SW740D
N-channel Enhanced mode TO-220/TO-220F/TO-252 MOSFET
Features
⚫
⚫
⚫
⚫
⚫
⚫
TO-220
High ruggedness
Low RDS(ON) (Typ 0.4Ω)@VGS=10V
Low Gate Charge (Typ 35nC)
Improved dv/dt Capability
100% Avalanche Tested
Application: LED, DC-DC
TO-220F
BVDSS : 400V
TO-252
ID
: 10A
RDS(ON) : 0.4Ω
1
2
2
1
3
2
1
3
2
1
3
1. Gate 2. Drain 3. Source
General Description
3
This power MOSFET is produced with advanced technology of SAMWIN.
This technology enable the power MOSFET to have better characteristics, including fast
switching time, low on resistance, low gate charge and especially excellent avalanche
characteristics.
Order Codes
Item
Sales Type
Marking
Package
Packaging
1
SW P 740D
SW740D
TO-220
TUBE
2
SW F 740D
SW740D
TO-220F
TUBE
3
SW D 740D
SW740D
TO-252
REEL
Absolute maximum ratings
Value
Symbol
Parameter
Unit
TO-220
VDSS
ID
TO-220F
TO-252
Drain to source voltage
400
V
Continuous drain current (@TC=25oC)
10*
A
Continuous drain current (@TC=100oC)
6.3*
A
40
A
± 30
V
IDM
Drain current pulsed
VGS
Gate to source voltage
EAS
Single pulsed avalanche energy
(note 2)
405
mJ
EAR
Repetitive avalanche energy
(note 1)
40
mJ
dv/dt
Peak diode recovery dv/dt
(note 3)
5
V/ns
PD
TSTG, TJ
TL
(note 1)
Total power dissipation (@TC=25oC)
Derating factor above 25oC
183.8
23.6
119
W
1.5
0.2
0.95
W/oC
Operating junction temperature & storage temperature
Maximum lead temperature for soldering
purpose, 1/8 from case for 5 seconds.
-55 ~ + 150
oC
300
oC
*. Drain current is limited by junction temperature.
Thermal characteristics
Value
Symbol
Parameter
Rthjc
Thermal resistance, Junction to case
Rthja
Thermal resistance, Junction to ambient
Copyright@ Semipower Technology Co., Ltd. All rights reserved.
TO-220
TO-220F
TO-252
0.68
5.3
1.05
58
50
May.2022. Rev. 4.0
Unit
oC/W
oC/W
1/7
SW740D
Electrical characteristic ( TJ = 25oC unless otherwise specified )
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Off characteristics
BVDSS
Drain to source breakdown voltage
VGS=0V, ID=250uA
400
ΔBVDSS
/ ΔTJ
Breakdown voltage temperature
coefficient
ID=250uA, referenced to 25oC
IDSS
Drain to source leakage current
V
V/oC
0.54
VDS=400V, VGS=0V
1
uA
VDS=320V, TJ=125oC
50
uA
Gate to source leakage current, forward
VGS=30V, VDS=0V
100
nA
Gate to source leakage current, reverse
VGS=-30V, VDS=0V
-100
nA
4.5
V
0.5
Ω
IGSS
On characteristics
VGS(TH)
Gate threshold voltage
RDS(ON)
Drain to source on state resistance
Gfs
Forward transconductance
VDS=VGS, ID=250uA
2.5
VGS=10V, ID=5A, TJ=25oC
0.4
VGS=10V, ID=5A, TJ
0.9
Ω
VDS=30V, ID=5A
8.5
S
=125oC
Dynamic characteristics
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer capacitance
td(on)
Turn on delay time
tr
td(off)
tf
Rising time
Turn off delay time
1358
VGS=0V, VDS=25V, f=1MHz
161
pF
20
18
VDS=200V, ID=10A, RG=10Ω,
VGS=10V
(note 4,5)
44
ns
47
Fall time
31
Qg
Total gate charge
35
Gate-drain charge
VDS=320V, VGS=10V, ID=10A ,
IG=3mA
(note 4,5)
Qgs
Gate-source charge
Qgd
Rg
Gate resistance
VDS=0V, Scan F mode
1.7
8
nC
15
Ω
Source to drain diode ratings characteristics
Symbol
Parameter
Test conditions
IS
Continuous source current
ISM
Pulsed source current
Integral reverse p-n Junction
diode in the MOSFET
VSD
Diode forward voltage drop.
