CY7C1313BV18-167BZCT

CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 18-Mbit QDR™-II SRAM 4-Word Burst Architecture Features Functional Description • Separate Independent Read and Write data ports — Supports concurrent transactions • 300-MHz clock for high bandwidth • 4-Word Burst for reducing address bus frequency • Double Data Rate (DDR) interfaces on both Read and Write ports (data transferred at 600 MHz) at 300 MHz • Two input clocks (K and K) for precise DDR timing — SRAM uses rising edges only • Two input clocks for output data (C and C) to minimize clock-skew and flight-time mismatches • Echo clocks (CQ and CQ) simplify data capture in high-speed systems • Single multiplexed address input bus latches address inputs for both Read and Write ports • Separate Port Selects for depth expansion • Synchronous internally self-timed writes • Available in x 8, x 9, x 18, and x 36 configurations • Full data coherency providing most current data • Core VDD = 1.8 (±0.1V); I/O VDDQ = 1.4V to VDD • Available in 165-ball FBGA package (13 x 15 x 1.4 mm) • Offered in both lead-free and non-lead free packages • Variable drive HSTL output buffers • JTAG 1149.1 compatible test access port • Delay Lock Loop (DLL) for accurate data placement Configurations CY7C1311BV18 – 2M x 8 CY7C1911BV18 – 2M x 9 CY7C1313BV18 – 1M x 18 CY7C1315BV18 – 512K x 36 The CY7C1311BV18, CY7C1911BV18, CY7C1313BV18, and CY7C1315BV18 are 1.8V Synchronous Pipelined SRAMs, equipped with QDR™-II architecture. QDR-II architecture consists of two separate ports to access the memory array. The Read port has dedicated Data Outputs to support Read operations and the Write port has dedicated Data Inputs to support Write operations. QDR-II architecture has separate data inputs and data outputs to completely eliminate the need to “turn-around” the data bus required with common I/O devices. Access to each port is accomplished through a common address bus. Addresses for Read and Write addresses are latched on alternate rising edges of the input (K) clock. Accesses to the QDR-II Read and Write ports are completely independent of one another. In order to maximize data throughput, both Read and Write ports are equipped with Double Data Rate (DDR) interfaces. Each address location is associated with four 8-bit words (CY7C1311BV18) or 9-bit words (CY7C1911BV18) or 18-bit words (CY7C1313BV18) or 36-bit words (CY7C1315BV18) that burst sequentially into or out of the device. Since data can be transferred into and out of the device on every rising edge of both input clocks (K and K and C and C), memory bandwidth is maximized while simplifying system design by eliminating bus “turn-arounds”. Depth expansion is accomplished with Port Selects for each port. Port selects allow each port to operate independently. All synchronous inputs pass through input registers controlled by the K or K input clocks. All data outputs pass through output registers controlled by the C or C (or K or K in a single clock domain) input clocks. Writes are conducted with on-chip synchronous self-timed write circuitry. Selection Guide 300 MHz 278 MHz 250 MHz 200 MHz 167 MHz Unit Maximum Operating Frequency 300 278 250 200 167 MHz Maximum Operating Current 550 530 500 450 400 mA Cypress Semiconductor Corporation Document Number: 38-05620 Rev. *C • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised June 27, 2006 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Logic Block Diagram (CY7C1311BV18) 8 DOFF Address Register Read Add. Decode CLK Gen. Write Reg 512K x 8 Array K K Write Reg 512K x 8 Array 19 Write Reg 512K x 8 Array A(18:0) Write Reg 512K x 8 Array Address Register Write Add. Decode D[7:0] RPS Control Logic C C Read Data Reg. 32 VREF WPS NWS[1:0] CQ CQ 16 Reg. Control Logic A(18:0) 19 16 Reg. Reg. 8 Q[7:0] 8 Logic Block Diagram (CY7C1911BV18) DOFF VREF WPS BWS[0] Write Reg Address Register Read Add. Decode CLK Gen. Write Reg 512K x 9 Array K K Write Reg 512K x 9 Array 19 Write Reg 512K x 9 Array Address Register 512K x 9 Array A(18:0) 9 Write Add. Decode D[8:0] RPS Control Logic C C Read Data Reg. 36 Control Logic CQ CQ 18 Reg. 18 Reg. Reg. 9 9 Document Number: 38-05620 Rev. *C A(18:0) 19 Q[8:0] Page 2 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Logic Block Diagram (CY7C1313BV18) DOFF Write Reg Address Register Read Add. Decode CLK Gen. Write Reg 256K x 18 Array K K Write Reg 256K x 18 Array 18 Write Reg 256K x 18 Array Address Register 256K x 18 Array A(17:0) 18 Write Add. Decode D[17:0] 18 RPS Control Logic C C Read Data Reg. 72 VREF WPS CQ CQ 36 Reg. Control Logic BWS[1:0] A(17:0) 36 Reg. Reg. 18 18 Q[17:0] Logic Block Diagram (CY7C1315BV18) DOFF VREF WPS BWS[3:0] Write Reg Address Register Read Add. Decode CLK Gen. Write Reg 128K x 36 Array K K Write Reg 128K x 36 Array 17 Write Reg 128K x 36 Array Address Register 128K x 36 Array A(16:0) 36 Write Add. Decode D[35:0] 17 RPS Control Logic C C Read Data Reg. 144 Control Logic Reg. Reg. 36 Document Number: 38-05620 Rev. *C CQ CQ 72 Reg. 72 A(16:0) 36 Q [35:0] Page 3 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Pin Configurations 165-ball FBGA (13 x 15 x 1.4 mm) Pinout CY7C1311BV18 (2M x 8) 1 2 3 4 5 6 7 8 9 10 11 A CQ NC/72M A WPS NWS1 K NC/144M RPS A NC/36M CQ B C D E F G H J K L M N P NC NC NC NC NC D4 NC NC NC/288M A VSS K NC VSS NWS0 A VSS A VSS VSS NC NC NC A VSS VSS NC NC NC Q3 D3 NC R NC NC NC Q4 VDDQ VSS VSS VSS VDDQ NC D2 Q2 NC NC NC VDDQ VDD VSS VDD VDDQ NC NC NC NC DOFF NC D5 VREF NC Q5 VDDQ NC VDDQ VDDQ VDDQ VDD VDD VDD VSS VSS VSS VDD VDD VDD VDDQ VDDQ VDDQ NC VDDQ NC NC VREF Q1 NC ZQ D1 NC NC NC VDDQ VDD VSS VDD VDDQ NC