PD-90433D
IRFF430
JANTX2N6802
JANTXV2N6802
REPETITIVE AVALANCHE AND dv/dt RATED
®
HEXFET TRANSISTORS
THRU-HOLE - TO-205AF (TO-39)
REF:MIL-PRF-19500/557
500V, N-CHANNEL
Product Summary
Part Number
IRFF430
BVDSS
RDS(on)
500V
1.5Ω
ID
2.5A
®
The HEXFET technology is the key to International
Rectifier’s advanced line of power MOSFET transistors.
The efficient geometry and unique processing of this
latest “State of the Art” design achieves: very low onstate resistance combined with high transconductance.
The HEXFET transistors also feature all of the well
established advantages of MOSFETs such as voltage
control, very fast switching, ease of parelleling and
temperature stability of the electrical parameters.
They are well suited for applications such as switching
power supplies, motor controls, inverters, choppers,
audio amplifiers and high energy pulse circuits.
TO-39
Features:
Repetitive Avalanche Ratings
Dynamic dv/dt Rating
Hermetically Sealed
Simple Drive Requirements
Ease of Paralleling
n ESD Rating: Class 1C per MIL-STD-750,
Method 1020
n
n
n
n
n
Absolute Maximum Ratings
Parameter
ID @ VGS = 10V, TC = 25°C
ID @ VGS = 10V, TC = 100°C
IDM
PD @ TC = 25°C
VGS
EAS
IAR
EAR
dv/dt
TJ
T STG
Continuous Drain Current
Continuous Drain Current
Pulsed Drain Current À
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy Á
Avalanche Current À
Repetitive Avalanche Energy À
Peak Diode Recovery dv/dt Â
Operating Junction
Storage Temperature Range
Lead Temperature
Weight
Units
2.5
1.5
10
25
0.20
±20
184
2.5
2.5
3.5
-55 to 150
A
W
W/°C
V
mJ
A
mJ
V/ns
°C
300 (0.063 in. (1.6mm) from case for 10s)
0.98 (typical)
g
For footnotes refer to the last page
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1
01/27/15
IRFF430, JANTX2N6802
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
BVDSS
∆BVDSS/∆TJ
RDS(on)
VGS(th)
g fs
IDSS
IGSS
IGSS
Qg
Qgs
Qgd
td(on)
tr
td(off)
tf
LS + LD
Parameter
Min
Drain-to-Source Breakdown Voltage
500
—
—
V
—
0.43
—
V/°C
—
—
2.0
1.5
—
—
—
—
—
—
—
—
1.5
1.725
4.0
—
25
250
—
—
19.8
2.2
5.5
—
—
—
—
—
—
—
—
—
—
—
—
—
—
7.0
100
-100
29.5
4.6
19.7
30
30
55
30
—
Temperature Coefficient of Breakdown
Voltage
Static Drain-to-Source On-State
Resistance
Gate Threshold Voltage
Forward Transconductance
Zero Gate Voltage Drain Current
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain (‘Miller’) Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Inductance
Typ Max Units
Ω
V
S
µA
nA
nC
Test Conditions
VGS = 0V, ID = 1.0mA
Reference to 25°C, ID = 1.0mA
VGS = 10V, ID =1.5A Ã
VGS =10V, ID = 2.5A Ã
VDS = VGS, ID = 250µA
V DS = 15V, IDS = 1.5A Ã
VDS = 400V, VGS = 0V
VDS = 400V
VGS = 0V, TJ = 125°C
VGS = 20V
V GS = -20V
VGS =10V, ID =2.5A
VDS= 250V
VDD = 250V, ID = 2.5A,
VGS =10V, RG = 7.5Ω
ns
nH
Measured from drain lead (6mm/0.25in. from
package) to source lead (6mm/0.25in. from
package)
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
—
—
—
610
135
65
—
—
pF
VGS = 0V, VDS = 25V
f = 1.0MHz
Source-Drain Diode Ratings and Characteristics
Parameter
Min Typ Max Units
IS
ISM
VSD
trr
Q RR
Continuous Source Current (Body Diode)
Pulse Source Current (Body Diode) À
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
ton
Forward Turn-On Time
—
—
—
—
—
—
—
—
—
—
2.5
10
1.4
900
7.0
Test Conditions
A
V
ns
µC
Tj = 25°C, IS = 2.5A, VGS = 0V Ã
Tj = 25°C, IF = 2.5A, di/dt ≤ 100A/µs
VDD ≤ 50V Ã
Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
Thermal Resistance
Parameter
RthJC
RthJA
Junction-to-Case
Junction-to-Ambient
Min Typ Max
—
—
—
—
5.0
175
Units
°C/W
Test Conditions
Typical socket mount.
Note: Corresponding Spice and Saber models are available on International Rectifier website.
For footnotes refer to the last page
2
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IRFF430, JANTX2N6802
Fig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
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Fig 2. Typical Output Characteristics
Fig 4. Normalized On-Resistance
Vs.Temperature
3
IRFF430, JANTX2N6802
13 a& b
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
ID, Drain-to-Source Current (A)
100
OPERATION IN THIS AREA LIMITED
BY RDS(on)
10
100µs
1
1ms
10ms
0.1
Tc = 25°C
Tj = 150°C
Single Pulse
0.01
1
DC
10
100
1000
VDS , Drain-to-Source Voltage (V)
Fig 7. Typical Source-Drain Diode
Forward Voltage
4
Fig 8. Maximum Safe Operating Area
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IRFF430, JANTX2N6802
RD
V DS
V GS
RG
D.U.T.
+
-V DD
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
VDS
90%
Fig 9. Maximum Drain Current Vs.
CaseTemperature
10%
VGS
td(on)
tr
t d(off)
tf
Fig 10b. Switching Time Waveforms
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRFF430, JANTX2N6802
L
VDS
D.U.T
RG
10V
20V
IAS
DRIVER
+
- VDD
0.01Ω
tp
Fig 12a. Unclamped Inductive Test Circuit
V(BR)DSS
A
EAS , Single Pulse Avalanche Energy (mJ)
400
15V
TOP
300
BOTTOM
ID
1.1A
1.6A
2.5A
200
100
0
25
tp
50
75
100
125
150
Starting T J , Junction Temperature (°C)
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
I AS
Current Regulator
Same Type as D.U.T.
Fig 12b. Unclamped Inductive Waveforms
50KΩ
QG
10 V
QGS
.2µF
.3µF
D.U.T.
QGD
+
V
- DS
VGS
VG
3mA
Charge
Fig 13a. Basic Gate Charge Waveform
6
12V
IG
ID
Current Sampling Resistors
Fig 13b. Gate Charge Test Circuit
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IRFF430, JANTX2N6802
Footnotes:
À Repetitive Rating; Pulse width limited by
maximum junction temperature.
Á VDD = 50V, Starting TJ = 25°C, L = 59mH
Peak IAS = 2.5A, VGS =10V, RG= 25Ω
 ISD ≤ 2.5A, di/dt ≤ 75A/µs, VDD ≤ 500V,
TJ ≤ 150°C, Suggested RG =7.5 Ω
à Pulse width ≤ 300 µs; Duty Cycle ≤ 2%
Case Outline and Dimensions —TO-205AF (TO-39)
LEGEND
1- SOURCE
2- GATE
3- DRAIN
IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA Tel: (310) 252-7105
IR LEOMINSTER : 205 Crawford St., Leominster, Massachusetts 01453, USA Tel: (978) 534-5776
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
Data and specifications subject to change without notice. 01/2015
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