SN74CB3Q3305
SCDS141D – OCTOBER 2003 – REVISED SEPTEMBER 2021
SN74CB3Q3305 Dual FET Bus Switch
2.5-V or 3.3-V Low-Voltage High-Bandwidth Bus Switch
1 Features
•
•
•
•
•
•
•
•
•
•
•
•
•
•
3 Description
MHz)1
High-bandwidth data path (up to 500
5-V tolerant I/Os with device powered up or
powered down
Low and flat ON-state resistance (ron)
characteristics over operating range
(ron = 3 Ω typical)
Supports input voltage beyond supply on data I/O
ports
– 0 to 5 V switching with 3.3 V VCC
– 0 to 3.3 V switching with 2.5 V VCC
Bidirectional data flow with near-zero propagation
delay
Low input or output capacitance minimizes loading
and signal distortion
(Cio(OFF) = 3.5 pF typical)
Fast switching frequency (fOE = 20 MHz maximum)
Data and control inputs provide undershoot clamp
diodes
Low power consumption (ICC = 0.25 mA typical)
VCC operating range from 2.3 V to 3.6 V
Data I/Os support 0 to 5 V signaling levels (0.8 V,
1.2 V, 1.5 V, 1.8 V, 2.5 V, 3.3 V, and 5 V)
Control inputs can be driven by TTL or
5 V/3.3 V CMOS outputs
Ioff supports partial-power-down mode operation
Latch-up performance exceeds 100 mA per JESD
78, Class II
2 Applications
•
•
•
•
•
•
•
IP phones: wired and wireless
Optical modules
Optical networking: video over fiber and EPON
Private branch exchange (PBX)
WiMAX and wireless infrastructure equipment
USB, differential signal interface
Bus isolation
The SN74CB3Q3305 device is a high-bandwidth FET
bus switch using a charge pump to elevate the
gate voltage of the pass transistor, providing a low
and flat ON-state resistance (ron). The low and flat
ON-state resistance allows for minimal propagation
delay and supports switching input voltage beyond
the supply on the data input/output (I/O) ports. The
device also features low data I/O capacitance to
minimize capacitive loading and signal distortion on
the data bus. Specifically designed to support highbandwidth applications, the SN74CB3Q3305 device
provides an optimized interface solution ideally suited
for broadband communications, networking, and dataintensive computing systems.
This device is fully specified for partial-power-down
applications using Ioff. The Ioff circuitry prevents
damaging current backflow through the device when
it is powered down. The device has isolation during
power off.
To ensure the high-impedance state during power up
or power down, OE should be tied to GND through a
pulldown resistor; the minimum value of the resistor
is determined by the current-sourcing capability of the
driver.
Device Information(1)
PART NUMBER
SN74CB3Q3305
(1)
PACKAGE
BODY SIZE (NOM)
VSSOP (8)
2.00 mm × 3.10 mm
TSSOP (8)
3.00 mm × 6.10 mm
For all available packages, see the orderable addendum at
the end of the data sheet.
B
A
VCC
Charge
Pump
EN(1)
(1) EN is the internal enable signal applied to the switch.
Simplified Schematic, Each FET Switch (SW)
1
For additional information regarding the performance characteristics of the CB3Q family, refer to the TI application report, CBT-C,
CB3T, and CB3Q Signal-Switch Families, SCDA008.
