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BUF634UG4

BUF634UG4

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    SOIC8_150MIL

  • 描述:

    Buffer Amplifier 1 Circuit 8-SOIC

  • 数据手册
  • 价格&库存
BUF634UG4 数据手册
Product Folder Order Now Support & Community Tools & Software Technical Documents BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 BUF634 250-mA High-Speed Buffer A newer version of this device is now available: BUF634A 1 Features 3 Description • The BUF634 is a high speed, unity-gain open-loop buffer recommended for a wide range of applications. The BUF634 can be used inside the feedback loop of op amps to increase output current, eliminate thermal feedback, and improve capacitive load drive. 1 • • • • • • • • A newer version of this device is now available: BUF634A High output current: 250 mA Slew rate: 2000 V/µs Pin-selected bandwidth: 30 MHz to 180 MHz Low quiescent current: 1.5 mA (30 MHz BW) Wide supply range: ±2.25 to ±18 V Internal current limit Thermal shutdown protection 8-pin PDIP, SOIC-8, 5-lead TO-220, 5-lead DDPAK-TO-263 surface-mount Output circuitry is fully protected by internal current limit and thermal shut-down, making the device rugged and easy to use. The BUF634 is available in a variety of packages to suit mechanical and power dissipation requirements. Types include 8-pin PDIP, SOIC-8 surface-mount, 5lead TO-220, and a 5-lead DDPAK-TO-263 surfacemount plastic power package. 2 Applications • • • • • • • • • For low power applications, the BUF634 operates on 1.5-mA quiescent current with 250-mA output, 2000-V/µs slew rate, and 30-MHz bandwidth. Bandwidth can be adjusted from 30 MHz to 180 MHz by connecting a resistor between V– and the BW Pin. Valve driver Solenoid driver Op amp current booster Line driver Headphone driver Video driver Motor driver Test equipment ATE pin driver The upgraded device, BUF634A offers a wider bandwidth (210 MHz) and a higher slew rate (3750 V/µs) at 40% lower quiescent current. See the Device Comparison Table for a selection of unitygain, open-loop buffers from Texas Instruments. Device Information(1) PART NUMBER BUF634 PACKAGE BODY SIZE (NOM) SOIC (8) 3.91 mm × 4.90 mm PDIP (8) 6.35 mm × 9.81 mm TO-220 (5) 8.51 mm × 10.16 mm DDPAK/TO-263 (5) 8.42 mm × 10.16 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Boost the Output Current of any Operational Amplifier 1 2 OPA2810 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Device Comparison Table..................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 3 4 7.1 7.2 7.3 7.4 7.5 7.6 4 4 4 4 5 7 Absolute Maximum Ratings ...................................... ESD Ratings ............................................................ Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Typical Characteristics .............................................. Detailed Description ............................................ 10 8.1 Overview ................................................................. 10 8.2 Functional Block Diagram ....................................... 10 8.3 Feature Description................................................. 11 8.4 Device Functional Modes........................................ 11 9 Application and Implementation ........................ 12 9.1 Application Information............................................ 12 9.2 Typical Application ................................................. 14 10 Power Supply Recommendations ..................... 15 11 Layout................................................................... 15 11.1 Layout Guidelines ................................................. 15 11.2 Layout Example .................................................... 17 12 Device and Documentation Support ................. 18 12.1 12.2 12.3 12.4 12.5 12.6 12.7 Device Support .................................................... Documentation Support ....................................... Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 18 18 18 18 19 19 19 13 Mechanical, Packaging, and Orderable Information ........................................................... 19 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision A (November 2015) to Revision B Page • Added discussion of BUF634A upgrade device to Features and Description sections ......................................................... 1 • Changed amplifier to OPA2810 and deleted table from Boost the Output Current of any Operational Amplifier figure........ 1 • Added Device Comparison Table .......................................................................................................................................... 3 Changes from Original (September 2000) to Revision A • 2 Page Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section. ................................................................................................ 1 Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 5 Device Comparison Table DEVICE VS± (V) IQ/CHANNEL (mA) BW (MHz) SLEW RATE (V/µs) VOLTAGE NOISE (nV/√Hz) BUF634A ±18 1.5 – 8.5 35 – 210 3750 3.4 Unity-gain, open-loop buffer BUF634 ±18 1.5 – 15 30 – 180 2000 4 Unity-gain, open-loop buffer LMH6321 ±18 11 110 1800 2.8 AMPLIFIER DESCRIPTION Unity-gain, open-loop buffer with adjustable current limit 6 Pin Configuration and Functions P and D Packages 8-Pin PDIP and SOIC Top View KC Package 5-Pin TO-220 Top View BW 1 8 NC NC 2 7 V+ VIN 3 6 VO V– 4 5 NC G=1 G=1 1 2 3 4 5 BW V– V+ VIN VO KTT Package 5-Pin DDPAK/TO-263 Top View G=1 1 2 3 4 5 BW V– V+ VIN VO Pin Functions PIN NAME NO. 8 PINS I/O DESCRIPTION 5 PINS BW 1 1 I Bandwidth adjust pin NC 2, 5, 8 — – No internal connection V+ 7 5 I Positive power supply VIN 3 2 I Input VO 6 4 O Output V– 4 3 I Negative power supply Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 3 A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN Supply voltage Input voltage MAX UNIT ±18 V ±VS Output short-circuit (to ground) Continuous Operating temperature –40 125 °C Junction temperature 150 °C Lead temperature (soldering, 10 s) 300 °C 125 °C Storage temperature, Tstg (1) –55 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 7.2 ESD Ratings VALUE UNIT Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2500 V Charged-device model (CDM), per JEDEC specification JESD22-C101 (2) ±1000 V ±2500 V BUF634F in PDIP and SOIC Packages V(ESD) Electrostatic discharge BUF634F in SOIC-8 Package Only V(ESD) Electrostatic discharge, BUF634F in TO-220 and DDPAK Packages V(ESD) (1) (2) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) Vs = (V+) - (V-) Supply voltage TA Operating temperature MIN NOM MAX UNIT ±2.25 (4.5) ±15 (30) ±18 (36) V -40 +25 +85 °C 7.4 Thermal Information BUF634 THERMAL METRIC (1) RθJA SOIC TO-220 DDPAK-TO-263 8 PINS 8 PINS 5 PINS 5 PINS UNIT 46.5 103.4 32.1 41.8 °C/W RθJC(top) Junction-to-case (top) thermal resistance 34.8 44.2 25.6 45 °C/W RθJB Junction-to-board thermal resistance 23.8 44.5 18.3 24.8 °C/W ψJT Junction-to-top characterization parameter 12 5.4 8.5 13.1 °C/W ψJB Junction-to-board characterization parameter 23.6 43.8 17.7 23.8 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance n/a n/a 0.7 2.4 °C/W (1) 4 Junction-to-ambient thermal resistance PDIP For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 7.5 Electrical Characteristics at TA = +25°C (1), VS = ±15 V, specifications are for both low quiescent-current mode and wide-bandwidth mode (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX ±30 ±100 UNIT INPUT Offset Voltage Offset Voltage vs Temperature Specified Temperature Range Offset Voltage vs Power Supply VS = ±2.25 V (2) to ±18 V Input Bias Current Low Quiescent Current Mode VIN = 0V Input Impedance mV µV/°C 0.1 1 ±0.5 ±2 ±5 ±20 mV/V µA Wide Bandwidth Mode Low Quiescent Current Mode RL = 100 Ω Noise Voltage ±100 