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LTC1417AIGN#TRPBF

LTC1417AIGN#TRPBF

  • 厂商:

    AD(亚德诺)

  • 封装:

    SSOP16

  • 描述:

    IC ADC 14BIT SAR 16SSOP

  • 数据手册
  • 价格&库存
LTC1417AIGN#TRPBF 数据手册
LTC1417 Low Power 14-Bit, 400ksps Sampling ADC Converter with Serial I/O U FEATURES ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ DESCRIPTIO The LTC ®1417 is a low power, 400ksps, 14-bit A/D converter. This versatile device can operate from a single 5V or ±5V supplies. An onboard high performance sample-andhold, a precision reference and internal trimming minimize external circuitry requirements. The low 20mW power dissipation is made even more attractive with two userselectable power shutdown modes. 16-Pin Narrow SSOP Package (SO-8 Footprint) Sample Rate: 400ksps ±1.25LSB INL and ±1LSB DNL Max Power Dissipation: 20mW (Typ) Single Supply 5V or ±5V Operation Serial Data Output No Missing Codes Over Temperature Power Shutdown: Nap and Sleep External or Internal Reference Differential High Impedance Analog Input Input Range: 0V to 4.096V or ±2.048V 81dB S/(N + D) and – 95dB THD at Nyquist The LTC1417 converts 0V to 4.096V unipolar inputs when using a 5V supply and ±2.048V bipolar inputs when using ±5V supplies. DC specs include ±1.25LSB INL, ±1LSB DNL and no missing codes over temperature. Outstanding AC performance includes 81dB S/(N + D) and – 95dB THD at a Nyquist input frequency of 200kHz. U APPLICATIO S ■ ■ ■ ■ High Speed Data Acquisition Digital Signal Processing Isolated Data Acquisition Systems Audio and Telecom Processing Spectrum Instrumentation , LTC and LT are registered trademarks of Linear Technology Corporation. W ■ The internal clock is trimmed for 2µs maximum conversion time. A separate convert start input and a data ready signal (BUSY) ease connections to FIFOs, DSPs and microprocessors. U EQUIVALE T BLOCK DIAGRA A 400kHz, 14-Bit Sampling A/D Converter in a Narrow 16-Lead SSOP Package 5V Effective Bits and Signal-to-(Noise + Distortion) vs Input Frequency 10µF 16 VDD 14 LTC1417 REFCOMP 2 4 S/H 14-BIT ADC 6 14 SERIAL PORT 4.096V 7 8 9 EXTCLKIN SCLK CLKOUT DOUT BUFFER 10µF VREF 12 3 8k 2.5V REFERENCE TIMING AND LOGIC 1µF 14 BUSY 12 RD 13 CONVST 11 SHDN 1417 TA01 5 AGND 15 VSS 10 (0V OR – 5V) DGND 74 68 10 62 8 6 S/(N + D) (dB) AIN– 80 1 EFFECTIVE BITS AIN+ 86 4 2 1k 10k 100k INPUT FREQUENCY (Hz) 1M 1417 TA02 sn1417 1417fas 1 LTC1417 U U RATI GS W W W W AXI U PACKAGE/ORDER I FOR ATIO (Notes 1, 2) Positive Supply Voltage (VDD) .................................. 6V Negative Supply Voltage (VSS) Bipolar Operation Only .......................... – 6V to GND Total Supply Voltage (VDD to VSS) Bipolar Operation Only ....................................... 12V Analog Input Voltage (Note 3) Unipolar Operation .................. – 0.3V to (VDD + 0.3V) Bipolar Operation............ (VSS – 0.3) to (VDD + 0.3V) Digital Input Voltage (Note 4) Unipolar Operation ............................... – 0.3V to 10V Bipolar Operation.........................(VSS – 0.3V) to 10V Digital Output Voltage Unipolar Operation ................... – 0.3 to (VDD + 0.3V) Bipolar Operation........... (VSS – 0.3V) to (VDD + 0.3V) Power Dissipation ............................................. 