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
SN74CB3Q3305
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SCDS141D – OCTOBER 2003 – REVISED SEPTEMBER 2021
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 4
6.1 Absolute Maximum Ratings........................................ 4
6.2 ESD Ratings............................................................... 4
6.3 Recommended Operating Conditions(1) .................... 4
6.4 Thermal Information....................................................5
6.5 Electrical Characteristics.............................................5
6.6 Switching Characteristics............................................6
6.7 Typical Characteristics................................................ 6
7 Parameter Measurement Information............................ 7
8 Detailed Description........................................................8
8.1 Overview..................................................................... 8
8.2 Functional Block Diagram........................................... 8
8.3 Feature Description.....................................................8
8.4 Device Functional Modes............................................8
9 Application and Implementation.................................... 9
9.1 Application Information............................................... 9
9.2 Typical Application...................................................... 9
10 Power Supply Recommendations..............................10
11 Layout........................................................................... 10
11.1 Layout Guidelines................................................... 10
11.2 Layout Example...................................................... 10
12 Device and Documentation Support..........................11
12.1 Documentation Support.......................................... 11
12.2 Receiving Notification of Documentation Updates.. 11
12.3 Support Resources................................................. 11
12.4 Trademarks............................................................. 11
12.5 Electrostatic Discharge Caution.............................. 11
12.6 Glossary.................................................................. 11
13 Mechanical, Packaging, and Orderable
Information.................................................................... 11
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision C (October 2015) to Revision D (September 2021)
Page
• Updated the numbering format for tables, figures, and cross-references throughout the document..................1
• Updated data sheet to include inclusive terminology..........................................................................................1
Changes from Revision B (October 2009) to Revision C (October 2015)
Page
• Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device
Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout
section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information
section ............................................................................................................................................................... 1
2
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5 Pin Configuration and Functions
1OE
1A
1B
GND
1
8
2
7
3
6
4
5
VCC
2OE
2B
2A
1OE
1
8
VCC
1A
2
7
2OE
1B
3
6
2B
GND
4
5
2A
Figure 5-2. DCU Package
8-Pin VSSOP
Top View
Figure 5-1. PW Package
8-Pin TSSOP
Top View
Table 5-1. Pin Functions
PIN
NAME
NO.
TYPE(1)
DESCRIPTION
1A
2
I/O
Channel 1 A port
1B
3
I/O
Channel 1 B port
1OE
1
I
2A
5
I/O
Channel 2 A port
2B
6
I/O
Channel 2 B port
2OE
7
I
Output Enable for switch 2
GND
4
P
Ground
Vcc
8
P
Power supply
(1)
Output Enable for switch 1
I = input, O = output, I/O = input and output, P = power
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
UNIT
–0.5
4.6
V
VIN
Control input
voltage(2) (3)
–0.5
7
V
VI/O
Switch I/O voltage(2) (3) (4)
–0.5
7
V
IIK
Control input clamp current
VIN < 0
–50
mA
II/OK
I/O port clamp current
VI/O < 0
–50
mA
VCC
Supply voltage
II/O
ON-state switch
current(5)
Continuous current through VCC or GND
impedance(6)
θJA
Package thermal
Tj
Junction temperature
Tstg
Storage temperature
(1)
(2)
(3)
(4)
(5)
(6)
–65
±64
mA
±100
mA
88
°C/W
150
°C
150
°C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
All voltages are with respect to ground, unless otherwise specified.
The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
VI and VO are used to denote specific conditions for VI/O.
II and IO are used to denote specific conditions for II/O.
The package thermal impedance is calculated in accordance with JESD 51-7.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic
discharge
Human body model (HBM), per ANSI/ESDA/JEDEC
JS-001(1)
UNIT
2000
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
V
1000
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions(1)
MAX
2.3
3.6
Supply voltage
VIH
High-level control input
voltage
VCC = 2.3 V to 2.7 V
1.7
VCC = 2.7 V to 3.6 V
2
VIL
Low-level control input
voltage
VCC = 2.3 V to 2.7 V
0.7
VCC = 2.7 V to 3.6 V
0.8
VI/O
Data input/output voltage
TA
Operating free-air temperature
(1)
4
MIN
VCC
UNIT
V
V
V
0
5.5
V
–40
85
°C
All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application
report, Implications of Slow or Floating CMOS Inputs, SCBA004.
