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SN65HVD1782QDRQ1

SN65HVD1782QDRQ1

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    SOIC8

  • 描述:

    AUTOMOTIVE FAULT-PROTECTED RS-48

  • 数据手册
  • 价格&库存
SN65HVD1782QDRQ1 数据手册
Product Folder Order Now Technical Documents Support & Community Tools & Software SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 SN65HVD178x-Q1 Fault-Protected RS-485 Transceivers With 3.3-V to 5-V Operation 1 Features 3 Description • • These devices are designed to survive overvoltage faults such as direct shorts to power supplies, miswiring faults, connector failures, cable crushes, and tool mis-applications. They are also robust to ESD events, with high levels of protection to the humanbody-model specification. 1 • • • • • • • • Qualified for Automotive Applications AEC-Q100 Qualified With the Following Results – Device Temperature Grade 1: –40°C to 125°C Ambient Operating Temperature Range – Device HBM ESD Classification Level H2 – Device CDM ESG Classification Level C3B Bus-Pin Fault Protection to: – > ±70 V ('HVD1780-Q1, 'HVD1781-Q1) – > ±30 V ('HVD1782-Q1) Operation With 3.3-V to 5-V Supply Range ±16-kV HBM Protection on Bus Pins Reduced Unit Load for up to 320 Nodes Failsafe Receiver for Open-Circuit, Short-Circuit and Idle-Bus Conditions Low Power Consumption – Low Standby Supply Current, 1 μA Maximum – ICC 4-mA Quiescent During Operation Pin-Compatible With Industry-Standard SN75176 Signaling Rates of 115 kbps, 1 Mbps, and up to 10 Mbps These devices combine a differential driver and a differential receiver, which operate from a single power supply. In the 'HVD1782, the driver differential outputs and the receiver differential inputs are connected internally to form a bus port suitable for half-duplex (two-wire bus) communication. This port features a wide common-mode voltage range, making the devices suitable for multipoint applications over long cable runs. These devices are characterized from –40°C to 125°C. These devices are pincompatible with the industry-standard SN75176 transceiver, making them drop-in upgrades in most systems. These devices are fully compliant with ANSI TIA/EIA 485-A with a 5-V supply and can operate with a 3.3-V supply with reduced driver output voltage for lowpower applications. For applications where operation is required over an extended common-mode voltage range, see the SN65HVD1785 (SLLS872) data sheet. Device Information(1) 2 Applications Automotive Data Links PART NUMBER SIGNALING RATE NUMBER OF NODES SN65HVD1780-Q1 Up to 115 kbps Up to 320 SN65HVD1781-Q1 Up to 1 Mbps Up to 320 SN65HVD1782-Q1 Up to 10 Mbps Up to 64 (1) For all available packages, see the orderable addendum at the end of the data sheet. Simplified Schematic VFAULT up to 70 V Copyright © 2016, Texas Instruments Incorporated 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION DATA. SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 3 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 6.9 6.10 3 4 4 4 4 5 6 7 7 8 Absolute Maximum Ratings ..................................... ESD Ratings—AEC................................................... ESD Ratings—IEC .................................................... Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Power Dissipation Ratings ........................................ Switching Characteristics .......................................... Package Dissipation Ratings .................................... Typical Characteristics ............................................ Parameter Measurement Information .................. 9 Detailed Description ............................................ 13 8.1 Overview ................................................................. 13 8.2 Functional Block Diagram ....................................... 13 8.3 Feature Description................................................. 13 8.4 Device Functional Modes........................................ 14 9 Application and Implementation ........................ 16 9.1 Application Information............................................ 16 9.2 Typical Application ................................................. 16 10 Power Supply Recommendations ..................... 20 11 Layout................................................................... 20 11.1 Layout Guidelines ................................................. 20 11.2 Layout Example .................................................... 20 12 Device and Documentation Support ................. 