0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
会员中心
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
SCANSTA476EVK

SCANSTA476EVK

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    -

  • 描述:

    BOARD EVALUATION SCANSTA476

  • 数据手册
  • 价格&库存
SCANSTA476EVK 数据手册
SCANSTA476 www.ti.com SNLS171G – JANUARY 2005 – REVISED APRIL 2013 SCANSTA476 Eight Input IEEE 1149.1 Analog Voltage Monitor Check for Samples: SCANSTA476 FEATURES DESCRIPTION • • • • • The SCANSTA476 is a low power, Analog Voltage Monitor used for sampling or monitoring up to 8 analog/mixed-signal input channels. Analog Voltage Monitors are valuable during product development, environmental test, production, and field service for verifying and monitoring power supply and reference voltages. In a supervisory role, the 'STA476 is useful for card or system-level health monitoring and prognostics applications. 1 2 • • Eight Selectable Analog Input Channels Analog Full-Scale Input Range 0V to VDD Typical Accuracy of 2 mV at Maximum VDD Very Low Power Operation Small Package Footprint in 16-Lead, 5 x 5 x 0.8 mm WSON Single +2.7V to +5.5V Supply Operation IEEE 1149.1 (JTAG) Compliant Interface APPLICATIONS • • • • • • • Measurement of Point Voltages Real-time Signal Monitoring System Health Monitoring and Prognostics Debug, Environmental Test, Production Test, Field Service Supplement In-Circuit Tester (ICT) Access Vital in Servers, Computing, Telecommunication and Industrial Equipment Essential in Medical, Data Storage, and Networking Equipment Instead of requiring an external microcontroller with a GPIO interface, the 'STA476 features a common IEEE 1149.1 (JTAG) interface to select the analog input, initiate a measurement, and access the results - further extending the capabilities of an existing JTAG infrastructure. The SCANSTA476 uses the VREF input as a reference. This enables the SCANSTA476 to operate with a full-scale input range of 0 to VDD, which can range from +2.7V to +5.5V. The SCANSTA476 is packaged in a 16-lead nonpullback WSON package that provides an extremely small footprint for applications where space is a critical consideration. This product operates over the industrial temperature range of −40°C to +85°C. Block Diagram VREF A0 A1 A2 A3 A4 A5 A6 A7 Successive Approximation ADC Control Logic IEEE 1149.1 TAP (JTAG) TDI TDO TCK TMS TRST 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2005–2013, Texas Instruments Incorporated SCANSTA476 SNLS171G – JANUARY 2005 – REVISED APRIL 2013 www.ti.com Connection Diagram VDD 1 16 A0 VREF 2 15 A1 VDD 3 14 A2 TRST 4 13 A3 TDO 5 12 A4 TDI 6 11 A5 TMS 7 10 A6 TCK 8 9 A7 DAP (GND) Figure 1. DAP = GND (Top View) Pin Descriptions Pin No. Symbol Description ANALOG I/O 16 A0 Analog input 0. This signal can range from 0V to VREF. 15 A1 Analog input 1. This signal can range from 0V to VREF. 14 A2 Analog input 2. This signal can range from 0V to VREF. 13 A3 Analog input 3. This signal can range from 0V to VREF. 12 A4 Analog input 4. This signal can range from 0V to VREF. 11 A5 Analog input 5. This signal can range from 0V to VREF. 10 A6 Analog input 6. This signal can range from 0V to VREF. 9 A7 Analog input 7. This signal can range from 0V to VREF. 2 VREF Analog reference voltage input. VREF must be ≤ VDD. This pin should be connected to a quiet source (not directly to VDD) and bypassed to GND with 0.1 µF and 1 µF monolithic capacitors located within 1 cm of the VREF pin. 6 TDI Test Data Input to