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6.4 Thermal Information
THERMAL
METRIC(1)
SN74CB3Q3305
SN74CB3Q3305
DCU (VSSOP)
PW (TSSOP)
8 PINS
8 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
183
190.6
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
64.2
74.0
°C/W
RθJB
Junction-to-board thermal resistance
62.5
119.4
°C/W
ψJT
Junction-to-top characterization parameter
4.3
120.0
°C/W
ψJB
Junction-to-board characterization parameter
62.1
117.7
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
—
—
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.5 Electrical Characteristics
over recommended operating free-air temperature range (unless otherwise noted)(1)
PARAMETER
VIK
TEST CONDITIONS
VCC = 3.6 V,
II = –18 mA
VCC = 3.6 V,
VIN = 0 to 5.5 V
IOZ (3)
VCC = 3.6 V,
VO = 0 to 5.5 V,
VI = 0,
Switch OFF,
VIN = VCC or GND
Ioff
VCC = 0,
VO = 0 to 5.5 V,
VI = 0
VCC = 3.6 V,
II/O = 0,
Switch ON or OFF,
VIN = VCC or GND
Control
inputs
IIN
ICC
ΔICC (4)
Control
inputs
ICCD (5)
A and B ports open,
Per control VCC = 3.6 V,
input
Control input switching at 50% duty cycle
Cin
Control
inputs
MIN
TYP(2)
0.25
VCC = 3.6 V, One input at 3 V, Other inputs at VCC or GND
MAX
UNIT
–1.8
V
±1
µA
±1
µA
1
µA
0.7
mA
25
µA
mA/
MHz
0.040
0.045
2.5
3.5
pF
VCC = 3.3 V,
VIN = 5.5 V, 3.3 V, or 0
Cio(OFF)
VCC = 3.3 V,
Switch OFF,
VIN = VCC or GND,
VI/O = 5.5 V, 3.3 V, or 0
3.5
5
pF
Cio(ON)
VCC = 3.3 V,
Switch ON,
VIN = VCC or GND,
VI/O = 5.5 V, 3.3 V, or 0
8
10.5
pF
3
8
3.5
9
3
6
3.5
8
ron (6)
VCC = 2.3 V,
TYP at VCC = 2.5 V
VCC = 3 V
(1)
(2)
(3)
(4)
(5)
(6)
VI = 0, IO = 30 mA
VI = 1.7 V, IO = –15 mA
VI = 0, IO = 30 mA
VI = 2.4 V, IO = –15 mA
Ω
VIN and IIN refer to control inputs. VI, VO, II, and IO refer to data pins.
All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C.
For I/O ports, the parameter IOZ includes the input leakage current.
This is the increase in supply current for each input that is at the specified TTL voltage level, rather than VCC or GND.
This parameter specifies the dynamic power-supply current associated with the operating frequency of a single control input (see
Figure 9-2).
Measured by the voltage drop between the A and B terminals at the indicated current through the switch. ON-state resistance is
determined by the lower of the voltages of the two (A or B) terminals.
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6.6 Switching Characteristics
over recommended operating free-air temperature range (unless otherwise noted) (see Figure 7-1)
FROM
(INPUT)
TO
(OUTPUT)
OE
A or B
A or B
B or A
ten
OE
A or B
tdis
OE
A or B
PARAMETER
fOE
(1)
tpd (2)
(1)
(2)
VCC
MIN
MAX
VCC = 2.5 V ± 0.2 V
10
VCC = 3.3 V ± 0.3 V
20
VCC = 2.5 V ± 0.2 V
0.09
VCC = 3.3 V ± 0.3 V
0.15
VCC = 2.5 V ± 0.2 V
1
5
VCC = 3.3 V ± 0.3 V
1
4.5
VCC = 2.5 V ± 0.2 V
1
4.5
VCC = 3.3 V ± 0.3 V
1
5
UNIT
MHz
ns
ns
ns
Maximum switching frequency for control input (VO > VCC, VI = 5 V, RL ≥ 1 MΩ, CL = 0).
The propagation delay is the calculated RC time constant of the typical ON-state resistance of the switch and the specified load
capacitance, when driven by an ideal voltage source (zero output impedance).