21 12.1 12.2 12.3 12.4 12.5 12.6 12.7 Device Support...................................................... Documentation Support ........................................ Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 21 21 21 21 21 21 21 13 Mechanical, Packaging, and Orderable Information ........................................................... 21 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision C (April 2016) to Revision D Page • Changed the differential input to receive a valid bus high from VID < VIT+ to VID > VIT+ in the Receiver Function Table..... 15 • Changed the Half-Duplex Layout Example .......................................................................................................................... 20 • Added the Receiving Notification of Documentation Updates section ................................................................................. 21 • Changed the Electrostatic Discharge Caution statement..................................................................................................... 21 Changes from Revision B (January 2016) to Revision C • Page Changed the signaling rate for SN65HVD1780-Q1 from 115 to 0.115 Bin the Recommended Operating Conditions table ....................................................................................................................................................................................... 4 Changes from Revision A (August 2015) to Revision B Page • Changed HBM and CDM back to the AEC specification and split the IEC specification into a separate table .................... 4 • Added the SN65HVD1780-Q1 and SN65HVD1782-Q1 devices to the Thermal Information table ....................................... 4 Changes from Original (September 2010) to Revision A Page • Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section .............................. 1 • Added new ListItem in Features, second one with sub list items........................................................................................... 1 2 Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 5 Pin Configuration and Functions D Package 8-Pin SOIC Top View   R 1 8 V RE 2 7 B DE 3 6 A D 4 5 GND CC Pin Functions PIN NAME TYPE NO. DESCRIPTION A 6 Bus I/O Driver output or receiver input (complementary to B) B 7 Bus I/O Driver output or receiver input (complementary to A) D 4 Digital input Driver data input DE 3 Digital input Driver enable, active high GND 5 Reference potential R 1 RE 2 Digital input VCC 8 Supply Local device ground Digital output Receive data output Receiver enable, active low 3.15-V-to-5.5-V supply 6 Specifications 6.1 Absolute Maximum Ratings See Note VCC (1) . Supply voltage MAX UNIT 7 V 'HVD1780-Q1, 'HVD1781Q1 A, B pins –70 70 'HVD1782-Q1 A, B pins –70 30 Input voltage range at any logic pin –0.3 VCC + 0.3 V Transient overvoltage pulse through 100 Ω per TIA-485 –70 70 V –24 24 mA Voltage range at bus pins Receiver output current Continuous total power dissipation TJ Junction temperature Tstg Storage temperature (1) MIN –0.5 V See Power Dissipation Ratings –40 170 °C 150 °C Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 3 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com 6.2 ESD Ratings—AEC VALUE Human-body model (HBM), per AEC Q100-002 (1) Electrostatic discharge V(ESD) (1) Bus terminals and GND ±16000 All pins ±4000 Charged-device model (CDM), per AEC Q100-011 ±2000 Machine Model (MM), AEC-Q100-003 ±400 UNIT V AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 6.3 ESD Ratings—IEC Electrostatic discharge V(ESD) Human body model (HBM), per IEC 60749-26 Bus terminals and GND VALUE UNIT ±16000 V 6.4 Recommended Operating Conditions MIN NOM MAX 3.15 5 VCC Supply voltage VI Input voltage at any bus terminal (separately or common mode) (1) VIH High-level input voltage (driver, driver enable, and receiver enable inputs) VIL Low-level input voltage (driver, driver enable, and receiver enable inputs) VID Differential input voltage Output current, driver –60 IO 5.5 V –7 12 V 2 VCC V 0 0.8 V –12 12 V 60 mA 8 mA Output current, receiver –8 RL Differential load resistance 54 CL Differential load capacitance 60 Ω 50 pF SN65HVD1780-Q1 1/tUI Signaling rate TA Operating free-air temperature (See the Thermal Information table) TJ Junction Temperature (1) UNIT 0.115 SN65HVD1781-Q1 1 SN65HVD1782-Q1 10 5-V supply –40 105 3.3-V supply –40 125 –40 150 Mbps °C °C By convention, the least positive (most negative) limit is designated as minimum in this data sheet. 