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VMMK-2203-BLKG

VMMK-2203-BLKG

  • 厂商:

    AVAGO(博通)

  • 封装:

    0402

  • 描述:

    AMP RFIC LNA E-PHEMT 10GHZ 0402

  • 数据手册
  • 价格&库存
VMMK-2203-BLKG 数据手册
VMMK-2203 0.9-11 GHz E-pHEMT Wideband Amplifier in Wafer Level Package Data Sheet Description Features Avago Technologies has combined its industry leading E-pHEMT technology with a revolutionary wafer level package (WLP). • 1 x 0.5 mm Surface Mount Package The VMMK-2203 is an easy-to-use GaAs MMIC amplifier that offers excellent gain and noise figure from 0.9 to 11 GHz. The input and output are matched to 50 Ω so no external matching is needed. Bias is supplied through a simple external choke and DC blocking network. The wafer level package is small and ultra thin, yet can be handled and placed with standard 0402 pick and place assembly. This product is easy to use since it requires only a single positive DC voltage for bias and no matching coefficients are required for impedance matching to 50 Ω systems. WLP 0402, 1mm x 0.5mm x 0.25 mm • Ultrathin (0.25mm) • Gain Block • Ultra-wide Bandwidth • 5V Supply • RoHS6 + Halogen Free Specifications (6GHz, 5V, 25mA Typ.) • Noise Figure: 2.0dB typical • Associated Gain: 16.5dB • Output IP3: +14dBm • Output P1dB: +5dBm Applications • Low Noise and Driver for Cellular/PCS and WCDMA Base Stations DY • 2.4 GHz, 3.5GHz, 5-6GHz WLAN and WiMax notebook computer, access point and mobile wireless applications • 802.16 & 802.20 BWA systems Pin Connections (Top View) • WLL and MMDS Transceivers • Point-to-Point Radio Input Input Note: “D” = Device Code “Y” = Month Code DY Amp Output / Vdd Output / Vdd • UWB • Antennas Attention: Observe precautions for handling electrostatic sensitive devices. ESD Machine Model = 40V ESD Human Body Model = 450V Refer to Avago Application Note A004R: Electrostatic Discharge, Damage and Control. Table 1. Absolute Maximum Ratings [1] Sym Parameters/Condition Unit Absolute Max Vd Supply Voltage (RF Output) [2] V 8 Id Device Current [2] mA 50 Pin, max CW RF Input Power (RF Input) [3] dBm +13 Pdiss Total Power Dissipation mW 400 Tch Max channel temperature °C 150 θjc Thermal Resistance [4] °C/W 107 Notes 1. Operation in excess of any of these conditions may result in permanent damage to this device. 2. Bias is assumed DC quiescent conditions 3. With the DC (typical bias) and RF applied to the device at board temperature Tb = 25°C 4. Thermal resistance is measured from junction to board using IR method Table 2. DC and RF Specifications TA= 25°C, Frequency = 6 GHz, Vd = 5V, Zin = Zout = 50Ω (unless otherwise specified) Sym Parameters/Condition Unit Minimum Typ. Maximum Id Device Current mA 20.0 25 30.0 NF[1] Noise Figure dB – 2 2.5 Ga [1] Associated Gain dB 15 16.5 18 OIP3 [2,3] Output 3rd Order Intercept dBm +14 – Output P-1dB[2] Output Power at 1dB Gain Compression (Pin = 0dBm) dBm +5 – IRL [2] Input Return Loss dB – -11 – ORL [2] Output Return Loss dB – -16 – Notes: 1. Measure Data obtained using 300um G-S probe on production wafer 2. Measure Data obtained using 300um G-S-G probe on PCB substrate 3. OIP3 test condition: F1 = 6.0GHz, F2 = 6.01GHz, Pin = -20dB 2 Product Consistency Distribution Charts at 6.0 GHz, Vd = 5 V LSL USL .02 .022 .024 .026 .028 .03 Id @ 5V, Mean=25mA, LSL=20mA, USL=30mA LSL USL 15 16 17 18 Gain @ 6GHz, Mean=16.5, LSL=15dB, USL=18dB USL 1.7 1.8 1.9 2 2.1 NF @ 6GHz, Mean=2dB, USL=2.5dB 3 2.2 2.3 2.4 2.5 Note: Distribution data based on 500 part sample size from 3 lots during initial characterization. Measurements were obtained using 300um G-S production wafer probe. Future wafers allocated to this product may have nominal values anywhere between the upper and lower limits. VMMK-2203 Typical Performance (TA = 25°C, Vdd = 5V, Idd = 25mA, Zin = Zout = 50 Ω unless noted) 20 3 18 2 NF (dB) S21 (dB) 16 14 1 12 10 0 2 4 6 8 Frequency (GHz) 10 0 12 Figure 1. Small-signal Gain [1] S22 (dB) -15 10 12 6 8 Frequency (GHz) 10 12 6 8 Frequency (GHz) 10 12 -20 -30 -40 -20 0 2 4 6 8 Frequency (GHz) 10 -50 12 Figure 3. Input Return Loss [1] 0 2 4 Figure 4. Output Return Loss [1] 10 20 8 18 OIP3 (dBm) 6 4 2 16 14 12 0 2 Figure 5. Output P-1dB [1] 4 6 8 Frequency (GHz) 10 12 10 0 2 Figure 6. Output IP3 [1] Notes: 1. Data taken on a G-S-G probe substrate fully de-embedded to the reference plane of the package 2. Output IP3 data taken at Pin= -20dBm 4 6 8 Frequency (GHz) -10 -10 P1dB (dBm) 4 0 -5 0 2 Figure 2. Noise Figure [1] 0 S11 (dB) 0 4 VMMK-2203 Typical Performance (continue) (TA = 25°C, Vdd = 5V, Idd = 25mA, Zin = Zout = 50 Ω unless noted) 30 4 25 3 NF (dB) Id (mA) 20 15 2 10 1 5 0 0 1 2 3 Vd (V) 4 5 0 6 Figure 7. Total Current [1] 16 S12 (dB) S21 (dB) 4 14 10 12 5V 3V -20 -30 -40 0 2 4 6 8 Frequency (GHz) 10 -50 12 Figure 9. Gain over Vd [1] 0 2 4 6 8 Frequency (GHz) 10 12 Figure 10. Isolation over Vd [1] 0 0 5V 3V -10 S22 (dB) -5 -10 -15 -20 -30 -40 0 2 4 6 8 Frequency (GHz) Figure 11. Input Return Loss Over Vdd [1] 10 12 -50 5V 3V 0 2 4 6 8 Frequency (GHz) Figure 12. Output Return Loss Over Vdd [1] Notes: 1. Data taken on a G-S-G probe substrate fully de-embedded to the reference plane of the package 5 6 8 Frequency (GHz) -10 12 S11 (dB) 2 0 5V 3V 18 -20 0 Figure 8. Noise Figure over Vd [1] 20 10 5V 3V 10 12 VMMK-2203 Typical Performance (continue) 10 20 5 15 OIP3 (dBm) P1dB (dBm) (TA = 25°C, Zin = Zout = 50 Ω unless noted) 0 5 -5 -10 OP1dB_5V OP1dB_3V 0 2 OIP3_5V OIP3_3V 4 6 8 Frequency (GHz) 10 20 5 18 4 16 3 14 25C 85C -40C 12 10 0 2 2 4 6 8 Frequency (GHz) 10 6 8 Frequency (GHz) 10 12 10 12 25 C 85 C -40 C 2 0 12 0 2 4 6 8 Frequency (GHz) Figure 16. Noise Figure over Temp [3] 15 25 25 C 85 C -40 C 12 20 OIP3 (dBm) 9 6 15 10 25 C 85 C -40 C 5 3 0 2 4 6 8 Frequency (GHz) Figure 17. Output P1dB Over Temp [3] 10 12 0 0 2 4 6 8 Frequency (GHz) Figure 18. Output IP3 Over Temp [2,3] Notes: 1. Data taken on a G-S-G probe substrate fully de-embedded to the reference plane of the package 2. Output IP3 data taken at Pin=-15dBm 3. Over temp data taken on a test fixture (Figure 20) without de-embedding 6 4 1 Figure 15. Gain over Temp [3] 0 0 Figure 14. Output IP3 Over Vdd [1,2] NF (dB) S21 (dB) 0 12 Figure 13. Output P-1dB over Vdd [1] P1dB (dBm) 10 10 12 Typical Scattering Parameters (Data obtained using 300um G-S-G PCB substrate, losses calibrated out to the package reference plane) TA = 25°C, VDD = 5V, Idq = 25mA, Zin = Zout = 50Ω 7 Freq GHz S11 S21 S12 S22 db mag Phase db mag phase db mag phase db mag Phase 0.1 -0.623 0.931 -17.303 15.410 5.895 24.706 -43.098 0.007 58.201 -14.226 0.194 -60.924 0.2 -1.806 0.812 -30.763 16.296 6.528 11.177 -39.251 0.011 49.500 -18.666 0.117 -67.718 0.3 -3.217 0.691 -40.107 16.744 6.874 3.676 -37.202 0.014 38.074 -21.230 0.087 -71.757 0.4 -4.789 0.576 -42.585 16.937 7.028 0.281 -36.138 