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GVT71128D32T-7I

GVT71128D32T-7I

  • 厂商:

    ETC1

  • 封装:

  • 描述:

    GVT71128D32T-7I - 128K X 32 SYNCHRONOUS BURST SRAM - List of Unclassifed Manufacturers

  • 数据手册
  • 价格&库存
GVT71128D32T-7I 数据手册
GALVANTECH, GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM SYNCHRONOUS BURST SRAM PIPELINED OUTPUT FEATURES • • • • • • • • • • • • • • • • • • • • Fast access times: 4.8, 5, 6, and 7ns Fast clock speed: 100, 83, and 66MHz Provide high performance 3-1-1-1 access rate Fast OE# access times: 5, 6, and 7ns Optimal for depth expansion (one cycle chip deselect to eliminate bus contention) Single +3.3V -5% and +10%power supply Support +2.5V I/O 5V tolerant inputs except I/O’s Clamp diodes to VSSQ at all outputs Common data inputs and data outputs BYTE WRITE ENABLE and GLOBAL WRITE control Three chip enables for depth expansion and address pipeline Address, control, input, and output pipeline registers Internally self-timed WRITE CYCLE Burst control pins (interleaved or linear burst sequence) Automatic power-down for portable applications High density, high speed packages Low capacitive bus loading High 30pF output drive capability at rated access time 128K x 32 SRAM +3.3V SUPPLY, PIPELINED, SINGLE CYCLE DESELECT, BURST COUNTER GENERAL DESCRIPTION The Galvantech Synchronous Burst SRAM family employs high-speed, low power CMOS designs using advanced triple-layer polysilicon, double-layer metal technology. Each memory cell consists of four transistors and two high valued resistors. The GVT71128D32 SRAM integrates 131,072x32 SRAM cells with advanced synchronous peripheral circuitry and a 2-bit counter for internal burst operation. All synchronous inputs are gated by registers controlled by a positive-edge-triggered clock input (CLK). The synchronous inputs include all addresses, all data inputs, address-pipelining chip enable (CE#), depth-expansion chip enables (CE2# and CE2), burst control inputs (ADSC#, ADSP#, and ADV#), write enables (BW1#, BW2#, BW3#, BW4#,and BWE#), and global write (GW#). Asynchronous inputs include the output enable (OE#) and burst mode control (MODE). The data outputs (Q), enabled by OE#, are also asynchronous. Addresses and chip enables are registered with either address status processor (ADSP#) or address status controller (ADSC#) input pins. Subsequent burst addresses can be internally generated as controlled by the burst advance pin (ADV#). Address, data inputs, and write controls are registered onchip to initiate self-timed WRITE cycle. WRITE cycles can be one to four bytes wide as controlled by the write control inputs. Individual byte write allows individual byte to be written. BW1# controls DQ1-DQ8. BW2# controls DQ9DQ16. BW3# controls DQ17-DQ24. BW4# controls DQ25DQ32. BW1#, BW2# BW3#, and BW4# can be active only with BWE# being LOW. GW# being LOW causes all bytes to be written. This device also incorporates pipelined enable circuit for easy depth expansion without penalizing system performance. The GVT71128D32 operates from a +3.3V power supply. All inputs and outputs are TTL-compatible. The device is ideally suited for 486, Pentium TM , 680x0, and PowerPCTM systems and for systems that are benefited from a wide synchronous data bus. OPTIONS Timing 4.8ns access/10ns cycle 5ns access/10ns