6.5 Thermal Information SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 THERMAL METRIC (1) UNIT D (SOIC) 8 PINS JEDEC high-K model 138 °C/W JEDIC low-K model RθJA Junction-to-ambient thermal resistance 242 °C/W RθJC(top) Junction-to-case (top) thermal resistance 61 °C/W RθJB Junction-to-board thermal resistance 62 °C/W ψJT Junction-to-top characterization parameter 3.8 °C/W ψJB Junction-to-board characterization parameter 38.6 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance N/A °C/W (1) 4 For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 6.6 Electrical Characteristics over recommended operating conditions (unless otherwise noted) PARAMETER |VOD| Driver differential output voltage magnitude TEST CONDITIONS MIN RL = 60 Ω, 4.75 V ≤ VCC 375 Ω on each output to –7 V to 12 V, SeeFigure 6 TA < 85°C 1.5 TA < 125°C 1.4 RL = 54 Ω, 4.75 V ≤ VCC ≤ 5.25 V TA < 85°C 1.7 TA < 125°C 1.5 RL = 54 Ω, 3.15 V ≤ VCC ≤ 3.45 V TA < 85°C RL = 100 Ω, 4.75 V ≤ VCC ≤ 5.25 V Δ|VOD| Change in magnitude of driver differential output voltage VOC(SS) Steady-state common-mode output voltage ΔVOC Change in differential driver output commonmode voltage VOC(PP) Peak-to-peak driver common-mode output voltage COD Differential output capacitance VIT+ Positive-going receiver differential input voltage threshold VIT– Negative-going receiver differential input voltage threshold VHYS Receiver differential input voltage threshold hysteresis (VIT+ – VIT–) (1) VOH Receiver high-level output voltage IOH = –8 mA VOL Receiver low-level output voltage IOL = 8 mA II(LOGIC) Driver input, driver enable, and receiver enable input current IOZ Receiver output high-impedance current IOS Driver short-circuit output current II(BUS) Bus input current (disabled driver) Supply current (quiescent) 2.5 2 –50 0 50 mV 1 VCC/2 3 V –50 0 50 mV (1) mV 23 pF mV mV 30 50 mV 2.4 VCC – 0.3 0.2 TA < 125°C VCC = 3.15 to 5.5 V or VCC = 0 V, DE at 0 V –35 –150 V 0.4 0.5 V –50 50 μA –1 1 μA –200 200 mA HVD1780-Q1, HVD1781-Q1 75 100 HVD1782-Q1 400 500 HVD1780-Q1, HVD1781-Q1 –60 –40 HVD1782-Q1 -400 -300 Driver and receiver enabled DE = VCC, RE = GND, no load 4 6 Driver enabled, receiver disabled DE = VCC, RE = VCC, no load 3 5 Driver disabled, receiver enabled DE = GND, RE = GND, no load 2 4 0.15 1 DE = GND, D = open, RE = VCC, no load, TA < Driver and receiver disabled, 85°C standby mode DE = GND, D = open, RE = VCC, no load, TA < 125°C Supply current (dynamic) 500 –180 TA < 85°C VI = –7 V ICC 2.2 –100 VO = 0 V or VCC, RE at VCC UNIT V 1 Center of two 27-Ω load resistors, See Figure 7 VI = 12 V MAX 2 0.8 TA < 125°C RL = 54 Ω TYP μA mA μA 12 See the Typical Characteristics section Ensured by design. Not production tested. Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 5 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com 6.7 Power Dissipation Ratings PARAMETER PD TSD (1) 6 Power dissipation TEST CONDITIONS VALUE VCC = 3.6 V, TJ = 150°C, RL = 300 Ω, CL = 50 pF (driver), CL = 15 pF (receiver) 3.3-V supply, unterminated (1) 75 VCC = 3.6 V, TJ = 150°C, RL = 100 Ω, CL = 50 pF (driver), CL = 15 pF (receiver) 3.3-V supply, RS-422 load (1) 95 VCC = 3.6 V, TJ = 150°C, RL = 54 Ω, CL = 50 pF (driver), CL = 15 pF (receiver) 3.3-V supply, RS-485 load (1) 115 VCC = 5.5 V, TJ = 150°C, RL = 300 Ω, CL = 50 pF (driver), CL = 15 pF (receiver) 5-V supply, unterminated (1) 290 VCC = 5.5 V, TJ = 150°C, RL = 100 Ω, CL = 50 pF (driver), CL = 15 pF (receiver) 5-V supply, RS-422 load (1) 320 VCC = 5.5 V, TJ = 150°C, RL = 54 Ω, CL = 50 pF (driver), CL = 15 pF (receiver) 5-V supply, RS-485 load (1) 400 UNIT mW Thermal-shutdown junction temperature 170 °C Driver and receiver enabled, 50% duty cycle square-wave signal at signaling rate: 1 Mbps. Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 6.8 Switching Characteristics over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 3.15 V < VCC < 3.45 V 0.4 1.4 1.8 μs 3.15 V < VCC < 5.5 V 0.4 1.7 2.6 µs DRIVER (SN65HVD1780) tr, tf Driver differential output rise/fall time RL = 54 Ω, CL = 50 pF, See Figure 8 tPHL, tPLH Driver propagation delay RL = 54 Ω, CL = 50 pF, See Figure 8 0.8 2 μs tSK(P) Driver differential output pulse skew, |tPHL – tPLH| RL = 54 Ω, CL = 50 pF, See Figure 8 20 250 ns tPHZ, tPLZ Driver disable time See Figure 9 and Figure 10 0.1 5 μs Receiver enabled 0.2 3 3 12 tPZH, tPZL Driver enable time Receiver disabled See Figure 9 and Figure 10 μs DRIVER (SN65HVD1781) tr, tf Driver differential output rise/fall time RL = 54 Ω, CL = 50 pF, See Figure 8 300 ns tPHL, tPLH Driver propagation delay RL = 54 Ω, CL = 50 pF, See Figure 8 200 ns tSK(P) Driver differential output pulse skew, |tPHL – tPLH| RL = 54 Ω, CL = 50 pF, See Figure 8 25 ns tPHZ, tPLZ Driver disable time See Figure 9 and Figure 10 tPZH, tPZL Receiver enabled Driver enable time Receiver disabled 50 See Figure 9 and Figure 10 3 μs 300 ns 10 μs DRIVER (SN65HVD1782) All VCC and Temp 50 tr, tf Driver differential output rise/fall time RL = 54 Ω, CL = 50 pF tPHL, tPLH Driver propagation delay RL = 54 Ω, CL = 50 pF, See Figure 8 55 ns tSK(P) Driver differential output pulse skew, |tPHL – tPLH| RL = 54 Ω, CL = 50 pF, See Figure 8 10 ns tPHZ, tPLZ Driver disable time See Figure 9 and Figure 10 tPZH, tPZL Receiver enabled Driver enable time Receiver disabled VCC > 4.5V and T < 105°C 16 See Figure 9 and Figure 10 ns 3 μs 300 ns 9 μs RECEIVER (ALL DEVICES UNLESS OTHERWISE NOTED) (1) tr, tf Receiver output rise/fall time tPHL, tPLH Receiver propagation delay time tSK(P) tPLZ, tPHZ tPZL(1), tPZH(1) tPZL(2), tPZH(2) (1) Receiver output pulse skew, |tPHL – tPLH| Receiver disable time CL = 15 pF, See Figure 11 CL = 15 pF, See Figure 11 CL = 15 pF, See Figure 11 (1) Receiver enable time All devices HVD1780-Q1, HVD1781-Q1 4 15 100 200 HVD1782-Q1 ns ns 80 HVD1780-Q1, HVD1781-Q1 6 HVD1782-Q1 20 ns 5 Driver enabled, See Figure 12 15 100 ns Driver enabled, See Figure 12 80 300 ns Driver disabled, See Figure 13 3 9 μs Ensured by design. Not production tested. 6.9 Package Dissipation Ratings PACKAGE (1) SOIC (D) 8-pin (1) JEDEC THERMAL MODEL TA < 25°C RATING DERATING FACTOR ABOVE TA = 25°C TA = 85°C RATING TA = 105°C RATING TA = 125°C RATING (3.3 V ONLY) High-K 905 mW 7.25 mW/°C 470 mW 325 mW 180 mW Low-K 516 mW 4.1 mW/°C 268 mW 186 mW 103 mW For the most current package and ordering information, see the Mechanical, Packaging, and Orderable Information section, or see the TI website at www.ti.com. Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 7 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com 10 80 0 70 ICC − RMS Supply Current − mA IO − Driver Output Current − mA 6.10 Typical Characteristics −10 −20 −30 TA = 25°C DE at VCC D at VCC RL = 54 W −40 TA = 25°C RE at VCC DE at VCC RL = 54 W CL = 50 pF VCC = 5 V 60 50 40 VCC = 3.3 V 30 20 −50 0 1 2 3 4 5 0 6 100 200 300 400 500 600 700 800 900 1000 Signaling Rate − kbps VCC − Supply Voltage − V G002 G001 Figure 2. RMS Supply Current vs Signaling Rate Figure 1. Driver Output Current vs Supply Voltage 4.4 35 30 VCC = 5.5 V 3.6 VCC = 3.3 V 3.2 25 Load = 300 W 2.8 2.4 Rise\Fall Time - (ns) VOD − Differential Output Voltage − V 4.0 Load = 100 W 2.0 Load = 60 W 1.6 1.2 20 15 VCC = 5 V 10 VCC = 3.3 V 0.8 5 0.4 VCC = 3.15 V 0.0 0 5 10 15 20 25 30 35 40 45 I(diff) − Differential Load Current − mA 0 50 -50 0 50 100 150 Temperature - (°C) G003 Figure 3. Differential Output Voltage vs Differential Load Current Figure 4. SN65HVD1782 Rise and Fall Time 2.5 RL = 50 W, CL = 50 pF 2.3 VCC = 5.5 V VOD − Differential Output − V 2.1 VCC = 5 V 1.9 1.7 VCC = 4.5 V 1.5 1.3 VCC = 4 V VCC = 3.6 V 1.1 VCC = 3.3 V 0.9 VCC = 3 V 0.7 2700 2500 2300 2100 1700 1900 1500 1300 1100 900 700 500 0.5 Transition Time − ns Figure 5. SN65HVD1780 Differential Output Amplitude and Transition Time vs Supply Voltage 8 Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 7 Parameter Measurement Information Input generator rate is 100 kbps, 50% duty cycle, rise and fall times less than 6 ns, output impedance 50 Ω. 375 W ±1% VCC DE 0 V or 3 V A D VOD 60 W ±1% B + _ –7 V < V(test) < 12 V 375 W ±1% Copyright © 2016, Texas Instruments Incorporated Figure 6. Measurement of Driver Differential Output Voltage With Common-Mode Load VCC 27 W ±1% DE Input A D A VA B VB VOC(PP) VOC B DVOC(SS) CL = 50 pF ±20% 27 W ±1% VOC CL Includes Fixture and Instrumentation Capacitance Copyright © 2016, Texas Instruments Incorporated Figure 7. Measurement of Driver Differential and Common-Mode Output With RS-485 Load 3V VCC DE D Input Generator VI CL = 50 pF ±20% A VOD 50 W B RL = 54 W ±1% CL Includes Fixture and Instrumentation Capacitance VI 50% 50% tPLH VOD tPHL »2V 90% 90% 0V 10% 0V 10% tr » –2 V tf Copyright © 2016, Texas Instruments Incorporated Figure 8. Measurement of Driver Differential Output Rise and Fall Times and Propagation Delays 3V D DE Input Generator VI 50 W A 3V S1 B CL = 50 pF ±20% CL Includes Fixture and Instrumentation Capacitance VO VI RL = 110 W ± 1% 50% 50% tPZH VO 0V 0.5 V VOH 90% 50% tPHZ »0V Copyright © 2016, Texas Instruments Incorporated NOTE: D at 3 V to test non-inverting output, D at 0 V to test inverting output. Figure 9. Measurement of Driver Enable and Disable Times With Active High Output and Pulldown