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TP3076N-G/NOPB

TP3076N-G/NOPB

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    DIP20_300MIL

  • 描述:

    ICCODECFILTERPCM20DIP

  • 数据手册
  • 价格&库存
TP3076N-G/NOPB 数据手册
OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 TP3076 COMBO® II Programmable PCM CODEC/Filter for ISDN and Digital Phone Applications Check for Samples: TP3076 FEATURES DESCRIPTION • Complete CODEC and Filter System Including: – Transmit and Receive PCM Channel Filters – μ-law or A-law Companding Coder and Decoder – Receive Power Amplifier Drives 300Ω – 4.096 MHz Serial PCM Data (max) • Programmable Functions: – Transmit Gain: 25.4 dB Range, 0.1 dB Steps – Receive Gain: 25.4 dB Range, 0.1 dB Steps – Time-slot Assignment; to 64 Slots/frame – 4 Interface Latches – A or μ-law – Analog Loopback – Digital Loopback • Direct Interface to Solid-state SLICs • Standard Serial Control Interface • 80 mW Operating Power (typ) • 1.5 mW Standby Power (typ) • Designed for CCITT and LSSGR Specifications • TTL and CMOS Compatible Digital Interfaces The TP3076 is a second-generation combined PCM CODEC and Filter devices optimized for digital switching applications on subscriber line and trunk cards and digital phone applications. Using advanced switched capacitor techniques, COMBO II combines transmit bandpass and receive lowpass channel filters with a companding PCM encoder and decoder. The devices are A-law and μ-law selectable and employ a conventional serial PCM interface capable of being clocked up to 4.096 MHz. A number of programmable functions may be controlled via a serial control port. 1 234 Channel gains are programmable over a 25.4 dB range in each direction. To enable COMBO II to interface to the SLIC control leads, a number of programmable latches are included; each may be configured as either an input or an output. The TP3076 provides 4 latches. NOTE See also AN-614 COMBO II application guide. 1 2 3 4 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. COMBO, TRI-STATE are registered trademarks of Texas Instruments. MICROWIRE/PLUS, COMBO II are trademarks of dcl_owner. All other trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 1994–2013, Texas Instruments Incorporated OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com Block Diagram Connection Diagram Figure 1. See Package PDIP (NFH) PIN DESCRIPTIONS Pin Description VCC +5V ±5% power supply. VBB −5V ±5% power supply. GND Ground. All analog and digital signals are referenced to this pin. FSX Transmit Frame Sync input. Normally a pulse or squarewave with an 8 kHz repetition rate is applied to this input to define the start of the transmit time slot assigned to this device (non-delayed data timing mode), or the start of the transmit frame (delayed data timing mode using the internal time-slot assignment counter). FSR Receive Frame Sync input. Normally a pulse or squarewave with an 8 kHz repetition rate is applied to this input to define the start of the receive time slot assigned to this device (non-delayed data timing mode), or the start of the receive frame (delayed data timing mode using the internal time-slot assignment counter). BCLK Bit clock input used to shift PCM data into and out of the DR and DX pins. BCLK may vary from 64 kHz to 4.096 MHz in 8 kHz increments, and must be synchronous with MCLK. MCLK Master clock input used by the switched capacitor filters and the encoder and decoder sequencing logic. Must be 512 kHz, 1.536/1.544 MHz, 2.048 MHz or 4.096 MHz and synchronous with BCLK. 2 Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 PIN DESCRIPTIONS (continued) Pin Description VFXI The Transmit analog high-impedance input. Voice frequency signals present on this input are encoded as an A-law or μ-law PCM bit stream and shifted out on the selected DX pin. VFRO The Receive analog power amplifier output, capable of driving load impedances as low as 300Ω (depending on the peak overload level required). PCM data received on the assigned DR pin is decoded and appears at this output as voice frequency signals. DX1 This transmit data TRI-STATE® output remains in the high impedance state except during the assigned transmit time slot on the assigned port, during which the transmit PCM data byte is shifted out on the rising edges of BCLK. TSX1 Normally this open drain output is floating in a high impedance state except when a time-slot is active on the DX output, when the TSX1 output pulls low to enable a backplane line-driver. DR1 This receive data input is inactive except during the assigned receive time slot of the assigned port when the receive PCM data is shifted in on the falling edges of BCLK. CCLK Control Clock input. This clock shifts serial control information into CI or out from CO when the CS input is low, depending on the current instruction. CCLK may be asynchronous with the other system clocks. CI Control Data Input pin. Serial control information is shifted into COMBO II on this pin when CS is low. Byte 1 of control information is always written into COMBO II, while the direction of byte 2 data is determined by bit 2 of byte 1, as defined in Table 1 CO Control Data Output pin. Serial control or status information is shifted out of COMBO II on this pin when CS is low. CS Chip Select input. When this pin is low, control information can be written to or read from COMBO II via CI or CO. IL3–IL0 Each Interface Latch I/O pin may be