500mW Operating Temperature Range LTC1417AC/LTC1417C ........................... 0°C to 70°C LTC1417AI/LTC1417I ......................... – 40°C to 85°C Storage Temperature Range ................ – 65°C to 150°C Lead Temperature (Soldering, 10 sec)................. 300°C U ABSOLUTE ORDER PART NUMBER TOP VIEW AIN+ 1 16 VDD AIN– 2 15 VSS VREF 3 14 BUSY REFCOMP 4 13 CONVST AGND 5 12 RD EXTCLKIN 6 11 SHDN SCLK 7 10 DGND CLKOUT 8 9 LTC1417ACGN LTC1417CGN LTC1417AIGN LTC1417IGN GN PART MARKING DOUT 1417A 1417 1417AI 1417I GN PACKAGE 16-LEAD (NARROW) PLASTIC SSOP TJMAX = 110°C, θJA = 95°C/W Consult LTC Marketing for parts specified with wider operating temperature ranges. U CO VERTER CHARACTERISTICS The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. Specifications are measured while using the internal reference unless otherwise noted. (Notes 5, 6) PARAMETER CONDITIONS MIN LTC1417 TYP MAX LTC1417A MIN TYP MAX UNITS Resolution ● 14 14 Bits No Missing Codes ● 13 14 Bits Integral Linearity Error (Note 7) Differential Linearity Error Transition Noise ● ±0.8 ±0.5 ±1.25 LSB ● ±0.7 ±1.5 ±0.35 LSB 0.33 0.33 (Note 12) ±2 ±1 LSBRMS Offset Error External Reference (Note 8) ±5 ±20 ±2 ±10 LSB Full-Scale Error Internal Reference External Reference = 2.5V ±15 ±5 ±60 ±30 ±15 ±5 ±60 ±15 LSB LSB Full-Scale Tempco IOUT(REF) = 0, Internal Reference, 0°C ≤ TA ≤ 70°C IOUT(REF) = 0, Internal Reference, – 40°C ≤ TA ≤ 85°C IOUT(REF) = 0, External Reference ±15 ● ±10 ±20 ±1 ±5 ppm/°C ppm/°C ppm/°C U U A ALOG I PUT The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) SYMBOL PARAMETER CONDITIONS VIN Analog Input Range (Note 9) 4.75V ≤ VDD ≤ 5.25V (Unipolar) 4.75V ≤ VDD ≤ 5.25V, – 5.25V ≤ VSS ≤ – 4.75V (Bipolar) ● ● IIN Analog Input Leakage Current CONVST = High ● 2 MIN TYP MAX 0 to 4.096 ±2.048 UNITS V V ±1 µA sn1417 1417fas LTC1417 U U A ALOG I PUT The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) SYMBOL PARAMETER CONDITIONS CIN Analog Input Capacitance Between Conversions (Sample Mode) During Conversions (Hold Mode) tACQ Sample-and-Hold Acquisition Time tAP Sample-and-Hold Aperture Time tjitter Sample-and-Hold Aperture Time Jitter CMRR Analog Input Common Mode Rejection Ratio MIN TYP MAX UNITS 14 3 150 ● pF pF 500 ns –1.5 0V < (AIN+ = AIN–) < 4.096V (Unipolar) – 2.048V < (AIN+ = AIN–) < 2.048V (Bipolar) ns 5 psRMS 65 65 dB dB W U DY A IC ACCURACY The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) SYMBOL PARAMETER CONDITIONS MIN S/(N + D) Signal-to-(Noise + Distortion) Ratio 100kHz Input Signal 79 81 dB THD Total Harmonic Distortion 100kHz Input Signal, First Five Harmonics – 85 – 95 dB SFDR Spurious Free Dynamic Range 200kHz Input Signal – 98 dB IMD Intermodulation Distortion fIN1 = 97.3kHz, fIN2 = 104.6kHz – 97 Full Power Bandwidth S/(N + D) ≥ 77dB Full Linear Bandwidth TYP MAX UNITS dB 10 MHz 0.8 MHz U U U I TER AL REFERE CE CHARACTERISTICS The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) PARAMETER CONDITIONS VREF Output Voltage IOUT = 0 VREF Output Tempco IOUT = 0, 0°C ≤ TA ≤ 70°C IOUT = 0, – 40°C ≤ TA ≤ 85°C ±10 ±20 ppm/°C ppm/°C VREF Line Regulation 4.75V ≤ VDD ≤ 5.25V – 5.25V ≤ VSS ≤ – 4.75V 0.05 0.05 LSB/V LSB/V VREF Output Resistance 0.1mA ≤ |IOUT| ≤ 0.1mA 