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FAN73912MX

FAN73912MX

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOIC-16_10.3X7.5MM

  • 描述:

    IC GATE DRVR HALF-BRIDGE 16SOIC

  • 数据手册
  • 价格&库存
FAN73912MX 数据手册
High-Current, Half-Bridge, Gate-Driver IC FAN73912 Description The FAN73912 is a monolithic half bridge gate−drive IC designed for high−voltage and high−speed driving for MOSFETs and IGBTs that operate up to +1200 V. The advanced input filter of HIN provides protection against short−pulsed input signals caused by noise. An advanced level−shift circuit offers high−side gate driver operation up to VS = −9.8 V (typical) for VBS = 15 V. The UVLO circuit prevents malfunction when VCC and VBS are lower than the specified threshold voltage. Output drivers typically source and sink 2 A and 3 A, respectively. www.onsemi.com SOIC−16W CASE 751BH Features • Floating Channel for Bootstrap Operation to +1200 V • Typically 2 A/ 3 A Sourcing/Sinking Current Driving Capability for • • • • • • • • • • • • Both Channels Gate Driver Supply (VCC) Range from 12 V to 20 V Separate Logic Supply (VDD) Range from 3 V to 20 V Extended Allowable Negative VS Swing to −9.8 V for Signal Propagation at VCC = VBS = 15 V Built−in Cycle−by−Cycle Edge−Triggered Shutdown Logic Built−in Shoot−Through Protection Logic Common−Mode dv/dt Noise Canceling Circuit UVLO Functions for Both Channels Built−in Advanced Input Filter Matched Propagation Delay Below 50 ns Outputs in−Phase with Input Signal Logic and Power Ground +/− 10 V Offset This Device is Pb−Free and Halogen Free February, 2021 − Rev. 2 $Y &Z &2 &K FAN73912MX = ON Semiconductor Logo = Assembly Plant Code = 2−Digit Date Code = Lot Code = Specific Device Code ORDERING INFORMATION FAN73912MX (Note 1) Electrical Contactor UPS Solar Inverter Ballast General−Purpose Half−Bridge Topology © Semiconductor Components Industries, LLC, 2016 $Y&Z&2&K FAN73912 MX Device Typical Application • • • • • MARKING DIAGRAM Package Shipping† Wide−16 SOIC 1,000/ Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. 1. This device passed wave−soldering test by JESD22A−111 1 Publication Order Number: FAN73912/D FAN73912 Up to 1200 V Q1 Typically 3.3~15 V Controller R1 9 NC HO 8 10 NC VB 7 11 VDD VS 6 HIN 12 HIN NC 5 DBOOT SD 13 SD NC 4 RBOOT LIN 14 LIN VCC 3 15 VSS COM 2 CBOOT Load 15 V C1 Q2 R2 16 NC 1 LO Figure 1. Application Schematic − Adjustable Option 7 VB UVLO LIN 14 VSS 15 VSS/COM LEVEL SHIFT R R S Q 8 HO 6 VS 3 VCC UVLO CYCLE−By − CYCLE EDGE TRIGGERED SHUTDOWN DELAY LS(ON/OFF) DRIVER SD 13 SCHMITT TRIGGER INPUT SHOOTTHROUGH PREVENTION NOISE CANCELLER DRIVER HIN 12 PULSE GENERATOR HS(ON/OFF) VDD 11 1 LO 2 COM Pin 4,5,9,10 and 16 are no connection Figure 2. Simplified Block Diagram www.onsemi.com 2 FAN73912 LO 1 16 NC COM 2 15 VSS FAN73912A VCC 3 14 LIN NC 4 13 SD NC 5 12 HIN VS 6 11 V DD VB 7 10 NC HO 8 9 NC Figure 3. Pin Connections − Wide 16−SOIC (Top View) Table 1. PIN FUNCTION DESCRIPTION ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Pin No. Symbol Description 1 LO Low−Side Driver Output 2 COM Low−Side Driver Return 3 VCC Low−Side Supply Voltage 4 NC No Connection 5 NC No Connection 6 VS High−Voltage Floating Supply Return 7 VB High−Side Floating Supply 8 HO High−Side Driver Output 9 NC No Connection 10 NC No Connection 11 VDD Logic Supply Voltage 12 HIN Logic Input for High−Side Gate Driver Output 13 SD Logic Input for Shutdown 14 LIN Logic Input for Low−Side Gate Driver Output 15 VSS Logic Ground 16 NC No