individually programmed as an input or an output determined by the state of the corresponding bit in the Latch Direction Register (LDR). For pins configured as inputs, the logic state sensed on each input is latched into the Interface Latch Register (ILR) whenever control data is written to COMBO II, while CS is low, and the information is shifted out on the CO pin. When configured as outputs, control data written into the ILR appears at the corresponding IL pins. These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 3 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com Absolute Maximum Ratings (1) (2) VCC to GND 7V VCC +0.5V to VBB −0.5V Voltage at VFXI VCC +0.5V to GND −0.5V Voltage at Any Digital Input −65°C to +150°C Storage Temperature Range −7V VBB to GND Current at VFR0 ±100 mA Current at Any Digital Output ±50 mA Lead Temperature (Soldering, 10 sec.) (1) (2) 300°C “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and specifications. Electrical Characteristics Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%, VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. Symbol Parameter Conditions Min Typ Max Units 0.7 V DIGITAL INTERFACES VIL Input Low Voltage (1) All Digital Inputs (DC Meas.) VIH Input High Voltage (1) All Digital Inputs (DC Meas.) (2) VOL Output Low Voltage DX1, TSX1, and CO, IL = 3.2 mA, All Other Digital Outputs, IL = 1 mA VOH Output High Voltage DX1 and CO, IL = −3.2 mA, All Other Digital Outputs (except TSX), IL = −1 mA All Digital Outputs, IL = −100 μA IIL Input Low Current Any Digital Input, GND < VIN < VIL −10 10 μA IIH Input High Current Any Digital Input, except MR, VIH < VIN < VCC −10 10 μA MR Only −10 100 IOZ Output Current in −10 10 1.0 2.0 V 0.4 2.4 V V VCC − 0.5 V DX1, TSX1 and CO High Impedance IL3–IL0 when Selected as Inputs ® State ( TRI-STATE ) μA GND < VOUT < VCC ANALOG INTERFACES IVFXI Input Current, VFXI −3.3V < VFXI < 3.3V −1.0 RVFXI Input Resistance −3.3V < VFXI < 3.3V 1.0 VOSX Input Offset Voltage Transmit Gain = 0 dB 200 mV Applied at VFXI Transmit Gain = 25.40 dB 10 mV Load Resistance Receive Gain = 0 dB 15k Receive Gain = −0.5 dB 600 Receive Gain = −1.2 dB 300 RLVFRO Ω RLVFRO ≥ 300Ω CLVFRO Load Capacitance ROVFRO Output Resistance Steady Zero PCM Code Applied to DR1 VOSR Output Offset Voltage Alternating ± Zero PCM Code Applied at VFRO DR1, Maximum Receive Gain μA MΩ 200 pF CLVFRO from VFRO to GND (1) (2) 4 1.0 −200 3.0 Ω 200 mV A signal is Valid if it is above VIHor below VIL and Invalid if it is between VIL and VIH. For the purposes of this specification the following conditions apply: a) All input signals are defined as: VIL = 0.4V, VIH = 2.7V, tR < 10 ns, tF < 10 ns. b) tR is measured from VIL to VIH. tF is measured from VIH to VIL. c) Delay Times are measured from the input signal Valid to the output signal Valid. d) Setup Times are measured from the data input Valid to the clock input Invalid. e) Hold Times are measured from the clock signal Valid to the data input Invalid. f) Pulse widths are measured from VIL to VIL or from VIH to VIH. See definitions and timing conventions section. Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 Electrical Characteristics (continued) Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%, VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. Symbol Parameter Conditions Min Typ Max Units 0.1 0.6 mA −0.1 −0.3 mA 8.0 11.0 mA POWER DISSIPATION ICC0 Power Down Current CCLK, CI, CO = 0.4V, CS = 2.4V Interface Latches Set as Outputs with No Load, All Other Inputs Active, Power Amp Disabled IBB0 Power Down Current As Above ICC1 Power Up Current CCLK, CI, CO = 0.4V, CS = 2.4V No Load on Power Amp Interface Latches Set as Outputs with No Load IBB1 Power Up Current As Above −8.0 −11.0 mA ICC2 Power Down Current As Above, Power Amp Enabled 2.0 3.0 mA IBB2 Power Down Current As Above, Power Amp Enabled −2.0 −3.0 mA Timing Specifications Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%; VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. All timing parameters are measured at VOH = 2.0V and VOL = 0.7V. See Definitions and Timing Conventions section for test methods information. Symbol Parameter Conditions Min Typ Max Units MASTER CLOCK TIMING fMCLK tWMH Frequency of MCLK Selection of Frequency is Programmable (See Table 5) Measured from VIH to VIH (1) Period of MCLK High 512 kHz 1536 kHz 1544 kHz 2048 kHz 4096 kHz 80 (1) ns tWML Period of MCLK Low Measured from VIL to VIL tRM Rise Time of MCLK Measured from VIL to VIH 80 30 ns ns tFM Fall Time of MCLK Measured from VIH to VIL 30 ns tHBM HOLD Time, BCLK LOW to MCLK HIGH tWFL Period of FSX or FSR Low 50 ns Measured from VIL to VIL 1 MCLK Period PCM INTERFACE TIMING fBCLK Frequency of BCLK May Vary from 64 kHz to 4096 kHz in 8 kHz Increments 64 tWBH Period of BCLK High Measured from VIH to VIH 80 ns tWBL Period of BCLK Low Measured from VIL to VIL 80 ns tRB Rise Time of BCLK Measured from VIL to VIH 30 ns tFB Fall Time of BCLK Measured from VIH to VIL 30 ns tHBF Hold Time, BCLK Low to FSX/R High or Low 30 ns tSFB Setup Time, FSX/R High to BCLK Low 30 ns tDBD Delay Time, BCLK High to Data Valid (1) Load = 100 pF Plus 2 LSTTL Loads 4096 80 kHz ns Applies only to MCLK Frequencies ≥ 1.536 MHz. At 512 kHz a 50:50 ±2% Duty Cycle must be used. Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 5 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com Timing Specifications (continued) Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%; VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. All timing parameters are measured at VOH = 2.0V and VOL = 0.7V. See Definitions and Timing Conventions section for test methods information. Symbol tDBZ Parameter Conditions Delay Time, BCLK Low to DX1 DX1 disabled is measured Disabled if FSX Low, FSX Low to at VOL or VOH according DX1 disabled if 8th BCLK to Figure 4 Min 15 Typ Max Units 80 ns 60 ns 60 ns 80 ns Low, or BCLK High to DX1 Disabled if FSX High tDBT Delay Time, BCLK High to Load = 100 pF Plus 2 LSTTL Loads TSX Low if FSX High, or FSX High to TSX Low if BCLK High (Nondelayed mode); BCLK High to TSX Low (delayed data mode) tZBT TRI-STATE Time, BCLK Low to TSX High if FSX Low, FSX Low to TSX High if 8th BCLK Low, or 15 BCLK High to TSX High if FSX High tDFD Delay Time, FSX/R Load = 100 pF Plus 2 LSTTL Loads, High to Data Valid Applies if FSX/R Rises Later Than BCLK Rising Edge in Non-Delayed Data Mode Only tSDB Setup Time, DR1 Valid to BCLK Low 30 ns tHBD Hold Time, BCLK 15 ns Low to DR1 Invalid SERIAL CONTROL PORT TIMING fCCLK Frequency of CCLK tWCH Period of CCLK High Measured from VIH to VIH 160 2048 kHz ns tWCL Period of CCLK Low Measured from VIL to VIH 160 ns tRC Rise Time of CCLK Measured from VIL to VIH 50 ns tFC Fall Time of CCLK Measured of VIH to VIL 50 ns tHCS Hold Time, CCLK Low CCLK1 10 ns CCLK8 100 ns 60 ns 60 ns 50 ns 50 ns to CS Low tHSC Hold Time, CCLK Low to CS High tSSC Setup Time, CS Transition to CCLK Low tSSC0 tSDC Setup Time, CS To Insure CO is Not Enabled Transition to CCLK High for Single Byte Setup Time, CI Data In to CCLK Low tHCD Hold Time, CCLK Low to CO Invalid tDCD Delay Time, CCLK High Load = 100 pF Plus 2 LSTTL Loads 80 ns to CO Data Out Valid 6 Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 Timing Specifications (continued) Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%; VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. All timing parameters are measured at VOH = 2.0V and VOL = 0.7V. See Definitions and Timing Conventions section for test methods information. Symbol tDSD tDDZ Parameter Conditions Delay Time, CS Low Applies Only if Separate to CO Valid CS Used for Byte 2 Delay Time, CS or 9th CCLK Applies to Earlier of CS High to CO High Impedance High or 9th CCLK High Min 15 Typ Max Units 80 ns 80 ns INTERFACE LATCH TIMING tSLC Setup Time, IL to Interface Latch Inputs Only 100 ns 50 ns CCLK 8 of Byte 1 tHCL Hold Tme, IL Valid from 8th CCLK Low (Byte 1) tDCL Delay Time CCLK8 of Interface Latch Outputs Only Byte 2 to IL CL = 50 pF 200 ns Timing Diagrams Figure 2. Non-Delayed Data Timing Mode Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 7 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com Figure 3. Delayed Data Timing Mode Figure 4. Control Port Timing Transmission Characteristics Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%, VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. f = 1015.625 Hz, VFXI = 0 dBm0, DR1 = 0 dBm0 PCM code. Transmit and receive gains programmed for maximum 0 dBm0 test levels (0 dB Gain). All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. Symbol Parameter Conditions Min Typ Max Units AMPLITUDE RESPONSE Absolute Levels The Maximum 0 dBm0 Levels Are: VFXI 1.375 Vrms VFRO (15 kΩ Load) 1.964 Vrms VFXI 73.8 mVrms VFRO (Any Load ≥ 300Ω) 105.0 mVrms The Minimum 0 dBm0 Levels are: GXA Transmit Gain Absolute Accuracy Transmit Gain Programmed for Maximum 0 dBm0 Test Level. Measure Deviation of Digital Code from Ideal 0 dBm0 PCM Code at DX1. TA = 25°C 8 Submit Documentation Feedback −0.15 0.15 dB Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 Transmission Characteristics (continued) Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%, VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. f = 1015.625 Hz, VFXI = 0 dBm0, DR1 = 0 dBm0 PCM code. Transmit and receive gains programmed for maximum 0 dBm0 test levels (0 dB Gain). All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. Symbol GXAG Parameter Conditions Transmit Gain TA = 25°C, VCC = 5V, VBB = 5V Variation with Programmed Gain from 0 dB to 19 dB Programmed Gain (0 dBm0 Levels of 1.619 Vrms to 0.182 Vrms) Min Typ Max Units −0.1 0.1 dB −0.3 0.3 dB −26 dB Programmed Gain from 19.1 dB to 25.4 dB (0 dBm0 Levels of 0.180 Vrms to 0.087 Vrms) NOTE: ±0.1 dB Min/Max is Available as a Selected Part GXAF Transmit Gain Variation with Relative to 1015.625 Hz (1) Minimum Gain < GX < Maximum Gain Frequency f = 60 Hz f = 200 Hz −1.8 −0.1 dB f = 300 Hz to 3000 Hz −0.15 0.15 dB f = 3400 Hz −0.7 0.0 dB f = 400 Hz −14 dB f ≥ 4600 Hz. Measure Response −32 dB at Alias Frequency from 0 kHz to 4 kHz GX = 0.0 dB, VFXI = 1.375 Vrms Relative to 1015.625 Hz −24.9 dB f = 203.125 Hz −1.7 −0.1 dB f = 343.75 Hz −0.15 0.15 dB f = 515.625 Hz −0.15 0.15 dB f = 2140.625 Hz −0.15 0.15 dB f = 3156.25 Hz −0.15 0.15 dB f = 3406.250 Hz −0.74 0.0 dB −13.5 dB f = 5250 Hz, Measure 2750 Hz −32 dB f = 11750 Hz, Measure 3750 Hz −32 dB f = 49750 Hz, Measure 1750 Hz −32 dB −0.1 0.1 dB VFXI = −40 dBm0 to +3 dBm0 −0.2 0.2 dB VFXI = −50 dBm0 to −40 dBm0 −0.4 0.4 dB VFXI = −55 dBm0 to −50 dBm0 −1.2 1.2 dB −0.15 0.15 dB f = 62.5 Hz f = 3984.375 Hz Relative to 1062.5 Hz GXAT Transmit Gain Variation with Temperature (1) Measured Relative to GXA, VCC = 5V, VBB = −5V, Minimum gain < GX < Maximum Gain GXAL GRA Transmit Gain Variation with Signal Level Receive Gain Absolute Accuracy Sinusoidal Test Method. Reference Level = 0 dBm0 Receive Gain Programmed for Maximum 0 dBm0 Test Level. Apply 0 dBm0 PCM Code to DR1. Measure VFR0. TA = 25°C (1) A multi-tone test technique is used. Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 9 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com Transmission Characteristics (continued) Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%, VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. f = 1015.625 Hz, VFXI = 0 dBm0, DR1 = 0 dBm0 PCM code. Transmit and receive gains programmed for maximum 0 dBm0 test levels (0 dB Gain). All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. Symbol GRAG Parameter Receive Gain Variation with Programmed Gain Conditions Min Typ Max Units −0.1 0.1 dB −0.3 0.3 dB −0.1 0.1 dB f = 200 Hz −0.25 0.15 dB f = 300 Hz to 3000 Hz −0.15 0.15 dB f = 3400 Hz −0.7 0.0 dB −14 dB TA = 25°C, VCC = 5V, VBB = −5V Programmed Gain from 0 dB to 19 dB (0 dBm0 Levels of 1.964 Vrms to 0.220 Vrms) Programmed Gain from 19.1 dB to 25.4 dB (0 dBm0 Levels of 0.218 Vrms to 0.105 Vrms) NOTE: ±0.1 dB Min/Max is Available as a Selected Part GRAT Receive Gain Variation with Temperature Measured Relative to GRA. VCC = 5V, VBB = −5V. Minimum Gain < GR < Maximum Gain GRAF Receive Gain Variation with Frequency Relative to 1015.625 Hz (2) DR1 = 0 dBm0 Code. Minimum Gain < GR < Maximum Gain f = 4000 Hz GR = 0 dB, DR1 = 0 dBm0 Code, GX = 0 dB (2) f = 296.875 Hz −0.15 0.15 dB f = 1875.00 Hz −0.15 0.15 dB f = 2906.25 Hz −0.15 0.15 dB f = 2984.375 Hz −0.15 0.15 dB f = 3406.250 Hz −0.74 f = 3984.375 Hz GRAL 0.0 dB −13.5 dB Receive Gain Variation with Signal Sinusoidal Test Method. Level Reference Level = 0 dBm0. DR1 = −40 dBm0 to +3 dBm0 −0.2 0.2 dB DR1 = −50 dBm0 to −40 dBm0 −0.4 0.4 dB DR1 = −55 dBm0 to −50 dBm0 −1.2 1.2 dB RL = 600Ω, GR = −0.5 dB −0.2 0.2 dB RL = 300Ω, GR = 1.2 dB −0.2 0.2 dB DR1 = 3.1 dBm0 −0.5 ENVELOPE DELAY DISTORTION WITH FREQUENCY DXA Tx Delay, Absolute f = 1600 Hz 315 μs DXR Tx Delay, Relative to DXA f = 500 Hz–600 Hz 220 μs f = 600 Hz–800 Hz 145 μs f = 800 Hz–1000 Hz 75 μs f = 1000 Hz–1600 Hz 40 μs f = 1600 Hz–2600 Hz 75 μs f = 2600 Hz–2800 Hz 105 μs f = 2800 Hz–3000 Hz 155 μs (2) 10 A multi-tone test technique is used. Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 Transmission Characteristics (continued) Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%, VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. f = 1015.625 Hz, VFXI = 0 dBm0, DR1 = 0 dBm0 PCM code. Transmit and receive gains programmed for maximum 0 dBm0 test levels (0 dB Gain). All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. Symbol Parameter Conditions Min DRA Rx Delay, Absolute f = 1600 Hz DRR Rx Delay, Relative to DRA f = 500 Hz–1000 Hz −40 f = 1000 Hz–1600 Hz −30 Typ Max Units 200 μs μs μs f = 1600 Hz–2600 Hz 90 μs f = 2600 Hz–2800 Hz 125 μs f = 2800 Hz–3000 Hz 175 μs 12 15 dBrnC0 −74 −67 dBm0p NOISE NXC NXP NRC Transmit Noise, C Message See (3). 11111111 Weighted, μ-Law Selected in Gain Register Transmit Noise, P Message See (3). 11111111 Weighted, A-Law Selected in Gain Register Receive Noise, C Message PCM Code is Alternating Positive 8 11 dBrnC0 PCM Code Equals Positive Zero −82 −79 dBm0p −53 dBm0 Weighted, μ-Law Selected NRP Receive Noise, P Message Weighted, A-Law Selected NRS Noise, Single Frequency f = 0 kHz to 100 kHz, Loop Around Measurement, VFXI = 0 Vrms PPSRX Positive Power Supply VCC = 5.0 VDC + 100 mVrms Rejection, Transmit f = 0 kHz–4 kHz (4) 36 dBC 30 dBC 36 dBC 30 dBC f = 0 Hz–4000 Hz 36 dBC f = 4 kHz–25 kHz 40 dB f = 25 kHz–50 kHz 36 dB f = 0 Hz–4000 Hz 36 dBC f = 4 kHz–25 kHz 40 dB f = 25 kHz–50 kHz 36 dB f = 4 kHz–50 kHz NPSRX Negative Power Supply VBB = −5.0 VDC +100 mVrms Rejection, Transmit f = 0 kHz–4 kHz (4) f = 4 kHz–50 kHz PPSRR Positive Power Supply Rejection, Receive PCM Code Equals Positive Zero VCC = 5.0 VDC + 100 mVrms Measure VFRO NPSRR Negative Power Supply Rejection, Receive PCM Code Equals Positive Zero VBB = −5.0 VDC + 100 mVrms Measure VFRO SOS Spurous Out-of-Band Signals Applied at the Channel Output 0 dBm0 300 Hz to 3400 Hz Input PCM Code at DR1 4600 Hz–7600 Hz −30 dB 7600 Hz–8400 Hz −40 dB 8400 Hz–50,000 Hz −30 dB DISTORTION (3) (4) Measured by grounded input at VFXI. PPSRX, NPSRX, and CTR-X are measured with a −50 dBm0 activation signal applied to VFXI. Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 11 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com Transmission Characteristics (continued) Unless otherwise noted, limits printed in BOLD characters are ensured for VCC = +5V ±5%, VBB = −5V ±5%; TA = 0°C to +70°C by correlation with 100% electrical testing at TA = 25°C. f = 1015.625 Hz, VFXI = 0 dBm0, DR1 = 0 dBm0 PCM code. Transmit and receive gains programmed for maximum 0 dBm0 test levels (0 dB Gain). All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at VCC = +5V, VBB = −5V, TA = 25°C. Symbol Parameter Conditions STDX Signal to Total Distortion STDR Transmit or Receive Half-Channel, Level = 3.0 dBm0 μ-Law Selected = 0 dBm0 to −30 dBm0 STDRL Single to Total Distortion Receive with Resistive Load Min Typ Max Units Sinusoidal Test Method 33 dBC 36 dBC = −40 dBm0 30 dBC = −45 dBm0 25 dBC RL = 600Ω, GR = −0.5 dB 33 dBC RL = 300Ω, GR = −1.2 dB 33 Sinusoidal Test Method Level = +3.1 dBm0 dBC SFDX Single Frequency Distortion, Transmit −46 dB SFDR Single Frequency Distortion, Receive −46 dB IMD Intermodulation Distortion −41 