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TMUX1219
SCDS409A – MAY 2019 – REVISED JUNE 2020
TMUX1219 5-V Bidirectional, 2:1 General Purpose Switch
1 Features
3 Description
•
•
•
•
•
•
•
•
•
•
•
The TMUX1219 is a general purpose complementary
metal-oxide semiconductor (CMOS) single-pole
double-throw (SPDT) switch. The TMUX1219
switches between two source inputs based on the
state of the SEL pin. Wide operating supply of 1.08 V
to 5.5 V allows for use in a broad array of
applications from personal electronics to building
automation. The device supports bidirectional analog
and digital signals on the source (Sx) and drain (D)
pins ranging from GND to VDD. A low supply current
of 4 nA enables use in portable applications.
1
Rail to rail operation
Bidirectional signal path
1.8 V Logic compatible
Fail-safe logic
Low on-resistance: 3 Ω
Wide supply range: 1.08 V to 5.5 V
-40°C to +125°C Operating temperature
Low supply current: 4 nA
Transition time: 14 ns
Break-before-make switching
ESD protection HBM: 2000 V
All logic inputs have 1.8 V logic compatible
thresholds, ensuring both TTL and CMOS logic
compatibility when operating in the valid supply
voltage range. Fail-Safe Logic circuitry allows
voltages on the control pins to be applied before the
supply pin, protecting the device from potential
damage.
2 Applications
•
•
•
•
•
•
•
•
•
•
•
•
Analog and Digital Switching
I2C and SPI bus Multiplexing
Remote Radio Units
Barcode scanner
Motor drives
Building automation
Analog input module
Power delivery
Video surveillance
Electronic point of sale
Appliances
Consumer audio
Device Information(1)
PART NUMBER
TMUX1219
Unity Gain
R
SPACER
SPACER
SPACER
Block Diagram
TMUX1219
Output
S1
S1
D
S2
TLV900 1
1.8 V
SEL
TMUX121 9
2.90 mm x 1.60 mm
SPACER
SPACER
R
S2
SOT-23 (6)
SPACER
D
Inve rting
BODY SIZE (NOM)
2.00 mm × 1.25 mm
(1) For all available packages, see the package option addendum
at the end of the data sheet.
Application Example
Input
PACKAGE
SC70 (6)
SEL
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TMUX1219
SCDS409A – MAY 2019 – REVISED JUNE 2020
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Table of Contents
1
2
3
4
5
6
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
6.1
6.2
6.3
6.4
6.5
6.6
6.7
6.8
6.9
7
1
1
1
2
3
4
Absolute Maximum Ratings ...................................... 4
ESD Ratings.............................................................. 4
Recommended Operating Conditions....................... 4
Thermal Information .................................................. 4
Electrical Characteristics (VDD = 5 V ±10 %) ............ 5
Electrical Characteristics (VDD = 3.3 V ±10 %) ......... 7
Electrical Characteristics (VDD = 1.8 V ±10 %) ......... 9
Electrical Characteristics (VDD = 1.2 V ±10 %) ....... 11
Typical Characteristics ............................................ 13
Parameter Measurement Information ................ 14
7.1
7.2
7.3
7.4
7.5
7.6
7.7
On-Resistance ........................................................
Off-Leakage Current ...............................................
On-Leakage Current ...............................................
Transition Time .......................................................
Break-Before-Make .................................................
Charge Injection ......................................................
Off Isolation .............................................................
14
14
15
15
16
16
17
7.8 Crosstalk ................................................................. 17
7.9 Bandwidth ............................................................... 18
8
Detailed Description ............................................ 19
8.1
8.2
8.3
8.4
9
Functional Block Diagram .......................................
Feature Description.................................................
Device Functional Modes........................................
Truth Tables ............................................................
19
19
19
19
Application and Implementation ........................ 20
9.1 Application Information............................................ 20
9.2 Typical Application ................................................. 20
10 Power Supply Recommendations ..................... 22
11 Layout................................................................... 23
11.1 Layout Guidelines ................................................. 23
11.2 Layout Example .................................................... 23
12 Device and Documentation Support ................. 24
12.1
12.2
12.3
12.4
12.5
12.6
Documentation Support ........................................
Receiving Notification of Documentation Updates
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
24
24
24
24
24
24
13 Mechanical, Packaging, and Orderable
Information ........................................................... 24
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Original (May 2019) to Revision A
Page
•
Changed the DBV package status From: Product Preview To Production Data ................................................................... 1
•
Added Thermal information for DBV package........................................................................................................................ 4
2
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SCDS409A – MAY 2019 – REVISED JUNE 2020
5 Pin Configuration and Functions
DCK Package
6-Pin SC70
Top View
DBV Package
6-Pin SOT-23
Top View
SEL
1
6
S2
VDD
2
5
D
GND
3
4
S1
SEL
1
6
S2
VDD
2
5
D
GND
3
4
S1
Not to scale
Not to scale
Pin Functions
PIN
NAME
NO.
