IRF640NSPBF
www.VBsemi.com
N-Channel 200 V (D-S) 175 °C MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
200
RDS(on) (Ω)
ID (A)
0.048 at VGS = 10 V
40
0.060 at VGS = 6.5 V
35
•
•
•
•
•
TrenchFET® Power MOSFET
175 °C Junction Temperature
Low Thermal Resistance Package
PWM Optimized for Fast Switching
Compliant to RoHS Directive 2002/95/EC
APPLICATIONS
TO-263
• Isolated DC/DC Converters
- Primary-Side Switch
D
G
D
S
G
Top View
S
N-Channel MOSFET
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)
Parameter
Symbol
Limit
Drain-Source Voltage
VDS
200
Gate-Source Voltage
VGS
± 20
TC = 25 °C
Continuous Drain Current (TJ = 175 °C)
ID
TC = 125 °C
Pulsed Drain Current
Avalanche Current
a
Repetitive Avalanche Energy
TC = 25 °C
Maximum Power Dissipationa
80
IAR
20
PD
TA = 25 °Cc
Operating Junction and Storage Temperature Range
V
40
25
IDM
EAR
L = 0.1 mH
Unit
16.2
200b
4.5
A
mJ
W
TJ, Tstg
- 55 to 175
°C
Symbol
Limit
Unit
RthJA
40
RthJC
1
THERMAL RESISTANCE RATINGS
Parameter
Junction-to-Ambient
PCB Mount (TO-263)
Junction-to-Case (Drain)
c
°C/W
Notes:
a. Duty cycle ≤ 1 %.
b. See SOA curve for voltage derating.
c. When mounted on 1" square PCB (FR-4 material).
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SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Conditions
Min .
VDS
VGS = 0 V, ID = 250 µA
200
VGS(th)
VDS = VGS, ID = 250 µA
2
IGSS
VDS = 0 V, VGS = ± 20 V
Typ.
Max.
Unit
Static
Drain-Source Breakdown Voltage
Gate-Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Currenta
IDSS
1
VDS = 160 V, VGS = 0 V, TJ = 125 °C
50
VDS = 160 V, VGS = 0 V, TJ = 175 °C
250
VDS ≥ 15 V, VGS = 10 V
RDS(on)
Drain-Source on State Resistance
a
Forward Transconductance
± 100
VDS = 160 V, VGS = 0 V
ID(on)
Drain-Source On-State Resistancea
4
60
0.048
VGS = 10 V, ID = 20 A, TJ = 125 °C
0.150
VGS = 10 V, ID = 20 A, TJ = 175 °C
0.180
VDS = 15 V, ID = 30 A
nA
µA
A
VGS = 10 V, ID = 20 A
VGS= 6.5 V, I D = 15 A
gfs
V
Ω
0.060
15
S
Dynamicb
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Total Gate Chargec
Qg
c
2820
VGS = 0 V, VDS = 25 V, f = 1 MHz
120
35
Gate-Source Charge
Qgs
Gate-Drain Chargec
Qgd
14
RG
2
Gate Resistance
Turn-On Delay Time
c
Rise Timec
Turn-Off Delay Timec
Fall Timec
VDS = 100 V, VGS = 10 V, ID = 20 A
td(on)
tr
td(off)
pF
300
VDD = 100 V, RL = 5 Ω
ID ≅ 20 A, VGEN = 10 V, RG = 2.5 Ω
tf
nC
11
Ω
15
25
35
55
40
60
30
45
ns
Source-Drain Diode Ratings and Characteristics (TC = 25 °C)b
IS
40
Pulsed Current
ISM
60
Forward Voltagea
VSD
Continuous Current
Reverse Recovery Time
Peak Reverse Recovery Charge
Reverse Recovery Charge
IF = 20 A, VGS = 0 V
trr
IRM(REC)
Qrr
IF = 50 A, dI/dt = 100 A/µs
A
1
1.5
V
115
170
ns
7.5
12
A
0.43
1.02
µC
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
2
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IRF640NSPBF
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TYPICAL CHARACTERISTICS (25 °C unless noted)
60
60
VGS = 10 thru 7 V
6V
50
I D - Drain Current (A)
I D - Drain Current (A)
50
40
30
20
5V
40
30
20
TC = 125 °C
10
10
25 °C
- 55 °C
3 V, 4 V
0
0
0
1
2
3
4
5
6
7
8
9
0
10
1
2
3
4
5
6
7
VGS - Gate-to-Source Voltage (V)
VDS - Drain-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
80
0.16
60
R DS(on) - On-Resistance ()
g fs - Transconductance (S)
TC = - 55 °C
25 °C
125 °C
40
20
0
0.12
VGS = 6 V
0.08
VGS = 10 V
0.04
0.00
0
10
20
30
40
50
60
0
10
20
ID - Drain Current (A)
40
50
60
ID - Drain Current (A)
Transconductance
On-Resistance vs. Drain Current
20
4200
V GS - Gate-to-Source Voltage (V)
3500
Ciss
C - Capacitance (pF)
30
2800
2100
1400
Crss
700
Coss
VDS = 100 V
ID = 20 A
16
12
8
4
0
0
0
40
80
120
160
200
0
10
20
30
40
VDS - Drain-to-Source Voltage (V)
Qg - Total Gate Charge (nC)
Capacitance
Gate Charge
50
60
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TYPICAL CHARACTERISTICS (25 °C unless noted)
100
VGS = 10 V
ID = 20 A
2.5
I S - Source Current (A)
R DS(on) - On-Resistance (Normalized)
3.0
2.0
1.5
1.0
TJ = 150 °C
0.5
0.0
- 50
- 25
0
25
50
75
100
125
150
1
0
175
0.3
TJ - Junction Temperature (°C)
0.6
0.9
1.2
VSD - Source-to-Drain Voltage (V)
On-Resistance vs. Junction Temperature
Source-Drain Diode Forward Voltage
1000
260
100
240
IAV (A) at TA = 25 °C
V DS (V)
I Dav (a)
TJ = 25 °C
10
10
1
ID = 1.0 mA
220
200
IAV (A) at TA = 150 °C
0.1
0.00001
0.0001
0.001
0.01
0.1
tin (s)
Avalanche Current vs. Time
4
1
180
- 50
- 25
0
25
50
75
100
125
150
175
TJ - Junction Temperature (°C)
Drain Source Breakdown
vs. Junction Temperature
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THERMAL RATINGS
30
100
Limited by R DS(on) *
I D - Drain Current (A)
I D - Drain Current (A)
25
20
15
10
100 µs
10
1 ms
10 ms
1
TC = 25 °C
Single Pulse
5
0
0
25
50
75
100
125
150
0.1
0.1
175
10 µs
TC - Ambient Temperature (°C)
Maximum Avalanche and Drain Current
vs. Case Temperature
100 ms, DC
1
10
1000
100
VDS - Drain-to-Source Voltage (V)
* VGS > minimum VGS at which RDS(on) is specified
Safe Operating Area
2
1
Normalized Effective Transient
Thermal Impedance
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10 -4
10 -3
10 -2
10 -1
1
Square Wave Pulse Duration (sec)
Normalized Thermal Transient Impedance, Junction-to-Case
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IRF640NSPBF
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