NC NC NC Q6 D6 VDDQ VSS VSS VSS VDDQ NC NC Q0 NC NC NC D7 NC NC VSS VSS VSS A VSS A VSS A VSS VSS NC NC NC NC D0 NC NC NC Q7 A A C A A NC NC NC TDO TCK A A A C A A A TMS TDI CY7C1911BV18 (2M x 9) A B C D E F G H J K L M N P R 1 2 3 4 CQ NC NC/72M A WPS NC NC A NC NC NC D5 NC VSS VSS A NC 9 10 11 RPS A NC/36M CQ A NC NC Q4 A VSS VSS VSS NC NC NC D4 NC 6 7 8 NC K NC/144M NC/288M K BWS0 VSS NC VSS 5 NC NC NC Q5 VDDQ VSS VSS VSS VDDQ NC D3 Q3 NC NC NC VDDQ VDD VSS VDD VDDQ NC NC NC NC DOFF NC D6 VREF NC Q6 VDDQ NC VDDQ VDDQ VDDQ VDD VDD VDD VSS VSS VSS VDD VDD VDD VDDQ VDDQ VDDQ NC VDDQ NC NC VREF Q2 NC ZQ D2 NC NC NC VDDQ VDD VSS VDD VDDQ NC NC NC NC Q7 D7 VDDQ VSS VSS VSS VDDQ NC NC Q1 NC NC NC D8 NC NC VSS VSS VSS A VSS A VSS A VSS VSS NC NC NC NC D1 NC NC NC Q8 A A C A A NC D0 Q0 TDO TCK A A A C A A A TMS TDI Document Number: 38-05620 Rev. *C Page 4 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Pin Configurations (continued) 165-ball FBGA (13 x 15 x 1.4 mm) Pinout CY7C1313BV18 (1M x 18) 1 A B C D E F G H J K L M N P R CQ NC R 3 4 5 6 7 8 9 10 11 WPS BWS1 K NC/288M RPS A NC/72M CQ Q9 D9 A NC K BWS0 A NC NC Q8 A NC A Q7 D8 VSS VSS VSS VSS NC VSS NC NC D7 NC NC D10 NC D11 Q10 VSS VSS NC NC Q11 VDDQ VSS VSS VSS VDDQ NC D6 Q6 NC Q12 D12 VDDQ VDD VSS VDD VDDQ NC NC Q5 NC D13 Q13 VDDQ VDD VSS VDD VDDQ NC D5 DOFF NC VREF NC VDDQ D14 VDDQ VDDQ VDD VDD VSS VSS VDD VDD VDDQ VDDQ NC VDDQ NC VREF Q4 ZQ D4 NC NC Q14 VDDQ VDD VSS VDD VDDQ NC D3 Q3 NC Q15 D15 VDDQ VSS VSS VSS VDDQ NC NC Q2 NC NC NC D17 D16 Q16 VSS VSS VSS A VSS A VSS A VSS VSS NC NC Q1 NC D2 D1 NC NC Q17 A A C A A NC D0 Q0 TDO TCK A A A C A A A TMS TDI 3 CY7C1315BV18 (512K x 36) 7 4 5 6 9 10 1 A B C D E F G H J K L M N P 2 NC/144M NC/36M CQ 2 NC/288M NC/72M WPS BWS2 BWS3 A 8 11 NC/36M NC/144M CQ K BWS1 RPS K D17 Q17 Q8 VSS VSS D16 VSS BWS0 A VSS A NC VSS Q16 Q7 D15 D8 D7 VSS VSS VSS VDDQ Q15 D6 Q6 Q27 Q18 D18 A D27 D28 Q28 D20 D19 Q19 VSS VSS Q29 D29 Q20 VDDQ Q30 Q21 D21 VDDQ VDD VSS VDD VDDQ D14 Q14 Q5 D30 D22 VREF Q31 Q22 VDDQ D23 VDDQ VDDQ VDDQ VDD VDD VDD VSS VSS VSS VDD VDD VDD VDDQ VDDQ VDDQ Q13 VDDQ D12 D13 VREF Q4 D5 ZQ D4 Q32 D32 Q23 VDDQ VDD VSS VDD VDDQ Q12 D3 Q3 Q33 Q24 D24 VDDQ VSS VSS VSS VDDQ D11 Q11 Q2 D33 D34 Q34 D26 D25 Q25 VSS VSS VSS A VSS A VSS A VSS VSS D10 Q10 Q1 D9 D2 D1 Q35 D35 Q26 A A C A A Q9 D0 Q0 TDO TCK A A A C A A A TMS TDI DOFF D31 Document Number: 38-05620 Rev. *C Page 5 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Pin Definitions Pin Name I/O Pin Description D[x:0] InputData input signals, sampled on the rising edge of K and K clocks during valid write operaSynchronous tions. CY7C1311BV18 − D[7:0] CY7C1911BV18 − D[8:0] CY7C1313BV18 − D[17:0] CY7C1315BV18 − D[35:0] WPS InputWrite Port Select, active LOW. Sampled on the rising edge of the K clock. When asserted active, Synchronous a Write operation is initiated. Deasserting will deselect the Write port. Deselecting the Write port will cause D[x:0] to be ignored. NWS0, NWS1, InputNibble Write Select 0, 1 − active LOW.(CY7C1311BV18 Only) Sampled on the rising edge of Synchronous the K and K clocks during Write operations. Used to select which nibble is written into the device NWS0 controls D[3:0] and NWS1 controls D[7:4]. All the Nibble Write Selects are sampled on the same edge as the data. Deselecting a Nibble Write Select will cause the corresponding nibble of data to be ignored and not written into the device. InputByte Write Select 0, 1, 2, and 3 − active LOW. Sampled on the rising edge of the K and K clocks BWS0, BWS1, BWS2, BWS3 Synchronous during Write operations. Used to select which byte is written into the device during the current portion of the Write operations. Bytes not written remain unaltered. CY7C1911BV18 − BWS0 controls D[8:0] CY7C1313BV18 − BWS0 controls D[8:0] and BWS1 controls D[17:9]. CY7C1315BV18 − BWS0 controls D[8:0], BWS1 controls D[17:9], BWS2 controls D[26:18] and BWS3 controls D[35:27]. All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select will cause the corresponding byte of data to be ignored and not written into the device. A InputAddress Inputs. Sampled on the rising edge of the K clock during active Read and Write operaSynchronous tions. These address inputs are multiplexed for both Read and Write operations. Internally, the device is organized as 2M x 8 (4 arrays each of 512K x 8) for CY7C1311BV18, 2M x 9 (4 arrays each of 512K x 9) for CY7C1911BV18,1M x 18 (4 arrays each of 256K x 18) for CY7C1313BV18 and 512K x 36 (4 arrays each of 128K x 36) for CY7C1315BV18. Therefore, only 19 address inputs are needed to access the entire memory array of CY7C1311BV18 and CY7C1911BV18, 18 address inputs for CY7C1313BV18 and 17 address inputs for CY7C1315BV18. These inputs are ignored when the appropriate port is deselected. Q[x:0] OutputsData Output signals. These pins drive out the requested data during a Read operation. Valid Synchronous data is driven out on the rising edge of both the C and C clocks during Read operations or K and K. when in single clock mode. When the Read port is deselected, Q[x:0] are automatically tri-stated. CY7C1311BV18 − Q[7:0] CY7C1911BV18 − Q[8:0] CY7C1313BV18 − Q[17:0] CY7C1315BV18 − Q[35:0] RPS InputRead Port Select, active LOW. Sampled on the rising edge of Positive Input Clock (K). When Synchronous active, a Read operation is initiated. Deasserting will cause the Read port to be deselected. When deselected, the pending access is allowed to complete and the output drivers are automatically tri-stated following the next rising edge of the C clock. Each Read access consists of a burst of four sequential transfers. C InputClock