0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
74ACTQ541MTC

74ACTQ541MTC

  • 厂商:

    FAIRCHILD(仙童半导体)

  • 封装:

  • 描述:

    74ACTQ541MTC - Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs - Fairchild Semiconductor

  • 数据手册
  • 价格&库存
74ACTQ541MTC 数据手册
74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs December 2007 74ACTQ541 Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs Features ■ ICC and IOZ reduced by 50% ■ Guaranteed simultaneous switching noise level and ■ ■ ■ ■ ■ ■ General Description The 74ACTQ541 is an octal buffer/line driver designed to be employed as memory and address drivers, clock drivers and bus oriented transmitter/receivers. This device is similar in function to the 74ACTQ244 while providing flow-through architecture (inputs on opposite side from outputs). This pinout arrangement makes this device especially useful as an output port for microprocessors, allowing ease of layout and greater PC board density. The 74ACTQ541 utilizes FACT Quiet Series™ technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Series features GTO™ output control and undershoot corrector in addition to split ground bus for superior performance. dynamic threshold performance Guaranteed pin-to-pin skew AC performance Inputs and outputs on opposite sides of package for easy board layout Non-inverting 3-STATE outputs Guaranteed 4kV minimum ESD immunity TTL compatible inputs Outputs source/sink 24mA Ordering Information Order Number 74ACTQ541SC 74ACTQ541MTC Package Number M20B MTC20 Package Description 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering number. All packages are lead free per JEDEC: J-STD-020B standard. FACT™, FACT Quiet Series™, and GTO™ are trademarks of Fairchild Semiconductor Corporation. ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs Connection Diagram Logic Symbol IEEE/IEC Pin Description Pin Name OE1–OE2 I0–I7 O1–O7 Inputs Outputs Pin Description 3-STATE Output Enable (Active-LOW) Truth Table Inputs OE1 L H X L OE2 L X H L I H X X L Outputs H Z Z L H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 2 74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs Absolute Maximum Ratings Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. Symbol VCC IIK Supply Voltage DC Input Diode Current VI = –0.5V VI = VCC + 0.5V VI IOK DC Input Voltage DC Output Diode Current VO = –0.5V VO = VCC + 0.5V VO IO TSTG TJ DC Output Voltage Parameter Rating –0.5V to +7.0V –20mA +20mA –0.5V to VCC + 0.5V –20mA +20mA –0.5V to VCC + 0.5V ±50mA ±50mA –65°C to +150°C ±300mA 140°C DC Output Source or Sink Current Storage Temperature DC Latch-Up Source or Sink Current Junction Temperature ICC or IGND DC VCC or Ground Current per Output Pin Recommended Operating Conditions The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings. Symbol VCC VI VO TA ∆V / ∆t Supply Voltage Input Voltage Output Voltage Operating Temperature Minimum Input Edge Rate: Parameter Rating 4.5V to 5.5V 0V to VCC 0V to VCC –40°C to +85°C 125mV/ns VIN from 0.8V to 2.0V, VCC @ 4.5V, 5.5V ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 3 74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs DC Electrical Characteristics TA = +25°C Symbol VIH VIL VOH TA = –40°C to +85°C Units V V V 2.0 2.0 0.8 0.8 2.9 4.4 3.76 4.76 0.1 0.1 0.44 0.44 ±1.0 ±2.5 1.5 75 –75 µA µA mA mA mA µA V V V V V Parameter Minimum HIGH Level Input Voltage Maximum LOW Level Input Voltage Minimum HIGH Level Output Voltage VCC (V) 4.5 5.5 4.5 5.5 3.0 4.5 4.5 5.5 Conditions VOUT = 0.1V or VCC – 0.1V VOUT = 0.1V or VCC – 0.1V IOUT = –50µA VIN = VIL or VIH, IOH = –24mA(1) IOUT = 50µA VIN = VIL or VIH, IOH = 24mA(1) VI = VCC, GND VI = VIL, VIH; VO = VCC, GND VI = VCC – 2.1V VOLD = 1.65V Max. VOHD = 3.85V Min. VIN = VCC or GND Figures 1 & 2(3) Figures 1 & 2(3) (4) Typ. 1.5 1.5 1.5 1.5 2.99 4.49 2.0 2.0 0.8 0.8 2.9 4.4 Guaranteed Limits 3.86 4.86 0.002 0.001 0.1 0.1 0.36 0.36 ±0.1 ±0.25 0.6 VOL Maximum LOW Level Output Voltage 3.0 4.5 4.5 5.5 IIN IOZ ICCT IOLD IOHD ICC VOLP VOLV VIHD VILD Maximum Input Leakage Current Maximum 3-STATE Leakage Current Maximum ICC/Input Minimum Dynamic Output Current(2) Maximum Quiescent Supply Current Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Minimum HIGH Level Dynamic Input Voltage Maximum LOW Level Dynamic Input Voltage 5.5 5.5 5.5 5.5 5.5 5.5 5.0 5.0 5.0 5.0 4.0 1.1 –0.6 1.9 1.2 1.5 –1.2 2.2 0.8 40.0 (4) Notes: 1. All outputs loaded; thresholds on input associated with output under test. 2. Maximum test duration 2.0ms, one output loaded at a time. 3. Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND. 4. Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (VILD), 0V to threshold (VIHD), f = 1MHz. ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 4 74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs AC Electrical Characteristics TA = +25°C, CL = 50pF Symbol tPLH tPHL tPZH tPZL tPHZ tPLZ tOSHL tOSLH Output to Output Skew, Data to Output(6) Output Disable Time 5.0 TA = –40°C to +85°C, CL = 50pF Min. 2.0 2.0 2.0 2.0 1.5 1.5 Parameter Propagation Delay, Data to Output Output Enable Time VCC (V)(5) 5.0 5.0 Min. 2.0 2.0 2.0 2.0 1.5 1.5 Typ. 4.5 5.5 5.0 6.5 5.5 5.5 0.5 0.5 Max. 7.0 7.0 9.0 9.0 7.5 7.5 1.0 1.0 Max. 7.5 7.5 9.5 9.5 8.0 8.0 1.0 1.0 Units ns ns ns ns Notes: 5. Voltage Range 5.0 is 5.0V ± 0.5V 6. Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. Capacitance Symbol CIN CPD Parameter Input Capacitance Power Dissipation Capacitance Conditions VCC = OPEN VCC = 5.0V Typ. 4.5 70 Units pF pF ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 5 74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs FACT Noise Characteristics The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. VOLP/VOLV and VOHP/VOHV : ■ Determine the quiet output pin that demonstrates the Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope Procedure: 1. Verify Test Fixture Loading: Standard Load 50pF, 500Ω. 2. Deskew the HFS generator so that no two channels have greater than 150ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. 4. Set the HFS generator to toggle all but one output at a frequency of 1MHz. Greater frequencies will increase DUT heating and effect the results of the measurement. 5. Set the HFS generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope. greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. ■ Measure VOLP and VOLV on the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. ■ Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. VILD and VIHD: ■ Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. ■ First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as VILD. ■ Next decrease the input HIGH voltage level, VIH, until the output begins to oscillate or steps out a min of 2ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD ■ Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability on the measurements. Notes: 7. VOHVand VOLP are measured with respect to ground reference. 8. Input pulses have the following characteristics: f = 1MHz, tr = 3ns, tf = 3 s, skew < 150ps. Figure 1. Quiet Output Noise Voltage Waveforms Figure 2. Simultaneous Switching Test Circuit ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 6 74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs Physical Dimensions 13.00 12.60 11.43 20 B 11 A 9.50 10.65 7.60 10.00 7.40 2.25 1 PIN ONE INDICATOR 0.51 0.35 0.25 M 10 1.27 CBA 1.27 0.65 LAND PATTERN RECOMMENDATION 2.65 MAX SEE DETAIL A C 0.33 0.20 0.10 C SEATING PLANE 0.75 0.25 (R0.10) (R0.10) 8° 0° X 45° 0.30 0.10 NOTES: UNLESS OTHERWISE SPECIFIED GAGE PLANE 0.25 1.27 0.40 (1.40) A) THIS PACKAGE CONFORMS TO JEDEC MS-013, VARIATION AC, ISSUE E B) ALL DIMENSIONS ARE IN MILLIMETERS. C) DIMENSIONS DO NOT INCLUDE MOLD FLASH OR BURRS. D) CONFORMS TO ASME Y14.5M-1994 E) LANDPATTERN STANDARD: SOIC127P1030X265-20L F) DRAWING FILENAME: MKT-M20BREV3 SEATING PLANE DETAIL A SCALE: 2:1 Figure 3. 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 7 74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs Physical Dimensions (Continued) Figure 4. 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 8 74ACTQ541 — Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs TRADEMARKS The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks. PDP-SPM™ SyncFET™ ® Power220® ® Power247 The Power Franchise® POWEREDGE® Power-SPM™ PowerTrench® TinyBoost™ Programmable Active Droop™ TinyBuck™ ® QFET TinyLogic® QS™ TINYOPTO™ QT Optoelectronics™ TinyPower™ ® Quiet Series™ TinyPWM™ RapidConfigure™ TinyWire™ Fairchild® SMART START™ Fairchild Semiconductor® µSerDes™ ® SPM FACT Quiet Series™ UHC® STEALTH™ FACT® Ultra FRFET™ SuperFET™ FAST® UniFET™ SuperSOT™-3 FastvCore™ VCX™ ® ®* SuperSOT™-6 FlashWriter SuperSOT™-8 * EZSWITCH™ and FlashWriter® are trademarks of System General Corporation, used under license by Fairchild Semiconductor. DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design. This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor. The datasheet is printed for reference information only. Rev. I32 ACEx® Build it Now™ CorePLUS™ CROSSVOLT™ CTL™ Current Transfer Logic™ EcoSPARK® EZSWITCH™ * ™ FPS™ FRFET® Global Power ResourceSM Green FPS™ Green FPS™ e-Series™ GTO™ i-Lo™ IntelliMAX™ ISOPLANAR™ MegaBuck™ MICROCOUPLER™ MicroFET™ MicroPak™ MillerDrive™ Motion-SPM™ OPTOLOGIC® OPTOPLANAR® 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. Preliminary First Production No Identification Needed Full Production Obsolete Not In Production ©1993 Fairchild Semiconductor Corporation 74ACTQ541 Rev. 1.6.0 www.fairchildsemi.com 9
74ACTQ541MTC 价格&库存

很抱歉,暂时无法提供与“74ACTQ541MTC”相匹配的价格&库存,您可以联系我们找货

免费人工找货