AD781JNZ

AD781–SPECIFICATIONS DC SPECIFICATIONS (TMIN to TMAX, VCC = +12 V 6 10%, VEE = –12 V 6 10%, CL = 20 pF, unless otherwise noted) Parameter Min AD781J Typ SAMPLING CHARACTERISTICS Acquisition Time 10 V Step to 0.01% 10 V Step to 0.1% Small Signal Bandwidth Full Power Bandwidth HOLD CHARACTERISTICS Effective Aperture Delay (25°C) Aperture Jitter (25°C) Hold Settling (to 1 mV, 25°C) Droop Rate Feedthrough (25°C) (VIN = ± 5 V, 100 kHz) –35 Max 600 500 4 1 700 600 –25 50 250 0.01 –15 75 500 1 Min –35 –86 AD781A Typ Max 600 500 4 1 700 600 –25 50 250 0.01 –15 75 500 1 Min –35 –86 AD781S Typ Max Units 600 500 4 1 700 600 ns ns MHz MHz –25 50 250 0.01 –15 75 500 1 ns ps ns µV/µs –86 dB 1 ACCURACY CHARACTERISTICS Hold Mode Offset Hold Mode Offset Drift Sample Mode Offset Nonlinearity Gain Error OUTPUT CHARACTERISTICS Output Drive Current Output Resistance, DC Total Output Noise (DC to 5 MHz) Sampled DC Uncertainty Hold Mode Noise (DC to 5 MHz) Short Circuit Current Source Sink INPUT CHARACTERISTICS Input Voltage Range Bias Current Input Impedance Input Capacitance DIGITAL CHARACTERISTICS Input Voltage Low Input Voltage High Input Current High (VIN = 5 V) –4 –5 0.3 150 85 125 +3 –4 200 ± 0.003 ± 0.025 +5 0.5 –5 50 50 2 –1 10 50 ± 0.002 ± 0.01 –5 0.3 150 85 125 20 10 +5 250 –5 50 50 2 0.8 0 +3 –4 200 ± 0.003 ± 0.025 +5 0.5 0.3 150 85 125 10 ± 12 4 80 75 95 ± 13.2 6.5 +3 200 ± 0.005 ± 0.025 +5 0.5 20 10 +5 250 –5 50 50 2 0.8 2.0 2 –1 10 50 ± 0.003 ± 0.01 –5 20 10 2.0 POWER SUPPLY CHARACTERISTICS Operating Voltage Range ± 10.8 Supply Current +PSRR (+12 V ± 10%) 70 –PSRR (–12 V ± 10%) 65 Power Consumption TEMPERATURE RANGE Specified Performance –1 10 50 ± 0.002 ± 0.01 175 ± 10.8 ± 12 4 70 80 65 75 95 +70 –40 10 ± 13.2 6.5 2 mA Ω µV rms µV rms µV rms mA mA +5 250 V nA MΩ pF 0.8 V V µA 2.0 2 mV µV/°C mV % FS % FS 10 175 ± 10.8 ± 12 4 70 80 65 75 95 ± 13.2 7 185 V mA dB dB mW +85 –55 +125 °C NOTE 1 Specified and tested over an input range of ± 5 V. Specifications subject to change without notice. Specifications shown in boldface are tested on all devices at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min and max specifications are guaranteed although only those shown in boldface are tested. –2– REV. A AD781 (TMIN to TMAX, VCC = +12 V 6 10%, VEE = –12 V 6 10%, CL = 20 pF, unless otherwise noted)1 HOLD MODE AC SPECIFICATIONS Parameter Min AD781J Typ TOTAL HARMONIC DISTORTION FIN = 10 kHz FIN = 50 kHz FIN = 100 kHz –90 –73 –68 SIGNAL-TO-NOISE AND DISTORTION FIN = 10 kHz 72 FIN = 50 kHz FIN = 100 kHz 78 73 67 INTERMODULATION DISTORTION FIN1 = 49 kHz, FIN2 = 50 kHz 2nd Order Products 3rd Order Products –77 –78 Max Min –80 AD781A Typ Max –90 –73 –68 72 Min –80 78 73 67 AD781S Typ –90 –73 –68 72 –77 –78 Max Units –80 dB dB dB 78 73 67 dB dB dB –77 –78 dB dB NOTE 1 FIN amplitude = 0 dB and F SAMPLE = 500 kHz unless otherwise indicated. Specifications shown in boldface are tested on all devices at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min and max specifications are guaranteed although only those shown in boldface are tested. Specifications subject to change without notice. ABSOLUTE MAXIMUM RATINGS* Spec VCC VEE Control Input Analog Input Output Short Circuit to Ground, VCC, or VEE Maximum Junction Temperature Storage Lead Temperature (10 sec max) Power Dissipation PIN CONFIGURATION With Respect to Min Max Unit Common Common Common Common –0.3 –15 –0.5 –12 +15 +0.3 +7 +12 V V V V VCC 1 IN 2 COMMON 3 NC 4 AD781 TOP VIEW (Not to Scale) 8 OUT 7 S/H 6 NC 5 VEE Indefinite –65 +175 +150 +300 195 °C °C ORDERING GUIDE Model1 °C mW Temperature Range AD781JN 0°C to +70°C AD781AN –40°C to +85°C AD781SQ –55°C to +125°C *Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Description Package Options2 8-Pin Plastic DIP N-8 8-Pin Plastic DIP N-8 8-Pin Cerdip Q-8 NOTES 1 For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices Military Products Databook or current AD781/883B data sheet. 