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TS3L110DGVR

TS3L110DGVR

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    TVSOP16_3.6X4.4MM

  • 描述:

    IC ETHERNET SWITCH QUAD 16TVSOP

  • 数据手册
  • 价格&库存
TS3L110DGVR 数据手册
Product Folder Order Now Tools & Software Technical Documents Support & Community TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 TS3L110 Quad SPDT High-Bandwidth 10/100 Base-T LAN Switch Differential 8-Channel to 4-Channel Multiplexer/Demultiplexer 1 Features • • • 1 • • • • • • • • Wide bandwidth (BW = 500 MHz typical) Low crosstalk (XTALK = –30 dB typical) Bidirectional data flow with near-zero propagation delay Low and flat ON-state resistance (ron = 4 Ω typical, ron(flat) = 1 Ω) Switching on Data I/O Ports (0 to 5 V) VCC Operating range from 3 V to 3.6 V Ioff Supports partial power-down-mode operation Data and control inputs have undershoot clamp diodes Latch-up performance exceeds 100 mA Per JESD 78, class II ESD Performance tested per JESD 22 – 2000-V Human-body model (A114-B, class II) – 1000-V Charged-device model (C101) Suitable for both 10 Base-T and 100 Base-T signaling 2 Applications • To ensure the high-impedance state during power up or power down, E should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. Device Information(1) PART NUMBER TS3L110 PACKAGE 9.90 mm x 3.91 mm SSOP (DBQ) 16 4.90 mm x 3.90 mm TVSOP (DGV) 16 3.60 mm x 4.40 mm TSSOP (PW) 16 5.00 mm x 4.40 mm VQFN (RGV) 16 4.00 mm x 4.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Logic Diagram (Positive Logic) 2 4 IA0 YA 3 YB 7 IB0 6 3 Description The TS3L110 device can be used to replace mechanical relays in LAN applications. This device has low and flat ON-state resistance (ron), wide bandwidth, and low crosstalk, making it suitable for 10/100 Base-T and various other LAN applications. The TS3L110 device can be used to route signals from a 10/100 Base-T Ethernet transceiver to the RJ45 LAN connectors in laptops or in docking stations. This device is designed for low channel-to-channel skew and low crosstalk. YC 9 11 10 YD 12 14 13 S IA1 5 10 and 100 Base-T signal switching The TS3L110 local area network (LAN) switch is a 4bit 1-of-2 multiplexer/demultiplexer with a single switch-enable (E) input. When E is low, the switch is enabled, and the I port is connected to the Y port. When E is high, the switch is disabled, and the highimpedance state exists between the I and Y ports. The select (S) input controls the data path of the multiplexer/demultiplexer. BODY SIZE (NOM) SOIC (D) 16 IB1 IC0 IC1 ID0 ID1 1 15 Control Logic E This device is fully specified for partial-power-down applications using Ioff. The Ioff feature ensures that damaging current does not backflow through the device when it is powered down. The device has isolation during power off. 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 4 6.1 Absolute Maximum Ratings .................................... 6.2 ESD Ratings.............................................................. 6.3 Recommended Operating Conditions ..................... 6.4 Thermal Information .................................................. 6.5 Electrical Characteristics ......................................... 6.6 Switching Characteristics......................................... 6.7 Dynamic Characteristics .......................................... 6.8 Typical Characteristics .............................................. 4 4 4 5 5 6 6 7 Parameter Measurement Information .................. 8 Detailed Description ............................................ 13 8.1 Overview ................................................................. 13 8.2 Functional Block Diagram ....................................... 13 8.3 Feature Description................................................. 13 8.4 Device Functional Modes........................................ 13 9 Application and Implementation ........................ 