TYPE (1)
DESCRIPTION
SEL
1
I
Select pin: controls state of the switch according to Table 1. (Logic Low = S1 to D, Logic High = S2 to D)
VDD
2
P
Positive power supply. This pin is the most positive power-supply potential. For reliable operation, connect
a decoupling capacitor ranging from 0.1 µF to 10 µF between VDD and GND.
GND
3
P
Ground (0 V) reference
S1
4
I/O
Source pin 1. Can be an input or output.
D
5
I/O
Drain pin. Can be an input or output.
S2
6
I/O
Source pin 2. Can be an input or output.
(1)
I = input, O = output, I/O = input and output, P = power
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SCDS409A – MAY 2019 – REVISED JUNE 2020
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6 Specifications
6.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted) (1) (2).
MIN
MAX
VDD
Supply voltage
–0.5
6
VSEL
Logic control input pin voltage (SEL)
–0.5
6
V
ISEL
Logic control input pin current (SEL)
–30
30
mA
VS or VD
Source or drain voltage (Sx, D)
–0.5
VDD+0.5
IS or ID (CONT)
Source or drain continuous current (Sx, D)
–30
30
mA
Tstg
Storage temperature
–65
150
°C
TJ
Junction temperature
150
°C
(1)
(2)
UNIT
V
V
Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum.
6.2 ESD Ratings
VALUE
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins
V(ESD)
(1)
(2)
Electrostatic discharge
(1)
UNIT
±2000
Charged device model (CDM), per JEDEC specification JESD22-C101
or ANSI/ESDA/JEDEC JS-002, all pins (2)
V
±750
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
Over operating free-air temperature range (unless otherwise noted).
MIN
VDD
Supply voltage
VS or VD
VSEL
TA
Ambient temperature
NOM
MAX
UNIT
1.08
5.5
V
Signal path input/output voltage (source or drain pin) (Sx, D)
0
VDD
V
Logic control input pin voltage (SEL)
0
5.5
V
–40
125
°C
6.4 Thermal Information
TMUX1219
THERMAL METRIC
(1)
DCK (SC70)
DBV (SOT-23)
6 PINS
6 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
243.1
212.3
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
206.0
156.7
°C/W
RθJB
Junction-to-board thermal resistance
128.3
96.5
°C/W
ΨJT
Junction-to-top characterization parameter
107.8
80.7
°C/W
ΨJB
Junction-to-board characterization parameter
128.0
96.2
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
°C/W
(1)
4
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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SCDS409A – MAY 2019 – REVISED JUNE 2020
6.5 Electrical Characteristics (VDD = 5 V ±10 %)
At TA = 25°C, VDD = 5 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX
UNIT
ANALOG SWITCH
RON
On-resistance
ΔRON
RON
On-resistance matching between
channels
On-resistance flatness
FLAT
IS(OFF)
ID(ON)
IS(ON)
Source off leakage current (1)
Channel on leakage current
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VDD = 5 V
Switch Off
VD = 4.5 V / 1.5 V
VS = 1.5 V / 4.5 V
Refer to Off-Leakage Current
25°C
VDD = 5 V
Switch On
VD = VS = 4.5 V / 1.5 V
Refer to On-Leakage Current
25°C
3
Ω
–40°C to +85°C
5
Ω
–40°C to +125°C
6
Ω
0.15
–40°C to +85°C
–40°C to +125°C
Ω
0.4
Ω
1
Ω
1.5
Ω
–40°C to +85°C
2
Ω
–40°C to +125°C
3
Ω
±5
nA
–40°C to +85°C
–25
25
nA
–40°C to +125°C
–40
40
nA
±15
nA
–40°C to +85°C
–50
50
nA
–40°C to +125°C
–80
80
nA
LOGIC INPUTS (SEL)
VIH
Input logic high
–40°C to +125°C
1.49
5.5
V
VIL
Input logic low
–40°C to +125°C
0
0.87
V
IIH
IIL
Input leakage current
25°C
IIH
IIL
Input leakage current
–40°C to +125°C
CIN
Logic input capacitance
25°C
CIN
Logic input capacitance
–40°C to +125°C
±0.005
µA
±0.05
1
µA
pF
2
pF
POWER SUPPLY
IDD
(1)
VDD supply current
Logic inputs = 0 V or 5.5 V
25°C
–40°C to +125°C
0.003
µA
1.5
µA
When VS is 4.5 V, VD is 1.5 V or when VS is 1.5 V, VD is 4.5 V.
