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LM5064PMHE/NOPB

LM5064PMHE/NOPB

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    TSSOP28_9.7X4.4MM_EP

  • 描述:

    IC HOT SWAP CTRLR SMBUS 28TSSOP

  • 数据手册
  • 价格&库存
LM5064PMHE/NOPB 数据手册
LM5064 www.ti.com SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 LM5064 Negative Voltage System Power Management and Protection IC with PMBus Check for Samples: LM5064 FEATURES APPLICATIONS • • • • • 1 2 • • • • • • • • • • • • • Input Voltage Range: -10V to -80V Programmable 26 mV or 50 mV Current Limit Threshold with Power Limiting (MOSFET Power Dissipation Limiting) Real Time Monitoring of VIN, VOUT, IIN, PIN, VAUX with 12-Bit Resolution and 1 kHz Sampling Rate Configurable Circuit Breaker Protection for Hard Shorts Configurable Under-Voltage and Over-Voltage Protection Remote Temperature Sensing with Programmable Warning and Shutdown Thresholds Detection and Notification of Damaged MOSFET Condition Power Measurement Accuracy: ±4.5% Over Temperature True Input Power Averages Dynamic Power Readings Averaging of VIN, IIN, PIN, and VOUT Over Programmable Interval Ranging from 0.001 to 4 Seconds Programmable WARN and FAULT Thresholds with SMBA Notification Black Box Capture of Telemetry Measurements and Device Status Triggered by WARN or FAULT Condition I2C/SMBus Interface and PMBus Compliant Command Structure Full Featured Application Development Software HTSSOP-28 Package Base Station Power Distribution Systems Intelligent Solid State Circuit Breaker -24V/-48V Industrial Systems DESCRIPTION The LM5064 combines a high performance hot swap controller with a PMBusTM compliant SMBus/I2C interface to accurately measure, protect and control the electrical operating conditions of systems connected to a backplane power bus. The LM5064 continuously supplies real-time power, voltage, current, temperature and fault data to the system management host via the SMBus interface. The LM5064 control block includes a unique hot swap architecture that provides current and power limiting to protect sensitive circuitry during insertion of boards into a live system backplane, or any other "hot" power source. A fast acting circuit breaker prevents damage in the event of a short circuit on the output. The input under-voltage and over-voltage levels and hysteresis are configurable, as well as the insertion delay time and fault detection time. A temperature monitoring block on the LM5064 interfaces with a low-cost external diode for monitoring the temperature of the external MOSFET or other thermally sensitive components. The PGD output provides a fast indicator when the input and/or output voltages are outside their programmed ranges. The LM5064 monitoring circuit computes both the real-time and average values of subsystem operating parameters (VIN, IIN, PIN, VOUT) as well as the peak power. Accurate power averaging is accomplished by averaging the product of the input voltage and current. A black box (Telemetry/Fault Snapshot) function captures and stores telemetry data and device status in the event of a warning or a fault. 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2011–2013, Texas Instruments Incorporated LM5064 SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 www.ti.com Typical Application Circuit GND GND VDD LOAD R1 VAUXH UVLO/EN R2 PGD Z1 0V-2.97V Auxiliary ADC Input INPUT RAIL -48V EN OUT OVLO R3 SMBus Interface RPG VCC ADR0 ADR1 ADR2 + GATE SMBA SCL SDAI SDAO LM5064 D1 SENSE VAUX CL RETRY VEE TIMER VREF SENSE_ K VEE_K VDD 1 µF CT COUT PWR DIODE 1 µF Q1 RPWR QT RS OUTPUT Connection Diagram VCC VAUXH NC GATE UVLO/EN OVLO SENSE SENSE_K VEE_K VEE SDAI SDAO SCL SMBA 1 2 3 4 5 6 7 Exposed Pad 8 9 10 11 12 13 14 28 PGD 27 NC 26 OUT 25 PWR 24 TIMER 23 RETRY 22 CL 21 VDD 20 ADR0 19 ADR1 18 ADR2 17 VAUX 16 DIODE 15 VREF Top View 28-Lead HTSSOP 9.7 mm × 4.4 mm × 0.9 mm PWP0028A Package PIN DESCRIPTIONS Pin# Name 1 VCC 2 VAUXH 3 NC 4 GATE 5 UVLO/EN 6 OVLO 2 Description Positive supply input. Connect the VCC pin to the positive voltage rail. High voltage auxiliary input. VCC with respect to VEE is measured by connecting the VAUXH pin to the VCC rail. No connect. This pin is not internally connected and should not be connected to any signal or power rail. MOSFET gate control signal for fault control of the output. The GATE pin is clamped to VEE through a 12.6V internal zener diode. Under-voltage lockout threshold input. Connecting the UVLO pin to a resistor divider from