Connection www.onsemi.com 3 FAN73912 Table 2. MAXIMUM RATINGS (TJ = 25°C, unless otherwise specified. All voltage parameters are referenced to COM unless otherwise stated in the table.) Parameter Symbol Min Max Unit VB High−Side Floating Supply Voltage −0.3 1225.0 V VS High−Side Floating Offset Voltage VB −25 VB +0.3 V VHO High−Side Floating Output Voltage VS −0.3 VB +0.3 V VCC Low−Side Supply Voltage −0.3 25 V VLO Low−Side Floating Output Voltage VDD Logic Supply Voltage VSS Logic GND VIN Logic Input Voltage (HIN, LIN and SD) −0.3 VCC +.0.3 V VSS −0.3 −0.3 VSS +25 25 V VDD −25 VDD +0.3 V VSS + VDD −25.3 −0.3 VDD +0.3 25 V Allowable Offset Voltage Slew Rate − ±50 V/ns Power Dissipation − 1.3 W qJA Thermal Resistance − 95 °C/W TJ Junction Temperature − 150 °C TSTG Storage Temperature −55 150 °C dVS/dt PD (Note 2, 3, 4) Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 2. Mounted on 76.2 x 114.3 x 1.6 mm PCB (FR−4 glass epoxy material). 3. Refer to the following standards: JESD51−2: Integral circuit’s thermal test method environmental conditions, natural convection; JESD51−3: Low effective thermal conductivity test board for leaded surface−mount packages. 4. Do not exceed maximum power dissipation (PD) under any circumstances. Table 3. RECOMMENDED OPERATING CONDITIONS (All voltage parameters are referenced to COM unless otherwise stated in the table) Parameter Symbol Min Max Unit VB High−Side Floating Supply Voltage VS + 12 VS + 20 V VS High−Side Floating Supply Offset Voltage (Note 6) 8 − VCC 1200 V VHO High−Side (HO) Output Voltage VS VB V VCC Low−Side Supply Voltage 12 20 V VLO Low−Side (LO) Output Voltage 0 VCC V VDD Logic Supply Voltage VSS + 3 0 VSS + 20 20 V VSS Logic Ground (Note 5) −10 10 V VIN Logic Input Voltage (HIN, LIN, SD) VSS + VDD − 20 0 VDD 20 V TJ Junction Temperature −40 +125 °C Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. 5. When VDD < 10 V, the minimum VSS offset is limited to −VDD. 6. Referenced to TJ = 25°C. www.onsemi.com 4 FAN73912 Table 4. STATIC ELECTRICAL CHARACTERISTICS (VBIAS (VCC, VBS, VDD) = 15.0 V, TJ = 25°C, unless otherwise specified. The VIH, VIL and IIN parameters are referenced to VSS and are applicable to respective input leads: HIN, LIN and SD. The VO and IO parameters are referenced to VS and COM and are applicable to the respective output leads: HO and LO. The VDDUV parameters are referenced to COM. The VBSUV parameters are referenced to VS1, 2, 3.) Symbol Parameter Conditions Min Typ Max Units LOW−SIDE POWER SUPPLY SECTION IQCC Quiescent VCC Supply Current VIN = 0 V or VDD − 170 300 mA IQDD Quiescent VDD Supply Current VIN = 0 V or VDD − − 10 mA IPCC Operating VCC Supply Current fIN = 20 kHz, rms VIN = 15 VPP − 650 950 mA IPDD Operating VDD Supply Current fIN = 20 kHz, rms VIN = 15 VPP − 2 − ISD Shutdown Supply Current SD = VDD − 30 50 mA VCCUV+ VCC Supply Under−Voltage Positive−Going Threshold Voltage VCC = Sweep 9.7 11.0 12 V VCCUV− VCC Supply Under−Voltage Negative−Going Threshold Voltage VCC = Sweep 9.2 10.5 11.4 V VCCUVH VCC Supply Under−Voltage Lockout Hysteresis Voltage VCC = Sweep − 0.5 − V BOOTSTRAPPED SUPPLY SECTION IQBS Quiescent VBS Supply Current VIN = 0 V or VDD − 50 100 mA IPBS Operating VBS Supply Current fIN = 20 kHz, rms value − 550 850 mA VBSUV+ VBS Supply Under−Voltage Positive−Going Threshold Voltage VBS = Sweep 9.7 11.0 12.0 V VBSUV− VBS Supply Under−Voltage Negative−Going Threshold Voltage VBS = Sweep 9.2 10.5 11.4 V VBSUVH VBS Supply Under−Voltage Lockout Hysteresis Voltage