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HVDA540QDRQ1

HVDA540QDRQ1

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    SOIC8_150MIL

  • 描述:

    IC TRANSCEIVER HALF 1/1 8SOIC

  • 数据手册
  • 价格&库存
HVDA540QDRQ1 数据手册
Sample & Buy Product Folder Support & Community Tools & Software Technical Documents SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 SN65HVDA54x-Q1, SN65HVDA54x-5-Q1 5-V Can Transceiver With I/O Level Adapting and Low-Power Mode Supply Optimization 1 Features • • 1 • • • • • • • Qualified for Automotive Applications AEC-Q100 Qualified With the Following Results: – Device Temperature Grade 1: –40°C to 125°C – Device HBM ESD Classification Level 3A – Device CDM ESD Classification Level C6 – Device MM ESD Classification Level M4 Meets or Exceeds the Requirements of ISO 11898-2 and ISO 11898-5 GIFT/ICT Compliant ESD Protection up to ±12 kV (Human-Body Model) on Bus Pins I/O Voltage Level Adapting – SN65HVDA54x: Adaptable I/O Voltage Range (VIO) From 3 V to 5.33 V – SN65HVDA54x-5: 5 V VCC Device Version Operating Modes: – Normal Mode: All Devices – Low Power Standby Mode (VCC Not Required, Only VIO Supply Needed Saving System Power) – SN65HVDA540: No Wake Up – SN65HVDA541: RXD Wake Up Request – Silent (Receive Only) Mode: HVDA542 High Electromagnetic Compliance (EMC) Protection – Undervoltage Protection on VIO and VCC – Bus-Fault Protection of –27 V to 40 V HVDA54x Functional Block Diagram – TXD Dominant State Time Out – RXD Wake Up Request Lock Out on CAN Bus Stuck Dominant Fault (HVDA541) – Thermal Shutdown Protection – Power-Up/Down Glitch-Free Bus I/O – High Bus Input Impedance When Unpowered (No Bus Load) 2 Applications • • • • • SAE J2284 High-Speed CAN for Automotive Applications SAE J1939 Standard Data Bus Interface GMW3122 Dual-Wire CAN Physical Layer ISO 11783 Standard Data Bus Interface NMEA 2000 Standard Data Bus Interface 3 Description The SN65HVDA54x-Q1 and SN65HVDA54x-5-Q1 devices, known as the HVDA54x and HVDA54x-5 respectively, are designed and qualified for use in automotive applications and meets or exceeds the specifications of the ISO 11898 High Speed CAN (Controller Area Network) Physical Layer standard (transceiver). Device Information(1) PART NUMBER PACKAGE SN65HVDA54x-Q1, SN65HVDA54x-5-Q1 SOIC (8) VIO/NC HVDA54x-5 Functional Block Diagram (See Note A) VIO DOMINANT TIME-OUT VIO STB DRIVER 6 (See Note B) 8 CANH TXD 1 DOMINANT TIME-OUT DRIVER 6 CANH CANL MODE SELECT LOGIC OUTPUT S 8 MUX RXD VCC OVER TEMPERATURE 7 CANL UNDER VOLTAGE 4 3 (See Note B) OVER TEMPERATURE 1 VCC 5 VCC 7 TXD VIO/NC 3 (See Note B) VIO HVDA542 VCC 5 4.90 mm × 3.91 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. HVDA540 / HVDA541 (See Note A) BODY SIZE (NOM) UNDER VOLTAGE WAKE UP LOGIC / MONITOR Low Power Standby Bus Receiver and Monitor HVDA541 MODE SELECT 4 RXD LOGIC OUTPUT 2 GND Copyright © 2016, Texas Instruments Incorporated HVDA54x devices pin 5 is VIO. HVDA54x-5 devices pin 5 is NC and VIO is internally connected to VCC. 2 GND Copyright © 2016, Texas Instruments Incorporated HVDA54x-5 devices: VIO is internally connected to VCC 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 4 6.1 6.2 6.3 6.4 6.5 6.6 6.7 4 4 4 5 5 8 9 Absolute Maximum Ratings ...................................... ESD Ratings.............................................................. Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Power Dissipation Ratings ........................................ Typical Characteristics .............................................. Parameter Measurement Information ................ 10 Detailed Description ............................................ 14 8.1 Overview ................................................................. 14 8.2 Functional Block Diagrams ..................................... 14 8.3 Feature Description................................................. 15 8.4 Device Functional Modes........................................ 17 9 Application and Implementation ........................ 21 9.1 Application Information............................................ 21 9.2 Typical Applications ................................................ 21 9.3 System Examples ................................................... 23 10 Power Supply Recommendations ..................... 25 11 Layout................................................................... 25 11.1 Layout Guidelines ................................................. 25 11.2 Layout Examples................................................... 26 12 Device and Documentation Support ................. 