14 9.1 Application Information............................................ 14 9.2 Typical Application ................................................. 14 10 Power Supply Recommendations ..................... 15 11 Layout................................................................... 16 11.1 Layout Guidelines ................................................. 16 11.2 Layout Example .................................................... 17 12 Device and Documentation Support ................. 18 12.1 12.2 12.3 12.4 12.5 Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 18 18 18 18 18 13 Mechanical, Packaging, and Orderable Information ........................................................... 18 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision A (May 2019) to Revision B • Change pin 10 to IC1, pin 11 to IC0, pin 13 to ID1, and pin 14 to ID0 in the Pin Configuration and Functions....................... 3 Changes from Original (September 2004) to Revision A • 2 Page Page Added Device Information table, ESD Ratings table, Thermal Information table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section. ..... 1 Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 TS3L110 www.ti.com SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 5 Pin Configuration and Functions D, DBQ, DGV, or PW Package SOIC, SSOP, TVSOP, TSSOP 16 Pins Top View S VCC RGY Package VQFN 16 Pins Top View VCC IA0 2 15 E IA1 3 14 ID0 YA 4 13 ID1 IB0 5 12 YD IB1 6 11 IC0 YB 7 10 IC1 GND 8 9 YC 16 IA0 2 15 E IA1 3 14 ID0 YA 4 13 ID1 Th ermal Pad 5 12 YD IB1 6 11 IC0 YB 7 10 IC1 8 IB0 GND No t to scale 9 16 YC 1 1 S No t to scale Pin Functions PIN NAME DESCRIPTION NO. S 1 Select input IA0 2 Data I/Os IA1 3 Data I/Os YA 4 Data I/Os IB0 5 Data I/Os IB1 6 Data I/Os YB 7 Data I/Os GND 8 Ground (0 V) reference YC 9 Data I/Os IC1 10 Data I/Os IC0 11 Data I/Os YD 12 Data I/Os ID1 13 Data I/Os ID0 14 Data I/Os E 15 Enable input VCC 16 Positive power supply. This pin is the most positive power-supply potential. For reliable operation, connect a decoupling capacitor ranging from 0.1 µF to 10 µF between VDD and GND. Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 3 TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 www.ti.com 6 Specifications Absolute Maximum Ratings (1) 6.1 over operating free-air temperature range (unless otherwise noted) MIN MAX –0.5 4.6 V VIN Control input voltage range (2) (3) –0.5 7 V VI/O Switch I/O voltage range (2) (3) (4) –0.5 7 IIK Control input clamp current VIN < 0 II/OK I/O port clamp current VI/O < 0 II/O ON-state switch current (5) Continuous current through VCC or GND ±100 mA VCC Supply voltage range D package Package thermal impedance θJA (1) (2) (3) (4) (5) (6) (7) V –50 mA –50 mA ±128 mA (6) 73 DBQ package (6) 90 DGV package (6) 120 PW package (6) 108 RGY package (7) Tstg UNIT °C/W 39 Storage temperature range –65 150 °C Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltages are with respect to ground, unless otherwise specified. The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed. VI and VO are used to denote specific conditions for VI/O. II and IO are used to denote specific conditions for II/O. The package thermal impedance is calculated in accordance with JESD 51-7. The package thermal impedance is calculated in accordance with JESD 51-5. 