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Electrical Characteristics (VDD = 5 V ±10 %) (continued)
At TA = 25°C, VDD = 5 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX
UNIT
DYNAMIC CHARACTERISTICS
tTRAN
tOPEN
Switching time between channels
Break before make time
(BBM)
QC
OISO
XTALK
Charge Injection
Off Isolation
Crosstalk
VS = 3 V
RL = 200 Ω, CL = 15 pF
Refer to Transition Time
25°C
VS = 3 V
RL = 200 Ω, CL = 15 pF
Refer to Break-Before-Make
25°C
12
–40°C to +85°C
–40°C to +125°C
8
ns
18
ns
19
ns
ns
–40°C to +85°C
1
ns
–40°C to +125°C
1
ns
VD = 1 V
RS = 0 Ω, CL = 1 nF
Refer to Charge Injection
25°C
–10
pC
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Off Isolation
25°C
–65
dB
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Off Isolation
25°C
–45
dB
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Crosstalk
25°C
–65
dB
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Crosstalk
25°C
–45
dB
MHz
BW
Bandwidth
RL = 50 Ω, CL = 5 pF
Refer to Bandwidth
25°C
250
CSOFF
Source off capacitance
f = 1 MHz
25°C
7
pF
CSON
CDON
On capacitance
f = 1 MHz
25°C
23
pF
6
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6.6 Electrical Characteristics (VDD = 3.3 V ±10 %)
At TA = 25°C, VDD = 3.3 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX
UNIT
ANALOG SWITCH
RON
On-resistance
ΔRON
RON
On-resistance matching between
channels
On-resistance flatness
FLAT
IS(OFF)
ID(ON)
IS(ON)
Source off leakage current (1)
Channel on leakage current
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VDD = 3.3 V
Switch Off
VD = 3 V / 1 V
VS = 1 V / 3 V
Refer to Off-Leakage Current
25°C
VDD = 3.3 V
Switch On
VD = VS = 3 V / 1 V
Refer to On-Leakage Current
25°C
5
Ω
–40°C to +85°C
10
Ω
–40°C to +125°C
12
Ω
0.15
Ω
–40°C to +85°C
1
Ω
–40°C to +125°C
1
Ω
3.5
Ω
–40°C to +85°C
4
Ω
–40°C to +125°C
5
Ω
±5
nA
–40°C to +85°C
–25
25
nA
–40°C to +125°C
–40
40
nA
±15
nA
–40°C to +85°C
–50
50
nA
–40°C to +125°C
–80
80
nA
LOGIC INPUTS (SEL)
VIH
Input logic high
–40°C to +125°C
1.35
5.5
V
VIL
Input logic low
–40°C to +125°C
0
0.8
V
IIH
IIL
Input leakage current
25°C
IIH
IIL
Input leakage current
-40°C to 125°C
CIN
Logic input capacitance
25°C
CIN
Logic input capacitance
–40°C to +125°C
±0.005
µA
±0.05
1
µA
pF
2
pF
POWER SUPPLY
IDD
(1)
VDD supply current
Logic inputs = 0 V or 5.5 V
25°C
–40°C to +125°C
0.003
µA
0.8
µA
When VS is 3 V, VD is 1 V or when VS is 1 V, VD is 3 V.
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Electrical Characteristics (VDD = 3.3 V ±10 %) (continued)
At TA = 25°C, VDD = 3.3 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX
UNIT
DYNAMIC CHARACTERISTICS
tTRAN
tOPEN
Switching time between channels
Break before make time
(BBM)
QC
OISO
XTALK
Charge Injection
Off Isolation
Crosstalk
VS = 2 V
RL = 200 Ω, CL = 15 pF
Refer to Transition Time
25°C
VS = 2 V
RL = 200 Ω, CL = 15 pF
Refer to Break-Before-Make
25°C
14
–40°C to +85°C
–40°C to +125°C
9
ns
20
ns
21
ns
ns
–40°C to +85°C
1
ns
–40°C to +125°C
1
ns
VD = 1 V
RS = 0 Ω, CL = 1 nF
Refer to Charge Injection
25°C
–6
pC
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Off Isolation
25°C
–65
dB
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Off Isolation
25°C
–45
dB
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Crosstalk
25°C
–65
dB
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Crosstalk
25°C
–45
dB
MHz
BW
Bandwidth
RL = 50 Ω, CL = 5 pF
Refer to Bandwidth
25°C
250
CSOFF
Source off capacitance
f = 1 MHz
25°C
7
pF
CSON
CDON
On capacitance
f = 1 MHz
25°C
23
pF
8
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SCDS409A – MAY 2019 – REVISED JUNE 2020