2 N = Plastic DIP; Q = Cerdip. CAUTION ESD (electrostatic discharge) sensitive device. The digital control inputs are diode protected; however, permanent damage may occur on unconnected devices subject to high energy electrostatic fields. Unused devices must be stored in conductive foam or shunts. WARNING! ESD SENSITIVE DEVICE REV. A –3– AD781 80 EFFECTIVE APERTURE DELAY – ns 70 V+ 1.0 DROOP RATE – µV/µs 60 PSRR – dB –10 10.0 50 V– 40 30 20 0.1 0.01 10 0 0.001 1 100 10 1k 10k 100k 0 1M 25 50 75 100 125 –15 –20 –25 –30 100 150 1k TEMPERATURE – °C FREQUENCY – Hz Power Supply Rejection Ratio vs. Frequency Droop Rate vs. Temperature, VIN = 0 V 100k 1M Effective Aperture Delay vs. Frequency 5 200 10k FREQUENCY – Hz 5 50 0 –50 –100 SUPPLY CURRENT – mA SUPPLY CURRENT – mA 100 4 3 2 4 3 2 –150 –200 –10 –5 0 5 1 –75 –50 –25 10 1 0 25 50 75 100 125 150 TEMPERATURE – °C INPUT VOLTAGE – V Bias Current vs. Input Voltage ±10 ±11 ±12 ±13 ±14 ±15 SUPPLY VOLTAGE – V Supply Current vs. Temperature Supply Current vs. Supply Voltage 1000 ACQUISITION TIME – ns BIAS CURRENT – nA 150 750 500 250 0 0 2 4 6 8 10 INPUT STEP – V Acquisition Time (to 0.01%) vs. Input Step Size –4– REV. A AD781 Signal-To-Noise and Distortion (S/N+D) Ratio—S/N+D is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for S/N+D is expressed in decibels. DEFINITIONS OF SPECIFICATIONS Acquisition Time—The length of time that the SHA must remain in the sample mode in order to acquire a full-scale input step to a given level of accuracy. Small Signal Bandwidth—The frequency at which the held output amplitude is 3 dB below the input amplitude, under an input condition of a 100 mV p-p sine wave. Total Harmonic Distortion (THD)—THD is the ratio of the rms sum of the first six harmonic components to the rms value of the measured input signal and is expressed as a percentage or in decibels. Full Power Bandwidth—The frequency at which the held output amplitude is 3 dB below the input amplitude, under an input condition of a 10 V p-p sine wave. Intermodulation Distortion (IMD)—With inputs consisting of sine waves at two frequencies, fa and fb, any device with nonlinearities will create distortion products, of order (m+n), at sum and difference frequency of mfa± nfb, where m, n = 0, 1, 2, 3.... Intermodulation terms are those for which m or n is not equal to zero. For example, the second order terms are (fa+fb) and (fa–fb), and the third order terms are (2fa+fb), (2fa–fb), (fa+2fb) and (fa–2fb). The IMD products are expressed as the decibel ratio of the rms sum of the measured input signals to the rms sum of the distortion terms. The two signals are of equal amplitude, and peak value of their sums is –0.5 dB from full scale. The IMD products are normalized to a 0 dB input signal. Effective Aperture Delay—The difference between the switch delay and the analog delay of the SHA channel. A negative number indicates that the analog portion of the overall delay is greater than the switch portion. This effective delay represents the point in time, relative to the hold command, that the input signal will be sampled. Aperture Jitter—The variations in aperture delay for successive samples. Aperture jitter puts an upper limit on the maximum frequency that can be accurately sampled. Hold Settling Time—The time required for the output to settle to within a specified level of accuracy of its final held value after the hold command has been given. FUNCTIONAL DESCRIPTION The AD781 is a complete sample-and hold amplifier that provides high speed sampling to 12-bit accuracy in less than 700 ns. Droop Rate—The drift in output voltage while in the hold mode. Feedthrough—The attenuated version of a changing input signal that appears at the output when the SHA is in the hold mode. The AD781 is completely self-contained, including an on-chip hold capacitor, and requires no external components or adjustments to perform the sampling function. Both input and output are treated as a single-ended signal, referred to common. Hold Mode Offset—The difference between the input signal and the held output. This offset term applies only in the hold mode and includes the error caused by charge injection and all other internal offsets. It is specified for an input of 0 V. The AD781 utilizes a proprietary circuit design which includes a self-correcting architecture. This sample-and-hold circuit corrects for internal errors after the hold command has been given, by compensating for amplifier gain and offset errors, and charge injection errors. Due to the nature of the design, the SHA output in the sample mode is not intended to provide an accurate representation of the input. However, in hold mode, the internal circuitry is reconfigured to produce an accurately held version