80 || 8 MΩ || pF Wide Bandwidth Mode 8 || 8 f = 10 kHz 4 nV/√Hz GAIN Gain RL = 1 kΩ, VO = ±10 V 0.95 0.99 RL = 100 Ω, VO = ±10 V 0.85 0.93 RL = 67 Ω, VO = ±10 V 0.8 0.9 V/V OUTPUT Current Output, Continuous Voltage Output ±250 Positive IO = 10 mA (V+) –2.1 (V+) –1.7 Negative IO = –10 mA (V–) +2.1 (V–) +1.8 Positive IO = 100 mA (V+) –3 (V+) –2.4 Negative IO = –100 mA (V–) +4 (V–) +3.5 Positive IO = 150 mA (V+) –4 (V+) –2.8 Negative IO = –150 mA (V–) +5 (V–) +4 Short-Circuit Current mA V Low Quiescent Current Mode ±350 ±550 Wide Bandwidth Mode ±400 ±550 mA DYNAMIC RESPONSE Low Quiescent Current Mode RL = 1 kΩ Wide Bandwidth Mode Bandwidth, –3dB RL = 100 Ω Slew Rate Settling Time Differential Gain Differential Phase (1) (2) 1% 180 MHz Low Quiescent Current Mode 20 Low Quiescent Current Mode 160 20 Vp-p, RL = 100 Ω 0.1% 30 20-V Step, RL = 100 Ω Low Quiescent 3.58 MHz, VO = 0.7 V, Current Mode RL = 150 Ω Wide Bandwidth Mode Low Quiescent 3.58 MHz, VO = 0.7 V, Current Mode RL = 150 Ω Wide Bandwidth Mode 2000 200 50 V/µs ns 4% 0.4% 2.5 ° 0.1 Tests are performed on high speed automatic test equipment, at approximately 25°C junction temperature. The power dissipation of this product will cause some parameters to shift when warmed up. SeeTypical Characteristics for over-temperature performance. Limited output swing available at low supply voltage. See Output voltage specifications. Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 5 A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com Electrical Characteristics (continued) at TA = +25°C(1), VS = ±15 V, specifications are for both low quiescent-current mode and wide-bandwidth mode (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT POWER SUPPLY Specified Operating Voltage ±15 ±2.25 (2) Operating Voltage Range IQ Quiescent Current IO = 0 V ±18 Low Quiescent Current Mode ±1.5 ±2 Wide Bandwidth Mode ±15 ±20 V mA TEMPERATURE RANGE TJ 6 Specification –40 85 °C Operating –40 125 °C Thermal Shutdown Temperature 175 Submit Documentation Feedback °C Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 7.6 Typical Characteristics at TA = 25°C, VS = ±15 V (unless otherwise noted) –10 0 –40 Phase (°) –5 Wide BW –15 –20 TJ = –40°C TJ = 25°C TJ = 125°C Low IQ –30 –40 –50 –50 10M 100M Frequency (Hz) 1G 1M Figure 1. Gain and Phase vs Frequency vs Quiescent Current 0 Wide BW –5 Low IQ 1G Figure 2. Gain and Phase vs Frequency vs Temperature RS = 50Ω VO = 10mV Gain (dB) 10 RL = 100Ω VO = 10mV 5 10M 100M Frequency (Hz) –5 Wide BW –20 –30 RS = 0Ω RS = 50Ω RS = 100Ω Low IQ –40 –15 –10 Phase (°) Phase (°) –10 0 –15 –10 Wide BW –20 RL = 1kΩ RL = 100Ω RL = 50Ω Low IQ –30 –40 –50 –50 1M 10M 100M Frequency (Hz) 1G 1M Figure 3. Gain and Phase vs Frequency vs Source Resistance 10M 100M Frequency (Hz) 10 5 0 –5 1G Figure 4. Gain and Phase vs Frequency vs Load Resistance RL = 100Ω RS = 50Ω VO = 10mV Gain (dB) RL = 100Ω RS = 50Ω VO = 10mV Low IQ Mode 0 –40 Phase (°) –30 CL = 0 CL = 50pF CL = 200pF CL = 1nF –20 –30 –40 –50 0 –15 –10 CL = 0pF CL = 50pF CL = 200pF CL = 1nF –20 5 –10 0 –15 –10 10 –5 Wide BW Mode –10 Phase (°) 5 0 Wide BW Low IQ –10 0 10 Gain (dB) 1M Gain (dB) Phase (°) –30 0 –10 IQ = 15mA IQ = 9mA IQ = 4mA IQ = 2.5mA IQ = 1.5mA –20 5 –10 0 –15 –10 Wide BW Low IQ 10 Gain (dB) –5 RL = 100Ω RS = 50Ω VO = 10mV Gain (dB) 10 RL = 100Ω 5 RS = 50Ω VO = 10mV 0 –50 1M 10M 100M Frequency (Hz) 1G Figure 5. Gain and Phase vs Frequency vs Load Capacitance 1M 10M 100M Frequency (Hz) 1G Figure 6. Gain and Phase vs Frequency vs Load Capacitance Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 7 A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com Typical Characteristics (continued) at TA = 25°C, VS = ±15 V (unless otherwise noted) 100 5 90 0 –5 Low IQ –10 0 –15 Phase (°) –10 Wide BW –20 Low IQ –30 –40 VS = ±18V VS = ±12V VS = ±5V VS = ±2.25V Power Supply Rejection (dB) Wide BW 10 Gain (dB) RL = 100Ω RS = 50Ω VO = 10mV 