Positive Input Clock for Output Data. C is used in conjunction with C to clock out the Read data from the device. C and C can be used together to deskew the flight times of various devices on the board back to the controller. See application example for further details. C InputClock Negative Input Clock for Output Data. C is used in conjunction with C to clock out the Read data from the device. C and C can be used together to deskew the flight times of various devices on the board back to the controller. See application example for further details. K InputClock Positive Input Clock Input. The rising edge of K is used to capture synchronous inputs to the device and to drive out data through Q[x:0] when in single clock mode. All accesses are initiated on the rising edge of K. K InputClock Negative Input Clock Input. K is used to capture synchronous inputs being presented to the device and to drive out data through Q[x:0] when in single clock mode. Document Number: 38-05620 Rev. *C Page 6 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Pin Definitions (continued) Pin Name I/O Pin Description CQ Echo Clock CQ is referenced with respect to C. This is a free running clock and is synchronized to the input clock for output data (C) of the QDR-II. In the single clock mode, CQ is generated with respect to K. The timings for the echo clocks are shown in the AC Timing table. CQ Echo Clock CQ is referenced with respect to C. This is a free running clock and is synchronized to the input clock for output data (C) of the QDR-II. In the single clock mode, CQ is generated with respect to K. The timings for the echo clocks are shown in the AC Timing table. ZQ Input Output Impedance Matching Input. This input is used to tune the device outputs to the system data bus impedance. CQ, CQ, and Q[x:0] output impedance are set to 0.2 x RQ, where RQ is a resistor connected between ZQ and ground. Alternately, this pin can be connected directly to VDDQ, which enables the minimum impedance mode. This pin cannot be connected directly to GND or left unconnected. DOFF Input DLL Turn Off - active LOW. Connecting this pin to ground will turn off the DLL inside the device. The timings in the DLL turned off operation will be different from those listed in this data sheet. TDO Output TCK Input TCK pin for JTAG. TDI Input TDI pin for JTAG. TMS Input TMS pin for JTAG. NC N/A Not connected to the die. Can be tied to any voltage level. NC/36M N/A Not connected to the die. Can be tied to any voltage level. NC/72M N/A Not connected to the die. Can be tied to any voltage level. NC/144M N/A Not connected to the die. Can be tied to any voltage level. NC/288M VREF VDD VSS VDDQ N/A InputReference TDO for JTAG. Not connected to the die. Can be tied to any voltage level. Reference Voltage Input. Static input used to set the reference level for HSTL inputs and outputs as well as AC measurement points. Power Supply Power supply inputs to the core of the device. Ground Ground for the device. Power Supply Power supply inputs for the outputs of the device. Functional Overview The CY7C1311BV18, CY7C1911BV18, CY7C1313BV18, CY7C1315BV18 are synchronous pipelined Burst SRAMs equipped with both a Read port and a Write port. The Read port is dedicated to Read operations and the Write port is dedicated to Write operations. Data flows into the SRAM through the Write port and out through the Read port. These devices multiplex the address inputs in order to minimize the number of address pins required. By having separate Read and Write ports, the QDR-II completely eliminates the need to “turn-around” the data bus and avoids any possible data contention, thereby simplifying system design. Each access consists of four 8-bit data transfers in the case of CY7C1311BV18, four 9-bit data transfers in the case of CY7C1911BV18, four 18-bit data transfers in the case of CY7C1313BV18, and four 36-bit data in the case of CY7C1315BV18 transfers in two clock cycles. Accesses for both ports are initiated on the Positive Input Clock (K). All synchronous input timing is referenced from the rising edge of the input clocks (K and K) and all output timing is referenced to the output clocks (C and C or K and K when in single clock mode). Document Number: 38-05620 Rev. *C All synchronous data inputs (D[x:0]) inputs pass through input registers controlled by the input clocks (K and K). All synchronous data outputs (Q[x:0]) outputs pass through output registers controlled by the rising edge of the output clocks (C and C or K and K when in single-clock mode). All synchronous control (RPS, WPS, BWS[x:0]) inputs pass through input registers controlled by the rising edge of the input clocks (K and K). CY7C1313BV18 is described in the following sections. The same basic descriptions apply to CY7C1311BV18, CY7C1911BV18, and CY7C1315BV18. Read Operations The CY7C1313BV18 is organized internally as 4 arrays of 256K x 18. Accesses are completed in a burst of four sequential 18-bit data words. Read operations are initiated by asserting RPS active at the rising edge of the Positive Input Clock (K). The address presented to Address inputs are stored in the Read address register. Following the next K clock rise, the corresponding lowest order 18-bit word of data is driven onto the Q[17:0] using C as the output timing reference. On the subsequent rising edge of C the next 18-bit data word is driven onto the Q[17:0]. This process continues until all four 18-bit data words have been driven out onto Q[17:0]. The requested data Page 7 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 will be valid 0.45 ns from the rising edge of the