8 ● MIN TYP MAX UNITS 2.480 2.500 2.520 V kΩ U U DIGITAL I PUTS A D DIGITAL OUTPUTS The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS VIH High Level Input Voltage VDD = 5.25V ● VIL Low Level Input Voltage VDD = 4.75V ● 0.8 V IIN Digital Input Current VIN = 0V to VDD ● ±10 µA CIN Digital Input Capacitance VOH High Level Output Voltage VOL Low Level Output Voltage VDD = 4.75V, IO = – 10µA VDD = 4.75V, IO = – 200µA ● VDD = 4.75V, IO = 160µA VDD = 4.75V, IO = – 1.6mA ● 2.4 V 1.4 pF 4.74 V V 4.0 0.05 0.10 0.4 V V IOZ High-Z Output Leakage DOUT, CLKOUT VOUT = 0V to VDD, RD High ● ±10 µA COZ High-Z Output Capacitance DOUT, CLKOUT RD High (Note 9) ● 15 pF ISOURCE Output Source Current VOUT = 0V – 10 mA ISINK Output Sink Current VOUT = VDD 10 mA sn1417 1417fas 3 LTC1417 U W POWER REQUIRE E TS The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) SYMBOL PARAMETER CONDITIONS MIN TYP UNITS 5.25 V VDD Positive Supply Voltage (Notes 10, 11) VSS Negative Supply Voltage (Note 10) Bipolar Only (VSS = 0V for Unipolar) IDD Positive Supply Current Unipolar, RD High (Note 5) Bipolar, RD High (Note 5) SHDN = 0V, RD = 0V SHDN = 0V, RD = 5V ● ● 4.0 4.3 750 0.1 5.5 6.0 mA mA µA µA Nap Mode Sleep Mode 4.75 MAX – 4.75 – 5.25 V ISS Negative Supply Current Nap Mode Sleep Mode Bipolar, RD High (Note 5) SHDN = 0V, RD = 0V SHDN = 0V, RD = 5V ● 2.0 0.7 1.5 2.8 mA µA nA PDIS Power Dissipation Unipolar Bipolar ● ● 20.0 31.5 27.5 44 mW mW WU TI I G CHARACTERISTICS The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) SYMBOL PARAMETER fSAMPLE(MAX) Maximum Sampling Frequency CONDITIONS ● MIN TYP MAX tCONV Conversion Time ● 1.8 2.25 µs tACQ Acquisition Time ● 150 500 ns tACQ + tCONV Acquisition Plus Conversion Time ● 2.1 2.5 µs t1 SHDN↑ to CONVST↓ Wake-Up Time from Nap Mode (Note 10) t2 CONVST Low Time (Notes 10, 11) ● t3 CONVST to BUSY Delay CL = 25pF ● t4 Data Ready Before BUSY↑ CL = 25pF ● 7 t5 Delay Between Conversions (Note 10) ● 250 ns t6 Wait Time RD↓ After BUSY↑ ● –5 ns t7 Data Access Time After RD↓ 400 kHz 500 ns 40 ns 35 CL = 25pF UNITS 70 12 ns ns 15 30 40 ns ns 20 ● 40 55 ns ns 35 ns ● CL = 100pF t8 Bus Relinquish Time ● t9 RD Low Time ● t7 ns t10 CONVST High Time ● 40 ns t11 Delay Time, SCLK↓ to DOUT Valid CL = 25pF ● t12 Time from Previous Data Remain Valid After SCLK↓ CL = 25pF ● 5 fSCLK Shift Clock Frequency (Note 13) ● 0 fEXTCLKIN External Conversion Clock Frequency ● 0.05 tdEXTCLKIN Delay Time, CONVST↓ to External Conversion Clock Input (Note 9) ● 15 40 10 ns ns 20 MHz 9 MHz 20 µs sn1417 1417fas 4 LTC1417 WU TI I G CHARACTERISTICS The ● indicates specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) SYMBOL PARAMETER CONDITIONS MIN tH SCLK SCLK High Time (Note 9) ● 10 ns tL SCLK SCLK Low Time (Note 9) ● 10 ns tH EXTCLKIN EXTCLKIN High Time ● 0.04 tL EXTCLKIN EXTCLKIN Low Time ● 0.04 fCLKOUT Conversion Clock Output Frequency Note 1: Absolute Maximum Ratings are those values beyond which the life of a device may be impaired. Note 2: All voltage values are with respect to ground with DGND and AGND wired together (unless otherwise noted). Note 3: When these pin voltages are taken below VSS or above VDD, they will be clamped by internal diodes. This product can handle input currents