80 Wide BW 70 60 50 40 Low IQ 30 20 10 –50 0 1M 10M 100M Frequency (Hz) 1G 1k 10k 100k 1M 10M Frequency (Hz) Figure 7. Gain and Phase vs Frequency vs Power Supply Voltage 20 Figure 8. Power Supply Rejection vs Frequency 500 +15V 18 450 15mA at R = 0 14 BW 12 R Limit Current (mA) Quiescent Current (mA) 16 10 8 –15V 6 4 400 Wide Bandwidth Mode 350 Low IQ Mode 300 250 2 1.5mA at R = ∞ 0 200 10 100 1k 10k –50 –25 0 25 50 75 100 125 150 Resistance (Ω) Junction Temperature (°C) Figure 9. Quiescent Current vs Bandwidth Control Resistance Figure 10. Short-Circuit Current vs Temperature 7 20 Cooling Low IQ Mode Quiescent Current (mA) Quiescent Current (mA) 6 5 4 »10°C 3 2 Thermal Shutdown 15 10 »10°C Wide BW Mode 5 1 Cooling Thermal Shutdown 0 0 –50 –25 0 25 50 75 100 125 150 175 200 –50 Figure 11. Quiescent Current vs Temperature 8 –25 0 25 50 75 100 125 150 175 200 Junction Temperature (°C) Junction Temperature (°C) Figure 12. Quiescent Current vs Temperature Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 Typical Characteristics (continued) at TA = 25°C, VS = ±15 V (unless otherwise noted) 13 13 VIN = 13V 11 VS = ±15V Low IQ Mode 10 –10 –11 TJ = –40°C TJ = 25°C TJ = 125°C –12 VIN = –13V VIN = 13V 12 Output Voltage Swing (V) Output Voltage Swing (V) 12 11 VS = ±15V Wide BW Mode 10 –10 –11 TJ = –40°C TJ = 25°C TJ = 125°C –12 VIN = –13V –13 –13 0 50 100 150 200 250 300 0 50 100 |Output Current| (mA) 150 200 Figure 13. Output Voltage Swing vs Output Current TO-220 and DDPAK Infinite Heat Sink ΘJC = 6°C/W Power Dissipation (W) Power Dissipation (W) 10 TO-220 and DDPAK Free Air ΘJA = 65°C/W 8-Pin DIP ΘJA = 100°C/W 300 Figure 14. Output Voltage Swing vs Output Current 12 3 2 250 |Output Current| (mA) 1 SO-8 ΘJA = 150°C/W 8 6 TO-220 and DDPAK Free Air ΘJA = 65°C/W 4 2 0 0 –50 –25 0 25 50 75 100 125 –50 150 –25 0 25 50 75 100 125 150 Ambient Temperature (°C) Ambient Temperature (°C) Figure 15. Maximum Power Dissipation vs Temperature Input 100mV/div Figure 16. Maximum Power Dissipation vs Temperature Input Wide BW Mode Wide BW Mode Low IQ Mode Low IQ Mode 20ns/div RS = 50 Ω, RL = 100 Ω 100mV/div 20ns/div RS = 50 Ω, RL = 100 Ω Figure 17. Small-Signal Response Figure 18. Large-Signal Response Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 9 A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com 8 Detailed Description 8.1 Overview The BUF634 device is a high speed, unity-gain open-loop buffer recommended for a wide range of applications. The BUF634 device can be used inside the feedback loop of op amps to increase output current, eliminate thermal feedback, and improve capacitive load drive. For low power applications, the BUF634 device operates on 1.5-mA quiescent current with 250-mA output, 2000-V/µs slew rate, and 30-MHz bandwidth. Bandwidth can be adjusted from 30 MHz to 180 MHz by connecting a resistor between V– and the BW Pin refer to Figure 9 and Figure 1. Output circuitry is fully protected by internal current limit and thermal shut-down, making it rugged and easy to use. See the Functional Block Diagram section for a simplified circuit diagram of the BUF634 showing its open-loop complementary follower design. 8.2 Functional Block Diagram V+ Thermal Shutdown VIN 200Ω VO I1(1) 150Ω 4kΩ BW V– Signal path indicated in bold. Note: (1) Stage currents are set by I1. 10 Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 8.3 Feature Description 8.3.1 Output Current The BUF634 device can deliver up to ±250-mA continuous output current. Internal circuitry limits output current to approximately ±350 mA; see Figure 10. For many applications, however, the continuous output current will be limited by thermal effects. The output voltage swing capability varies with junction temperature and output current (see Figure 14). Although all four package types are tested for the same output performance using a high speed test, the higher junction temperatures with the DIP and SO-8 package types often provide less output voltage swing. Junction temperature is reduced in the DDPAK surface-mount power package because it is soldered directly to the circuit board. The TO-220 package used with a good heat sink further reduces junction temperature, allowing maximum possible output swing. 