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FDB8896_F085

FDB8896_F085

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOT404

  • 描述:

    MOSFET N-CH 30V 19A TO-263AB

  • 数据手册
  • 价格&库存
FDB8896_F085 数据手册
ON Semiconductor Is Now To learn more about onsemi™, please visit our website at www.onsemi.com onsemi and       and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without notice. The information herein is provided “as-is” and onsemi makes no warranty, representation or guarantee regarding the accuracy of the information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using onsemi products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/ or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others. onsemi products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use onsemi products for any such unintended or unauthorized application, Buyer shall indemnify and hold onsemi and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that onsemi was negligent regarding the design or manufacture of the part. onsemi is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. Other names and brands may be claimed as the property of others. N-Channel PowerTrench® MOSFET 30V, 93A, 5.7mΩ General Description Features • rDS(ON) = 5.7mΩ, VGS = 10V, ID = 35A • rDS(ON) = 6.8mΩ, VGS = 4.5V, ID = 35A This N-Channel MOSFET has been designed specifically to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low rDS(ON) and fast switching speed. • High performance trench technology for extremely low rDS(ON) • Low gate charge • High power and current handling capability • Qualified to AEC Q101 Applications • RoHS Compliant • DC/DC converters ® FDB8896-F085 N-Channel PowerTrench MOSFET FDB8896-F085 D GATE G SOURCE TO-263AB FDB SERIES DRAIN (FLANGE) S MOSFET Maximum Ratings TC = 25°C unless otherwise noted Parameter S Symbol VDSS Drain to Source Voltage Ratings 30 Units V VGS Gate to Source Voltage ±20 V 93 A Drain Current Continuous (TC = 25oC, VGS = 10V) (Note 1) ID Continuous (TC = 25oC, VGS = 4.5V) (Note 1) Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 43oC/W) Pulsed EAS Single Pulse Avalanche Energy (Note 2) Power dissipation PD Derate above 25oC TJ, TSTG Operating and Storage Temperature 85 A 19 A Figure 4 A 74 mJ 80 W 0.53 W/oC -55 to 175 oC Thermal Characteristics 1.88 o C/W Thermal Resistance Junction to Ambient TO-263 ( Note 3) 62 o C/W Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area 43 oC/W RθJC Thermal Resistance Junction to Case TO-263 RθJA RθJA Package Marking and Ordering Information Device Marking FDB8896 Device FDB8896-F085 ©2010 Semiconductor Components Industries, LLC. September-2017, Rev. 1 Package TO-263AB Reel Size 330mm Tape Width 24mm Quantity 800 units Publication Order Number: FDB8896-F085/D Symbol Parameter Test Conditions Min Typ Max Units V Off Characteristics BVDSS Drain to Source Breakdown Voltage IDSS Zero Gate Voltage Drain Current IGSS Gate to Source Leakage Current ID = 250μA, VGS = 0V VDS = 24V VGS = 0V TC = 150oC VGS = ±20V 30 - - - - 1 - - 250 - - ±100 nA - 2.5 V μA On Characteristics VGS(TH) rDS(ON) Gate to Source Threshold Voltage Drain to Source On Resistance VGS = VDS, ID = 250μA 1.2 ID = 