74F20SCX

Revised July 1999 74F20 Dual 4-Input NAND Gate General Description This device contains two independent gates, each of which performs the logic NAND function. Ordering Code: Order Number Package Number Package Description 74F20SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74F20SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F20PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbol Connection Diagram IEEE/IEC Unit Loading/Fan Out Pin Names U.L. Input IIH/I IL Description HIGH/LOW Output I OH/IOL An, Bn, Cn, Dn Inputs 1.0/1.0 20 µA/−0.6 mA On Outputs 50/33.3 −1 mA/20 mA © 1999 Fairchild Semiconductor Corporation DS009462 www.fairchildsemi.com 74F20 Dual 4-Input NAND Gate April 1988 74F20 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Free Air Ambient Temperature Junction Temperature under Bias −55°C to +150°C Supply Voltage 0°C to +70°C +4.5V to +5.5V −0.5V to +7.0V VCC Pin Potential to Ground Pin Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Current Applied to Output in LOW State (Max) twice the rated IOL (mA) DC Electrical Characteristics Symbol Parameter Min Typ Max VCC Units Input HIGH Voltage VIL Input LOW Voltage 0.8 V VCD Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA V Min IOH = −1 mA VOH Output HIGH Voltage VOL Output LOW 2.0 10% VCC 2.5 5% VCC 2.7 V Conditions VIH Input HIGH Current IBVI Input HIGH Current Breakdown Test ICEX Output HIGH Leakage Current VID Input Leakage IOD Output Leakage Circuit Current IIL Input LOW Current IOS Output Short-Circuit Current ICCH Power Supply Current ICCL Power Supply Current 0.5 V Min IOL = 20 mA 5.0 µA Max VIN = 2.7V 7.0 µA Max VIN = 7.0V 50 µA Max VOUT = VCC V 0.0 3.75 µA 0.0 4.75 Test Recognized as a LOW Signal IOH = −1 mA 10% VCC Voltage IIH Recognized as a HIGH Signal IID = 1.9 µA All other pins grounded VIOD = 150 mV All other pins grounded −0.6 mA Max −150 mA Max VOUT = 0V 0.9 1.4 mA Max VO = HIGH 3.4 5.1 mA Max VO = LOW −60 VIN = 0.5V AC Electrical Characteristics Symbol Parameter TA = +25°C TA = −55° to +125°C TA = 0°C to +70°C VCC = +5.0V VCC = +5.0V VCC = +5.0V CL = 50 pF CL = 50 pF CL = 50 pF Min Typ Max Min Max Min tPLH Propagation Delay 2.4 3.7 5.0 2.0 7.0 2.4 6.0 tPHL An, Bn, Cn, Dn to On 1.5 3.2 4.3 1.5 6.5 1.5 5.3 www.fairchildsemi.com 2 Units Max ns 74F20 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D 3 www.fairchildsemi.com 74F20 Dual 4-Input NAND Gate Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com 4