dB −90 −75 dB −90 −70 dB Transmit or Receive Two Frequencies in the Range 300 Hz–3400 Hz CROSSTALK CTX-R CTR-X 12 Transmit to Receive Crosstalk, 0 dBm0 Transmit Level f = 300 Hz–3400 Hz Receive to Transmit Crosstalk, 0 dBm0 Receive Level f = 300 Hz–3400 Hz (4) DR = Idle Code Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 FUNCTIONAL DESCRIPTION POWER-ON INITIALIZATION When power is first applied, power-on reset circuitry initializes the COMBO II and puts it into the power-down state. The gain control registers for the transmit and receive gain sections are programmed for no output, the power amp is disabled and the device is in the non-delayed timing mode. The Latch Direction Register (LDR) is pre-set with all IL pins programmed as inputs, placing the SLIC interface pins in a high impedance state. The CO pin is in TRI-STATE condition. Other initial states in the Control Register are indicated in CONTROL REGISTER INSTRUCTION. The desired modes for all programmable functions may be initialized via the control port prior to a Power-up command. POWER-DOWN STATE Following a period of activity in the powered-up state the power-down state may be re-entered by writing any of the control instructions into the serial control port with the “P” bit set to “1” as indicated in Table 1. It is recommended that the chip be powered down before writing any additional instructions. In the power-down state, all non-essential circuitry is de-activated and the DX1 output is in the high impedance TRI-STATE condition. The data stored in the Gain Control registers, the LDR and ILR, and all control bits remain unchanged in the power-down state unless changed by writing new data via the serial control port, which remains active. The outputs of the Interface Latches also remain active, maintaining the ability to monitor and control the SLIC. TRANSMIT FILTER AND ENCODER The Transmit section input, VFXI, is a high impedance input. No external components are necessary to set the gain. Following this is a programmable gain/attenuation amplifier which is controlled by the contents of the Transmit Gain Register (see PROGRAMMABLE FUNCTIONS section). An active pre-filter then precedes the 3rd order high-pass and 5th order low-pass switched capacitor filters. The A/D converter has a compressing characteristic according to the standard CCITT A or μ255 coding laws, which must be selected by a control instruction during initialization (see Table 1 and Table 2). A precision on-chip voltage reference ensures accurate and highly stable transmission levels. Any offset voltage arising in the gain-set amplifier, the filters or the comparator is canceled by an internal auto-zero circuit. Each encode cycle begins immediately following the assigned Transmit time-slot. The total signal delay referenced to the start of the time-slot is approximately 165 μs (due to the Transmit Filter) plus 125 μs (due to encoding delay), which totals 290 μs. Data is shifted out on DX1 during the selected time slot on eight rising edges of BCLK. DECODER AND RECEIVER FILTER PCM data is shifted into the Decoder's Receive PCM Register via the DR1 pin during the selected time-slot on the 8 falling edges of BCLK. The Decoder consists of an expanding DAC with either A or μ255 law decoding characteristic, which is selected by the same control instruction used to select the Encode law during initialization. Following the Decoder is a 5th order low-pass switched capacitor filter with integral Sin x/x correction for the 8 kHz sample and hold. A programmable gain amplifier, which must be set by writing to the Receive Gain Register, is included, and finally a Power Amplifier capable of driving a 300Ω load to ±3.5V, a 600Ω load to ±3.8V or a 15 kΩ load to ±4.0V at peak overload. Table 1. Programmable Register Instructions Byte 1 (1) (2) (3) Function Byte 2 (1) 7 6 5 4 3 2 1 0 Single Byte Power-Up/Down P X X X X X 0 X None Write Control Register P 0 0 0 0 0 1 X See Table 2 Read-Back Control Register P 0 0 0 0 1 1 X See Table 2 Write to Interface Latch Register P 0 0 0 1 0 1 X See Table 4 (1) (2) (3) 7 6 5 4 3 2 1 0 Bit 7 of bytes 1 and 2 is always the first bit clocked into or out from the CI or CO pin. X = don't care. “P” is the power-up/down control bit, see POWER-UP/DOWN CONTROL section. (“0” = Power Up, “1” = Power Down) Other register address codes are invalid and should not be used. Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 13 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com Table 1. Programmable Register Instructions (continued) Byte 1 (1) (2) (3) Function Byte 2 (1) 7 6 5 4 3 2 1 0 7 6 5 4 3 Read Interface Latch Register P 0 0 0 1 1 1 X See Table 4 Write Latch Direction Register P 0 0 1 0 0 1 X See Table 3 Read Latch Direction Register P 0 0 1 0 1 1 X See Table 3 Write Receive Gain Register P 0 1 0 0 0 1 X See Table 8 Read Receive Gain Register P 0 1 0 0 1 1 X See Table 8 Write Transmit Gain Register P 0 1 0 1 0 1 X See Table 7 Read Transmit Gain Register P 0 1 0 1 1 1 X See Table 7 Write Receive Time-Slot/Port P 1 0 0 1 0 1 X See Table 6 Read-Back Receive Time-Slot/Port P 1 0 0 1 1 1 X See Table 6 Write Transmit Time-Slot/Port P 1 0 1 0 0 1 X See Table 6 Read-Back Transmit Time-Slot/Port P 1 0 1 0 1 1 X See Table 6 2 1 0 A decode cycle begins immediately after the assigned receive timeslot, and 10 μs later the Decoder DAC output is updated. The total signal delay is 10 μs plus 120 μs (filter