VCC to VEE will set the under-voltage lockout threshold. After the UVLO pin voltage falls below 2.48V, an internal 20 µA current source is switched to provide a user settable hysteresis. The UVLO pin can be toggled directly to act as a precision enable. After the UVLO threshold voltage is exceeded, the output voltage will begin to transition to VVEE as the GATE pin supplies 52 µA to turn on the MOSFET. Over-voltage lockout threshold input. Connecting the OVLO pin to a resistor divider from VCC to VEE will set the over-voltage lockout threshold. After the OVLO pin voltage exceeds 2.47V, an internal 21 µA current source is switched to provide a user settable hysteresis. If the OVLO threshold is exceeded, the MOSFET will be immediately disabled to protect the output. Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 LM5064 www.ti.com SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 PIN DESCRIPTIONS (continued) Pin# Name 7 SENSE Description 8 SENSE_K 9 VEE_K 10 VEE Negative supply input. Connect the VEE pin to the negative voltage supply rail. Use a small ceramic bypass capacitor (0.1 µF) from the VEE pin to the VCC pin to suppress transient current spikes when the load switch is turned off. The operational voltage range for the VEE pin is -10V to -80V. The VEE pin absolute maximum voltage is -100V. 11 SDAI SMBus data input. The SDAI pin is designed to read PMBus commands using the SMBus communication protocol. SDAI can be connected to SDAO if desired. 12 SDAO SMBus data output. The SDAO pin is designed to transmit PMBus commands using the SMBus communication protocol. SDAO can be connected to SDAI if desired. Current limit and power limit sense input. SENSE provides a direct connection to the MOSFET source and current sense resistor voltage to detect current limit and power limit events. This unfiltered signal will allow the LM5064 to quickly respond during over-current or over-power events. Current telemetry Kelvin sense positive input. SENSE_K is the positive input to a precision differential current sense amplifier. Connecting SENSE_K to the positive terminal of the current sense resistor will provide an accurate current telemetry signal. Current telemetry Kelvin sense negative input. The VEE_K pin is the negative input to a precision differential current sense amplifier. Connecting VEE_K to the negative terminal of the current sense resistor will provide an accurate current signal. 13 SCL 14 SMBA SMBus clock input. SMBus alert. This pin is connected to an open drain MOSFET which pulls the pin to VEE if a fault is detected. 15 VREF Internal ADC reference output. Connect a 1 µF capacitor from the VREF pin to VEE to filter noise imposed on the internal reference output. 16 DIODE Positive diode sense. The DIODE pin should be connected to the anode of a diode whose cathode is connected to VEE for temperature monitoring. 17 VAUX Auxiliary pin allows voltage telemetry from an external source. Full scale input of 2.97V. 18 ADR2 Address pin 2. The address pins can be connected to VDD, VEE, or left open to set the PMBus address of the LM5064. 19 ADR1 Address pin 1 The address pins can be connected to VDD, VEE, or left open to set the PMBus address of the LM5064. 20 ADR0 Address pin 0. The address pins can be connected to VDD, VEE, or left open to set the PMBus address of the LM5064. 21 VDD Internal 4.9V sub-regulator output. VDD must be connected and closely coupled to VEE through a 1 µF ceramic bypass capacitor. 22 CL 23 RETRY Retry selction pin. Connecting RETRY to VDD sets the LM5064 to lockout after a fault condition is detected. Connecting RETRY to VEE sets the LM5064 to retry after a fault condition. 24 TIMER Timing input. Set the insertion time delay and the fault timeout period by connecting a capacitor from the TIMER pin to VEE. The restart time is also set through the TIMER pin when in restart mode. 25 PWR Power limit input. Connecting a resistor from PWR to VEE sets the maximum power dissipation allowed in the external MOSFET switch. Power is calculated using the current information through the current sense resistor and voltage sensed across the MOSFET. 26 OUT Output voltage sense input. The OUT pin is used to sense the output voltage and calculate the power across the MOSFET switch. 