SATA 6Gb/s
M.2 SATA
Manual
M.2 SATA is a non-volatile, solid-state storage device delivering Serial
ATA performance, reliability and ruggedness for environmentally
challenging applications.
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Revision History
Date
Revision
3/10/17
A
3/13/17
B
3/21/17
C
5/18/17
D
7/24/17
E
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Description
Initial Release. Revised based on
PSFEM6XXXGSXXX_D with new PN’s
performance, block diagram, TBW, power
consumption. Add VPFEM6030GZCDMTL.
Add Industrial Temperature PN’s
Add VPFEM6030GZCDMTL.
Add Industrial Temperature PN’s. Revise
note 2 on Extended SMART Attribute Actual
Data table. Add 8GB and 16GB info. Add
section on Flash Management
Add PN’s VPFEM5008GZCWMTL and
VPFEM5016GZCDMTL. Remove I.T. from
page1. Add 8GB LBA
Checked By
Add IOPS and MB/s performance based on
IOMETER06
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Legal Information
Legal Information
Copyright© 2017 Sanmina Corporation. All rights reserved. The information in
this document is proprietary and confidential to Sanmina Corporation. No part of
this document may be reproduced in any form or by any means or used to make
any derivative work (such as translation, transformation, or adaptation) without
written permission from Sanmina. Sanmina reserves the right to revise this
documentation and to make changes in content from time to time without
obligation on the part of Sanmina to provide notification of such revision or
change.
Sanmina provides this documentation without warranty, term or condition of any
kind, either expressed or implied, including, but not limited to, expressed and
implied warranties of merchantability, fitness for a particular purpose, and noninfringement. While the information contained herein is believed to be accurate,
such information is preliminary, and should not be relied upon for accuracy or
completeness, and no representations or warranties of accuracy or
completeness are made. In no event will Sanmina be liable for damages arising
directly or indirectly from any use of or reliance upon the information contained in
this document. Sanmina may make improvements or changes in the product(s)
and/or the program(s) described in this documentation at any time.
Sanmina, Viking Technology, Viking Modular Solutions, and Element logo are
trademarks of Sanmina Corporation. Other company, product or service names
mentioned herein may be trademarks or service marks of their respective
owners.
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Ordering Information: M.2 SATA SSD Solid-State Drive
Length
(mm)
Interface
Application
User
Capacity
(GB)
Temperature
(C)
NAND
VPFEM5008GZCWMTL
80
SATA 6GB
Client
8
0 to 70
TSB 15nm MLC
VPFEM5016GZCDMTL
VPFEM5032GZCDMTL
VPFEM5060GZCDMTL
VPFEM5256GZCAMTL
VPFEM5008GZIWMTL
VPFEM5016GZIDMTL
VPFEM5032GZIDMTL
VPFEM5064GZIDMTL
VPFEM5128GZIBMTL
VPFEM5256GZIAMTL
VPFEM5512GZIZMTL
80
80
80
80
80
80
80
80
80
80
80
SATA 6GB
SATA 6GB
SATA 6GB
SATA 6GB
SATA 6GB
SATA 6GB
SATA 6GB
SATA 6GB
SATA 6GB
SATA 6GB
SATA 6GB
Client
Client
Client
Client
Client
Client
Client
Client
Client
Client
Client
16
32
60
256
8
16
32
64
128
256
512
0 to 70
0 to 70
0 to 70
0 to 70
-40 to +85
-40 to +85
-40 to +85
-40 to +85
-40 to +85
-40 to +85
-40 to +85
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
TSB 15nm MLC
Part Number
Notes:
Refer to Product Specifications for Capacity and LBA count
Lower case “x” is the NAND device code
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Client SSD’s – Viking’s client SSD contains sophisticated provisions to protect
firmware and data from corruption due to unexpected power loss. However,
should power fail unexpectedly, “in-flight” write data may be lost if the SSD power
is not managed at the system level for these power fail events.