6.7 Typical Characteristics
ron – ON-State Resistance – Ω
16
14
12
VCC = 3.3 V
TA = 25°C
IO = –15 mA
10
8
6
4
2
0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
VI – V
Figure 6-1. Typical ron vs VI
6
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7 Parameter Measurement Information
VCC
Input Generator
VIN
50 Ω
50 Ω
VG1
TEST CIRCUIT
DUT
2 × VCC
Input Generator
VI
S1
RL
VO
50 Ω
50 Ω
VG2
RL
CL
(see Note A)
TEST
VCC
S1
RL
VI
CL
tpd(s)
2.5 V ± 0.2 V
3.3 V ± 0.3 V
Open
Open
500 Ω
500 Ω
VCC or GND
VCC or GND
30 pF
50 pF
tPLZ/tPZL
2.5 V ± 0.2 V
3.3 V ± 0.3 V
2 × VCC
2 × VCC
500 Ω
500 Ω
GND
GND
30 pF
50 pF
0.15 V
0.3 V
tPHZ/tPZH
2.5 V ± 0.2 V
3.3 V ± 0.3 V
GND
GND
500 Ω
500 Ω
VCC
VCC
30 pF
50 pF
0.15 V
0.3 V
V∆
VCC
Output
Control
(VIN)
VCC/2
VCC/2
0V
tPZL
Output
Control
(VIN)
VCC
VCC/2
VCC/2
0V
tPLH
tPHL
VCC/2
Output
Waveform 1
S1 at 2 × VCC
(see Note B)
tPLZ
VCC
VCC/2
tPZH
VOH
Output
Open
GND
VCC/2
VOL
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES (tpd(s))
VOL + V∆
VOL
tPHZ
VOH
VCC/2
VOH − V∆
0V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd(s). The tpd propagation delay is the calculated RC time constant of the typical ON-state resistance
of the switch and the specified load capacitance, when driven by an ideal voltage source (zero output impedance).
H. All parameters and waveforms are not applicable to all devices.
Figure 7-1. Test Circuit and Voltage Waveforms
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8 Detailed Description
8.1 Overview
The SN74CB3Q3305 device is organized as two 1-bit switches with separate output-enable (1OE and 2OE)
inputs. It can be used as two 1-bit bus switches or as one 2-bit bus switch. When OE is high, the associated 1-bit
bus switch is ON and the A port is connected to the B port, allowing bidirectional data flow between ports. When
OE is low, the associated 1-bit bus switch is OFF and a high-impedance state exists between the A and B ports.
8.2 Functional Block Diagram
2
3
1A
1B
SW
1
1OE
5
6
2A
2B
SW
7
2OE
Figure 8-1. Logic Diagram (Positive Logic)
8.3 Feature Description
The device supports High-Bandwidth data path up to 500 MHz. The I/O ports are 5 V tolerant when powered up
or powered down due to IOFF. The charge pump creates low and flat ON-state resistance characteristics over the
whole operating temperature range.
Switching input voltage beyond the supply is supported on data I/O ports: 0 V to 5 V with 3.3 V VCC or 0 V to 3.3
V with 2.5 V VCC.
The data flow is bidirectional with near-zero propagation delay. Reduced input/output capacitance for higher
speed applications. OE can be toggled at the high speeds of 20 MHz for fast switching applications.
8.4 Device Functional Modes
Table 8-1 lists the functional modes of the SN74CB3Q3305.
Table 8-1. Function Table (Each Bus Switch)
8
INPUT
OE
INPUT/OUTPUT
A
FUNCTION
H
B
A port = B port
L
Z
Disconnect
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9 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
9.1 Application Information
Figure 9-1 shows that the SN74CB3Q3305 can be used as bidirectional switch. The controller operates at 5
V and the peripheral can accept 5 V. Even with a VCC of 3 V on the SN74CB3Q3305, the two ports can be
connected to pass the 5 V signal. The controller uses the OE pin control the switch. This is a very generic
example and could apply to many situations. For applications that require only 1 bit (for example, one channel),
tie the unused OE low and tie the unused ports A and B to either high or low (not shown).