27 NC 28 PGD EP EP Current limit threshold input. The LM5064 detects current limit events by sensing the voltage across a series resistor. The current limit threshold is set to 26 mV by connecting CL to VDD and 50 mV when CL is connected to VEE. No connect. This pin is not internally connected and should not be connected to any signal or power rail. Power good monitor output. Open-drain output pulls low during over-current, UVLO, and OVLO. An external pull-up resistor to VDD or external rail is required. Exposed pad. Connect to PCB VEE plane using multiple thermal vias. These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 3 LM5064 SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 Absolute Maximum Ratings www.ti.com (1) VCC, UVLO/EN, OUT, VAUXH, PGD to VEE -0.3V to 100V GATE to VEE -0.3V to 16V OVLO, TIMER, PWR to VEE -0.3V to 7V SENSE_K, SENSE, VEE_K to VEE -0.3V to +0.3V SCL, SDAI, SDAO, SMBA, CL, ADR0, ADR1, ADR2, VDD, VAUX, DIODE, RETRY , VREF to VEE -0.3V to 6V ESD Rating Human Body Model (2) 2 kV Storage Temperature -65°C to 150°C Junction Temperature 150°C (1) (2) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which operation of the device is intended to be functional. For specifications and test conditions, see the Electrical Characteristics. The human body model is a 100 pF capacitor discharged through a 1.5 kΩ resistor into each pin. 2 kV rating for all pins except GATE and PGD which are rated at 1.5 kV and 1 kV respectively. Operating Ratings VCC supply voltage above VEE 10V to +80V OUT voltage above VEE 0V to +80V PGD off voltage above VEE 0V to +80V −40°C to + 125°C Junction temperature 4 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 LM5064 www.ti.com SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 Electrical Characteristics Limits in standard type are for TJ = 25°C only; limits in boldface type apply over the junction temperature (TJ) range of -40°C to +125°C. Minimum and Maximum limits are specified through test, design, or statistical correlation. Typical values represent the most likely parametric norm at TJ = 25°C, and are provided for reference purposes only. Unless otherwise stated the following conditions apply: VCC-VEE = 48V. See (1) (2). Symbol Parameter Conditions Min Typ Max Units Input (VCC) IIN-EN Input current, enabled VCC - VEE = 48V, UVLO/EN = 5V 6 8 mA PORIT Threshold voltage to start insertion timer VCC - VEE increasing 8 9.2 V POREN Threshold voltage to enable all functions VCC - VEE increasing 8.7 9.9 V POREN hysteresis VCC - VEE decreasing 170 Enabled, OUT = VEE -100 nA Disabled, OUT = VEE + 48V 135 µA POREN-HYS mV Output (OUT) IOUT-EN OUT bias current, enabled IOUT-DIS OUT bias current, disabled (3) OVLO/UVLO UVLOTH UVLO/EN threshold UVLO/EN Falling UVLOHYS UVLO/EN hysteresis current UVLO/EN = VEE + 2V UVLODEL UVLO delay Delay to GATE high 9 Delay to GATE low 12 UVLOBIAS UVLO/EN bias current 2.41 2.48 2.55 V 13 20 26 µA UVLO/EN = VEE + 5V µs µs 1 µA OVLOTH OVLO threshold OVLOHYS OVLO hysteresis current OVLO = VEE + 2.8V OVLODEL OVLO delay Delay to GATE high 10 µs Delay to GATE low 12 µs OVLOBIAS OVLO bias current OVLO = 2.3V Power limit sense voltage (OUT-SENSE) OUT – SENSE = 48V, RPWR = 145 kΩ 2.39 2.47 2.53 V -26 -21 -13 µA 1 µA 29.5 mV Power Limit (PWR) PWRLIM-1 PWRLIM-2 IPWR RSAT(PWR) 19.5 24.5 OUT - SENSE = 24V, RPWR = 75 kΩ 24.7 mV PWR pin current VPWR = 2.5V -18 µA PWR pin impedance when disabled UVLO/EN = 2.0V 140 Ω Source current Normal Operation -72 Sink current UVLO/EN < VEE+2V 3.4 SENSE - VEE =150 mV, VGATE =VEE+5V 50 Gate Control (GATE) IGATE VGATE -52 -32 µA 4.1 5.3 mA 111 180 mA Gate output voltage in normal operation GATE-VEE Voltage 12.6 V VCL Current limit threshold voltage CL = VDD VCL Current limit threshold voltage CL = VEE or FLOAT tCL Response time SENSE-VEE stepped from 0 mV to 80 mV 54 µs SENSE input current Enabled, OUT = VEE -5 µA Disabled, OUT = VCC -55 µA -10 µA Current Limit ISENSE ISENSE_K (1) (2) (3) (4) (4) (4) SENSE_K input current 23 26 30 mV 47 50 53 mV Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which operation of the device is intended to be functional. For specifications and test conditions, see the Electrical Characteristics. Current out of a pin is indicated as a negative value. OUT bias current (disabled) due to leakage current through an internal 1 MΩ resistance from SENSE to OUT. CL bit High or Low is set by either the CL pin on startup (if CL = VDD, then High, if CL = VEE or FLOAT, then Low) or by the current limit setting bit in the device setup register. Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 5 LM5064 SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 www.ti.com Electrical Characteristics (continued) Limits in standard type are for TJ = 25°C only; limits in boldface type apply over the junction temperature (TJ) range of -40°C to +125°C. Minimum and Maximum limits are specified through test, design, or statistical correlation. Typical values represent the most likely parametric norm at TJ = 25°C, and are provided for reference purposes only. Unless otherwise stated the following conditions apply: VCC-VEE = 48V. See (1) (2). Symbol IVEE_K Parameter Conditions Min VEE_K input current Typ Max -10 Units µA Circuit Breaker RTCB VCB tCB Circuit breaker to current limit ratio: (VSENSE-VVEE)/VCL Circuit breaker threshold voltage: (VSENSE-VVEE) Circuit breaker response time CB/CL ratio bit = 0, ILim = 50 mV 1.45 1.9 2.22 CB/CL ratio bit = 1, ILim = 50 mV 2.8 3.7 4.9 CB/CL ratio bit = 0, ILim = 26 mV 1.8 CB/CL ratio bit = 1, ILim = 26 mV 3.6 CB/CL ratio bit = 0, ILim = 50 mV 72 93 116 mV CB/CL ratio bit = 1, ILim = 50 mV 144 187 230 mV CB/CL ratio bit = 0, ILim = 26 mV 37 49 59 mV CB/CL ratio bit = 1, ILim = 26 mV 72 93 116 mV SENSE-VEE stepped from 0 mV to 150 mV, time to GATE = VEE 800 ns Timer (TIMER) VTMRH Upper threshold VTMRL Lower threshold Restart cycles 3.74 3.9 4.07 V 1.09 1.2 1.39 V End of 8th cycle 0.3 Re-enable threshold ITIMER 0.3 Insertion time current Sink current, end of insertion time TIMER pin = VEE+2V Fault detection current SENSE-VEE=VCL Fault sink current DCFAULT tFAULT V -5.9 -4.8 -3.3 µA 1 1.5 2 mA -95 -74 -50 µA 1.7 2.4 3.2 µA Fault restart duty cycle Fault to GATE = VEE delay V TIMER pin reaches the upper threshold 0.5 % 15 µs Power Good (PGD) PGDTH Threshold measured at OUT - OUT – SENSE Decreasing SENSE OUT – SENSE Increasing PGDVOL Output low voltage ISINK = 2 mA PGDIOH Off leakage current VPGD = 80V 1.18 1.24 1.31 V 2.44 2.5 2.56 V 50 150 mV 5 µA ADC and MUX Resolution INL tACQUIRE tRR 12 Bits Integral non-linearity ADC only ±4 LSB Acquisition + conversion time Any Channel 100 µs Acquisition round robin time Cycle all channels 1 ms Internal Reference VREF Telemetry Accuracy IINFSR Reference voltage 2.93 Current input full scale range CL= VEE (6) CL = VDD IINLSB Current input LSB CL= VEE (5) (6) 6 (6) (6) CL = VDD VAUXFSR 2.97 3.02 V (5) (6) VAUX input full scale range 74.9 mV 38.1 mV 18.3 µV 9.3 µV 2.96 V Full scale range depends on both the VREF value and the gain/attenuation of the current/voltage channel. CL bit High or Low is set by either the CL pin on startup (if CL = VDD, then High, if CL = VEE or FLOAT, then Low) or by the current limit setting bit in the device setup register. Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 LM5064 www.ti.com SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 Electrical Characteristics (continued) Limits in standard type are for TJ = 25°C only; limits in boldface type apply over the junction temperature (TJ) range of -40°C to +125°C. Minimum and Maximum limits are specified through test, design, or statistical correlation. Typical values represent the most likely parametric norm at TJ = 25°C, and are provided for reference purposes only. Unless otherwise stated the following conditions apply: VCC-VEE = 48V. See (1) (2). Symbol Parameter VAUXLSB Conditions Min Typ Max Units VAUX input LSB 724 VAUXHFSR VAUXH input full scale range 88.9 V VAUXHLSB VAUXH input LSB 21.7 mV OUTLSB OUT pin LSB µV 21.7 mV IINACC Input current accuracy SENSE_K-VEE_K = 50 mV, CL = VEE (Note 6) -3.0 3.0 % VACC VAUX, VAUXH, OUT VAUXH-VEE=48V,OUT - VEE= 48V, VAUX = 2.8V -2.7 2.7 % PINACC Input power accuracy VCC-VEE = 48V, SENSE_K-VEE_K = 50 mV, CL = VDD -4.5 4.5 % Diode Temperature Sensor TACC Temperature accuracy using local diode TA = 25°C to 85°C 2 Remote diode resolution IDIODE °C 9 External diode current source High Level 250 Low Level bits 325 9.4 Diode current ratio µA µA 25.9 VAUX IIN Input current VAUX = 3V VDD regulated output IDD = 0 mA 1 µA 5.15 V VDD Regulation VDDOUT 4.6 IDD = -10 mA VDDILIM VDD current limit VDD = 0V VDDPOR VDD voltage reset threshold VDD Rising PMBus Pin Thresholds (SCL, SDAI/O, SMBA) 4.9 4.8 -25 -30 V -42 4.1 mA V (7) VIL Data, clock input low voltage With respect to VEE VIH Data, clock input high voltage With respect to VEE VOL Data output low voltage ISINK = 3 mA ILEAK Input leakage current SDAI, SMBA, SCL = 5V above VEE 0.9 V 2.1 5.5 V 0 0.4 µA 1 µA Pin Strappable Thresholds (CL, RETRY) VIH ILEAK Thermal (7) (8) Input high voltage Input leakage current 3 CL,RETRY = 5V V 5 µA (8) θJA Junction to ambient 30 °C/W θJC Junction to case 4 °C/W PMBus communication clock rate at final test is 400 kHz. Junction to ambient thermal resistance is highly application and board layout dependent. Specified thermal resistance values for the package specified is based on a 4-layer, 4"x3", 2/1/1/2 oz. Cu board as per JEDEC standards is used. For detailed information on soldering plastic HTSSOP packages refer to the Packaging Data Book. Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 7 LM5064 SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 www.ti.com Typical Performance Characteristics Unless otherwise specified the following conditions apply: TJ = 25°C, VCC-VEE = 48V. VCC Pin Current SENSE Pin Current -4.70 VCC = 80V 6.2 6.0 SENSE PIN CURRENT ( A) VCC INPUT CURRENT (mA) 6.4 VCC = 48V 5.8 VCC = 9V 5.6 5.4 5.2 -50 -4.75 -4.80 -4.84 -4.90 -4.95 -5.00 -25 0 25 50 75 TEMPERATURE (°C) 100 125 -50 SENSE_K Pin Current (Enabled) VEE_K PIN CURRENT ( A) SENSE_K PIN CURRENT ( A) -9.3 -9.6 -9.9 -10.2 -10.5 -10.8 -11.1 -11.4 -9.4 -9.6 -9.8 -10.0 -10.2 -10.4 -11.7 -10.6 -25 0 25 50 75 TEMPERATURE (°C) 100 125 -50 OUT Pin Current (Disabled) -25 0 25 50 75 100 125 TEMPERATURE (°C) GATE Output Voltage (VGATE) 240 15 210 180 VCC = 48V 150 120 90 60 VCC - VEE = 80V 14 VCC = 80V GATE PIN VOLTAGE (V) OUT PIN CURRENT ( A) 100 125 -9.2 -12.0 -50 VCC = 9V 30 13 12 VCC - VEE = 48V 11 10 9 8 VCC - VEE = 9V 7 0 6 -50 -25 0 25 50 75 TEMPERATURE (°C) 100 125 GATE Pin Source Current -50 -25 0 25 50 75 TEMPERATURE (°C) 100 125 VSNS (SENSE_K-VEE_K) at Power Limit Threshold RPWR = 75 kΩ -51.6 30 VCC-VEE=48V, CL = VEE -51.7 VSNSVOLTAGE (mV) GATE PIN SOURCE CURRENT ( A) 0 25 50 75 TEMPERATURE (°C) VEE_K Pin Current (Enabled) -9.0 -51.8 -51.9 -52.0 25 20 VCC-VEE=24V, CL = VDD 15 10 -52.1 -52.2 -50 8 -25 5 -25 0 25 50 75 TEMPERATURE (°C) 100 125 -50 Submit Documentation Feedback -25 0 25 50 75 TEMPERATURE (°C) 100 125 Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 LM5064 www.ti.com SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 Typical Performance Characteristics (continued) Unless otherwise specified the following conditions apply: TJ = 25°C, VCC-VEE = 48V. UVLO Threshold UVLO Hysteresis Current 20.4 UVLO HYSTERESIS CURRENT ( A) 2.490 UVLO THRESHOLD (V) 2.488 2.486 2.484 2.482 2.480 2.478 2.476 2.474 2.472 2.470 -50 -25 0 25 50 75 100 125 TEMPERATURE (°C) 20.2 20.0 19.8 19.6 19.4 19.2 -50 OVLO Threshold -25 0 25 50 75 TEMPERATURE (°C) 100 125 OVLO Hysteresis Current OVLO HYSTERESIS CURRENT ( A) OVLO THRESHOLD (V) 2.480 2.475 2.470 2.465 2.460 2.455 2.450 -50 -25 -19.9 -20.0 -20.1 -20.2 -20.3 -20.4 -20.5 -20.6 -50 0 25 50 75 100 125 TEMPERATURE (°C) Current Limit Threshold CIRCUIT BREAKER THRESHOLD (mV) CURRENT LIMIT THRESHOLD (V) CL = VEE 50 45 40 35 CL = VDD 25 20 -50 -25 0 25 50 75 TEMPERATURE (°C) 100 125 Reference Voltage 180 160 CL = VEE, CB/CL BIT = HIGH 140 120 100 CL = VEE, CB/CL BIT = LOW 80 60 CL = VDD, CB/CL BIT = LOW 40 -50 -25 0 25 50 75 TEMPERATURE (°C) 100 125 IIN Measurement Accuracy (SENSE_K-VEE_K = 50 mV) 1.6 2.974 1.2 CL=VEE 0.8 IIN ERROR (%) 2.972 VREF (V) 100 125 200 2.976 2.970 2.968 2.966 0.4 0.0 -0.4 -0.8 2.964 -1.2 2.962 -50 0 25 50 75 TEMPERATURE (°C) Circuit Breaker Threshold 55 30 -25 -1.6 -25 0 25 50 75 100 125 TEMPERATURE (°C) -50 -25 0 25 50 75 TEMPERATURE (°C) 100 125 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 9 LM5064 SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 www.ti.com Typical Performance Characteristics (continued) Unless otherwise specified the following conditions apply: TJ = 25°C, VCC-VEE = 48V. PIN Measurement Accuracy (SENSE_K-VEE_K = 50 mV) Startup (Insertion Delay) 1.0 INSERTION DELAY = 140 ms 0.8 PIN ERROR (%) 0.6 CL=VEE VTIMER (2V/Div) 0.4 0.2 0.0 -0.2 -0.4 VOUT (20V/Div) -0.6 VSYS (20V/Div) -0.8 -1.0 -50 -25 0 25 50 75 TEMPERATURE (°C) IIN (5A/Div) 100 125 Short Circuit VOUT 40 ms/div Startup (1A Load) VTIMER (2V/Div) VOUT (20V/Div) VOUT (20V/Div) VSYS (20V/Div) (-48V) VSYS (5V/Div) VTIMER (2V/Div) VGATE (20V/Div) IIN (5A/Div) 40 ms/div 1s/div Startup (UVLO/EN, OVLO) Startup (PGD) VGATE (20V/Div) VPGOOD (2V/Div) VSYS (25V/Div) VSYS (25V/Div) VOUT (25V/Div) VOUT (25V/Div) 400 ms/div 10 400 ms/div Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 LM5064 www.ti.com SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 Typical Performance Characteristics (continued) Unless otherwise specified the following conditions apply: TJ = 25°C, VCC-VEE = 48V. Current Limit Event (CL = VDD) Circuit Breaker