6.2 ESD Ratings VALUE Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 V(ESD) (1) (2) 6.3 Electrostatic discharge (1) Charged-device model (CDM), per JEDEC specification JESD22-C101 or ANSI/ESDA/JEDEC JS-002 (2) UNIT ±2000 V ±1000 JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. e. Recommended Operating Conditions (1) MIN MAX VCC Supply voltage 3 3.6 V VIH High-level control input voltage (E, S) 2 5.5 V VIL Low-level control input voltage (E, S) 0 0.8 V VI/O Input/output voltage 0 5.5 V TA Operating free-air temperature –40 85 °C (1) 4 UNIT All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 TS3L110 www.ti.com SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 6.4 Thermal Information TS3L110 THERMAL METRIC (1) D (SOIC) DBQ (SSOP) DGV (TVSOP) PW (TSSOP) RGV (VQFN) 16 PINS 16 PINS 16 PINS 16 PINS 16 PINS UNIT RθJA Junction-to-ambient thermal resistance 92.0 114.5 139.3 111.5 50.8 °C/W RθJC(top) Junction-to-case (top) thermal resistance 52.3 60.5 57.4 42.0 48.1 °C/W RθJB Junction-to-board thermal resistance 50.3 58.2 73.7 57.8 26.7 °C/W ψJT Junction-to-top characterization parameter 17.3 15.3 7.2 4.2 2.1 °C/W ψJB Junction-to-board characterization parameter 50.0 57.6 73.0 57.2 26.5 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance - - - - 10.7 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC package thermal metrics application report. Electrical Characteristics (1) 6.5 over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V (unless otherwise noted) PARAMETER TEST CONDITIONS VIK E, S VCC = 3.6 V, IIN = –18 mA IIH E, S VCC = 3.6 V, IIL E, S MIN TYP (2) MAX UNIT –1.8 V VIN = 5.5 V ±1 µA VCC = 3.6 V, VIN = GND ±1 µA Ioff VCC = 0, VO = 0 to 5.5 V, VI = 0 ICC VCC = 3.6 V, II/O = 0, Switch ON or OFF E, S f = 1 MHz, VIN = 0 I port VI = 0, f = 1 MHz, Outputs open, Y port VI = 0, I or Y port Cin Cio(OFF) Cio(ON) ron ron(flat) (3) Δron (4) (1) (2) (3) (4) 1 µA 0.7 1.5 mA 2.5 3.5 pF Switch OFF 3.5 5 f = 1 MHz, Outputs open, Switch OFF 5.5 7 VI = 0, f = 1 MHz, Outputs open, Switch ON 10.5 13 pF VCC = 3 V, 1.25 V ≤ VI ≤ VCC, IO = –10 mA to –30 mA 4 8 Ω VCC = 3 V, VI = 1.25 V and VCC, IO = –10 mA to –30 mA 1 VCC = 3 V, 1.25 V ≤ VI ≤ VCC, IO = –10 mA to –30 mA 0.9 pF Ω 2 Ω VI, VO, II, and IO refer to I/O pins. VIN refers to the control inputs. All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C. ron(flat) is the difference of ron in a given channel at specified voltages. Δron is the difference of ron in a given device. Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 5 TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 6.6 www.ti.com Switching Characteristics over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V, RL = 200 Ω, CL = 10 pF (unless otherwise noted) (see Figure 5 and Figure 6) FROM (INPUT) TO (OUTPUT) tpd (2) I or Y Y or I tPZH, tPZL E or S I or Y 0.5 7 ns tPHZ, tPLZ E or S I or Y 0.5 5 ns tsk(p) (3) I or Y Y or I 0.2 ns PARAMETER (1) (2) (3) MIN TYP (1) MAX 0.25 0.1 UNIT ns All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C. The propagation delay is the calculated RC time constant of the typical ON-state resistance of the switch and the specified load capacitance when driven by an ideal voltage source (zero output impedance). Skew between opposite transitions of the same output |tPHL – tPLH|. This parameter is not production tested. 6.7 Dynamic Characteristics over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V (unless otherwise noted) PARAMETER TYP (1) TEST CONDITIONS UNIT XTALK RL = 100 Ω, f = 250 MHz, See Figure 7 –26 OIRR RL = 100 Ω, f = 250 MHz, See Figure 8 –28 dB BW RL = 100 Ω, See Figure 6 500 MHz (1) 6 dB All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C. Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 TS3L110 www.ti.com SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 6.8 Typical Characteristics 0 20 0 120 Phase −10 −1 100 −4 −40 −5 −50 −6 −60 −20 80 −40 60 Gain −70 −7 10 100 40 −80 20 −100 700 1 10 Frequency (MHz) Phase at 250 MHz, 88.2 Deg Gain −28.5 dB at 250 MHz Phase at 627 MHz, −36 Deg Gain −3 dB at 627 MHz Figure 2. OFF Isolation vs Frequency −10 160 −20 140 −30 120 −40 100 Phase −50 80 −60 60 Gain −70 40 −80 20 −90 10 0 700 100 Output Voltage (V) 180 Phase (Deg) Gain (dB) Figure 1. Gain and Phase vs Frequency 0 1 0 700 100 Frequency (MHz) 5 20 4 16 VO 3 12 2 8 rON 1 ON-State Resistance (W) 1 −60 Phase (Deg) −3 −30 Phase (Deg) Gain (dB) Gain (dB) Phase −20 Gain −2 0 4 Frequency (MHz) Phase