Load Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 9 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com Parameter Measurement Information (continued) 3V A 3V D DE Input Generator RL = 110 W ±1% S1 »3V VI VO 50% 50% 0V B tPZL tPLZ CL = 50 pF ±20% VI 50 W »3V CL Includes Fixture and Instrumentation Capacitance VO 50% 10% VOL Copyright © 2016, Texas Instruments Incorporated NOTE: D at 0 V to test non-inverting output, D at 3 V to test inverting output. Figure 10. Measurement of Driver Enable and Disable Times With Active-Low Output and Pullup Load A Input Generator R VI 50 W 1.5 V 0V VO B CL = 15 pF ±20% RE CL Includes Fixture and Instrumentation Capacitance 3V VI 50% 50% 0V tPLH VO tPHL 90% 90% 50% 10% tr 50% 10% VOH VOL tf Copyright © 2016, Texas Instruments Incorporated Figure 11. Measurement of Receiver Output Rise and Fall Times and Propagation Delays 10 Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 Parameter Measurement Information (continued) 3V VCC DE A 0 V or 3 V D B RE Input Generator VI 1 kW ± 1% R VO S1 CL = 15 pF ±20% CL Includes Fixture and Instrumentation Capacitance 50 W 3V VI 50% 50% 0V tPZH(1) tPHZ VOH 90% VO 50% D at 3 V S1 to GND »0V tPZL(1) tPLZ VCC VO 50% D at 0 V S1 to VCC 10% VOL Copyright © 2016, Texas Instruments Incorporated Figure 12. Measurement of Receiver Enable and Disable Times With Driver Enabled Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 11 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com Parameter Measurement Information (continued) VCC A 0 V or 1.5 V R VO S1 B 1.5 V or 0 V RE Input Generator VI 1 kW ± 1% CL = 15 pF ±20% CL Includes Fixture and Instrumentation Capacitance 50 W 3V VI 50% 0V tPZH(2) VOH VO A at 1.5 V B at 0 V S1 to GND 50% GND tPZL(2) VCC VO 50% VOL A at 0 V B at 1.5 V S1 to VCC Copyright © 2016, Texas Instruments Incorporated Figure 13. SN65HVD1781 Measurement of Receiver Enable Times With Driver Disabled 12 Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 8 Detailed Description 8.1 Overview The SN65HVD1780-Q1, SN65HVD1781-Q1, and SN65HVD1782-Q1 devices are half-duplex RS-485 transceivers available in three speed grades suitable for data transmission up to 115 kbps, 1 Mbps, and 10 Mbps. These devices feature a wide common-mode operating range and bus-pin fault protection up to ±70 V. Each device has an active-high driver enable and active-low receiver enable. A standby current of less than 1 µA can be achieved by disabling both driver and receiver. 8.2 Functional Block Diagram VCC R RE A B DE D GND Copyright © 2016, Texas Instruments Incorporated 8.3 Feature Description Internal ESD protection circuits protect the transceiver bus terminals against ±16-kV Human Body Model (HBM) electrostatic discharges. Device operation is specified over a wide temperature range from –40°C to 125°C. 8.3.1 Bus Fault Conditions The SN65HVD178x-Q1 family of RS-485 transceivers is designed to survive bus pin faults up to ±70 V. The SN65HVD1782-Q1 device will not survive a bus pin fault with a direct short to voltages above 30 V when all of the following occurs: • The device is powered on • The driver is enabled (DE = HIGH), and one of of the following is true – D = HIGH AND the bus fault is applied to the A pin – D = LOW AND the bus fault is applied to the B pin Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 13 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com Feature Description (continued) Under other conditions, the device survives shorts to bus pin faults up to ±70 V. Table 1 summarizes the conditions under which the device may be damaged, and the conditions under which the device will not be damaged. Table 1. Bus Fault Conditions for the HVD1782 POWER DE D A B OFF X X –70 V < VA < 70 V –70 V < VB < 70 V RESULTS Device survives ON LO X –70 V < VA < 70 V –70 V < VB < 70 V Device survives ON HI L –70 V < VA < 70 V –70 V < VB < 30 V Device survives ON HI L –70 V < VA < 70 V 30 V < VB ON HI H –70 V < VA < 30 V –70 V < VB < 30 V Device survives ON HI H 30 V < VA –70 V < VB < 30 V Damage may occur Damage may occur 8.3.2 Receiver Failsafe The SN65HVD178x-Q1 family of half-duplex transceivers provides internal biasing of the receiver input thresholds in combination with large input-threshold hysteresis. At a positive input threshold of VIT+ = –35 mV and an input hysteresis of VHYS = 30 mV, the receiver output remains logic high under bus-idle, bus-short, or open bus conditions in the presence of up to 130-mVPP differential noise without the need for external failsafe biasing resistors. 