cycle 6ns access/12ns cycle 7ns access/15ns cycle Packages 100-pin TQFP Temperature Commercial Industrial MARKING -4 -5 -6 -7 T • • None I (0°C to 70°C) (-40°C t o 85°C) Galvantech, Inc. 3080 Oakmead Village Drive, Santa Clara, CA 95051 Tel (408) 566-0688 Fax (408) 566-0699 Web Site www.galvantech.com Rev. 11/9 9 Pentium is a trademark of Intel Corporation. PowerPC is a trademark of IBM Corporation. Galvantech, Inc. reserves the right to change products or specifications without notice. GALVANTECH, FUNCTIONAL BLOCK DIAGRAM GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM BYTE 1 WRITE BW1# BWE# CLK D Q BYTE 2 WRITE BW2# D Q GW# BYTE 3 WRITE BW3# D Q BYTE 4 WRITE BW4# D Q byte 4 write byte 3 write Output Buffers byte 2 write byte 1 write DQ1-DQ32 CE# CE2 CE2# OE# ZZ Power Down Logic ENABLE D Q D Q ADSP# A16-A2 ADSC# CLR ADV# A1-A0 MODE Binary Counter & Logic Address Register Input Register 128K x 8 x 4 SRAM Array OUTPUT REGISTER D Q NOTE: The Functional Block Diagram illustrates simplified device operation. See Truth Table, pin descriptions and timing diagrams for detailed information. November 20, 1999 2 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM PIN ASSIGNMENT (Top View) A6 A7 CE# CE2 BW4# BW3# BW2# BW1# CE2# VCC VSS CLK GW# BWE# OE# ADSC# ADSP# ADV# A8 A9 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 75 74 73 72 71 70 69 68 NC DQ17 DQ18 VCCQ VSSQ DQ19 DQ20 DQ21 DQ22 VSSQ VCCQ DQ23 DQ24 NC VCC NC VSS DQ25 DQ26 VCCQ VSSQ DQ27 DQ28 DQ29 DQ30 VSSQ VCCQ DQ31 DQ32 NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 100-pin PQFP or 100-pin TQFP 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 NC DQ16 DQ15 VCCQ VSSQ DQ14 DQ13 DQ12 DQ11 VSSQ VCCQ DQ10 DQ9 VSS NC VCC ZZ DQ8 DQ7 VCCQ VSSQ DQ6 DQ5 DQ4 DQ3 VSSQ VCCQ DQ2 DQ1 NC 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 PIN DESCRIPTIONS QFP PINS 37, 32, 44, 49, 36, 35, 34, 33, 100, 99, 82, 81, 45, 46, 47, 48, 50 93,94,95,96 SYMBOL A0-A16 TYPE InputSynchronous BW1#, BW2#, BW3#, BW4# BWE# GW# InputSynchronous 87 88 InputSynchronous InputSynchronous 89 CLK InputSynchronous 98 92 CE# CE2# InputSynchronous InputSynchronous November 20, 1999 Rev. 11/9 9 MODE A5 A4 A3 A2 A1 A0 NC NC VSS VCC NC NC A10 A11 A12 A13 A14 A15 A16 DESCRIPTION Addresses: These inputs are registered and must meet the setup and hold times around the rising edge of CLK. The burst counter generates internal addresses associated with A0 and A1, during burst cycle and wait cycle . Byte Write: A byte write is LOW for a WRITE cycle and HIGH for a READ cycle. BW1# controls DQ1-DQ8. BW2# controls DQ9-DQ16. BW3# controls DQ17-DQ24. BW4# controls DQ25-DQ32. Data I/O are high impedance if either of these inputs are LOW, conditioned by BWE# being LOW. Write Enable: This active LOW input gates byte write operations and must meet the setup and hold times around the rising edge of CLK. Global Write: This active LOW input allows a full 32-bit WRITE to occur independent of the BWE# and BWn# lines and must meet the setup and hold times around the rising edge of CLK. Clock: This signal registers the addresses, data, chip enables, write control and burst control inputs on its rising edge. All synchronous inputs must meet setup and hold times around the clock’s rising edge. Chip Enable: This active LOW input is used to enable the device and to gate ADSP#. Chip Enable: This active LOW input is used to enable the device. 