27 12.1 12.2 12.3 12.4 12.5 12.6 12.7 Documentation Support ........................................ Related Links ........................................................ Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 27 27 27 27 27 27 27 13 Mechanical, Packaging, and Orderable Information ........................................................... 28 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision C (December 2012) to Revision D Page • Changed device numbers From: SN65HVD54x-Q1 To: HVD54x-Q1 .................................................................................... 1 • Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section. ................................................................................................. 1 • Removed Ordering Information table, see POA at the end of the data sheet........................................................................ 4 Changes from Revision B (September 2010) to Revision C Page • Deleted DSJ package info ...................................................................................................................................................... 1 • Deleted DSJ package info ...................................................................................................................................................... 3 • Added note in line 4.5 Test Conditions, "TA = –40°C, 25°C, 125°C"...................................................................................... 5 • Deleted DSJ package info ...................................................................................................................................................... 8 • Deleted DSJ (VSON) package info ...................................................................................................................................... 17 2 Submit Documentation Feedback Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com SLLS804D – MARCH 2009 – REVISED AUGUST 2016 5 Pin Configuration and Functions HVDA54x D Package 8-Pin SOIC Top View HVDA54x-5 D Package 8-Pin SOIC Top View TXD 1 8 STB/S TXD 1 8 STB/S GND 2 7 CANH GND 2 7 CANH VCC 3 6 CANL 6 CANL 4 5 VIO VCC 3 RXD RXD 4 5 NC Not to scale Not to scale Pin Functions PIN NAME HVDA54x HVDA54x-5 CANH 7 7 CANL 6 GND 2 NC TYPE DESCRIPTION I/O High level CAN bus line 6 I/O Low level CAN bus line 2 GND — 5 Supply RXD 4 4 O CAN receive data output (low in dominant bus state, high in recessive bus state) STB/S 8 8 I Mode select: STB, Standby mode (HVDA540/541) select pin (active high) S, Silent mode (HVDA542) select pin (active high) TXD 1 1 I CAN transmit data input (low for dominant bus state, high for recessive bus state) VCC 3 3 Supply Transceiver 5V supply voltage VIO 5 — Supply HVDA54x: Transceiver logic level (IO) supply voltage HVDA54x-5: No connect Copyright © 2009–2016, Texas Instruments Incorporated Ground connection HVDA54x: Transceiver logic level (IO) supply voltage HVDA54x-5: No connect Submit Documentation Feedback Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 3 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) (2) MIN MAX UNIT VCC Supply voltage –0.3 6 V VIO I/O supply voltage –0.3 6 V Voltage at bus terminals (CANH, CANL) –27 40 V 20 mA IO Receiver output current (RXD) VI Voltage input (TXD, STB, S) HVDA54x –0.3 6 V and VI ≤ VIO + 0.3 V HVDA54x-5 –0.3 6 V –40 150 °C 260 °C TJ Operating virtual-junction temperature TLEAD Lead temperature (soldering, 10 seconds) Tstg Storage temperature (1) (2) °C Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values, except differential I/O bus voltages, are with respect to ground terminal. 6.2 ESD Ratings VALUE Human-body model (HBM), per AEC Q100-002 (1) Electrostatic discharge V(ESD) ±4000 Pins 6 and 7 (2) ±12000 Charged-device model (CDM), per AEC Q100-011 ±1000 Machine model ±7000 IEC 61000-4-2 contact discharge (3) (1) (2) (3) All pins except 6 and 7 Pins 6 and 7 to pin 2 UNIT V ±7000 AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. HBM test method based on AEC-Q100-002, CANH and CANL bus pins stressed with respect to each other and GND. IEC 61000-4-2 is a system level ESD test. Results given here are specific to the IBEE CAN EMC Test specification conditions. Different system level configurations will lead to different results. 