VBS = Sweep − 0.5 − V Offset Supply Leakage Current VB = VS = 1200 V (TJ = 25°C) − − 50 mA VB = VS = 1200 V (TJ = 125°C) (Note 7) − − 100 VB = VS = 1100 V (TJ = −40°C) (Note 7) − − 100 VDD = 3 V 2.4 − − VDD = 15 V 9.5 − − VDD = 3 V − − 0.8 VDD = 15 V − − 6.0 30 50 ILK INPUT LOGIC SECTION (HIN.LIN AND AD) VIH VIL Logic “1” Input Voltage Logic “0” Input Voltage V V IIN+ Logic “1” Input bias Current VIN = 15 V − IIN− Logic “0” Input bias Current VIN = 0 V − − 1 mA RIN Logic Input Pull−down Resistance − 500 − kW mA GATE DRIVER OUTPUT SECTION VOH High−Level Output Voltage, VBIAS−VO IO = 0 A − − 1.2 V VOL Low−Level Output Voltage, VO IO = 0 A − − 0.1 V IO+ Output HIGH Short−Circuit Pulse Current VO = 0 V, VIN = 5 V with PW ≤ 10 ms − 2.0 − A IO− Output LOW Short−Circuit Pulsed Current VO = 15 V, VIN = 0 V with PW ≤ 10 ms − 3.0 − A VS Allowable Negative VS Pin Voltage for HIN Signal Propagation to HO − −9.8 −7.0 V 7. These parameters are guaranteed by design. www.onsemi.com 5 FAN73912 Table 5. DYNAMIC ELECTRICAL CHARACTERISTICS (VBIAS(VCC, VBS, VDD) = 15.0 V, VS = VSS = COM, CL = 1000 pF and TJ = 25°C, unless otherwise specified.) Parameter Symbol Conditions Min Typ Max Units LOW−SIDE POWER SUPPLY SECTION tON Turn−On Propagation Delay VS = 0 V − 500 − ns tOFF Turn−Off Propagation Delay VS = 0 V − 550 − ns tFLTIN Input Filtering Time (HIN, LIN) (Note 8) 80 150 220 ns tFLTSD Input Filtering Time (SD) − 30 − ns 260 330 400 ns ns tSD Shutdown Propagation Delay Time tR Turn−On Rise Time − 25 − tF Turn−Off Fall Time − 15 − DT Dead Time − − 50 ns − 50 100 ns MDT Dead Time Matching (Note 9) MT Delay Matching , HO & LO Turn−On/OFF (Note 10) PM Output Pulse−Width Matching (Note 11) PWIN > 1 ms 8. The minimum width of the input pulse should exceed 500 ns to ensure the filtering time of the input filter is exceeded. 9. MDT is defined as | DTHO−LO−DTLO−HO | referenced to Figure 40. 10. MT is defined as an absolute value of matching delay time between High−side and Low−Side. 11. PM is defined as an absolute value of matching pulse−width between Input and Output. www.onsemi.com 6 FAN73912 580 620 560 600 540 580 tOFF [ns] tON [ns] TYPICAL CHARACTERISTICS 520 500 560 540 480 520 460 500 440 −40 −20 0 20 40 60 80 100 480 −40 120 −20 0 Temperature [°C] 100 120 30 40 25 35 20 tF [ns] 30 tR [ns] 80 Figure 5. Turn−Off Propagation Delay vs. Temperature Figure 4. Turn−On Propagation Delay vs. Temperature 25 15 20 10 15 5 10 −40 −20 0 20 40 60 80 100 0 −40 120 −20 0 Temperature [°C] 50 40 40 MTOFF [ns] 50 30 20 10 0 −40 80 60 20 40 Temperature [°C] 100 120 Figure 7. Turn−Off Fall Time vs. Temperature Figure 6. Turn−On Rise Time vs Temperature MTON [ns] 20 40 60 Temperature [°C] 30 20 10 −20 0 20 40 60 80 100 0 −40 120 −20 0 20 40 60 80 100 Temperature [°C] Temperature [°C] Figure 9. Turn−Off Delay Matching vs. Temperature Figure 8. Turn−On Delay Matching vs. Temperature www.onsemi.com 7 120 FAN73912 TYPICAL CHARACTERISTICS (continued) 400 40 380 IIN+ [mA] tSD [ns] 30 360 340 20 320 10 300 280 −40 −20 0 20 40 60 Temperature [°C] 80 100 0 −40 120 40 60 80 100 120 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 −20 0 20 40 60 80 100 0.0 −40 120 −20 0 20 40 60 80 100 120 Temperature [°C] Temperature [°C] Figure 13. Quiescent VDD Supply Current vs. Temperature Figure 12. Quiescent VCC Supply Current vs. Temperature 80 800 70 700 60 600 50 IPCC [mA] IQBS [mA] 20 Figure 11. Logic Input High Bias Current vs. Temperature IQDD [mA] IQCC [mA] 0 Temperature [°C] Figure 10. Shutdown