3 Galvantech, Inc. reserves the right to change products or specifications without notice. GALVANTECH, PIN DESCRIPTIONS (continued) QFP PINS 97 86 83 84 GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM SYMBOL CE2 OE# ADV # ADSP# TYPE inputSynchronous DESCRIPTION Chip enable: This active HIGH input is used to enable the device. Output Enable: This active LOW asynchronous input enables the data output drivers. Address Advance: This active LOW input is used to control the internal burst counter. A HIGH on this pin generates wait cycle (no address advance). Address Status Processor: This active LOW input, along with CE# being LOW, causes a new external address to be registered and a READ cycle is initiated using the new address . Address Status Controller: This active LOW input causes device to be de-selected or selected along with new external address to be registered. A READ or WRITE cycle is initiated depending upon write control inputs. Mode: This input selects the burst sequence. A LOW on this pin selects LINEAR BURST. A NC or HIGH on this pin selects INTERLEAVED BURST . Snooze: This active HIGH input puts the device in low power consumption standby mode. For normal operation, this input has to be either LOW or NC (No Connect). Data Inputs/Outputs: First Byte is DQ1-DQ8. Second Byte is DQ9-DQ16. Third Byte is DQ17-DQ24. Fourth Byte is DQ25-DQ32. Input data must meet setup and hold times around the rising edge of CLK. Power Supply: +3.3V -5% to +10%. Pin 14 does not have to be connected directly to VCCas long as it is greater than VIH . Ground: GN D Output Buffer Supply: +3.3V -5% to +10%. For 2.5V I/O: 2.375V to VCC. Output Buffer Ground: GND No Connect: These signals are not internally connected. Input InputSynchronous InputSynchronous 85 ADSC# InputSynchronous 31 64 52, 53, 56, 57, 58, 59, 62, 63, 68, 69, 72-75, 78, 79, 2, 3, 6-9, 12, 13, 18, 19, 22-25, 28, 29 15, 41, 65, 9 1 17, 40, 67, 9 0 4, 11, 20, 27, 54, 61, 70, 77 5, 10, 21, 26, 55, 60, 71, 76 1, 14, 16, 30, 38, 39, 42, 43, 50, 51, 66, 80 MODE ZZ DQ1-DQ32 InputStatic InputAsynchro-nous Input/ Outpu t VCC VSS VCCQ VSSQ NC Supply Ground I/O Supply I/O Ground - BURST ADDRESS TABLE (MODE = NC/VCC ) First Address (external) A...A00 A...A01 A...A10 A...A11 Second Address (internal) A...A01 A...A00 A...A11 A...A10 Third Address (internal) A...A10 A...A11 A...A00 A...A01 Fourth Address (internal) A...A11 A...A10 A...A01 A...A00 BURST ADDRESS TABLE (MODE = GND) First Address (external) A...A00 A...A01 A...A10 A...A11 Second Address (internal) A...A01 A...A10 A...A11 A...A00 Third Address (internal) A...A10 A...A11 A...A00 A...A01 Fourth Address (internal) A...A11 A...A00 A...A01 A...A10 PARTIAL TRUTH TABLE FOR READ/WRIT E FUNCTION READ READ WRITE one byte WRITE all bytes WRITE all bytes GW# H H H H L BWE# H L L L X BW1# X H L L X BW2# X H H L X BW3# X H H L X BW4# X H H L X November 20, 1999 4 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, TRUTH TABLE OPERATION ADDRESS USED CE# GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM CE2# CE2 ADSP # ADSC# ADV# WRITE# OE# CLK DQ Deselected Cycle, Power Down Deselected Cycle, Power Down Deselected Cycle, Power Down Deselected Cycle, Power Down Deselected Cycle, Power Down READ Cycle, Begin