XP3B-3029-5050-1-T/T

Electroformed Probe Pins XP3B Highly Reliable Electroformed Probe Pins. Outer spring type. • Plunger structure to ensure stable contact. • High durability due to the smooth end surfaces achieved with electroforming. ■Feature ●Plunger structure to ensure stable contact. Standard Probe Pin ●Plunger structure ensures stable and constant plunger contact. Electroformed Probe Pin Upper machined plunger Tube Upper electroformed plunger Spring Spring Lower machined plunger Lower electroformed plunger (Cross-section diagram) Conductive Path Upper plunger Tube Lower plunger Contact sections (Contact Sections Enlarged) Conductive Path Upper plunger Lower plunger ●Plunger Tip Shapes. Plunger tip shapes other than those shown below can also be manufactured. D R S ■Usage Example Device Solder ball IC test socket Electroformed probe PCB 1 XP3B ■Model Number List XP3B-@@@@-@@@@-@-@/@ − −− −− − − − 1 2 3 4 5 6 7 8 2 Diameter 4 Upper contact length 3 Overall length 5 Lower contact length 2 1 Series Diameter 38 3 4 5 Overall length Upper contact length Lower contact length 6 7 8 Plating specification Upper contact shape Lower contact shape 2.85 mm 50 0.5 mm 50 0.5 mm XP3B 1 30 D S S R R S S 0.38 dia. 29 30 D Gold 0.30 dia. 0.30 dia. 12 1.18 mm 30 0.3 mm 15 0.15 mm ■Ratings and Specifications Diameter Model 0.38 dia. XP3B-3829-5050-1-@/@ Rated current 0.30 dia. XP3B-3029-5050-1-@/@ XP3B-3012-3015-1-@/@ 25 gf 8 gf 2A Contact force 33 gf 2A Recommended stroke 0.4 mm 0.2 mm Maximum stroke 0.5 mm 0.25 mm Contact resistance 50 mΩ max. Mechanical durability 60 mΩ max. 1,000,000 operations min. ■Materials and Finish 2 0.30 dia. Plunger Nickel alloy/gold plating Spring SWP/gold plating 100 mΩ max. XP3B XP3B-38 0.38 Diameter for 0.5-mm Pitch ■Dimensions ■Recommended Mounting Dimensions (Unit: mm) 0.09 0.35 Upper contact length protrusion 0.2 (Unit: mm) 0.41 dia. 0.23 dia. 0.5 2.85 1.85 0.5 0.2 0.38 dia. 0.09 0.23 dia. 0.1 Lower contact length protrusion 0.5 ■Ordering Information Upper contact shape D R Lower contact shape Model D XP3B-3829-5050-1-D/D R XP3B-3829-5050-1-D/R S XP3B-3829-5050-1-D/S R XP3B-3829-5050-1-R/R R XP3B-3829-5050-1-S/R S XP3B-3829-5050-1-S/S Minimum ordering quantity (pieces) 50 S Note: Either upper or lower contact can be set for contact with the inspection target. 3 XP3B XP3B-30 0.30 Diameter for 0.4-mm Pitch ■Dimensions (Unit: mm) ■Recommended Mounting Dimensions 0.35 Upper contact length protrusion 0.2 0.06 (Unit: mm) 0.33 dia. 0.23 dia. 0.5 2.85 1.85 0.5 0.2 0.3 dia. 0.09 0.23 dia. 0.1 Lower contact length protrusion 0.4 ■Ordering Information Upper contact shape D R S Lower contact shape D XP3B-3029-5050-1-D/D R XP3B-3029-5050-1-D/R S XP3B-3029-5050-1-D/S D XP3B-3029-5050-1-R/D R XP3B-3029-5050-1-R/R S XP3B-3029-5050-1-R/S D XP3B-3029-5050-1-S/D R XP3B-3029-5050-1-S/R S XP3B-3029-5050-1-S/S Note: Set the lower contact for contact with the inspection target. 4 Model Minimum ordering quantity (pieces) 50 XP3B XP3B-3012 0.30 Diameter for High-frequency Applications ■Dimensions (Unit: mm) 0.08 ■Recommended Mounting Dimensions(Unit: mm) 0.33 dia. 0.2 Upper contact length protrusion 0.2 0.23 dia. 0.3 1.18 0.73 0.15 0.2 0.120 0.23 dia. 0.05 Lower contact length protrusion 0.3 dia. 0.4 ■Ordering Information Upper contact shape Lower contact shape Model D Minimum ordering quantity (pieces) XP3B-3012-3015-1-D/S S 50 S XP3B-3012-3015-1-S/S Note: Set the lower contact for contact with the inspection target. Return loss Insertion Loss 0 0 S12 S21 2 Return loss [dB] Insertion Loss [dB] S11 5 1 3 4 5 6 S22 10 15 20 25 30 35 7 40 8 45 0 10 20 Frequency [GHz] 30 40 0 10 20 30 40 Frequency [GHz] 5 XP3B ■Safety Precautions Precautions for Correct Use ●General Environmental Conditions (1) Use the Probe Pins in an ambient atmosphere that does not contain dust, dirt, corrosive gas, or oil so that the Probe Pins do not get contaminated. ●Stroke