0.016 30.992 -25.224 0.055 -69.531 0.5 -6.014 0.500 -45.376 17.138 7.193 -4.222 -35.494 0.017 23.868 -27.013 0.045 -72.073 0.9 -9.520 0.334 -46.030 17.440 7.447 -19.422 -34.943 0.018 10.054 -32.841 0.023 -83.598 1 -10.053 0.314 -45.287 17.468 7.471 -22.849 -34.846 0.018 8.211 -34.657 0.019 -82.547 2 -11.859 0.255 -36.749 17.573 7.562 -54.672 -34.992 0.018 -7.465 -41.210 0.009 161.055 3 -11.242 0.274 -40.341 17.447 7.453 -85.386 -35.810 0.016 -16.631 -31.341 0.027 84.468 4 -10.554 0.297 -54.521 17.046 7.117 -115.626 -36.954 0.014 -23.677 -23.890 0.064 49.757 5 -10.446 0.300 -70.762 16.351 6.570 -144.946 -38.862 0.011 -26.344 -18.666 0.117 27.200 6 -10.989 0.282 -88.565 15.548 5.989 -172.420 -40.724 0.009 -25.092 -15.376 0.170 10.065 7 -11.965 0.252 -105.725 14.741 5.458 161.832 -42.158 0.008 -15.494 -13.046 0.223 -5.275 8 -13.267 0.217 -123.379 14.054 5.043 137.412 -43.098 0.007 -4.492 -11.179 0.276 -18.954 9 -14.919 0.180 -142.510 13.539 4.753 113.475 -42.853 0.007 8.295 -9.538 0.334 -31.497 10 -16.701 0.146 -166.823 13.159 4.550 89.158 -42.384 0.008 19.326 -8.011 0.398 -43.146 11 -17.972 0.126 163.087 12.879 4.405 63.721 -40.724 0.009 23.652 -6.616 0.467 -55.112 12 -17.781 0.129 128.897 12.543 4.238 36.160 -39.332 0.011 26.908 -5.338 0.541 -68.500 13 -16.496 0.150 97.602 11.875 3.924 6.410 -37.924 0.013 22.544 -4.465 0.598 -83.481 14 -14.943 0.179 72.431 10.617 3.395 -24.069 -37.788 0.013 14.404 -4.124 0.622 -98.826 15 -13.731 0.206 54.358 8.757 2.741 -53.104 -37.589 0.013 8.991 -4.278 0.611 -112.509 16 -12.597 0.235 40.489 6.512 2.116 -78.994 -37.856 0.013 6.710 -4.834 0.573 -123.438 17 -11.805 0.257 29.853 4.131 1.609 -101.974 -38.273 0.012 7.867 -5.430 0.535 -132.619 18 -10.906 0.285 20.369 1.789 1.229 -122.236 -38.416 0.012 4.077 -5.883 0.508 -139.697 19 -10.128 0.312 12.841 -0.460 0.948 -140.763 -38.862 0.011 3.017 -6.200 0.490 -145.124 20 -9.549 0.333 5.210 -2.569 0.744 -158.032 -39.412 0.011 -1.898 -6.375 0.480 -150.506 VMMK-2203 Application and Usage (Please always refer to the latest Application Note AN5378 in website) Biasing and Operation The VMMK-2203 is biased with a positive supply connected to the output pin through an external user supplied bias-tee as shown in Figure 19. The recommended supply voltage is between 3 and 5V. The corresponding drain currents are approximately 15 and 25 mA. Biasing the device at 5V results in higher gain, lower noise figure, higher IP3 and P1dB. In a typical application, the bias-tee can be constructed using lumped elements. The value of the output inductor can have a major effect on both low and high frequency operation. The demo board uses an 8.2 nH inductor that has self resonant frequency higher than the maximum desired frequency of operation. Vdd 0.1 uF 100 pF Size: 1.1 mm x 0.6 mm (0402 component) Input 8.2 nH Output Amp 100 pF Input Pad Ground Pad 50 Ohm line Output Pad 100 pF 50 Ohm line Figure 19. Usage of the VMMK-2203 At frequencies higher than 6 GHz, it may be advantageous to use a quarter-wave long microstrip line to act as a high impedance at the desired frequency of operation. This technique proves a good solution but only over relatively narrow bandwidths. Another approach for using the VMMK-2203 in broadband is to put in series two different value inductors with the smaller value inductor placed closest to the device and favoring the higher frequencies. The larger value inductor will