delay) plus 62.5 μs (½ frame) which gives approximately 190 μs. PCM INTERFACE The FSX and FSR frame sync inputs determine the beginning of the 8-bit transmit and receive time-slots respectively. They may have any duration from a single cycle of BCLK HIGH to one MCLK period LOW. Two different relationships may be established between the frame sync inputs and the actual time-slots on the PCM busses by setting bit 3 in the Control Register (see Table 2). Non-delayed data mode is similar to long-frame timing on the TP3050/60 series of devices (COMBO); time-slots begin nominally coincident with the rising edge of the appropriate FS input. The alternative is to use Delayed Data mode, which is similar to shortframe sync timing on COMBO, in which each FS input must be high at least a half-cycle of BCLK earlier than the timeslot. The Time-Slot Assignment circuit on the device can only be used with Delayed Data timing. When using Time-Slot Assignment, the beginning of the first time-slot in a frame is identified by the appropriate FS input. The actual transmit and receive time-slots are then determined by the internal Time-Slot Assignment counters. Transmit and Receive frames and time-slots may be skewed from each other by any number of BCLK cycles. During each assigned Transmit time-slot, the DX1 output shifts data out from the PCM register on the rising edges of BCLK. TSX1 also pulls low for the first 7½ bit times of the time-slot to control the TRI-STATE Enable of a backplane line-driver. Serial PCM data is shifted into the DR1 input during each assigned Receive time-slot on the falling edges of BCLK. SERIAL CONTROL PORT Control information and data are written into or read-back from COMBO II via the serial control port consisting of the control clock CCLK, the serial data input, CI, and output, CO, and the Chip Select input, CS. All control instructions require 2 bytes, as listed Table 1, with the exception of a single byte power-up/down command. The Byte 1 bits are used as follows: bit 7 specifies power up or power down; bits 6, 5, 4 and 3 specify the register address, bit 2 specifies whether the instruction is read or write; bit 1 specifies a one or two byte instruction; and bit 0 is not used. To shift control data into COMBO II, CCLK must be pulsed high 8 times while CS is low. Data on the CI input is shifted into the serial input register on the falling edge of each CCLK pulse. After all data is shifted in, the contents of the input shift register are decoded, and may indicate that a 2nd byte of control data will follow. This second byte may either be defined by a second byte-wide CS pulse or may follow the first contiguously, i.e, it is not mandatory for CS to return high between the first and second control bytes. At the end of CCLK8 in the 2nd control byte the data is loaded into the appropriate programmable register. CS may remain low continuously when programming successive registers, if desired. However, CS must be set high when no data transfers are in progress. 14 Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 To readback Interface Latch data or status information from COMBO II, the first byte of the appropriate instruction is strobed while CS is low, as defined in Table 1. CS must be kept low, or be taken low again for a further 8 CCLK cycles, during which the data is shifted onto the CO pin on the rising edges of CCLK. When CS is high the CO pin is in the high-impedance TRI-STATE, enabling the CI and CO pins of many devices to be multiplexed together. If CS returns high during either byte 1 or byte 2 before all eight CCLK pulses of that byte occur, both the bit count and byte count are reset and register contents are not affected. This prevents loss of synchronization in the control interface as well as corruption of register data due to processor interrupt or other problem. When CS returns low again, the device will be ready to accept bit 1 of byte 1 of a new instruction. PROGRAMMABLE FUNCTIONS POWER-UP/DOWN CONTROL Following power-on initialization, power-up and power-down control may be accomplished by writing any of the control instructions listed in Table 1 into COMBO II with the “P” bit set to “0” for power-up or “1” for power-down. Normally it is recommended that all programmable functions be initially programmed while the device is powered down. Power state control can then be included with the last programming instruction or the separate single-byte instruction. Any of the programmable registers may also be modified while the device is powered-up or down by setting the “P” bit as indicated. When the power-up or down control is entered as a single byte instruction, bit one (1) must be reset to a 0. When a power-up command is given, all de-activated circuits are activated, but the TRI-STATE PCM output(s), DX1 will remain in the high impedance state until the second FSX pulse after power-up. CONTROL REGISTER INSTRUCTION The first byte of a READ or WRITE instruction to the Control Register is as shown in Table 1. The second byte has the following bit functions: Table 2. Control Register Byte 2 Functions Bit Number and Name (1) 7 6 5 4 3 2 1 0 F1 F0 MA IA DN DL AL PP Function 0 0 MCLK = 512 kHz 0 1 MCLK = 1.536 MHz or 1.544 MHz 1 0 MCLK = 2.048 MHz (1) 1 1 MCLK = 4.096 MHz 0 X Select μ255 Law (1) 1 0 A-Law, Including Even Bit Inversion 1 1 A-Law, No Even Bit Inversion 0 Delay Data Timing 1 Non-Delayed Data Timing (1) 0 0 Normal Operation (1) 1 X Digital Loopback 0 1 Analog Loopback 0 Power Amp Enabled in PDN 1 Power Amp Disabled in PDN (1) state at power-on initialization. Master Clock Frequency Selection A Master clock must be provided to COMBO II for operation of the filter and coding/decoding functions. The MCLK frequency must be either 512 kHz, 1.536 MHz, 1.544 MHz, 2.048 MHz, or 4.096 MHz and must be synchronous with BCLK. Bits F1 and F0 (see Table 2) must be set during initialization to select the correct internal divider. Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 15 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com Coding Law Selection Bits “MA” and “IA” in Table 2 permit the selection of μ255 coding or A-law coding, with or without even bit inversion. Analog Loopback Analog Loopback mode is entered by setting the “AL” and “DL” bits in the Control Register as shown in Table 2. In the analog loopback mode, the Transmit input VFXI is isolated from the input pin and internally connected to the VFRO output, forming a loop from the Receive PCM Register back to the Transmit PCM Register. The VFRO pin remains active, and the programmed settings of the Transmit and Receive gains remain unchanged, thus care must be taken to ensure that overload levels are not exceeded anywhere in the loop. Digital Loopback Digital Loopback mode is entered by setting the “AL” and “DL” bits in the Control Register as shown in Table 2. This mode provides another stage of path verification by enabling data written into the Receive PCM Register to be read back from that register in any Transmit time-slot at DX1. PCM decoding continues and analog output appears at VFR0. The output can be disabled by programming ‘No Output' in the Receive Gain Register (see Table 8). INTERFACE LATCH DIRECTIONS Immediately following power-on, all Interface Latches assume they are inputs, and therefore all IL pins are in a high impedance state. Each IL pin may be individually programmed as a logic input or output by writing the appropriate instruction to the LDR, see Table 1 and Table 3. For minimum power dissipation, unconnected latch pins should be programmed as outputs. For the TP3076, bits 2 and 3 should always be programmed as “1” (outputs). Bits L3–L0 must be set by writing the specific instruction to the LDR with the L bits in the second byte set as follows: Table 3. Byte 2 Functions of Latch Direction Register (1) Byte 2 Bit Number 7 6 5 4 3 2 1 0 L0 L1 L2 L3 1 1 X X Ln Bit (1) IL Direction 0 Input 1 Output X = Don't Care INTERFACE LATCH STATES Interface Latches configured as outputs assume the state determined by the appropriate data bit in the 2-byte instruction written to the Interface Latch Register (ILR) as shown in Table 1 and Table 4. Latches configured as inputs will sense the state applied by an external source, such as the Off-Hook detect output of a SLIC. All bits of the ILR, i.e. sensed inputs and the programmed state of outputs, can be read back in the 2nd byte of a READ from the ILR. It is recommended that during initialization, the state of IL pins to be configured as outputs should be programmed first followed immediately by the Latch Direction Register. Table 4. Interface Latch Data Bit Order Bit Number 16 7 6 5 4 3 2 1 0 D0 D1 D2 D3 D4 D5 X X Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 Table 5. Coding Law Conventions (1) μ255 Law MSB True A-Law with A-Law without Even Bit Inversion Even Bit Inversion LSB MSB LSB MSB LSB VIN = +Full Scale 10000000 10101010 111111111 VIN = 0V 11111111 11010101 100000000 11111111 01010101 000000000 00000000 00101010 011111111 VIN = −Full Scale (1) The MSB is always the first PCM bit shifted in or out of COMBO II. Table 6. Time-Slot and Port Assignment Instruction Bit Number and Name Function 7 6 5 4 3 2 1 0 EN PS (1) T5 (2) T4 T3 T2 T1 T0 0 1 X X X X X X Disable DX1 Output (Transmit Instruction) Disable DR1 Input (Receive Instruction) 1 (1) (2) 1 Assign One Binary Coded Time-Slot from 0–63 Enable DX1 Output (Transmit Instruction) Assign One Binary Coded Time-Slot from 0–63 Enable DR1 Input (Transmit Instruction) The “PS” bit MUST be set to “1” for both transmit and receive for the TP3076. T5 is the MSB of the time-slot assignment bit field. Time-slot bits should be set to “000000” for both transmit and receive when operating in non-delayed data timing mode. TIME-SLOT ASSIGNMENT COMBO II can operate in either fixed time-slot or time-slot assignment mode for selecting the Transmit and Receive PCM time-slots. Following power-on, the device is automatically in Non-Delayed Timing mode, in which the time-slot always begins with the leading (rising) edge of frame sync inputs FSX and FSR. Time-Slot Assignment may only be used with Delay Data timing; see Figure 3. FSX and FSR may have any phase relationship with each other in BCLK period increments. Alternatively, the internal time-slot assignment counters and comparators can be used to access any time-slot in a frame, using the frame sync inputs as marker pulses for the beginning of transmit and receive time-slot 0. In this mode, a frame may consist of up to 64 time-slots of 8 bits each. A time-slot is assigned by a 2-byte instruction as shown in Table 1 and Table 6. The last 6 bits of the second byte indicate the selected time-slot from 0–63 using straight binary notation. When writing a time-slot and port assignment register, if the PCM interface is currently active, it is immediately deactivated