Propagation Delay vs. Temperature 220 210 200 190 180 170 160 150 140 130 120 110 100 −40 −20 40 30 500 400 20 300 10 0 −40 −20 0 20 40 60 80 100 200 −40 120 −20 0 20 40 60 80 100 Temperature [°C] Temperature [°C] Figure 15. Operating VCC Supply Current vs. Temperature Figure 14. Quiescent VBS Supply Current vs. Temperature www.onsemi.com 8 120 FAN73912 TYPICAL CHARACTERISTICS (continued) 5.0 1000 4.5 800 3.5 IPBS [mA] IPDD [mA] 4.0 3.0 2.5 2.0 600 400 1.5 200 1.0 0.5 0.0 −40 −20 0 20 40 60 80 100 0 −40 120 60 80 100 120 Figure 17. Operating VBS Supply Current vs. Temperature 11.0 10.8 VCCUV− [V] 10.8 10.6 10.6 10.4 10.2 10.0 10.4 9.8 10.2 9.6 −20 0 20 40 60 80 100 −40 120 −20 0 20 40 60 80 100 120 Temperature [°C] Temperature [°C] Figure 19. VCC UVLO− vs. Temperature Figure 18. VCC UVLO+ vs. Temperature 11.0 11.4 10.8 11.2 10.6 VBSUV− [V] 11.0 VBSUV+ [V] 40 Figure 16. Operating VDD Supply Current vs. Temperature 11.0 10.8 10.6 10.4 10.4 10.2 10.0 9.8 10.2 10.0 −40 20 Temperature [°C] 11.2 VCCUV+ [V] 0 Temperature [°C] 11.4 10.0 −40 −20 9.6 −20 0 20 40 60 80 100 120 −40 −20 0 20 40 60 80 100 Temperature [°C] Temperature [°C] Figure 20. VBS UVLO+ vs. Temperature Figure 21. VBS UVLO− vs. Temperature www.onsemi.com 9 120 FAN73912 TYPICAL CHARACTERISTICS (continued) 0.010 0.008 1.4 0.006 0.004 1.0 VOL [V] VOH [V] 1.2 0.8 0.002 0.000 −0.002 0.6 −0.004 0.4 −0.006 0.2 0.0 −40 −20 0 20 40 60 80 100 −0.008 −0.010 −40 120 −20 0 20 10 10 9 9 8 8 VIL− [V] VIH [V] 100 120 7 7 6 5 6 5 4 4 3 3 2 2 −20 0 20 40 60 80 100 1 −40 120 −20 0 20 40 60 80 100 120 Temperature [°C] Temperature [°C] Figure 25. Logic Low Input Voltage vs. Temperature Figure 24. Logic High Input Voltage vs. Temperature 12 Logic Threshold Voltage [V] −7 −8 VS [V] 80 Figure 23. Low−Level Output Voltage vs. Temperature Figure 22. High−Level Output Voltage vs. Temperature −9 −10 −11 −12 −40 60 Temperature [°C] Temperature [°C] 1 −40 40 −20 0 20 40 60 80 100 10 8 6 4 2 0 120 0 Temperature [°C] 2 4 6 8 10 12 14 16 18 VDD Logic Supply Voltage [V] Figure 27. Input Logic (HIN&LIN) Threshold Voltage vs. VDD Supply Voltage Figure 26. Allowable Negative VS vs. Temperature www.onsemi.com 10 20 FAN73912 −4 600 580 −6 560 tON [ns] VS [V] TYPICAL CHARACTERISTICS (continued) −8 −10 540 520 500 480 −12 460 −14 440 −16 420 400 10 11 12 13 14 15 16 17 18 19 20 3 4 5 6 VDD Supply Voltage [V] VCC Supply Voltage [V] Figure 29. Turn−On Propagation Delay vs. VDD Supply Voltage Figure 28. Allowable Negative VS Voltage for HIN Signal Propagation to High Side vs. VCC Supply Voltage 600 350 580 300 540 tFLTIN [ns] tOFF [ns] 560 520 500 480 460 250 200 150 100 440 420 400 50 3 4 0 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 VDD Supply Voltage [V] 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Figure 31. Logic Input Filtering Time vs. VDD Supply Voltage 160 440 140 420 120 400 100 380 tSD [V] tFLTSD [ns] 3 4 5 6 VDD Supply Voltage [V] Figure 30. Turn−Off Propagation Delay vs. VDD Supply Voltage 80 60 360 340 320 40 300 20 280 260 0 7 8 9 10 11 12 13 14 15 16 17 18 19 20 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 VDD Supply Voltage [V] 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 VDD Supply Voltage [V] Figure 33. Shutdown Propagation Delay vs. VDD Supply Voltage Figure 32. Shutdown Input Filtering Time vs. VDD Supply Voltage www.onsemi.com 11 FAN73912 TYPICAL CHARACTERISTICS (continued) 400 380 26 24 360 22 MDT [ns] DT [ns] 340 320 300 280 18 260 240 220 200 20 16 