support IEEE 1149.1 features 5 TDO Test Data Ouput to support IEEE 1149.1 features 7 TMS Test Mode Select to support IEEE 1149.1 features 8 TCK Test Clock to support IEEE 1149.1 features 4 TRST Test Reset to support IEEE 1149.1 features DIGITAL I/O POWER SUPPLY 1,3 See (1) 2 (1) VDD Positive supply pin. These pins should be connected to a quiet +2.7V to +5.5V source and bypassed to GND with 0.1 µF and 1 µF monolithic capacitors located within 1 cm of the power pin. GND Ground reference for CMOS circuitry. DAP is the exposed metal contact at the bottom of the WSON package. The DAP is used as the primary GND connection to the device. It should be connected to the ground plane with at least 4 vias for optimal low-noise and thermal performance. Note that GND is not an actual pin on the package, the GND is connected thru the DAP on the back side of the WSON package. Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: SCANSTA476 SCANSTA476 www.ti.com SNLS171G – JANUARY 2005 – REVISED APRIL 2013 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) (2) −0.3V to +6.5V Supply Voltage VDD Voltage on Any Analog Pin to GND −0.3V to VDD+0.3V Voltage on Any Digital Pin to GND -0.3V to VDD+0.3V Input Current at Any Pin (3) ±10 mA ESD Susceptibility Human Body Model 8000V Machine Model >250V Soldering Temperature Refer to AN-1187 (SNOA401) Junction Temperature +150°C Storage Temperature −65°C to +150°C Thermal Resistance, θJA 42°C/W Thermal Resistance, θJC 14.3°C/W (1) (2) (3) Absolute maximum ratings are limiting values, to be applied individually, and beyond which the serviceability of the circuit may be impaired. Functional operability under any of these conditions is not implied. Exposure to maximum ratings for extended periods may affect device reliability. If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications. Except power supply pins. Recommended Operating Conditions −40°C ≤ TA ≤ +85°C Operating Temperature Range VDD Supply Voltage +2.7V to +5.5V Digital Input Pins Voltage Range Analog Input Pins Voltage Range (1) +0V to VDD (1) +0V to VREF For valid measurements, the analog VIN < VREF ≤ VDD. SCANSTA476 Electrical Characteristics The following specifications apply for VDD = +2.7V to 5.5V, fTCK = 20 MHz, unless otherwise noted. Symbol Parameter Conditions Typical Limits Units 2.7 V (min) 5.5 V (max) 5.0 mA POWER SUPPLY CHARACTERISTICS VDD IDD PD Supply Voltage −40°C ≤ TA ≤ 85°C Normal Mode (Static) VDD = +2.7V to +5.5V, Normal Mode (Operational) VDD = +2.7V to +5.5V, fTCK = 1 MSPS 5.0 mA (max) Power Consumption, Normal Mode (Operational) VDD = +5.5V, fTCK = 1 MSPS 27.5 mW (max) 0 to VREF V 3.5 ANALOG INPUT CHARACTERISTICS (A0-A7) VIN Analog Input Range VREF Reference Voltage Range IDCL DC Leakage Current VMEAS Analog Input Measurement Accuracy VREF ≤ VDD VDD V 0.1 ±10 µA (max) VDD = +2.7V 1 7.5 VDD = +5.5V 2 15 mV DIGITAL INPUT CHARACTERISTICS (TDI, TMS, TCK, TRST) VDD = +2.7V to +3.6V 2.0 VDD = +5.5V 2.1 VIH Input High Voltage V (min) VIL Input Low Voltage VDD = +5V 0.8 V (max) VCL Input Clamp Voltage ICL = -18mA -0.8 -1.5 V (max) IIN Input Current VIN = 0V or VDD 0.2 ±10 µA (max) Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: SCANSTA476 3 SCANSTA476 SNLS171G – JANUARY 2005 – REVISED APRIL 2013 www.ti.com SCANSTA476 Electrical Characteristics (continued) The following specifications apply for VDD = +2.7V to 5.5V, fTCK = 20 MHz, unless otherwise noted. Symbol IILR Parameter Conditions Input Current Typical