AFE7070
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SLOS761D – FEBRUARY 2012 – REVISED JANUARY 2013
Dual 14-Bit 65-MSPS Digital-to-Analog Converter With Integrated Analog Quadrature
Modulator
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FEATURES
APPLICATIONS
•
•
•
•
•
1
•
•
•
•
•
•
•
•
•
Maximum Sample Rate: 65 MSPS
Low Power:
– 325 mW LVDS Output Mode
– 334 mW Analog Output Mode
Interleaved CMOS Input, 1.8–3.3 V IOVDD
Input FIFO for Independent Data and DAC
Clocks
3- or 4-pin SPI Interface for Register
Programming
Complex NCO (DDS): 32-Bit Frequency, 16-Bit
Phase
Quadrature Modulator Correction: Gain,
Phase, Offset for Sideband and LO
Suppression
Analog Baseband Filter With Programmable
Bandwidth: 20-MHz Maximum RF Bandwidth
RF Ouput: Analog (linear) or LVDS (Clock)
RF Frequency Range: 100 MHz to 2.7 GHz
Package: 48-Pin QFN (7-mm × 7-mm)
Low-Power, Compact Software-Defined Radios
Femto- and Pico-Cell BTS
Clock Frequency Translation
DESCRIPTION
The AFE7070 is a dual 14-bit 65-MSPS digital-toanalog
converter
(DAC)
with
integrated,
programmable fourth-order baseband filter and
analog quadrature modulator. The AFE7070 includes
additional digital signal-processing features such as a
numerically controlled oscillator for frequency
generation/translation, and a quadrature modulator
correction circuit, providing LO and sideband
suppression capability. The AFE7070 has an
interleaved 14-bit 1.8-V to 3.3-V CMOS input. The
AFE7070 provides 20 MHz of RF signal bandwidth
with an RF output frequency range of 100 MHz to 2.7
GHz. An optional LVDS output can be used to
convert the quadrature modulator output to a clock
signal up to 800 MHz. Total power consumption is
less than 350 mW with the LVDS output and 334 mW
with the analog RF output.
The AFE7070 package is a 7-mm × 7mm 48-pin QFN
package. The AFE7070 is specified over the full
industrial temperature range (–40°C to 85°C).
AVAILABLE OPTIONS
TA
ORDER CODE
PACKAGE DRAWING/TYPE
TRANSPORT MEDIA
QUANTITY
AFE7070IRGZ25
–40°C to 85°C
AFE7070IRGZT
25
RGZ / 48QFN quad flatpack no-lead
Tape and reel
AFE7070IRGZR
250
2500
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012–2013, Texas Instruments Incorporated
AFE7070
SLOS761D – FEBRUARY 2012 – REVISED JANUARY 2013
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
BLOCK DIAGRAM
SCLK
SDENB
SDIO
ALARM_SDO
RESETB
BG_BYP
SPI/
Registers
1.2-V
REF
D[13:0]
IQ_FLAG
SYNC_SLEEP
Dual
DAC
NCO/
Mixer
(DDS)
Demux
RF_OUT
QMC
Baseband
Filter
CLK_IO
DACCLKP/N
Quadrature
Modulator
Clock
¸1,2,4
LVDS_P/N
¸2
LO_P/N
PIN CONFIGURATION
DACVDD18
MODVDD33
MODVDD33
FUSEVDD18
GND
RF_OUT
LVDS_N
GND
LVDS_P
LVDSVDD18
BG_BYP
DACVDD18
RGZ Package
(Top View)
DACCLKP
1
48 47 46 45 44 43 42 41 40 39 38 37
36
ATEST
DACCLKN
2
35
TESTMODE
CLKVDD18
3
34
ALARM_SDO
DACVDD33
4
33
LO_N
CLK_IO
5
32
LO_P
IQ_FLAG
6
31
SDENB
AFE7070
SYNC_SLEEP
7
30
SCLK
RESETB
8
29
SDIO
D13 (MSB)
9
28
D0 (LSB)
D12
10
27
D1
GND
11
26
GND
DVDD18
IOVDD
D2
D3
D4
D5
D6
D8
D7
D9
D10
D11
25
12
13 14 15 16 17 18 19 20 21 22 23 24
IOVDD
DVDD18
P0023-25
2
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SLOS761D – FEBRUARY 2012 – REVISED JANUARY 2013
PIN FUNCTIONS
PIN
NAME
NO.
I/O
DESCRIPTION
MISC/SERIAL
CMOS output for ALARM condition, active-low. The ALARM output functionality is defined through the
CONFIG7 registers.
ALARM_SDO
34
O
RESETB
8
I
Resets the chip when low. 1.8-V to 3.3-V CMOS, set by IOVDD. Internal pullup
SCLK
30
I
Serial interface clock. 1.8-V to 3.3-V CMOS, set by IOVDD. Internal pulldown
SDENB
31
I
Active-low serial data enable, always an input. 1.8-V to 3.3-V CMOS, set by IOVDD. Internal pullup
SDIO
29
I/O
Bidirectional serial data in 3-pin mode (default). In 4-pin interface mode (CONFIG3 sif_4pin), the SDIO
pin is an input only. 1.8-V to 3.3-V CMOS, set by IOVDD. Internal pulldown
Single-ended input or output CMOS level clock for latching input data. 1.8-V to 3.3-V CMOS, set by
IOVDD.
Optionally, it can be used as the unidirectional data output in 4-pin serial interface mode (CONFIG3
sif_4pin = 1). 1.8-V to 3.3-V CMOS, set by IOVDD.
DATA/CLOCK INTERFACE
CLK_IO
5
I/O
D[13:0]
9, 10,
14–23,
27, 28
I
Data bits 0 through 13. D13 is the MSB, D0 is the LSB. For complex data, channel I and channel Q are
multiplexed. For NCO phase data, either 14 bits are transferred at the internal sample clock rate, or 8
MSBs and 8 LSBs are interleaved on D[13:6]. 1.8-V to 3.3-V CMOS, set by IOVDD. Internal pulldown
1, 2
I
Differential input clock for DACs.
IQ_FLAG
6
I
When register CONFIG1 iqswap is 0, IQ-FLAG high identifies the DACA sample in dual-input or dualoutput clock modes. 1.8-V or 3.3-V CMOS, set by IOVDD. Internal pulldown
SYNC_SLEEP
7
I
Multi-function. Sync signal for signal processing blocks, TX ENABLE or SLEEP function. Selectable via
SPI. 1.8-V to 3.3-V CMOS, set by IOVDD.
LO_P, LO_N
32, 33
I
Local oscillator input. Can be used differentially or single-ended by terminating the unused input
through a capacitor and 50-Ω resistor to GND.
LVDS_P,
LVDS_N
45, 44
O
Differential LVDS output
RF_OUT
42
O
Analog RF output
ATEST
36
O
Factory use only. Do not connect.
BG_BYP
47
I
Reference voltage decoupling – connect 0.1 µF to GND.
TESTMODE
35
I
Factory use only. Connect to GND.
13, 24
I
1.8-V to 3.3-V supply for CMOS I/Os
DACCLKP,
DACCLKN
RF
REFERENCE
POWER
IOVDD
CLKVDD18
3
I
1.8 V
12, 25
I
1.8 V
LVDSVDD18
46
I
1.8 V
DACVDD18
37, 48
I
1.8 V
DACVDD33
4
I
3.3 V
MODVDD33
38, 39
I
3.3 V
FUSEVDD18
40
I
Connect to 1.8 V to 3.3 V supply (1.8 V is preferred to lower power dissipation).