of the input signal. Below is a block diagram of the AD781. Tracking Mode Offset—The difference between the input and output signals when the SHA is in the track mode. Nonlinearity--The deviation from a straight line on a plot of input vs. (held) output as referenced to a straight line drawn between endpoints, over an input range of –5 V and +5 V. Gain Error—Deviation from a gain of +1 on the transfer function of input vs. held output. Power Supply Rejection Ratio—A measure of change in the held output voltage for a specified change in the positive or negative supply. Sampled DC Uncertainty—The internal rms SHA noise that is sampled onto the hold capacitor. 1 IN 2 8 OUT 7 S/H 6 NC 5 VEE X1 Hold Mode Noise—The rms noise at the output of the SHA while in the hold mode, specified over a given bandwidth. Total Output Noise—The total rms noise that is seen at the output of the SHA while in the hold mode. It is the rms summation of the sampled dc uncertainty and the hold mode noise. COMMON 3 NC 4 AD781 Functional Block Diagram Output Drive Current—The maximum current the SHA can source (or sink) while maintaining a change in hold mode offset of less than 2.5 mV. REV. A VCC –5– AD781 DYNAMIC PERFORMANCE (VOUT HOLD – VIN ), mV VOUT ACQUISITION ACCURACY – % The AD781 is compatible with 12-bit A-to-D converters in terms of both accuracy and speed. The fast acquisition time, fast hold settling time and good output drive capability allow the AD781 to be used with high speed, high resolution A-to-D converters like the AD674 and AD7672. The AD781’s fast acquisition time provides high throughput rates for multichannel data acquisition systems. Typically, the sample and hold can acquire a 10 V step in less than 600 ns. Figure 1 shows the settling accuracy as a function of acquisition time. +1 V IN , VOLTS –4 –5 –3 –2 –1 3 2 1 4 +5 HOLD MODE OFFSET 0.08 –1 GAIN ERROR 0.06 NONLINEARITY 0.04 Figure 3. Hold Mode Offset, Gain Error and Nonlinearity 0.02 0 0 250 500 750 1000 ACQUISITION TIME – ns For applications where it is important to obtain zero offset, the hold mode offset may be nulled externally at the input to the A-to-D converter. Adjustment of the offset may be accomplished through the A-to-D itself or by an external amplifier with offset nulling capability (e.g., AD711). The offset will change less than 0.5 mV over the specified temperature range. Figure 1. VOUT Settling vs. Acquisition Time The hold settling determines the required time, after the hold command is given, for the output to settle to its final specified accuracy. The typical settling behavior of the AD781 is shown in Figure 2. The settling time of the AD781 is sufficiently fast to allow the SHA, in most cases, to directly drive an A-to-D converter without the need for an added “start convert” delay. SUPPLY DECOUPLING AND GROUNDING CONSIDERATIONS As with any high speed, high resolution data acquisition system, the power supplies should be well regulated and free from excessive high frequency noise (ripple). The supply connection to the AD781 should also be capable of delivering transient currents to the device. To achieve the specified accuracy and dynamic performance, decoupling capacitors must be placed directly at both the positive and negative supply pins to common. Ceramic type 0.1 µF capacitors should be connected from VCC and VEE to common. ANALOG P.S. C +12V 0.1µF DIGITAL P.S. –12V 0.1µF C 1µF 1µF +5V 1µF + INPUTS Figure 2. Typical AD781 Hold Mode AD781 HOLD MODE OFFSET The dc accuracy of the AD781 is determined primarily by the hold mode offset. The hold mode offset refers to the difference between the final held output voltage and the input signal at the time the hold command is given. The hold mode offset arises from a voltage error introduced onto the hold capacitor by charge injection of the internal switches. The nominal hold mode offset is specified for a 0 V input condition. Over the input range of –5 V to +5 V, the AD781 is also characterized for an effective gain error and nonlinearity of the held value, as shown in Figure 3. As indicated by the AD781 specifications, the hold mode offset is very stable over temperature. 