greater than 100mA without latchup if the pin is driven below VSS (ground for unipolar mode) or above VDD. Note 4: When these pin voltages are taken below VSS they will be clamped by internal diodes. This product can handle input currents greater than 100mA below VSS without latchup. These pins are not clamped to VDD. Note 5: VDD = 5V, VSS = – 5V, fSAMPLE = 400kHz, tr = tf = 5ns unless otherwise specified. Note 6: Linearity, offset and full-scale specifications apply for a singleended AIN+ input with AIN– grounded. U W SIGNAL/(NOISE + DISTORTION) (dB) DNL ERROR (LSBs) INL (LSBs) 0 – 0.5 –1.0 –1.0 0 4096 8192 12288 16384 OUTPUT CODE 1417 G01 MHz fEXTCLKIN MHz 90 0.5 –0.5 µs 20 9.4 S/(N + D) vs Input Frequency and Amplitude 1.0 0.5 µs (TA = 25°C, unless otherwise specified) Differential Nonlinearity vs Output Code 1.0 UNITS Note 7: Integral nonlinearity is defined as the deviation of a code from a straight line passing through the actual endpoints of the transfer curve. The deviation is measured from the center of the quantization band. Note 8: Bipolar offset is the offset voltage measured from – 0.5LSB when the output code flickers between 0000 0000 0000 00 and 1111 1111 1111 11. Note 9: Guaranteed by design, not subject to test. Note 10: Recommended operating conditions. Note 11: The falling CONVST edge starts a conversion. If CONVST returns high at a critical point during the conversion it can create small errors. For best results ensure that CONVST returns high either within 625ns after conversion start or after BUSY rises. Note 12: Typical RMS noise at the code transitions. See Figure 2 for histogram. Note 13: t11 of 40ns maximum allows fSCLK up to 10MHz for rising capture with 50% duty cycle. fSCLK up to 20MHz for falling capture with 5ns setup time. TYPICAL PERFOR A CE CHARACTERISTICS Typical INL Curve MAX 20 Internal Conversion Clock Mode (EXTCLKIN = 5V) External Conversion Clock Mode (EXTCLKIN is Driven by an External Conversion Clock Input) 0 TYP 80 VIN = 0dB 70 60 VIN = –20dB 50 40 30 VIN = –60dB 20 10 0 0 4096 12288 8192 OUTPUT CODE 16384 1417 G02 1k 100k 10k INPUT FREQUENCY (Hz) 1M 1417 G03 sn1417 1417fas 5 LTC1417 U W TYPICAL PERFOR A CE CHARACTERISTICS (TA = 25°C, unless otherwise specified) Signal-to-Noise Ratio vs Input Frequency 70 60 50 40 30 20 10 0 10k 100k INPUT FREQUENCY (Hz) – 20 – 40 – 60 – 80 THD –100 3RD –120 1M 2ND 1 –80 –100 1k 200 Intermodulation Distortion Plot 0 –40 – 40 –60 –80 –120 –100 –120 0 50 VDD DGND 120 Input Offset Voltage Shift vs Source Resistance 10 60 50 40 30 20 10 10M 1417 G10 9 8 7 6 5 4 3 2 1 0 0 10k 100k 1M RIPPLE FREQUENCY (Hz) 20 40 60 80 100 120 140 160 180 200 FREQUENCY (kHz) 1417 G09 CHANGE IN OFFSET VOTLAGE (LSB) COMMON MODE REJECTION (dB) 80 1k 0 200 100 150 FREQUENCY (kHz) 70 60 100 – 80 1417 G08 0 VSS – 60 Input Common Mode Rejection vs Input Frequency 40 1M 1417 G06 fSAMPLE = 400kHz fIN1 = 97.303466kHz – 20 fIN2 = 104.632568kHz VIN = 4.096VP-P Power Supply Feedthrough vs Ripple Frequency VRIPPLE = 60mV fSAMPLE = 400kHz 20 fIN = 200kHz 10k 100k INPUT FREQUENCY (Hz) fSAMPLE = 400kHz fIN = 197.949188kHz –20 SFDR = –98dB SINAD = 81.1dB 1417 G07 FEEDTHROUGH (dB) –120 –100 100 150 FREQUENCY (kHz) –100 AMPLITUDE (dB) AMPLITUDE (dB) AMPLITUDE (dB) –60 50 –80 0 fSAMPLE = 400kHz fIN = 10.05859375kHz SFDR = –97.44dB SINAD = 81.71dB 0 –60 Nonaveraged, 4096 Point FFT, Input Frequency = 200kHz –40 –120 –40 1417 G05 Nonaveraged, 4096 Point FFT, Input Frequency = 10kHz –20 –20 1000 10 100 INPUT FREQUENCY (kHz) 1417 G04 0 SPURIOUS FREE DYNAMIC RANGE (dB) SIGNAL-TO-NOISE RATIO (dB) 80 0 0 AMPLITUDE (dB BELOW THE FUNDAMENTAL) 90 1k Spurious-Free Dynamic Range vs Input Frequency Distortion vs Input Frequency 1 100 10 INPUT FREQUENCY (kHz) 1000 1417 G11 1 100 1k 10k 100k 10 INPUT SOURCE RESISTANCE (Ω) 1M 1417 G12 sn1417 1417fas 6 LTC1417 U W TYPICAL PERFOR A CE CHARACTERISTICS (TA = 25°C, unless otherwise specified) VDD Supply Current vs Temperature (Bipolar Mode) 3.0 5 5 2.5 4 3 2 1 VSS SUPPLY CURRENT (mA) 6 0 –75 –50 –25 4 3 2 1 0 –75 –50 –25 0 25 50 75 100 125 150 TEMPERATURE (°C) 4.0 4.0 2.0 1.5 1.0 0 25 50 75 100 125 150 TEMPERATURE (°C) VSS Supply Current vs Sampling Frequency (Bipolar Mode) 2.5 3.5 3.0 2.5 2.0 1.5 1.0 2.0 1.5 1.0 0.5 0.5 0.5 0 0.5 1417 G15 VSS SUPPLY CURRENT (mA) 4.5 VDD SUPPLY CURRENT (mA) 5.0 4.5 2.5 1.0 VDD Supply Current vs Sampling Frequency (Bipolar Mode) 5.0 3.0 1.5 1417 G14 VDD Supply Current vs Sampling Frequency (Unipolar Mode) 3.5 2.0 0 –75 –50 –25 0 25 50 75 100 125 150 TEMPERATURE (°C) 1417 G13 VDD SUPPLY CURRENT (mA) VSS Supply Current vs Temperature (Bipolar Mode) 6 VDD SUPPLY CURRENT (mA) VDD SUPPLY CURRENT (mA) VDD Supply Current vs Temperature (Unipolar Mode) 0 0 50 100 150 200 250 300 350 400 450 500 SAMPLING FREQUENCY (kHz) 0 50 100 150 200 250 300 350 400 450 500 SAMPLING FREQUENCY (kHz) 1417 G16 1417 G17 0 0 50 100 150 200 250 300 350 400 450 500 SAMPLING FREQUENCY (kHz) 1417 G18 U U U PIN FUNCTIONS AIN+ (Pin 1): Positive Analog Input. AIN– (Pin 2): Negative Analog Input. VREF (Pin 3): 2.50V Reference Output. Bypass to AGND with 1µF. REFCOMP (Pin 4): 4.096V Reference Output. Bypass to AGND using 10µF tantalum in parallel with 0.1µF ceramic. AGND (Pin 5): Analog Ground. EXTCLKIN (Pin 6): External Conversion Clock Input. A 5V input will enable the internal conversion clock. SCLK (Pin 7): Data Clock Input. CLKOUT (Pin 8): Conversion Clock Output. DOUT (Pin 9): Serial Data Output. DGND (Pin 10): Digital Ground. SHDN (Pin 11): Power Shutdown Input. Low selects shutdown. Shutdown mode selected by RD. RD = 0V for Nap mode and RD = 5V for Sleep mode. RD (Pin 12): Read Input. This enables the output drivers. RD also sets the shutdown mode when SHDN goes low. RD and SHDN low selects the quick wake-up Nap mode, RD high and SHDN low selects Sleep mode. sn1417 1417fas 7 LTC1417 U U U PIN FUNCTIONS CONVST (Pin 13): Conversion Start Signal. This active low signal starts a conversion on its falling edge. BUSY (Pin 14): The BUSY output shows the converter status. It is low when a conversion is in progress. VSS (Pin 15): Negative Supply, –5V for Bipolar Operation. Bypass to AGND using 10µF tantalum in parallel with 0.1µF ceramic. Analog ground for unipolar operation. VDD (Pin 16): 5V Positive Supply. Bypass to AGND with 10µF tantalum in parallel with 0.1µF ceramic. TEST CIRCUITS Load Circuits for Access Timing Load Circuits for Output Float Delay 5V 5V 1k 1k DOUT DOUT DOUT 1k CL