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Table of Contents
1
INTRODUCTION
9
1.1
Features
1.2
Block Diagram
10
1.3
SATA Interface
11
2
PRODUCT SPECIFICATIONS
9
12
2.1
Capacity and LBA count
12
2.2
Performance
13
2.3
Timing
2.3.1 STANDBY IMMEDIATE Command
14
14
2.4
Flash Management
2.4.1 Error Correction Code (ECC)
2.4.2 Wear Leveling
2.4.3 Bad Block Management
2.4.4 TRIM
2.4.5 SMART
2.4.6 Over-Provision
2.4.7 Firmware Upgrade
15
15
15
15
15
16
16
16
2.5
Low Power Management
2.5.1 DEVSLP Mode (Optional)
2.5.2 DIPM/HIPM Mode
16
16
16
2.6
17
Power Loss Protection: Flushing Mechanism (Optional)
2.7
Advanced Device Security Features
2.7.1 Secure Erase
2.7.2 Write Protect
17
17
17
2.8
SSD Lifetime Management
2.8.1 Terabytes Written (TBW)
2.8.2 Thermal Monitor (Optional)
18
18
18
2.9
An Adaptive Approach to Performance Tuning
2.9.1 Throughput
2.9.2 Predict & Fetch
18
18
18
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2.9.3
Compression
19
2.10
Electrical Characteristics
2.10.1
Absolute Maximum Ratings
2.10.2
Supply Voltage
2.10.3
Power Consumption
20
20
20
20
2.11
Environmental Conditions
2.11.1
Temperature and Altitude
2.11.2
Shock and Vibration
2.11.3
Electromagnetic Immunity
21
21
21
21
2.12
21
3
Reliability
MECHANICAL INFORMATION
22
3.1
Dimensions
22
3.2
Card Edge Detail
24
3.3
M.2 SSD Weight
26
4
PIN AND SIGNAL DESCRIPTIONS
26
4.1
Signal and Power Description Tables
26
4.2
Hot Plug Support
27
5
COMMAND SETS
27
5.1
ATA Commands
5.1.1 48-Bit Address Command Set
5.1.2 ATA General Feature Command Set
5.1.3 Device Configuration Overlay Command Set
5.1.4 General Purpose Log Command Set
5.1.5 Host Protected Area Command Set
5.1.6 Power Management Command Set
5.1.7 Security Mode Feature Set
5.1.8 Identify Device Data
5.1.1 S.M.A.R.T. Support
5.1.2 SATA 3.0 S.M.A.R.T. Command Set
27
28
29
29
29
29
30
30
31
35
36
5.2
SATA Commands
5.2.1 Native Command Queuing (NCQ)
40
40
6
REFERENCES
40
7
GLOSSARY
41
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Table of Tables
Table 2-1: Maximum Sustained Read and Write Bandwidth ____________________________ 13
Table 2-2: Sequential Read and Write Bandwidth (Iometer 06) _________________________ 13
Table 2-3: Random Read/ Write Input/Output Operations per Second (IOPS) (Iometer 06) ____ 14
Table 2-3: Timing Specifications _________________________________________________ 14
Table 2-4: STANDBY IMMEDIATE Timing _________________________________________ 15
Table 2-5: Absolute Maximum Ratings ____________________________________________ 20
Table 2-6: Operating Voltage ____________________________________________________ 20
Table 2-7: Typical Power Consumption at 3.3V ______________________________________ 20
Table 2-8: Temperature and Altitude Related Specifications ____________________________ 21
Table 2-9: Shock and Vibration Specifications _______________________________________ 21
Table 2-10: Reliability Specifications ______________________________________________ 21
Table 3-1: M.2 SSD weight ______________________________________________________ 26
Table 4-1: M.2 SATA Connector Pin Signal Definitions ________________________________ 26
Table 5-1: Supported ATA Commands ____________________________________________ 27
Table 5-2: List of Device Identification _____________________________________________ 31
Table 5-3: S.M.A.R.T. Command Set ______________________________________________ 36
Table 5-4: Extended SMART Attribute Table ________________________________________ 36
Table 5-5: Extended SMART Attribute Actual Data ___________________________________ 37
Table 5-6: Supported S.M.A.R.T. EXECUTE OFF-LINE IMMEDIATE Subcommands ________ 40
Table of Figures
Figure 1-1: High-Level Block Diagram _____________________________________________ 10
Figure 3-1: Dimensions ________________________________________________________ 22
Figure 3-2: Dimension Details for M.2 80mm length __________________________________ 23
Figure 3-3: Dimension Details for M.2 card edge _____________________________________ 24
Figure 3-4: Dimension Details for M.2 connector and notch ____________________________ 25
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1 Introduction
Viking’s rugged industrial designed SSD’s offer the highest flash storage
reliability and performance in harsh environments such as shock, vibration,
humidity, altitude, ESD, and extreme temperatures.
