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ONET8501PB
SLLS910A – JULY 2008 – REVISED JUNE 2016
ONET8501PB 11.3-Gbps Rate-Selectable Limiting Amplifier
1 Features
2 Applications
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Up to 11.3-Gbps Operation
2-Wire Digital Interface
Digitally Selectable Input Bandwidth
Adjustable LOS Threshold
Digitally Selectable Output Voltage
Digitally Selectable Output Preemphasis
Adjustable Input Threshold Voltage
Low Power Consumption
Input Offset Cancellation
CML Data Outputs With On-Chip 50-Ω BackTermination to VCC
Single 3.3-V Supply
Output Disable
Surface Mount Small Footprint 3-mm × 3-mm,
16‑Pin, RoHS compliant VQFN Package
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10-Gigabit Ethernet Optical Receivers
2x, 4x, 8x, and 10x Fiber Channel Optical
Receivers
SONET OC-192/SDH-64 Optical Receivers
SFP+ and XFP Transceiver Modules
XENPAK, XPAK, X2, and 300-Pin MSA
Transponder Modules
Cable Drivers and Receivers
3 Description
The ONET8501PB device is a high-speed, 3.3-V
limiting amplifier for multiple fiber optic and copper
cable applications with data rates from 2 Gbps up to
11.3 Gbps.
The device provides a two-wire serial interface which
allows digital control of the bandwidth, output
amplitude, output preemphasis, input threshold
voltage (slice level), and the loss of signal assert
level. Predetermined settings for bandwidth and LOS
assert levels can also be selected with external rate
selection pins.
Device Information(1)
PART NUMBER
ONET8501PB
PACKAGE
VQFN (16)
BODY SIZE (NOM)
3.00 mm × 3.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
RATE1
RATE0
SCK
SDA
Typical Application Circuit
L1
BLM15HD102SN1
DIN
DIN
DOUT+
RATE0
RATE1
DOUT+
DOUT-
GND
VCC
COC1
C2
0.1 mF
C3
0.1 mF
DOUTC4
0.1 mF
LOS
DIN-
ONET
8501PB
16 Pin QFN
DIS
DIN+
VCC
GND
COC2
C1
0.1 mF
SCK
SDA
VCC
C6
0.1 mF
C5
330 pF
DISABLE
LOS
Copyright © 2016, Texas Instruments Incorporated
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ONET8501PB
SLLS910A – JULY 2008 – REVISED JUNE 2016
www.ti.com
Table of Contents
1
2
3
4
5
6
7
8
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Description (continued).........................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
3
4
7.1
7.2
7.3
7.4
7.5
7.6
4
4
4
4
5
6
Absolute Maximum Ratings ......................................
ESD Ratings..............................................................
Recommended Operating Conditions.......................
DC Electrical Characteristics ....................................
AC Electrical Characteristics.....................................
Typical Characteristics ..............................................
Detailed Description .............................................. 8
8.1 Overview ................................................................... 8
8.2 Functional Block Diagram ......................................... 8
8.3 Feature Description................................................... 9
8.4 Device Functional Modes.......................................... 9
8.5 Programming........................................................... 11
8.6 Register Maps ......................................................... 12
9
Application and Implementation ........................ 18
9.1 Application Information............................................ 18
9.2 Typical Application .................................................. 18
10 Power Supply Recommendations ..................... 20
11 Layout................................................................... 20
11.1 Layout Guidelines ................................................. 20
11.2 Layout Example .................................................... 20
12 Device and Documentation Support ................. 21
12.1
12.2
12.3
12.4
12.5
Receiving Notification of Documentation Updates
Community Resource............................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
21
21
21
21
21
13 Mechanical, Packaging, and Orderable
Information ........................................................... 21
4 Revision History
Changes from Original (July 2008) to Revision A
•
2
Page
Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section ................................................................................................. 1
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SLLS910A – JULY 2008 – REVISED JUNE 2016
5 Description (continued)
The ONET8501PB provides a gain of about 34 dB which ensures a fully differential output swing for input signals
as low as 20 mVpp. The output amplitude can be adjusted to 350 mVpp, 650 mVpp, or 850 mVpp. To compensate
for frequency-dependent loss of microstrips or striplines connected to the output of the device, programmable
preemphasis is included in the output stage. A settable loss of signal detection and output disable are also
provided.
The device, available in RoHS compliant small footprint 3-mm × 3-mm, 16-pin VQFN package, typically
dissipates less than 170 mW and is characterized for operation from –40°C to 100°C.
6 Pin Configuration and Functions
GND
1
DIN+
2
SDA
SCK
RATE0
RATE1
16
15
14
13
RGT Package
16-Pin VQFN
Top View
12
VCC
11
DOUT+
DOUT–
Exposed Pad
7
8
LOS
9
DIS
4
6
GND
COC2
10
5
3
COC1
DIN–
VCC
Not to scale
Pin Functions
PIN
TYPE
DESCRIPTION
NAME
NO.
COC1
5
Analog
Offset cancellation filter capacitor plus terminal. An external capacitor can be connected
between this pin and COC2 to reduce the low frequency cutoff. To disable the offset
cancellation loop, connect COC1 and COC2 together.
COC2
6
Analog
Offset cancellation filter capacitor minus terminal. An external capacitor can be connected
between this pin and COC1 to reduce the low frequency cutoff. To disable the offset
cancellation loop, connect COC1 and COC2 together.
DIN+
2
Analog-input
Noninverted data input. Differentially 100 Ω terminated to DIN–.
DIN–
3
Analog-input
Inverted data input. Differentially 100 Ω terminated to DIN+.
DIS
7
Digital-input
Disables the output stage when set to a high level.
DOUT–
10
CML-out
Inverted data output. On-chip 50 Ω back-terminated to VCC.
DOUT+
11
CML-out
Noninverted data output. On-chip 50 Ω back-terminated to VCC.