35A, VGS = 10V - 0.0049 0.0057 ID = 35A, VGS = 4.5V - 0.0059 0.0068 ID = 35A, VGS = 10V, TJ = 175oC - 0.0078 0.0094 Ω Dynamic Characteristics Input Capacitance COSS Output Capacitance CRSS Reverse Transfer Capacitance RG Gate Resistance Qg(TOT) Total Gate Charge at 10V - 2525 - - 490 - pF - 300 - pF VGS = 0.5V, f = 1MHz - 2.3 - Ω VGS = 0V to 10V - 48 67 nC VDS = 15V, VGS = 0V, f = 1MHz Qg(5) Total Gate Charge at 5V VGS = 0V to 5V Qg(TH) Threshold Gate Charge VGS = 0V to 1V Qgs Gate to Source Gate Charge Qgs2 Gate Charge Threshold to Plateau Qgd Gate to Drain “Miller” Charge Switching Characteristics VDD = 15V ID = 35A Ig = 1.0mA pF - 25 36 nC - 2.3 3.0 nC - 8 - nC - 5.7 - nC - 9.5 - nC (VGS = 10V) tON Turn-On Time - - 167 ns td(ON) Turn-On Delay Time - 9 - ns tr Rise Time td(OFF) Turn-Off Delay Time tf tOFF - 102 - ns - 58 - ns Fall Time - 44 - ns Turn-Off Time - - 153 ns V VDD = 15V, ID = 35A VGS = 4.5V, RGS = 6.2Ω Drain-Source Diode Characteristics ISD = 35A - - 1.25 ISD = 20A - - 1.0 V Reverse Recovery Time ISD = 35A, dISD/dt = 100A/μs - - 27 ns Reverse Recovered Charge ISD = 35A, dISD/dt = 100A/μs - - 12 nC VSD Source to Drain Diode Voltage trr QRR Notes: 1: Package current limitation is 80A. 2: Starting TJ = 25°C, L = 36μH, IAS = 64A, VDD = 27V, VGS = 10V. 3: Pulse width = 100s. 4 www.onsemi.com 2 ® CISS FDB8896-F085 N-Channel PowerTrench MOSFET Electrical Characteristics TC = 25°C unless otherwise noted 100 CURRENT LIMITED BY PACKAGE 1.0 80 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.2 0.8 0.6 0.4 VGS = 10V 60 VGS = 4.5V 40 20 0.2 0 0 25 50 75 100 150 125 0 175 25 50 75 TC , CASE TEMPERATURE (oC) 100 125 150 175 TC, CASE TEMPERATURE (oC) Figure 1. Normalized Power Dissipation vs Case Temperature Figure 2. Maximum Continuous Drain Current vs Case Temperature 2 ZθJC, NORMALIZED THERMAL IMPEDANCE DUTY CYCLE - DESCENDING ORDER 0.5 0.2 0.1 0.05 0.02 0.01 ® 1 PDM 0.1 t1 t2 NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZθJC x RθJC + TC SINGLE PULSE 0.01 10-5 10-4 10-3 10-2 10-1 100 101 t, RECTANGULAR PULSE DURATION (s) Figure 3. Normalized Maximum Transient Thermal Impedance 1000 IDM, PEAK CURRENT (A) TC = 25oC FOR TEMPERATURES TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS: 175 - TC I = I25 VGS = 4.5V 150 100 50 10-5 10-4 FDB8896-F085 N-Channel PowerTrench MOSFET Typical Characteristics TC = 25°C unless otherwise noted 10-3 10-2 t, PULSE WIDTH (s) Figure 4. Peak Current Capability www.onsemi.com 3 10-1 100 101 500 1000 IAS, AVALANCHE CURRENT (A) ID, DRAIN CURRENT (A) 10μs 100 100μs 10 OPERATION IN THIS AREA MAY BE LIMITED BY rDS(ON) 1ms 1 10ms SINGLE PULSE TJ = MAX RATED TC = 25oC If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD) If R ≠ 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] 100 STARTING TJ = 25oC 10 DC STARTING TJ = 150oC 1 0.1 1 60 10 0.01 0.1 1 10 tAV, TIME IN AVALANCHE (ms) VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 5. Forward Bias Safe Operating Area Figure 6. Unclamped Inductive Switching Capability 160 160 VGS = 10V ® VGS = 5V ID, DRAIN CURRENT (A) ID , DRAIN CURRENT (A) PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX VDD = 15V 120 o TJ = 25 C 80 40 o TJ = 175 C 120 VGS = 4V 