6.3 Recommended Operating Conditions MIN MAX UNIT 4.68 5.33 V 3 5.33 V –12 12 V 0.7 × VIO VIO V 0 0.3 × VIO V VCC Supply voltage VIO I/O supply voltage VI or VIC Voltage at any bus terminal (separately or common mode) VIH High-level input voltage TXD, STB, S (for HVD54x-5: VIO = VCC) VIL Low-level input voltage TXD, STB, S (for HVD54x-5: VIO = VCC) VID Differential input voltage, bus Between CANH and CANL –6 IOH High-level output current RXD –2 IOL Low-level output current RXD TA Operating ambient free-air temperature See Thermal Information and Power Dissipation Ratings 4 Submit Documentation Feedback –40 6 V mA 2 mA 125 °C Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com SLLS804D – MARCH 2009 – REVISED AUGUST 2016 6.4 Thermal Information THERMAL METRIC HVDA54x, HVDA54x-5-Q1 (1) UNIT D (SOIC) 8 PINS Low-K thermal resistance 140 High-K thermal resistance 112 RθJA Junction-to-ambient thermal resistance RθJC(top) Junction-to-case (top) thermal resistance 56 °C/W RθJB Junction-to-board thermal resistance 50 °C/W ψJT Junction-to-top characterization parameter 13 °C/W ψJB Junction-to-board characterization parameter 55 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance — °C/W (1) °C/W For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. 6.5 Electrical Characteristics over recommended operating conditions, TJ = –40°C to 150°C (unless otherwise noted), HVDA54x-5 devices VIO = VCC PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT SUPPLY CHARACTERISTICS (HVDA54x) Standby mode STB at VIO, VCC = 5.33 V, VIO = 3 V, (HVDA540/54 TXD at VIO (2) 1 Only) 5-V supply current ICC 5 Normal mode TXD at 0 V, 60-Ω load, STB / S at 0 V (Dominant) 50 70 Normal mode TXD at VIO, No load, STB / S at 0 V or S at (Recessive) VIO 5.5 10 Silent Mode (HVDA542 only) 5.5 10 7 15 TXD at VIO, No load, STB / S at 0 V or S at VIO Standby STB at VIO , VCC = 5.33 V or 0 V, RXD mode floating, TXD at VIO (HVDA540/54 TA = –40°C, 25°C, 125°C (3) 1 Only) Normal mode I/O supply current (recessive or dominant) VCC = 5.33 V, RXD floating, TXD at 0 V or and Silent VIO. Normal Mode: STB or S at 0 V. Silent Mode Mode (HVDA542): S at VIO. (HVDA542 Only) IIO UVVCC Undervoltage detection on VCC for forced standby mode Undervoltage detection on VIO for forced standby mode VHYS(UVVIO) Hysteresis voltage for undervoltage detection on UVVIO for forced standby mode (1) (2) (3) mA µA 3.2 Hysteresis voltage for VHYS(UVVCC) undervoltage detection on UVVCC for standby mode UVVIO µA 75 300 3.6 4 200 1.9 2.45 V mV 2.95 130 V mV All typical values are at 25°C and supply voltages of VCC = 5 V and VIO = 3.3 V. The VCC supply is not needed during standby mode so in the application ICC in standby mode may be zero. If the VCC supply remains, then ICC is per specification with VCC. See SN65HVDA54x-Q1 Errata . Copyright © 2009–2016, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 5 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 www.ti.com Electrical Characteristics (continued) over recommended operating conditions, TJ = –40°C to 150°C (unless otherwise noted), HVDA54x-5 devices VIO = VCC PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT SUPPLY CHARACTERISTICS (HVDA54x-5) Standby mode STB at VCC, VCC = 5.33 V, TXD at VCC (HVDA5405/541-5 Only) 5-V supply current ICC (2) Normal mode TXD at 0 V, 60-Ω load, STB / S at 0 V (Dominant) 50 70 Normal mode TXD at VIO, No load, STB / S at 0 V or S at (Recessive) VIO 5.5 10 Silent Mode (HVDA542 only) 5.5 10 3.6 4 TXD at VIO, No load, STB / S at 0 V or S at VIO Undervoltage detection on VCC for forced standby mode UVVCC 20 3.2 Hysteresis voltage for VHYS(UVVCC) undervoltage detection on UVVCC for standby mode 240 µA mA V mV DEVICE SWITCHING CHARACTERISTICS: PROPAGATION TIME (LOOP TIME TXD TO RXD) Total loop delay, driver input tPROP(LOOP1) (TXD) to receiver output (RXD), recessive to dominant tPROP(LOOP2) Total loop delay, driver input (TXD) to receiver output (RXD), dominant to recessive 70 230 Figure 9, STB at 0 V ns 70 230 2.9 4.5 0.8 1.75 DRIVER ELECTRICAL CHARACTERISTICS VO(D) Bus output voltage (dominant) CANH VO(R) Bus output voltage (recessive) VI = VIO, VIO = 3 V, STB at 0 V or S at X (4), RL = 60 Ω, See Figure 2 and Figure 15 VO(STBY) Bus output voltage, standby mode (HVDA540, HVDA541 only) STB / S at VIO, RL = 60 Ω, See Figure 2 and Figure 15 VOD(D) Differential output voltage (dominant) CANL Differential output voltage (recessive) VOD(R) VI = 0 V, STB / S at 0 V, RL = 60 Ω, See Figure 2 and Figure 15 2 2.5 V 3 V –0.1 0.1 V VI = 0 V, RL = 60 Ω, STB / S at 0 V, See Figure 2, Figure 15, and Figure 3 1.5 3 VI = 0 V, RL = 45 Ω, STB / S at 0 V, See Figure 2, Figure 15, and Figure 3 1.4 3 –0.012 0.012 –0.5 0.05 V VI = 3 V, STB / S at 0 V, RL = 60 Ω, See Figure 2 and Figure 15 VI = 3 V, STB / S at 0 V, No load V VSYM Output symmetry (dominant or recessive) (VO(CANH) + VO(CANL)) STB / S at 0 V, RL = 60 Ω, See Figure 12 0.9 VCC VCC 1.1 VCC V VOC(SS) Steady-state common-mode