Burs t READ Cycle, Begin Burs t WRITE Cycle, Begin Burst READ Cycle, Begin Burs t READ Cycle, Begin Burs t READ Cycle, Continue Burst READ Cycle, Continue Burst READ Cycle, Continue Burst READ Cycle, Continue Burst WRITE Cycle, Continue Burst WRITE Cycle, Continue Burst READ Cycle, Suspend Burs t READ Cycle, Suspend Burs t READ Cycle, Suspend Burs t READ Cycle, Suspend Burs t WRITE Cycle, Suspend Burst WRITE Cycle, Suspend Burst None None None None None External External External External External Next Next Next Next Next Next Current Current Current Current Current Current H L L L L L L L L L X X H H X H X X H H X H X X H X H L L L L L X X X X X X X X X X X X X L X L X H H H H H X X X X X X X X X X X X X L L H H L L H H H H H X X H X H H X X H X L X X L L X X L L L H H H H H H H H H H H H X X X X X X X X X X L L L L L L H H H H H H X X X X X X X L H H H H H H L L H H H H L L X X X X X L H X L H L H L H X X L H L H X X L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H High-Z High-Z High-Z High-Z High-Z Q High-Z D Q High-Z Q High-Z Q High-Z D D Q High-Z Q High-Z D D Note: 1. 2. 3. 4. 5. 6. 7. X means “don’t care.” H means logic HIGH. L means logic LOW. WRITE# = L means [BWE# + BW1#*BW2#*BW3#*BW4#]*GW# equals LOW. WRITE# = H means [BWE# + BW1#*BW2#*BW3#*BW4#]*GW# equals HIGH. BW1# enables write to DQ1-DQ8. BW2# enables write to DQ9-DQ16. BW3# enables write to DQ17-DQ24. BW4# enables write to DQ25-DQ32. All inputs except OE# must meet setup and hold times around the rising edge (LOW to HIGH) of CLK. Suspending burst generates wait cycle. For a write operation following a read operation, OE# must be HIGH before the input data required setup time plus High-Z time for OE# and staying HIGH throughout the input data hold time. This device contains circuitry that will ensure the outputs will be in High-Z during power-up. ADSP# LOW along with chip being selected always initiates an READ cycle at the L-H edge of CLK. A WRITE cycle can be performed by setting WRITE# LOW for the CLK L-H edge of the subsequent wait cycle. Refer to WRITE timing diagram for clarification. November 20, 1999 5 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, A BSOLUTE MAXIMUM RATINGS* GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM *Stresses greater than those listed uunder “Absolute Maximum Ratings” may cause permanent damage to the device.This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Voltage on VCC Supply Relative to VSS........-0.5V to +4.6V VIN ...........................................................-0.5V to VCC+0.5V Storage Temperature (plastic) .........................-55o C to +150 o Junction Temperature .....................................................+150 o Power Dissipation ...........................................................1.0W Short Circuit Output Current .........................................50mA DC ELECTRICAL CHARACTERISTICS AND RECOMMENDED OPERATING CONDITIONS (All Temperature Ranges; VCC = 3.3V -5 to +10% unless otherwise noted) CONDITIONS Data Inputs (DQxx) All Other Inputs DESCRIPTION Input High (Logic 1) Voltage Input Low (Logic 0) Voltage Input Leakage Current Output Leakage Current Output High Voltage Output Low Voltage Supply Voltage I/O Supply Voltage (3.3V I/O) I/O Supply Voltage (2.5V I/O) SYMBOL V I HD V IH V Il IL I IL O V OH V OL VCC