Conditions (1) Apply a load to the Probe Pins only in the axial direction. Never apply a lateral load. (2) The life of the Probe Pins will be drastically reduced if the recommended stroke is exceeded. ●Current Application Conditions (1) Apply current when the Probe Pins are stationary after they come into contact with the target at the recommended stroke position. (2) If a current is applied during the stroke, at a position other than the recommended stroke, or when the Probe Pins are not in contact with the target, the life of the Probe Pins will be drastically reduced. (3) The catalog value of the carrying capacity may not be met due to Probe Pin deterioration or other factors. Allow sufficient leeway when you design the actual application. ●Voltage Application Conditions (1) Apply voltage when the Probe Pins are stationary after they come into contact with the target at the recommended stroke position. (2) Do not apply a voltage when the Probe Pins are not in contact with the target. The Probe Pins will be damaged due to discharge immediately before they come into contact. (3) When a high voltage is applied to the contact probe, strictly observe the current and voltage application conditions. Also, take measures to prevent discharge or other large instantaneous currents. 6 ●Carrying Capacity (1) The rated current that is given in the catalog is the maximum continuous current for 1 minute for inspection of gold pads under the conditions given on the left (general environment, recommended stroke, current application, and voltage application). ●Resistance (1) If a large current is applied, the resistance may increase due to deterioration of the contacts and internal components. (2) As the number of strokes increases, the resistance may increase due to deterioration of the contacts and internal components. ●Durability (1) The durability that is given in the catalog is a guideline for the number of times that the Probe Pins can be used without problems at 10 mA for gold pads under the conditions given on the left (general environment, recommended stroke, current application, and voltage application). (2) Depending on the operating environment and conditions, the Probe Pins may need to be replaced sooner than the specified limit in the datasheet due to increased resistance, reduced contact force, or other factors. Replace the Probe Pins as required by the actual application. ●Contact Force (1) If the current is increased, heat generated by the Probe Pins will reduce the contact force. ●Recommended Mounting Dimensions (1) The dimensions are reference values. Actual values will depend on the material and thickness of the resin plate. ●Handling Precautions Observe the following precautions when you are handling the Probe Pins. Otherwise, the Probe Pins may be damaged. • Do not apply excessive force to the contact sections of the electroformed plungers. • Do not apply excessive force to the coil spring section. MEMO • Application examples provided in this document are for reference only. In actual applications, confirm equipment functions and safety before using the product. • Consult your OMRON representative before using the product under conditions which are not described in the manual or applying the product to nuclear control systems, railroad systems, aviation systems, vehicles, combustion systems, medical equipment, amusement machines, safety equipment, and other systems or equipment that may have a serious influence on lives and property if used improperly. Make sure that the ratings and performance characteristics of the product provide a margin of safety for the system or equipment, and be sure to provide the system or equipment with double safety mechanisms. Note: Do not use this document to operate the Unit. OMRON Corporation Electronic and Mechanical Components Company Contact: www.omron.com/ecb Cat. No. G088-E1-04 0616(0414)(O)