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FDD8870

FDD8870

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOT428

  • 描述:

    MOSFET N-CH 30V 160A D-PAK

  • 数据手册
  • 价格&库存
FDD8870 数据手册
FDD8870 / FDU8870 N-Channel PowerTrench® MOSFET 30V, 160A, 3.9mΩ General Description Features This N-Channel MOSFET has been designed specifically to improve the overall ef ficiency of DC/ DC converters using either synchronous or conven tional swit ching PW M controllers. It has been optimized for low gate charge, low rDS(ON) and fast switching speed. • rDS(ON) = 3.9mΩ, VGS = 10V, ID = 35A • rDS(ON) = 4.4mΩ, VGS = 4.5V, ID = 35A • High performance t rench t echnology for ext remely low rDS(ON) • Low gate charge Applications • High power and current handling capability • DC/DC converters D D G S D-PAK TO-252 (TO-252) I-PAK (TO-251AA) G S G D S MOSFET Maximum Ratings TC = 25°C unless otherwise noted Symbol VDSS VGS ID Drain to Source Voltage Parameter Ratings 30 Units V Gate to Source Voltage ±20 V Continuous (TC = 25oC, VGS = 10V) (Note 1) 160 A Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 52oC/W) 150 A 21 A Drain Current Continuous (TC = 25oC, VGS = 4.5V) (Note 1) Pulsed EAS PD TJ, TSTG Single Pulse Avalanche Energy (Note 2) Power dissipation Derate above 25oC Operating and Storage Temperature Figure 4 A 690 mJ 160 1.07 W W/oC oC -55 to 175 Thermal Characteristics RθJC Thermal Resistance Junction to Case TO-252, TO-251 0.94 o C/W RθJA Thermal Resistance Junction to Ambient TO-252, TO-251 100 o C/W Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area 52 RθJA ©2008 Fairchild Semiconductor Corporation oC/W FDD8870 / FDU8870 Rev. 1.2 FDD8870 / FDU8870 March 2015 Device Marking FDD8870 Device FDD8870 Package TO-252AA Reel Size 13” Tape Width 16mm Quantity 2500 units FDU8870 FDU8870 TO-251AA Tube N/A 75 units F F Electrical Characteristics TC = 25°C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units V Off Characteristics BVDSS Drain to Source Breakdown Voltage IDSS Zero Gate Voltage Drain Current IGSS Gate to Source Leakage Current ID = 250µA, VGS = 0V VDS = 24V VGS = 0V VGS = ±20V TC = 150oC 30 - - - - 1 - - 250 - - ±100 nA - 2.5 V µA On Characteristics VGS(TH) Gate to Source Threshold Voltage rDS(ON) Drain to Source On Resistance VGS = VDS, ID = 250µA 1.2 ID = 35A, VGS = 10V - 0.0032 0.0039 - 0.0036 0.0044 ID = 35A, VGS = 10V, TJ = 175oC - 0.0051 0.0063 ID = 35A, VGS = 4.5V Ω Dynamic Characteristics CISS Input Capacitance CRSS Reverse Transfer Capacitance Qg(TOT) Total Gate Charge at 10V Qg(TH) Threshold Gate Charge Qgs2 Gate Charge Threshold to Plateau COSS Output Capacitance RG Gate Resistance Qg(5) Total Gate Charge at 5V Qgs Gate to Source Gate Charge Qgd Gate to Drain “Miller” Charge Switching Characteristics VDS = 15V, VGS = 0V, f = 1MHz VGS = 0.5V, f = 1MHz VGS = 0V to 10V VGS = 0V to 5V VGS = 0V to 1V VDD = 15V ID = 35A Ig = 1.0mA - 5160 - - 990 - pF pF - 590 - pF - 2.1 - Ω - 91 118 nC - 48 62 nC - 5 6.5 nC - 14 - nC - 9 - nC - 18 - nC (VGS = 10V) tON Turn-On T ime - - 139 ns td(ON) Turn-On Delay Time - 9 - ns tr Rise Time td(OFF) Turn-Off Delay Time tf tOFF - 83 - ns - 83 - ns Fall Time - 42 - ns Turn-Off Time - - 189 ns ISD = 35A - - 1.25 V - - 1.0 V ISD = 35A, dISD/dt = 100A/µs - - 37 ns - - 21 nC VDD = 15V, ID = 35A VGS = 10V, RGS = 3.3Ω Drain-Source Diode Characteristics VSD Source to Drain Diode Voltage trr Reverse Recovery Time QRR Reverse Recovered Charge ISD = 15A ISD = 35A, dISD/dt = 100A/µs Notes: 1: Package current limitation is 35A. 2: Starting TJ = 25°C, L = 1.77mH, IAS = 28A, VDD = 27V, VGS = 10V. : F ©2008 Fairchild Semiconductor Corporation FDD8870 / FDU8870 Rev. 1.2 FDD8870 / FDU8870 Package Marking and Ordering Information FDD8870 / FDU8870 Typical Characteristics TC = 25°C unless otherwise noted 175 1.0 150 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.2 0.8 0.6 0.4 CURRENT LIMITED BY PACKAGE 125 100 75 50 0.2 25 0 0 25 50 75 100 150 125 0 175 25 50 75 TC , CASE TEMPERATURE (oC) 100 125 150 175 o TC, CASE TEMPERATURE ( C) Figure 1. Normalized Power Dissipation vs Case Temperature Figure 2. Maximum Continuous Drain Current vs Case Temperature 2 ZθJC, NORMALIZED THERMAL IMPEDANCE 1 DUTY CYCLE - DESCENDING ORDER 0.5 0.2 0.1 0.05 0.02 0.01 PDM 0.1 t1 t2 NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZθJC x RθJC + TC SINGLE PULSE 0.01 10-5 10-4 10-3 10-2 10-1 100 101 t, RECTANGULAR PULSE DURATION (s) Figure 3. Normalized Maximum Transient Thermal Impedance 2000 1000 IDM, PEAK CURRENT (A) TC = 25oC TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS: VGS = 4.5V 175 - TC I = I25 150 100 30 10-5 10-4 10-3 10-2 10-1 100 101 t, PULSE WIDTH (s) Figure 4. Peak Current Capability ©2008 Fairchild Semiconductor Corporation FDD8870 / FDU8870 Rev. 1.2 FDD8870 / FDU8870 Typical Characteristics TC = 25°C unless otherwise noted 1000 100 IAS, AVALANCHE CURRENT (A) ID, DRAIN CURRENT (A) 10µs 100 100µs 10 OPERATION IN THIS AREA MAY BE LIMITED BY rDS(ON) 1ms 10ms 1 DC SINGLE PULSE TJ = MAX RATED TC = 25oC STARTING TJ = 25oC 10 If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD) If R ≠ 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] 1 0.1 1 10 VDS, DRAIN TO SOURCE VOLTAGE (V) 0.1 60 1 10 tAV, TIME IN AVALANCHE (ms) Figure 6. Unclamped Inductive Switching Capability 100 100 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX VDD = 15V VGS = 5V 80 ID, DRAIN CURRENT (A) 80 TJ = 175oC 60 TJ = 25oC 40 VGS = 4V VGS = 10V 60 VGS = 3V 40 VGS = 2.5V TC = 25oC PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 20 20 o TJ = -55 C 0 0 1.5 2.0 2.5 VGS , GATE TO SOURCE VOLTAGE (V) 0 3.0 0.2 0.4 0.6 VDS , DRAIN TO SOURCE VOLTAGE (V) Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics 8 1.6 NORMALIZED DRAIN TO SOURCE ON RESISTANCE PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX ID = 35A rDS(ON), DRAIN TO SOURCE ON RESISTANCE (mΩ) 100 NOTE: Refer to Fairchild Application Notes AN7514 and AN7515 Figure 5. Forward Bias Safe Operating Area ID , DRAIN CURRENT (A) STARTING TJ = 150oC 6 4 ID = 1A PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 1.4 1.2 1.0 0.8 VGS = 10V, ID = 35A 2 2 4 6 8 10 VGS, GATE TO SOURCE VOLTAGE (V) Figure 9. Drain to Source On Resistance vs Gate Voltage and Drain Current ©20048Fairchild Semiconductor Corporation 0.6 -80 -40 0 40 80 120 TJ, JUNCTION TEMPERATURE (oC) 160 200 Figure 10. Normalized Drain to Source On Resistance vs Junction Temperature FDD8870 / FDU8870 Rev. 1.2 FDD8870 / FDU8870 Typical Characteristics TC = 25°C unless otherwise noted 1.2 1.2 ID = 250µA NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE NORMALIZED GATE THRESHOLD VOLTAGE VGS = VDS, ID = 250µA 1.0 0.8 0.6 0.4 -80 -40 0 40 80 120 160 1.1 1.0 0.9 -80 200 -40 TJ, JUNCTION TEMPERATURE (oC) Figure 11. Normalized Gate Threshold Voltage vs Junction Temperature 80 120 160 200 10 VDD = 15V CRSS = CGD VGS , GATE TO SOURCE VOLTAGE (V) CISS = CGS + CGD C, CAPACITANCE (pF) 40 Figure 12. Normalized Drain to Source Breakdown Voltage vs Junction Temperature 10000 COSS ≅ CDS + CGD 1000 VGS = 0V, f = 1MHz 400 0.1 0 TJ , JUNCTION TEMPERATURE (oC) 8 6 4 WAVEFORMS IN DESCENDING ORDER: ID = 35A ID = 5A 2 0 1 10 VDS , DRAIN TO SOURCE VOLTAGE (V) Figure 13. Capacitance vs Drain to Source Voltage ©2004 Fairchild Semiconductor Corporation 30 0 20 40 60 Qg, GATE CHARGE (nC) 80 100 Figure 