Event (CL = VDD) VTIMER (2V/Div) VTIMER (2V/Div) VGATE (5V/Div) VOUT (20V/Div) VGATE (5V/Div) CL = 8.7A CB=1.8 x CL VOUT (20V/Div) IIN (5A/Div) IIN (5A/Div) 4 ms/div 400 µs/div Retry Event (RETRY = VEE) Latch Off (RETRY = VDD) VTIMER (2V/Div) VTIMER (2V/Div) VOUT (20V/Div) (-48V) VOUT (20V/Div) (-48V) VGATE (10V/Div) VIN (20V/Div) IIN (1A/Div) 400 ms/div 100 ms/div Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 11 LM5064 SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 www.ti.com PGD OUT VAUXH VEE_K SENSE_K SENSE BLOCK DIAGRAM VCC LM5064 VEE 1.24V/2.5V VDD REG VDD UV OV Ref S/H AMUX 12 bit ADC VCC Current Limit Threshold 1/30 VREF 1/30 IDS 26/50 mV 52 µA DIODE 1 M: Power Limit Threshold VAUX VEE Current Telemetry Sense Diode Temp Sense VDS GATE CONTROL 4.1 mA 111 mA VEE Circuit Breaker Threshold Current Limit/ Power Limit Control VEE (26|50) x (1.8,3.6|1.9,3.7) mV 4.8 µA Insertion Timer MEASUREMENT/ FAULT REGISTERS SCL SDAI SDAO SMBUS INTERFACE GATE 12.6V 74 µA Fault Timer 18 µA TIMER 21 µA TELEMETRY STATE MACHINE OV 2.4 µA TIME AND GATE LOGIC CONTROL 2.47V Fault Discharge VEE VEE UV SMBA 1.5 mA End Insertion Time 3.9V 2.48V 1.2V ADDRESS DECODER 0.3V 20 µA OVLO PWR ADR2 Enable POR UVLO /EN 8.7V/8.53V VCC Insertion Timer POR 8V VCC RETRY VEE ADR1 CL ADR0 Figure 1. Block Diagram 12 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 LM5064 www.ti.com SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 FUNCTIONAL DESCRIPTION The LM5064 is designed to control the in-rush current to the load upon insertion of a circuit card into a live backplane or other “hot” power source, thereby limiting the voltage sag on the backplane’s supply and the dv/dt of the voltage applied to the load. The effect from the insertion event on other circuits in the system is minimized, preventing possible unintended resets. A controlled shutdown when the circuit card is removed can also be implemented using the LM5064. In addition to a programmable current limit, the LM5064 monitors and limits the maximum power dissipation in the series pass device (Q1) to maintain operation within the device’s Safe Operating Area (SOA). Either current limiting or power limiting for an extended period of time (user defined) results in the shutdown of the series pass device. In this event, the LM5064 can latch off or repetitively retry based on the hardware setting of the RETRY pin. Once started, the number of retries can be set to 0, 1, 2, 4, 8, 16, or infinite. The circuit breaker function quickly switches off the series pass device upon detection of a severe over-current condition. Programmable under-voltage lockout (UVLO) and over-voltage lockout (OVLO) circuits shut down the LM5064 when the system input voltage (VSYS) is outside the desired operating range. The telemetry capability of the LM5064 provides intelligent monitoring of the input voltage, output voltage, input current, input power, temperature, and an auxiliary input. The LM5064 also provides a peak capture of the input power and programmable hardware averaging of the input voltage, current, power, and output voltage. Warning thresholds which trigger the SMBA pin may be programmed for input and output voltage, current, power and temperature via the PMBus interface. Additionally, the LM5064 is capable of detecting damage to the external MOSFET, Q1. Operating Voltage The LM5064 operating voltage is the voltage supplied between VCC and VEE (VCC-VEE) which has an operating range of 10V to 80V with a 100V transient capability. All signals to the IC are referenced to the VEE voltage which acts as the effective return path for the IC. Power Up Sequence Referring to Figure 2, as the system voltage (VSYS) initially increases, the external N-channel MOSFET (Q1) is held off by an internal 111 mA pull-down current at the GATE pin. The strong pull-down current at the GATE pin prevents an inadvertent turn on as the MOSFET’s gate-to-drain (Miller) capacitance is charged. Additionally, the TIMER pin is initially held at VEE. When the operating voltage of the LM5064 (VCC - VEE) reaches the PORIT threshold, the insertion time begins. During the insertion time, the capacitor at the TIMER pin (CT) is charged by a 4.8 µA current source, and Q1 is held off by a 4.1 mA pull-down current at the GATE pin regardless of the input voltage. The insertion time delay allows ringing and transients on VSYS to settle before Q1 is enabled. The insertion time ends when the TIMER pin voltage reaches 3.9V. CT is then