74LVQ373SCX

74LVQ373 Low Voltage Octal Transparent Latch with 3-STATE Outputs February 1992 Revised June 2001 74LVQ373 Low Voltage Octal Transparent Latch with 3-STATE Outputs General Description The LVQ373 consists of eight latches with 3-STATE outputs for bus organized system applications. The latches appear transparent to the data when Latch Enable (LE) is HIGH. When LE is low, the data satisfying the input timing requirements is latched. Data appears on the bus when the Output Enable (OE) is LOW. When OE is HIGH, the bus output is in the high impedance state. Features s Ideal for low power/low noise 3.3V applications s Implements patented EMI reduction circuitry s Available in SOIC JEDEC, SOIC EIAJ and QSOP packages s Guaranteed simultaneous switching noise level and dynamic threshold performance s Improved latch-up immunity s Guaranteed incident wave switching into 75Ω s 4 kV minimum ESD immunity Ordering Code: Order Number 74LVQ373SC 74LVQ373SJ 74LVQ373QSC Package Number M20B M20D MQA20 Package Description 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150" Wide Devices also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code. Logic Symbols Connection Diagram IEEE/IEC Truth Table Inputs Outputs Dn X L H X On Z L H O0 Pin Descriptions Pin Names D0–D7 LE OE O0–O7 Description Data Inputs Latch Enable Input Output Enable Input 3-STATE Latch Outputs LE X H H L OE H L L L H = HIGH Voltage Level L = LOW Voltage Level Z = High Impedance X = Immaterial O0 = Previous O0 before HIGH to Low transition of Latch Enable © 2001 Fairchild Semiconductor Corporation DS011359 www.fairchildsemi.com 74LVQ373 Functional Description The LVQ373 contains eight D-type latches with 3-STATE standard outputs. When the Latch Enable (LE) input is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D-type input changes. When LE is LOW, the latches store the information that was present on the D-type inputs a setup time preceding the HIGH-to-LOW transition of LE. The 3-STATE standard outputs are controlled by the Output Enable (OE) input. When OE is LOW, the standard outputs are in the 2-state mode. When OE is HIGH, the standard outputs are in the high impedance mode but this does not interfere with entering new data into the latches. Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 74LVQ373 Absolute Maximum Ratings(Note 1) Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = −0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current (ICC or IGND) Storage Temperature (TSTG) DC Latch-Up Source or Sink Current −0.5V to +7.0V −20 mA +20 mA −0.5V to VCC + 0.5V −20 mA +20 mA −0.5V to VCC + 0.5V ±50 mA ±400 mA −65°C to +150°C ±300 mA Recommended Operating Conditions (Note 2) Supply Voltage (VCC) Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate (∆V/∆t) VIN from 0.8V to 2.0V VCC @ 3.0V 125 mV/ns 2.0V to 3.6V 0V to VCC 0V to VCC −40°C to +85°C Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The “Recommended Operating Conditions” table will define the conditions for actual device operation. Note 2: Unused inputs must be held HIGH or LOW. They may not float. DC Electrical Characteristics Symbol VIH VIL VOH Parameter Minimum High Level Input Voltage Maximum Low Level Input Voltage Minimum High Level Output Voltage VOL Maximum Low Level Output Voltage IIN IOLD IOHD ICC IOZ Maximum Input Leakage Current Minimum Dynamic Output Current (Note 4) Maximum Quiescent Supply Current Maximum 3-STATE Leakage Current VOLP VOLV VIHD VILD Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Maximum High Level Dynamic Input Voltage Maximum Low Level Dynamic Input Voltage 3.6 ±0.25 ±2.5 µA VCC (V) 3.0 3.0 3.0 3.0 3.0 3.0 3.6 3.6 3.6 3.6 4.0 0.002 TA = +25°C Typ 1.5 1.5 2.99 2.0 0.8 2.9 2.58 0.1 0.36 ±0.1 TA = −40°C to +85°C Guaranteed Limits 2.0 0.8 2.9 2.48 0.1 0.44 ±1.0 36 −25 40.0 V V V V V V µA mA mA µA VOUT = 0.1V or VCC − 0.1V VOUT = 0.1V or VCC − 0.1V IOUT = −50 µA VIN = VIL or VIH (Note 3) IOH = −12 mA IOUT = 50 µA VIN = VIL or VIH (Note 3) IOL = 12 mA VI = VCC, GND VOLD = 0.8V Max (Note 5) VOHD = 2.0V Min (Note 5) VIN = VCC or GND VI (OE) = VIL, VIH VI = VCC, GND VO = VCC, GND 3.3 3.3 3.3 3.3 0.4 −0.3 1.7 1.6 0.8 −0.8 2.0 0.8 V V V V (Note 6)(Note 7) (Note 6)(Note 7) (Note 6)(Note 8) (Note 6)(Note 8) Units Conditions Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: M aximum test duration 2.0 ms, one output loaded at a time. Note 5: Incident wave switching on transmission lines with impedances as low as 75Ω for commercial temperature range is guaranteed. Note 6: Worst case package. Note 7: M ax number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND. Note 8: Max number of Data Inputs (n) switching. (n − 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. 3 www.fairchildsemi.com 74LVQ373 AC Electrical Characteristics TA = +25°C Symbol Parameter VCC (V) tPHL tPLH tPLH tPHL tPZL tPZH tPHZ tPLZ tOSHL tOSLH Output to Output Skew (Note 9) Output Disable Time Propagation Delay Dn to On Propagation Delay LE to On Output Enable Time 2.7 3.3 ± 0.3 2.7 3.3 ± 0.3 2.7 3.3 ± 0.3 2.7 3.3 ± 0.3 2.7 3.3 ± 0.3 Min 2.5 2.5 2.5 2.5 2.5 2.5 1.0 1.0 CL = 50 pF Typ 9.6 8.0 9.6 8.0 10.2 8.5 10.8 9.0 1.0 1.0 Max 14.8 10.5 16.9 12.0 18.3 13.0 20.4 14.5 1.5 1.5 TA = −40°C to +85°C CL = 50 pF Min 2.5 2.5 2.5 2.5 2.5 2.5 1.0 1.0 Max 16.0 11.0 18.0 12.5 19.0 13.5 21.0 15.0 1.5 1.5 ns ns ns ns ns Units Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. AC Operating Requirements TA = +25°C Symbol Parameter VCC (V) tS tH tW Setup Time, HIGH or LOW Hold Time, HIGH or LOW LE Pulse Width, HIGH 2.7 3.3 ± 0.3 2.7 3.3 ± 0.3 2.7 3.3 ± 0.3 Typ 0 0 0 0 2.4 2.0 CL = 50 pF 4.0 3.0 1.5 1.5 5.0 4.0 TA = −40°C to +85°C CL = 50 pF Guaranteed Minimum 4.5 3.0 1.5 1.5 6.0 4.0 ns ns ns Units Capacitance Symbol CIN CPD (Note 10) Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 39 Units pF pF VCC = Open VCC = 3.3V Conditions Note 10: CPD is measured at 10 MHz. www.fairchildsemi.com 4 74LVQ373 Physical Dimensions inches (millimeters) unless otherwise noted 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Package Number M20B 5 www.fairchildsemi.com 74LVQ373 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M20D www.fairchildsemi.com 6 74LVQ373 Low Voltage Octal Transparent Latch with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150" Wide Package Number MQA20 Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 7 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com www.fairchildsemi.com