then offer better low frequency performance by not loading the output of the device. The parallel combination of the 100pF and 0.1uF capacitors provides a low impedance in the band of operation and at lower frequencies. They should be placed as close as possible to the inductor. The low frequency bypass provides good rejection of power supply noise and also provides a low impedance termination for third order low frequency mixing products that will be generated when multiple in-band signals are injected into any amplifier. Refer the Absolute Maximum Ratings table for allowed DC and thermal conditions. 8 Figure 20. Evaluation/Test Board (available to qualified customer request) S Parameter Measurements The S-parameters are measured on a .016 inch thick RO4003 printed circuit test board, using G-S-G (ground signal ground) probes. Coplanar waveguide is used to provide a smooth transition from the probes to the device under test. The presence of the ground plane on top of the test board results in excellent grounding at the device under test. A combination of SOLT (Short - Open - Load - Thru) and TRL (Thru - Reflect - Line) calibration techniques are used to correct for the effects of the test board, resulting in accurate device S-parameters. The reference plane for the S Parameters is at the edge of the package. The product consistency distribution charts shown on page 2 represent data taken by the production wafer probe station using a 300um G-S wafer probe. The ground-signal probing that is used in production allows the device to be probed directly at the device with minimal common lead inductance to ground. Therefore there will be a slight difference in the nominal gain obtained at the test frequency using the 300um G-S wafer probe versus the 300um G-S-G printed circuit board substrate method. fy the device rial with one tal. Soldering sion than FR5 materials with ge of the base evice circuitry GaAs package to damaging s RO4003 and al and should ng source leads leads of the unt. The recern is shown ned footprint t borders the en. re any plated ng and tests hin .003”) and ure 5 provides VMMK-3XXX kness RO4350 e also applies t frequencies -1XXX FETs at ductance may may be placed bility. Consult ation. of the VMMK that the VIAs om under the of the VIAs is e VIAs should Outline Drawing 1.004 MIN, 1.085 MAX PIN ONE INDICATOR 0.125 0.125 GROUND PAD 0.500 MIN, 0.585 MAX 0.470 OUTPUT PAD 0.390 0.160 INPUT PAD 0.160 Notes: Solderable area of the device shown in yellow. Dimensions in mm. Tolerance ± 0.015 mm Suggested PCB Material and Land Pattern Recommended SMT Attachment The VMMK Packaged Devices are compatible with high volume surface mount PCB assembly processes. 1.2 (0.048) 0.400 (0.016) 0.100 (0.004) 0.076 max (0.003) 2pl see discussion 0.381 (0.015) 2pl 1. Follow ESD precautions while handling packages. 0.100 (0.004) 0.500 (0.020) Part of Input Circuit Manual Assembly for Prototypes 2. Handling should be along the edges with tweezers or from topside if using a vacuum collet. 0.500 (0.020) 0.200 (0.008) Part of Output Circuit 0.200 (0.008) 0.7 (0.028) 0.254 dia PTH (0.010) 4pl Solder Mask 0.400 dia (0.016) 4pl Notes: Figure 5. Recommended PCB layout for VMMK devices 1. 