output voltage STB / S at 0 V, RL = 60 Ω, See Figure 8 2 2.5 3 V ΔVOC(SS) Change in steady-state common- STB / S at 0 V, RL = 60 Ω, mode output voltage See Figure 8 IOS(SS)_DOM Short-circuit steady-state output current, Dominant (4) 6 40 VCANH = 0 V, CANL open, TXD = low, See Figure 11 mV –100 VCANL = 32 V, CANH open, TXD = low, See Figure 11 mA 100 For the HVDA542 device the bus output voltage (recessive) will be the same if the device is in normal mode with S pin at 0 V or if the device is in silent mode with the S pin at HIGH. Submit Documentation Feedback Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com SLLS804D – MARCH 2009 – REVISED AUGUST 2016 Electrical Characteristics (continued) over recommended operating conditions, TJ = –40°C to 150°C (unless otherwise noted), HVDA54x-5 devices VIO = VCC PARAMETER IOS(SS)_REC CO Short-circuit steady-state output current, Recessive Output capacitance TEST CONDITIONS MIN TYP (1) MAX –20 V ≤ VCANH ≤ 32 V, CANL open, TXD = high, See Figure 11 –10 10 –20 V ≤ VCANL ≤ 32 V, CANH open, TXD = high, See Figure 11 –10 10 UNIT mA See receiver input capacitance DRIVER SWITCHING CHARACTERISTICS tPLH Propagation delay time, low-tohigh level output STB / S at 0 V, See Figure 4 65 ns tPHL Propagation delay time, high-tolow level output STB / S at 0 V, See Figure 4 50 ns tR Differential output signal rise time STB / S at 0 V, See Figure 4 25 ns tF Differential output signal fall time STB / S at 0 V, See Figure 4 55 ns tEN Enable time from standby or silent mode to normal mode dominant See Figure 7 t(DOM) (5) Dominant time out See Figure 10 300 20 µs 400 700 µs 800 900 mV RECEIVER ELECTRICAL CHARACTERISTICS VIT+ Positive-going input threshold voltage, normal mode STB / S at 0 V, See Table 1 VIT– Negative-going input threshold voltage, normal mode STB / S at 0 V, See Table 1 Vhys Hysteresis voltage (VIT+ – VIT–) VIT(STBY) Input threshold voltage, standby mode (HVDA541 only) STB at VIO II(OFF_LKG) Power-off (unpowered) bus input leakage current CANH = CANL = 5 V, VCC at 0 V, VIO at 0 V, TXD at 0 V CI Input capacitance to ground (CANH or CANL) HVDA54x: TXD at VIO, VIO at 3.3 V. HVDA54x-5: TXD at VCC VI = 0.4 sin (4E6πt) + 2.5 V 13 pF CID Differential input capacitance HVDA54x: TXD at VIO, VIO at 3.3 V. HVDA54x-5: TXD at VCC VI = 0.4 sin(4E6πt) 5 pF RID Differential input resistance RIN Input resistance (CANH or CANL) RI(M) Input resistance matching [1 – ®IN(CANH)/RIN(CANL))] × 100% HVDA54x: TXD at VIO, VIO = 3.3 V, STB at 0 V HVDA54x-5: TXD at VCC, STB at 0 V V(CANH) = V(CANL) 500 650 mV 100 125 mV 400 29 1150 mV 3 µA 80 kΩ 14.5 25 40 kΩ –3 0 3 % RECEIVER SWITCHING CHARACTERISTICS tPLH Propagation delay time, low-tohigh-level output STB / S at 0 V , See Figure 6 95 ns tPHL Propagation delay time, high-tolow-level output STB / S at 0 V , See Figure 6 60 ns tR Output signal rise time STB / S at 0 V , See Figure 6 13 ns tF Output signal fall time STB / S at 0 V , See Figure 6 10 ns (5) The TXD dominant time out (t(DOM)) disables the driver of the transceiver once the TXD has been dominant longer than t(DOM), which releases the bus lines to recessive, preventing a local failure from locking the bus dominant. The driver may only transmit dominant again after TXD has been returned HIGH (recessive). While this protects the bus from local faults, locking the bus dominant, it limits the minimum data rate possible. The CAN protocol allows a maximum of eleven successive dominant bits (on TXD) for the worst case, where five successive dominant bits are followed immediately by an error frame. This, along with the t(DOM) minimum, limits the minimum bit rate. The minimum bit rate may be calculated by: Minimum Bit Rate = 11/ t(DOM) = 11 bits / 300 µs = 37 kbps Copyright © 2009–2016, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 7 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 www.ti.com Electrical Characteristics (continued) over recommended operating conditions, TJ = –40°C to 150°C (unless otherwise noted), HVDA54x-5 devices VIO = VCC PARAMETER TEST CONDITIONS tBUS Dominant time required on bus for wake-up from standby (HVDA541 only) tCLEAR Recessive time on the bus to clear the standby mode receiver output (RXD) if standby mode is entered while bus is dominant (HVDA541 only) MIN TYP (1) MAX UNIT 1.5 5 µs 1.5 5 µs STB at VIO, See Figure 17 and Figure 18 TXD PIN CHARACTERISTICS VIH High-level input voltage HVD54x-5: VIO = VCC VIL Low-level input voltage HVD54x-5: VIO = VCC 0.7 × VIO IIH High-level input current HVDA54x: TXD at VIO HVDA54x-5: TXD at VCC IIL Low-level input current TXD at 0 V V 0.3 × VIO V –2 2 