IPB107N20NAATMA1

IPB107N20NA OptiMOSTM3 Power-Transistor IPP110N20NA Product Summary Features • N-channel, normal level • Excellent gate charge x R DS(on) product (FOM) VDS 200 V RDS(on),max (TO263) 10.7 mW ID 88 A • Very low on-resistance R DS(on) • 175 °C operating temperature • Pb-free lead plating; RoHS compliant • Qualified according to AEC Q101 • Halogen-free according to IEC61249-2-21 • Ideal for high-frequency switching and synchronous rectification Type IPB107N20NA IPP110N20NA Package PG-TO263-3 PG-TO220-3 Marking 107N20NA 110N20NA Maximum ratings, at T j=25 °C, unless otherwise specified Parameter Symbol Conditions Continuous drain current ID Value T C=25 °C 88 T C=100 °C 63 Unit A Pulsed drain current1) I D,pulse T C=25 °C 352 Avalanche energy, single pulse E AS I D=80 A, R GS=25 W 560 mJ Reverse diode dv /dt dv /dt 10 kV/µs Gate source voltage V GS ±20 V Power dissipation P tot 300 W Operating and storage temperature T j, T stg -55 ... 175 °C T C=25 °C IEC climatic category; DIN IEC 68-1 1) 55/175/56 See figure 3 Rev. 2.1 page 1 2011-05-11 IPB107N20NA Parameter IPP110N20NA Values Symbol Conditions Unit min. typ. max. - - 0.5 minimal footprint - - 62 6 cm2 cooling area2) - - 40 200 - - Thermal characteristics Thermal resistance, junction - case R thJC Thermal resistance, junction ambient R thJA K/W Electrical characteristics, at T j=25 °C, unless otherwise specified Static characteristics Drain-source breakdown voltage V (BR)DSS V GS=0 V, I D=1 mA Gate threshold voltage V GS(th) V DS=V GS, I D=270 µA 2 3 4 Zero gate voltage drain current I DSS V DS=160 V, V GS=0 V, T j=25 °C - 0.1 1 V DS=160 V, V GS=0 V, T j=125 °C - 10 100 V µA Gate-source leakage current I GSS V GS=20 V, V DS=0 V - 1 100 nA Drain-source on-state resistance R DS(on) V GS=10 V, I D=88 A, (TO220) - 9.9 11 mW V GS=10 V, I D=88 A, (TO263) - 9.6 10.7 2) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm 2 (one layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. Rev. 2.1 page 2 2011-05-11 IPB107N20NA Parameter IPP110N20NA Values Symbol Conditions Unit min. typ. max. - 5340 7100 - 401 533 Dynamic characteristic4) Input capacitance C iss Output capacitance C oss Reverse transfer capacitance C rss - 5 - Turn-on delay time t d(on) - 18 - Rise time tr - 26 - Turn-off delay time t d(off) - 41 - Fall time tf - 11 - Gate to source charge Q gs - 23 - Gate to drain charge Q gd - 8 - - 15 - V GS=0 V, V DS=100 V, f =1 MHz V DD=100 V, V GS=10 V, I D=44 A, R G=1.6 W pF ns Gate Charge Characteristics3) V DD=100 V, I D=44 A, V GS=0 to 10 V nC Switching charge Q sw Gate charge total Qg - 65 87 Gate plateau voltage V plateau - 4.4 - Output charge Q oss - 162 216 nC - - 88 A - - 352 - 1 1.2 - 142 - 640 V DD=100 V, V GS=0 V V Reverse Diode4) Diode continous forward current IS Diode pulse current I S,pulse Diode forward voltage V SD Reverse recovery time t rr Reverse recovery charge Q rr 3) 4) T C=25 °C V GS=0 V, I F=88 