8.3.3 Hot-Plugging These devices are designed to operate in hot swap or hot-pluggable applications. Key features for hot-pluggable applications are power-up and power-down glitch free operation, default disabled input and output pins, and receiver failsafe. As shown in the Functional Block Diagram, an internal power-on reset circuit keeps the driver outputs in a high impedance state until the supply voltage has reached a level at which the device will reliably operate. This circuit ensures that no problems occur on the bus pin outputs as the power supply turns on or off. As shown in Device Functional Modes, the driver and receiver enable inputs (DE and RE) are disabled by default. This default ensures that the device neither drives the bus nor reports data on the R pin until the associated controller actively drivers the enable pins. 8.4 Device Functional Modes When the driver enable pin, DE, is logic high, the differential outputs A and B follow the logic states at data input D. A logic high at D causes A to turn high and B to turn low. In this case the differential output voltage defined as VOD = VA – VB is positive. When D is low, the output states reverse, B turns high, A becomes low, and VOD is negative. When DE is low, both outputs turn high-impedance. In this condition the logic state at D is irrelevant. The DE pin has an internal pull-down resistor to ground, thus when left open the driver is disabled (high-impedance) by default. The D pin has an internal pull-up resistor to VCC, thus, when left open while the driver is enabled, output A turns high and B turns low. Table 2. Driver Function Table 14 INPUT ENABLE D DE A H H H L Actively drive bus High L H L H Actively drive bus Low X L Z Z Driver disabled X OPEN Z Z Driver disabled by default OPEN H H L Actively drive bus High by default Submit Documentation Feedback OUTPUTS DRIVER STATE B Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 When the receiver enable pin, RE, is logic low, the receiver is enabled. When the differential input voltage defined as VID = VA – VB is positive and higher than the positive input threshold, VIT+, the receiver output, R, turns high. When VID is negative and lower than the negative input threshold, VIT–, the receiver output, R, turns low. If VID is between VIT+ and VIT– the output is indeterminate. When RE is logic high or left open, the receiver output is high-impedance and the magnitude and polarity of VID are irrelevant. Internal biasing of the receiver inputs causes the output to go failsafe-high when the transceiver is disconnected from the bus (open-circuit), the bus lines are shorted (short-circuit), or the bus is not actively driven (idle bus). Table 3. Receiver Function Table DIFFERENTIAL INPUT ENABLE OUTPUT VID = VA – VB RE R VID > VIT+ L H Receive valid bus High VIT– < VID < VIT+ L ? Indeterminate bus state RECEIVER STATE VID < VIT– L L Receive valid bus Low X H Z Receiver disabled X OPEN Z Receiver disabled by default Open-circuit bus L H Fail-safe high output Short-circuit bus L H Fail-safe high output Idle (terminated) bus L H Fail-safe high output Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 15 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information The SN65HVD178x-Q1 family of devices is a half-duplex RS-485 transceiver commonly used for asynchronous data transmissions. The driver and receiver enable pins allow for the configuration of different operating modes. R R R R R R RE A RE A RE A DE B DE B DE B D D D D D D Copyright © 2016, Texas Instruments Incorporated Figure 14. Half-Duplex Transceiver Configurations Using independent enable lines provides the most flexible control as it allows for the driver and the receiver to be turned on and off individually. While this configuration requires two control lines, it allows for selective listening into the bus traffic, whether the driver is transmitting data or not. Combining the enable signals simplifies the interface to the controller by forming a single direction-control signal. In this configuration, the transceiver operates as a driver when the direction-control line is high, and as a receiver when the direction-control line is low. Additionally, only one line is required when connecting the receiver-enable input to ground and controlling only the driver-enable input. In this configuration, a node not only receives the data from the bus, but also the data it sends and can verify that the correct data have been transmitted. 