output clock (C or C or (K or K when in single-clock mode)). In order to maintain the internal logic, each read access must be allowed to complete. Each Read access consists of four 18-bit data words and takes 2 clock cycles to complete. Therefore, Read accesses to the device can not be initiated on two consecutive K clock rises. The internal logic of the device will ignore the second Read request. Read accesses can be initiated on every other K clock rise. Doing so will pipeline the data flow such that data is transferred out of the device on every rising edge of the output clocks (C and C or K and K when in single-clock mode). When the read port is deselected, the CY7C1313BV18 will first complete the pending Read transactions. Synchronous internal circuitry will automatically tri-state the outputs following the next rising edge of the Positive Output Clock (C). This will allow for a seamless transition between devices without the insertion of wait states in a depth expanded memory. Write Operations Write operations are initiated by asserting WPS active at the rising edge of the Positive Input Clock (K). On the following K clock rise the data presented to D[17:0] is latched and stored into the lower 18-bit Write Data register, provided BWS[1:0] are both asserted active. On the subsequent rising edge of the Negative Input Clock (K) the information presented to D[17:0] is also stored into the Write Data register, provided BWS[1:0] are both asserted active. This process continues for one more cycle until four 18-bit words (a total of 72 bits) of data are stored in the SRAM. The 72 bits of data are then written into the memory array at the specified location. Therefore, Write accesses to the device can not be initiated on two consecutive K clock rises. The internal logic of the device will ignore the second Write request. Write accesses can be initiated on every other rising edge of the Positive Input Clock (K). Doing so will pipeline the data flow such that 18 bits of data can be transferred into the device on every rising edge of the input clocks (K and K). When deselected, the Write port will ignore all inputs after the pending Write operations have been completed. Byte Write Operations Byte Write operations are supported by the CY7C1313BV18. A Write operation is initiated as described in the Write Operations section above. The bytes that are written are determined by BWS0 and BWS1, which are sampled with each set of 18-bit data words. Asserting the appropriate Byte Write Select input during the data portion of a Write will allow the data being presented to be latched and written into the device. Deasserting the Byte Write Select input during the data portion of a write will allow the data stored in the device for that byte to remain unaltered. This feature can be used to simplify Read/Modify/Write operations to a Byte Write operation. Single Clock Mode The CY7C1313BV18 can be used with a single clock that controls both the input and output registers. In this mode the device will recognize only a single pair of input clocks (K and K) that control both the input and output registers. This operation is identical to the operation if the device had zero skew between the K/K and C/C clocks. All timing parameters remain the same in this mode. To use this mode of operation, Document Number: 38-05620 Rev. *C the user must tie C and C HIGH at power on. This function is a strap option and not alterable during device operation. Concurrent Transactions The Read and Write ports on the CY7C1313BV18 operate completely independently of one another. Since each port latches the address inputs on different clock edges, the user can Read or Write to any location, regardless of the transaction on the other port. If the ports access the same location when a Read follows a Write in successive clock cycles, the SRAM will deliver the most recent information associated with the specified address location. This includes forwarding data from a Write cycle that was initiated on the previous K clock rise. Read accesses and Write access must be scheduled such that one transaction is initiated on any clock cycle. If both ports are selected on the same K clock rise, the arbitration depends on the previous state of the SRAM. If both ports were deselected, the Read port will take priority. If a Read was initiated on the previous cycle, the Write port will assume priority (since Read operations can not be initiated on consecutive cycles). If a Write was initiated on the previous cycle, the Read port will assume priority (since Write operations can not be initiated on consecutive cycles). Therefore, asserting both port selects active from a deselected state will result in alternating Read/Write operations being initiated, with the first access being a Read. Depth Expansion The CY7C1313BV18 has a Port Select input for each port. This allows for easy depth expansion. Both Port Selects are sampled on the rising edge of the Positive Input Clock only (K). Each port select input can deselect the specified port. Deselecting a port will not affect the other port. All pending transactions (Read and Write) will be completed prior to the device being deselected. Programmable Impedance An external resistor, RQ, must be connected between the ZQ pin on the SRAM and VSS to allow the SRAM to adjust its output driver impedance. The value of RQ must be 5X the value of the intended line impedance driven by the SRAM. The allowable range of RQ to guarantee impedance matching with a tolerance of ±15% is between 175Ω and 350Ω, with VDDQ = 1.5V. The output impedance is adjusted every 1024 cycles