VCCQ VCCQ MIN 2.0 2.0 -0.3 -2 -2 2.4 MAX VCCQ+0.3 4.6 0.8 2 2 UNITS V V V uA uA V NOTES 1,2 1,2 1, 2 14 0V < V IN < V CC Output(s) disabled, 0V < V OUT < V CC IOH = - 4.0mA IOL = 8 .0mA 1, 11 1, 11 1 1 1 0.4 3.1 3.1 2.375 3.6 3.6 VCC V V V V DESCRIPTION Power Supply Current: Operating CMOS Standby CONDITIONS Device selected; all inputs < V IL or > V IH ;cycle time > tKC MIN; VCC =MAX; outputs open Device deselected; VCC = MAX; all inputs < V SS +0.2 or >VCC -0.2; all inputs static; CLK frequency = 0 Device deselected; all inputs < V IL o r > V IH; all inputs static; VCC = MAX; CLK frequency = 0 Device deselected; all inputs < V IL o r > V IH ; VCC = MAX; CLK cycle time > t KC MIN SYM Icc TYP 80 -4 225 -5 225 -6 185 -7 120 UNITS NOTES mA 3, 12, 13 12,13 ISB2 0.2 2 2 2 2 mA TTL Standby ISB3 8 18 18 18 18 mA 12,13 Clock Runnin g ISB4 12 30 30 25 20 mA 12,13 CAPACITANCE DESCRIPTION Input Capacitance Input/Output Capacitance (DQ) CONDITIONS TA = 2 5 o C; f = 1 MHz VCC = 3.3V SYMBOL CI CO TYP 3 6 MAX 4 7 UNITS pF pF NOTES 4 4 THERMAL CONSIDERATIO N DESCRIPTION Thermal Resistance - Junction to Ambient Thermal Resistance - Junction to Case CONDITIONS Still air, soldered on 4.25 x 1.125 inch 4-layer PCB SYMBOL TQFP TYP ΘJ A Θ JC 20 1 UNITS o C/W o C/W NOTES November 20, 1999 6 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, AC ELECTRICAL CHARACTERISTICS GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM (Note 5) (All Temperature Ranges; VCC = 3.3V -5 to +10% ) DESCRIPTION Cloc k Clock cycle tim e Clock HIGH time Clock LOW tim e Output Times Clock to output valid Clock to output invalid Clock to output in Low-Z Clock to output in High-Z OE to output valid OE to output in Low-Z OE to output in High-Z Setup Times Address, Controls and Data In Hold Times Address, Controls and Data In tH tS t KQ tKQ X t KQLZ t KQH Z t OEQ t OELZ t OEHZ tKC tKH tKL -4 SY M MIN MAX MIN -5 MAX MIN -6 MAX MIN -7 MAX UNIT S NOTES 10 4 4 4.8 2 3 5 5 0 4 2.0 0.5 10 4 4 5 2 3 5 5 0 4 2.5 0.5 12 4 4 6 2 3 5 6 0 5 2.5 0.5 15 5 5 7 2 3 6 7 0 6 2.5 0.5 ns ns ns ns ns ns ns ns ns ns ns ns 6,7 6,7 9 6,7 6,7 10 10 CAPACITANCE DERATING DESCRIPTION Clock to output valid SYMBOL ∆ tKQ TYP 0.016 MAX UNITS ns / pF NOTES 15 November 20, 1999 7 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, AC TEST CONDITIONS FOR 3.3V I/O Input pulse levels Input rise and fall times Input timing reference levels Output reference levels Output load GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM OUTPUT LOADS FOR 3.3V I/O 0V to 3.0V 1.5ns 1.5V 1.5V See Figures 1 and 2 DQ Z0 = 50 Ω 50Ω Vt = 1.5V Fig. 1 OUTPUT LOAD EQUIVALENT 3.3v 317 Ω DQ 351 Ω 30 pF AC TEST CONDITIONS FOR 2.5V I/O Input pulse levels Input slew rate Output rise and fall times(max) Input timing reference levels Output reference levels Output load 0V to 2.5V 1.0V/ns 1.8ns 1.25V 1.25V See Figures 3 5 pF Fig. 2 OUTPUT LOAD EQUIVALENT OUTPUT LOADS FOR 2.5V I/O DQ Z0 = 50Ω 50 Ω Vt = 1.25V Fig. 3 OUTPUT LOAD EQUIVALENT NOTES 1. 2. 3. 4. 5. 6. 7. 8. All voltages referenced to VSS (GND). Overshoot: Undershoot: VIH ≤ +6.0V for t ≤ t KC /2. VIL ≤ -2.0V for t ≤ t KC /2 10. This is a synchronous device. All synchronous inputs must meet specified setup and hold time, except for “don’t care” as defined in the truth table. 11. AC I/O curves are available upon request. 