6.7 Electrical Characteristics (VDD = 1.8 V ±10 %)
At TA = 25°C, VDD = 1.8 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX
UNIT
ANALOG SWITCH
RON
On-resistance
ΔRON
IS(OFF)
ID(ON)
IS(ON)
On-resistance matching between
channels
Source off leakage current (1)
Channel on leakage current
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VDD = 1.98 V
Switch Off
VD = 1.62 V / 1 V
VS = 1 V / 1.62 V
Refer to Off-Leakage Current
25°C
VDD = 1.98 V
Switch On
VD = VS = 1.62 V / 1 V
Refer to On-Leakage Current
25°C
40
Ω
–40°C to +85°C
80
Ω
–40°C to +125°C
80
Ω
0.4
Ω
–40°C to +85°C
1.5
Ω
–40°C to +125°C
1.5
Ω
±5
nA
–40°C to +85°C
–25
25
nA
–40°C to +125°C
–40
40
nA
±15
nA
–40°C to +85°C
–50
50
nA
–40°C to +125°C
–80
80
nA
LOGIC INPUTS (SEL)
VIH
Input logic high
–40°C to +125°C
1.07
5.5
V
VIL
Input logic low
–40°C to +125°C
0
0.68
V
IIH
IIL
Input leakage current
25°C
IIH
IIL
Input leakage current
–40°C to +125°C
CIN
Logic input capacitance
25°C
CIN
Logic input capacitance
–40°C to +125°C
±0.005
µA
±0.05
1
µA
pF
2
pF
POWER SUPPLY
IDD
(1)
VDD supply current
Logic inputs = 0 V or 5.5 V
25°C
–40°C to +125°C
0.001
µA
0.6
µA
When VS is 1.62 V, VD is 1 V or when VS is 1 V, VD is 1.62 V.
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Electrical Characteristics (VDD = 1.8 V ±10 %) (continued)
At TA = 25°C, VDD = 1.8 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX
UNIT
DYNAMIC CHARACTERISTICS
tTRAN
tOPEN
Transition time between channels
Break before make time
(BBM)
QC
OISO
XTALK
Charge Injection
Off Isolation
Crosstalk
VS = 1 V
RL = 200 Ω, CL = 15 pF
Refer to Transition Time
25°C
VS = 1 V
RL = 200 Ω, CL = 15 pF
Refer to Break-Before-Make
25°C
28
–40°C to +85°C
–40°C to +125°C
16
ns
44
ns
44
ns
ns
–40°C to +85°C
1
ns
–40°C to +125°C
1
ns
VD = 1 V
RS = 0 Ω, CL = 1 nF
Refer to Charge Injection
25°C
–3
pC
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Off Isolation
25°C
–65
dB
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Off Isolation
25°C
–45
dB
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Crosstalk
25°C
–65
dB
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Crosstalk
25°C
–45
dB
MHz
BW
Bandwidth
RL = 50 Ω, CL = 5 pF
25°C
250
CSOFF
Source off capacitance
f = 1 MHz
25°C
7
pF
CSON
CDON
On capacitance
f = 1 MHz
25°C
23
pF
10
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SCDS409A – MAY 2019 – REVISED JUNE 2020
6.8 Electrical Characteristics (VDD = 1.2 V ±10 %)
At TA = 25°C, VDD = 1.2 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX
UNIT
ANALOG SWITCH
RON
On-resistance
ΔRON
IS(OFF)
ID(ON)
IS(ON)
On-resistance matching between
channels
Source off leakage current (1)
Channel on leakage current
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C
VDD = 1.32 V
Switch Off
VD = 1 V / 0.8 V
VS = 0.8 V / 1 V
Refer to Off-Leakage Current
25°C
VDD = 1.32 V
Switch On
VD = VS = 1 V / 0.8 V
Refer to On-Leakage Current
25°C
70
Ω
–40°C to +85°C
105
Ω
–40°C to +125°C
105
Ω
0.4
Ω
–40°C to +85°C
1.5
Ω
–40°C to +125°C
1.5
Ω
±5
nA
–40°C to +85°C
–25
25
nA
–40°C to +125°C
–40
40
nA
±15
nA
–40°C to +85°C
–50
50
nA
–40°C to +125°C
–80
80
nA
LOGIC INPUTS (SEL)
VIH
Input logic high
–40°C to +125°C
0.96
5.5
V
VIL
Input logic low
–40°C to +125°C
0
0.36
V
IIH
IIL
Input leakage current
25°C
IIH
IIL
Input leakage current
–40°C to +125°C
CIN
Logic input capacitance
25°C
CIN
Logic input capacitance
–40°C to +125°C
±0.005
µA
±0.05
1
µA
pF
2
pF
POWER SUPPLY
IDD
(1)
VDD supply current
Logic inputs = 0 V or 5.5 V
25°C
–40°C to +125°C
0.003
µA
0.5
µA
When VS is 1 V, VD is 0.8 V or when VS is 0.8 V, VD is 1 V.