8.4 Device Functional Modes The BUF634 is operational when the power-supply voltage is greater than 4.5 V (±2.25 V). The maximum power supply voltage for the BUF634 is 36 V (±18 V). At low power supply conditions, such as ±2.25 V, the output swing may be limited. Refer to Electrical Characteristics for additional information. Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 11 A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information Figure 19 shows the BUF634 device connected as an open-loop buffer. The source impedance and optional input resistor, RS, influence frequency response: see Typical Characteristics. Power supplies should be bypassed with capacitors connected close to the device pins. Capacitor values as low as 0.1 µF assure stable operation in most applications, but high output current and fast output slewing can demand large current transients from the power supplies. Solid tantalum 10-µF capacitors are recommended. High frequency open-loop applications may benefit from special bypassing and layout considerations. See High Frequency Applications for more information. V+ 10µF DIP/SO-8 Pinout shown 7 VIN RS 3 BUF634 4 1 6 VO RL 10µF Optional connection for wide bandwidth — see text. V– Figure 19. Buffer Connections 9.1.1 High Frequency Applications The excellent bandwidth and fast slew rate of the BUF634 device are useful in a variety of high frequency openloop applications. When operated open-loop, printed-circuit-board layout and bypassing technique can affect dynamic performance. For best results, use a ground plane-type circuit board layout and bypass the power supplies with 0.1-µF ceramic chip capacitors at the device pins in parallel with solid tantalum 10-µF capacitors. Source resistance affects highfrequency peaking, step-response overshoot and ringing. Best response is usually achieved with a series input resistor of 25 Ω to 200 Ω, depending on the signal source. Response with some loads (especially capacitive) can be improved with a resistor of 10 Ω to 150 Ω in series with the output. Figure 20. High Performance Headphone Driver 12 Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 Application Information (continued) +24V C(1) 10kΩ + 10µF BUF634 C(1) 10kΩ + 12V – pseudo ground + 12V – NOTE: (1) System bypass capacitors. Figure 21. Pseudo-Ground Driver IO = ±200mA VIN ±2V OPA177 BUF634 Valve 10Ω Figure 22. Current-Output Valve Driver 10kΩ 1kΩ VIN ±1V 10kΩ 9kΩ 1/2 OPA2234 BUF634 Motor BUF634 1/2 OPA2234 ±20V at 250mA Figure 23. Bridge-Connected Motor Driver Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 13 A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com 9.2 Typical Application 9.2.1 Boosting Op Amp Output Current The BUF634 device can be connected inside the feedback loop of most op amps to increase output current (see Figure 24). When connected inside the feedback loop, the offset voltage of the BUF634 device and other errors are corrected by the feedback of the op amp. V+ C1(1) VO VIN OPA BUF634 BW NOTE: (1) C1 not required for most common op amps. Use with unity-gain stable high speed op amps. Wide BW mode (if required) V– OP AMP RECOMMENDATIONS OPA177, OPA1013 OPA111, OPA2111 OPA121, OPA234 (1), OPA130 (1) Use Low I Q mode. G = 1 stable. OPA27, OPA2107 OPA602, OPA131 (1) Low I Q mode is stable. Increasing CL may cause excessive ringing or instability. Use Wide BW mode. OPA627, OPA132 (1) Use Wide BW mode, C1 = 200pF. G = 1 stable. OPA637, OPA37 Use Wide BW mode. These op amps are not G = 1 stable. Use in G > 4. NOTE: (1) Single, dual, and quad versions. Figure 