14. Gate Charge Waveforms for Constant Gate Current FDD8870 / FDU8870 Rev. 1.2 VDS BVDSS tP L VDS VARY tP TO OBTAIN IAS + RG REQUIRED PEAK IAS VDD VDD - VGS DUT tP IAS 0V 0 0.01Ω tAV Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms VDS VDD Qg(TOT) VDS L VGS VGS = 10V VGS Qg(5) + Qgs2 VDD VGS = 5V DUT VGS = 1V Ig(REF) 0 Qg(TH) Qgs Qgd Ig(REF) 0 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms VDS tON tOFF td(ON) td(OFF) RL tf tr VDS 90% 90% + VGS VDD - 10% 10% 0 DUT 90% RGS VGS VGS 0 Figure 19. Switching Time Test Circuit ©2008 Fairchild Semiconductor Corporation 50% 10% 50% PULSE WIDTH Figure 20. Switching Time Waveforms FDD8870 / FDU8870 Rev. 1.2 FDD8870 / FDU8870 Test Circuits and Waveforms FDD8870 / FDU8870 Thermal Resistance vs. Mounting Pad Area ( T JM – TA ) P DM = ----------------------------Rθ JA (EQ. 1) In us ing surf ace m ount dev ices s uch as t he T O-252 package, the environment in which it is applied will have a significant inf luence on t he part’s cur rent and m aximum power dissipat ion ratings. Precise det ermination of P DM is complex and influenced by many factors: 1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 125 RθJA = 33.32+ 23.84/(0.268+Area) EQ.2 RθJA = 33.32+ 154/(1.73+Area) EQ.3 100 RθJA (oC/W) The max imum rated junct ion temperature, T JM, and t he thermal resist ance of t he heat dissipating pat h determines the maximum allowable device power dissipation, PDM, in an application. Therefore t he application’s ambient temperature, T A (oC), and t hermal res istance R θJA (oC/W) must be rev iewed t o ens ure t hat T JM is never ex ceeded. Equation 1 mat hematically represents the relationship and serves as the basis for establishing the rating of the part. 75 50 25 0.01 (0.0645) 0.1 (0.645) 1 10 (6.45) (64.5) AREA, TOP COPPER AREA in2 (cm2) Figure 21. Thermal Resistance vs Mounting Pad Area 2. T he number of copper layers and t he t hickness of the board. 3. The use of external heat sinks. 4. The use of thermal vias. 5. Air flow and board orientation. 6. For non st eady state applicat ions, t he pulse widt h, t he duty cycle and the transient thermal response of the part, the board and the environment they are in. Fairchild provides t hermal i nformation t o as sist the designer’s preliminary application evaluat ion. F igure 21 defines t he R θJA f or t he device as a f unction of t he top copper (component s ide) area. T his is f or a horizont ally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph prov ides the necessary information for calculation of the steady state junction temperature or power dissipat ion. P ulse applications can be ev aluated us ing t he F airchild dev ice Spice thermal model o r m anually ut ilizing the norm alized maximum transient thermal impedance curve. Thermal res istances c orresponding t o ot her c opper area s can be obt ained f rom Figure 21 or by calc ulation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in c entimeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads. 23.84 ( 0.268 + Area ) R θ JA = 33.32 + ------------------------------------- (EQ. 2) Area in Inches Squared 154 ( 1.73 + Area ) R θ JA = 33.32 + ---------------------------------- (EQ. 3) Area in Centimeters Squared ©2008 Fairchild Semiconductor Corporation FDD8870 / FDU8870 Rev. 1.2 LDRAIN DPLCAP 10 Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD RLDRAIN RSLC1 51 5 51 EVTHRES + 19 8 + LGATE GATE 1 Lgate 1 9 5e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 2e-9 EVTEMP RGATE + 18 22 9 20 21 11 + 17 EBREAK 18 - 16 DBODY MWEAK 6 MMED MSTRO RLGATE LSOURCE CIN 8 7 SOURCE 3 RSOURCE RLSOURCE RLgate 1 9 50 RLdrain 2 5 10 RLsource 3 7 20 Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD ESLC 50 RDRAIN 6 8 ESG DBREAK + RSLC2 Ebreak 11 7 17 18 32.7 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 It 8 17 1 DRAIN 2 5 S1A 12 S2A 13 8 17 18 RVTEMP S2B 13 19 CB 6 8 VBAT 5 8 EDS - IT 14 + + EGS Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 1.57e-3 Rgate 9 20 2.1 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 1.2e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD 15 14 13 S1B CA RBREAK - + 8 22 RVTHRES Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*500),10))} .MODEL DbodyMOD D (IS=1.3E-11 IKF=10 N=1.01 RS=1.8e-3 TRS1=8e-4 TRS2=2e-7 + CJO=2e-9 M=0.57 TT=1e-10 XTI=0.9) .MODEL DbreakMOD D (RS=8e-2 TRS1=1e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=1.6e-9 IS=1e-30 N=10 M=0.38) .MODEL MmedMOD NMOS (VTO=1.76 KP=10 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.1 T_ABS=25) .MODEL MstroMOD NMOS (VTO=2.2 KP=650 IS=1e-30 N=10 TOX=1 L=1u W=1u T_ABS=25) .MODEL MweakMOD NMOS (VTO=1.47 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=21 RS=0.1 T_ABS=25) .MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-4e-7) .MODEL RdrainMOD RES (TC1=2e-4 TC2=8e-6) .MODEL RSLCMOD RES (TC1=9e-4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=8e-3 TC2=1e-6) .MODEL RvthresMOD RES (TC1=-2e-3 TC2=-9.5e-6) .MODEL RvtempMOD RES (TC1=-2.6e-3 TC2=2e-7) .MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3 VOFF=-4) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-0.5) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=-2) .ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. ©2008 Fairchild Semiconductor Corporation FDD8870 / FDU8870 Rev. 1.2 FDD8870 / FDU8870 PSPICE Electrical Model .SUBCKT FDD8870 2 1 3 ; rev July 2003 Ca 12 8 4.2e-9 Cb 15 14 4.2e-9 Cin 6 8 4.7e-9 dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod spe.ebreak n11 n7 n17 n18 = 32.7 GATE spe.eds n14 n8 n5 n8 = 1 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 RDRAIN 6 8 ESG EVTHRES + 19 8 + LGATE DBREAK 50 - EVTEMP RGATE + 18 22 9 20 21 11 DBODY 16 MWEAK 6 EBREAK + 17 18 - MMED MSTRO RLGATE CIN DRAIN 2 8 LSOURCE 7 SOURCE 3 RSOURCE RLSOURCE i.it n8 n17 = 1 S1A 12 l.lgate n1 n9 = 5e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 2e-9 res.rlgate n1 n9 = 50 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 20 S2A 14 13 13 8 S1B CA RBREAK 15 17 18 RVTEMP S2B 13 CB 6 8 EGS 19 - IT 14 + + VBAT 5 8 EDS - m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u, temp=m_temp m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u, temp=m_temp m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u, temp=m_temp + 8 22 RVTHRES res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-4e-7 res.rdrain n50 n16 = 1.57e-3, tc1=2e-4,tc2=8e-6 res.rgate n9 n20 = 2.1 res.rslc1 n5 n51 = 1e-6, tc1=9e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 1.2e-3, tc1=8e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-2e-3,tc2=-9.5e-6 res.rvtemp n18 n19 = 1, tc1=-2.6e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/500))** 10)) } } ©2008 Fairchild Semiconductor Corporation FDD8870 / FDU8870 Rev. 1.2 FDD8870 / FDU8870 SABER Electrical Model rev July 2003 template FDD8870 n2,n1,n3 =m_temp electrical n2,n1,n3 number m_temp=25 { var i iscl dp..model dbodymod = (isl=1.3e-11,ikf=10,nl=1.01,rs=1.8e-3,trs1=8e-4,trs2=2e-7,cjo=2e-9,m=0.57,tt=1e-10,xti=0.9) dp..model dbreakmod = (rs=8e-2,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=1.6e-9,isl=10e-30,nl=10,m=0.38) m..model mmedmod = (type=_n,vto=1.76,kp=10,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.2,kp=650,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.47,kp=0.05,is=1e-30, tox=1,rs=0.1) LDRAIN sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-3) DPLCAP 5 sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3,voff=-4) 10 sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-2,voff=-0.5) RLDRAIN RSLC1 sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-0.5,voff=-2) 51 c.ca n12 n8 = 4.2e-9 RSLC2 c.cb n15 n14 = 4.2e-9 ISCL c.cin n6 n8 = 4.7e-9 th JUNCTION FDD8870T CTHERM1 TH 6 1e-3 CTHERM2 6 5 2e-3 CTHERM3 5 4 3e-3 CTHERM4 4 3 9e-3 CTHERM5 3 2 1e-2 CTHERM6 2 TL 2e-2 RTHERM1 CTHERM1 6 RTHERM1 TH 6 3e-2 RTHERM2 6 5 8e-2 RTHERM3 5 4 1.1e-1 RTHERM4 4 3 1.6e-1 RTHERM5 3 2 1.72e-1 RTHERM6 2 TL 2e-1 RTHERM2 CTHERM2 5 SABER Thermal Model SABER thermal model FDD8870T template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =1e-3 ctherm.ctherm2 6 5 =2e-3 ctherm.ctherm3 5 4 =3e-3 ctherm.ctherm4 4 3 =9e-3 ctherm.ctherm5 3 2 =1e-2 ctherm.ctherm6 2 tl =2e-2 rtherm.rtherm1 th 6 =3e-2 rtherm.rtherm2 6 5 =8e-2 rtherm.rtherm3 5 4 =1.1e-1 rtherm.rtherm4 4 3 =1.6e-1 rtherm.rtherm5 3 2 =1.72e-1 rtherm.rtherm6 2 tl =2e-1 } RTHERM3 CTHERM3 4 CTHERM4 RTHERM4 3 CTHERM5 RTHERM5 2 CTHERM6 RTHERM6 tl ©2008 Fairchild Semiconductor Corporation CASE FDD8870 / FDU8870 Rev. 1.2 FDD8870 / FDU8870 PSPICE Thermal Model REV 23 July 2003 TRADEMARKS The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks. 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DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. TO OBTAIN THE LATEST, MOST UP-TO-DATE DATASHEET AND PRODUCT INFORMATION, VISIT OUR WEBSITE AT HTTP://WWW.FAIRCHILDSEMI.COM. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. AUTHORIZED USE Unless otherwise specified in this data sheet, this product is a standard commercial product and is not intended for use in applications that require extraordinary levels of quality and reliability. This product may not be used in the following applications, unless specifically approved in writing by a Fairchild officer: (1) automotive or other transportation, (2) military/aerospace, (3) any safety critical application – including life critical medical equipment – where the failure of the Fairchild product reasonably would be expected to result in personal injury, death or property damage. Customer’s use of this product is subject to agreement of this Authorized Use policy. In the event of an unauthorized use of Fairchild’s product, Fairchild accepts no liability in the event of product failure. In other respects, this product shall be subject to Fairchild’s Worldwide Terms and Conditions of Sale, unless a separate agreement has been signed by both Parties. ANTI-COUNTERFEITING POLICY Fairchild Semiconductor Corporation's Anti-Counterfeiting Policy. Fairchild's Anti-Counterfeiting Policy is also stated on our external website, www.fairchildsemi.com, under Terms of Use Counterfeiting of semiconductor parts is a growing problem in the industry. All manufacturers of semiconductor products are experiencing counterfeiting of their parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed applications, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild's quality standards for handling and storage and provide access to Fairchild's full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address any warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Advance Information Formative / In Design Preliminary First Production No Identification Needed Full Production Obsolete Not In Production Definition Datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design. Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only. Rev. I75 © Fairchild Semiconductor Corporation www.fairchildsemi.com
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