ST2012SB32768H5WZZAP

Specifications Drawing No. USY1N-H1-15378-00 Issued Date. 1/6 Jul,28,2015 Messrs: Digi-key Note: Part Number will be revised in case of specification change. Product Type Tuning Fork Crystal Series ST2012SB Frequency 32.768 kHz Customer Part Number - Customer Specification Number - KYOCERA Part Number ST2012SB32768H5WZZAP Remarks Pb-Free, RoHS Compliant, MSL 1 Customer Approval Approval Signature Approved Date Department Person in charge Seller KYOCERA Crystal Device Corporation Manufacturer KYOCERA Crystal Device Corporation (Crystal Units Division) (Sales Division) 6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 612-8501 Japan TEL. No. 075-604-3500 FAX. No. 075-604-3501 Design Department 5850, Higashine-Koh, Higashine-Shi, Yamagata 999-3701 Japan TEL. No. 0237-43-5611 FAX. No. 0237-43-5615 Quality Assurance KYOCERA Crystal Device Corporation Crystal Unit Application Engineering Section Crystal Units Division F.Mukae Approved by T.Soda Checked by A.Muraoka Issued by Y.Nozaki KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14378-00 2/6 Revision History Rev.No. 0 Description of revision First Edition Date Approved by Checked by Issued by Jul,28,2015 T.Soda A.Muraoka Y.Nozaki KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14378-00 3/6 1. APPLICATION This specification sheet is applied to tuning fork crystal “ST2012SB”. 2. PART NUMBER ST2012SB32768H5WZZAP 3. RATINGS Items SYMB. Rating Unit Operating Temperature range Topr -25~+75 deg. C Storage Temperature range Tstg -40~+85 deg. C 4. CHARACTERISTICS 4-1 ELECTRICAL CHARACTERISTICS Electrical Specification Item Symbol Condition Min Nominal Frequency fo Ta = 25 deg. C Frequency Tolerance df/fo Ta = 25 deg.C Frequency Stability df/T Operating Temperature Aging df/F Ta = 25 deg. C 1year Load Capacitance CL Equivalent series resistance R1 Q-Value Q 9000 Motional capacitance C1 Shunt capacitance Turning point Secondary temperature Coefficient Drive level Insulation resistance (between electrodes) Typ. Max 32.768 -250 Unit kHz 250 12.5 ppm pF 75 k 4.8 6.8 fF Co 0.9 1.7 pF Tp 20 30 deg. C K -4.0 DL -8 10 /C2 0.1 IR 500 0.5 W M 4-2 MOISTURE SENSITIVITY LEVEL Level 1 KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14378-00 4/6 5. APPEARANCES, DIMENSION (TOP VIEW) CONNECTION (TOP VIEW) (1) (2) 0.6MAX K225A K825AB 4-(0.215) 1.2± 0.1 2.0±0.1 (3) (Side View) (Bottom View ) 6-(0.1) C0.20 4-(R0.1) UNIT : mm 0.80 MARKING (1.) (2.) (3.) Identification Date Code (3 Digits) Load Capacitance K Last 1 digit of year and week Code. (Example) 12.5pF  A *The font of marking above is for reference purpose. 6. RECOMMENDED LAND PATTERN 0.7 1.4 0.7 1.5 UNIT : mm KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14378-00 5/6 7. RELIABILITY Frequency Stability, and ESR Stability, After stressing. TEST ITEM Frequency Stability ESR Stability Remarks  5 k Max or  30% Ta=25 deg. C (ppm) 7.1 High temp. use/storage 7.2 Low temp. use/storage 7.3 Shock 7.4 Vibration 7.5 Soldering Heat Resistance reflow 7.6 High temp. With humidity 7.7 Temperature cycle  10  10  20  10  10  10  10 8. REFLOW PROFILE Pb-free reflow requirements for soldering heat resistance KYOCERA Crystal Device Corporation KBS-5079F Drawing No. USY1N-H1-14378-00 6/6 9. Cautions for use (1) Soldering upon mounting Characteristics may be affected when Solder paste or conductive glue comes in contact with product lid or surface. (2) When using mounting machine Please minimize the shock when using mounting machine to avoid any excess stress to the product. (3) Conformity of a circuit We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 3 times the ESR (Equivalent Series Resistance) of Crystal unit. 10. Storage conditions Please store product in below conditions, and use within 6 months. Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition. 11. Manufacturing location Kyocera Crystal Device Corporation Shiga Yohkaichi Plant 12. Quality Assurance To be guaranteed by Kyocera Crystal Device Quality Assurance Division 13. Quality guarantee When Kyocera Crystal Device Corporation rooted failure occurs within 1 year after its delivery, substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery will be waivered. 14. Others In case of any questions or opinions regarding the Specification, please have it in written manner within 45 days after issued date. KYOCERA Crystal Device Corporation KBS-5079F