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HD60N75

HD60N75

  • 厂商:

    HL(豪林)

  • 封装:

    TO252

  • 描述:

    类型:N沟道;漏源电压(Vdss):75V;连续漏极电流(Id):60A;功率(Pd):3.75W;导通电阻(RDS(on)@Vgs,Id):16mΩ@10V,30A;阈值电压(Vgs(th)@Id)...

  • 数据手册
  • 价格&库存
HD60N75 数据手册
BVDSS = 75V RDS(on) = 16 mΩ HD60N75 / HU60N75 ID = 60 A 75V N-Channel MOSFET TO-252 TO-251 FEATURES  Originative New Design HD60N75  Superior Avalanche Rugged Technology  Robust Gate Oxide Technology HU60N75 1.Gate 2. Drain 3. Source  Very Low Intrinsic Capacitances  Excellent Switching Characteristics  Unrivalled Gate Charge : 40 nC (Typ.)  Extended Safe Operating Area  Lower RDS(ON) : 0.016 Ω (Typ.) @V GS=10V  100% Avalanche Tested Absolute Maximum Ratings Symbol TC=25℃ unless otherwise specified Parameter Value Units 75 V VDSS Drain-Source Voltage ID Drain Current – Continuous (TC = 25℃) 60 A Drain Current – Continuous (TC = 100℃) 35.4 A IDM Drain Current – Pulsed 200 A VGS Gate-Source Voltage ±20 V EAS Single Pulsed Avalanche Energy (Note 2) 490 mJ IAR Avalanche Current (Note 1) 60 A EAR Repetitive Avalanche Energy (Note 1) 12 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 7.0 V/ns PD Power Dissipation (TA = 25℃)* 3.75 W Power Dissipation (TC = 25℃) - Derate above 25℃ 120 W 0.8 W/℃ -55 to +150 ℃ 300 ℃ (Note 1) TJ, TSTG Operating and Storage Temperature Range TL Maximum lead temperature for soldering purposes, 1/8” from case for 5 seconds Thermal Resistance Characteristics Typ. Max. RθJC Symbol Junction-to-Case Parameter -- 1.0 RθJA Junction-to-Ambient* -- 40 RθJA Junction-to-Ambient -- 62.5 * When mounted on the minimum pad size recommended (PCB Mount) Units ℃/W HD60N75_HU60N75 Nov 2009 Symbol Parameter unless otherwise specified Test Conditions Min Typ Max Units On Characteristics VGS RDS(ON) Gate Threshold Voltage VDS = VGS, ID = 250 ㎂ 2.0 -- 4.0 V Static Drain-Source On-Resistance VGS = 10 V, ID = 30 A -- 0.013 0.016 Ω VGS = 0 V, ID = 250 ㎂ 60 -- -- V ID = 250 ㎂, Referenced to25℃ -- 0.06 -- V/℃ VDS = 75 V, VGS = 0 V -- -- 1 ㎂ VDS = 48 V, TC = 150℃ -- -- 10 ㎂ Off Characteristics BVDSS Drain-Source Breakdown Voltage ΔBVDSS Breakdown Voltage Temperature /ΔTJ Coefficient IDSS Zero Gate Voltage Drain Current IGSSF Gate-Body Leakage Current, Forward VGS = 20 V, VDS = 0 V -- -- 100 ㎁ IGSSR Gate-Body Leakage Current, Reverse VGS = -20 V, VDS = 0 V -- -- -100 ㎁ -- 1600 2270 ㎊ -- 600 780 ㎊ -- 90 120 ㎊ -- 15 40 ㎱ -- 105 220 ㎱ -- 60 130 ㎱ -- 65 140 ㎱ -- 40 52 nC -- 10 -- nC -- 17 -- nC Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance VDS = 20 V, VGS = 0 V, f = 1.0 MHz Switching Characteristics td(on) Turn-On Time tr Turn-On Rise Time td(off) Turn-Off Delay Time tf Turn-Off Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd VDS = 30 V, ID = 60 A, RG = 25 Ω (Note 4,5) VDS = 48 V, ID = 60 A, VGS = 10 V (Note 4,5) Gate-Drain Charge Source-Drain Diode Maximum Ratings and Characteristics IS Continuous Source-Drain Diode Forward Current -- -- 60 ISM Pulsed Source-Drain Diode Forward Current -- -- 200 VSD Source-Drain Diode Forward Voltage IS = 60 A, VGS = 0 V -- -- 1.6 V trr Reverse Recovery Time -- 52 -- ㎱ Qrr Reverse Recovery Charge IS = 60 A, VGS = 0 V diF/dt = 100 A/μs (Note 4) -- 75 -- μC Notes ; 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L=230μH, IAS=50A, VDD=25V, RG=25, Starting TJ =25C 3. ISD≤50A, di/dt≤300A/μs, VDD≤BVDSS , Starting TJ =25 C 4. Pulse Test : Pulse Width ≤ 300μs, Duty