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 14 VDD Supply Voltage [V] VDD Supply Voltage [V] Figure 35. Dead−Time Matching vs. VDD Supply Voltage Figure 34. Dead Time vs. VDD Supply Voltage 100 PM [ns] 80 60 40 20 0 3 4 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 VDD Supply Voltage [V] Figure 36. Output Pulse−Width Matching vs. VDD Supply Voltage www.onsemi.com 12 FAN73912 SWITCHING TIME DEFINITIONS 9 NC HO 8 10 NC VB 7 11 VDD VS 6 HIN 12 HIN NC 5 SD 13 SD NC 4 14 LIN VCC 3 15 VSS COM 2 16 NC LO 1 15 V LIN HO 100 nF 1 nF 15 V (0 to 1200 V) 15 V 100 nF LO 1 nF Figure 37. Switching Time Test Circuit A B C D HIN LIN SD Shutdown Shutdown SKIP SKIP Shoot−Through Protection HO Shoot−Through Protection LO Figure 38. Input/Output Timing Diagram HIN 50% 50% More than dead−time More than dead−time LIN 50% 50% tOFF tOFF 90% HO tF tON 10% 10% tOFF tR LO 50% tON 90% 90% 10% Figure 39. Switching Time Definition www.onsemi.com 13 90% FAN73912 SWITCHING TIME DEFINITIONS (continued) HIN 50% LIN 50% tOFF DTLO−HO 90% HO 10% DTHO−LO tR 90% 90% LO tOFF 10% tF MDT = ⎪DTHO−LO − DTLO−HO⎟ Figure 40. Internal Dead Time Definition HIN 50% 50% (LIN) ton tr toff 90% tf 90% HO (LO) 10% 10% Figure 41. Switching Time Waveform Definitions 50% SD tSD 90% HO (LO) Figure 42. Switching Time Definitions www.onsemi.com 14 10% FAN73912 APPLICATIONS INFORMATION Dead Time Shutdown Input Dead time is automatically inserted whenever the dead time of the external two input signals (between HIN and LIN signals) is shorter than internal fixed dead times (DT1 and DT2). Otherwise, external dead times larger than internal dead times are not modified by the gate driver and internal dead−time waveform definition is shown in Figure 43. When the SD pin is in LOW state, the gate driver operates normally. When a condition occurs that should shut down the gate driver, the SD pin should be HIGH. The Shutdown circuitry has an input filter; the minimum input duration is specified by tFLTIN (typically 250 ns). HIN 50% SD 50% LIN tSD 50% 90% 50% HO (LO) LO DT1 HO DT2 50% 50% Figure 45. Output Shutdown Timing Waveform Figure 43. Internal Dead−Time Definitions Noise Filter Input Noise Filter Figure 46 shows the input noise filter method, which has symmetry duration between the input signal (tINPUT) and the output signal (tOUTPUT) and helps to reject noise spikes and short pulses. This input filter is applied to the HIN, LIN, and EN inputs. The upper pair of waveforms (Example A) shows an input signal duration (tINPUT) much longer than input filter time (tFLTIN); it is approximately the same duration between the input signal time (tINPUT) and the output signal time (tOUTPUT). The lower pair of waveforms (Example B) shows an input signal time (tINPUT) slightly longer than input filter time (tFLTIN); it is approximately the same duration between input signal time (tINPUT) and the output signal time (tOUTPUT). Protection Function Shoot−Through Protection The shoot−through protection circuitry prevents both high− and low−side switches from conducting at the same time, as shown in Figure 44. HIN LIN Shoot−Through Protection HO LO After DT IN Example A After DT Example A HIN tFLTIN tINPUT tOUTPUT OUT LIN Shoot−Through Protection IN tINPUT Example B HO LO tOUTPUT OUT Example B tFLTIN Output duration is same as input duration Figure 46. Input Noise Filter Definition Figure 44. Shoot−Through Protection www.onsemi.com 15 FAN73912 Short−Pulsed Input Noise Rejection Method DC+ Bus The input filter circuitry provides protection