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Electrical Characteristics (VDD = 1.2 V ±10 %) (continued)
At TA = 25°C, VDD = 1.2 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX
UNIT
DYNAMIC CHARACTERISTICS
tTRAN
tOPEN
Transition time between channels
Break before make time
(BBM)
QC
OISO
XTALK
Charge Injection
Off Isolation
Crosstalk
VS = 1 V
RL = 200 Ω, CL = 15 pF
Refer to Transition Time
25°C
VS = 1 V
RL = 200 Ω, CL = 15 pF
Refer to Break-Before-Make
25°C
55
–40°C to +85°C
–40°C to +125°C
28
ns
190
ns
190
ns
ns
–40°C to +85°C
1
ns
–40°C to +125°C
1
ns
VD = 1 V
RS = 0 Ω, CL = 1 nF
Refer to Charge Injection
25°C
–2
pC
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Off Isolation
25°C
–65
dB
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Off Isolation
25°C
–45
dB
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Crosstalk
25°C
–65
dB
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Crosstalk
25°C
–45
dB
MHz
BW
Bandwidth
RL = 50 Ω, CL = 5 pF
25°C
250
CSOFF
Source off capacitance
f = 1 MHz
25°C
7
pF
CSON
CDON
On capacitance
f = 1 MHz
25°C
23
pF
12
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6.9 Typical Characteristics
at TA = 25°C, VDD = 5 V (unless otherwise noted)
80
10
VDD = 1.08V
8
On Resistance (:)
On Resistance (:)
60
40
VDD = 1.62 V
TA = 125qC
TA = 85qC
6
4
20
2
VDD = 3 V
VDD = 4.5 V
TA = -40qC
0
0
0.5
1
1.5
2
2.5
3
3.5
Source or Drain Voltage (V)
4
4.5
5
0
0.5
1
1.5
2
Source or Drain Voltage (V)
D001
TA = 25°C
Figure 1. On-Resistance vs Source or Drain Voltage
3
D002
Figure 2. On-Resistance vs Source or Drain Voltage
30
25
400
20
300
Time (ns)
Supply Current (PA)
2.5
VDD = 3 V
500
200
VDD = 3.3 V
Rising
15
Falling
10
VDD = 5 V
100
5
0
0
0.5
1
1.5
2
2.5
3
3.5
Logic Voltage (V)
4
4.5
0
0.5
5
1.5
D003
TA = 25°C
2.5
3.5
VDD - Supply Voltage (V)
4.5
5.5
D004
TA = 25°C
Figure 3. Supply Current vs Logic Voltage
Figure 4. Ttransition vs Supply Voltage
0
0
-10
-1
-20
-2
-30
Gain (dB)
Magnitude (dB)
TA = 25qC
0
-40
-50
-60
-3
-4
-5
-6
-70
-7
-80
-90
100k
-8
1M
10M
Frequency (Hz)
1M
100M
D005
TA = 25°C
10M
Frequency (Hz)
100M
D006
TA = 25°C
Figure 5. Crosstalk and Off-Isolation vs Frequency
Figure 6. Frequency Response
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7 Parameter Measurement Information
7.1 On-Resistance
The on-resistance of a device is the ohmic resistance between the source (Sx) and drain (D) pins of the device.
The on-resistance varies with input voltage and supply voltage. The symbol RON is used to denote on-resistance.
The measurement setup used to measure RON is shown in Figure 7. Voltage (V) and current (ISD) are measured
using this setup, and RON is computed with RON = V / ISD:
V
ISD
Sx
D
VS
Figure 7. On-Resistance Measurement Setup
7.2 Off-Leakage Current
Source leakage current is defined as the leakage current flowing into or out of the source pin when the switch is
off. This current is denoted by the symbol IS(OFF).
The setup used to measure off-leakage current is shown in Figure 8.
VDD
VDD
Is (OFF)
A
S1
D
S2
VS
VD
GND
Figure 8. Off-Leakage Measurement Setup
14
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7.3 On-Leakage Current
Source on-leakage current is defined as the leakage current flowing into or out of the source pin when the switch
is on. This current is denoted by the symbol IS(ON).
Drain on-leakage current is defined as the leakage current flowing into or out of the drain pin when the switch is
on. This current is denoted by the symbol ID(ON).
Either the source pin or drain pin is left floating during the measurement. Figure 9 shows the circuit used for
measuring the on-leakage current, denoted by IS(ON) or ID(ON).
VDD
VDD
VDD
VDD
IS (ON)
ID (ON)
S1
N.C.
S1
A
D
D
A
S2
N.C.