24. Boosting Op Amp Output Current 9.2.1.1 Design Requirements • • • • • • Boost the output current of an OPA627 Operate from ±15V power supplies Operate from -40°C to +85°C Gain = 23.5 V/V Output current = ±250 mA Bandwidth greater than 100 kHz 9.2.1.2 Detailed Design Procedure To assure that the composite amplifier remains stable, the phase shift of the BUF634 device must remain small throughout the loop gain of the circuit. For a G=+1 op amp circuit, the BUF634 device must contribute little additional phase shift (approximately 20° or less) at the unity-gain frequency of the op amp. Phase shift is affected by various operating conditions that may affect stability of the op amp; see Typical Characteristics. Most general-purpose or precision op amps remain unity-gain stable with the BUF634 device connected inside the feedback loop as shown. Large capacitive loads may require the BUF634 device to be connected for wide bandwidth for stable operation. High speed or fast-settling op amps generally require the wide bandwidth mode to remain stable and to assure good dynamic performance. To check for stability with an op amp, look for oscillations or excessive ringing on signal pulses with the intended load, and worst-case conditions that affect phase response of the buffer. Connect the circuit as shown in Figure 24. Choose resistors to provide a voltage gain of 23.5 V/V. Select the feedback resistor to be 2.7 kΩ. Choose the input resistor to be 120 Ω. 14 Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 Typical Application (continued) 9.2.1.3 Application Curve Gain (db) 40 20 0 100 1k 10k Frequency (Hz) 100k 1M Figure 25. Frequency Response of Composite Amplifier 10 Power Supply Recommendations The BUF634 is specified for operation from 4.5V to 36 V (±2.25 V to ±18 V). Many specifications apply from –40°C to +85°C. Parameters that can exhibit significant variance with regard to operating voltage or temperature are presented in the Typical Characteristics. 11 Layout 11.1 Layout Guidelines For best operational performance of the device, use good PCB layout practices, including: • Noise can propagate into analog circuitry through the power pins of the circuit. Bypass capacitors are used to reduce the coupled noise by providing low-impedance power sources local to the analog circuitry. – Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as close to the device as possible. A single bypass capacitor from V+ to ground is applicable for singlesupply applications. • Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground planes. A ground plane helps distribute heat and reduces EMI noise pickup. Make sure to physically separate digital and analog grounds paying attention to the flow of the ground current. For more detailed information refer to Circuit Board Layout Techniques, SLOA089. • In order to reduce parasitic coupling, run the input traces as far away from the supply or output traces as possible. If these traces cannot be kept separate, crossing the sensitive trace perpendicular is much better as opposed to in parallel with the noisy trace. • Place the external components as close to the device as possible. As illustrated in Figure 27 • Keep the length of input traces as short as possible. Always remember that the input traces are the most sensitive part of the circuit. • Cleaning the PCB following board assembly is recommended for best performance. • Any precision integrated circuit may experience performance shifts due to moisture ingress into the plastic package. Following any aqueous PCB cleaning process, baking the PCB assembly is recommended to remove moisture introduced into the device packaging during the cleaning process. A low temperature, post cleaning bake at 85°C for 30 minutes is sufficient for most circumstances. Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 15 A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com Layout Guidelines (continued) Power dissipated in the BUF634 device causes the junction temperature to rise. A thermal protection circuit in the BUF634 device disables the output when the junction temperature reaches approximately 175°C. When the thermal protection is activated, the output stage is disabled, allowing the device to cool. Quiescent current is approximately 6 mA during thermal shutdown. When the junction temperature cools to approximately 165°C, the output circuitry is again enabled. This can cause the protection circuit to cycle on and off with a period ranging from a fraction of a second to several minutes or more, depending on package type, signal, load and thermal environment. The thermal protection circuit is designed to prevent damage during abnormal conditions. Any tendency to activate the thermal protection circuit during normal operation is a sign of an inadequate heat sink or excessive power dissipation for the package type. The TO-220 package provides the best thermal performance. When the TO-220 is used with a properly sized heat sink, output is not limited by thermal performance. See Application Bulletin AB-037 for details on heat sink calculations. The DDPAK also has excellent thermal characteristics. Its mounting tab should be soldered to a circuit board copper area for good heat dissipation. Figure 26 shows typical thermal resistance from junction to ambient as a function of the copper area. The mounting tab of the TO-220 and DDPAK packages is electricallyconnected to the V– power supply. The DIP and SO-8 surface-mount packages are excellent for applications requiring high output current with low average power dissipation. To achieve the best possible thermal performance with the DIP or SO-8 packages, solder the device directly to a circuit board. Because much of the heat is dissipated by conduction through the package pins, sockets will degrade thermal performance. Use wide circuit board traces on all the device pins, including pins that are not connected. With the DIP package, use traces on both sides of the printed circuit board if possible. THERMAL RESISTANCE vs CIRCUIT BOARD COPPER AREA Thermal Resistance, ΘJA (°C/W) 60 Circuit Board Copper Area BUF634F Surface Mount Package 1oz copper 50 40 30 20 BUF634F Surface Mount Package 10 0 1 2 3 4 5 Copper Area (inches2) Figure 26. Thermal Resistance vs Circuit Board Copper Area 11.1.1 Power Dissipation Power dissipation depends on power supply voltage, signal, and load conditions. With DC signals, power dissipation is equal to the product of output current times the voltage across the conducting output transistor, VS – VO. Power dissipation can be minimized by using the lowest possible power supply voltage necessary to assure the required output voltage swing. For resistive loads, the maximum power dissipation occurs at a DC output voltage of one-half the power supply voltage. Dissipation with AC signals is lower. Application Bulletin SBOS022 explains how to calculate or measure power dissipation with unusual signals and loads. Any tendency to activate the thermal protection circuit indicates excessive power dissipation or an inadequate heat sink. For reliable operation, junction temperature should be limited to 150°C, maximum. To estimate the margin of safety in a complete design, increase the ambient temperature until the thermal protection is triggered. The thermal protection should trigger more than 45°C above the maximum expected ambient condition of your application. 