to prevent possible bus clashes. A new assignment becomes active on the second frame following the end of the Chip-Select for the second control byte. Rewriting of the register contents should not be performed during the talking period of a connection to prevent waveform distortion caused by loss of a sample which will occur with each register write. The “EN” bit allows the PCM input, DR1, or output, DX1, as appropriate, to be enabled or disabled. Time-Slot Assignment mode requires that the FSX and FSR pulses conform to the delayed data timing format shown in Figure 3. PORT SELECTION On the TP3076, the “PS” bit MUST always be set to 1. Table 6 shows the format for the second byte of both transmit and receive time-slot and port assignment instructions. TRANSMIT GAIN INSTRUCTION BYTE 2 The transmit gain can be programmed in 0.1 dB steps by writing to the Transmit Gain Register as defined in Table 1 and Table 7. This corresponds to a range of 0 dBm0 levels at VFXI between 1.375 Vrms and 0.074 Vrms (equivalent to +5.0 dBm to −20.4 dBm in 600Ω). To calculate the binary code for byte 2 of this instruction for any desired input 0 dBm0 level in Vrms, take the nearest integer to the decimal number given by: Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 17 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com 200 × log10 (V/0.07299) (1) and convert to the binary equivalent. Some examples are given in Table 7. A complete tabulation is given in Appendix I of AN-614. It should be noted that the Transmit (idle channel) Noise and Transmit Signal to Total Distortion are both specified with transmit gain set to 0 dB (gain register set to all ones). At high transmit gains there will be some degradation in noise performance for these parameters. See Application Note AN-614 for more information on this subject. Table 7. Byte 2 of Transmit Gain Instruction (1) Bit Number 0 dBm0 Test Level (Vrms) 76543210 at VFXI 00000000 No Output (1) 00000001 0.074 00000010 0.075 — — 11111110 1.359 11111111 1.375 Analog signal path is cut off, but DX remains active and will output codes representing idle noise. RECEIVE GAIN INSTRUCTION BYTE 2 The receive gain can be programmed in 0.1 dB steps by writing to the Receive Gain Register as defined in Table 1 and Table 8. Note the following restrictions on output drive capability: 1. 0 dBm0 levels ≤ 1.96 Vrms at VFRO may be driven into a load of ≥ 15 kΩ to GND; Receive Gain set to 0 dB (gain register set to all ones). 2. 0 dBm0 levels ≤ 1.85 Vrms at VFRO may be driven into a load of ≥ 600Ω to GND; Receive Gain set to 0.5 dB. 3. 0 dBm0 levels ≤ 1.71 Vrms at VFRO may be driven into a load of ≥ 300 Ω to GND. Receive Gain set to −1.2 dB. To calculate the binary code for byte 2 of this instruction for any desired output 0 dBm0 level in Vrms, take the nearest integer to the decimal number given by: 200 × log10 (V/0.1043) (2) and convert to the binary equivalent. Some examples are given in Table 8. A complete tabulation is given in Appendix I or AN-614. Table 8. Byte 2 of Receive Gain Instruction Bit Number 0 dBm0 Test Level (Vrms) 76543210 at VFRO 00000000 No Output (Low Z to GND) 00000001 0.105 00000010 0.107 — — 11111110 1.941 11111111 1.964 APPLICATIONS INFORMATION Figure 5 shows a typical ISDN phone application of the TP3076 together with a TP3420 ISDN Transceiver “S” Interface Device and HPC16400 High-Performance Microcontroller with HDLC Controller. The TP3076 device is programmed over its serial control interface via the HPC16400 MICROWIRE/PLUS™ serial I/O port. 18 Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 OBSOLETE TP3076 www.ti.com SNOSC47D – APRIL 1994 – REVISED APRIL 2013 POWER SUPPLIES While the pins of the TP3076 COMBO II device are well protected against electrical misuse, it is recommended that the standard CMOS practice of applying GND to the device before any other connections are made should always be followed. In applications where the printed circuit card may be plugged into a hot socket with power and clocks already present, an extra long ground pin on the connector should be used and a Schottky diode connected between VBB and GND. To minimize noise sources all ground connections to each device should meet at a common point as close as possible to the GND pin in order to prevent the interaction of ground return currents flowing through a common bus impedance. Power supply decoupling capacitors of 0.1 μF should be connected from this common point to VCC and VBB as close to the device pins as possible. Further guidelines on PCB layout techniques are provided in Application Note AN-614, “ COMBO II™ Programmable PCM CODEC/Filter Family Application Guide”. (1) Primo type EM80–PMI2 or similar. (2) Primo type DH31 or similar. (3) Sidetone ≃ −9.2 dB for 200Ω,Sidetone ≃ −21.5 dB for 1200Ω. Figure 5. Typical Application in an ISDN Phone Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 19 OBSOLETE TP3076 SNOSC47D – APRIL 1994 – REVISED APRIL 2013 www.ti.com REVISION HISTORY Changes from Revision C (April 2013) to Revision D • 20 Page Changed layout of National Data Sheet to TI format .......................................................................................................... 19 Submit Documentation Feedback Copyright © 1994–2013, Texas Instruments Incorporated Product Folder Links: TP3076 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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