upon power-up to account for drifts in supply voltage and temperature. Echo Clocks Echo clocks are provided on the QDR-II to simplify data capture on high-speed systems. Two echo clocks are generated by the QDR-II. CQ is referenced with respect to C and CQ is referenced with respect to C. These are free running clocks and are synchronized to the output clock of the QDR-II. In the single clock mode, CQ is generated with respect to K and CQ is generated with respect to K. The timings for the echo clocks are shown in the AC Timing table. Page 8 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 DLL DLL to be specifically reset in order to lock the DLL to the desired frequency. The DLL will automatically lock 1024 clock cycles after a stable clock is presented. The DLL may be disabled by applying ground to the DOFF pin. For information refer to the application note ‘DLL Considerations in QDRII/DDRII/QDRII+/DDRII+.’ These chips utilize a Delay Lock Loop (DLL) that is designed to function between 80 MHz and the specified maximum clock frequency. During power-up, when the DOFF is tied HIGH, the DLL gets locked after 1024 cycles of stable clock. The DLL can also be reset by slowing or stopping the input clock K and K for a minimum of 30 ns. However, it is not necessary for the Application Example[11] SRAM #1 Vt R D A R P S # W P S # B W S # R = 250ohms ZQ CQ/CQ# Q C C# K K# SRAM #4 R P S # D A DATA IN DATA OUT Address RPS# BUS WPS# MASTER BWS# (CPU CLKIN/CLKIN# or Source K ASIC) Source K# R W P S # B W S # ZQ R = 250ohms CQ/CQ# Q C C# K K# Vt Vt Delayed K Delayed K# R R = 50ohms Vt = Vddq/2 Truth Table[12, 13, 14, 15, 16, 17] Operation K Write Cycle: Load address on the rising edge of K; input write data on two consecutive K and K rising edges. L-H H[8] Read Cycle: Load address on the rising edge of K; wait one and a half cycle; read data on two consecutive C and C rising edges. L-H L[9] X Q(A) at C(t + 1) ↑ Q(A + 1) at C(t + 2) ↑ Q(A + 2) at C(t + 2)↑ Q(A + 3) at C(t + 3) ↑ NOP: No Operation L-H H H D=X Q = High-Z D=X Q = High-Z D=X Q = High-Z D=X Q = High-Z Stopped X X Previous State Previous State Previous State Previous State Standby: Clock Stopped RPS WPS DQ DQ DQ DQ L[9] D(A) at K(t + 1) ↑ D(A + 1) at K(t + 1) ↑ D(A + 2) at K(t + 2) ↑ D(A + 3) at K(t + 2) ↑ Notes: 1. The above application shows four QDR-II being used. 2. X = “Don't Care,” H = Logic HIGH, L = Logic LOW, ↑ represents rising edge. 3. Device will power-up deselected and the outputs in a tri-state condition. 4. “A” represents address location latched by the devices when transaction was initiated. A + 1, A + 2, and A +3 represents the address sequence in the burst. 5. “t” represents the cycle at which a Read/write operation is started. t + 1, t + 2, and t + 3 are the first, second and third clock cycles respectively succeeding the “t” clock cycle. 6. Data inputs are registered at K and K rising edges. Data outputs are delivered on C and C rising edges, except when in single clock mode. 7. It is recommended that K = K and C = C = HIGH when clock is stopped. This is not essential, but permits most rapid restart by overcoming transmission line charging symmetrically. 8. If this signal was LOW to initiate the previous cycle, this signal becomes a “Don’t Care” for this operation. 9. This signal was HIGH on previous K clock rise. Initiating consecutive Read or Write operations on consecutive K clock rises is not permitted. The device will ignore the second Read or Write request. Document Number: 38-05620 Rev. *C Page 9 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Write Cycle Descriptions (CY7C1311BV18 and CY7C1313BV18) BWS0/NWS0 BWS1/NWS1 K K – L L L–H L L – L H L–H L H – H L L–H H L – H H L–H H H – [2, 10] Comments During the Data portion of a Write sequence: CY7C1311BV18 − both nibbles (D[7:0]) are written into the device, CY7C1313BV18 − both bytes (D[17:0]) are written into the device. L-H During the Data portion of a Write sequence: CY7C1311BV18 − both nibbles (D[7:0]) are written into the device, CY7C1313BV18 − both bytes (D[17:0]) are written into the device. – During the Data portion of a Write sequence : CY7C1311BV18 − only the lower nibble (D[3:0]) is written into the device. D[7:4] will remain unaltered, CY7C1313BV18 − only the lower byte (D[8:0]) is written into the device. D[17:9] will remain unaltered. L–H During the Data portion of a Write sequence : CY7C1311BV18 − only the lower nibble (D[3:0]) is written into the device. D[7:4] will remain unaltered, CY7C1313BV18 − only the lower byte (D[8:0]) is written into the device. D[17:9] will remain unaltered. – During the Data portion of a Write sequence : CY7C1311BV18 − only the upper nibble (D[7:4]) is written into the device. D[3:0] will remain unaltered, CY7C1313BV18 − only the upper byte (D[17:9]) is written into the device. D[8:0] will remain unaltered. L–H During the Data portion of a Write sequence : CY7C1311BV18 − only the upper nibble (D[7:4]) is written into the device. D[3:0] will remain unaltered, CY7C1313BV18 − only the upper byte (D[17:9]) is written into the device. D[8:0] will remain unaltered. – No data is written into the devices during this portion of a write operation. L–H No data is written into the devices during this portion of a write operation. Note: 10. Assumes a Write cycle was initiated per the Write Port Cycle Description Truth Table. NWS0, NWS1, BWS0, BWS1, BWS2 and BWS3 can be altered on different portions of a Write cycle, as long as the set-up and hold requirements are achieved. Document Number: 38-05620 Rev. *C Page 10 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Write