GND
1,4, EP
Supply
LOS
8
Open-drain MOS
RATE1
13
Digital-input
Bandwidth selection for noise suppression.
RATE0
14
Digital-input
Bandwidth selection for noise suppression.
SCK
15
Digital-input
Serial interface clock input. Connect a pullup resistor (10 kΩ typical) to VCC.
SDA
16
Digital-input
Serial interface data input. Connect a pullup resistor (10 kΩ typical) to VCC.
VCC
9, 12
Supply
Circuit ground. Exposed die pad (EP) must be grounded.
High level indicates that the input signal amplitude is below the programmed threshold level.
Open-drain output. Requires an external 10-kΩ pullup resistor to VCC for proper operation.
3.3-V ± 10% supply voltage.
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SLLS910A – JULY 2008 – REVISED JUNE 2016
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7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
Supply voltage (2)
VCC
(2)
MIN
MAX
UNIT
–0.3
4
V
0.5
4
V
–0.3
4
V
VDIN+, VDIN–
Voltage at DIN+, DIN–
VLOS, VCOC1, VCOC2, VDOUT+, VDOUT–, VDIS,
VRATE0, VRATE1, VSDA, VSCK
Voltage at LOS, COC1, COC2, DOUT+, DOUT–, DIS,
RATE0, RATE1, SDA, SCK (2)
VDIN,DIFF
Differential voltage between DIN+ and DIN–
±2.5
V
IDIN+, IDIN–, IDOUT+, IDOUT–
Continuous current at inputs and outputs
25
mA
TLEAD
Lead temperature 1.6mm (1/16 inch) from case for 10 s
260
°C
TA
Characterized free-air operating temperature
100
°C
TJ,max
Maximum junction temperature
125
°C
Tstg
Storage temperature
150
°C
(1)
(2)
–40
–65
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to network ground terminal.
7.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
±2000
Charged-device model (CDM), per JEDEC specification JESD22-C101 (2)
±750
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
MIN
NOM
MAX
VCC
Supply voltage
2.95
3.3
3.6
V
TA
Operating free-air temperature
–40
100
°C
DIGITAL input high voltage
UNIT
2
V
DIGITAL input low voltage
0.8
V
7.4 DC Electrical Characteristics
Over recommended operating conditions, outputs connected to a 50-Ω load, AMP1 = 0, AMP0 = 1 (Register 3) unless
otherwise noted. Typical operating condition is at VCC = 3.3 V and TA = 25°C.
PARAMETER
TEST CONDITIONS
VCC
Supply voltage
IVCC
Supply current
DIS = 0, CML currents included
RIN
Data input resistance
Differential
ROUT
Data output resistance
Single-ended, referenced to VCC
LOS HIGH voltage
ISOURCE = 50 µA with 10-kΩ pullup to VCC
LOS LOW voltage
ISINK = 10 mA with 10-kΩ pullup to VCC
4
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MIN
TYP
MAX
2.95
3.3
3.6
UNIT
V
50
63
mA
100
Ω
50
Ω
2.4
V
0.4
V
Copyright © 2008–2016, Texas Instruments Incorporated
Product Folder Links: ONET8501PB
ONET8501PB
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SLLS910A – JULY 2008 – REVISED JUNE 2016
7.5 AC Electrical Characteristics
Over recommended operating conditions, outputs connected to a 50-Ω load, AMP1 = 0, AMP0 = 1 (Register 3) and maximum
bandwidth unless otherwise noted. Typical operating condition is at VCC = 3.3 V and TA = 25°C.
PARAMETER
TEST CONDITION
RATE1 = 1, RATE0 = 0
f3dB-H
–3-dB bandwidth default settings
f3dB-L
Low frequency –3-dB bandwidth
MIN
TYP
7.5
9
RATE1 = 1, RATE0 = 1
8.4
RATE1 = 0, RATE0 = 1
7.6
RATE1 = 0, RATE0 = 0
2.4
With 330-pF COC capacitor
10
45
5
9
20
30
PRBS31 pattern at 11.3 Gbps, BER < 10–12
VOD-min ≥ 0.95 × VOD (output limited)
VIN,MIN
Data input sensitivity
–12
PRBS31 pattern at 8.5 Gbps, BER < 10
, RATE1 = 1, RATE0 = 0
SDD22
Differential output return gain
SCD11
Differential to common-mode
conversion gain
SCC22
Common-mode output return gain
A
Small signal gain
VIN,MAX
Data input overload
RJ
mVpp
4
0.01 GHz < f < 3.9 GHz
–16
3.9 GHz < f < 12.1 GHz
See
0.01 GHz < f < 3.9 GHz
–16
3.9 GHz < f < 12.1 GHz
See (1)
0.01 GHz < f < 12.1 GHz
–15
0.01 GHz < f < 7.5 GHz
–13
7.5 GHz < f < 12.1 GHz
–9
29
dB
(1)
dB
dB
dB
34
dB
2000
mVpp
VIN = 15 mVpp, K28.5 pattern
3
8
VIN = 30 mVpp, K28.5 pattern
3
10
VIN = 2000 mVpp, K28.5 pattern
6
15
Deterministic jitter at 8.5 Gbps
VIN = 30 mVpp, K28.5 pattern, RATE1 = 1, RATE0 = 0
4
pspp
Deterministic jitter at 4.25 Gbps
VIN = 30 mVpp, K28.5 pattern, RATE1 = 1, RATE0 = 1
6
pspp
Deterministic jitter at 2.125 Gbps
VIN = 30 mVpp, K28.5 pattern, RATE1 = 0, RATE0 = 1
8
pspp
Random jitter
VIN = 30 mVpp
1
psrms
Deterministic jitter at 11.3 Gbps
DJ
kHz
4
PRBS31 pattern at 2.125 Gbps, BER < 10–12, RATE1 = 0, RATE0 = 1