11, 26,
41, 43
I
Ground
DVDD18
GND
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ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) (1)
VALUE
Supply voltage
range
DACVDD33, MODVDD33, FUSEVDD18, IOVDD
(2)
–0.5 V to 4 V
DVDD18, CLKVDD18, DACVDD18 (2)
–0.5 V to 2.3 V
–0.5 V to 4 V
D[13..0], IQ FLAG, SYNC_SLEEP, SCLK, SDENB, SDIO, ALARM_SDO,
RESETB , CLK_IO, TESTMODE
Supply voltage
range (2)
DACCLKP, DACCLKN
–0.5 V to IOVDD + 0.5 V
–0.5 V to CLKVDD18 + 0.5 V
LVDS_P, LVDS_N
–0.5 V to LVDSVDD18 + 0.5 V
BG_BYP, ATEST
–0.5 V to DACVDD33 + 0.5 V
RFOUT, LO_P, LO_N
–0.5 V to MODVDD33 + 0.5 V
Operating free-air temperature range, TA
–40°C to 85°C
Storage temperature range
–65°C to 150°C
(1)
(2)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of these or any other conditions beyond those indicated under Recommended Operating Conditions is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Measured with respect to GND
DC ELECTRICAL CHARACTERISTICS
Typical values at TA = 25°C, full temperature range is TMIN = –40°C to TMAX = 85°C, DAC sampling rate = 65 MSPS, DVDD18
= 1.8 V, CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V, analog output
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DC SPECIFICATIONS
DAC resolution
14
Bits
REFERENCE OUTPUT
Reference voltage
1.14
1.2
1.26
V
POWER SUPPLY
IOVDD
I/O supply voltage
1.71
3.6
V
DVDD18
Digital supply voltage
1.71
1.8
1.89
V
CLKVDD18
Clock supply voltage
1.71
1.8
1.89
V
DACVDD18
DAC 1.8-V analog supply voltage
1.71
1.8
1.89
V
LVDSVDD18
LVDS analog supply voltage
1.71
1.8
1.89
V
FUSEVDD18
FUSE analog supply voltage
1.71
1.8
3.6
V
DACVDD33
DAC 3.3-V analog supply voltage
3.15
3.3
3.45
V
MODVDD33
Modulator analog supply voltage
3.15
3.3
3.45
IIOVDD
I/O supply current
IDVDD18
Digital supply current
ICLKVDD18
Clock supply current
mA
IDACVDD18
DAC 1.8-V supply current
mA
ILVDSVDD18
LVDS output supply current
IFUSEVDD18
FUSE supply current
IDACVDD33
DAC 3.3-V supply current
IMODVDD33
Modulator supply current
Power dissipation
Connect to 1.8-V supply for lower power
V
mA
18
mA
mA
21
mA
mA
68
mA
LVDS output: NCO, QMC active, fDAC = 40 MHz, IOVDD = 2.5
V
337
380
mW
Analog output: NCO off, QMC active, fDAC = 65 MHz, IOVDD =
2.5 V
335
380
mW
Sleep mode with clock, internal reference on, IOVDD = 2.5 V
80
Sleep mode without clock, internal reference off, IOVDD = 2.5
V
5
mW
25
mW
POWER SUPPLY vs MODE
3.3-V supplies (DACVDD33, MODVDD33, IOVDD)
1.8-V supplies (DVDD18, CLKVDD18, DACVDD18,
FUSEVD18, LVDSVDD18)
72
NCO = 1 MHz, LVDS on, RF out off, no input data, 65 MSPS
Power dissipation
4
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mA
47
mA
322
mW
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SLOS761D – FEBRUARY 2012 – REVISED JANUARY 2013
DC ELECTRICAL CHARACTERISTICS (continued)
Typical values at TA = 25°C, full temperature range is TMIN = –40°C to TMAX = 85°C, DAC sampling rate = 65 MSPS, DVDD18
= 1.8 V, CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V, analog output
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
3.3-V supplies (DACVDD33, MODVDD33, IOVDD)
1.8-V supplies (DVDD18, CLKVDD18, DACVDD18,
FUSEVDD18, LVDSVDD18)
MIN
TYP
MAX
71
NCO = 1 MHz, LVDS on, RF out off,
no input data, 40 MSPS
UNIT
mA
32
mA
337
mW
102
mA
36
mA
Power dissipation
334
mW
3.3-V supplies (DACVDD33, MODVDD33, IOVDD)
101
mA
22
mA
325
mW
Power dissipation
3.3-V supplies (DACVDD33, MODVDD33, IOVDD)
1.8-V supplies (DVDD18, CLKVDD18, DACVDD18,
FUSEVD18, LVDSVDD18)
1.8-V supplies (DVDD18, CLKVDD18, DACVDD18,
FUSEVD18, LVDSVDD18)
1 MHz full-scale input, RF out on, LVDS output off,
NCO off, QMC on, 65 MSPS
1 MHz full-scale input, RF out on, LVDS output off,
NCO off, QMC off, 32.5 MSPS
Power dissipation
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ELECTRICAL CHARACTERISTICS
Typical values at TA = 25°C, full temperature range is TMIN = –40°C to TMAX = 85°C, DAC sampling rate = 65 MSPS, DVDD18
= 1.8 V, CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 =
3.3 V, analog output (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DIGITAL INPUTS (D[13:0], IQ_FLAG, SDI, SCLK, SDENB, RESETB, SYNC_SLEEP, ALARM_SDO, CLK_IO)
VIH
VIL
High-level input voltage
Low-level input voltage
IOVDD = 3.3 V
2.3
IOVDD = 2.5 V
1.75
IOVDD = 1.8 V
1.25
V
IOVDD = 3.3 V
1
IOVDD = 2.5 V
0.75
IOVDD = 1.8 V
0.54
V
IIH
High-level input current
IOVDD = 3.3 V
–80
80
µA
IIL
Low-level input current
IOVDD = 3.3 V
–80
80
µA
Ci
Input capacitance
fDAC
DAC sample rate
Interleaved data, fDAC = 1/2 × fINPUT
0
65
MSPS
fINPUT
Input data rate
Interleaved data, fINPUT = 2 × fDAC
0
130
MSPS
5
pF
DIGITAL OUTPUTS (ALARM_SDO, SDIO, CLK_IO)
VOH
VOL
High-level output voltage
Low-level output voltage
ILOAD = –100 µA
IOVDD – 0.2
ILOAD = –2 mA
0.8 × IOVDD
V
V
ILOAD = 100 µA
ILOAD = 2 mA
0.2
V
0.22 × IOVDD
V
CLOCK INPUT (DACCLKP/DACCLKN)
DACCLKP/N duty cycle
DACCLKP/N differential voltage
40%
60%
0.4
1
V
Timing Parallel Data Input (D[13:0], IQ_FLAG, SYNC_SLEEP) – Dual Input Clock Mode
tSU
Input setup time
Relative to CLK_IO rising edge
1
ns
tH
Input hold time
Relative to CLK_IO rising edge
1
ns
tLPH
Input clock pulse high time
3
ns
Timing Parallel Data Input (D[13:0], IQ_FLAG, SYNC_SLEEP) – Dual Output Clock Mode
tSU
Input setup time
Relative to CLK_IO rising edge
1
0.2
ns
tH
Input hold time
Relative to CLK_IO rising edge
1
0.2
ns
Timing Parallel Data Input (D[13:0], IQ_FLAG, SYNC_SLEEP) – Single Differential DDR and SDR Clock Modes
tSU
Input setup time
Relative to DACCLKP/N rising edge
0
–0.8
ns
tH
Input hold time
Relative to DACCLKP/N rising edge
2
1
ns
Timing – Serial Data Interface
tS(SDENB)
Setup time, SDENB to rising edge of SCLK
20
ns
tS(SDIO)
Setup time, SDIO valid to rising edge of SCLK
10
ns
tH(SDIO)
Hold time, SDIO valid to rising edge of SCLK
5
ns
tSCLK
Period of SCLK
100
ns
tSCLKH
High time of SCLK
40
ns
tSCLKL
Low time of SCLK
40
ns
tD(DATA)
Data output delay after falling edge of SCLK
10
ns
tRESET
Minimum RESETB pulse duration
25
ns
6
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AC ELECTRICAL CHARACTERISTICS
Typical values at TA = 25°C, full temperature range is TMIN = –40°C to TMAX = 85°C, DAC sampling rate = 65 MSPS, DVDD18
= 1.8 V, CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 =
3.3 V, analog output (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
2.7
GHz
5
dBm
800
MHz
LO INPUT
fLO
LO frequency range
0.1
PLO_IN
LO input power
–5
LO port return loss
15
LVDS OUTPUT
fLVDS_OUT LVDS output frequency
100
INTEGRATED BASEBAND FILTER
2.5 MHz
Baseband attenuation at setting
Filtertune = 8 relative to low-frequency
signal
Baseband attenuation at setting
Filtertune = 0 relative to low-frequency
signal
1
5 MHz
18
10 MHz
42
20 MHz
65
10 MHz
1
20 MHz
18
40 MHz
42
55 MHz
58
Baseband filter phase linearity
RMS phase deviation from linear phase across
minimum or maximum cutoff frequency
Baseband filter amplitude ripple
Frequency < 0.9 × nominal cutoff frequency
2
dB
dB
Degrees
0.5
dB
RF Output Parameters – fLO = 100 MHz, Analog Output
POUT_FS
Full-scale RF output power
Full-scale 50-kHz digital sine wave
–1
dBm
IP2
Output IP2
Maximum LPF BW setting, fBB = 4.5, 5.5 MHz