80 VGS = 3V 40 TC = 25oC PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX TJ = -55oC 0 0 1.5 2.0 2.5 3.0 3.5 0 4 VGS , GATE TO SOURCE VOLTAGE (V) 0.25 0.5 0.75 1.0 1.25 1.5 VDS , DRAIN TO SOURCE VOLTAGE (V) Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics 14 1.6 NORMALIZED DRAIN TO SOURCE ON RESISTANCE PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX ID = 35A rDS(ON), DRAIN TO SOURCE ON RESISTANCE (mΩ) 100 12 10 8 6 ID = 1A PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX 1.4 1.2 1.0 0.8 VGS = 10V, ID = 35A 4 2 4 6 8 10 0.6 -80 VGS, GATE TO SOURCE VOLTAGE (V) Figure 9. Drain to Source On Resistance vs Gate Voltage and Drain Current -40 0 40 80 120 TJ, JUNCTION TEMPERATURE (oC) 160 Figure 10. Normalized Drain to Source On Resistance vs Junction Temperature www.onsemi.com 4 FDB8896-F085 N-Channel PowerTrench MOSFET Typical Characteristics TC = 25°C unless otherwise noted 200 1.2 1.2 ID = 250μA NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE NORMALIZED GATE THRESHOLD VOLTAGE VGS = VDS, ID = 250μA 1.0 0.8 0.6 0.4 -80 -40 0 40 80 120 160 1.1 1.0 0.9 -80 200 -40 TJ, JUNCTION TEMPERATURE (oC) Figure 11. Normalized Gate Threshold Voltage vs Junction Temperature 40 120 160 200 10 COSS ≅ CDS + CGD 1000 CRSS = CGD VDD = 15V ® VGS , GATE TO SOURCE VOLTAGE (V) CISS = CGS + CGD 8 6 4 WAVEFORMS IN DESCENDING ORDER: ID = 35A ID = 16A 2 VGS = 0V, f = 1MHz 100 0.1 80 Figure 12. Normalized Drain to Source Breakdown Voltage vs Junction Temperature 5000 C, CAPACITANCE (pF) 0 TJ , JUNCTION TEMPERATURE (oC) 0 30 1 10 VDS , DRAIN TO SOURCE VOLTAGE (V) 0 10 20 30 40 50 Qg, GATE CHARGE (nC) Figure 13. Capacitance vs Drain to Source Voltage FDB8896-F085 N-Channel PowerTrench MOSFET Typical Characteristics TC = 25°C unless otherwise noted Figure 14. Gate Charge Waveforms for Constant Gate Current www.onsemi.com 5 VDS BVDSS tP L VDS VARY tP TO OBTAIN REQUIRED PEAK IAS IAS + RG VDD VDD - VGS DUT tP IAS 0V 0 0.01Ω tAV Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms ® VDS FDB8896-F085 N-Channel PowerTrench MOSFET Test Circuits and Waveforms VDD Qg(TOT) VDS L VGS VGS = 10V VGS Qg(5) + Qgs2 VDD VGS = 5V DUT VGS = 1V Ig(REF) 0 Qg(TH) Qgs Qgd Ig(REF) 0 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms VDS tON tOFF td(ON) td(OFF) RL tf tr VDS 90% 90% + VGS VDD - 10% 0 10% DUT 90% RGS VGS VGS 0 Figure 19. Switching Time Test Circuit 50% 10% 50% PULSE WIDTH Figure 20. Switching Time Waveforms www.onsemi.com 6 ( T JM – TA ) P DM = ----------------------------Rθ JA 80 RθJA = 26.51+ 19.84/(0.262+Area) EQ.2 RθJA = 26.51+ 128/(1.69+Area) EQ.3 60 RθJA (oC/W) The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM, in an application. Therefore the application’s ambient temperature, TA (oC), and thermal resistance RθJA (oC/W) must be reviewed to ensure that TJM is never exceeded. Equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. 40 (EQ. 1) In using surface mount devices such as the TO-263 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of PDM is complex and influenced by many factors: 1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 20 0.1 1 10 (0.645) (6.45) AREA, TOP COPPER AREA in2 (cm2) (64.5) Figure 21. Thermal Resistance vs Mounting Pad Area 2. The number of copper layers and the thickness of the board. ® 3. The use of external heat sinks. 