1.1 Features
The SSD delivers the following features:
Offers seamless SATA Revision 3.0 interface support for SATA up to
6Gb/s
Low overall SSD power consumption
Supports Native Command Queuing (NCQ) to 32 commands
Compatible with all major SLC and MLC flash technologies
S.M.A.R.T.
Superior wear-leveling algorithm
Efficient error recovery
Compliant with ONFI 4.0 interface:
o SDR up to mode 5
o NV-DDR up to mode 5
o NV-DDR2 up to mode 7
o NV-DDR3 up to mode 8
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1.2 Block Diagram
Figure 1-1: High-Level Block Diagram
Notes:
1. Support for up to 2-channels and 2 CE in the NAND Flash interface
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1.3 SATA Interface
The Serial ATA (SATA) interface is compliant with the SATA IO Serial
ATA specification, revision 3.0 that supports SATA up to 6 Gbps.
The SATA interface connects the host computer to the SSD subsystem.
The SATA interface runs at a maximum speed of 6 Gbps (Giga-bits per
second). If the host computer is unable to negotiate a speed of 6 Gbps,
the SATA interface automatically renegotiates to a speed of 3 Gbps or 1.5
Gbps.
For a list of supported commands and other specifics, please see Chapter 5.
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2 Product Specifications
2.1 Capacity and LBA count
Raw Capacity
(GB)
User Capacity
(GB)
LBA Count
8
8
15,649,200
16
14
27,370,224
16
16
31,277,232
32
30
58,626,288
32
32
62,533,296
64
60
117,231,408
64
64
125,045,424
128
120
234,441,648
128
128
250,069,680
256
240
468,862,128
256
256
500,118,192
512
480
937,703,088
512
512
1,000,215,216
Notes:
1. Per www.idema.org, LBA1-03 spec,
LBA counts = (97,696,368) + (1,953,504 * (Advertised Capacity in GBytes – 50))
2. GB capacities based on power of 10, GiB capacities are based on powers of 2
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2.2 Performance
Table 2-1: Maximum Sustained Read and Write Bandwidth
Capacity
8GB
16GB
30/32GB
60/64GB
120/128GB
240/256GB
480/512GB
Flash Structure
8GBx1, TSOP, TSB 15nm
16GBx1, TSOP, TSB 15nm
32GBx1, BGA, TSB 15nm
32GBx2, BGA, TSB 15nm
64GBx2, BGA, TSB 15nm
128GBx2, BGA, TSB 15nm
256GBx2, BGA, TSB 15nm
Performance
CrystalDiskMark
ATTO
Read
Write
Read
Write
(MB/s) (MB/s) (MB/s) (MB/s)
320
105
560
540
320
85
560
540
550
175
550
540
550
335
550
540
550
465
550
540
550
465
550
540
550
470
550
540
Notes:
1. Performance measured using CrystalDiskMark.
2. Performance may vary from flash configuration, SDR configuration, and platform.
3. Refer to Application Note AN0006 for Viking SSD Benchmarking Methodology.
4. Data is based on SSD’s using Toshiba A15nm Toggle NAND devices
5. L95A data not currently available
Table 2-2: Sequential Read and Write Bandwidth (Iometer 06)
Read MB/s
(256K)
Capacity
Flash Type
8GB
15nm
537
16GB
15nm
537
32GB
537
64GB
15nm
15nm
128GB
15nm
256GB
512GB
Notes:
1.