µA –100 –7 µA RXD PIN CHARACTERISTICS VOH High-level output voltage IO = –2 mA, See Figure 6 HVD54x-5: VIO = VCC VOL Low-level output voltage IO = 2 mA, See Figure 6 HVD54x-5: VIO = VCC 0.8 × VIO V 0.2 × VIO V STB PIN CHARACTERISTICS (HVDA540 AND HVDA541 ONLY) VIH High-level input voltage HVD54x-5: VIO = VCC VIL Low-level input voltage HVD54x-5: VIO = VCC 0.7 × VIO IIH High-level input current HVDA54x: STB at VIO HVDA54x-5: STB at VCC IIL Low-level input current STB at 0 V V 0.3 × VIO V 2 µA –2 –20 µA 0.7 × VIO V S PIN CHARACTERISTICS (HVDA542 ONLY) VIH High-level input voltage HVD54x-5: VIO = VCC VIL Low-level input voltage HVD54x-5: VIO = VCC IIH High-level input current HVDA54x: S at VIO HVDA54x-5: S at VCC IIL Low-level input current S at 0 V 0.3 × VIO V 30 µA 2 µA –2 Thermal shutdown temperature 185 °C 6.6 Power Dissipation Ratings over recommended operating conditions, TJ = –40°C to 150°C (unless otherwise noted), HVDA54x-5 devices VIO = VCC MIN PD 8 Average power dissipation VCC = 5 V, VIO = VCC, TJ = 27°C, RL = 60 Ω, STB at 0 V, Input to TXD at 500 kHz, 50% duty cycle square wave, CL at RXD = 15 pF TYP UNIT 140 mW VCC = 5.33 V, VIO = VCC, TJ = 130°C, RL = 60 Ω, STB at 0 V, Input to TXD at 500 kHz, 50% duty cycle square wave, CL at RXD = 15 pF Submit Documentation Feedback MAX 215 Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com SLLS804D – MARCH 2009 – REVISED AUGUST 2016 6.7 Typical Characteristics 3.00E+00 2.50E+00 VOD 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 4.5 4.6 4.7 4.8 4.9 5 5.1 5.2 5.3 5.4 5.5 VCC C001 STB = 0 V RL= 60 Ω CL= Open Rcm= open Temp = 25°C Figure 1. HVDA540 VCC vs VOD from 4.5 V to 5.5 V Copyright © 2009–2016, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 9 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 www.ti.com 7 Parameter Measurement Information Figure 2. Driver Voltage, Current, and Test Definition Figure 3. Driver VOD Test Circuit A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 125 kHz, 50% duty cycle, tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω. B. CL includes instrumentation and fixture capacitance within ±20%. C. For HVDA54x-5 device versions, VIO = VCC. Figure 4. Driver Test Circuit and Voltage Waveforms Figure 5. Receiver Voltage and Current Definitions 10 Submit Documentation Feedback Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com SLLS804D – MARCH 2009 – REVISED AUGUST 2016 Parameter Measurement Information (continued) A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 125 kHz, 50% duty cycle, tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω. B. CL includes instrumentation and fixture capacitance within ±20%. C. C. For HVDA54x-5 device versions VIO = VCC. Figure 6. Receiver Test Circuit and Voltage Waveforms Table 1. Differential Input Voltage Threshold Test INPUT VCANH OUTPUT VCANL |VID| R –11.1 V –12 V 900 mV L 12 V 11.1 V 900 mV L –6 V –12 V 6V L 12 V 6V 6V L –11.5 V –12 V 500 mV H 12 V 11.5 V 500 mV H –12 V –6 V 6V H 6V 12 V 6V H Open Open X H VOL VOH A. CL = 100 pF includes instrumentation and fixture capacitance within ±20%. B. All VI input pulses are from 0 V to VIO and supplied by a generator having the following characteristics: tr or tf ≤ 6 ns. Pulse Repetition Rate (PRR) = 25 kHz, 50% duty cycle. C. C. For HVDA54x-5 device versions VIO = VCC. Figure 7. tEN Test Circuit and Waveforms Copyright © 2009–2016, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 11 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 A. www.ti.com All VI input pulses are from 0 V to VIO and supplied by a generator having the following characteristics: tr or tf ≤ 6 ns. Pulse Repetition Rate (PRR) = 125 kHz, 50% duty cycle. Figure 8. Common-Mode Output Voltage Test and Waveforms A. CL = 100 pF includes instrumentation and fixture capacitance within ±20%. B. All VI input pulses are from 0 V to VIO and supplied by a generator having the following characteristics: tr or tf ≤ 6 ns. Pulse Repetition Rate (PRR) = 125 kHz, 50% duty cycle. C. For HVDA54x-5 device versions, VIO = VCC. Figure 9. tPROP(LOOP) Test Circuit and Waveform A. CL = 100 pF includes instrumentation and fixture capacitance within ±20%. B. All VI input pulses are from 0 V to VIO and supplied by a generator having the following characteristics: tr or tf ≤ 6 ns. Pulse Repetition Rate (PRR) = 500 Hz, 50% duty cycle. C. For HVDA54x-5 device versions, VIO = VCC. Figure 10. TXD Dominant Time Out Test Circuit and Waveforms 12 Submit Documentation Feedback Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com A. SLLS804D – MARCH 2009 – REVISED AUGUST 2016 For HVDA54x-5 device versions