against short−pulsed input signals (HIN, LIN, and SD) on the input signal lines by applied noise signal. If the input signal duration is less than input filter time (tFLTIN), the output does not change states. Example A and B of the Figure 47 show the input and output waveforms with short−pulsed noise spikes with a duration less than input filter time; the output does not change states. Q1 D1 iLOAD iFREEWHEELING VS Load Q2 D2 Example A IN tFLTIN tFLTIN tFLTIN OUT (LOW) Figure 48. Half−Bridge Application Circuits Example B tFLTIN OUT (HIGH) tFLTIN This negative voltage can be trouble for the gate driver’s output stage, there is the possibility to develop an overvoltage condition of the bootstrap capacitor, input signal missing and latch−up problems because it directly affects the source VS pin of the gate driver, shown in Figure 49. This undershoot voltage is called “negative VS transient”. tFLTIN Figure 47. Noise Rejecting Input Filter Definition Negative VS Transient The bootstrap circuit has the advantage of being simple and low cost, but has some limitations. The biggest difficulty with this circuit is the negative voltage present at the emitter of the high−side switching device when high−side switch is turned−off in half−bridge application. If the high−side switch, Q1, turns−off while the load current is flowing to an inductive load, a current commutation occurs from high−side switch, Q1, to the diode, D2, in parallel with the low−side switch of the same inverter leg. Then the negative voltage present at the emitter of the high−side switching device, just before the freewheeling diode, D2, starts clamping, causes load current to suddenly flow to the low−side freewheeling diode, D2, as shown in Figure 48. Q1 VS GND Freewheeling Figure 49. VS Waveforms during Q1 Turn−Off www.onsemi.com 16 FAN73912 Figure 50 and Figure 51 show the commutation of the load current between high−side switch, Q1, and low−side freewheeling diode, D3, in same inverter leg. The parasitic inductances in the inverter circuit from the die wire bonding to the PCB tracks are jumped together in LC and LE for each IGBT. When the high−side switch, Q1, and low−side switch, Q4, are turned on, the VS1 node is below DC+ voltage by the voltage drops associated with the power switch and the parasitic inductances of the circuit due to load current is flows from Q1 and Q4, as shown in Figure 50. When the high−side switch, Q1, is turned off and Q4, remained turned on, the load current to flows the low−side freewheeling diode, D3, due to the inductive load connected to VS1 as shown in Figure 51. Q1 Turn−Off and D3 Conducting. The current flows from ground (which is connected to the COM pin of the gate driver) to the load and the negative voltage present at the emitter of the high−side switching device. In this case, the COM pin of the gate driver is at a higher potential than the VS pin due to the voltage drops associated with freewheeling diode, D3, and parasitic elements, LC3 and LE3. The FAN73912 has a typical negative VS transient characteristics, as shown in Figure 52. 