Cycle Descriptions(CY7C1315BV18)[2, 10] BWS0 BWS1 BWS2 BWS3 K K Comments L L L L L–H – During the Data portion of a Write sequence, all four bytes (D[35:0]) are written into the device. L L L L – L–H During the Data portion of a Write sequence, all four bytes (D[35:0]) are written into the device. L H H H L–H – During the Data portion of a Write sequence, only the lower byte (D[8:0]) is written into the device. D[35:9] will remain unaltered. L H H H – L–H During the Data portion of a Write sequence, only the lower byte (D[8:0]) is written into the device. D[35:9] will remain unaltered. H L H H L–H – During the Data portion of a Write sequence, only the byte (D[17:9]) is written into the device. D[8:0] and D[35:18] will remain unaltered. H L H H – L–H During the Data portion of a Write sequence, only the byte (D[17:9]) is written into the device. D[8:0] and D[35:18] will remain unaltered. H H L H L–H – During the Data portion of a Write sequence, only the byte (D[26:18]) is written into the device. D[17:0] and D[35:27] will remain unaltered. H H L H – L–H During the Data portion of a Write sequence, only the byte (D[26:18]) is written into the device. D[17:0] and D[35:27] will remain unaltered. H H H L L–H H H H L – H H H H L–H – No data is written into the device during this portion of a write operation. H H H H – L–H No data is written into the device during this portion of a write operation. During the Data portion of a Write sequence, only the byte (D[35:27]) is written into the device. D[26:0] will remain unaltered. L–H During the Data portion of a Write sequence, only the byte (D[35:27]) is written into the device. D[26:0] will remain unaltered. Write Cycle Descriptions (CY7C1911BV18)[2, 10] BWS0 K K L L–H – During the Data portion of a Write sequence, the single byte (D[8:0]) is written into the device. L – L–H During the Data portion of a Write sequence, the single byte (D[8:0]) is written into the device. H L–H – No data is written into the device during this portion of a write operation. H – L–H No data is written into the device during this portion of a write operation. Document Number: 38-05620 Rev. *C Page 11 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 IEEE 1149.1 Serial Boundary Scan (JTAG) These SRAMs incorporate a serial boundary scan test access port (TAP) in the FBGA package. This part is fully compliant with IEEE Standard #1149.1-1900. The TAP operates using JEDEC standard 1.8V I/O logic levels. Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull-up resistor. TDO should be left unconnected. Upon power-up, the device will come up in a reset state which will not interfere with the operation of the device. TDI and TDO pins as shown in TAP Controller Block Diagram. Upon power-up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the Capture IR state, the two least significant bits are loaded with a binary “01” pattern to allow for fault isolation of the board level serial test path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between TDI and TDO pins. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Test Access Port—Test Clock Boundary Scan Register The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. The boundary scan register is connected to all of the input and output pins on the SRAM. Several no connect (NC) pins are also included in the scan register to reserve pins for higher density devices. Test Mode Select The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this pin unconnected if the TAP is not used. The pin is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI pin is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information on loading the instruction register, see the TAP Controller State Diagram. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) on any register. Test Data-Out (TDO) The TDO output pin is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine (see Instruction codes). The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. Performing a TAP Reset A Reset is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power-up, the TAP is reset internally to ensure that TDO comes up in a high-Z state. TAP Registers Registers are connected between the TDI and TDO pins and allow data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction registers. Data is serially loaded into the TDI pin on the rising edge of TCK. Data is output on the TDO pin on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the Document Number: 38-05620 Rev. *C The boundary scan register is loaded with the contents of the RAM Input and Output ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO pins when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the Input and Output ring. The Boundary Scan Order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in the Identification Register Definitions table. TAP Instruction Set Eight different instructions are possible with the three-bit instruction register. All combinations are listed in the Instruction Code table. Three of these instructions are listed as RESERVED and should not be used. The other five instructions are described in detail below. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO pins. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. IDCODE The IDCODE instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO pins and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction Page 12 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 is loaded into the instruction register upon power-up or whenever the TAP controller is given a test logic reset state. SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO pins when the TAP controller is in a Shift-DR state. The SAMPLE Z command puts the output bus into a High-Z state until the next command is given during the “Update IR” state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output will undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This will not harm the device, but there is no guarantee as to the value that will be captured. Repeatable results may not be possible. To guarantee that the boundary scan register will capture the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller's capture set-up plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK captured in the boundary scan register. Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. PRELOAD allows an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells prior to the selection of another boundary scan test operation. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO pins. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. EXTEST The EXTEST instruction enables the preloaded data to be driven out through the system output pins. This instruction also selects the boundary scan register to be connected for serial access between the TDI and TDO in the shift-DR controller state. EXTEST OUTPUT BUS TRI-STATE IEEE Standard 1149.1 mandates that the TAP controller be able to put the output bus into a tri-state mode. The boundary scan register has a special bit located at bit #47. When this scan cell, called the “extest output bus tristate”, is latched into the preload register during the “Update-DR” state in the TAP controller, it will directly control the state of the output (Q-bus) pins, when the EXTEST is entered as the current instruction. When HIGH, it will enable the output buffers to drive the output bus. When LOW, this bit will place the output bus into a High-Z condition. This bit can be set by entering the SAMPLE/PRELOAD or EXTEST command, and then shifting the desired bit into that cell, during the “Shift-DR” state. During “Update-DR”, the value loaded into that shift-register cell will latch into the preload register. When the EXTEST instruction is entered, this bit will directly control the output Q-bus pins. Note that this bit is pre-set HIGH to enable the output when the device is powered-up, and also when the TAP controller is in the “Test-Logic-Reset” state. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions. The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required—that is, while data captured is shifted out, the preloaded data can be shifted in. Document Number: 38-05620 Rev. *C Page 13 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 TAP Controller State Diagram[11] 1 TEST-LOGIC RESET 0 0 TEST-LOGIC/ IDLE 1 1 1 SELECT DR-SCAN SELECT IR-SCAN 0 0 1 1 CAPTURE-DR CAPTURE-IR 0 0 SHIFT-DR SHIFT-IR 0 1 0 1 1 EXIT1-DR 1 EXIT1-IR 0 0 PAUSE-DR 0 0 PAUSE-IR 1 1 0 0 EXIT2-IR EXIT2-DR 1 1 UPDATE-DR 1 0 UPDATE-IR 1 0 Note: 11. The 0/1 next to each state represents the value at TMS at the rising edge of TCK. Document Number: 38-05620 Rev. *C Page 14 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 TAP Controller Block Diagram 0 Bypass Register Selection Circuitry TDI 2 1 0 1 0 Selection Circuitry Instruction Register 31 30 29 . . 2 TDO Identification Register 106 . . . . 2 1 0 Boundary Scan Register TCK TMS TAP Controller TAP Electrical Characteristics Over the Operating Range[12, 15, 16] Parameter Description Test Conditions Min. Max. Unit IOH = −2.0 mA 1.4 Output HIGH Voltage IOH = −100 µA 1.6 Output LOW Voltage IOL = 2.0 mA 0.4 V VOL2 Output LOW Voltage IOL = 100 µA 0.2 V V VOH1 Output HIGH Voltage VOH2 VOL1 V V VIH Input HIGH Voltage 0.65VDD VDD + 0.3 VIL Input LOW Voltage –0.3 0.35VDD V IX Input and Output Load Current –5 5 µA GND ≤ VI ≤ VDD TAP AC Switching Characteristics Over the Operating Range [13, 14] Parameter Description Min. Max. Unit 20 MHz tTCYC TCK Clock Cycle Time tTF TCK Clock Frequency 50 ns tTH TCK Clock HIGH 20 ns tTL TCK Clock LOW 20 ns Set-up Times tTMSS TMS Set-up to TCK Clock Rise 5 ns tTDIS TDI Set-up to TCK Clock Rise 5 ns tCS Capture Set-up to TCK Rise 5 ns Hold Times tTMSH TMS Hold after TCK Clock Rise 5 ns tTDIH TDI Hold after Clock Rise 5 ns Notes: 12. These characteristic pertain to the TAP inputs (TMS, TCK, TDI and TDO). Parallel load levels are specified in the Electrical Characteristics table. 13. tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register. 14. Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns. 15. Overshoot: VIH(AC) < VDDQ + 0.85V (Pulse width less than tCYC/2), Undershoot: VIL(AC) > −1.5V (Pulse width less than tCYC/2). 16. All Voltage referenced to Ground. Document Number: 38-05620 Rev. *C Page 15 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 TAP AC Switching Characteristics Over the Operating Range [13, 14] (continued) Parameter Description Min. Capture Hold after Clock Rise tCH Max. 5 Unit ns Output Times tTDOV TCK Clock LOW to TDO Valid tTDOX TCK Clock LOW to TDO Invalid 10 0 ns ns TAP Timing and Test Conditions[14] 0.9V ALL INPUT PULSES 1.8V 0.9V 50Ω 0V TDO Z0 = 50Ω CL = 20 pF GND tTH (a) tTL Test Clock TCK tTCYC tTMSS tTMSH Test Mode Select TMS tTDIS tTDIH Test Data-In TDI Test Data-Out TDO tTDOV Document Number: 38-05620 Rev. *C tTDOX Page 16 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Identification Register Definitions Value Instruction Field CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Revision Number (31:29) 000 000 000 000 Description Version number. Cypress Device ID (28:12) 11010011011000101 11010011011001101 11010011011010101 11010011011100101 Defines the type of SRAM. Cypress