VIO = VCC. Figure 11. Driver Short-Circuit Current Test and Waveforms A. All VI input pulses are from 0 V to VIO and supplied by a generator having the following characteristics: tr/tf ≤ 6 ns, Pulse Repetition Rate (PRR) = 250 kHz, 50% duty cycle. Figure 12. Driver Output Symmetry Test Circuit Copyright © 2009–2016, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 13 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 www.ti.com 8 Detailed Description 8.1 Overview The device meets or exceeds the specifications of the ISO 11898 High Speed CAN (Controller Area Network) Physical Layer standard (transceiver). This device provides CAN transceiver functions: differential transmit capability to the bus and differential receive capability at data rates up to 1 megabit per second (Mbps). The device includes many protection features providing device and CAN network robustness. 8.2 Functional Block Diagrams HVDA540 / HVDA541 (See Note A) VIO/NC VCC 3 5 VCC (See Note B) VIO OVER TEMPERATURE 7 TXD 1 DOMINANT TIME-OUT VIO STB DRIVER 6 (See Note B) 8 CANH CANL MODE SELECT RXD 4 LOGIC OUTPUT MUX UNDER VOLTAGE WAKE UP LOGIC / MONITOR Low Power Standby Bus Receiver and Monitor HVDA541 2 GND Copyright © 2016, Texas Instruments Incorporated HVDA54x devices pin 5 is VIO. HVDA54x-5 devices pin 5 is NC and VIO is internally connected to VCC. Figure 13. HVDA54x Functional Block Diagram 14 Submit Documentation Feedback Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com SLLS804D – MARCH 2009 – REVISED AUGUST 2016 Functional Block Diagrams (continued) HVDA542 (See Note A) VIO/NC VCC 3 5 VCC (See Note B) VIO OVER TEMPERATURE 7 TXD S 1 DOMINANT TIME-OUT 8 DRIVER 6 CANH CANL MODE SELECT UNDER VOLTAGE 4 RXD LOGIC OUTPUT 2 GND Copyright © 2016, Texas Instruments Incorporated HVDA54x-5 devices: VIO is internally connected to VCC Figure 14. HVDA54x-5 Functional Block Diagram 8.3 Feature Description 8.3.1 Digital Inputs and Outputs The HVDA54x devices have an I/O supply voltage input pin (VIO) to ratiometrically level shift the digital logic input and output levels with respect to VIO for compatibility with protocol controllers having I/O supply voltages between 3 V and 5.33 V. The HVDA54x-5 devices have a single VCC supply (5 V). The digital logic input and output levels for these devices are with respect to VCC for compatibility with protocol controllers having I/O supply voltages between 4.68 V and 5.33 V. 8.3.2 TXD Dominant State Time Out During normal mode, the only mode where the CAN driver is active, the TXD dominant time out circuit prevents the transceiver from blocking network communication in event of a hardware or software failure where TXD is held dominant longer than the time-out period t(DOM). The dominant time out circuit is triggered by a falling edge on TXD. If no rising edge is seen before the time out constant of the circuit expires (t(DOM)) the CAN bus driver is disabled freeing the bus for communication between other network nodes. The CAN driver is reactivated when a recessive signal is seen on TXD pin, thus clearing the dominant state time out. The CAN bus pins is biased to recessive level during a TXD dominant state time out. Copyright © 2009–2016, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 15 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 www.ti.com Feature Description (continued) NOTE The maximum dominant TXD time allowed by the TXD Dominant state time out limits the minimum possible data rate of the device. The CAN protocol allows a maximum of eleven successive dominant bits (on TXD) for the worst case, where five successive dominant bits are followed immediately by an error frame. This, along with the t(DOM) minimum, limits the minimum bit rate. The minimum bit rate may be calculated in Equation 1: Minimum Bit Rate = 11/t(DOM) (1) 8.3.3 Thermal Shutdown If the junction temperature of the device exceeds the thermal shut down threshold the device will turn off the CAN driver circuits. This condition is cleared once the temperature drops below the thermal shut down temperature of the device. The CAN bus pins will be biased to recessive level during a thermal shutdown. 