0.010” Rogers RO4350 As a general rule, if a VIA is within .004” (100u) of the edge of the soldermask but not under the device, then the VIA should be filled. Any VIA which is covered by the solder mask and is beyond .004” (100u) of the solder mask edge can be uncapped and unfilled as it is not at risk of wicking away solder from the device. If for any reason it is required to include a VIA or VIAs under a VMMK device, then the VIAs should be filled and capped. A capped VIA is a “plated over” filled VIA. If a filled but uncapped VIA is placed under the device, there will not be enough solderable surface area for device attachment. If an unfilled and uncapped VIA is placed directly under the ground pad, then the liquid solder will flow into the open VIA hole during the reflow process and deplete the solder volume to varying degrees from 9under the ground pad. Depletion of the solder volume due to unfilled VIAs may lead to a weak solder joint, poor grounding of the device, and/or stresses compromising 3. Recommended attachment is solder paste. Please see recommended solder reflow profile. Conductive epoxy is not recommended. Hand soldering is not recommended. 4. Apply solder paste using either a stencil printer or dot placement. The volume of solder paste will be dependent on PCB and component layout and should be controlled to ensure consistent mechanical and electrical performance. Excessive solder will degrade RF performance. 5. Follow solder paste and vendor’s recommendations when developing a solder reflow profile. A standard profile will have a steady ramp up from room temperature to the pre-heat temp to avoid damage due to thermal shock. 6. Packages have been qualified to withstand a peak temperature of 260°C for 20 to 40 sec. Verify that the profile will not expose device beyond these limits. 7. Clean off flux per vendor’s recommendations. 8. Clean the module with Acetone. Rinse with alcohol. Allow the module to dry before testing. Ordering Information Part Number Devices Per Container Container VMMK-2203-BLKG 100 Antistatic Bag VMMK-2203-TR1G 5000 7” Reel Package Dimension Outline D Die dimension: E A Dim Range Unit D 1.004 - 1.085 mm E 0.500 - 0.585 mm A 0.225 - 0.275 mm Note: All dimensions are in mm Reel Orientation Device Orientation USER FEED DIRECTION REEL 4 mm TOP VIEW Note: “D” = Device Code ”Y” = Month Code •DY •DY 10 CARRIER TAPE •DY •DY USER FEED DIRECTION 8 mm END VIEW Tape Dimensions T Do Note: 1 Po B A A P1 Scale 5:1 Bo W Note: 2 F E 5° (Max) B D1 BB SECTION Note: 2 P2 Ao R0.1 5° (Max) Ko Ao = 0.73±0.05 mm Scale 5:1 Bo = 1.26±0.05 mm AA SECTION mm Ko = 0.35 +0.05 +0 Unit: mm Symbol Spec. K1 Po P1 P2 Do D1 E F 10Po W T – 4.0±0.10 4.0±0.10 2.0±0.05 1.55±0.05 0.5±0.05 1.75±0.10 3.50±0.05 40.0±0.10 8.0±0.20 0.20±0.02 Notice: 1. 10 Sprocket hole pitch cumulative tolerance is ±0.1mm. 2. Pocket position relative to sprocket hole measured as true position of pocket not pocket hole. 3. Ao & Bo measured on a place 0.3mm above the bottom of the pocket to top surface of the carrier. 4. Ko measured from a plane on the inside bottom of the pocket to the top surface of the carrier. 5. Carrier camber shall be not than 1m per 100mm through a length of 250mm. For product information and a complete list of distributors, please go to our web site: www.avagotech.com Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies in the United States and other countries. Data subject to change. Copyright © 2005-2014 Avago Technologies. All rights reserved. AV02-2001EN - December 16, 2014
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