Differential input return gain
UNIT
GHz
4
PRBS31 pattern at 4.25 Gbps, BER < 10–12, RATE1 = 1, RATE0 = 1
SDD11
MAX
VIN > 30 mVpp, DIS = 0, AMP1 = 0, AMP0 = 0
250
350
VIN > 30 mVpp, DIS = 0, AMP1 = 0, AMP0 = 1
500
650
800
VIN > 30 mVpp, DIS = 0, AMP1 = 1, AMP0 = 1
650
850
1050
pspp
450
mVpp
VOD
Differential data output voltage
VPREEM
Output preemphasis step size
tR
Output rise time
20% to 80%, VIN > 30 mVpp
28
40
tF
Output fall time
20% to 80%, VIN > 30 mVpp
28
40
ps
CMOV
AC common-mode output voltage
PRBS31 pattern; AMP1 = 0, AMP0 = 1
7
mVrms
LOW LOS assert threshold range
min
K28.5 pattern at 11.3 Gbps, LOSRNG = 0
15
LOW LOS assert threshold range
max
K28.5 pattern at 11.3 Gbps, LOSRNG = 0
35
HIGH LOS assert threshold range
min
K28.5 pattern at 11.3 Gbps, LOSRNG = 1
35
HIGH LOS assert threshold range
max
K28.5 pattern at 11.3 Gbps, LOSRNG = 1
80
Versus temperature at 11.3 Gbps
1.5
DIS = 1
VTH
VTH
LOS threshold variation
5
1
dB
ps
mVpp
mVpp
Versus supply voltage VCC at 11.3 Gbps
1
Versus data rate
LOS hysteresis (electrical)
mVrms
2
4
6
dB
TLOS_AST
LOS assert time
2.5
10
80
µs
TLOS_DEA
LOS deassert time
2.5
10
80
µs
TDIS
Disable response time
(1)
K28.5 pattern at 11.3 Gbps
dB
1.5
20
ns
Differential Return Gain given by SDD11, SDD22 = –11.6 + 13.33 log10(f/8.25), f in GHz
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7.6 Typical Characteristics
Typical operating condition is at VCC = 3.3 V, TA = 25°C, AMP1 = 0, AMP0 = 1 (Register 3), and maximum bandwidth unless
otherwise noted.
50
12
11
45
10
40
9
Bandwidth - GHz
SDD21 - dB
35
30
25
20
15
8
7
6
5
4
3
10
2
5
1
0
0
1
10
f - Frequency - GHz
0
100
0 1
2
3
4
5
6
7 8
9 10 11 12 13 14 15
Register Setting - Decimal
Figure 1. Frequency Response
Figure 2. Bandwidth vs Register Setting
0
800
-5
700
600
-15
-20
500
SDD11 - dB
VO - Output Voltage - mVpp
-10
400
300
-25
-30
-35
-40
200
-45
100
0
0
-50
20
40
60
80
VI - Input Voltage - mVpp
-55
0.1
100
1
10
100
f - Frequency - GHz
Figure 4. Differential Input Return Gain vs
Frequency
Figure 3. Transfer Function
0
-5
1E-04
-10
Bit-Error Ratio
SDD22 - dB
-15
-20
-25
-30
-35
1E-07
1E-10
-40
-45
-50
0.1
1
10
100
1E-13
0
f - Frequency - GHz
Figure 5. Differential Output Return Gain vs
Frequency
6
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1
2
3
VI - Input Voltage - mVpp
4
5
Figure 6. BIT-Error Ratio vs
Input Voltage (11.3 GBPS)
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Typical Characteristics (continued)
Typical operating condition is at VCC = 3.3 V, TA = 25°C, AMP1 = 0, AMP0 = 1 (Register 3), and maximum bandwidth unless
otherwise noted.
3.2
10
9
2.8
2.4
Random Jitter - psRMS
Deterministic Jitter - pspp
8
7
6
5
4
3
2
1.6
1.2
0.8
2
0.4
1
0
0
0
200 400 600 800 1000 1200 1400 1600 1800 2000
VI - Input Voltage - mVpp
0
Figure 7. Deterministic Jitter vs
Input Voltage
10
20
30 40 50 60 70 80
VI - Input Voltage - mVpp
90
100
Figure 8. Random Jitter vs
Input Voltage
300
90
280
60
50
LOS Deassert Voltage
40
30
LOS Assert Voltage
20
10
0
128
LOS Hysteresis - dB
LOS Assert/Deassert Voltage - mVpp
70
148
168
188
208
228
Register Setting - Decimal
260
240
220
200
180
LOS Deassert Voltage
160
140
120
LOS Assert Voltage
100
80
60
40
20
0
158 168 178 188 198 208 218 228 238 248 258
248
Register Setting - Decimal
Figure 9. LOS Assert/Deassert Voltage vs
Register Setting LOSRNG = 0
Figure 10. LOS Assert/Deassert Voltage vs
Register Setting LOSRNG = 1
8
8
7
7
6
6
LOS Hysteresis - dB
LOS Assert/Deassert Voltage - mVpp
80
5
4
3
5
4
3
2
2
1
1
0
128
148
168
188
208
228
Register Setting - Decimal
248
0
158 168 178 188 198 208 218 228 238 248 258
Register Setting - Decimal
Figure 11. LOS Hysteresis vs
Register Setting LOSRNG = 0
Figure 12. LOS Hysteresis vs
Register Setting LOSRNG = 1
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8 Detailed Description
8.1 Overview
This compact, low-power, 11.3-Gbps limiting amplifier consists of a high-speed data path with offset cancellation
block (DC feedback) combined with an analog settable input threshold adjust, a loss-of-signal detection block
using two peak detectors, a two-wire interface with a control-logic block and a band-gap voltage reference and
bias current generation block.
See Functional Block Diagram for a simplified block diagram of the ONET8501PB.