2.
3.
Write MB/s
(256K)
1
366
1
1
366
1
1
366
1
1
366
1
537
1
366
1
15nm
537
366
15nm
1
366
537
537
1
Estimated Performance measured using Iometer 06 with queue depth set to 32.
Write Cache enabled with DDR cache.
Tested with VPFEM5256GZIAMTL (Toshiba MLC L die)
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Table 2-3: Random Read/ Write Input/Output Operations per Second (IOPS)
(Iometer 06)
Capacity
Flash Type
8GB
15nm
Random Read
IOPS
(4K)
1
14200
16GB
15nm
14200
32GB
14200
64GB
15nm
15nm
128GB
256GB
512GB
Notes:
1.
2.
3.
4.
5.
6.
7.
8.
Random Write
IOPS
(4K)
1
1100
1
1100
1
1
1100
1
14200
1
1100
1
15nm
14200
1
1100
1
15nm
14200
1100
15nm
1
1100
14200
1
Estimated Performance measured using Iometer 06 with queue depth set to 32.
Write Cache enabled with DDR cache.
Tested with VPFEM5256GZIAMTL (Toshiba MLC L die)
Random IOPS cover the entire range of legal logical block addresses (LBA’s). Measurements are
performed on a full drive (all LBA’s have valid content).
Performance may vary by NAND type and host.
Refer to Application Note AN0006 for Viking SSD Benchmarking Methodology.
Data is based on SSD’s using Toshiba A15nm NAND devices
L95A data not currently available
2.3 Timing
Table 2-4: Timing Specifications
Type
Power-On-to-Ready (POR)
Command to DRQ
Time to Erase (ATA Secure Erase)
Average Latency
TBD
TBD
TBD
Notes:
1. Device measured using Drivemaster.
2. Sector Read/Write latency measured up to 2048 block transfers (512B/sector = 1 Block)
3. Queue depth set to 32 for NCQ
4. Sequential IOPS cover the entire range of legal logical block addresses (LBA’s). Measurements are
performed on a full drive (all LBA’s have valid content
5. DRQ (Data Transfer Requested) bit being asserted
2.3.1 STANDBY IMMEDIATE Command
The Power-On-to-Ready time assumes a proper shutdown (power removal
preceded by STANDBY IMMEDIATE command. A STANDBY IMMEDIATE
before power down always performs a graceful shutdown and does not require
the use of the hold-up circuit. Note that SMART attribute 174 "Unexpected Power
Loss" records the number of non-graceful power cycle events.
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Table 2-5: STANDBY IMMEDIATE Timing
Power Cycle Endurance
STANDBY IMMEDIATE to WE completed
Min
-
Max
72.9
Unit
Ms
Notes:
1. From Standby Immediate command to NAND Write Protect enable.
2.4 Flash Management
2.4.1 Error Correction Code (ECC)
Flash memory cells will deteriorate with use, which might generate random bit
errors in the stored data. Thus, the Viking M.2 2280 applies the LDPC (Low
Density Parity Check) of ECC algorithm, which can detect and correct errors
occur during read process, ensure data been read correctly, as well as protect
data from corruption.
2.4.2 Wear Leveling
NAND flash devices can only undergo a limited number of program/erase cycles,
and in most cases, the flash media are not used evenly. If some areas get
updated more frequently than others, the lifetime of the device would be reduced
significantly. Thus, Wear Leveling is applied to extend the lifespan of NAND
flash by evenly distributing write and erase cycles across the media.
Viking SSDs provides advanced Wear Leveling algorithm, which can efficiently
spread out the flash usage through the whole flash media area. Moreover, by
implementing both dynamic and static Wear Leveling algorithms, the life
expectancy of the NAND flash is greatly improved.