Cycle ≤ 2% 5. Essentially Independent of Operating Temperature A HD60N75_HU60N75 Electrical Characteristics TC=25 C HD60N75_HU60N75 ID, Drain Current [A] ID, Drain Current [A] Typical Characteristics VGS, Gate-Source Voltage [V] VDS, Drain-Source Voltage [V] Figure 1. On Region Characteristics RDS(ON)[Ω], Drain-Source On-Resistance IDR, Reverse Drain Current [A] Figure 2. Transfer Characteristics ID, Drain Current [A] VSD, Source-Drain Voltage [V] Figure 4. Body Diode Forward Voltage Variation with Source Current and Temperature Figure 3. On Resistance Variation vs Drain Current and Gate Voltage 3000 Ciss 2000 Coss 1500 ※ Note ; 1. VGS = 0 V 2. f = 1 MHz 1000 Crss 500 VGS, Gate-Source Voltage [V] 2500 Capacitances [pF] 12 Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd VDS = 30V 10 VDS = 48V 8 6 4 2 ※ Note : ID = 50 A 0 -1 10 0 10 1 10 0 0 10 20 30 40 VDS, Drain-Source Voltage [V] QG, Total Gate Charge [nC] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics 50 HD60N75_HU60N75 Typical Characteristics (continued) 2.5 RDS(ON), (Normalized) 1.0 * Note : 1. VGS = 0 V 0.9 Drain-Source On-Resistance 1.1 2.0 1.5 1.0  Note : 0.5 1. VGS = 10 V 2. ID = 25 A 2. ID = 250 A 0.0 -100 0.8 -100 -50 0 50 100 150 -50 0 200 50 100 150 200 o TJ, Junction Temperature [ C] o TJ, Junction Temperature [ C] Figure 8. On-Resistance Variation vs Temperature Figure 7. Breakdown Voltage Variation vs Temperature 60 3 10 Operation in This Area is Limited by R DS(on) ID, Drain Current [A] 50 100 s 2 10 1 ms 10 ms DC 1 10 * Notes : o 1. TC = 25 C 40 30 20 10 o 2. TJ = 175 C 3. Single Pulse 0 25 0 10 -1 0 10 1 10 2 10 10 50 75 100 125 Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs Case Temperature 0 10 D=0.5 * Notes : o 1. ZJC(t) = 1.24 C/W Max. 0.2 2. Duty Factor, D=t1/t2 0.1 3. TJM - TC = PDM * ZJC(t) -1 10 0.05 PDM 0.02 0.01 t1 single pulse -2 10 -5 10 -4 10 150 o TC, Case Temperature [ c] VDS, Drain-Source Voltage [V] Zθ JC(t), Thermal Response ID, Drain Current [A] BVDSS, (Normalized) Drain-Source Breakdown Voltage 1.2 -3 10 -2 10 -1 10 t2 0 10 t1, Square Wave Pulse Duration [sec] Figure 11. Transient Thermal Response Curve 1 10 175 HD60N75_HU60N75 Fig 12. Gate Charge Test Circuit & Waveform 50KΩ 12V VGS Same Type as DUT 200nF Qg 10V 300nF VDS VGS Qgs Qgd DUT 3mA Charge Fig 13. Resistive Switching Test Circuit & Waveforms RL VDS VDS 90% VDD RG ( 0.5 rated VDS ) Vin DUT 10V 10% td(on) tr td(off) t on t off tf Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD L VDS VDD ID BVDSS IAS RG 10V ID (t) DUT VDS (t) VDD tp Time HD60N75_HU60N75 Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + VDS _ IS L Driver RG VGS VGS ( Driver ) Same Type as DUT VDD • dv/dt controlled by RG • IS controlled by pulse period Gate Pulse Width D = -------------------------Gate Pulse Period 10V IFM , Body Diode Forward Current IS ( DUT ) di/dt IRM Body Diode Reverse Current VDS ( DUT ) Body Diode Recovery dv/dt Vf Body Diode Forward Voltage Drop VDD HD60N75_HU60N75 Package Dimension TO TO-252 2.3±0.1 6.6±0.2 1.2±0.3 9.7+0.5 -0.3 2.7±0.3 0.5±0.05 5.6±0.2 1±0.2 5.35±0.15 1.2±0.3 0.05+0.1 -0.05 0.8±0.2 0.6±0.2 2.3typ 2 3typ 2.3typ 0.5+0.1 -0.05 HD60N75_HU60N75 Package Dimension TO TO-251 6.6±0.2 2.3±0.1 0.8±0.15 0.6±0.1 2.3typ 2 3typ 2.3typ 7.8±0 ±0.4 ± 0.3 7.5 0.75±0.15 7±0.2 0.5±0.05 5.6±0.2 5.35±0.15 0.5+0.1 -0.05 1.2±0.3
HD60N75 价格&库存

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