63
dBm
IP3
Output IP3
Maximum LPF BW setting, fBB = 4.5, 5.5 MHz
18
dBm
Carrier feedthrough
Unadjusted, fBB = 50 kHz, full scale
45
dBc
Sideband suppression
Unadjusted, fBB = 50 kHz, full scale
27
dBc
Output noise floor
≥ 30 MHz offset, fBB = 50 kHz, full scale
137
dBc/Hz
8.5
dB
Output return loss
RF Output Parameters – fLO = 450 MHz, Analog Output
POUT_FS
Full-scale RF output power
Full-scale 50-kHz digital sine wave
0.2
dBm
IP2
Output IP2
Max LPF BW setting, fBB = 4.5, 5.5 MHz
67
dBm
IP3
Output IP3
Max LPF BW setting, fBB = 4.5, 5.5 MHz
19
dBm
Carrier feedthrough
Unadjusted, fBB = 50 kHz, full scale
45
dBc
Sideband Suppression
Unadjusted, fBB = 50 kHz, full scale
38
dBc
Output noise floor
≥ 30 MHz offset, fBB = 50 kHz, full scale
143
dBc/Hz
8.5
dB
Output return loss
RF Output Parameters – fLO = 850 MHz, Analog Output
POUT_FS
Full-scale RF output power
Full-scale 50-kHz digital sine wave
0.3
dBm
IP2
Output IP2
Max LPF BW setting, fBB = 4.5, 5.5 MHz
64
dBm
IP3
Output IP3
Max LPF BW setting, fBB = 4.5, 5.5 MHz
19
dBm
Carrier feedthrough
Unadjusted, fBB = 50 kHz, full scale
41
dBc
Sideband suppression
Unadjusted, fBB = 50 kHz, full scale
Output noise floor
≥ 30 MHz offset, fBB = 50 kHz, full scale
37
dBc
143
dBc/Hz
8.5
dB
1 WCDMA TM1 signal, PAR = 10 dB,
POUT = –10 dBFS
65
dBc
10-MHz LTE, PAR = 10 dB, POUT = –10 dBFS
61
dBc
Output return loss
ACPR
Adjacent-channel power ratio
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AC ELECTRICAL CHARACTERISTICS (continued)
Typical values at TA = 25°C, full temperature range is TMIN = –40°C to TMAX = 85°C, DAC sampling rate = 65 MSPS, DVDD18
= 1.8 V, CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 =
3.3 V, analog output (unless otherwise noted)
PARAMETER
ALT1
Alternate-channel power ratio
TEST CONDITIONS
MIN
1 WCDMA TM1 signal, PAR = 10 dB,
POUT = –10 dBFS
TYP
MAX
UNIT
66
dBc
RF Output Parameters – fLO = 2.1 GHz, Analog Output
POUT_FS
Fullscale RF output power
–1.5
dBm
IP2
Output IP2
50
dBm
IP3
Output IP3
19
dBm
Carrier feedthrough
38
dBc
Sideband suppression
42
dBc
141
dBc/Hz
8.5
dB
1 WCDMA TM1 signal, PAR = 10 dB,
POUT = –10 dBFS
65
dBc
20 MHz LTE, PAR = 10 dB,
POUT = - 10 dBFS
61
dBc
1 WCDMA TM1 signal, PAR = 10 dB,
POUT = –10 dBFS
65
dBc
Output noise floor
≥ 30 MHz offset, fBB = 50 kHz, full scale
Output return loss
ACPR
Adjacent-channel power ratio
ALT1
Alternate-channel power ratio
RF Output Parameters – fLO = 2.7 GHz, Analog Output
POUT_FS
Full-scale RF output power
–3.6
dBm
IP2
Output IP2
48
dBm
IP3
Output IP3
17
dBm
Carrier feedthrough
36
dBc
Sideband suppression
35
dBc
139
dBc/Hz
8.5
dB
Output noise floor
≥ 30 MHz offset, fBB = 50 kHz, full scale
Output return loss
RF Output Parameters – fLO = 622 MHz, LVDS Output, ÷4
VOD
Differential output voltage
VOC
Common-mode output voltage
8
Assumes a 100-Ω differential load
247
350
454
1.125
1.25
1.375
mV
V
Output noise floor
≥ 13 MHz offset, fBB = 1 MHz
Carrier feedthrough
Unadjusted, fBB = 50 kHz, full scale
40
dBc
Sideband suppression
Unadjusted, fBB = 50 kHz, full cale
40
dBc
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TYPICAL PERFORMANCE PLOTS
2
1
0
−1
−2
−3
−4
−5
−6
−7
−8
−9
−10
−5 dBm
0 dBm
8 dBm
Output Power (dBm)
Output Power (dBm)
TA = 25°C, DAC sampling rate = 65 MSPS, single-tone IF = 1.1 MHz, two-tone IF = 1 MHz and 2 MHz, DVDD18 = 1.8 V,
CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V,
analog output, unless otherwise noted
1000
2000
3000
LO Frequency (MHz)
4000
Output Power (dBm)
−40°C
25°C
85°C
1000
2000
3000
LO Frequency (MHz)
G000
Figure 1. Output Power vs LO Frequency and LO Power
2
1
0
−1
−2
−3
−4
−5
−6
−7
−8
−9
−10
2
1
0
−1
−2
−3
−4
−5
−6
−7
−8
−9
−10
4000
G001
Figure 2. Output Power vs LO Frequency and Temperature
3.15V
3.3V
3.45V
1000
2000
3000
LO Frequency (MHz)
4000
G002
Figure 3. Output Power vs LO Frequency and Supply Voltage
20
−5dBm
0dBm
8dBm
19
18
17
OIP3 (dB)
Output Power (dBm)
−5
−10
−15
16
15
14
13
12
−20
−20
Frequency = 1960 MHz
Frequency = 2140 MHz
−15
−10
−5
CW Digital Input Power (dBFS)
11
10
1000
G003
Figure 4. Output Power vs Input Power and LO Frequency
2000
Frequency (MHz)
3000
4000
G004
Figure 5. OIP3 vs LO Frequency and LO Power
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TYPICAL PERFORMANCE PLOTS (continued)
TA = 25°C, DAC sampling rate = 65 MSPS, single-tone IF = 1.1 MHz, two-tone IF = 1 MHz and 2 MHz, DVDD18 = 1.8 V,
CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V,
analog output, unless otherwise noted
22
22
−40°C
25°C
85°C
21
20
20
19
OIP3 (dBm)
OIP3 (dBm)
19
18
17
16
14
13
13
1000
2000
Frequency (MHz)
3000
12
4000
3000
4000
G006
75
−40°C
25°C
85°C
70
65
60
OIP2 (dBm)
60
55
50
45
55
50
45
40
40
35
35
30
30
1000
2000
Frequency (MHz)
3000
25
4000
Unadjusted Carrier Feedthrough (dBm)
3.15V
3.3V
3.45V
70
65
60
55
50
45
40
35
30
2000
Frequency (MHz)
3000
2000
Frequency (MHz)
3000
4000
G008
Figure 9. OIP2 vs LO Frequency and Temperature
75
1000
1000
G007
Figure 8. OIP2 vs LO Frequency and LO Power
25
2000
Frequency (MHz)
Figure 7. OIP3 vs LO Frequency and Supply Voltage
−5dBm
0dBm
8dBm
65
25
1000
G005
70
OIP2 (dBm)
16
15
75
OIP2 (dBm)
17
14
Figure 6. OIP3 vs LO Frequency and Temperature
4000
−25
−5dBm
0dBm
8dBm
−30
−35
−40
−45
−50
G009
Figure 10. OIP2 vs LO Frequency and Supply Voltage
10
18
15
12
3.15V
3.3V
3.45V
21
1000
2000
Frequency (MHz)
3000
4000
G010
Figure 11. Unadjusted Carrier Feethrough vs LO Frequency
and LO Power
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TYPICAL PERFORMANCE PLOTS (continued)
−25
Unadjusted Carrier Feedthrough (dBm)
Unadjusted Carrier Feedthrough (dBm)
TA = 25°C, DAC sampling rate = 65 MSPS, single-tone IF = 1.1 MHz, two-tone IF = 1 MHz and 2 MHz, DVDD18 = 1.8 V,
CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V,
analog output, unless otherwise noted
−40°C
25°C
85°C
−30
−35
−40
−45
−50
1000
2000
Frequency (MHz)
3000
4000
−40
−45
−50
1000
2000
Frequency (MHz)
3000
4000
G012
−60
−40°C
25°C
85°C
−45
Carrier Feedthrough (dBm)
Carrier Feedthrough (dBm)
−35
−40
−40°C
25°C
85°C
−55
−65
−70
−75
−80
−85
−50
−55
−60
−65
−70
−75
−80
−85
900
920
940
960
Frequency (MHz)
−90
980
1920
1940
G013
Figure 14. Adjusted Carrier Feethrough vs LO Frequency
and Temperature at 940 MHz
1960
1980
Frequency (MHz)
2000
G014
Figure 15. Adjusted Carrier Feethrough vs LO Frequency
and Temperature at 1960 MHz
−40
−40
−40°C
25°C
85°C
−50
−40°C
25°C
85°C
−45
Carrier Feedthrough (dBm)
−45
Carrier Feedthrough (dBm)
−30
Figure 13. Unadjusted Carrier Feethrough vs LO Frequency
and Supply Voltage
−50
−55
−60
−65
−70
−75
−80
3.15V
3.3V
3.45V
G011
Figure 12. Unadjusted Carrier Feethrough vs LO Frequency
and Temperature
−90
−25
−50
−55
−60
−65
−70
−75
−80
−85
2100
2120
2140
2160
Frequency (MHz)
−90
2180
G015
Figure 16. Adjusted Carrier Feethrough vs LO Frequency
and Temperature at 2140 MHz
2460
2480
2500
2520
Frequency (MHz)
2540
G016
Figure 17. Adjusted Carrier Feethrough vs LO Frequency
and Temperature at 2500 MHz
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TYPICAL PERFORMANCE PLOTS (continued)
TA = 25°C, DAC sampling rate = 65 MSPS, single-tone IF = 1.1 MHz, two-tone IF = 1 MHz and 2 MHz, DVDD18 = 1.8 V,
CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V,
analog output, unless otherwise noted
−40
Carrier Feedthrough (dBm)
−50
Sideband Suppression (dBc)
−40°C
25°C
85°C
−45
−55
−60
−65
−70
−75
−80
−85
−90
3460
3480
3500
3520
Frequency (MHz)
1000
G017
2000
Frequency (MHz)
3000
4000
G029
Figure 19. Unadjusted Sideband Suppression vs LO
Frequency and LO Power
55
55
Sideband Suppression (dBc)
−40°C
25°C
85°C
50
45
40
35
30
25
1000
2000
Frequency (MHz)
3000
3.15V
3.3V
3.45V
50
45
40
35
30
25
4000
1000
G028
2000
Frequency (MHz)
3000
4000
G027
Figure 20. Unadjusted Sideband Suppression vs LO
Frequency and Temperature
Figure 21. Unadjusted Sideband Suppression vs LO
Frequency and Supply Voltage
90
80
−40°C
25°C
85°C
85
80
Sideband Suppression (dBc)
Sideband Suppression (dBc)
30
3540
60
Sideband Suppression (dBc)
40
20
Figure 18. Adjusted Carrier Feethrough vs LO Frequency
and Temperature at 3500 MHz
75
70
65
60
55
50
−40°C
25°C
85°C
75
70
65
60
55
50
45
900
920
940
960
Frequency (MHz)
40
980
G018
Figure 22. Adjusted Sideband Suppression vs LO
Frequency and Temperature at 940 MHz
12
−5dBm
0dBm
8dBm
50
1920
1940
1960
1980
Frequency (MHz)
2000
G019
Figure 23. Adjusted Sideband Suppression vs LO
Frequency and Temperature at 1960 MHz
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TYPICAL PERFORMANCE PLOTS (continued)
TA = 25°C, DAC sampling rate = 65 MSPS, single-tone IF = 1.1 MHz, two-tone IF = 1 MHz and 2 MHz, DVDD18 = 1.8 V,
CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V,
analog output, unless otherwise noted
90
90
−40°C
25°C
85°C
80
75
70
65
60
55
50
45
40
80
75
70
65
60
55
50
45
2100
2120
2140
2160
Frequency (MHz)
40
2180
2460
2480
G020
Figure 24. Adjusted Sideband Suppression vs LO
Frequency and Temperature at 2140 MHz
2500
2520
Frequency (MHz)
2540
G021
Figure 25. Adjusted Sideband Suppression vs LO
Frequency and Temperature at 2500 MHz
70
85
−40°C
25°C
85°C
80
75
−40°C
25°C
85°C
70
ACPR (dBc)
Sideband Suppression (dBc)
−40°C
25°C
85°C
85
Sideband Suppression (dBc)
Sideband Suppression (dBc)
85
65
60
55
65
50
45
40
35
3460
3480
3500
3520
Frequency (MHz)
60
3540
1000
G022
Figure 26. Adjusted Sideband Suppression vs LO
Frequency and Temperature at 3500 MHz
2000
Frequency (MHz)
3000
G023
Figure 27. WCDMA Adjacent-Channel Power Ratio (ACPR)
vs Temperature
70
70
3.15V
3.3V
3.45V
ACPR (dBc)
ALT ACPR (dBc)
−40°C
25°C
85°C
65
60
4000
1000
2000
Frequency (MHz)
3000
4000
65
60
G024
Figure 28. WCDMA Adjacent-Channel Power Ratio (AltACPR) vs Temperature
1000
2000
Frequency (MHz)
3000
4000
G025
Figure 29. WCDMA Adjacent-Channel Power Ratio (ACPR)
vs Supply Voltage
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TYPICAL PERFORMANCE PLOTS (continued)
TA = 25°C, DAC sampling rate = 65 MSPS, single-tone IF = 1.1 MHz, two-tone IF = 1 MHz and 2 MHz, DVDD18 = 1.8 V,
CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V,
analog output, unless otherwise noted
70
−120
Noise Spectral Density (dBc/Hz)
ALT ACPR (dBc)
3.15V
3.3V
3.45V
65
60
1000
2000
Frequency (MHz)
3000
Noise Spectral Density (dBc/Hz)
Noise Spectral Density (dBc/Hz)
−140
−15
−10
−5
Digital Amplitude (dBFS)
G030
Figure 31. Noise Spectral Density (NSD) vs Input Power and
LO Frequency
−135
1000
2000
Frequency (MHz)
3000
−140
3.15V
3.3V
3.45V
−145
4000
1000
G031
2000
Frequency (MHz)
3000
4000
G032
Figure 33. Noise Spectral Density (NSD) at 30-MHz Offset vs
LO Frequency and Supply Voltage
−135
Noise Spectral Density (dBc/Hz)
−132
Noise Spectral Density (dBc/Hz)
−135
−135
3.15V
3.3V
3.45V
Figure 32. Noise Spectral Density (NSD) at 6-MHz Offset vs
LO Frequency and Supply Voltage
−137
−40°C
25°C
85°C
1000
2000
Frequency (MHz)
3000
4000
−140
−40°C
25°C
85°C
−145
G033
Figure 34. Noise Spectral Density (NSD) at 6-MHz Offset vs
LO Frequency and Temperature
14
−130
G026
−130
−142
−125
−145
−20
4000
Figure 30. WCDMA Adjacent-Channel Power Ratio (AltACPR) vs Supply Voltage
−140
6 MHz Offset
30 MHz Offset
1000
2000
Frequency (MHz)
3000
4000
G034
Figure 35. Noise Spectral Density (NSD) at 30-MHz Offset
vs. LO Frequency and Temperature
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TYPICAL PERFORMANCE PLOTS (continued)
TA = 25°C, DAC sampling rate = 65 MSPS, single-tone IF = 1.1 MHz, two-tone IF = 1 MHz and 2 MHz, DVDD18 = 1.8 V,
CLKVDD18 = 1.8 V, DACVDD18 = 1.8 V, FUSEVDD18 = 1.8 V, IOVDD = 3.3 V, DACVDD33 = 3.3 V, MODVDD33 = 3.3 V,
analog output, unless otherwise noted
Amplitude (dB)
−10
−20
−30
−40
−50
−60
Filter tune = 0
Filter tune = 4
Filter tune = 8
5
10
15
Baseband Frequency (MHz)
20
G035
Figure 36. Baseband Filter Response
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SERIAL INTERFACE
The serial port of the AFE7070 is a flexible serial interface which communicates with industry-standard
microprocessors and microcontrollers. The interface provides read/write access to all registers used to define the
operating modes of the AFE7070. The serial port is compatible with most synchronous transfer formats and can
be configured as a 3- or 4-pin interface by sif_4pin in CONFIG3 (bit6). In both configurations, SCLK is the serial
interface input clock and SDENB is serial interface enable. For the 3-pin configuration, SDIO is a bidirectional pin
for both data in and data out. For the 4-pin configuration, SDIO is data-in only and ALARM_SDO is data-out
only. Data is input into the device with the rising edge of SCLK. Data is output from the device on the falling
edge of SCLK.
Each read/write operation is framed by signal SDENB (serial data-enable bar) asserted low for 2 to 5 bytes,
depending on the data length to be transferred (1–4 bytes). The first frame byte is the instruction cycle, which
identifies the following data transfer cycle as read or write, how many bytes to transfer, and the address to which
to transfer the data. Table 1 indicates the function of each bit in the instruction cycle and is followed by a detailed
description of each bit. Frame bytes 2 through 5 comprise the data transfer cycle.
Table 1. Instruction Byte of the Serial Interface
MSB
LSB
Bit
7
6
5
4
3
2
1
0
Description
R/W
N1
N0
A4
A3
A2
A1
A0
R/W
Identifies the following data transfer cycle as a read or write operation. A high indicates a read
operation from the AFE7070, and a low indicates a write operation to the AFE7070.
[N1 : N0]
Identifies the number of data bytes to be transferred, as listed in Table 2. Data is transferred MSB
first.
Table 2. Number of Transferred Bytes Within One Communication Frame
[A4 : A0]
N1
N0
DESCRIPTION
0
0
Transfer 1 byte
0
1
Transfer 2 bytes
1
0
Transfer 3 bytes
1
1
Transfer 4 bytes
Identifies the address of the register to be accessed during the read or write operation. For multibyte transfers, this address is the starting address. Note that the address is written to the
AFE7070 MSB first and counts down for each byte.
Figure 37 shows the serial interface timing diagram for an AFE7070 write operation. SCLK is the serial interface
clock input to AFE7070. Serial data enable SDENB is an active-low input to the AFE7070. SDIO is serial data in.
Input data to the AFE7070 is clocked on the rising edges of SCLK.