0 −5 VS [V] −10 VLC1 −30 −35 50 D1 LE1 VLE1 VS1 ifreewheeling Q4 D3 D4 LE3 VLE4 LE4 Figure 50. Q1 and Q4 Turn−On DC+ Bus LC1 LC2 Q2 Q1 D1 D2 ifreewheeling LE1 VS1 LC3 iLOAD LE2 Load VLC3 VS2 VLC4 LE3 LC4 Placement of Components The recommended placement and selection of component as follows: • Place a bypass capacitor between the VCC and VSS pins. A ceramic 1 mF capacitor is suitable for most applications. This component should be placed as close as possible to the pins to reduce parasitic elements. Q4 Q3 D3 D4 VLE3 VLE4 300 Printed Circuit Board Layout The layout recommended for minimized parasitic elements is as follows: • Direct tracks between switches with no loops or deviation. • Avoid interconnect links. These can add significant inductance. • Reduce the effect of lead−inductance by lowering package height above the PCB. • Consider co−locating both power switches to reduce track length. • To minimize noise coupling, the ground plane should not be placed under or near the high−voltage floating side. • To reduce the EM coupling and improve the power switch turn−on/off performance, the gate drive loops must be reduced as much as possible. LC4 Q3 250 General Guidelines VS2 LC3 200 Even though the FAN73912 has been shown able to handle these negative VS transient conditions, it is strongly recommended that the circuit designer limit the negative VS transient as much as possible by careful PCB layout to minimize the value of parasitic elements and component use. The amplitude of negative VS voltage is proportional to the parasitic inductances and the turn−off speed, di/dt, of the switching device. LE2 Load 150 Figure 52. Negative VS Transient Characteristic D2 iLOAD 100 Pulse Width [ns] LC2 Q2 Q1 −20 −25 DC+ Bus LC1 −15 LE4 Figure 51. Q1 Turn−Off and D3 Conducting www.onsemi.com 17 FAN73912 • The bypass capacitor from VCC to VSS supports both • • the low−side driver and bootstrap capacitor recharge. A value at least ten times higher than the bootstrap capacitor is recommended. The bootstrap resistor, RBOOT, must be considered in sizing the bootstrap resistance and the current developed during initial bootstrap charge. If the resistor is needed in series with the bootstrap diode, verify that VB does not fall below COM (ground). Recommended use is typically 5 ~ 10 W that increase the VBS time constant. If the voltage drop of bootstrap resistor and diode is too high or the circuit topology does not allow a sufficient charging time, a fast recovery or ultra−fast recovery diode can be used. The bootstrap capacitor, CBOOT, uses a low−ESR capacitor, such as ceramic capacitor. It is strongly • • • • recommended that the placement of components is as follows: Place components tied to the floating voltage pins (VB and VS) near the respective high−voltage portions of the device and the FAN73912. Not Connected (NC) pins in this package maximize the distance between the high−voltage and low−voltage pins (see Figure 3). Place and route for bypass capacitors and gate resistors as close as possible to gate drive IC. Locate the bootstrap diode, DBOOT, as close as possible to bootstrap capacitor, CBOOT. The bootstrap diode must use a lower forward voltage drop and minimal switching time as soon as possible for fast recovery or ultra−fast diode. www.onsemi.com 18 MECHANICAL CASE OUTLINE PACKAGE DIMENSIONS SOIC−16, 300 mils CASE 751BH−01 ISSUE A DATE 18 MAR 2009 D SYMBOL E1 E MIN NOM MAX 2.49 2.64 A 2.36 A1 0.10 b 0.33 0.41 0.51 c 0.18 0.23 0.28 D 10.08 10.31 10.49 E 10.01 10.31 10.64 E1 7.39 7.49 7.59 0.30 1.27 BSC e h 0.25 L 0.38 θ 0º 0.75 0.81 1.27 8º PIN #1 IDENTIFICATION TOP VIEW h A b e A1 SIDE VIEW c q L END VIEW Notes: (1) All dimensions are in millimeters. Angles in degrees. (2) Complies with JEDEC MS-013. DOCUMENT NUMBER: DESCRIPTION: 98AON34279E SOIC−16, 300 MILS Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red. 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