9.2 Typical Application An RS-485 bus consists of multiple transceivers connecting in parallel to a bus cable. To eliminate line reflections, each cable end is terminated with a termination resistor, RT, whose value matches the characteristic impedance, Z0, of the cable. This method, known as parallel termination, allows for higher data rates over longer cable length. R R RE B DE D R A R A RT RT D A B A R DE D B D R D R RE B RE DE D D R RE DE D Copyright © 2016, Texas Instruments Incorporated Figure 15. Typical RS-485 Network With Half-Duplex Transceivers 16 Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 Typical Application (continued) 9.2.1 Design Requirements RS-485 is a robust electrical standard suitable for long-distance networking that may be used in a wide range of applications with varying requirements, such as distance, data rate, and number of nodes. 9.2.1.1 Data Rate and Bus Length There is an inverse relationship between data rate and bus length, meaning the higher the data rate, the shorter the cable length; and conversely, the lower the data rate, the longer the cable may be without introducing data errors. While most RS-485 systems use data rates between 10 kbps and 100 kbps, some applications require data rates up to 250 kbps at distances of 4000 feet and longer. Longer distances are possible by allowing for small signal jitter of up to 5 or 10%. 10000 Cable Length (ft) 5%, 10%, and 20% Jitter 1000 Conservative Characteristics 100 10 100 1k 10k 100k 1M 10M 100M Data Rate (bps) Figure 16. Cable Length vs Data Rate Characteristic 9.2.1.2 Bus Loading The RS-485 standard specifies that a compliant driver must be able to driver 32 unit loads (UL), where 1 unit load represents a load impedance of approximately 12 kΩ. Because the SN65HVD7x-Q1 family of devices consists of 1/10 UL transceivers, it is possible to connect up to 320 receivers to the bus. 9.2.2 Detailed Design Procedure Although the SN65HVD178x-Q1 family of devices is internally protected against human-body-model ESD strikes up to 16 kV, additional protection against higher-energy transients can be provided at the application level by implementing external protection devices. Figure 17 shows a protection circuit intended to withstand 8-kV IEC ESD (per IEC 61000-4-2) as well as 4-kV EFT (per IEC 61000-4-4). Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 17 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com Typical Application (continued) 3.3 V 100 nF 100 nF VCC 10 k R1 R RxD MCU/ UART DIR RE A DE B TVS D TxD R2 GND 10 k Copyright © 2016, Texas Instruments Incorporated Figure 17. RS-485 Transceiver with External Transient Protection Table 4. Bill of Materials DEVICE FUNCTION ORDER NUMBER MANUFACTURER XCVR RS-485 Transceiver SN65HVD178x-Q1 TI R1, R2 10-Ω, Pulse-Proof Thick-Film Resistor CRCW0603010RJNEAHP Vishay TVS Bidirectional 600-W Transient Suppressor SMBJ43CA Littlefuse 9.2.2.1 Stub Length When connecting a node to the bus, the distance between the transceiver inputs and the cable trunk, known as the stub, should be as short as possible. Stubs present a non-terminated piece of bus line which can introduce reflections as the length of the stub increases. As a general guideline, the electrical length, or round-trip delay, of a stub should be less than one-tenth of the rise time of the driver, thus giving a maximum physical stub length as shown in Equation 1. Lstub ≤ 0.1 × tr × v × c where • • • tr is the 10/90 rise time of the driver c is the speed of light (3 × 108 m/s) v is the signal velocity of the cable or trace as a factor of c (1) 9.2.2.2 Receiver Failsafe The differential receivers of the SN65HVD178x-Q1 family have receiver input thresholds that are offset so that receiver output state is known for the following three fault conditions: • Open bus conditions, such as a disconnected connector • Shorted bus conditions, such as cable damage shorting the twisted-pair together • Idle bus conditions that occur when no driver on the bus is actively driving In any of these cases, the differential receiver will output a failsafe logic High state so that the output of the receiver is not indeterminate. 