S2
Vs
VS
VS
VD
GND
GND
Figure 9. On-Leakage Measurement Setup
7.4 Transition Time
Transition time is defined as the time taken by the output of the device to rise or fall 10% after the logic control
signal has risen or fallen past the logic threshold. The 10% transition measurement is utilized to provide the
timing of the device. System level timing can then account for the time constant added from the load resistance
and load capacitance. Figure 10 shows the setup used to measure transition time, denoted by the symbol
tTRANSITION.
VDD
0.1…F
VDD
VDD
Log ic
Control
(VSEL)
tf < 5ns
tr < 5ns
VIH
VIL
VS
0V
S1
D
OUTPUT
S2
RL
CL
tTRAN SITION
tTRAN SITION
SEL
90%
OUTPUT
VSEL
10%
GND
0V
Figure 10. Transition-Time Measurement Setup
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7.5 Break-Before-Make
Break-before-make delay is a safety feature that prevents two inputs from connecting when the device is
switching. The output first breaks from the on-state switch before making the connection with the next on-state
switch. The time delay between the break and the make is known as break-before-make delay. Figure 11 shows
the setup used to measure break-before-make delay, denoted by the symbol tOPEN(BBM).
VDD
0.1…F
VDD
VDD
Logic
Control
(VSEL)
tr < 5ns
tf < 5ns
S1
VS
D
OUTPUT
S2
0V
RL
CL
90%
Output
tBBM 1
SEL
tBBM 2
0V
VSEL
tOPEN (BBM) = min ( tBBM 1, tBBM 2)
GND
Figure 11. Break-Before-Make Delay Measurement Setup
7.6 Charge Injection
The TMUX1219 has a transmission-gate topology. Any mismatch in capacitance between the NMOS and PMOS
transistors results in a charge injected into the drain or source during the falling or rising edge of the gate signal.
The amount of charge injected into the source or drain of the device is known as charge injection, and is denoted
by the symbol QC. Figure 12 shows the setup used to measure charge injection from Drain (D) to Source (Sx).
VSS
VDD
0.1…F
0.1…F
VSS
VDD
VDD
S2
VSEL
VD
N.C.
D
S1
OUTPUT
VOUT
0V
CL
Output
VOUT
VS
QC = CL ×
SEL
VOUT
VSEL
GND
Figure 12. Charge-Injection Measurement Setup
16
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7.7 Off Isolation
Off isolation is defined as the ratio of the signal at the drain pin (D) of the device when a signal is applied to the
source pin (Sx) of an off-channel. Figure 13 shows the setup used to measure, and the equation used to
calculate off isolation.
0.1µF
NETWORK
VDD
ANALYZER
VS
50Q
S
VSIG
D
VOUT
RL
50Q
SX
GND
RL
50Q
Figure 13. Off Isolation Measurement Setup
Off Isolation
§V
·
20 ˜ Log ¨ OUT ¸
© VS ¹
(1)
7.8 Crosstalk
Crosstalk is defined as the ratio of the signal at the drain pin (D) of a different channel, when a signal is applied
at the source pin (Sx) of an on-channel. Figure 14 shows the setup used to measure, and the equation used to
calculate crosstalk.
0.1µF
NETWORK
VDD
ANALYZER
S1
VOUT
RL
D
50Q
VS
RL
S2
50Q
50Q
VSIG
GND
Figure 14. Crosstalk Measurement Setup
Channel-to-Channel Crosstalk
§V
·
20 ˜ Log ¨ OUT ¸
© VS ¹
(2)
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7.9 Bandwidth
Bandwidth is defined as the range of frequencies that are attenuated by less than 3 dB when the input is applied
to the source pin (Sx) of an on-channel, and the output is measured at the drain pin (D) of the device. Figure 15
shows the setup used to measure bandwidth.
0.1µF
NETWORK
VDD
VS
ANALYZER
50Q
S
VSIG
D
VOUT
RL
SX
50Q
GND
RL
50Q
Figure 15. Bandwidth Measurement Setup
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8 Detailed Description
8.1 Functional Block Diagram
The TMUX1219 is an 2:1 (SPDT), 1-channel switch where the input is controlled with a single select (SEL)
control pin.
TMUX1219
S1
D
S2
SEL
Figure 16. TMUX1219 Functional Block Diagram
8.2 Feature Description
8.2.1 Bidirectional Operation
The TMUX1219 conducts equally well from source (Sx) to drain (D) or from drain (D) to source (Sx). The device
has very similar characteristics in both directions and supports both analog and digital signals.
8.2.2 Rail to Rail Operation
The valid signal path input/output voltage for TMUX1219 ranges from GND to VDD.
