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FDN337N-F169

FDN337N-F169

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOT-23

  • 描述:

    MOSFET N-CH 30V 2.2A SOT23-3

  • 数据手册
  • 价格&库存
FDN337N-F169 数据手册
FDN337N N-Channel Logic Level Enhancement Mode Field Effect Transistor General Description Features SuperSOTTM-3 N-Channel logic level enhancement mode power field effect transistors are produced using ON Semiconductor's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. These devices are particularly suited for low voltage applications in notebook computers, portable phones, PCMCIA cards, and other battery powered circuits where fast switching, and low in-line power loss are needed in a very small outline surface mount package. SuperSOTTM-8 SuperSOTTM-6 SOT-23 2.2 A, 30 V, RDS(ON) = 0.065 Ω @ VGS = 4.5 V RDS(ON) = 0.082 Ω @ VGS = 2.5 V. Industry standard outline SOT-23 surface mount package using proprietary SuperSOTTM-3 design for superior thermal and electrical capabilities. High density cell design for extremely low RDS(ON). Exceptional on-resistance and maximum DC current capability. SO-8 SOIC-16 SOT-223 D D 3 37 S TM SuperSOT -3 G Absolute Maximum Ratings Symbol Parameter VDSS Drain-Source Voltage VGSS ID PD Maximum Power Dissipation TA = 25oC unless other wise noted FDN337N Units 30 V Gate-Source Voltage - Continuous ±8 V Drain/Output Current - Continuous 2.2 A - Pulsed TJ,TSTG S G 10 (Note 1a) 0.5 (Note 1b) 0.46 Operating and Storage Temperature Range -55 to 150 W °C THERMAL CHARACTERISTICS RθJA Thermal Resistance, Junction-to-Ambient (Note 1a) 250 °C/W RθJC Thermal Resistance, Junction-to-Case (Note 1) 75 °C/W © 1998 Semiconductor Components Industries, LLC. October-2017, Rev. 3 Publication Order Number: FDN337N /D Electrical Characteristics (TA = 25 OC unless otherwise noted ) Symbol Parameter Conditions Min Typ Max Units OFF CHARACTERISTICS BVDSS Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 µA ∆BVDSS/∆TJ Breakdown Voltage Temp. Coefficient ID = 250 µA, Referenced to 25 oC 30 V IDSS Zero Gate Voltage Drain Current VDS = 24 V, VGS = 0 V IGSSF Gate - Body Leakage, Forward VGS = 8 V,VDS = 0 V IGSSR Gate - Body Leakage, Reverse VGS = -8 V, VDS = 0 V -100 nA TJ = 55°C ON CHARACTERISTICS mV/ oC 41 1 µA 10 µA 100 nA (Note) VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 µA ∆VGS(th)/∆TJ Gate Threshold Voltage Temp. Coefficient ID = 250 µA, Referenced to 25 oC 0.4 RDS(ON) Static Drain-Source On-Resistance VGS = 4.5 V, ID = 2.2 A 0.7 1 TJ =125°C VGS = 2.5 V, ID = 2 A V mV/ oC -2.3 0.054 0.065 0.08 0.11 0.07 0.082 10 Ω ID(ON) On-State Drain Current VGS = 4.5 V, VDS = 5 V A gFS Forward Transconductance VDS = 5 V, ID = 2.2 A 13 S VDS = 10 V, VGS = 0 V, f = 1.0 MHz 300 pF 145 pF 35 pF DYNAMIC CHARACTERISTICS Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance SWITCHING CHARACTERISTICS tD(on) Turn - On Delay Time tr Turn - On Rise Time tD(off) Turn - Off Delay Time tf Turn - Off Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd Gate-Drain Charge (Note) VDD = 5 V, ID = 1 A, VGS = 4.5 V, RGEN = 6 Ω VDS = 10 V, ID = 2.2 A, VGS = 4.5 V 4 10 ns 10 18 ns 17 28 ns 4 10 ns 7 9 nC 1.1 nC 1.9 nC DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS IS Maximum Continuous Drain-Source