8.3.4 Undervoltage Lockout and Unpowered Device Both of the supply pins have undervoltage detection which place the device in forced standby mode to protect the bus during an undervoltage event on either the VCC or VIO supply pins. If VIO is undervoltage the RXD pin is tri-stated and the device does not pass any wake-up signals from the bus to the RXD pin. Since the device is placed into forced standby mode the CAN bus pins have a common mode bias to ground protecting the CAN network, see Figure 15 and Figure 16. The device is designed to be an ideal passive load to the CAN bus if it is unpowered. The bus pins (CANH, CANL) have extremely low leakage currents when the device is unpowered so they will not load down the bus but rather be no load. This is critical, especially if some nodes of the network will be unpowered while the rest of the network remains in operation. NOTE Once an undervoltage condition is cleared and the VCC and VIO have returned to valid levels the device will typically need 300 µs to transition to normal operation. Table 2. Undervoltage Protection DEVICE VCC VIO HVDA540 HVDA541 Bad Good HVDA542 (3) 16 BUS RXD Forced Standby Mode Common mode bias to GND (1) HIGH (Recessive) Forced Standby Mode Common mode bias to GND (1) Mirrors bus state via wake-up filter (2) Forced Standby Mode Common mode bias to GND (1) HIGH (Recessive) HVDA54x Good Bad Forced Standby Mode (3) Common mode bias to GND (1) tri-state HVDA54x-5 Bad N/A Forced Standby Mode Common mode bias to GND (1) HIGH (Recessive) or tri-state Unpowered No Load High Z All Devices (1) (2) DEVICE STATE Unpowered See Figure 15 and Figure 16 for common mode bias information. See Figure 17 and Figure 18 for operation of the low power wake up receiver and bus monitor for RXD Wake Up Request behavior and Table 5 for the wake up receiver threshold levels. When VIO is undervoltage, the device is forced into standby mode with respect to the CAN bus since there is not a valid digital reference to determine the digital I/O states or power the wake-up receiver. Submit Documentation Feedback Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com SLLS804D – MARCH 2009 – REVISED AUGUST 2016 8.3.5 Floating Pins The device has integrated pullup and pulldowns on critical pins to place the device into known states if the pins float. The TXD pin is pulled up to VIO to force a recessive input level if the pin floats. The STB is pulled up to the IO supply pin, VIO(HVDA540 and HVDA541), or VCC (HVDA540-5 and HVDA541-5) to force the device in standby mode (low power) if the pin floats. The S pin is pulled down to GND to force the device into normal mode if the pin floats (HVDA542 and HVDA542-5). 8.3.6 CAN Bus Short-Circuit Current Limiting The device has several protection features that limit the short circuit current when a CAN bus line is shorted. These include CAN driver current limiting (dominant and recessive) and TXD dominant state time out to prevent continuously driving dominant. During CAN communication the bus switches between dominant and recessive states, thus the short circuit current may be viewed either as the current during each bus state or as a DC average current. For system current and power considerations in termination resistance and common mode choke ratings the average short circuit current should be used. The device has TXD dominant state time out which prevents permanently having the higher short circuit current of dominant state. The CAN protocol also has forced state changes and recessive bits such as bit stuffing, control fields, and interframe space. These ensure there is a minimum recessive amount of time on the bus even if the data field contains a high percentage of dominant bits. NOTE The short circuit current of the bus depends on the ratio of recessive to dominant bits and their respective short circuit currents. The average short circuit current may be calculated by Equation 2: IOS(AVG) = %Transmit * [(%REC_Bits * IOS(SS)_REC) + (%DOM_Bits * IOS(SS)_DOM)] + [%Receive * IOS(SS)_REC] where • • • • • • • IOS(AVG) is the average short circuit current, %Transmit is the percentage the node is transmitting CAN messages, %Receive is the percentage the node is receiving CAN messages, %REC_Bits is the percentage of recessive bits in the transmitted CAN messages, %DOM_Bits is the percentage of dominant bits in the transmitted CAN messages, IOS(SS)_REC is the recessive steady state short circuit current and IOS(SS)_DOM is the dominant steady-state short circuit current. (2) 8.4 Device Functional Modes The device has two main operating modes: normal mode (all devices) and standby mode (HVDA540 / 541) or silent mode (HVDA542). Operating mode selection is made through the STB (HVDA540 / 541) or the S (HVDA542) input pin. Table 3. Operating Modes (1) (2) DEVICE STB / S MODE DRIVER RECEIVER RXD Pin All Devices LOW Normal Mode Enabled (On) Enabled (On) Mirrors bus state (1) HVDA540 HIGH Standby Mode (No Wake Up) Disabled (Off) Disabled (Off) Recessive (HIGH) Mirrors bus state via wakeup filter (2) Mirrors bus state (1) HVDA541 