APT200GN60B2G
600V, VCE(ON) = 1.45V Typical
Field Stop IGBT
Utilizing the latest Field Stop and Trench Gate technologies, these IGBT’s have ultra low VCE(ON) and
are ideal for low frequency applications that require absolute minimum conduction loss. Easy paralleling
is a result of very tight parameter distribution and a slightly positive VCE(ON) temperature coefficient. A
built-in gate resistor ensures extremely reliable operation, even in the event of a short circuit fault. Low
gate charge simplifies gate drive design and minimizes losses.
• 1200V Field Stop
• Trench Gate: Low VCE(ON)
• Easy Paralleling
• Integrated Gate Resistor :Low EMI, High Reliability
• RoHS Compliant
Applications: Welding, Inductive Heating, Solar Inverters, SMPS, Motor drives, UPS
All Ratings: TC = 25°C unless otherwise specified.
Maximum Ratings
Symbol Parameter
Ratings
VCES
Collector-Emitter Voltage
600
VGE
Gate-Emitter Voltage
±20
IC1
Continuous Collector Current @ TC = 25°C
283
IC2
Continuous Collector Current @ TC = 110°C
158
ICM
SSOA
PD
TJ, TSTG
TL
Pulsed Collector Current
1
Unit
Volts
Amps
600
Switching Safe Operating Area @ TJ = 175°C
600A @ 600V
Total Power Dissipation
682
Operating and Storage Junction Temperature Range
Watts
-55 to 175
Max. Lead Temp. for Soldering: 0.063” from Case for 10 Sec.
°C
300
Static Electrical Characteristics
Min
Typ
Max
Unit
V(BR)CES
Collector-Emitter Breakdown Voltage (VGE = 0V, IC = 4mA)
600
-
-
VGE(TH)
Gate Threshold Voltage (VCE = VGE, IC = 3.2mA, Tj = 25°C)
5.0
5.8
6.5
Collector Emitter On Voltage (VGE = 15V, IC = 200A, Tj = 25°C)
1.05
1.45
1.85
Collector Emitter On Voltage (VGE = 15V, IC = 200A, Tj = 125°C)
-
1.65
-
Collector Cut-off Current (VCE = 600V, VGE = 0V, Tj = 25°C) 2
-
-
25
Collector Cut-off Current (VCE = 600V, VGE = 0V, Tj = 125°C) 2
-
-
1000
Gate-Emitter Leakage Current (VGE = ±20V)
-
-
600
nA
Integrated Gate Resistor
-
2
-
Ω
VCE(ON)
ICES
IGES
RG(int)
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.
Microsemi Website - http://www.microsemi.com
Volts
μA
050-7628 Rev A 9-2008
Symbol Characteristic / Test Conditions
Dynamic Characteristics
Symbol
APT200GN60B2G
Characteristic
Test Conditions
Cies
Input Capacitance
Coes
Output Capacitance
Cres
Reverse Transfer Capacitance
VGEP
Gate-to-Emitter Plateau Voltage
VGE = 0V, VCE = 25V
f = 1MHz
Gate Charge
Min
Typ
Max
-
14100
-
-
461
-
-
393
-
-
8.2
-
Qg
Total Gate Charge
VGE = 15V
-
1180
-
Qge
Gate-Emitter Charge
VCE= 300V
-
85
-
Gate-Collector Charge
IC = 100A
-
660
-
Qgc
SSOA
td(on)
tr
td(off)
tf
Eon1
Switching Safe Operating Area
TJ = 150°C, RG = 1.0Ω , VGE = 15V,
L = 100μH, VCE= 600V
Turn-On Delay Time
-
50
-
Inductive Switching (25°C)
-
80
-
Turn-Off Delay Time
VCC = 400V
560
-
Current Fall Time
VGE = 15V
-
100
-
RG = 1.0Ω
-
13
-
TJ = +25°C
-
15
-
Current Rise Time
IC = 200A
Eon2
Turn-On Switching Energy
Eoff
Turn-Off Switching Energy 6
-
11
-
td(on)
Turn-On Delay Time
-
50
-
Inductive Switching (125°C)
-
80
-
Turn-Off Delay Time
VCC = 400V
-
620
-
Current Fall Time
VGE = 15V
-
70
-
Turn-On Switching Energy
4
IC = 200A
14
-
Turn-On Switching Energy
RG = 1.0Ω
-
5
-
16
-
Turn-Off Switching Energy
6
-
10
-
Eon1
Eon2
Eoff
nC
A
5
tf
V
600
Turn-On Switching Energy
td(off)
pF
7
4
tr
Unit
Current Rise Time
TJ = +125°C
ns
mJ
ns
mJ
Thermal and Mechanical Characteristics
Symbol Characteristic / Test Conditions
R
R
θJC
θJC
WT
Min
Typ
Max
Unit
Junction to Case (IGBT)
-
-
0.13
°C/W
Junction to Case (DIODE)
-
-
N/A
Package Weight
-
6.1
-
1 Repetitive Rating: Pulse width limited by maximum junction temperature.
2 For Combi devices, Ices includes both IGBT and FRED leakages
3 See MIL-STD-750 Method 3471.
4 Eon1 is the clamped inductive turn-on energy of the IGBT only, without the effect of a commutating diode reverse recovery current adding to
the IGBT turn-on loss. Tested in inductive switching test circuit shown in figure 21, but with a Silicon Carbide diode.
5 Eon2 is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching
loss. (See Figures 21, 22.)
6 Eoff is the clamped inductive turn-off energy measured in accordance with JEDEC standard JESD24-1. (See Figures 21, 23.)
7 RG is external gate resistance not including gate driver impedance.
050-7628 Rev A 9-2008
Microsemi reserves the right to change, without notice, the specifications and information contained herein.
gm
Typical Performance Curves
APT200GN60B2G
400
450
GE
= 15V
IC, COLLECTOR CURRENT (A)
IC, COLLECTOR CURRENT (A)
300
250
TJ= 25°C
200
TJ= 125°C
150
TJ= 150°C
100
TJ= 55°C
50
0
0.5
1
1.5
2
2.5
3
VCE, COLLECTOR-TO-EMITTER VOLTAGE (V)
FIGURE 1, Output Characteristics (TJ = 25°C)
250μs PULSE
TEST
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