quickly discharged by an internal 1.5 mA pull-down current. The GATE pin then switches on Q1 when the operating voltage exceeds the UVLO threshold. If the operating voltage is above the UVLO threshold at the end of the insertion time,(t1 in Figure 2) the GATE pin sources 52 µA to charge the gate capacitance of Q1. The maximum voltage on GATE is limited by an internal 12.6V zener diode to VEE. As the voltage at the OUT pin transitions to VSYS, the LM5064 monitors the drain current and power dissipation of MOSFET Q1. In-rush current limiting and/or power limiting circuits actively control the current delivered to the load. During the in-rush limiting interval (t2 in Figure 2), an internal 74 µA fault timer current source charges CT. If Q1’s power dissipation and the input current reduce below their respective limiting thresholds before the TIMER pin reaches 3.9V, the 74 µA current source is switched off, and CT is discharged by the internal 2.4 µA current sink (t3 in Figure 2). The in-rush limiting will no longer engage unless a current-limit condition occurs. If the TIMER pin voltage reaches 3.9V before in-rush current limiting or power limiting ceases during t2, a fault is declared and Q1 is turned off. See the Fault Timer & Restart section for a complete description of the fault mode. The LM5064 will assert the SMBA pin after the operating voltage has exceeded the POR threshold to indicate that the volatile memory and device settings are in their default state. The CONFIG_PRESET bit within the MFR_SPECIFIC_17 register (E1h) indicates default configuration of warning thresholds and device operation and will remain high until a CLEAR_FAULTS command is received. Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 13 LM5064 SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 www.ti.com 0V System Input Voltage UVLO VSYS LM5064 Operating Voltage |VSYS| POR IT (VCC± VEE) 3.9 V 4.8 PA 2.4 PA 74 PA TIMER Pin GATE Pin 111 mA pull-down 4.1 mA pull-down 52 PA source I LIMIT Load Current 0V Output Voltage (OUT Pin) 1.24V VSYS PGD VEE t1 Insertion Time t2 t3 In-rush Limiting Normal Operation Figure 2. Power Up Sequence Gate Control A current source provides the charge at the GATE pin to enhance the N-Channel MOSFET’s gate (Q1). During normal operating conditions (t3 in Figure 2) the gate of Q1 is held charged by an internal 52 µA current source. The GATE pin peak voltage is roughly 12.6V, which will force a VGS across Q1 of 12.6V under normal operation. When the system voltage is initially applied, the GATE pin is held low by a 111 mA pull-down current. This helps prevent an inadvertent turn on of Q1 through its drain-gate capacitance as the applied system voltage increases. During the insertion time (t1 in Figure 2), the GATE pin is held low by a 4.1 mA pull-down current. This maintains Q1 in the off-state until the end of t1, regardless of the voltage on VSYS or UVLO/EN. Following the insertion time, during t2 in Figure 2, the gate voltage of Q1 is modulated to keep the current or power dissipation level from exceeding the programmed levels. While in the current or power limiting mode, the TIMER pin capacitor is charging. If the current and power limiting cease before the TIMER pin reaches 3.9V, the TIMER pin capacitor then discharges, and the circuit begins normal operation. If the in-rush limiting condition persists such that the TIMER pin reached 3.9V during t2, the GATE pin is then pulled low by the 4.1 mA pull-down current. The GATE pin is then held low until either a power up sequence is initiated (RETRY pin to VDD), an automatic retry is attempted (RETRY pin to VEE or floating), or a PMBus ON/OFF command is initiated. See the Fault Timer & Restart section. If the operating voltage falls below the UVLO threshold, or rises above the OVLO threshold, the GATE pin is pulled low by the 4.1 mA pull-down current to switch off Q1. 