7 9 11 15 AD674 1 DIGITAL DATA OUTPUT SIGNAL GROUND Figure 4. Basic Grounding and Decoupling Diagram The AD781 does not provide separate analog and digital ground leads as is the case with most A-to-D converters. The common pin is the single ground terminal for the device. It is the reference point for the sampled input voltage and the held output voltage and also the digital ground return path. The common pin should be connected to the reference (analog) ground of the A-to-D converter with a separate ground lead. Since the analog and digital grounds in the AD781 are connected internally, the –6– REV. A AD781 Measurements of Figures 7 and 8 were made using a 14-bit A/D converter with VIN = 10 V p-p and a sample frequency of 100 kSPS. common pin should also be connected to the digital ground, which is usually tied to analog common at the A-to-D converter. Figure 4 illustrates the recommended decoupling and grounding practice. 1% NOISE CHARACTERISTICS 1/2 BIT @ 8 BITS Designers of data conversion circuits must also consider the effect of noise sources on the accuracy of the data acquisition system. A sample-and-hold amplifier that precedes the A-to-D converter introduces some noise and represents another source of uncertainty in the conversion process. The noise from the AD781 is specified as the total output noise, which includes both the sampled wideband noise of the SHA in addition to the band limited output noise. The total output noise is the rms sum of the sampled dc uncertainty and the hold mode noise. A plot of the total output noise vs. the equivalent input bandwidth of the converter being used is given in Figure 5. 0.1% 1/2 BIT @ 10 BITS 1/2 BIT @ 12 BITS 0.01% 1/2 BIT @ 14 BITS APERTURE JITTER TYPICAL AT 50ps 1k 300 10k 100k 1M FREQUENCY – Hz –65 200 –70 –75 100 THD – dB OUTPUT NOISE – µV rms Figure 6. Error Magnitude vs. Frequency –80 –85 0 1k 10k 100k 1M 10M FREQUENCY – Hz –90 Figure 5. RMS Noise vs. Input Bandwidth of ADC –95 100 DRIVING THE ANALOG INPUTS 100k 10k 1M Figure 7. Total Harmonic Distortion vs. Frequency 90 80 S/(N + D) – dB 70 HIGH FREQUENCY SAMPLING Aperture jitter and distortion are the primary factors which limit frequency domain performance of a sample-and-hold amplifier. Aperture jitter modulates the phase of the hold command and produces an effective noise on the sampled analog input. The magnitude of the jitter induced noise is directly related to the frequency of the input signal. 60 50 40 30 20 10 0 100 A graph showing the magnitude of the jitter induced error vs. frequency of the input signal is given in Figure 6. 1k 10k 100k FREQUENCY – Hz Figure 8. Signal/(Noise and Distortion) vs. Frequency The accuracy in sampling high frequency signals is also constrained by the distortion and noise created by the sample-and hold. The level of distortion increases with frequency and reduces the “effective number of bits” of the conversion. REV. A 1k FREQUENCY – Hz For best performance, it is important to drive the AD781 analog input from a low impedance signal source. This enhances the sampling accuracy by minimizing the analog and digital crosstalk. Signals which come from higher impedance sources (e.g., over 5 kΩ) will have a relatively higher level of crosstalk. For applications where signals have high source impedance, an operational amplifier buffer in front of the AD781 is required. The AD711 (precision BiFET op amp) is recommended for these applications. –7– AD781 AD781 TO AD674 INTERFACE 20 Figure 9 shows a typical data acquisition circuit using the AD781, a high linearity, low aperture jitter SHA and the AD674 a 12-bit high speed ADC. The time between the AD674 status line going high and the actual start of conversion allows the AD781 to settle to 0.01%. As a result, the AD674 status line can be used to control the AD781; only an inverter is needed to interface the two devices. 0 STATUS –40 C1509–10–2/91 AMPLITUDE – dB –20 –60 –80 –100 +5V 7404 OR EQUIV. +12V CE 12/8 28 STS 0.1µF –120 0.1µF 1 2 6 VL –140 0 2 6 IN OUT 3 8 5 AD674 13 10 V IN AD781 GND 16 NC 14 20 VIN VEE 13 16 20 23 26 30 33 D0–11 27 12-BIT THREE-STATE DATA GAIN 10 REF IN 0.1µF 100Ω –12V 8 REF OUT 100Ω 12 BIP OFFSET OFFSET 5 R/C CONVERT 9 AGND 7 11 +12V 4.7µF –12V 0.1µF 0.1µF 4.7µF Figure 9. AD781 to AD674 Interface OUTLINE DIMENSIONS Dimensions shown in inches and (mm). Cerdip (Q) Package Mini-DIP (N) Package PRINTED IN U.S.A. VIN 4 A0 NC 10 Figure 10. FFT Plot of AD781 to AD674 Interface, FIN = 1 kHz 3 CS 4 NC S/H 7 FREQUENCY BINS – kHz 15 DGND 7 1 VCC 3 –8– REV. A