12. “Device Deselected” means the device is in POWER -DOWN mode as defined in the truth table. “Device Selected” means the device is active. 13. Typical values are measured at 3.3V, 25oC and 20ns cycle time. 14. MODE pin has an internal pull-up and ZZ pin has an internal pull-down. These two pins exhibit an input leakage current of +30 µA. 15. Capacitance derating applies to capacitance different from the load capacitance shown in Fig. 1 or Fig. 3, for 3.3V or 2.5V I/O respectively Ic c is given with no output current. Ic c increases with greater output loading and faster cycle times. This parameter is sampled. Test conditions as specified with the output loading as shown in Fig. 1 unless otherwise noted. Output loading is specified with CL=5pF as in Fig. 2. At any given temperature and voltage condition, t KQHZ is less than t KQLZ and t OEHZ is less than t OELZ. A READ cycle is defined by byte write enables all HIGH or ADSP# LOW along with chip enables being active for the required setup and hold times. A WRITE cycle is defined by at one byte or all byte WRITE per READ/WRITE TRUTH TABLE. OE# is a “don’t care” when a byte write enable is sampled LOW. 9. November 20, 1999 8 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM READ TIMING t KC t KL CLK t S t KH ADSP# tH ADSC# tS ADDRESS BW1#, BW2#, BW3#, BW4#, BWE#, GW# CE# (See Note) A1 tH A2 t S ADV# t H OE# t tKQLZ KQ tOELZ tOEQ tKQ DQ Q(A1) Q(A2) Q(A2+1) Q(A2+2) Q(A2+3) Q(A2) Q(A2+1) SINGLE READ BURST READ Note: CE# active in this timing diagram means that all chip enables CE#, CE2, and CE2# are active. November 20, 1999 9 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM WRITE TIMING CLK t S ADSP# t H ADSC# t S ADDRESS BW1#, BW2#, BW3#, BW4#, BWE# GW# CE# (See Note) A1 tH A2 A3 t S ADV# t H OE# t tKQX OEHZ DQ Q D(A1) D(A2) D(A2+1) D(A2+1) D(A2+2) D(A2+3) D(A3) D(A3+1) D(A3+2) SINGLE WRITE BURST WRITE BURST WRITE Note: CE# active in this timing diagram means that all chip enables CE#, CE2, and CE2# are active. November 20, 1999 10 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM READ/WRITE TIMING CLK t S ADSP# t H ADSC# t S ADDRESS BW1#, BW2#, BW3#, BW4#, BWE#, GW# CE# (See Note) ADV# A1 A2 t A3 H A4 A5 OE# DQ Q(A1) Single Reads Q(A2) D(A3) Single Write Q(A3) Pass Through Q(A4) Q(A4+1) Burst Read Q(A4+2) D(A5) D(A5+1) Burst Write Note: CE# active in this timing diagram means that all chip enables CE#, CE2, and CE2# are active. November 20, 1999 11 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, 100 Pin TQFP Package Dimensions GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM 16.00 + 0.10 14.00 + 0.10 #1 20.00 + 0.10 22.00 + 0.10 1.40 + 0.05 1.60 Max Note: All dimensions in Millimeters November 20, 1999 0.65 Basic 0.30 + 0.08 0.60 + 0.15 12 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9 GALVANTECH, Ordering Information GVT71128D32 128K X 32 SYNCHRONOUS BURST SRAM GVT 71128D32 X - X X Galvantech Prefix Part Number Speed (4 = 4.8ns access/10ns cycle 5 = 5ns access/10ns cycle 6 = 6ns access/12ns cycle 7 = 7ns access/15ns cycle) Package (T = 100 PIN TQFP) Temperature (Blank = Commercial I = Industrial) November 20, 1999 13 Galvantech, Inc. reserves the right to change products or specifications without notice. Rev. 11/9 9
GVT71128D32T-7I 价格&库存

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