74LVQ573SCX

Revised June 2001 74LVQ573 Low Voltage Octal Latch with 3-STATE Outputs General Description Features The LVQ573 is a high-speed octal latch with buffered common Latch Enable (LE) and buffered common Output Enable (OE) inputs. The LVQ573 is functionally identical to the LVQ373 but with inputs and outputs on opposite sides of the package. ■ Ideal for low power/low noise 3.3V applications ■ Implements patented EMI reduction circuitry ■ Available in SOIC JEDEC, SOIC EIAJ, and QSOP packages ■ Guaranteed simultaneous switching noise level and dynamic threshold performance ■ Improved latch-up immunity ■ Guaranteed incident wave switching into 75Ω ■ 4 kV minimum ESD immunity Ordering Code: Order Number 74LVQ573SC 74LVQ573SJ 74LVQ573QSC Package Number M20B Package Description 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide MQA20 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150" Wide Devices also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code. Logic Symbols Connection Diagram IEEE/IEC Truth Table Inputs Pin Descriptions Pin Names D0–D7 Description Data Inputs LE Latch Enable Input OE 3-STATE Output Enable Input O0–O7 3-STATE Latch Outputs © 2001 Fairchild Semiconductor Corporation DS011361 Outputs OE LE D On L H H H L H L L L L X O0 H X X Z H = HIGH Voltage L = LOW Voltage Z = High Impedance X = Immaterial O0 = Previous O0 before HIGH-to-LOW transition of Latch Enable www.fairchildsemi.com 74LVQ573 Low Voltage Octal Latch with 3-STATE Outputs February 1992 74LVQ573 Functional Description D-type inputs a setup time preceding the HIGH-to-LOW transition of LE. The 3-STATE buffers are controlled by the Output Enable (OE) input. When OE is LOW, the buffers are enabled. When OE is HIGH the buffers are in the high impedance mode but this does not interfere with entering new data into the latches. The LVQ573 contains eight D-type latches with 3-STATE output buffers. When the Latch Enable (LE) input is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D-type input changes. When LE is LOW the latches store the information that was present on the Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 Supply Voltage (VCC) Recommended Operating Conditions (Note 2) −0.5V to +7.0V DC Input Diode Current (IIK) Supply Voltage (VCC) VI = −0.5V −20 mA Input Voltage (VI) VI = VCC + 0.5V +20 mA Output Voltage (VO) DC Input Voltage (VI) −0.5V to VCC + 0.5V 0V to VCC −40°C to +85°C Minimum Input Edge Rate (∆V/∆t) VO = −0.5V −20 mA VIN from 0.8V to 2.0V VO = VCC + 0.5V +20 mA VCC @ 3.0V 125 mV/ns −0.5V to VCC + 0.5V DC Output Source Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The “Recommended Operating Conditions” table will define the conditions for actual device operation. ±50 mA or Sink Current (IO) DC VCC or Ground ±400 mA Current (ICC or IGND) Storage Temperature (TSTG) 0V to VCC Operating Temperature (TA) DC Output Diode Current (IOK) DC Output Voltage (VO) 2.0V to 3.6V −65°C to +150°C Note 2: Unused inputs must be held HIGH or LOW. They may not float. DC Latch-Up Source or ±300 mA Sink Current DC Electrical Characteristics Symbol VIH Parameter Minimum High Level Input Voltage VIL Maximum Low Level Input Voltage