16
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Data Transfer Cycle(s)
Instruction Cycle
SDENB
SCLK
SDIO
r/w N1 N0 A4 A3 A2 A1 A0 D7 D6 D5 D4
ts (SDENB)
t
D3 D2 D1 D0
SCLK
SDENB
SCLK
SDIO
ts (SDIO)
th
(SDIO)
t SCLKH t SCLKL
Figure 37. Serial Interface Write Timing Diagram
Figure 38 shows the serial interface timing diagram for an AFE7070 read operation. SCLK is the serial interface
clock input to AFE7070. Serial data enable SDENB is an active-low input to the AFE7070. SDIO is serial data-in
during the instruction cycle. In the 3-pin configuration, SDIO is data-out from the AFE7070 during the data
transfer cycle(s), while ALARM_SDO is in a high-impedance state. In the 4-pin configuration, ALARM_SDO is
data-out from the AFE7070 during the data transfer cycle(s). At the end of the data transfer, ALARM_SDO
outputs low on the final falling edge of SCLK until the rising edge of SDENB, when it enters the high-impedance
state.
Data Transfer Cycle(s)
Instruction Cycle
SDENB
SCLK
SDIO
r/w N1 N0 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 0
D7 D6 D5 D4 D3 D2 D1 D0 0
ALARM_SDO
4 pin configuration
output
SDENB
3 pin configuration
output
SCLK
SDIO
ALARM_SDO
Data n
Data n-1
td (Data)
Figure 38. Serial Interface Read Timing Diagram
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REGISTER DESCRIPTIONS
In the SIF interface there are three types of registers, NORMAL, READ_ONLY, and WRITE_TO_CLEAR. The
NORMAL register type allows data to be written and read from the register. All 8 bits of the data are registered at
the same time, but there is no synchronizing with an internal clock. All register writes are asynchronous with
respect to internal clocks. READ_ONLY registers only allow reading of the registers—writing to them has no
effect. WRITE_TO_CLEAR registers are just like NORMAL registers in that they can be written and read;
however, when the internal signals set a bit high in these registers, that bit stays high until it is written to 0. This
way, interrupts are captured and constant until dealt with and cleared.
Register Map
Name
Address
Default
(MSB)
bit 7
bit 6
bit 5
CONFIG0
0x00
0x10
div2_dacclk_ena
div2_sync_ena
clkio_sel
CONFIG1
0x01
0x10
twos
iqswap
CONFIG2
0x02
0xXX
Unused
Unused
Unused
CONFIG3
0x03
0x10
alarm_or_sdo_
ena
sif_4pin
CONFIG4
0x04
0x0F
fuse_pd
CONFIG5
0x05
0x00
CONFIG6
0x06
CONFIG7
0x07
CONFIG8
0x08
0x00
CONFIG9
0x09
0x7A
CONFIG10
0x0A
0xB6
qmc_offseta(12:8)
Unused
Unused
Unused
CONFIG11
0x0B
0xEA
qmc_offsetb(12:8)
Unused
Unused
Unused
CONFIG12
0x0C
0x45
CONFIG13
0x0D
0x1A
qmc_gainb (7:0)
CONFIG14
0x0E
0x16
qmc_phase (7:0)
CONFIG15
0x0F
0xAA
CONFIG16
0x10
0xC6
CONFIG17
0x11
0x24
freq (15:8)
CONFIG18
0x12
0x02
freq (23:16)
CONFIG19
0x13
0x00
freq (31:24)
CONFIG20
0x14
0x00
phase (7:0)
CONFIG21
0x15
0x00
phase (15:8)
CONFIG22
0x16
0x00
Reserved
CONFIG23
0x17
0xXX
Reserved
CONFIG24
0x18
0xXX
Reserved
CONFIG25
0x19
0xXX
Reserved
CONFIG26
0x1A
0xXX
Reserved
CONFIG27
0x1B
0xXX
Reserved
CONFIG28
0x1C
0xXX
Reserved
CONFIG29
0x1D
0xXX
Reserved
CONFIG30
0x1E
0xXX
CONFIG31
0x1F
0x82
18
bit 4
bit 3
bit 2
bit 1
clkio_out_ena_n
data_clk_sel
data_type
fifo_ena
daca_
complement
dacb_
complement
Unused
Unused
Unused
SLEEP
TXENABLE
SYNC
mixer_gain
pd_clkrcvr
pd_clkrcvr_
mask
offset_ena
qmc_corr_ena
mixer_ena
0x00
pd_lvds
pd_rf_out
pd_dac
pd_analogout
pd_lvds_mask
0x13
mask_2away
mask_1away
fifo_sync_mask
fifo_offset
alarm2away_
ena
trim_clk_rc_fltr
(LSB)
bit 0
sync_IorQ
lvds_clk_div
Alarm_fifo_
2away
Alarm_fifo_1away
sync_sleep_txenable_sel
msb_out
coarse_dac(3:0)
filter_tune(4:0)
pd_tf_out_
mask
pd_dac_mask
pd_analogout_
mask
alarm_1away_
ena
qmc_offseta (7:0)
qmc_offsetb (7:0)
qmc_gaina (7:0)
qmc_phase(9:8)
qmc_gaini(10:8)
qmc_gainq(10:8)
freq (7:0)
Reserved
titest_voh
titest_vol
Version(5:0)
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Register name: CONFIG0; Address: 0x00
BIT 7
div2_dacclk_ena
0
BIT 0
div2_sync_ena
0
clkio_sel
0
clkio_out_ena_n
1
data_clk_sel
0
data_type
0
fifo_ena
0
sync_IorQ
0
Table 3. Clock Mode Memory Programming
Mode
div2_dacclk_ena
div2_sync_ena
clkio_sel
clkio_out_ena_n
data_clk_sel
Dual input clock(00)
1
0
1
1
0
Dual output clock (01)
1
1
0
0
0
Single differential DDR clock (10)
0
0
0
1
1
Single differential SDR clock (11)
0
0
1
1
1
div2_dacclk_ena:
When set to 1, this enables the divide-by-2 in the DAC clock path. This must be set to 1
when in dual-input clock mode or dual-output clock mode.
div2_sync_ena:
When set to 1, the divide-by-2 is synchronized with the iq_flag. It is only useful in the dualclock modes when the divide-by-2 is enabled. Care must be take to ensure the input data
and DAC clocks are correctly aligned.
clkio_sel:
This bit is used to determine which clock is used to latch the input data. This should be set
according to Table 3.
clkio_out_ena_n:
When set to 0, the clock CLK_IO is an output. Depending on the mode, is should be set
according to Table 3.
data_clk_sel:
This bit is used to determine which clock is used to latch the input data. This should be set
according to Table 3.
data_type:
When asserted, the phase data is presented at the data interface. The phase data is then
updated with each clock. The phase register then holds the value of the I and Q data to be
used with the mix operation.
fifo_ena:
When asserted, the FIFO is enabled. Used in dual-input clock mode only. In all other
modes, the FIFO is bypassed.
sync_IorQ:
When set to 0, sync is latched on the I phase of the input clock. When set to 1, sync is
detected on the Q phase of the clock and is sent to the rest of the chip when the next I
data is presented.
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Register name: CONFIG1; Address: 0x01
BIT 7
twos
0
BIT 0
iqswap
0
trim_clk_rc_fltr
0
1
daca_complement
0
dacb_complement
0
X
lvds_clk_div
X
twos:
When asserted, the input to the chip is 2s complement, otherwise offset binary.
iqswap:
When asserted, the DACA data is driven onto DACB and reverse.
trim_clk_rc_fltr:
2 bits to trim the RC filter for LVDS out
daca_complement:
When asserted, the output to DACA is complemented. This allows the user of the chip
effectively to change the + and – designations of the PADs.
dacb_complement:
When asserted, the output to DACB is complemented. This allows the user of the chip
effectively to change the + and – designations of the PADs.
lvds_clk_div:
20
lvds_clk_div
LVDS Clock Division
00
2
01
4
10
1
11
1
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Register name: CONFIG2; Address: 0x02
Write-to-clear register bits remain asserted once set. Each bit must be written to 0 before another 1 can
be captured.
BIT 7
unused
0
BIT 0
unused
0
unused
0
unused
0
unused
0
unused
0
Alarm_fifo_2away
1
Alarm_fifo_1away
1
Alarm_fifo_2away:
When asserted, the FIFO pointers are 2 away from collision. (WRITE_TO_CLEAR)
Alarm_fifo_1away:
When asserted, the FIFO pointers are 1 away from collision. (WRITE_TO_CLEAR)
Register name: CONFIG3; Address: 0x03 (INTERFACE SELECTION)
BIT 7
alarm_or_sdo_ena
0
BIT 0
sif_4pin
0
SLEEP
0
TXenable
1
SYNC
0
sync_sleep_txenable_sel
0
0
msb_out
0
alarm_or_sdo_e When asserted, the output of the ALARM_SDO pin is enabled.
na:
sif_4pin:
When asserted, the part is in 4-pin SPI mode. The data-out is output on the ALARM_SDO
pin. If this bit is not enabled, the alarm signal is output on the ALARM_SDO pin.
sleep:
When asserted, all blocks programmed to go to sleep in CONFIG4 and CONFIG6 registers
labeled pd_***_mask are powered down.