8.2 Functional Block Diagram
COC1
COC2
VCC
GND
Offset
Cancellation
Input Buffer
with
Selectable
Bandwidth
VCC
Gain Stage
Gain Stage
Output
Buffer
50 Ω
50 Ω
DOUT+
DIN+
100 Ω
DOUT-
DIN-
LOS
LOS Detection
SDA
4 Bit
SCK
SCK
8 Bit Register
4 Bit
DIS
DIS
SDA
RATE0
RATE0
RATE1
RATE1
Settings
Input Threshold
Preemphasis
2 Bit Amplitude
4 Bit + Select RSA
4 Bit + Select RSB
4 Bit + Select
RSC
4 Bit + Select
RSD
7 Bit + Select
LOSA
7 Bit + Select
LOSB
7 Bit + Select
LOSC
7 Bit + Select
LOSD
4 Bit
7 Bit
Band-Gap Voltage
Reference and
Bias Current
Generation
SELRATE
SELLOS
Power-On
Reset
2-Wire Interface &
Control Logic
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8.3 Feature Description
8.3.1 High-Speed Data Path
The high-speed data signal is applied to the data path by means of input signal pins DIN+ / DIN–. The data path
consists of a 100-Ω differential termination resistor followed by a digitally controlled bandwidth switch input buffer
for rate select. The RATE1 and RATE0 pins can be used to control the bandwidth of the filter. Default bandwidth
settings are used; however, these can be changed using registers 4 through 7 through the serial interface. For
details regarding the rate selection, see Table 19. A gain stage and an output buffer stage follow the input buffer,
which together provide a gain of 34 dB. The device can accept input amplitude levels from 5 mVpp up to
2000 mVpp. The amplified data output signal is available at the output pins DOUT+ and DOUT, which includes
on-chip 2 × 50-Ω back-termination to VCC.
Offset cancellation compensates for internal offset voltages and thus ensures proper operation even for very
small input data signals. The offset cancellation can be disabled so that the input threshold voltage can be
adjusted to optimize the bit error rate or change the eye crossing to compensate for input signal pulse width
distortion. The offset cancellation can be disabled by setting OCDIS = 1 (bit 1 of register 0). The input threshold
level can be adjusted using register settings THADJ[0..7] (register 1). For details regarding input threshold adjust,
see Table 19.
The low frequency cutoff is as low as 80 kHz with the built-in filter capacitor. For applications, which require even
lower cutoff frequencies, an additional external filter capacitor may be connected to the COC1 and COC2 pins. A
value of 330 pF results in a low frequency cutoff of 10 kHz.
8.3.2 Band-gap Voltage and Bias Generation
The ONET8501PB limiting amplifier is supplied by a single 3.3-V supply voltage connected to the VCC pins. This
voltage is referred to ground (GND).
On-chip band-gap voltage circuitry generates a reference voltage, independent of supply voltage, from which all
other internally required voltages and bias currents are derived.
8.4 Device Functional Modes
8.4.1 High-Speed Output Buffer
The output amplitude of the buffer can be set to 350 mVpp, 650 mVpp, or 850 mVpp using register settings
AMP[0..1] (register 3) through the serial interface. To compensate for frequency dependant losses of
transmission lines connected to the output, the ONET8501PB has adjustable preemphasis of the output stage.
The preemphasis can be set from 0 to 8 dB in 1-dB steps using register settings PEADJ[0..3] (register 2).
8.4.2 Rate Select
There are 16 possible internal filter settings (4 bit) to adjust the small signal bandwidth to the data rate. For fast
rate selection, 4 default values can be selected with the RATE1 and RATE0 pins. Using the serial interface, the
bandwidth settings can be customized instead of using the default values. The default bandwidths and the
registers used to change the bandwidth settings are shown in Table 1.
Table 1. Rate Selection Default Settings and Registers Used for Adjustment
RATE1
RATE0
DEFAULT BANDWIDTH
(GHz)
REGISTER USED FOR ADJUSTMENT
0
0
2.4
RSA (Register 4)
0
1
7.6
RSB (Register 5)
1
1
8.4
RSC (Register 6)
1
0
9
RSD (Register 7)
If the rate select register selection bit is set LOW, for example RSASEL = 0 (bit 7 of register 4), then the default
bandwidth for that register is used. If the register selection bit is set HIGH, for example RSASEL = 1 (bit 7 of
register 4), then the content of RSA[0..3] (register 4) is used to set the input filter bandwidth when RATE0 = 0
and RATE1 = 0. The settings of the rate selection registers RSA, RSB, RSC, RSD, and the corresponding filter
bandwidths are shown in Table 2.
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Table 2. Available Bandwidth Settings
TYPICAL
BANDWIDTH
(GHz)
RSX3
RSX2
RSX1
RSX0
0
0
0
0
9
0
0
0
1
8.6
0
0
1
0
8.4
0
0
1
1
8.1
0
1
0
0
7.9
0
1
0
1
7.6
0
1
1
0
6.9
0
1
1
1
6.2
1
0
0
0
5.2
1
0
0
1
4.2
1
0
1
0
3.7
1
0
1
1
3.4
1
1
0
0
3.2
1
1
0
1
2.8
1
1
1
0
2.6
1
1
1
1
2.4
The RATE1 and RATE0 pins do not have to be used if the serial interface is being used. If RATE1 is not
connected it is internally pulled HIGH and if RATE0 is not connected it is internally pulled LOW, thus selecting
register 7. Therefore, changing the contents of RSD[0..3] (register 7) through the serial interface can be used to
adjust the bandwidth.
8.4.3 Loss-of-Signal Detection
The loss of signal detection is done by 2 separate level detectors to cover a wide dynamic range. The peak
values of the input signal and the output signal of the gain stage are monitored by the peak detectors. The peak
values are compared to a predefined loss of signal threshold voltage inside the loss of signal detection block. As
a result of the comparison, the LOS signal, which indicates that the input signal amplitude is below the defined
threshold level, is generated. The LOS assert level is settable through the serial interface. There are 2 LOS
ranges settable with the LOSRNG bit (bit 2 register 0) through the serial interface. By setting the bit LOSRNG =
1, the high range of the LOS assert values are used (35 mVpp to 80 mVpp) and by setting the bit LOSRNG = 0,
the low range of the LOS assert values are used (15 mVpp to 35 mVpp).