2.4.3 Bad Block Management
Bad blocks are blocks that include one or more invalid bits, and their reliability is
not guaranteed. Blocks that are identified and marked as bad by the
manufacturer are referred to as “Initial Bad Blocks”. Bad blocks that are
developed during the lifespan of the flash are named “Later Bad Blocks”. Viking
SSDs implements an efficient bad block management algorithm to detect the
factory-produced bad blocks and manages any bad blocks that appear with use.
This practice further prevents data being stored into bad blocks and improves the
data reliability.
2.4.4 TRIM
TRIM is a feature which helps improve the read/write performance and speed
of solid-state drives (SSD). Unlike hard disk drives (HDD), SSDs are not able to
overwrite existing data, so the available space gradually becomes smaller with
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each use. With the TRIM command, the operating system can inform the SSD
which blocks of data are no longer in use and can be removed permanently.
Thus, the SSD will perform the erase action, which prevents unused data from
occupying blocks all the time.
2.4.5 SMART
SMART, an acronym for Self-Monitoring, Analysis and Reporting Technology, is
an open standard that allows a hard disk drive to automatically detect its health
and report potential failures. When a failure is recorded by SMART, users can
choose to replace the drive to prevent unexpected outage or data loss.
Moreover, SMART can inform users of impending failures while there is still time
to perform proactive actions, such as copy data to another device.
2.4.6 Over-Provision
Over Provisioning refers to the inclusion of extra NAND capacity in a SSD, which
is not visible and cannot be used by users. With Over Provisioning, the
performance and IOPS (Input/Output Operations per Second) are improved by
providing the controller additional space to manage P/E cycles, which enhances
the reliability and endurance as well. Moreover, the write amplification of the SSD
becomes lower when the controller writes data to the flash.
2.4.7 Firmware Upgrade
Firmware can be considered as a set of instructions on how the device
communicates with the host. Firmware will be upgraded when new features are
added, compatibility issues are fixed, or read/write performance gets improved.
2.5 Low Power Management
2.5.1 DEVSLP Mode (Optional)
With the increasing need of aggressive power/battery life, SATA interfaces
include a new feature, Device Sleep (DEVSLP) mode, which helps further reduce
the power consumption of the device. DEVSLP enables the device to completely
power down the device PHY and other sub-systems, making the device reach
a new level of lower power operation. The DEVSLP does not specify the exact
power level a device can achieve in the DEVSLP mode, but the power usage can
be dropped down to 5mW or less.
2.5.2 DIPM/HIPM Mode
SATA interfaces contain two low power management states for power saving:
Partial and Slumber modes. For Partial mode, the device has to resume to full
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operation within 10 microseconds, whereas the device will spend 10 milliseconds
to become fully operational in the Slumber mode. SATA interfaces allow
low power modes to be initiated by Host (HIPM, Host Initiated Power
Management) or Device (DIPM, Device Initiated Power Management). As for
HIPM, Partial or Slumber mode can be invoked directly by the software. For
DIPM, the device will send requests to enter Partial or Slumber mode.
2.6 Power Loss Protection: Flushing Mechanism (Optional)
Power Loss Protection is a mechanism to prevent data loss during unexpected
power failure. DRAM is a volatile memory and frequently used as temporary
cache or buffer between the controller and the NAND flash to improve the SSD
performance. However, one major concern of the DRAM is that it is not able
to keep data during power failure. Accordingly, the SSD requests the controller to
transfer data to the cache. SDR performs as a cache, and its size is 32MB. Only
when the data is fully committed to the NAND flash will the controller send
acknowledgement (ACK) to the host. Such implementation can prevent falsepositive performance and the risk of power cycling issues.
Additionally, it is critical for a controller to shorten the time the in-flight data stays
in the cache. Thus, the Viking SSD applies an algorithm to reduce the amount of
data resides in the cache to provide a better performance. This technology
allows incoming data to only have a “pit stop” in the cache and then move to the
NAND flash at once. If the flash is jammed due to particular file sizes (such as
random 4KB data), the cache will be treated as an “organizer”, consolidating
incoming data into groups before written into the flash to improve write
amplification. In summary, provide the reliability required by consumer,
industrial, and enterprise-level applications.