IS=10A, VGS=0V
trr
Reverse recovery time
Qrr
Reverse recovery charge
IS=10A, VGS=0V,
dIF/dt=100A/us
Min.
Typ.
Max.
Unit
10
A
40
A
1.4
V
355
ns
2.9
uC
※. Notes
1.
Repeatitive rating : pulse width limited by junction temperature.
2.
L =8.1mH, IAS =10A, VDD=50V, RG=25Ω, Starting TJ = 25oC
3.
ISD ≤ 10A, di/dt = 100A/us, VDD ≤ BVDSS, Staring TJ =25oC
4.
Pulse Test : Pulse Width ≤ 300us, duty cycle ≤ 2%.
5.
Essentially independent of operating temperature.
Copyright@ Semipower Technology Co., Ltd. All rights reserved.
May.2022. Rev. 4.0
2/7
SW740D
Fig. 1. On-state characteristics
Fig. 2. Transfer Characteristics
Fig. 3. On-resistance variation vs.
drain current and gate voltage
Fig. 4. On-state current vs. diode
forward voltage
Fig 5. Breakdown voltage variation
vs. junction temperature
Fig. 6. On-resistance variation
vs. junction temperature
Copyright@ Semipower Technology Co., Ltd. All rights reserved.
May.2022. Rev. 4.0
3/7
SW740D
Fig. 7. Gate charge characteristics
Fig. 9. Maximum safe operating area(TO-220)
Fig. 8. Capacitance Characteristics
Fig. 10. Maximum safe operating area (TO-220F)
Fig. 11. Maximum safe operating area (TO-252)
Copyright@ Semipower Technology Co., Ltd. All rights reserved.
May.2022. Rev. 4.0
4/7
SW740D
Fig. 12. Transient thermal response curve(TO-220)
Fig. 13. Transient thermal response curve(TO-220F)
Fig. 14. Transient thermal response curve(TO-252)
Copyright@ Semipower Technology Co., Ltd. All rights reserved.
May.2022. Rev. 4.0
5/7
SW740D
Fig. 15. Gate charge test circuit & waveform
Fig. 16. Switching time test circuit & waveform
VDS
90%
RL
RGS
VDS
VDD
VIN
10VIN
DUT
10%
10%
td(on)
tr
td(off)
tON
tf
tOFF
Fig. 17. Unclamped Inductive switching test circuit & waveform
Copyright@ Semipower Technology Co., Ltd. All rights reserved.
May.2022. Rev. 4.0
6/7
SW740D
Fig. 18. Peak diode recovery dv/dt test circuit & waveform
DUT
+ V
DS
10V
VGS (DRIVER)
L
IS
di/dt
IS (DUT)
IRM
VDS
RG
Diode reverse current
VDD
Diode recovery dv/dt
Same type
as DUT
10VGS
VDS (DUT)
*. dv/dt controlled by RG
*. Is controlled by pulse period
VDD
VF
Body diode forward voltage drop
DISCLAIMER
* All the data & curve in this document was tested in SEMIPOWER TESTING & APPLICATION CENTER.
* This product has passed the PCT,TC,HTRB,HTGB,HAST,PC and Solderdunk reliability testing.
* Qualification standards can also be found on the Web site (http://www.semipower.com.cn)
* Suggestions for improvement are appreciated, Please send your suggestions to samwin@samwinsemi.com
Copyright@ Semipower Technology Co., Ltd. All rights reserved.
May.2022. Rev. 4.0
7/7