A, T j=25 °C V R=100 V, I F=44 A, di F/dt =100 A/µs V ns - nC See figure 16 for gate charge parameter definition Not subjected to production test - verified by design/characterization Rev. 2.1 page 3 2011-05-11 IPB107N20NA 1 Power dissipation 2 Drain current P tot=f(T C) I D=f(T C); V GS≥10 V 320 IPP110N20NA 100 280 80 240 60 ID [A] Ptot [W] 200 160 40 120 80 20 40 0 0 0 50 100 150 200 0 50 100 TC [°C] 150 200 TC [°C] 3 Safe operating area 4 Max. transient thermal impedance I D=f(V DS); T C=25 °C; D =0 Z thJC=f(t p) parameter: t p parameter: D =t p/T 103 100 1 µs 10 µs 100 µs 102 ZthJC [K/W] 0.5 ID [A] 1 ms 101 10 ms 10-1 0.2 0.1 DC 0.05 100 0.02 0.01 single pulse 10-2 10-1 10-1 100 101 102 103 10-4 10-3 10-2 10-1 100 tp [s] VDS [V] Rev. 2.1 10-5 page 4 2011-05-11 IPB107N20NA IPP110N20NA 5 Typ. output characteristics 6 Typ. drain-source on resistance I D=f(V DS); T j=25 °C R DS(on)=f(I D); T j=25 °C parameter: V GS parameter: V GS 200 20 10 V 175 4.5 V 7V 150 15 5V 5V RDS(on) [mW] ID [A] 125 100 75 4.5 V 50 7V 10 10 V 5 25 0 0 0 1 2 3 4 5 0 20 40 60 VDS [V] 80 100 120 140 ID [A] 7 Typ. transfer characteristics 8 Typ. forward transconductance I D=f(V GS); |V DS|>2|I D|R DS(on)max g fs=f(I D); T j=25 °C parameter: T j 200 180 180 160 160 140 140 120 gfs [S] ID [A] 120 100 100 80 80 60 60 40 40 175 °C 25 °C 20 20 0 0 0 2 4 6 8 VGS [V] Rev. 2.1 0 25 50 75 100 125 150 ID [A] page 5 2011-05-11 IPB107N20NA 9 Drain-source on-state resistance 10 Typ. gate threshold voltage R DS(on)=f(T j); I D=88 A; V GS=10 V V GS(th)=f(T j); V GS=V DS IPP110N20NA parameter: I D 35 4 3.5 30 2700 µA 3 270 µA 2.5 VGS(th) [V] RDS(on) [mW] 25 20 15 typ 2 1.5 10 1 5 0.5 0 0 -60 -20 20 60 100 140 -60 180 -20 20 60 100 140 180 Tj [°C] Tj [°C] 11 Typ. capacitances 12 Forward characteristics of reverse diode C =f(V DS); V GS=0 V; f =1 MHz I F=f(V SD) parameter: T j 104 103 Ciss Coss 103 175 °C IF [A] C [pF] 102 102 25 °C Crss 101 101 100 0 40 80 120 160 0.5 1 1.5 2 VSD [V] VDS [V] Rev. 2.1 0 page 6 2011-05-11 IPB107N20NA 13 Avalanche characteristics 14 Typ. gate charge I AS=f(t AV); R GS=25 W V GS=f(Q gate); I D=44 A pulsed parameter: T j(start) parameter: V DD 100 IPP110N20NA 10 25 °C 8 160 V 100 °C 100 V 125 °C 40 V VGS [V] IAS [A] 6 10 4 2 0 1 1 10 100 0 1000 20 40 60 80 Qgate [nC] tAV [µs] 15 Drain-source breakdown voltage 16 Gate charge waveforms V BR(DSS)=f(T j); I D=1 mA 230 V GS Qg VBR(DSS) [V] 220 210 200 V gs(th) 190 Q g(th) 180 Q sw Q gs -60 -20 20 60 100 140 Q gate Q gd 180 Tj [°C] Rev. 2.1 page 7 2011-05-11 IPB107N20NA IPP110N20NA PG-TO220-3: Outline Rev. 2.1 page 8 2011-05-11 IPB107N20NA IPP110N20NA PG-TO263-3: Outline Rev. 2.1 page 9 2011-05-11 IPB107N20NA IPP110N20NA Published by Infineon Technologies AG 81726 Munich, Germany © 2011 Infineon Technologies AG All Rights Reserved. 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Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 2.1 page 10 2011-05-11