74F1071
18-Bit Undershoot/Overshoot Clamp and ESD
Protection Device
Features
General Description
■ 18-bit array structure in 20-pin package
The 74F1071 is an 18-bit undershoot/overshoot clamp
which is designed to limit bus voltages and also to protect more sensitive devices from electrical overstress
due to electrostatic discharge (ESD). The inputs of the
device aggressively clamp voltage excursions nominally
at 0.5V below and 7V above ground.
■ FAST Bipolar voltage clamping action
■ Dual center pin grounds for min inductance
■ Robust design for ESD protection
■ Low input capacitance
■ Optimum voltage clamping for 5V CMOS/TTL
applications
Ordering Information
Package
Number
Package Description
M20B
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
74F1071MSA
MSA20
20-Lead Shrink Small Outline Package (SSOP), JEDEC MO-150, 5.3mm Wide
74F1071MTC
MTC20
20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm
Wide
Order Number
74F1071SC
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering number.
All packages are lead free per JEDEC: J-STD-020B standard.
Connection Diagram
Note: Simplified Component Representation
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
www.fairchildsemi.com
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
January 2008
Symbol
TSTG
Parameter
Rating
Storage Temperature
–65°C to +150°C
TA
Ambient Temperature Under Bias
–65°C to +125°C
TJ
Junction Temperature Under Bias
–65°C to +150°C
VI
Input Voltage(1)
–0.5V to +6V
II
Input Current(1)
–200mA to +50mA
ESD(2)
Human Body Model (MIL-STD-883D method 3015.7)
±10kV
IEC 801-2
±6kV
Machine Model (EIAJIC-121-1981)
±2kV
DC Latchup Source Current (JEDEC Method 17)
±500mA
Package Power Dissipation @ +70°C SOIC Package
800mW
Notes:
1. Voltage ratings may be exceeded if current ratings and junction temperature and power consumption ratings are not
exceeded.
2. ESD Rating for Direct contact discharge using ESD Simulation Tester. Higher rating may be realized in the actual
application.
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to absolute maximum ratings.
Symbol
Parameter
TA
Free Air Ambient Temperature
VZ
Reverse Bias Voltage
θJA
Thermal Resistance (in Free Air)
Rating
0°C to +70°C
0V to 5.25 VDC
SOIC Package
100°C/W
SSOP Package
110°C/W
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
www.fairchildsemi.com
2
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
TA = +25°C
Symbol
IIH
VZ
Parameter
Input HIGH Current
Reverse Voltage
Conditions
Min.
Typ.
Max.
VIN = 5.25V; Untested
Input @ GND
1.5
VIN = 5.5V; Untested
Input @ GND
IZ = 1mA; Untested
Inputs @ GND
6.6
IZ = 50mA; Untested
Inputs @ GND
VF
Forward Voltage
Min.
Max.
Units
10
50
µA
3
20
100
6.9
7.2
7.1
7.5
5.9
7.7
–0.3
–0.6
–0.9
–0.3
–0.9
IF = –200mA; Untested
Inputs @ 5V
–0.5
–1.1
–1.5
–0.5
–1.5
Adjacent Input
Crosstalk
CIN
Input Capacitance
VBIAS = 0 VDC
(small signal @ 1MHz) V
BIAS = 5 VDC
3
25
V
8.0
IF = –18mA; Untested
Inputs @ 5V
ICT
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
TA = 0°C to +70°C
V
%
pF
13
www.fairchildsemi.com
3
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
DC Electrical Characteristics
Typical Forward and Reverse V/I Characteristics
Typical Reverse Conduction Characteristics
ESD Network
CZ
RZ
Human Body Model
100pF
1500Ω
IEC 801-2
150pF
330Ω
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
Typical Forward Conduction Characteristics
Simulated ESD Voltage Clamping Test Circuit
www.fairchildsemi.com
4
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
DC Electrical Characteristics
Unclamped +1kV ESD Voltage Waveform
(IEC801-2 Network)
Clamped +1kV ESD Voltage Waveform
(IEC801-2 Network)
Unclamped -1kV ESD Voltage Waveform
(IEC801-2 Network)
Clamped -1kV ESD Voltage Waveform
(IEC801-2 Network)
Typical Application
74F1071 ESD Protection of ASIC on User Port
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
www.fairchildsemi.com
5
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
DC Electrical Characteristics (Continued)
13.00
12.60
A
11.43
20
11
B
9.50
10.65 7.60
10.00 7.40
2.25
1
10
0.51
0.35
PIN ONE
INDICATOR
0.25
M
0.65
1.27
1.27
C B A
LAND PATTERN RECOMMENDATION
2.65 MAX
SEE DETAIL A
0.33
0.20
C
0.75
0.25
X 45°
SEATING PLANE
NOTES: UNLESS OTHERWISE SPECIFIED
(R0.10)
GAGE PLANE
(R0.10)
0.10 C
0.30
0.10
0.25
8°
0°
A) THIS PACKAGE CONFORMS TO JEDEC
MS-013, VARIATION AC, ISSUE E
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS DO NOT INCLUDE MOLD
FLASH OR BURRS.
D) CONFORMS TO ASME Y14.5M-1994
1.27
0.40
SEATING PLANE
E) LANDPATTERN STANDARD: SOIC127P1030X265-20L
(1.40)
DETAIL A
F) DRAWING FILENAME: MKT-M20BREV3
SCALE: 2:1
Figure 1. 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,
specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
www.fairchildsemi.com
6
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
Physical Dimensions
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
Physical Dimensions (Continued)
Figure 2. 20-Lead Shrink Small Outline Package (SSOP), JEDEC MO-150, 5.3mm Wide
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,
specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
www.fairchildsemi.com
7
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
Physical Dimensions (Continued)
Figure 3. 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,
specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
www.fairchildsemi.com
8
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PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
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As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
2. A critical component in any component of a life support,
device, or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In Design
This datasheet contains the design specifications for product
development. Specifications may change in any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data; supplementary data will be
published at a later date. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild Semiconductor
reserves the right to make changes at any time without notice to improve
the design.
Obsolete
Not In Production
This datasheet contains specifications on a product that has been
discontinued by Fairchild Semiconductor. The datasheet is printed for
reference information only.
Rev. I32
©1994 Fairchild Semiconductor Corporation
74F1071 Rev. 1.4.0
www.fairchildsemi.com
9
74F1071 — 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global
subsidiaries, and is not intended to be an exhaustive list of all such trademarks.
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