JEDEC ID (11:1) 00000110100 00000110100 00000110100 00000110100 Allows unique identification of SRAM vendor. ID Register Presence (0) 1 1 1 1 Indicates the presence of an ID register. Scan Register Sizes Register Name Bit Size Instruction 3 Bypass 1 ID 32 Boundary Scan 107 Instruction Codes Instruction Code Description EXTEST 000 Captures the Input/Output ring contents. IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operation. SAMPLE Z 010 Captures the Input/Output contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a High-Z state. RESERVED 011 Do Not Use: This instruction is reserved for future use. SAMPLE/PRELOAD 100 Captures the Input/Output ring contents. Places the boundary scan register between TDI and TDO. Does not affect the SRAM operation. RESERVED 101 Do Not Use: This instruction is reserved for future use. RESERVED 110 Do Not Use: This instruction is reserved for future use. BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operation. Document Number: 38-05620 Rev. *C Page 17 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Boundary Scan Order Bit # Bump ID Bit # Bump ID Bit # Bump ID Bit # Bump ID 0 6R 27 11H 54 7B 81 3G 1 6P 28 10G 55 6B 82 2G 2 6N 29 9G 56 6A 83 1J 3 7P 30 11F 57 5B 84 2J 4 7N 31 11G 58 5A 85 3K 5 7R 32 9F 59 4A 86 3J 6 8R 33 10F 60 5C 87 2K 1K 7 8P 34 11E 61 4B 88 8 9R 35 10E 62 3A 89 2L 9 11P 36 10D 63 1H 90 3L 10 10P 37 9E 64 1A 91 1M 11 10N 38 10C 65 2B 92 1L 12 9P 39 11D 66 3B 93 3N 13 10M 40 9C 67 1C 94 3M 14 11N 41 9D 68 1B 95 1N 15 9M 42 11B 69 3D 96 2M 16 9N 43 11C 70 3C 97 3P 17 11L 44 9B 71 1D 98 2N 18 11M 45 10B 72 2C 99 2P 19 9L 46 11A 73 3E 100 1P 20 10L 47 Internal 74 2D 101 3R 21 11K 48 9A 75 2E 102 4R 22 10K 49 8B 76 1E 103 4P 23 9J 50 7C 77 2F 104 5P 24 9K 51 6C 78 3F 105 5N 25 10J 52 8A 79 1G 106 5R 26 11J 53 7A 80 1F Document Number: 38-05620 Rev. *C Page 18 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Power-Up Sequence in QDR-II SRAM[17, 18] QDR-II SRAMs must be powered up and initialized in a predefined manner to prevent undefined operations. Power-Up Sequence • Apply power and drive DOFF LOW (All other inputs can be HIGH or LOW) — Apply VDD before VDDQ DLL Constraints • DLL uses either K or C clock as its synchronizing input.The input should have low phase jitter, which is specified as tKC Var • The DLL will function at frequencies down to 80 MHz • If the input clock is unstable and the DLL is enabled, then the DLL may lock to an incorrect frequency, causing unstable SRAM behavior — Apply VDDQ before VREF or at the same time as VREF • After the power and clock (K, K, C, C) are stable take DOFF HIGH • The additional 1024 cycles of clocks are required for the DLL to lock ~ ~ Power-up Waveforms K K ~ ~ Unstable Clock > 1024 Stable clock Start Normal Operation Clock Start (Clock Starts after V DD / V DDQ Stable) VDD / VDDQ DOFF V DD / V DDQ Stable (< +/- 0.1V DC per 50ns ) Fix High (or tied to VDDQ) Notes: 17. It is recommended that the DOFF pin be pulled HIGH via a pull up resistor of 1 Kohm. 18. During Power-Up, when the DOFF is tied HIGH, the DLL gets locked after 1024 cycles of stable clock. Document Number: 38-05620 Rev. *C Page 19 of 28 [+] Feedback CY7C1311BV18 CY7C1911BV18 CY7C1313BV18 CY7C1315BV18 Maximum Ratings Current into Outputs (LOW)......................................... 20 mA Static Discharge Voltage (MIL-STD-883, M. 3015).. > 2001V (Above which the useful life may be impaired.) Storage Temperature ................................. –65°C to +150°C Ambient Temperature with Power Applied .. –55°C to +125°C Latch-up Current.................................................... > 200 mA Operating Range Supply Voltage on VDD Relative to GND........ –0.5V to +2.9V Range Supply Voltage on VDDQ Relative to GND ...... –0.5V to +VDD Ambient Temperature (TA) VDD[21] VDDQ[21] 0°C to +70°C 1.8 ± 0.1V 1.4V to VDD Com’l DC Applied to Outputs in High-Z .........–0.5V to VDDQ + 0.3V Ind’l DC Input Voltage[15] ...............................–0.5V to VDD + 0.3V –40°C to +85°C Electrical Characteristics Over the Operating Range[16] DC Electrical Characteristics Over the Operating Range Parameter Description Test Conditions Min. Typ. Max. Unit V VDD Power Supply Voltage 1.7 1.8 1.9 VDDQ I/O Supply Voltage 1.4 1.5 VDD V VOH Output HIGH Voltage Note 19 VDDQ/2 – 0.12 VDDQ/2 + 0.12 V VOL Output LOW Voltage Note 20 VDDQ/2 – 0.12 VDDQ/2 + 0.12 V VOH(LOW) Output HIGH Voltage IOH = −0.1 mA, Nominal Impedance VDDQ – 0.2 VDDQ V VOL(LOW) Output LOW Voltage IOL = 0.1 mA, Nominal Impedance VSS 0.2 V VIH Input HIGH Voltage[15] VREF + 0.1 VDDQ + 0.3 V VIL Input LOW Voltage[15] –0.3 VREF – 0.1 V IX Input Leakage Current GND ≤ VI ≤ VDDQ −5 5 µA IOZ Output Leakage Current GND ≤ VI ≤ VDDQ, Output Disabled VREF Input Reference Voltage[22] Typical Value = 0.75V IDD VDD Operating Supply ISB1 Automatic Power-down Current −5 5 µA 0.95 V VDD = Max., IOUT = 0 mA, 167 MHz f = fMAX = 1/tCYC 200 MHz 400 mA 450 mA 250 MHz 500 mA 278 MHz 530 mA 300 MHz 550 mA 167 MHz 200 mA 200 MHz 220 mA 250 MHz 240 mA 278 MHz 250 mA 300 MHz 260 mA 0.68 Max. VDD, Both Ports Deselected, VIN ≥ VIH or VIN ≤ VIL f = fMAX = 1/tCYC, Inputs Static 0.75 AC Electrical Characteristics Over the Operating Range Parameter Description Test Conditions Min. Typ. Max. Unit VIH Input HIGH Voltage VREF + 0.2 – – V VIL Input LOW Voltage – – VREF – 0.2 V Capacitance[23] Parameter Description CIN Input Capacitance CCLK Clock Input Capacitance CO Output Capacitance Test Conditions TA = 25°C, f = 1 MHz, VDD = 1.8V VDDQ = 1.5V Max. Unit 5 pF 6 pF 7 pF Notes: 19. Output are impedance controlled. IOH = −(VDDQ/2)/(RQ/5) for values of 175Ω