DOUT DGND 30pF 1k CL 30pF DGND A) HI-Z TO VOH AND VOL TO VOH A) VOH TO HI-Z B) HI-Z TO VOL AND VOH TO VOL B) VOL TO HI-Z 1417 TC02 1417 TC01 W FUNCTIONAL BLOCK DIAGRA U U CSAMPLE AIN+ 1 16 CSAMPLE AIN– VREF 15 2 3 8k ZEROING SWITCHES 2.5V REF VDD VSS (0V FOR UNIPOLAR MODE –5V FOR BIPOLAR MODE) + REF AMP COMP 14-BIT CAPACITIVE DAC – REFCOMP (4.096V) AGND DGND 4 5 10 14 SUCCESSIVE APPROXIMATION REGISTER 9 SHIFT REGISTER 7 INTERNAL CLOCK MUX 6 EXTCLKIN DOUT SCLK CONTROL LOGIC 11 SHDN 13 CONVST 12 RD 8 14 1417 BD CLKOUT BUSY sn1417 1417fas 8 LTC1417 U U W U APPLICATIONS INFORMATION The LTC1417 uses a successive approximation algorithm and an internal sample-and-hold circuit to convert an analog signal to a 14-bit serial output. The ADC is complete with a precision reference and an internal clock. The control logic provides easy interface to microprocessors and DSPs (please refer to Digital Interface section for the data format). Conversion start is controlled by the CONVST input. At the start of the conversion, the successive approximation register (SAR) is reset. Once a conversion cycle has begun, it cannot be restarted. During the conversion, the internal differential 14-bit capacitive DAC output is sequenced by the SAR from the most significant bit (MSB) to the least significant bit (LSB). Referring to Figure 1, the AIN+ and AIN– inputs are connected to the sample-and-hold capacitors (CSAMPLE) during the acquire phase and the comparator offset is nulled by the zeroing switches. In this acquire phase, a minimum delay of 500ns will provide enough time for the sampleand-hold capacitors to acquire the analog signal. During the convert phase, the comparator zeroing switches open, placing the comparator in compare mode. The input switches connect the CSAMPLE capacitors to ground, transferring the differential analog input charge onto the summing junction. This input charge is successively compared with the binary weighted charges supplied by the differential capacitive DAC. Bit decisions are made by the high speed comparator. At the end of a conversion, the differential DAC output balances the AIN+ and AIN– input charges. The SAR contents (a 14-bit data word) that represent the difference of AIN+ and AIN– are output through the serial pin DOUT. DC Performance One way of measuring the transition noise associated with a high resolution ADC is to use a technique where a DC signal is applied to the input of the ADC and the resulting output codes are collected over a large number of conversions. For example in Figure 2, the distribution of output code is shown for a DC input that has been digitized 4096 times. The distribution is Gaussian and the RMS code transition is about 0.33LSB. 4000 3500 3000 2500 COUNTS CONVERSION DETAILS 2000 1500 1000 500 AIN+ AIN– CSAMPLE SAMPLE + 0 –1 0 1 2 1417 F02 CSAMPLE– SAMPLE –2 CODE ZEROING SWITCHES HOLD HOLD Figure 2. Histogram for 4096 Conversions HOLD HOLD DYNAMIC PERFORMANCE CDAC+ + CDAC– VDAC+ COMP – VDAC– 14 SAR SHIFT REGISTER DOUT 1417 F01 Figure 1. Simplified Block Diagram The LTC1417 has excellent high speed sampling capability. FFT (Fast Fourier Transform) test techniques are used to test the ADC’s frequency response, distortion and noise