Diode Forward Current VSD Drain-Source Diode Forward Voltage VGS = 0 V, IS = 0.42 A (Note) 0.65 0.42 A 1.2 V Note: 1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design. Typical RθJA using the board layouts shown below on FR-4 PCB in a still air environment : Scale 1 : 1 on letter size paper 2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%. a. 250oC/W when mounted on 0.02 in2 pad of 2oz Cu. a b. 270oC/W when mounted on a 0.001 in2 pad of 2oz Cu. www.onsemi.com 2 Typical Electrical Characteristics VGS = 4.5V 5 2 R DS(ON ) , NORMALIZED DRAIN-SOURCE ON-RESISTANCE I D , DRAIN-SOURCE CURRENT (A) 6 3.0 2.5 2.0 4 3 1.5 2 1 1.8 1.4 2.5 1.2 0 0.3 0.6 0.9 1.2 3.0 3.5 4.5 1 0.8 0 VGS = 2.0V 1.6 1.5 0 1 2 3 4 I D , DRAIN CURRENT (A) VDS , DRAIN-SOURCE VOLTAGE (V) 0.25 R DS(ON) , ON-RESISTANCE (OHM) R DS(ON) , NORMALIZED DRAIN-SOURCE ON-RESISTANCE 1.6 ID = 2.2A VGS = 4.5 V 1.2 1 0.8 0.6 -50 6 Figure 2. On-Resistance Variation with Drain Current and Gate Figure 1. On-Region Characteristics. 1.4 5 I D = 1.1A 0.2 0.15 25°C 0.05 0 -25 0 25 50 75 100 125 125°C 0.1 150 1 2 3 4 5 VGS , GATE TO SOURCE VOLTAGE (V) T , JUNCTION TEMPERATURE (°C) J Figure 3. On-Resistance Variation with Temperature. Figure 4. On-Resistance Variation with Gate-to-Source Voltage. ID , DRAIN CURRENT (A) V DS = 5.0V TJ = -55°C 6 I S , REVERSE DRAIN CURRENT (A) 7 25°C 125°C 5 4 3 2 1 0 0 0.5 V GS 1 1.5 2 , GATE TO SOURCE VOLTAGE (V) 4 2 TJ = 125°C 25°C 0.1 -55°C 0.01 0.001 0.0001 2.5 VGS = 0V 0.5 0 0.2 0.4 0.6 0.8 VSD , BODY DIODE FORWARD VOLTAGE (V) Figure 5. Transfer Characteristics. www.onsemi.com 3 1 Typical Electrical Characteristics (continued) 1000 I D = 2.2A VDS = 5V 4 500 15V 10V CAPACITANCE (pF) VGS , GATE-SOURCE VOLTAGE (V) 5 3 2 Ciss 200 Coss 100 50 1 0 20 0.1 0 2 4 6 f = 1 MHz VGS = 0V Crss 0.2 8 0.5 V DS 1 2 5 10 20 , DRAIN TO SOURCE VOLTAGE (V) Q g , GATE CHARGE (nC) Figure 7. Gate Charge Characteristics. Figure 8. Capacitance Characteristics. 50 20 5 VGS = 4.5V SINGLE PULSE Rθ JA =250 °C/W TA = 25°C 0.03 0.01 0.1 0.5 V 30 20 10 0 0.0001 1 DS ms 1s 10s DC 0.3 0.1 POWER (W) 100 1 SINGLE PULSE R θJA =270° C/W TA = 25°C 40 10m s 2 2 5 10 20 0.001 50 0.01 0.1 1 10 100 300 SINGLE PULSE TIME (SEC) , DRAI N-SOURCE VOLTAGE (V) Figure 10. Single Pulse Maximum Power Dissipation. Figure 9. Maximum Safe Operating Area. 1 r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE I D , DRAIN CURRENT (A) 1m s IT LIM N) S(O RD 10 0.5 D = 0.5 0.2 0.1 0.05 0.02 0.01 0.2 R θJA (t) = r(t) * RθJA R θJA = 270 °C/W 0.1 0.05 0.02 0.01 P(pk) t1 Single Pulse 0.005 Duty Cycle, D = t1 /t2 0.002 0.001 0.0001 t2 TJ - TA = P * RθJA (t) 0.001 0.01 0.1 1 t1 , TIME (sec) Figure 11. Transient Thermal Response Curve. Thermal characterization performed using the conditions described in note 1b. Transient thermal response will change depending on the circuit board design. www.onsemi.com 4 10 100 300 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor 19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: orderlit@onsemi.com ❖ © Semiconductor Components Industries, LLC N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5817−1050 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative www.onsemi.com
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