TRST, TDI, TMS only Limits Units -300 µA (max) DIGITAL OUTPUT CHARACTERISTICS (TDO) IOH = -100 µA, 2.7V ≤ VDD ≤ 5.5V VOH Output High Voltage VOL Output Low Voltage IOS Output Short Circuit Current IOZ TRI-STATE Leakage Current VDD −0.2 V (min) IOH = -4 mA, 3.0V ≤ VDD ≤ 5.5V 2.4 V (min) IOH = -4 mA, VDD = 2.7V 2.2 V (min) IOL = 100 µA, 2.7V ≤ VDD ≤ 5.5V 0.2 V (max) IOL = 4 mA, 2.7V ≤ VDD ≤ 5.5V 0.4 V (max) -85 mA (max) ±10 µA (max) VOUT = 0V, VDD = 5.5V Output Coding Straight (Natural) Binary AC ELECTRICAL CHARACTERISTICS FMAX Throughput Rate TCK = 20MHz 1 MSPS (max) INPUT TIMING CHARACTERISTICS tSET TDI to TCK (H/L) See (1) 2.0 ns (min) 1.5 ns (min) 2.0 ns (min) 2.0 ns (min) 10.0 ns (min) 2.0 ns (min) 2.5 ns (min) 20 MHz (min) tHOLD TDI to TCK (H/L) See (1) tSET TMS to TCK (H/L) See (1) tHOLD TMS to TCK (H/L) See tW TCK Pulse Width (H/L) See tREC Recovery TIme TRST to TCK See tW TRST Pulse Width (L) See FMAX TCK (1) (1) (1) (1) (1) Data sheet min/max specification limits are specified by design or statistical analysis. APPLICATIONS INFORMATION POWER-UP TIMING The SCANSTA476 typically requires 1 µs to power up, either after first applying VDD, or after an incomplete conversion shift. To return to normal, one "dummy" conversion must be fully completed. After this first dummy conversion, the SCANSTA476 will perform conversions properly. STARTUP MODE When the VDD supply is first applied, the SCANSTA476 requires one dummy conversion after start-up. 4 Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: SCANSTA476 SCANSTA476 www.ti.com SNLS171G – JANUARY 2005 – REVISED APRIL 2013 Timing Diagrams JTAG Reset TAP State TLR (Test-Logic-Reset) JTAG Instruction Shift RTI SEL DR SEL IR CAP IR (IDLE) EX1 IR SHIFT IR UPD IR RTI (Run-Test/Idle) TCK TRST TMS 8-bit instruction register op-code (40h to 47h) TDI x x x x 0 0 1 0 0 1 8-bit instruction register capture value (81h) TDO 1 0 0 0 0 0 LSB MSB Op-codes 40h to 47h select pins A0 to A7 respectively. Note the JTAG reset preamble places the JTAG TAP controller in a stable state (RTI). Both the instruction and data shifts start in - and return to - the RTI state Figure 2. Instruction Shift (Channel Select) Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: SCANSTA476 5 SCANSTA476 SNLS171G – JANUARY 2005 – REVISED APRIL 2013 www.ti.com (IDLE) TAP State RTI JTAG Data Shift SEL CAP DR DR (IDLE) EX1 UPD DR DR SHIFT DR RTI TCK TRST TMS (GRQ¶W FDUH) TDI TDO 0 0 0 0 D11 D10 D9 D8 D7 D6 D5 D4 MSB D3 D2 D1 D0 LSB D11 through D0 correspond to the 12-bit sample from the ADC Core. Note that Data shifts can be run back-to-back for continous sampling of a single channel, or can be interleaved with instruction shifts for rippling through all 8 channels. Figure 3. Data Shift (A/D Sample) 6 Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: SCANSTA476 SCANSTA476 www.ti.com SNLS171G – JANUARY 2005 – REVISED APRIL 2013 REVISION HISTORY Changes from Revision F (April 2013) to Revision G • Page Changed layout of National Data Sheet to TI format ............................................................................................................ 6 Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: SCANSTA476 7 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) SCANSTA476TSD/NOPB ACTIVE WSON NHQ 16 1000 RoHS & Green SN Level-3-260C-168 HR -40 to 85 STA476T (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
SCANSTA476EVK 价格&库存

很抱歉,暂时无法提供与“SCANSTA476EVK”相匹配的价格&库存,您可以联系我们找货

免费人工找货