TXenable:
When 0, the data path is zeroed. When 1, the device transmits.
sync:
When written with a 1, the part is synced. To be resynced using the sif register, it must be
reset to 0 by writing a 0 then write a 1 to the sif to sync.
sync_sleep_
txenable_sel:
This is used to define the function of the SYNC_SLEEP pin. This pin can be used for multiple
functions, but only one at a time. When it is set to control any one of the functions, all other
functions are controlled by writing their respective sif register bits.
msb_out:
sync_sleep_txenable
_sel
Pin controls
00
All controlled by sif bit
01
TXENABLE
10
SYNC
11
SLEEP
When set, and alarm_sdo_out_ena is also set, the ALARM_SDO pin outputs the value of
daca bit 13.
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Register name: CONFIG4; Address: 0x04
BIT 7
BIT 0
fuse_pd
0
mixer_gain
0
pd_clkrcvr
0
pd_clkrcvr_mask
0
coarse_dac(3:0)
1
1
1
1
fuse_pd:
When set to 1, the fuses are powered down. This saves approximately 50 µA at 1.8 V for
every intact fuse. The default value is 0.
mixer_gain:
When asserted, the complex mixer output is multiplied by 2. Only applied when the mixer is
enabled (mixer_ena = 1).
pd_clkrcvr:
When asserted, the clock receiver is powered down.
pd_clkrcvr_mask: When asserted, allows the clock receiver to be powered down with the SYNC_SLEEP pin or
sleep register bit.
coarse_dac:
DAC full-scale current control
Register name: CONFIG5; Address: 0x05
BIT 7
offset_ena
0
BIT 0
qmc_corr_ena
0
mixer_ena
0
0
0
filter_tune(4:0)
0
0
0
offset_ena:
When asserted, the qmc offset blk is enabled.
qmc_corr_ena:
When asserted, the qmc correction is enabled.
mixer_ena:
When asserted, the complex mix is performed. Otherwise, the mixer is bypassed.
filter_tune(4:0):
Bits used to change the bandwidth of the analog filters
Register name: CONFIG6; Address: 0x06
BIT 7
BIT 0
pd_lvds
pd_rf_out
pd_dac
pd_analogout
pd_lvds_mask
pd_tf_out_mask
pd_dac_mask
0
0
0
1
1
1
0
pd_analogout_
mask
0
pd_lvds:
When asserted, the LVDS output stage is powered down.
pd_rf_out:
When asserted, the RF output stage is powered down.
pd_dac:
When asserted, DACs are powered down.
pd_analog_out:
When asserted, the entire analog circuit after the DACs (filters, modulator, LO input, RF
output stage, LVDS output) is powered down.
The following are used to determine what blocks are powered down when the SYNC_SLEEP pin is used or the
sleep register bit is set.
pd_lvds_mask:
When asserted, allows the LVDS to be powered down
pd_rf_out_mask:
When asserted, allows the RF output to be powered down
pd_dac_mask:
When asserted, allows the DACs to be powered down
22
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Register name: CONFIG7; Address: 0x07
BIT 7
mask_2away
0
BIT 0
mask_1away
0
fifo_sync_mask
0
fifo_offset
0
1
alarm_2away_ena
1
0
alarm_1away_ena
1
mask_2away:
When set to 1, the ALARM_SDO pin is not asserted when the FIFO pointers are 2 away
from collision. The alarm still shows up in the CONFIG7 bits.
mask_1away:
When set to 1, the ALARM_SDO pin is not asserted when the FIFO pointers are 1 away
from collision. The alarm still shows up in the CONFIG7 bits.
fifo_sync_mask:
When set to 1, the sync to the FIFO is masked off. Sync does not then reset the pointers.
If the value is 0, when the sync is toggled the FIFO pointers are reset to the offset values.
fifo_offset:
Used to set the offset pointers in the FIFO. Programs the starting location of the output
side of the FIFO, allows the output pointer to be shifted from –4 to +3 (2s complement)
positions with respect to its default position when synced. The default position for the
output side pointer is 2. The input side pointer defaults to 0.
alarm_2away_ena:
When asserted, alarms from the FIFO that represent the pointers being 2 away from
collision are enabled.
alarm_1away_ena:
When asserted, alarms from the FIFO that represent the pointers being 1 away from
collision are enabled.
Register name: CONFIG8; Address: 0x08
BIT 7
0
BIT 0
0
qmc_offseta(7:0):
qmc_offseta (7:0)
0
0
0
0
0
0
Bits 7:0 of qmc_offseta. The complete registers qmc_offseta[12:0] and qmc_offsetb[12:0]
are updated when CONFIG8 is written, so CONFIG9, CONFIG10, and CONFIG11 should
be written before CONFIG8.
Register name: CONFIG9; Address: 0x09
BIT 7
0
BIT 0
1
qmc_offsetb(7:0):
qmc_offsetb (7:0)
1
1
1
0
1
0
Bits 7:0 of qmc_offsetb. The complete registers qmc_offseta[12:0] and qmc_offsetb[12:0]
are updated when CONFIG8 is written, so CONFIG9, CONFIG10, and CONFIG11 should
be written before CONFIG8.
Register name: CONFIG10; Address: 0x0A
BIT 7
1
qmc_offsetb(12:8):
BIT 0
0
qmc_offseta(12:8)
1
1
0
Unused
1
Unused
1
Unused
0
Bits 12:8 of qmc_offseta. The complete registers qmc_offseta[12:0] and qmc_offsetb[12:0]
are updated when CONFIG8 is written, so CONFIG9, CONFIG10, and CONFIG11 should
be written before CONFIG8.
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Register name: CONFIG11; Address: 0x0B
BIT 7
1
BIT 0
1
qmc_offsetb(12:8):
qmc_offsetb(12:8)
1
0
1
Unused
0
Unused
1
Unused
0
Bits 12:8 of qmc_offsetb. The complete registers qmc_offseta[12:0] and
qmc_offsetb[12:0] are updated when CONFIG8 is written, so CONFIG9, CONFIG10, and
CONFIG11 should be written before CONFIG8.
Register name: CONFIG12; Address: 0x0C
BIT 7
BIT 0
qmc_gaina (7:0)
0
1
qmc_gaina(7:0):
0
0
0
1
0
1
Bits 7:0 of qmc_gaina. The complete registers qmc_gaina[10:0], qmc_gainb[10:0] and
qmc_phase[9:0] are updated when CONFIG12 is written, so CONFIG13, CONFIG14, and
CONFIG15 should be written before CONFIG12.
Register name: CONFIG13; Address: 0x0D
BIT 7
BIT 0
qmc_gainb (7:0)
0
0
qmc_gainb(7:0):
0
1
1
0
0
0
Bits 7:0 of qmc_gainb. The complete registers qmc_gaina[10:0], qmc_gainb[10:0] and
qmc_phase[9:0] are updated when CONFIG12 is written, so CONFIG13, CONFIG14, and
CONFIG15 should be written before CONFIG12.
Register name: CONFIG14; Address: 0x0E
BIT 7
0
BIT 0
0
qmc_phase(7:0)
qmc_phase (7:0)
1
0
0
1
1
0
Bits 7:0 of qmc_phase. The complete registers qmc_gaina[10:0], qmc_gainb[10:0] and
qmc_phase[9:0] are updated when CONFIG12 is written, so CONFIG13, CONFIG14, and
CONFIG15 should be written before CONFIG12.
Register name: CONFIG15; Address: 0x0F
BIT 7
BIT 0
qmc_phase(9:8)
1
0
1
qmc_gaina(10:8)
0
qmc_phase(9:8):
Bits 9:8 of qmc_phase value
qmc_gaina(10:8):
Bits 9:8 of qmc_gaina value
qmc_gainb(10:8):
Bits 9:8 of qmc_gainb value
1
0
qmc_gainb(10:8)
1
0
The complete registers qmc_gaina[10:0], qmc_gainb[10:0] and qmc_phase[9:0] are updated when CONFIG12
is written, so CONFIG13, CONFIG14, and CONFIG15 should be written before CONFIG12.
24
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Register name: CONFIG16; Address: 0x10
BIT 7
BIT 0
freq (7:0)
1
freq(7:0):
1
0
0
0
1
1
0
Bits 7:0 of frequency value
Register name: CONFIG17; Address: 0x11
BIT 7
BIT 0
freq (15:8)
0
freq (15:8):
0
1
0
0
1
0
0
Bits 15:8 of frequency value
Register name: CONFIG18; Address: 0x12
BIT 7
BIT 0
freq (23:15)
0
freq (23:15):
0
0
0
0
0
1
0
Bits 23:15 of frequency value
Register name: CONFIG19; Address: 0x13
BIT 7
BIT 0
freq (31:24)
0
freq (31:24):
0
0
0
0
0
0
0
Bits 31:24 of frequency value
Register name: CONFIG20; Address: 0x14
BIT 7
BIT 0
phase (7:0)
0
phase (7:0):
0
0
0
0
0
0
0
Bits 7:0 of phase value
Register name: CONFIG21; Address: 0x15
BIT 7
BIT 0
phase (15:8)
0
phase (15:8):
0
0
0
0
0
0
0
Bits 15:8 of phase value
Register name: CONFIG22; Address: 0x16
BIT 7
0
BIT 0
0
nco_sync_sleep(7:0):
0
nco__sync_sleep(7:0)
0
0
0
0
0
Set to 11110000 to use the SYNC_SLEEP pin to update the NCO frequency value;
otherwise, set to 00000000. Note that register sync_sleep_txenable_sel in CONFIG3
must be set to 10 to use the SYNC_SLEEP pin as a SYNC input.