performance at the rated throughput. By applying a low distortion sine wave and analyzing the digital output using an FFT algorithm, the ADC’s spectral content can be examined for frequencies beyond the fundamental. Figure 3 shows a typical LTC1417 FFT plot. sn1417 1417fas 9 LTC1417 U W U U APPLICATIONS INFORMATION 0 fSAMPLE = 400kHz fIN = 10.05859375kHz SFDR = –97.44dB SINAD = 81.71dB AMPLITUDE (dB) –20 –40 –60 The effective number of bits (ENOBs) is a measurement of the resolution of an ADC and is directly related to the S/(N + D) by the equation: ENOB (N) = [S/(N + D) – 1.76]/6.02 –80 –100 –120 Effective Number of Bits 0 50 100 150 FREQUENCY (kHz) 200 where N is the effective number of bits of resolution and S/(N + D) is expressed in dB. At the maximum sampling rate of 400kHz, the LTC1417 maintains near ideal ENOBs up to the Nyquist input frequency of 200kHz (refer to Figure 4). 1417 G07 14 Figure 3a. LTC1417 Nonaveraged, 4096 Point FFT, Input Frequency = 10kHz 86 80 12 74 68 EFFECTIVE BITS AMPLITUDE (dB) fSAMPLE = 400kHz fIN = 197.949188kHz –20 SFDR = –98dB SINAD = 81.1dB –40 10 62 8 6 –60 4 –80 2 1k –100 –120 10k 100k INPUT FREQUENCY (Hz) S/(N + D) (dB) 0 1M 1417 TA02 0 50 100 150 FREQUENCY (kHz) 200 Figure 4. Effective Bits and Signal/(Noise + Distortion) vs Input Frequency 1417 G08 Figure 3b. LTC1417 Nonaveraged, 4096 Point FFT, Input Frequency = 200kHz Signal-to-Noise Ratio The signal-to-noise plus distortion ratio [S/(N + D)] is the ratio between the RMS amplitude of the fundamental input frequency to the RMS amplitude of all other frequency components at the A/D output. The output is band limited to frequencies from above DC and below half the sampling frequency. Figure 3b shows a typical spectral content with a 400kHz sampling rate and a 200kHz input. The dynamic performance is excellent for input frequencies up to and beyond the Nyquist limit of 200kHz. Total Harmonic Distortion Total harmonic distortion (THD) is the ratio of the RMS sum of all harmonics of the input signal to the fundamental itself. The out-of-band harmonics alias into the frequency band between DC and half the sampling frequency. THD is expressed as: V22 + V32 + V42 + ...Vn2 V1 where V1 is the RMS amplitude of the fundamental frequency and V2 through Vn are the amplitudes of the second through nth harmonics. THD vs Input Frequency is shown in Figure 5. The LTC1417 has good distortion performance up to the Nyquist frequency and beyond. THD = 20Log sn1417 1417fas 10 LTC1417 U U W U AMPLITUDE (dB BELOW THE FUNDAMENTAL) APPLICATIONS INFORMATION ( 0 – 20 – 40 ) Amplitude at fa The peak harmonic or spurious noise is the largest spectral component excluding the input signal and DC. This value is expressed in decibels relative to the RMS value of a full-scale input signal. – 80 THD –100 3RD 2ND 1 10 100 INPUT FREQUENCY (kHz) 1000 1417 G05 Figure 5. Distortion vs Input Frequency Intermodulation Distortion If the ADC input signal consists of more than one spectral component, the ADC transfer function nonlinearity can produce intermodulation distortion (IMD) in addition to THD. IMD is the change in one sinusoidal input caused by the presence of another sinusoidal input at a different frequency. If two pure