14 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: LM5064 LM5064 www.ti.com SNVS718E – JUNE 2011 – REVISED FEBRUARY 2013 Current Limit The current limit threshold is reached when the voltage across the sense resistor RS (SENSE to VEE) exceeds the internal voltage limit of 26 mV or 50 mV depending on whether the CL pin is connected to VDD or VEE, respectively. In the current limiting condition, the GATE voltage is controlled to limit the current in MOSFET Q1. While the current limit circuit is active, the fault timer is active as described in the Fault Timer & Restart section. If the load current falls below the current limit threshold before the end of the Fault Timeout Period, the LM5064 resumes normal operation. If the current limit condition persists for longer than the Fault Timeout Period set by CT, the IIN OC Fault bit in the STATUS_INPUT (7Ch) register, the INPUT bit in the STATUS_WORD (79h) register, and IIN_OC/PFET_OP_FAULT bit in the DIAGNOSTIC_WORD (E1h) register will be toggled high and SMBA pin will be asserted. SMBA toggling can be disabled using the ALERT_MASK (D8h) register. For proper operation, the RS resistor value should be no higher than 200 mΩ. Higher values may create instability in the current limit control loop. The current limit threshold pin value may be overridden by setting appropriate bits in the DEVICE_SETUP register (D9h). Circuit Breaker If the load current increases rapidly (e.g., the load is short circuited), the current in the sense resistor (RS) may exceed the current limit threshold before the current limit control loop is able to respond. If the current exceeds 1.9x or 3.7x (CL = VEE) the current limit threshold, Q1 is quickly switched off by the 111 mA pull-down current at the GATE pin, and a Fault Timeout Period begins. When the voltage across RS falls below the circuit breaker (CB) threshold, the 111 mA pull-down current at the GATE pin is switched off, and the gate voltage of Q1 is then determined by the current limit or the power limit functions. If the TIMER pin reaches 3.9V before the current limiting or power limiting condition ceases, Q1 is switched off by the 4.1 mA pull-down current at the GATE pin as described in the Fault Timer & Restart section. A circuit breaker event will cause the CIRCUIT_BREAKER_FAULT bit in the STATUS_MFR_SPECIFIC (80h) and DIAGNOSTIC_WORD (E1h) registers to be toggled high, and SMBA pin will be asserted unless this feature is disabled using the ALERT_MASK (D8h) register. The circuit breaker pin configuration may be overridden by setting appropriate bits in the DEVICE_SETUP (D9h) register. Power Limit An important feature of the LM5064 is the MOSFET power limiting. The power limit function can be used to maintain the maximum power dissipation of MOSFET Q1 within the device SOA rating. The LM5064 determines the power dissipation in Q1 by monitoring its drain-source voltage (OUT to SENSE), and the drain current through the RS (SENSE to VEE). The product of the current and voltage is compared to the power limit threshold programmed by the resistor at the PWR pin. If the power dissipation reaches the limiting threshold, the GATE voltage is modulated to regulate the current in Q1. While the power limiting circuit is active, the fault timer is active as described in the Fault Timer & Restart section. If the power limit condition persists for longer than the Fault Timeout Period set by the timer capacitor, CT, the IIN OC Fault bit in the STATUS_INPUT (7Ch) register, the INPUT bit in the STATUS_WORD (79h) register, and the IIN_OC/PFET_OP_FAULT bit in the DIAGNOSTIC_WORD (E1h) register will be toggled high and SMBA pin will be asserted unless this feature is disabled using the ALERT_MASK (D8h) register. Fault Timer & Restart When the current limit or power limit threshold is reached during turn-on, or as a result of a fault condition, the gate-to-source voltage of Q1 is modulated to regulate the load current and power dissipation in Q1. When either limiting function is active, a 74 µA fault timer current source charges the external capacitor (CT) at the TIMER pin as shown in Figure 2(Fault Timeout Period). If the fault condition subsides during the Fault Timeout Period before the TIMER pin reaches 3.9V, the LM5064 returns to the normal operating mode and CT is discharged by the 1.5 mA current sink. If the TIMER pin reaches 3.9V during the Fault Timeout Period, Q1 is switched off by a 4.1 mA pull-down current at the GATE pin. The subsequent restart procedure then depends on the selected retry configuration. If the RETRY pin is high (VDD), the LM5064 latches the GATE pin low at the end of the Fault Timeout Period. CT is then discharged to VEE by the 2.4 µA fault current sink. The GATE pin is held low by the 4.1 mA pull-down current until a power up sequence is externally initiated by cycling the operating voltage (VCC-VEE), or momentarily pulling the UVLO/EN pin below its threshold with an open-collector or open-drain device as shown in Figure 3. The voltage at the TIMER pin must be
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