at 250 MHz, 137.92 Deg Gain −26 dB at 250 MHZ 0 0 0 1 2 3 4 5 Input Voltage (V) Figure 3. Crosstalk vs Frequency Figure 4. Output Voltage and ON-State Resistance vs Input Voltage Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 7 TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 www.ti.com 7 Parameter Measurement Information VCC Input Generator VIN 50 (W) 50 (W) VG1 TEST CIRCUIT DUT 2 x VCC Input Generator VO VI S1 RL Open GND 50 (W) 50 (W) VG2 CL (see Note A) TEST VCC S1 tPLZ/tPZL 3.3 V ± 0.3 V 2 x VCC tPHZ/tPZH 3.3 V ± 0.3 V GND Output Control (VIN) RL VI CL VD 200 (W) GND 10 pF 0.3 V 200 (W) VCC 10 pF 0.3 V RL 2.5 V 1.25 V Output Waveform 1 S1 at 2 VCC tPZL (see Note B) 0V tPLZ VOH VCC/2 tPZH Output Waveform 2 S1 at GND (see Note B) 1.25 V VOL + 0.3 V VOL tPHZ VCC/2 VOH − 0.3 V VOH VOL VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low. Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns. D. The outputs are measured one at a time, with one transition per measurement. E. tPLZ and tPHZ are the same as tdis. F. tPLZ and tPHH are the same as ten. Figure 5. Test Circuit and Voltage Waveforms 8 Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 TS3L110 www.ti.com SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 Parameter Measurement Information (continued) VCC Input Generator VIN 50 W 50 W VG1 TEST CIRCUIT DUT 2 x VCC Input Generator RL VO VI S1 Open GND 50 W 50 W VG2 CL (see Note A) RL TEST VCC S1 RL VIN (see Note B) CL tsk(p) 3.3 V ± 0.3 V GND 200 W VCC or GND 10 pF 3.5 V Data Input 2.5 V 1.5 V tPLH tPHL VOH (VOH + VOL)/2 VOL Data Output tsk(p) = tPHL − tPLH VOLTAGE WAVEFORMS PULSE SKEW [tsk(p)] A. CL includes probe and jig capacitance. B. Switch is ON during the measurement of tsk(p), that is, voltage at E = 0 and S = VCC or GND. Figure 6. Test Circuit and Voltage Waveforms Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 9 TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 www.ti.com Parameter Measurement Information (continued) EXT TRIGGER BIAS Network Analyzer (HP8753ES) VBIAS P1 P2 VCC YA IA0 CL = 10 pF (see Note A) RL = 100 W S DUT VS E VE A. CL includes probe and jig capacitance. Figure 7. Test Circuit for Frequency Response (BW) Frequency response is measured at the output of the ON channel. For example, when VS = 0, VE = 0, and YA is the input, the output is measured at IA0. All unused analog I/O ports are left open. HP8753ES Setup • Average = 4 • RBW = 3 kHz • VBIAS = 0.35 V • ST = 2 s • P1 = 0 dBM 10 Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 TS3L110 www.ti.com SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 Parameter Measurement Information (continued) EXT TRIGGER BIAS Network Analyzer (HP8753ES) VBIAS P1 P2 VCC YA IA0 S RL = 100 W CL = 10 pF (see Note A) RL = 100 W CL = 10 pF (see Note A) 50 W (see Note B) VS E DUT VE YB IB0 A. CL includes probe and jig capacitance. B. A 50-Ω termination resistor is needed to match the loading of the network analyzer Figure 8. Test Circuit for Crosstalk (XTALK) Crosstalk is measured at the output of the nonadjacent ON channel. For example, when VS = 0, VE = 0, and YA is the input, the output is measured at IB0. All unused analog input (Y) ports are connected to GND, and output (I) ports are connected to GND through 50-Ω pulldown resistors. HP8753ES Setup • Average = 4 • RBW = 3 kHz • VBIAS = 0.35 V • ST = 2 s • P1 = 0 dBM Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 11 TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 www.ti.com Parameter Measurement Information (continued) EXT TRIGGER BIAS Network Analyzer (HP8753ES) VBIAS P1 P2 VCC YA IA0 S RL = 100 W CL = 10 pF (see Note A) RL = 100 W CL = 10 pF (see Note A) DUT VS IA1 E VE A. CL includes probe and jig capacitance. B. A 50-Ω termination resistor is needed to match the loading of the network analyzer 50 W (see Note B) Figure 9. Test Circuit for OFF Isolation (OIRR) OFF isolation is