9.2 Typical Application
3V
5V
0.1 F
VCC
8
1A
2OE
7
5
2A
2B
6
4
GND
1B
3
1
1OE
2
5V
CONTROLLER
PERIPHERAL
SN74CB3Q3305
Figure 9-1. Typical Application of the SN74CB3Q3305
9.2.1 Design Requirements
1. Recommended Input Conditions:
• For specified high and low levels, see VIH and VIL in Section 6.3.
• Inputs and outputs are overvoltage tolerant allowing them to go as high as 5.5 V at any valid VCC.
2. Absolute Maximum Conditions:
• I/O currents should not exceed ±64 mA per channel.
• Continuos current through GND or VCC should not exceed ±100 mA.
3. Frequency Selection Criterion:
• Maximum frequency tested is 500 MHz.
• Added trace resistance/capacitance can reduce maximum frequency capability; use layout practices as
directed in Section 11.
9.2.2 Detailed Design Procedure
The 0.1 µF capacitor should be placed as close as possible to the device.
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9.2.3 Application Curve
12
VCC = 3.3 V
TA = 25°C
A and B Ports Open
10
I CC – mA
8
6
4
One OE Switching
2
0
0
2
4
6
8
10
12
14
16
18
20
OE Switching Frequency − MHz
Figure 9-2. Typical ICC vs OE Switching Frequency
10 Power Supply Recommendations
The power supply can be any voltage between the minimum and maximum supply voltage rating listed in
Section 6.1 table.
Each VCC terminal should have a good bypass capacitor to prevent power disturbance. For devices with a
single supply, a 0.1 μF bypass capacitor is recommended. If multiple pins are labeled VCC, then a 0.01 μF or
0.022 μF capacitor is recommended for each VCC because the VCC pins are tied together internally. For devices
with dual-supply pins operating at different voltages, for example VCC and VDD, a 0.1 µF bypass capacitor is
recommended for each supply pin. To reject different frequencies of noise, use multiple bypass capacitors in
parallel. Capacitors with values of 0.1 μF and 1 μF are commonly used in parallel. The bypass capacitor should
be installed as close to the power terminal as possible for best results.
11 Layout
11.1 Layout Guidelines
Reflections and matching are closely related to the loop antenna theory but are different enough to be discussed
separately from the theory. When a PCB trace turns a corner at a 90° angle, a reflection can occur. A reflection
occurs primarily because of the change of width of the trace. At the apex of the turn, the trace width increases
to 1.414 times the width. This increase upsets the transmission-line characteristics, especially the distributed
capacitance and self–inductance of the trace which results in the reflection. Not all PCB traces can be straight
and therefore some traces must turn corners. Figure 11-1 shows progressively better techniques of rounding
corners. Only the last example (BEST) maintains constant trace width and minimizes reflections.
11.2 Layout Example
BETTER
BEST
2W
WORST
1W min.
W
Figure 11-1. Trace Example
10
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12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation see the following:
• Texas Instruments, CBT-C, CB3T, and CB3Q Signal-Switch Families application report
• Texas Instruments, Implications of Slow or Floating CMOS Inputs application report
• Texas Instruments, Selecting the Right Texas Instruments Signal Switch application report
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
12.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
12.4 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
12.6 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
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15-Jun-2021
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
74CB3Q3305DCURG4
ACTIVE
VSSOP
DCU
8
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
GARR
SN74CB3Q3305DCUR
ACTIVE
VSSOP
DCU
8
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
(GARQ, GARR)
SN74CB3Q3305PW
ACTIVE
TSSOP
PW
8
150
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
BU305
SN74CB3Q3305PWG4
ACTIVE
TSSOP
PW
8
150
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
BU305
SN74CB3Q3305PWR
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU | SN
Level-1-260C-UNLIM
-40 to 85
BU305
SN74CB3Q3305PWRE4
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
BU305
SN74CB3Q3305PWRG4
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
BU305
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of