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Register name: CONFIG23; Address: 0x17
BIT 7
X
BIT 0
X
X
Reserved – Varies from device to device
X
X
X
X
X
Register name: CONFIG24; Address: 0x18
BIT 7
X
BIT 0
X
X
reserved – Varies from device to device
X
X
X
X
X
Register name: CONFIG25; Address: 0x19
BIT 7
X
BIT 0
X
X
Reserved – Varies from device to device
X
X
X
X
X
Register name: CONFIG26; Address: 0x1A
BIT 7
X
BIT 0
X
X
Reserved – Varies from device to device
X
X
X
X
X
Register name: CONFIG27; Address: 0x1B
BIT 7
X
BIT 0
X
X
Reserved – Varies from device to device
X
X
X
X
X
Register name: CONFIG28; Address: 0x1C
BIT 7
X
BIT 0
X
X
Reserved – Varies from device to device
X
X
X
X
X
Register name: CONFIG29; Address: 0x1D
BIT 7
X
BIT 0
X
X
Reserved – Varies from device to device
X
X
X
X
X
Register name: CONFIG30; Address: 0x1E
BIT 7
X
BIT 0
X
X
Reserved – Varies from device to device
X
X
X
X
X
Register name: CONFIG31; Address: 0x1F
BIT 7
titest_voh
1
BIT 0
titest_vol
0
Version(5:0)
0
0
titest_voh:
Bit held high for sif test purposes
titest_voh:
Bit held low for sif test purposes
version:
Version of the chip
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PARALLEL DATA INPUT
The AFE7070 can input either complex I and Q data interleaved on D[13:0] at a data rate 2× the internal output
sample clock frequency, 16-bit NCO phase data interleaved as 8 MSBs and 8 LSBs on pins D[13:6] at a data
rate 2× the internal output sample clock frequency, or 14-bit NCO phase data at a data rate 1× the internal
output sample clock frequency. These modes are described in detail in the CLOCK MODES section.
CLOCK MODES
The AFE7070 has four clock modes for providing the DAC sample clock and data latching clocks.
Clock Mode
Dual-input clock
Dual-output clock
CLK_IO
FIFO
DataLatch
DACCLKFreqRatio
DataFormat
IQ or phase (MSB/LSB)
Input
Enabled
CLK_IO
1× or 2× internal
sample clock
Output
Disabled
CLK_IO
2× internal sample
clock
IQ or phase (MSB/LSB)
IQ or phase (MSB/LSB)
14-bit phase-only
Single differential
DDR clock
Disabled
Disabled
DACCLK
1× internal sample
clock
Single differential
SDR clock
Disabled
Disables
DACCLK
1× internal sample
clock
Progamming Bits
See Table 3 in
CONFIG0 decription.
DUAL-INPUT CLOCK MODE
In dual-input clock mode, the user provides both a differential DAC clock at pins DACCLKP/N at 2× the internal
sample clock frequency and a second single-ended CMOS-level clock at CLK_IO for latching input data. The
DACCLK is divided by 2 internally to provide the internal output sample clock, with the phase determined by the
IQ_FLAG input. The IQ_FLAG signal can either be a repetitive high/low signal or a single event that is used to
reset the clock divider phase and identify the I sample.
CLK_IO is an SDR clock at the input data rate, or 2× the internal sample-clock frequency. The DAC clock and
data clock must be frequency locked, and a FIFO is used internally to absorb the phase difference between the
two clock domains. The phase relationship of CLK_IO and DACCLK can be any phase at the initial sync of the
FIFO, and thereafter can move up to ±4 clock cycles before the FIFO input and output pointers overrun and
cause data errors. In dual-input clock mode, the latency from input data to output samples is not controlled
because the FIFO can introduce a one-clock cycle variation in latency, depending on the exact phase
relationship between DACCLK and CLK_IO.
An external sync must be given on the SYNC_SLEEP pin to reset/initialize internal signal processing blocks.
Because the internal processing blocks process I and Q in parallel, the user can provide the sync signal during
either the I or Q input times (or both). Note that the internal sync signal must propagate through the input FIFO,
and therefore the latency of the sync updates of the signal processing blocks is not controlled.
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Dual Input Clock Mode (SDR)
DACCLKP
DACCLKN
Phase unconstrained (max +/- 4 clk after FIFO sync)
CLK_IO
(input)
ts th
D[13:0]
I
Q
I
Q
I
Q
IQ_FLAG
IQ
Identification
or
SYNC_SLEEP
SYNC_SLEEP
Sync
(Initialization)
or
SYNC_SLEEP
Internal
SYNC
Signal
Internal
Output
Sample
Clock
Internal sync signal based on SYNC_SLEEP low to high, either I or Q
Internal sample clock phase based on IQ_FLAG
Output
waveform
Figure 39. Dual-Input Clock Mode
DUAL-OUTPUT CLOCK MODE
In dual-output clock mode, the user provides a differential DAC clock at pins DACCLKP/N at 2× the internal
sample clock frequency. The DACCLK is divided by 2 internally to provide the internal output sample clock, with
the phase determined by the IQ_FLAG input. The IQ_FLAG signal can either be a repetitive high/low signal or a
single event that is used to reset the clock divider phase and identify the I sample.
The AFE7070 outputs a single-ended CMOS-level clock at CLK_IO for latching input data. CLK_IO is an SDR
clock at the input data rate, or 2× the internal sample clock frequency. The CLK_IO clock can be used to drive
the input data source (such as digital upconverter) that sends the data to the DAC. Note that the CLK_IO delay
relative to the input DACCLK rising edge (td) in Figure 40) increases with increasing loads.
An external sync can be given on the SYNC_SLEEP pin to reset/initialize internal signal processing blocks.
Because the internal processing blocks process I and Q in parallel, the user can provide the sync signal during
either the I or Q input times (or both).
In the dual-output clock mode, the FIFO is bypassed, so the latency from the data input to the DAC output and
the time from sync input to update of the signal processing block are deterministic.
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DACCLKP
DACCLKN
td
CLK_IO
(output)
ts th
D[13:0]
I
Q
I
Q
I
Q
IQ_FLAG
IQ
Identification
or
IQ_FLAG
SYNC_SLEEP
Sync
(Initialization)
or
SYNC_SLEEP
Internal
SYNC
Signal
Internal sync signal based on SYNC_SLEEP low to high, either I or Q
Internal
Output
Sample
Clock
Internal sample clock phase based on IQ_FLAG
Output
waveform
Figure 40. Dual-Output Clock Mode Timing Diagram
SINGLE DIFFERENTIAL DDR CLOCK
In single differential DDR clock mode, the user provides a differential clock to DACCLKP/N at the internal output
sample clock frequency. The rising and falling edges of DACCLK are used to latch I and Q data, respectively.
The internal output sample clock is derived from DACCLKP/N.
An external sync can be given on the SYNC_SLEEP pin to reset/initialize internal signal processing blocks.
Because the internal processing blocks process I and Q in parallel, the user can provide the sync signal during
either the I or Q input times (or both).
In the single differential DDR clock mode, the FIFO is bypassed, so the latency from the data input to the DAC
output and the time from sync input to update of the signal processing block are deterministic.
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DACCLKP
DACCLKN
ts th
D[13:0]
I
I on rising edge, Q on falling edge
Q
I
Q
I
Q
SYNC_SLEEP
Sync
(Initialization)
or
SYNC_SLEEP
Internal
SYNC
Signal
Internal sync signal based on SYNC_SLEEP low to high, either I or Q
Internal
Output
Sample
Clock
Internal sample clock based on DACCLK/C
Output
waveform
Figure 41. Single Clock Mode Timing Diagram
SINGLE DIFFERENTIAL SDR CLOCK MODE
In single differential SDR clock mode, the user provides a differential clock to DACCLKP/N at 1× the internal
output sample clock frequency. This mode is only used for transferring 14-bit phase data, and therefore only
requires one data latching per internal output sample clock. The internal output sample clock is derived from
DACCLKP/N.
An external sync can be given on the SYNC_SLEEP pin to reset/initialize internal signal processing blocks.
In the single differential SDR clock mode, the FIFO is bypassed, so the latency from the data input to the DAC
output and the time from sync input to update of the signal processing block are deterministic.
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DACCLKP
DACCLKN
ts
D[13:0]
th
P(0)
P(1)
P(2)
SYNC_SLEEP
Internal
Output
Sample
Clock
Internal sample clock based on DACCLK/C
Output
waveform
Figure 42. Single Differential SDR Clock Mode
FIFO ALARMS
The FIFO only operates when the write and read pointers are positioned properly. If either pointer over- or underruns the other, samples are duplicated or skipped. To prevent this, register CONFIG2 can be used to track two
FIFO-related alarms:
• alarm_fifo_2away: Occurs when the pointers are within two addresses of each other
• alarm_fifo_1away: Occurs when the pointers are within one address of each other
These two alarm events are generated asynchronously with respect to the clocks and can be accessed through
the ALARM_SDO pin by writing a 1 in register alarm_or_sdo_ena (CONFIG3[7]) and 0 in register sif_4pin
(CONFIG3[6]).