2.7 Advanced Device Security Features
2.7.1 Secure Erase
Secure Erase is a standard ATA command and will write all “0xFF” to fully wipe
all the data on hard drives and SSDs. When this command is issued, the SSD
controller will erase its storage blocks and return to its factory default settings.
2.7.2 Write Protect
When a SSD contains too many bad blocks and data are continuously written in,
then the SSD might not be usable anymore. Thus, Write Protect is a mechanism
to prevent data from being written in and protect the accuracy of data that are
already stored in the SSD.
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2.8 SSD Lifetime Management
2.8.1 Terabytes Written (TBW)
TBW (Terabytes Written) is a measurement of SSDs’ expected lifespan, which
represents the amount of data written to the device. To calculate the TBW of a
SSD, the following equation is applied:
TBW = [(NAND Endurance) x (SSD Capacity) x (WLE)] / WAF
NAND Endurance: Refers to the P/E (Program/Erase) cycle of a NAND flash.
SSD Capacity: The SSD capacity is the specific capacity in total of a SSD.
WLE: Wear Leveling Efficiency (WLE) ratio of the average #of erases on all the
blocks to the erases on any block at maximum.
WAF: Write Amplification Factor (WAF) is a numerical value representing the ratio
between the amount of data that a SSD controller needs to write and the amount of data
that the host’s flash controller writes. A better WAF, which is near 1, guarantees better
endurance and lower frequency of data written to flash memory.
2.8.2 Thermal Monitor (Optional)
Thermal monitors are devices for measuring temperature, and can be found in
SSDs in order to issue warnings when SSDs go beyond a certain temperature.
The higher temperature the thermal monitor detects, the more power the SSD
consumes, causing the SSD to get aging quickly. Hence, the processing speed
of a SSD should be under control to prevent temperature from exceeding a
certain range. Meanwhile, the SSD can achieve power savings.
2.9 An Adaptive Approach to Performance Tuning
2.9.1 Throughput
Based on the available space of the disk, the SSD will regulate the read/write
speed and manage the performance of throughput. When there still remains a lot
of space, the firmware will continuously perform read/write action. There is still no
need to implement garbage collection to allocate and release memory, which will
accelerate the read/write processing to improve the performance. Contrarily,
when the space is going to be used up, the SSD will slow down the read/write
processing, and implement garbage collection to release memory. Hence,
read/write performance will become slower.
2.9.2 Predict & Fetch
Normally, when the host tries to read data from the SSD, the SSD will only
perform one read action after receiving one command. However, the SSD
applies “Predict & Fetch” to improve the read speed. When the host issues
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sequential read commands to the SSD, the SSD will automatically expect that
the following will also be read commands. Thus, before receiving the next
command, flash has already prepared the data. Accordingly, this accelerates the
data processing time, and the host does not need to wait so long to receive data.
2.9.3 Compression
Write data to the NAND Flash costs time. To improve the write speed
performance, the SSD launches a compression technique. Whether a file could
be compressed or not depending on the file type, for file types have redundancy
data pattern, through our embedded encode engine, we could reduce the amount
of data that is actually written to the Flash. Comparing to the SSD without the
compression, write efficiency is raised and the SSD endurance is also improved
since Flash could be benefit from less data written for a longer SSD lifetime.
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2.10 Electrical Characteristics
2.10.1
Absolute Maximum Ratings
Values shown are stress ratings only. Functional operation outside normal
operating values is not implied. Extended exposure to absolute maximum ratings
may affect reliability.