8.2.3 1.8 V Logic Compatible Inputs
The TMUX1219 has 1.8-V logic compatible control for the logic control input (SEL). The logic input threshold
scales with supply but still provides 1.8-V logic control when operating at 5.5 V supply voltage. 1.8-V logic level
inputs allow the TMUX1219 to interface with processors that have lower logic I/O rails and eliminates the need
for an external translator, which saves both space and BOM cost. For more information on 1.8 V logic
implementations refer to Simplifying Design with 1.8 V logic Muxes and Switches
8.2.4 Fail-Safe Logic
The TMUX1219 supports Fail-Safe Logic on the control input pin (SEL) allowing for operation up to 5.5 V,
regardless of the state of the supply pin. This feature allows voltages on the control pin to be applied before the
supply pin, protecting the device from potential damage. Fail-Safe Logic minimizes system complexity by
removing the need for power supply sequencing on the logic control pins. For example, the Fail-Safe Logic
feature allows the select pin of the TMUX1219 to be ramped to 5.5 V while VDD = 0 V. Additionally, the feature
enables operation of the TMUX1219 with VDD = 1.2 V while allowing the select pin to interface with a logic level
of another device up to 5.5 V.
8.3 Device Functional Modes
The select (SEL) pin of the TMUX1219 controls which source channel is connected to the drain of the device.
When a signal path is not selected, that source pin is in high impedance mode (HI-Z). The control pin can be as
high as 5.5 V.
8.4 Truth Tables
Table 1. TMUX1219 Truth Table
CONTROL LOGIC (SEL)
Selected Source (Sx) Connected To Drain (D) Pin
0
S1
1
S2
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The TMUX12xx family offers good system performance across a wide operating supply (1.08V to 5.5V). These
devices include 1.8V logic compatible control input pins that enable operation in systems with 1.8V I/O rails.
Additionally, the control input pin supports Fail-Safe Logic which allows for operation up to 5.5V, regardless of
the state of the supply pin. This protection stops the logic pins from back-powering the supply rail. These
features of the TMUX12xx, a family of general purpose multiplexers and switches, reduce system complexity,
board size, and overall system cost.
9.2 Typical Application
9.2.1 Switchable Operational Amplifier Gain Setting
One example application of the TMUX1219 is to change an Op Amp from unity gain setting to an inverting
amplifier configuration. Utilizing a switch allows a system to have a configurable gain and allows the same
architecture to be utilized across the board for various inputs to the system. Figure 17 shows the TMUX1219
configured for gain setting application.
Input
R
Unity Gain
S1
Inve rting
S2
R
Output
D
TLV900 1
1.8 V
SEL
TMUX121 9
Figure 17. Switchable Op Amp Gain Setting
9.2.1.1 Design Requirements
This design example uses the parameters listed in Table 2.
Table 2. Design Parameters
20
PARAMETERS
VALUES
Input Signal
0 V to 2.75 V
Mux Supply (VDD)
2.75 V
Op Amp Supply (V+/ V-)
±2.75 V
Mux I/O signal range
0 V to VDD (Rail to Rail)
Control logic thresholds
1.8 V compatible (up to 5.5V)
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9.2.1.2 Detailed Design Procedure
The application shown in Figure 17 demonstrates how to use a single control input and toggle between gain
settings of -1 and +1. If switching between inverting and unity gain is not required, the TMUX1219 can be utilized
in the feedback path to select different feedback resistors and provide scalable gain settings for configurable
signal conditioning.
The TMUX1219 can be operated without any external components except for the supply decoupling capacitors.
The select pin is recommended to have a weak pull-down or pull-up resistor to ensure the input is in a known
state. All inputs to the switch must fall within the recommend operating conditions of the TMUX1219 including
signal range and continuous current. For this design with a supply of 2.75 V the signal range can be 0 V to 2.75
V and the max continuous current can be 30 mA.
9.2.1.3 Application Curve
80
VDD = 1.08V
On Resistance (:)
60
40
VDD = 1.62 V
20
VDD = 3 V
VDD = 4.5 V
0
0
0.5
1
1.5
2
2.5
3
3.5
Source or Drain Voltage (V)
4
4.5
5
D001
TA = 25°C
Figure 18. On-Resistance vs Source or Drain Voltage
9.2.2 Input Control for Power Amplifier
Another application of the TMUX1219 is for input control of a power amplifier. Utilizing a switch allows a system
to control when the DAC is connected to the power amplifier, and can stop biasing the power amplifier by
switching the gate to GND. Figure 19 shows the TMUX1219 configured for control of the power amplifier.
RF Input
RF Output
5V
TMUX1219
0V
DAC
1.8 V
SEL
Figure 19. Input Control of Power Amplifier
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9.2.2.1 Design Requirements
This design example uses the parameters listed in Table 2.