There are 128 possible internal LOS settings (7 bit) for each LOS range to adjust the LOS assert level. For fast
LOS selection, 4 default values can be selected with the RATE1 and RATE0 pins; however, the LOS settings
can be customized instead of using the default values. The default LOS assert levels and the registers used to
change the LOS settings are shown in Table 3.
Table 3. LOS Assert Level Default Settings and Registers Used for Adjustment
RATE1
RATE0
DEFAULT LOS ASSERT LEVEL
(mVpp)
REGISTER USED FOR
ADJUSTMENT
0
0
15
LOSA (Register 8)
0
1
18
LOSB (Register 9)
1
1
26
LOSC (Register 10)
1
0
26
LOSD (Register 11)
If the LOS register selection bit is set low, for example LOSASEL = 0 (bit 7 of register 8), then the default LOS
assert level for that register is used. If the register selection bit is set high, for example LOSASEL = 1 (bit 7 of
register 8), then the content of LOSA[0..6] (register 8) is used to set the LOS assert level when RATE1 = 0 and
RATE0 = 0. The RATE1 and RATE0 pins do not have to be used if the serial interface is being used. If RATE1 is
not connected it is internally pulled HIGH and if RATE0 is not connected it is internally pulled LOW, thus
selecting register 11. Therefore, changing the content of LOSD[0..6] (register 11) through the serial interface can
be used to adjust the LOS assert level.
10
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8.5 Programming
8.5.1 2-Wire Interface and Control Logic
The ONET8501PB uses a 2-wire serial interface for digital control. The two circuit inputs, SDA and SCK, are
driven, respectively, by the serial data and serial clock from a microcontroller, for example. Both inputs include
100-kΩ pullup resistors to VCC. For driving these inputs, TI recommends an open-drain output.
The 2-wire interface allows write access to the internal memory map to modify control registers and read access
to read out control and status signals. The ONET8501PB is a slave device only which means that it can not
initiate a transmission itself; it always relies on the availability of the SCK signal for the duration of the
transmission. The master device provides the clock signal as well as the START and STOP commands. The
protocol for a data transmission is as follows:
1. START command
2. 7-bit slave address (1000100) followed by an eighth bit which is the data direction bit (R/W). A zero indicates
a WRITE and a 1 indicates a READ.
3. 8-bit register address
4. 8-bit register data word
5. STOP command
Regarding timing, the ONET8501PB is I2C compatible. The typical timing is shown in Figure 13 and a complete
data transfer is shown in Figure 14. Parameters for Figure 13 are defined in Table 4.
Bus Idle: Both SDA and SCK lines remain HIGH
Start Data Transfer: A change in the state of the SDA line, from HIGH to LOW, while the SCK line is HIGH,
defines a START condition (S). Each data transfer begins with a START condition.
Stop Data Transfer: A change in the state of the SDA line from LOW to HIGH while the SCK line is HIGH
defines a STOP condition (P). Each data transfer ends with a STOP condition; however, if the master still wishes
to communicate on the bus, it can generate a repeated START condition and address another slave without first
generating a STOP condition.
Data Transfer: Only one data byte can be transferred between a START and a STOP condition. The receiver
acknowledges the transfer of data.
Acknowledge: Each receiving device, when addressed, is obliged to generate an acknowledge bit. The
transmitter releases the SDA line and a device that acknowledges must pull down the SDA line during the
acknowledge clock pulse in such a way that the SDA line is stable LOW during the HIGH period of the
acknowledge clock pulse. Setup and hold times must be taken into account. When a slave-receiver doesn’t
acknowledge the slave address, the data line must be left HIGH by the slave. The master can then generate a
STOP condition to abort the transfer. If the slave-receiver does acknowledge the slave address but some time
later in the transfer cannot receive any more data bytes, the master must abort the transfer. This is indicated by
the slave generating the not acknowledge on the first byte to follow. The slave leaves the data line HIGH and the
master generates the STOP condition.
SDA
tr
tBUF
tLOW
tHIGH
tHDSTA
tf
SCK
P
S
S
tHDSTA
tHDDAT
tSUDAT
P
tSUSTA
tSUSTO
Figure 13. I2C Timing Diagram
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Programming (continued)
Table 4. Timing Diagram Definitions
PARAMETER
MIN
MAX
UNIT
400
kHz
fSCK
SCK clock frequency
tBUF
Bus free time between START and STOP conditions
1.3
µs
tHDSTA
Hold time after repeated START condition. After this period, the first clock pulse is generated
0.6
µs
tLOW
Low period of the SCK clock
1.3
µs
tHIGH
High period of the SCK clock
0.6
µs
tSUSTA
Setup time for a repeated START condition
0.6
µs
tHDDAT
Data HOLD time
0
µs
tSUDAT
Data setup time
tR
Rise time of both SDA and SCK signals
tF
Fall time of both SDA and SCK signals
tSUSTO
Setup time for STOP condition
100
ns
300
ns
300
ns
0.6
µs
SDA
SCK
1-7
S
SLAVE
ADDRESS
8
9
R/W
ACK
1-7
8
REGISTER
ADDRESS
9
1-7
ACK
8
REGISTER
FUNCTION
9
ACK
P
Figure 14. I2C Data Transfer
8.6 Register Maps
The register mapping for read and write register addresses 0 (0x00) through 11 (0x0B) are shown in Table 5
through Table 16. The register mapping for the read only register addresses 14 (0x0E) and 15 (0x0F) are shown
in Table 17 and Table 18.
Table 19 describes the circuit functionality based on the register settings.