VOH Minimum High Level Output Voltage VOL Maximum Low Level Output Voltage TA = +25°C VCC TA = −40°C to +85°C Units (V) Typ 3.0 1.5 2.0 2.0 V 3.0 1.5 0.8 0.8 V 3.0 2.99 2.9 2.9 V 3.0 3.0 2.58 2.48 V 0.1 0.1 V 0.002 IOUT = −50 µA VIN = VIL or VIH (Note 3) IOH = −12 mA IOUT = 50 µA VIN = VIL or VIH (Note 3) 0.44 V ±0.1 ±1.0 µA VI = VCC, GND VOLD = 0.8 VMax (Note 5) 3.6 IOLD Minimum Dynamic 3.6 36 mA IOHD Output Current (Note 4) 3.6 −25 mA ICC Maximum Quiescent 3.6 4.0 40.0 µA 3.6 ±0.25 ±2.5 µA IOL = 12 mA VOHD = 2.0V VMin (Note 5) VIN = VCC or GND VI (OE) = V IL, VIH 3-STATE Leakage Current VOUT = 0.1V or VCC − 0.1V 0.36 Maximum Input Leakage Current IOZ VOUT = 0.1V or VCC − 0.1V 3.0 IIN Supply Current Conditions Guaranteed Limits VI = VCC, GND VO = VCC, GND VOLP Quiet Output Maximum Dynamic VOL 3.3 0.4 0.8 V (Note 6)(Note 7) VOLV Quiet Output Minimum Dynamic VOL 3.3 −0.4 −0.8 V (Note 6)(Note 7) VIHD Maximum High Level Dynamic Input Voltage 3.3 1.6 2.0 V (Note 6)(Note 8) VILD Maximum Low Level Dynamic Input Voltage 3.3 1.6 0.8 V (Note 6)(Note 8) Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: Incident wave switching on transmission lines with impedances as low as 75Ω for commercial temperature range is guaranteed for. Note 6: Worst case package. Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND. Note 8: Max number of Data Inputs (n) switching. (n − 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. 3 www.fairchildsemi.com 74LVQ573 Absolute Maximum Ratings(Note 1) 74LVQ573 AC Electrical Characteristics TA = +25°C Symbol Parameter tPHL Propagation Delay tPLH Dn to On tPLH Propagation Delay tPHL LE to On tPZL Output Enable Time tPZH tPHZ Output Disable Time tPLZ tOSHL Output to Output Skew (Note 9) tOSLH Dn to On TA = −40°C to +85°C CL = 50 pF VCC CL = 50 pF (V) Min Typ Max Min Max 2.7 2.5 10.2 14.8 2.5 16.0 3.3 ± 0.3 2.5 8.5 10.5 2.5 11.0 2.7 2.5 10.2 16.9 2.5 18.0 3.3 ± 0.3 2.5 8.5 12.0 2.5 12.5 2.7 2.5 10.2 18.3 2.5 19.0 3.3 ± 0.3 2.5 8.5 13.0 2.5 13.5 2.7 1.0 10.8 20.4 1.0 21.0 3.3 ± 0.3 1.0 9.0 14.5 1.0 15.0 2.7 1.0 1.5 1.5 3.3 ± 0.3 1.0 1.5 1.5 Units ns ns ns ns ns Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. AC Operating Requirements TA = +25°C Symbol Parameter (V) tS Setup Time, HIGH or LOW Dn to LE tH Hold Time, HIGH or LOW Dn to LE tW LE Pulse Width, HIGH TA = −40°C to +85°C CL = 50 pF VCC Typ CL = 50 pF 2.7 0 4.0 4.5 3.3 ± 0.3 0 3.0 3.0 2.7 0 1.5 1.5 3.3 ± 0.3 0 1.5 1.5 2.7 2.4 5.0 6.0 3.3 ± 0.3 2.0 4.0 4.0 Capacitance Symbol Parameter Typ Units CIN Input Capacitance 4.5 pF VCC = Open CPD (Note 10) Power Dissipation Capacitance 37 pF VCC = 3.3V Note 10: CPD is measured at 10 MHz. www.fairchildsemi.com 4 Units Guaranteed Minimum Conditions ns ns ns 74LVQ573 Physical Dimensions inches (millimeters) unless otherwise noted 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Package Number M20B 5 www.fairchildsemi.com 74LVQ573 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M20D www.fairchildsemi.com 6 74LVQ573 Low Voltage Octal Latch with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150" Wide Package Number MQA20 Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 7 www.fairchildsemi.com