18 Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 Receiver failsafe is accomplished by offsetting the receiver thresholds such that the input indeterminate range does not include zero volts differential. In order to comply with the RS-422 and RS-485 standards, the receiver output must output a High when the differential input VID is more positive than 200 mV, and must output a Low when VID is more negative than –200 mV. The receiver parameters which determine the failsafe performance are VIT(+), VIT(–), and VHYS (the separation between VIT(+) and VIT(–)). As shown in the Electrical Characteristics table, differential signals more negative than –200mV will always cause a Low receiver output, and differential signals more positive than 200 mV will always cause a High receiver output. When the differential input signal is close to zero, it is still above the maximum VIT(+) threshold of –35 mV, and the receiver output will be High. Only when the differential input is more than VHYS below VIT(+) will the receiver output transition to a Low state. Therefore, the noise immunity of the receiver inputs during a bus fault condition includes the receiver hysteresis value, VHYS, as well as the value of VIT(+). R Vhys (min) 30 mV -65 -35 0 +65 VID (mV) Vn max = 130 mVpp Figure 18. Noise Immunity Under Bus Fault Conditions 9.2.3 Application Curve SN65HVD1781-Q1 D Input Differential Output R Output 1-Mbps Operation Figure 19. SN65HVD1781-Q1 PRBS Data Pattern Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 19 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 www.ti.com 10 Power Supply Recommendations To ensure reliable operation at all data rates and supply voltages, each supply should be buffered with a 100-nF ceramic capacitor located as close to the supply pins as possible. The TPS7A6150-Q1 is a linear voltage regulator suitable for the 5-V supply. 11 Layout 11.1 Layout Guidelines On-chip IEC-ESD protection is good for laboratory and portable equipment but often insufficient for EFT and surge transients occurring in industrial environments. Therefore robust and reliable bus node design requires the use of external transient protection devices. Because ESD and EFT transients have a wide frequency bandwidth from approximately 3 MHz to 3 GHz, highfrequency layout techniques must be applied during PCB design. 1. Place the protection circuitry close to the bus connector to prevent noise transients from entering the board. 2. Use VCC and ground planes to provide low-inductance. High-frequency currents follow the path of least inductance and not the path of least impedance. 3. Design the protection components into the direction of the signal path. Do not force the transient currents to divert from the signal path to reach the protection device. 4. Apply 100-nF to 220-nF bypass capacitors as close as possible to the VCC pins of the transceiver, UART, or controller ICs on the board. 5. Use at least two vias for VCC and ground connections of bypass capacitors and protection devices to minimize effective via inductance. 6. Use 1-kΩ to 10-kΩ pullup and pulldown resistors for enable lines to limit noise currents in these lines during transient events. 7. While pure TVS protection is sufficient for surge transients up to 1 kV, higher transients require metal-oxide varistors (MOVs) which reduce the transients to a few hundred volts of clamping voltage, and transient blocking units (TBUs) that limit transient current to less than 1 mA. 11.2 Layout Example 5 Via to ground C R 6 Via to VCC 4 R JMP 1 R MCU 5 TVS 6 R SN65HVD178x 5 Figure 20. Half-Duplex Layout Example 20 Submit Documentation Feedback Copyright © 2010–2017, Texas Instruments Incorporated Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 SN65HVD1780-Q1, SN65HVD1781-Q1, SN65HVD1782-Q1 www.ti.com SLLSE49D – SEPTEMBER 2010 – REVISED JULY 2017 12 Device and Documentation Support 12.1 Device Support 12.1.1 Third-Party Products Disclaimer TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE. 12.2 Documentation Support 12.2.1 Related Documentation For related documentation see the following: • RS-485 Half-Duplex Evaluation Module • SN65HVD17xx Fault-Protected RS-485 Transceivers With Extended Common-Mode Range • TPS7A6xxx-Q1 300-mA 40-V Low-Dropout Regulator With 25-µA Quiescent Current 12.3 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 12.4 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.5 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 12.6 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.7 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Copyright © 2010–2017, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD1780-Q1 SN65HVD1781-Q1 SN65HVD1782-Q1 21 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) SN65HVD1780QDRQ1 ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 1780Q SN65HVD1781QDRQ1 ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 1781Q SN65HVD1782QDRQ1 ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 1782Q (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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