8.6.1 Register 0 (0x00) Mapping – Control Settings
Table 5. Register 0 (0x00) Mapping – Control Settings
BIT 7
—
BIT 6
—
BIT 5
—
REGISTER ADDRESS 0 (0X00)
BIT 4
BIT 3
—
DIS
BIT 2
LOSRNG
BIT 1
OCDIS
BIT 0
I2CDIS
BIT 1
THADJ1
BIT 0
THADJ0
8.6.2 Register 1 (0x01) Mapping – Input Threshold Adjust
Table 6. Register 1 (0x01) Mapping – Input Threshold Adjust
BIT 7
THADJ7
12
BIT 6
THADJ6
BIT 5
THADJ5
REGISTER ADDRESS 1 (0X01)
BIT 4
BIT 3
THADJ4
THADJ3
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BIT 2
THADJ2
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8.6.3 Register 2 (0x02) Mapping – Preemphasis Adjust
Table 7. Register 2 (0x02) Mapping – Preemphasis Adjust
BIT 7
—
BIT 6
—
BIT 5
—
REGISTER ADDRESS 2 (0X02)
BIT 4
BIT 3
—
PEADJ3
BIT 2
PEADJ2
BIT 1
PEADJ1
BIT 0
PEADJ0
8.6.4 Register 3 (0x03) Mapping – Output Amplitude Adjust
Table 8. Register 3 (0x03) Mapping – Output Amplitude Adjust
BIT 7
—
BIT 6
—
BIT 5
—
REGISTER ADDRESS 3 (0X03)
BIT 4
BIT 3
—
—
BIT 2
—
BIT 1
AMP1
BIT 0
AMP0
8.6.5 Register 4 (0x04) Mapping – Rate Selection Register A
Table 9. Register 4 (0x04) Mapping – Rate Selection Register A
BIT 7
RSASEL
BIT 6
—
BIT 5
—
register address 4 (0x04)
BIT 4
BIT 3
—
RSA3
BIT 2
RSA2
BIT 1
RSA1
BIT 0
RSA0
8.6.6 Register 5 (0x05) Mapping – Rate Selection Register B
Table 10. Register 5 (0x05) Mapping – Rate Selection Register B
BIT 7
RSBSEL
BIT 6
—
BIT 5
—
REGISTER ADDRESS 5 (0X05)
BIT 4
BIT 3
—
RSB3
BIT 2
RSB2
BIT 1
RSB1
BIT 0
RSB0
8.6.7 Register 6 (0x06) Mapping – Rate Selection Register C
Table 11. Register 6 (0x06) Mapping – Rate Selection Register C
BIT 7
RSCSEL
BIT 6
—
BIT 5
—
REGISTER ADDRESS 6 (0X06)
BIT 4
BIT 3
—
RSC3
BIT 2
RSC2
BIT 1
RSC1
BIT 0
RSC0
8.6.8 Register 7 (0x07) Mapping – Rate Selection Register D
Table 12. Register 7 (0x07) Mapping – Rate Selection Register D
BIT 7
RSDSEL
BIT 6
—
BIT 5
—
REGISTER ADDRESS 7 (0X07)
BIT 4
BIT 3
—
RSD3
BIT 2
RSD2
BIT 1
RSD1
BIT 0
RSD0
8.6.9 Register 8 (0x08) Mapping – LOS Assert Level Register A
Table 13. Register 8 (0x08) Mapping – LOS Assert Level Register A
BIT 7
LOSASEL
BIT 6
LOSA6
BIT 5
LOSA5
REGISTER ADDRESS 8 (0X08)
BIT 4
BIT 3
LOSA4
LOSA3
BIT 2
LOSA2
BIT 1
LOSA1
BIT 0
LOSA0
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8.6.10 Register 9 (0x09) Mapping – LOS Assert Level Register B
Table 14. Register 9 (0x09) Mapping – LOS Assert Level Register B
BIT 7
LOSBSEL
BIT 6
LOSB6
BIT 5
LOSB5
REGISTER ADDRESS 9 (0X09)
BIT 4
BIT 3
LOSB4
LOSB3
BIT 2
LOSB2
BIT 1
LOSB1
BIT 0
LOSB0
8.6.11 Register 10 (0x0A) Mapping – LOS Assert Level Register C
Table 15. Register 10 (0x0A) Mapping – LOS Assert Level Register C
BIT 7
LOSCSEL
BIT 6
LOSC6
BIT 5
LOSC5
REGISTER ADDRESS 10 (0X0A)
BIT 4
BIT 3
LOSC4
LOSC3
BIT 2
LOSC2
BIT 1
LOSC1
BIT 0
LOSC0
8.6.12 Register 11 (0x0B) Mapping – LOS Assert Level Register D
Table 16. Register 11 (0x0B) Mapping – LOS Assert Level Register D
BIT 7
LOSDSEL
BIT 6
LOSD6
BIT 5
LOSD5
REGISTER ADDRESS 11 (0X0B)
BIT 4
BIT 3
LOSD4
LOSD3
BIT 2
LOSD2
BIT 1
LOSD1
BIT 0
LOSD0
8.6.13 Register 14 (0x0E) Mapping – Selected Rate Setting (Read Only)
Table 17. Register 14 (0x0E) Mapping – Selected Rate Setting (Read Only)
BIT 7
—
BIT 6
—
BIT 5
—
REGISTER ADDRESS 14 (0X0E)
BIT 4
BIT 3
—
SELRATE3
BIT 2
SELRATE2
BIT 1
SELRATE1
BIT 0
SELRATE0
8.6.14 Register 15 (0x0F) Mapping – Selected LOS Level (Read Only)
Table 18. Register 15 (0x0F) Mapping – Selected LOS Level (Read Only)
BIT 7
—
BIT 6
SELLOS6
BIT 5
SELLOS5
REGISTER ADDRESS 15 (0X0F)
BIT 4
BIT 3
SELLOS4
SELLOS3
BIT 2
SELLOS2
BIT 1
SELLOS1
BIT 0
SELLOS0
Table 19. Register Functionality
SYMBOL
REGISTER BIT
FUNCTION
DIS
Output disable bit 3
Output disable bit:
1 = output disabled
0 = output enabled
LOSRNG
LOS Range bit 2
LOS range bit:
1 = high LOS assert voltage range
0 = low LOS assert voltage range
OCDIS
Offset cancellation disable bit 1
Offset cancellation disable bit:
1 = offset cancellation is disabled
0 = offset cancellation is enabled
I2CDIS
I2C disable bit 0
I2C disable bit:
1 = I2C is disabled.