sine waves of frequencies fa and fb are applied to the ADC input, nonlinearities in the ADC transfer function can create distortion products at the sum and difference frequencies of mfa ±nfb, where m and n = 0, 1, 2, 3, etc. For example, 2nd order IMD terms include (fa ± fb). If the two input sine waves are equal in magnitude, the value (in decibels) of the 2nd-order IMD products can be expressed by the following formula: 0 fSAMPLE = 400kHz fIN1 = 97.303466kHz – 20 fIN2 = 104.632568kHz VIN = 4.096VP-P AMPLITUDE (dB) ( Amplitude at fa ± fb Peak Harmonic or Spurious Noise – 60 –120 ) IMD fa + fb = 20Log – 40 – 60 – 80 –100 –120 0 20 40 60 80 100 120 140 160 180 200 FREQUENCY (kHz) 1417 G09 Full-Power and Full-Linear Bandwidth The full-power bandwidth is the input frequency at which the amplitude of the reconstructed fundamental is reduced by 3dB from a full-scale input signal. The full-linear bandwidth is the input frequency at which the S/(N + D) has dropped to 77dB (12.5 effective bits). The LTC1417 has been designed to optimize input bandwidth, allowing the ADC to undersample input signals with frequencies above the converter’s Nyquist Frequency. The noise floor stays very low at high frequencies; S/(N + D) becomes dominated by distortion at frequencies far beyond Nyquist. DRIVING THE ANALOG INPUT The differential analog inputs of the LTC1417 are easy to drive. The inputs may be driven differentially or as a singleended input (i.e., the AIN– input is grounded). The AIN+ and AIN– inputs are sampled at the same instant. Any unwanted signal that is common to both inputs will be reduced by the common mode rejection of the sampleand-hold circuit. The inputs draw only one small current spike while charging the sample-and-hold capacitors at the end of conversion. During conversion, the analog inputs draw only a small leakage current. If the source impedance of the driving circuit is low, then the LTC1417 inputs can be driven directly. As source impedance increases, so will acquisition time (see Figure 7). For minimum acquisition time, with high source impedance, a buffer amplifier must be used. The only requirement is that the amplifier driving the analog input(s) must settle after the small current spike before the next conversion starts — 500ns for full throughput rate. Figure 6. Intermodulation Distortion Plot sn1417 1417fas 11 LTC1417 U W U U APPLICATIONS INFORMATION LT1360: 50MHz Voltage Feedback Amplifier. 3.8mA supply current, ±2.5V to ±15V supplies. High AVOL, 1mV offset and 80ns settling to 1mV (4V step, inverting and noninverting configurations) make it suitable for fast DC applications. Excellent AC specifications. Dual and quad versions are available as LT1361 and LT1362. ACQUISITION TIME (µs) 100 10 1 LT1468: 90MHz Voltage Feedback Amplifier. ±5V to ±15V supplies. Lower distortion and noise. Settles to 0.01% in 770ns. Distortion is –115dB to 20kHz. 0.1 0.01 1 10 100 1k 10k SOURCE RESISTANCE (Ω) 100k 1417 F07 Figure 7. tACQ vs Source Resistance Choosing an Input Amplifier Choosing an input amplifier is easy if a few requirements are taken into consideration. First, choose an amplifier that has a low output impedance (
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