measured at the output of the OFF channel. For example, when VS = VCC, VE = 0, and YA is the input, the output is measured at IA0. All unused analog input (Y) ports are left open, and output (I) ports are connected to GND through 50-Ω pulldown resistors. HP8753FS Setup • Average = 4 • RBW = 3 kHz • VBIAS = 0.35 V • ST = 2 s • P1 = 0 dBM 12 Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 TS3L110 www.ti.com SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 8 Detailed Description 8.1 Overview The TI TS3L110 LAN switch is a 4-bit 1-of-2 multiplexer/demultiplexer with a single switch-enable (E) input. When E is low, the switch is enabled, and the I port is connected to the Y port. When E is high, the switch is disabled, and the high-impedance state exists between the I and Y ports. The select (S) input controls the data path of the multiplexer/demultiplexer. 8.2 Functional Block Diagram 2 4 IA0 YA 3 YB 7 5 IB0 6 YC 9 11 10 YD 12 14 13 S IA1 IB1 IC0 IC1 ID0 ID1 1 Control Logic 15 E 8.3 Feature Description Ioff supports Partial-Power-Down Mode Operation. The TS3L110 device ensures the signal path is high impedance state when VCC = 0 V. 8.4 Device Functional Modes The TS3L110 supports a power down mode which reduces the current consumption of the device and places all the signal paths in a high impedance state. To place the TS3L100 in power down mode, set the E pin with a logic high voltage as seen in Table 1. Table 1. Function Table INPUTS S INPUT/OUTPUT YX FUNCTION L L IX0 YX = IX0 L H IX1 YX = IX1 H X Z Disconnect E Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 13 TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 www.ti.com 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information There are many Local Area Network (LAN) applications in which the ethernet hubs or controllers have a limited number of I/Os or need to route signals from a single ethernet PHY to multiple ethernet jacks. The TS3L110 solution can effectively expand the limited I/Os by switching between multiple Ethernet jacks to interface them to a single Ethernet PHY. 9.2 Typical Application VCC TS3L110 Processor 4 4 Ethernet PHY IX YX RJ45 Port 1 4 IX GPIO S GPIO E RJ45 Port 2 GND Figure 10. Typical Application Schematic 9.2.1 Design Requirements Ensure that all of the signals passing through the switch are within the recommended operating ranges. To ensure proper performance, see Recommended Operating Conditions. 9.2.2 Detailed Design Procedure The TS3L110 can be properly operated without any external components. TI recommends that the digital control pins S and E be pulled up to VCC or down to GND to avoid undesired switch positions that could result from the floating pin. Connect the exposed thermal pad to ground. 14 Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 TS3L110 www.ti.com SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 Typical Application (continued) 9.2.3 Application Curves 0 0 Phase −10 Gain Gain (dB) −2 −20 −3 −30 −4 −40 −5 −50 −6 −60 Phase (Deg) −1 −70 −7 1 10 100 700 Frequency (MHz) Phase at 627 MHz, −36 Deg Gain −3 dB at 627 MHz Figure 11. Gain and Phase vs Frequency 10 Power Supply Recommendations Power to the device is supplied through the VCC pins. TI recommends placing a bypass capacitor as close to the supply pin (VCC) as possible to help smooth out lower frequency noise to provide better load regulation across the frequency spectrum. Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 15 TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 www.ti.com 11 Layout 11.1 Layout Guidelines • • • • • • • • TI recommends keeping the high-speed signals as short as possible. Each via introduces discontinuities in the transmission line of the signal and increases the chance of picking up interference from the other layers of the board. Be careful when designing test points on twisted pair lines; through-hole pins are not recommended. When it becomes necessary to turn 90°, use two 45° turns or an arc instead of making a single 90° turn. This reduces reflections on the signal traces by minimizing impedance discontinuities. Do not route traces under or near crystals, oscillators, clock signal generators, switching regulators, mounting holes, magnetic devices or ICs that use or duplicate clock signals. Avoid stubs on the high-speed signals because they cause signal reflections. If a stub is unavoidable, then the stub must be less than 200 mm. Route all high-speed signal traces over continuous GND planes, with no interruptions. Avoid crossing over anti-etch, commonly found with plane splits. Due to high-frequency signals, a printed-circuit board with at least four layers is recommended; two signal layers separated by a ground and power layer as shown in Figure 12. The majority of signal traces must run on a single layer, preferably Signal 1. Immediately next to this layer should be the GND plane, which is solid with no cuts. Avoid running signal traces across a split in the ground or power plane. When running across split planes is unavoidable, sufficient decoupling must be used. Minimizing the number of signal vias reduces EMI by reducing inductance at high frequencies. Signal 1 GND Plane Power Plane Signal 2 Figure 12. Four-Layer Board Stackup 16 Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 TS3L110 www.ti.com SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 11.2 Layout Example VDD To To To System System System 0603 42 41 40 39 1 38 To System 2 37 To System 3 36 To System 4 35 To System 5 34 To System 6 33 To System 7 32 8 31 Exposed Center Pad (GND) 9 To System 10 To System 11 28 To System 12 27 To System 13 26 14 25 To System 15 24 To System 16 23 To System 17 22 19 20 To System To System To System To System To System To System To System 30 To System 18 To System 29 To System To System To System To System To System To System To System To System 21 To To To System System System Figure 13. Layout Example Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 17 TS3L110 SCDS176B – SEPTEMBER 2004 – REVISED OCTOBER 2019 www.ti.com 12 Device and Documentation Support 12.1 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 12.2 Community Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 12.3 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 12.4 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.5 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 18 Submit Documentation Feedback Copyright © 2004–2019, Texas Instruments Incorporated Product Folder Links: TS3L110 PACKAGE OPTION ADDENDUM www.ti.com 14-Oct-2022 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) Samples (4/5) (6) TS3L110D ACTIVE SOIC D 16 40 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TS3L110 Samples TS3L110DBQR ACTIVE SSOP DBQ 16 2500 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 TK110 Samples TS3L110DE4 ACTIVE SOIC D 16 40 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TS3L110 Samples TS3L110DG4 ACTIVE SOIC D 16 40 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TS3L110 Samples TS3L110DGVR ACTIVE TVSOP DGV 16 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TK110 Samples TS3L110DR ACTIVE SOIC D 16 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TS3L110 Samples TS3L110PW ACTIVE TSSOP PW 16 90 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TK110 Samples TS3L110PWR ACTIVE TSSOP PW 16 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TK110 Samples TS3L110PWRE4 ACTIVE TSSOP PW 16 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TK110 Samples TS3L110PWRG4 ACTIVE TSSOP PW 16 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 TK110 Samples TS3L110RGYR ACTIVE VQFN RGY 16 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 85 TK110 Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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