0 = I2C is enabled. This is the default setting.
14
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Table 19. Register Functionality (continued)
SYMBOL
REGISTER BIT
FUNCTION
THADJ7
Input threshold adjust bit 7 (MSB)
Input threshold adjustment setting:
THADJ6
Input threshold adjust bit 6
Maximum positive shift for 00000001 (1)
THADJ5
Input threshold adjust bit 5
Minimum positive shift for 01111111 (127)
THADJ4
Input threshold adjust bit 4
Zero shift for 10000000 (128)
THADJ3
Input threshold adjust bit 3
Minimum negative shift for 10000001 (129)
THADJ2
Input threshold adjust bit 2
Maximum negative shift for 11111111 (255)
THADJ1
Input threshold adjust bit 1
THADJ0
Input threshold adjust bit 0 (LSB)
PEADJ3
Preemphasis adjust bit 3 (MSB)
PEADJ2
Preemphasis adjust bit 2
Preemphasis (dB)
Register Setting
PEADJ1
Preemphasis adjust bit 1
0
0000
PEADJ0
Preemphasis adjust bit 0 (LSB)
1
0001
2
0011
3
0100
4
0101
5
0111
6
1100
7
1101
8
1111
Preemphasis setting:
AMP1
Output amplitude adjustment bit 1
Output amplitude adjustment:
AMP0
Output amplitude adjustment bit 0
00 = 350 mVpp
01 = 650 mVpp
10 = 650 mVpp
11 = 850 mVpp
RSASEL
Register RSA select bit 7 (MSB)
–
Rate selection register A
RSASEL = 1
–
Content of register A bits 3 to 0 is used to select the input filter BW
–
RSASEL = 0
RSA3
Rate select register A bit 3
RSA2
Rate select register A bit 2
RSA1
Rate select register A bit 1
RSA0
Rate select register A bit 0 (LSB)
RSBSEL
Register RSB select bit 7 (MSB)
–
Default BW of 2.4 GHz is used
Register RSA is used when RATE1 = 0 and RATE0 = 0
Rate selection register B
RSBSEL = 1
–
Content of register B bits 3 to 0 is used to select the input filter BW
–
RSBSEL = 0
RSB3
Rate select register B bit 3
RSB2
Rate select register B bit 2
RSB1
Rate select register B bit 1
RSB0
Rate select register B bit 0 (LSB)
Default BW of 7.6 GHz is used
Register RSB is used when RATE1 = 0 and RATE0 = 1
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Table 19. Register Functionality (continued)
SYMBOL
RSCSEL
REGISTER BIT
FUNCTION
Register RSC select bit 7 (MSB)
Rate selection register C
–
RSCSEL = 1
–
Content of register C bits 3 to 0 is used to select the input filter BW
–
RSCSEL = 0
RSC3
Rate select register C bit 3
RSC2
Rate select register C bit 2
RSC1
Rate select register C bit 1
RSC0
Rate select register C bit 0 (LSB)
RSDSEL
Register RSD select bit 7 (MSB)
Default BW of 8.4 GHz is used
Register RSC is used when RATE1 = 1 and RATE0 = 1
Rate selection register D
–
RSDSEL = 1
–
Content of register D bits 3 to 0 is used to select the input filter BW
–
RSDSEL = 0
RSD3
Rate select register D bit 3
RSD2
Rate select register D bit 2
RSD1
Rate select register D bit 1
RSD0
Rate select register D bit 0 (LSB)
Register RSD is used when RATE1 = 1 and RATE0 = 0 or RATE1 and RATE0 are
not connected
LOSASEL
Register LOSA select bit 7 (MSB)
LOS assert level register A
LOSA6
LOS assert level register A bit 6
LOSASEL = 1
LOSA5
LOS assert level register A bit 5
Content of register A bits 6 to 0 is used to select the LOS assert level
LOSA4
LOS assert level register A bit 4
Minimum LOS assert level for 0000000
LOSA3
LOS assert level register A bit 3
LOSA2
LOS assert level register A bit 2
LOSA1
LOS assert level register A bit 1
LOSA0
LOS assert level register A bit 0 (LSB)
Register LOSA is used when RATE1 = 0 and RATE0 = 0
LOSBSEL
Register LOSB select bit 7 (MSB)
LOS assert level register B
LOSB6
LOS assert level register B bit 6
LOSBSEL = 1
LOSB5
LOS assert level register B bit 5
Content of register B bits 6 to 0 is used to select the LOS assert level
LOSB4
LOS assert level register B bit 4
Minimum LOS assert level for 0000000
LOSB3
LOS assert level register B bit 3
LOSB2
LOS assert level register B bit 2
LOSB1
LOS assert level register B bit 1
LOSB0
LOS assert level register B bit 0 (LSB)
Register LOSB is used when RATE1 = 0 and RATE0 = 1
LOSCSEL
Register LOSC select bit 7 (MSB)
LOS assert level register C
LOSC6
LOS assert level register C bit 6
LOSCSEL = 1
LOSC5
LOS assert level register C bit 5
Content of register C bits 6 to 0 is used to select the LOS assert level
LOSC4
LOS assert level register C bit 4
Minimum LOS assert level for 0000000
LOSC3
LOS assert level register C bit 3
LOSC2
LOS assert level register C bit 2
LOSC1
LOS assert level register C bit 1
LOSC0
LOS assert level register C bit 0 (LSB)
16
Default BW of 9.0 GHz is used
Maximum LOS assert level for 1111111
LOSASEL = 0
Default LOS assert level of 15 mVpp is used
Maximum LOS assert level for 1111111
LOSBSEL = 0
Default LOS assert level of 18 mVpp is used
Maximum LOS assert level for 1111111
LOSCSEL = 0
Default LOS assert level of 26 mVpp is used
Register LOSC is used when RATE1 = 1 and RATE0 = 1
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Table 19. Register Functionality (continued)
SYMBOL
REGISTER BIT
FUNCTION
LOSDSEL
Register LOSD select bit 7 (MSB)
LOS assert level register D
LOSD6
LOS assert level register D bit 6
LOSDSEL = 1
LOSD5