4. The use of thermal vias. 5. Air flow and board orientation. 6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in. ON Semiconductor provides thermal information to designer’s preliminary application assist the evaluation. Figure 21 defines the RθJA for the device as a function of the top copper (component side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse be evaluated using the ON applications can Semiconductor device Spice thermal model or manually utilizing the normalized maximum transient thermal impedance curve. Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeters square. The area, in square inches or square centimeters is 19.84 (0.262 + Area) R θJA = 26.51 + ------------------------------------- (EQ. 2) Area in Inches Squared 128 (1.69 + Area) R θJA = 26.51 + ---------------------------------- FDB8896-F085 N-Channel PowerTrench MOSFET Thermal Resistance vs. Mounting Pad Area (EQ. 3) Area in Centimeters Squared www.onsemi.com 7 .SUBCKT FDB8896 2 1 3 ; rev December 2003 Ca 12 8 2.3e-9 Cb 15 14 2.3e-9 Cin 6 8 2.3e-9 LDRAIN DPLCAP 10 RSLC2 5 51 EVTHRES + 19 8 + LGATE GATE 1 EVTEMP RGATE + 18 22 9 20 11 + 17 EBREAK 18 - 21 16 DBODY MWEAK 6 MMED MSTRO RLGATE LSOURCE CIN Lgate 1 9 5.5e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 2.7e-9 8 7 SOURCE 3 RSOURCE RLSOURCE S1A RLgate 1 9 55 RLdrain 2 5 10 RLsource 3 7 27 12 S2A 13 8 15 14 13 S1B CA RBREAK 17 18 RVTEMP S2B 13 19 CB 6 8 EGS VBAT 5 8 EDS - IT 14 + + - Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 2.1e-3 Rgate 9 20 2.3 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 2e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD + 8 22 RVTHRES Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*500),10))} .MODEL DbodyMOD D (IS=4E-12 IKF=10 N=1.01 RS=2.6e-3 TRS1=8e-4 TRS2=2e-7 + CJO=8.8e-10 M=0.57 TT=1e-16 XTI=2.2) .MODEL DbreakMOD D (RS=8e-2 TRS1=1e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=9.4e-10 IS=1e-30 N=10 M=0.4) .MODEL MmedMOD NMOS (VTO=1.98 KP=10 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.3 T_ABS=25) .MODEL MstroMOD NMOS (VTO=2.4 KP=350 IS=1e-30 N=10 TOX=1 L=1u W=1u T_ABS=25) .MODEL MweakMOD NMOS (VTO=1.68 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=23 RS=0.1 T_ABS=25) .MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-4e-7) .MODEL RdrainMOD RES (TC1=1.2e-3 TC2=8e-6) .MODEL RSLCMOD RES (TC1=9e-4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=7.5e-3 TC2=1e-6) .MODEL RvthresMOD RES (TC1=-2.4e-3 TC2=-8.8e-6) .MODEL RvtempMOD RES (TC1=-2.6e-3 TC2=2e-7) .MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3 VOFF=-4) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-0.5) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=-2) .ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. www.onsemi.com 8 ® Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD ESLC 50 RDRAIN 6 8 ESG DBREAK + It 8 17 1 RLDRAIN RSLC1 51 Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD Ebreak 11 7 17 18 33 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 DRAIN 2 5 FDB8896-F085 N-Channel PowerTrench MOSFET PSPICE Electrical Model rev December 2003 template FDB8896 n2,n1,n3 =m_temp electrical n2,n1,n3 number m_temp=25 { var i iscl dp..model dbodymod = (isl=4e-12,ikf=10,nl=1.01,rs=2.6e-3,trs1=8e-4,trs2=2e-7,cjo=8.8e-10,m=0.57,tt=1e-16,xti=2.2) dp..model dbreakmod = (rs=8e-2,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=9.4e-10,isl=10e-30,nl=10,m=0.4) m..model mmedmod = (type=_n,vto=1.98,kp=10,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.4,kp=350,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.68,kp=0.05,is=1e-30, tox=1,rs=0.1) LDRAIN sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-3) DPLCAP 5 sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3,voff=-4) 10 sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-2,voff=-0.5) RLDRAIN RSLC1 sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-0.5,voff=-2) 51 c.ca n12 n8 = 2.3e-9 RSLC2 c.cb n15 n14 = 2.3e-9 ISCL c.cin n6 n8 = 2.3e-9 EVTHRES + 19 8 + LGATE GATE 1 EVTEMP RGATE + 18 22 9 20 21 11 DBODY 16 MWEAK 6 EBREAK + 17 18 - MMED MSTRO RLGATE CIN 8 LSOURCE 7 RSOURCE RLSOURCE i.it n8 n17 = 1 S1A 12 l.lgate n1 n9 = 5.5e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 2.7e-9 RBREAK 15 14 13 13 8 S1B CA res.rlgate n1 n9 = 55 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 27 S2A 17 18 RVTEMP S2B 13 CB 6 8 EGS 19 - m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u, temp=m_temp m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u, temp=m_temp m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u, temp=m_temp res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-4e-7 res.rdrain n50 n16 = 2.1e-3, tc1=1.2e-3,tc2=8e-6 res.rgate n9 n20 = 2.3 res.rslc1 n5 n51 = 1e-6, tc1=9e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 2e-3, tc1=7.5e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-2.4e-3,tc2=-8.8e-6 res.rvtemp n18 n19 = 1, tc1=-2.6e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/500))** 10)) } } www.onsemi.com 9 VBAT 5 8 EDS - IT 14 + + + 8 22 RVTHRES SOURCE 3 ® spe.ebreak n11 n7 n17 n18 = 33 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 RDRAIN 6 8 ESG DBREAK 50 - dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod DRAIN 2 FDB8896-F085 N-Channel PowerTrench MOSFET SABER Electrical Model th JUNCTION REV 23 December 2003 FDB8896T CTHERM1 TH 6 9e-4 CTHERM2 6 5 1e-3 CTHERM3 5 4 2e-3 CTHERM4 4 3 3e-3 CTHERM5 3 2 7e-3 CTHERM6 2 TL 8e-2 RTHERM1 CTHERM1 6 RTHERM1 TH 6 3.0e-2 RTHERM2 6 5 1.0e-1 RTHERM3 5 4 1.8e-1 RTHERM4 4 3 2.8e-1 RTHERM5 3 2 4.5e-1 RTHERM6 2 TL 4.6e-1 RTHERM2 CTHERM2 5 SABER Thermal Model RTHERM3 CTHERM3 4 RTHERM4 rtherm.rtherm1 th 6 =3.0e-2 rtherm.rtherm2 6 5 =1.0e-1 rtherm.rtherm3 5 4 =1.8e-1 rtherm.rtherm4 4 3 =2.8e-1 rtherm.rtherm5 3 2 =4.5e-1 rtherm.rtherm6 2 tl =4.6e-1 } CTHERM4 3 RTHERM5 CTHERM5 2 CTHERM6 RTHERM6 tl www.onsemi.com 10 CASE ® SABER thermal model FDB8896T template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =9e-4 ctherm.ctherm2 6 5 =1e-3 ctherm.ctherm3 5 4 =2e-3 ctherm.ctherm4 4 3 =3e-3 ctherm.ctherm5 3 2 =7e-3 ctherm.ctherm6 2 tl =8e-2 FDB8896-F085 N-Channel PowerTrench MOSFET PSPICE Thermal Model ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 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