16 Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 11.2 Layout Example Optional: Use for wide bandwidth applications Place all passive components close to the device to reduce parasitic errors VS+ Run the input trace as far away from the supply lines as possible BW BUF634 SOIC Package NC NC V+ VIN VO V± NC 10 µF GND RS VIN Output Use low-ESR, ceramic bypass capacitor 10 µF Use low-ESR, ceramic bypass capacitor GND VS± Ground (GND) plane on another layer Figure 27. BUF634 Layout Example Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 17 A newer version of this device is now available: BUF634A BUF634 SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 www.ti.com 12 Device and Documentation Support 12.1 Device Support 12.1.1 TINA-TI™ (Free Software Download) TINA™ is a simple, powerful, and easy-to-use circuit simulation program based on a SPICE engine. TINA-TI is a free, fully-functional version of the TINA software, preloaded with a library of macro models in addition to a range of both passive and active models. TINA-TI provides all the conventional dc, transient, and frequency domain analysis of SPICE, as well as additional design capabilities. Available as a free download from the Analog eLab Design Center, TINA-TI offers extensive post-processing capability that allows users to format results in a variety of ways. Virtual instruments offer the ability to select input waveforms and probe circuit nodes, voltages, and waveforms, creating a dynamic quick-start tool. NOTE These files require that either the TINA software (from DesignSoft™) or TINA-TI software be installed. Download the free TINA-TI software from the TINA-TI folder. 12.1.2 TI Precision Designs The BUF634 is featured in several TI Precision Designs, available online at http://www.ti.com/. TI Precision Designs are analog solutions created by TI’s precision analog applications experts and offer the theory of operation, component selection, simulation, complete PCB schematic and layout, bill of materials, and measured performance of many useful circuits. 12.2 Documentation Support 12.2.1 Related Documentation For related documentation see the following: • Texas Instruments, Circuit board layout techniques application report • Texas Instruments, Combining an amplifier with the BUF634 application note • Texas Instruments, Add current limit to the BUF634 application note • Texas Instruments, Power amplifier stress and power handling limitations application note • Texas Instruments, Shelf-Life Evaluation of Lead-Free Component Finishes application report 12.3 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 12.4 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 18 Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 A newer version of this device is now available: BUF634A BUF634 www.ti.com SBOS030B – SEPTEMBER 2000 – REVISED MARCH 2019 12.5 Trademarks E2E is a trademark of Texas Instruments. TINA-TI is a trademark of Texas Instruments, Inc and DesignSoft, Inc. TINA, DesignSoft are trademarks of DesignSoft, Inc. All other trademarks are the property of their respective owners. 12.6 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.7 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Submit Documentation Feedback Copyright © 2000–2019, Texas Instruments Incorporated Product Folder Links: BUF634 19 PACKAGE OPTION ADDENDUM www.ti.com 14-Oct-2022 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) BUF634F/500 NRND DDPAK/ TO-263 KTT 5 500 RoHS & Green Call TI | SN Level-2-260C-1 YEAR -40 to 125 BUF634F BUF634F/500E3 NRND DDPAK/ TO-263 KTT 5 500 RoHS & Green SN Level-2-260C-1 YEAR -40 to 125 BUF634F BUF634FKTTT NRND DDPAK/ TO-263 KTT 5 250 RoHS & Green Call TI | SN Level-2-260C-1 YEAR -40 to 125 BUF634F BUF634FKTTTE3 NRND DDPAK/ TO-263 KTT 5 250 RoHS & Green SN Level-2-260C-1 YEAR -40 to 125 BUF634F BUF634T NRND TO-220 KC 5 49 RoHS & Green Call TI | SN N / A for Pkg Type -40 to 125 BUF634T BUF634TG3 NRND TO-220 KC 5 49 RoHS & Green SN N / A for Pkg Type -40 to 125 BUF634T BUF634U NRND SOIC D 8 75 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 BUF 634U BUF634U/2K5 NRND SOIC D 8 2500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 BUF 634U (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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