HIGH Standby Mode (RXD Wake Up Request) Disabled (Off) Low power wake-up receiver and bus monitor enabled HVDA542 HIGH Silent Mode Disabled (Off) Enabled (On) Mirrors bus state: LOW if CAN bus is dominant, HIGH if CAN bus is recessive. See Figure 17 and Figure 18 for operation of the low power wake up receiver and bus monitor for RXD Wake Up Request behavior and Table 5 for the wake up receiver threshold levels. Copyright © 2009–2016, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 17 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 SLLS804D – MARCH 2009 – REVISED AUGUST 2016 www.ti.com 8.4.1 Bus States by Mode The CAN bus has three valid states during powered operation depending on the mode of the device. In normal mode the bus may be dominant (logic LOW) where the bus lines are driven differentially apart or recessive (logic HIGH) where the bus lines are biased to VCC/2 via the high-ohmic internal input resistors RIN of the receiver. The third state is low power standby mode where the bus lines will be biased to GND via the high-ohmic internal input resistors RIN of the receiver. Typical Bus Voltage CANH Low Power Standby Mode Normal & Silent Mode VCC/2 A RXD CANH B CANL Vdiff Vdiff CANL A: Normal Mode B: Low Power Standby Mode Recessive Dominant Recessive Time, t Figure 15. Bus States (Physical Bit Representation) Figure 16. Simplified Common Mode Bias and Receiver Implementation 8.4.2 Normal Mode This is the normal operating mode of the device. It is selected by setting STB or S low. The CAN driver and receiver are fully operational and CAN communication is bidirectional. The driver is translating a digital input on TXD to a differential output on CANH and CANL. The receiver is translating the differential signal from CANH and CANL to a digital output on RXD. In recessive state the CAN bus pins (CANH and CANL) are biased to 0.5 × VCC. In dominant state the bus pins are driven differentially apart. Logic high is equivalent to recessive on the bus and logic low is equivalent to a dominant (differential) signal on the bus. 8.4.3 Standby Mode (HVDA540) This is the low power mode of the device. It is selected by setting STB high. The CAN driver and receiver are turned off and bidirectional CAN communication is not possible. There is no wake up capability in the HVDA540, the RXD pin will remain recessive (high) while the device is in standby mode. This state is supplied via the VIO supply, thus the VCC (5V) supply may be turned off for additional power savings at the system level. The local protocol controller (MCU) should reactivate the device to normal mode to enable communication via the CAN bus. The 5 V (VCC) supply needs to be reactivated by the local protocol controller to resume normal mode if it has been turned off for low-power standby operation. The CAN bus pins are weakly pulled to GND, see Figure 15 and Figure 16. 8.4.4 Standby Mode With RXD Wake Up-Request (HVDA541) This is the low power mode of the device. It is selected by setting STB high. The CAN driver and main receiver are turned off and bidirectional CAN communication is not possible. The low power receiver and bus monitor, both supplied via the VIO supply, are enabled to allow for RXD wake up requests via the CAN bus. The VCC (5V) supply may be turned off for additional power savings at the system level. A wake up request will be output to RXD (driven low) for any dominant bus transmissions longer than the filter time tBUS. The local protocol controller (MCU) should monitor RXD for transitions and then reactivate the device to normal mode based on the wake up request. The 5 V (VCC) supply needs to be reactivated by the local protocol controller to resume normal mode if it has been turned off for low-power standby operation. The CAN bus pins are weakly pulled to GND, see Figure 15 and Figure 16. 8.4.4.1 RXD Wake Up Request Lock Out for Bus Stuck Dominant Fault (HVDA541) If the bus has a fault condition where it is stuck dominant while the HVDA541 is placed into standby mode via the STB pin, the device locks out the RXD wake up request until the fault has been removed to prevent false wake up signals in the system. 18 Submit Documentation Feedback Copyright © 2009–2016, Texas Instruments Incorporated Product Folder Links: SN65HVDA540-Q1 SN65HVDA541-Q1 SN65HVDA542-Q1 SN65HVDA540-5-Q1 SN65HVDA541-5-Q1 SN65HVDA542-5-Q1 SN65HVDA540-Q1, SN65HVDA541-Q1 SN65HVDA542-Q1, SN65HVDA540-5-Q1 SN65HVDA541-5-Q1, SN65HVDA542-5-Q1 www.ti.com SLLS804D – MARCH 2009 – REVISED AUGUST 2016 Standby Mode, STB = High STB Bus VDiff tBUS
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