Table 2-6: Absolute Maximum Ratings
Description
Maximum Voltage Range for Vin
Maximum Temperature Range
2.10.2
Min
-0.2
-40
Max
6
85
Unit
V
C
Min
Max
Unit
3.135
3.465
V
Supply Voltage
The operating voltage is 3.3V
Table 2-7: Operating Voltage
Description
Operating Voltage for 3.3 V (+/- 5%)
2.10.3
Power Consumption
All onboard power requirements of the SSD are derived from the SATA 3.3V rail.
Table 2-8: Typical Power Consumption at 3.3V
Power Consumption
Read
Write
Devslp
Capacity
8GB
Flash Structure
8GBx1, TSOP, TSB 15nm
(mW)
830
(mW)
765
(mW)
4.9
16GB
16GBx1, TSOP, TSB 15nm
895
805
4.9
30/32GB
32GBx1, BGA, TSB 15nm
1,190
1,280
4.9
60/64GB
32GBx2, BGA, TSB 15nm
1,190
1,295
4.9
120/128GB
64GBx2, BGA, TSB 15nm
1,170
1,525
4.9
240/256GB
128GBx2, BGA, TSB 15nm
1,250
1,555
4.9
256GBx2, BGA, TSB 15nm
1,455
1,675
4.9
480/512GB
Notes:
1. Measured using Toshiba A15 Toggle MLC NAND
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2.11 Environmental Conditions
2.11.1
Temperature and Altitude
Table 2-9: Temperature and Altitude Related Specifications
Conditions
Commercial
Temperature- Ambient
Industrial
Temperature- Ambient
Humidity (noncondensing)
2.11.2
Operating
0 to 70°C
Shipping
-40 to 85°C
Storage
-40 to 85°C
-40 to 85°C
-40 to 85°C
-40 to 85°C
95% under 55C
93% under 40C
93% under 40C
Shock and Vibration
SSD products are tested in accordance with environmental specification for
shock and vibration
Table 2-10: Shock and Vibration Specifications
Stimulus
Shock
Vibration
2.11.3
Description
500G, 2ms
20 – 80 Hz/1.52mm, 80 – 2000 Hz/20G, (X,Y,Z axis / 30 min for each)
Electromagnetic Immunity
M.2 is an embedded product for host systems and is designed not to impair with
system functionality or hinder system EMI/FCC compliance.
2.12 Reliability
Table 2-11: Reliability Specifications
Parameter
MTBF
ECC
Read
Endurance
Write
Endurance
Data retention
Description
Over 2,000,000 hours
72-bit per 1KByte
Unlimited
8GB
12 TBW
16GB
23 TBW
32GB
45 TBW
64GB
90 TBW
128GB
181 TBW
256GB
262 TBW
512GB
544 TBW
> 90 days at NAND expiration
NOTES:
1. Tested to JEDEC219A client endurance workloads using Toshiba 15nm Toggle MLC NAND.
2. TBW may differ according to flash configuration and platform.
3. The endurance of SSD could be estimated based on user behavior, NAND endurance cycles,
and write amplification factor. It is not guaranteed by flash vendor
4. TBW=(GB capacity x DWPD x 365 x years)/1000
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3 Mechanical Information
3.1 Dimensions
Figure 3-1: Dimensions
d
VRFEM6xxx
Note2
VRFEM4xxx
Note2
VPFEM5xxx
Note2
Notes:
1. All dimensions are in millimeter. General tolerance is ± 0.15. PCB thickness 0.8 ± 0.08
2. Refer to Ordering Information table for the complete Viking part number that describes the “xxx”.
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Figure 3-2: Dimension Details for M.2 80mm length
VPFEM5xxx
Note2
FOR CARD EDGE DETAIL
SEE SECTION 3.2
Notes:
1. All dimensions are in millimeter. General tolerance is ± 0.15. PCB thickness 0.8 ± 0.08
2. Refer to Ordering Information table for the complete Viking part number that describes the “xxx”.
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3.2 Card Edge Detail
Figure 3-3: Dimension Details for M.2 card edge
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Figure 3-4: Dimension Details for M.2 connector and notch
Key notch detail
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3.3 M.2 SSD Weight
Table 3-1: M.2 SSD weight
Weight