Table 3. Design Parameters
PARAMETERS
VALUES
Supply (VDD)
5V
Mux I/O signal range
0 V to VDD (Rail to Rail)
Control logic thresholds
1.8 V compatible (up to 5.5V)
9.2.2.2 Detailed Design Procedure
The application shown in Figure 19 demonstrates how to toggle between the DAC output and GND for control of
a power amplifier using a single control input. The DAC output is utilized to bias the gate of the power amplifier
and can be disconnected from the circuit using the select pin of the switch. The TMUX1219 can support 1.8-V
logic signals on the control input, allowing the device to interface with low logic controls of an FPGA or MCU. The
TMUX1219 can be operated without any external components except for the supply decoupling capacitors. The
select pin is recommended to have a weak pull-down or pull-up resistor to ensure the input is in a known state.
All inputs to the switch must fall within the recommend operating conditions of the TMUX1219 including signal
range and continuous current. For this design with a supply of 5 V the signal range can be 0 V to 5 V and the
max continuous current can be 30 mA.
9.2.2.3 Application Curve
A key parameter for this application is the transition time of the device. Faster transition time allows the system to
toggle between input sources at a faster rate and allows the output to settle to the final value. The TMUX1219
has a transition time that varies with supply voltage and is shown in Figure 20
30
25
Time (ns)
20
Rising
15
Falling
10
5
0
0.5
1.5
2.5
3.5
VDD - Supply Voltage (V)
4.5
5.5
D004
TA = 25°C
Figure 20. Ttransition vs Supply Voltage
10 Power Supply Recommendations
The TMUX1219 operates across a wide supply range of 1.08 V to 5.5 V. Do not exceed the absolute maximum
ratings because stresses beyond the listed ratings can cause permanent damage to the devices.
Power-supply bypassing improves noise margin and prevents switching noise propagation from the VDD supply to
other components. Good power-supply decoupling is important to achieve optimum performance. For improved
supply noise immunity, use a supply decoupling capacitor ranging from 0.1 μF to 10 μF from VDD to ground.
Place the bypass capacitors as close to the power supply pins of the device as possible using low-impedance
connections. TI recommends using multi-layer ceramic chip capacitors (MLCCs) that offer low equivalent series
resistance (ESR) and inductance (ESL) characteristics for power-supply decoupling purposes. For very sensitive
systems, or for systems in harsh noise environments, avoiding the use of vias for connecting the capacitors to
the device pins may offer superior noise immunity. The use of multiple vias in parallel lowers the overall
inductance and is beneficial for connections to ground planes.
22
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11 Layout
11.1 Layout Guidelines
11.1.1 Layout Information
When a PCB trace turns a corner at a 90° angle, a reflection can occur. A reflection occurs primarily because of
the change of width of the trace. At the apex of the turn, the trace width increases to 1.414 times the width. This
increase upsets the transmission-line characteristics, especially the distributed capacitance and self–inductance
of the trace which results in the reflection. Not all PCB traces can be straight and therefore some traces must
turn corners. Figure 21 shows progressively better techniques of rounding corners. Only the last example (BEST)
maintains constant trace width and minimizes reflections.
BETTER
BEST
2W
WORST
1W min.
W
Figure 21. Trace Example
Route high-speed signals using a minimum of vias and corners which reduces signal reflections and
impedance changes. When a via must be used, increase the clearance size around it to minimize its
capacitance. Each via introduces discontinuities in the signal’s transmission line and increases the chance of
picking up interference from the other layers of the board. Be careful when designing test points, throughhole pins are not recommended at high frequencies.
Figure 22 illustrates an example of a PCB layout with the TMUX1219. Some key considerations are:
•
•
•
•
Decouple the VDD pin with a 0.1-µF capacitor, placed as close to the pin as possible. Make sure that the
capacitor voltage rating is sufficient for the VDD supply.
Keep the input lines as short as possible.
Use a solid ground plane to help reduce electromagnetic interference (EMI) noise pickup.
Do not run sensitive analog traces in parallel with digital traces. Avoid crossing digital and analog traces if
possible, and only make perpendicular crossings when necessary.
11.2 Layout Example
Via to
GND plane
TMUX1219
Wide (low inductance)
trace for power
C
Figure 22. TMUX1219 Layout Example
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12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
Texas Instruments, Improve Stability Issues with Low CON Multiplexers.
Texas Instruments, Simplifying Design with 1.8 V logic Muxes and Switches.
Texas Instruments, Eliminate Power Sequencing with Powered-off Protection Signal Switches.
Texas Instruments, System-Level Protection for High-Voltage Analog Multiplexers.
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.3 Community Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
12.4 Trademarks
E2E is a trademark of Texas Instruments.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
TMUX1219DBVR
ACTIVE
SOT-23
DBV
6
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
26IT
TMUX1219DCKR
ACTIVE
SC70
DCK
6
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1F5
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of