SYNCHRONIZATON
The AFE7070 has a synchonization input pin, SYNC_SLEEP, that is sampled by the same clock mode as the
input data to initialize signal processing blocks and optionally update NCO frequency and phase values. In the
case of dual input clock mode, the sync signal must propagate through the input FIFO, which creates an
uncertainty of ±1 clock cycle for the synchronization of the signal processing. In all other clock modes, the FIFO
is bypassed; therefore the exact time of the SYNC_SLEEP input to sync event is deterministic, and multiple
devices can be exactly synchronized.
The function of the pin SYNC_SLEEP is determined by register sync_sleep_txenable_sel in CONFIG3; setting to
10 configures the SYNC_SLEEP pin as a SYNC input.
QUADRATURE MODULATOR CORRECTION (QMC) BLOCK
The quadrature modulator correction (QMC) block provides a means for changing the phase balance of the
complex signal to compensate for I and Q imbalance present in an analog quadrature modulator. The block
diagram for the QMC block is shown in Figure 43. The QMC block contains three programmable parameters.
Registers qmc_gaina(10:0) and qmc_gainb(10:0) control the I and Q path gains and are 11-bit values with a
range of 0 to approximately 2.0. Register qmc_phase(9:0) controls the phase imbalance between I and Q and is
a 10-bit value with a range of –1/8 to approximately +1/8. LO feedthrough can be minimized by adjusting the
DAC offset feature described below.
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Figure 43. QMC Gain/Phase Block Diagram
The LO feedthrough can be minimized by adjusting the DAC offset. Registers qmc_offseta(12:0) and
qmc_offsetb(12:0) control the I and Q path offsets and are 13-bit values with a range of –4096 to 4095. The
DAC offset value adds a digital offset to the digital data before digital-to-analog conversion. The qmc_gaina and
qmc_gainb registers can be used to back off the signal before the offset to prevent saturation when the offset
value is added to the digital signal.
Figure 44. QMC Offset Block Diagram
NUMERICALLY CONTROLLED OSCILLATOR (NCO)
The AFE7070 contains a numerically controlled oscillator that can be used as either a data generation source or
to provide sin and cos for fully complex mixing with input data. The NCO has a 32-bit frequency register
freq(31:0) and a 16-bit phase register phase(15:0). The NCO tuning frequency is programmed in the CONFIG16
through CONFIG19 registers. Phase offset is programmed in the CONFIG20 and CONFIG21 registers. A block
diagram of the NCO is shown in Figure 45.
32
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Figure 45. Numerically Controlled Oscillator (NCO)
Synchronization of the NCO occurs by resetting the NCO accumulator to zero, which is described as follows.
Frequency word freq in the frequency register is added to the accumulator every clock cycle, fDAC. The output
frequency of the NCO is
freq ´ fNCO_CLK
fNCO =
232
(1)
With a complex input represented by IIN(t) and QIN(t), the output of FMIX IOUT(t) and QOUT(t) is
IOUT (t) = ëéIIN (t) cos (2p fNCO t + d ) - QIN (t)sin (2p fNCO t + d )ûù ´ 2(mixer_gain - 1)
QOUT (t) = éëIIN (t) sin (2p fNCO t + d ) + QIN (t)cos (2p fNCO t + d )ùû ´ 2(mixer_gain - 1)
(2)
where t is the time since the last resetting of the NCO accumulator, δ is the phase offset value, and mixer_gain
is either 0 or 1. δ is given by:
d = 2π ´ phase (15 : 0)/216
(3)
When register mixer_gain is set to 0, the gain through FMIX is sqrt(2)/2 or –3 dB. This loss in signal power is in
most cases undesirable, and it is recommended that the gain function of the QMC block be used to increase the
signal by 3 dB to compensate. With mixer_gain = 1, the gain through FMIX is sqrt(2) or 3 dB, which can cause
clipping of the signal if IIN(t) and QIN(t) are simultaneously near full-scale amplitude and should therefore be used
with caution.
There are two methods to change the frequency and phase values in the NCO block.
1. Synchronous updating: To update the NCO frequency and phase using the SYNC_SLEEP pin,
sync_sleep_txenable_sel in the CONFIG3 register must be set to 10 and nco_sync_sleep in the CONFIG22
register must be set to 11110000 should be written to the CONFIG22 register. With these settings, the
frequency and phase register values only update the NCO frequency and phase values the pin
SYNC_SLEEP is raised, which allows precise control of when the frequency is updated. The accumulator is
not reset. There is a six-clock cycle latency from the time when the sync is clocked into the part until the new
frequency value is used in the calculation of the accumulator.
2. Non-synchronous updating: If the nco_sync_sleep register in CONFIG22 is set to 00000000, the frequency
register value updates the NCO frequency value when the lowest register bits freq(7:0) in CONFIG16 are
written. To assure updating with a complete frequency value, register bits freq(32:8) in CONFIG17,
CONFIG18, and CONFIG19 should be written before CONFIG16. Likewise, the phase register value updates
the NCO phase value when the lowest register bits phase(7:0) in CONFIG20 are written. To assure updating
with a complete phase value, register bits phase(15:8) in CONFIG21 should be written before CONFIG20.
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AFE7070
SLOS761D – FEBRUARY 2012 – REVISED JANUARY 2013
www.ti.com
ANALOG OUTPUT MODE
The AFE7070 has two output modes. The analog output mode includes an an RF buffer amplifier and covers the
full frequency range of output frequency listed in the AC Electrical Characteristics table. The RF output should be
AC coupled and is intended to drive a 50-Ω load.
LVDS OUTPUT MODE
The AFE7070 provides an output mode where the modulator output is converted from an analog signal by a
comparator to a digital LVDS output signal. The RF output frequency in the LVDS output mode is limited to
frequencies below the specification listed in the AC Electrical Characteristics table.
The output includes options for frequency division of ÷1, ÷2 and ÷4 (Figure 46), set in register lvds_clk_div in
CONFIG1.
/1,2,4
LVDS P/N
Figure 46. LVDS Output Option
CMOS DIGITAL INPUTS
Figure 47 through Figure 50 show schematics of the equivalent CMOS digital inputs and outputs of the AFE7070.
All the CMOS digital inputs and outputs are relative to the IOVDD supply, which can vary from 1.8 V to 3.3 V.
This facilitates the I/O interface and eliminates the need of level translation. See the specification table for logic
thresholds. The pullup and pulldown circuitry is approximately equivalent to 100 kΩ.
IOVDD
25 W
ALARM_SDO
GND
Figure 47. CMOS Digital Equivalent Circuit for ALARM_SDO Output
34
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Product Folder Links: AFE7070
AFE7070
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SLOS761D – FEBRUARY 2012 – REVISED JANUARY 2013
IOVDD
800 W
67 kW
SDIO
IOVDD
GND
GND
Figure 48. CMOS Digital Equivalent Circuit for SDIO Bidirectional Input/Output
IOVDD
TESTMODE
DATA(13:0)
SCLK
SYNC_SLEEP
IQFLAG
800 W
67 kW
GND
Figure 49. CMOS Digital Equivalent Circuit for TESTMODE, DATA, SCLK, SYNC_SLEEP and IQFLAG
Inputs
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Product Folder Links: AFE7070
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AFE7070
SLOS761D – FEBRUARY 2012 – REVISED JANUARY 2013
www.ti.com
IOVDD
67 kW
800 W
RESET
SDENB
GND
Figure 50. CMOS Digital Equivalent Circuit for RESET and SDENB Inputs
spacer
REVISION HISTORY
Changes from Original (February 2012) to Revision A
Page
•
Changed the TYPICAL PERFORMANCE PLOTS of the Product Preview data sheet ........................................................ 9
•
Changed the SERIAL INTERFACE of the Product Preview data sheet ............................................................................. 16
Changes from Revision A (July 2012) to Revision B
•
Changed the device status From: Product Preview To: Production ..................................................................................... 1
Changes from Revision B (August 2012) to Revision C
•
36
Page
Added AFE7070IRGZ25 to AVAILABLE OPTIONS ............................................................................................................. 1
Changes from Revision B (October 2012) to Revision D
•
Page
Page
Changed the TYP value of fLO = 450 MHz, Analog Output noise floor From: 156 To: 143 .................................................. 7
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Product Folder Links: AFE7070
PACKAGE OPTION ADDENDUM
www.ti.com
23-Apr-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
AFE7070IRGZR
ACTIVE
VQFN
RGZ
48
2500
RoHS & Green
NIPDAUAG
AFE7070IRGZT
ACTIVE
VQFN
RGZ
48
250
RoHS & Green NIPDAU | NIPDAUAG
Level-3-260C-168 HR
-40 to 85
AFE7070I
Level-3-260C-168 HR
-40 to 85
AFE7070I
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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