LOS assert level register D bit 5
Content of register D bits 6 to 0 is used to select the LOS assert level
LOSD4
LOS assert level register D bit 4
Minimum LOS assert level for 0000000
LOSD3
LOS assert level register D bit 3
LOSD2
LOS assert level register D bit 2
LOSD1
LOS assert level register D bit 1
LOSD0
LOS assert level register D bit 0 (LSB)
Register LOSD is used when RATE1 = 1 and RATE0 = 0
SELRATE3
Selected rate setting bit 3
Selected rate setting (read only)
SELRATE2
Selected rate setting bit 2
SELRATE1
Selected rate setting bit 1
SELRATE0
Selected rate setting bit 0
SELLOS6
Selected LOS assert level bit 6 (MSB)
SELLOS5
Selected LOS assert level bit 5
SELLOS4
Selected LOS assert level bit 4
SELLOS3
Selected LOS assert level bit 3
SELLOS2
Selected LOS assert level bit 2
SELLOS1
Selected LOS assert level bit 1
SELLOS0
Selected LOS assert level bit 0 (LSB)
Maximum LOS assert level for 1111111
LOSDSEL = 0
Default LOS assert level of 26 mVpp is used
Selected LOS assert level (read only)
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
Figure 15 shows a typical application with digital control. In this case DIN+ and DIN– are connected to
Transimpedance Amplifier (ROSA) and DOUT+ and DOUT– to SFP connector. SDA and SCK are connected to
a microprocessor.
9.2 Typical Application
RATE1
RATE0
SCK
SDA
Figure 15 shows a typical application circuit using the ONET8501PB.
L1
BLM15HD102SN1
DIN
DIN
RATE0
RATE1
DOUT-
GND
DOUTC4
0.1 mF
VCC
COC1
C2
0.1 mF
DOUT+
DOUT+
LOS
DIN-
ONET
8501PB
16 Pin QFN
DIS
DIN+
C3
0.1 mF
VCC
GND
COC2
C1
0.1 mF
SCK
SDA
VCC
C6
0.1 mF
C5
330 pF
LOS
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DISABLE
Figure 15. Typical Application Circuit
9.2.1 Design Requirements
For this design example, use the parameters listed in Table 20 as the input parameters.
Table 20. Design Parameters
PARAMETER
EXAMPLE VALUE
Supply voltage
18
3.3 V
VIN
20 mVpp to 2000 mVpp
Data rate
8.5 Gbps to 10.3 Gbps
AC capacitors
0.1 µF
COC capacitor
330 pF
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9.2.2 Detailed Design Procedure
The purpose of the series resistors is to improve the signal integrity between the VCSEL driver and the VCSEL.
Because the VCSEL impedance varies depending on its type, the series resistor provides a better matching
impedance for the modulation current outputs.
The output amplitude adjustments are set as: AMP0 = 1 and AMP1 = 0 (see Register 3). DIN+, DIN–, DOUT+,
and DOUT– are AC-coupled with 0.1 µF.
9.2.3 Application Curves
100 mV/div
20 ps/div
Figure 16. Output Eye-Diagram at 10.3 GBPS vs
and Input Voltage (20 mVpp)
100 mV/div
20 ps/div
Figure 18. Output Eye-Diagram at 8.5 GBPS
and Input Voltage (20 mVpp)
100 mV/div
15 ps/div
Figure 17. Output Eye-Diagram at 10.3 GBPS vs
and Maximum Input Voltage (2000 mVpp)
100 mV/div
20 ps/div
Figure 19. Output Eye-Diagram at 8.5 GBPS
and Maximum Input Voltage (2000 mVpp)
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10 Power Supply Recommendations
The ONET8401PB is designed to operate with an input supply voltage range from 2.95 V to 3.6 V.
For SFP+ modules, the ONET8501PB must be used because of its low AC common-mode voltage.
The supply current of the ONET8501PB is dependent upon the output amplitude setting.
The typical setting for an SFP+ module is the 650-mVpp output voltage. The typical supply current in this case is
50 mA leading to 165 mW.
11 Layout
11.1 Layout Guidelines
For optimum performance, use 50-Ω transmission lines (100-Ω differential) for connecting the high-speed inputs
and outputs. The length of transmission lines must be kept as short as possible to reduce loss and patterndependent jitter. TI recommends maximizing the separation of the DOUT+ and DOUT– transmission lines from
the DIN+ and DIN– transmission lines to minimize transmitter to receiver crosstalk.
11.2 Layout Example
AC-coupling
capacitors
DIN+
DOUT+
DIN–
DOUT–
From
ROSA
COC capacitor
Figure 20. ONET8501PB Layout Example
20
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12 Device and Documentation Support
12.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.2 Community Resource
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.3 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
12.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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Copyright © 2008–2016, Texas Instruments Incorporated
Product Folder Links: ONET8501PB
21
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
ONET8501PBRGTR
ACTIVE
VQFN
RGT
16
3000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 100
85PB
ONET8501PBRGTRG4
ACTIVE
VQFN
RGT
16
3000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 100
85PB
ONET8501PBRGTT
ACTIVE
VQFN
RGT
16
250
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 100
85PB
ONET8501PBRGTTG4
ACTIVE
VQFN
RGT
16
250
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 100
85PB
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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