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N-Channel QFET® MOSFET
500 V, 1.6 A, 5.3 Ω
Description
Features
This N-Channel enhancement mode power MOSFET is
produced
using
ON Semiconductor’s
proprietary
planar stripe and DMOS technology. This advanced
MOSFET technology has been especially tailored to
reduce on-state resistance, and to provide superior
switching performance and high avalanche energy
strength. These devices are suitable for switched mode
power supplies, audio amplifier, DC motor control, and
variable switching power applications.
• 1.6 A, 500 V, RDS(on) = 5.3 Ω (Max.) @ VGS = 10 V,
ID = 0.8 A
• Low Gate Charge (Typ. 6.0 nC)
• Low Crss (Typ. 4.3 pF)
• Fast Switching
• 100% Avalanche Tested
• Improved dv/dt Capability
D
G
G
D
S
I-PAK
Absolute Maximum Ratings T
Symbol
VDSS
ID
S
o
C
= 25 C unless otherwise noted.
FQU2N50BTU-WS
500
Parameter
Drain-Source Voltage
- Continuous (TC = 25°C)
Drain Current
- Continuous (TC = 100°C)
IDM
Drain Current
VGSS
Gate-Source Voltage
EAS
Single Pulsed Avalanche Energy
IAR
EAR
dv/dt
PD
- Pulsed
(Note 1)
TL
1.6
A
1.0
A
6.4
A
± 30
V
(Note 2)
120
mJ
Avalanche Current
(Note 1)
1.6
A
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (TA = 25°C) *
(Note 1)
3.0
4.5
2.5
mJ
V/ns
W
30
0.24
-55 to +150
W
W/°C
°C
300
°C
(Note 3)
Power Dissipation (TC = 25°C)
TJ, TSTG
Units
V
- Derate above 25°C
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering,
1/8" from Case for 5 Seconds
Thermal Characteristics
Symbol
RJC
RJA
Parameter
FQU2N50BTU_WS
Thermal Resistance, Junction to Ambient (Minimum Pad of 2-oz Copper), Max.
2
Thermal Resistance, Junction to Ambient (*1 in Pad of 2-oz Copper), Max.
©2000 Semiconductor Components Industries, LLC.
October-2017,Rev. 3
Unit
4.17
Thermal Resistance, Junction to Case, Max.
110
oC/W
50
Publication Order Number:
FQU2N50B/D
FQU2N50B — N-Channel QFET® MOSFET
FQU2N50B
Part Number
FQU2N50BTU-WS
Electrical Characteristics T
Symbol
Package
I-PAK
Top Mark
FQU2N50B
Packing Method
Tube
Reel Size
N/A
Tape Width
N/A
Quantity
75 units
o
C
= 25 C unless otherwise noted.
Parameter
Test Conditions
Min
Typ
Max
Units
500
--
--
V
--
V/°C
Off Characteristics
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = 250 µA
∆BVDSS
/
∆TJ
Breakdown Voltage Temperature
Coefficient
ID = 250 µA, Referenced to 25°C
--
0.48
IDSS
Zero Gate Voltage Drain Current
VDS = 500 V, VGS = 0 V
--
--
1
µA
VDS = 400 V, TC = 125°C
--
--
10
µA
IGSSF
Gate-Body Leakage Current, Forward
VGS = 30 V, VDS = 0 V
--
--
100
nA
IGSSR
Gate-Body Leakage Current, Reverse
VGS = -30 V, VDS = 0 V
--
--
-100
nA
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250 µA
2.3
3.0
3.7
V
VDS = VGS, ID = 250 mA
3.6
4.3
5.0
V
RDS(on)
Static Drain-Source
On-Resistance
VGS = 10 V, ID = 0.8 A
--
4.2
5.3
Ω
gFS
Forward Transconductance
VDS = 50 V, ID = 0.8 A
--
1.3
--
S
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
--
180
230
pF
--
30
40
pF
--
4
6
pF
ns
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
VDD = 250 V, ID = 2.1 A,
RG = 25 Ω
(Note 4)
VDS = 400 V, ID = 2.1 A,
VGS = 10 V
(Note 4)
Gate-Drain Charge
--
6
20
--
25
60
ns
--
10
30
ns
--
20
50
ns
--
6.0
8.0
nC
--
1.3
--
nC
--
3.0
--
nC
A
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
1.6
ISM
--
--
6.4
A
VSD
Maximum Pulsed Drain-Source Diode Forward Current
VGS = 0 V, IS = 1.6 A
Drain-Source Diode Forward Voltage
--
--
1.4
V
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VGS = 0 V, IS = 2.1 A,
dIF / dt = 100 A/µs
1. Repetitive rating : pulse-width limited by maximum junction temperature.
2. L = 85 mH, IAS = 1.6 A, VDD = 50 V, RG = 25 Ω, starting TJ = 25oC.
3. ISD ≤ 2.1 A, di/dt ≤ 200 A/μs, VDD ≤ BVDSS, starting TJ = 25oC.
4. Essentially independent of operating temperature.
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2
--
195
--
ns
--
0.69
--
µC
FQU2N50B — N-Channel QFET® MOSFET
Package Marking and Ordering Information
ID , Drain Current [A]
0
10
Bottom :
VGS
15 V
10 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
ID , Drain Current [A]
Top :
-1
10
150℃
0
10
25℃
-55℃
※ Notes :
1. 250μs Pulse Test
2. TC = 25℃
※ Notes :
1. VDS = 50V
2. 250μs Pulse Test
-2
10
-1
-1
0
10
10
1
10
2
10
4
8
6
10
VGS , Gate-Source Voltage [V]
VDS , Drain-Source Voltage [V]
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
18
IDR , Reverse Drain Current [A]
RDS(on) [ Ω ],
Drain-Source On-Resistance
15
VGS = 10V
12
VGS = 20V
9
6
3
0
10
25℃
150℃
※ Notes :
1. VGS = 0V
2. 250μs Pulse Test
※ Note : TJ = 25℃
0
0.0
-1
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
10
0.2
0.4
ID , Drain Current [A]
0.6
0.8
1.0
1.2
1.4
VSD , Source-Drain Voltage [V]
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
12
350
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
300
VDS = 100V
10
Capacitance [pF]
250
Ciss
200
Coss
150
※ Notes :
1. VGS = 0 V
2. f = 1 MHz
100
Crss
50
VGS, Gate-Source Voltage [V]
VDS = 250V
VDS = 400V
8
6
4
2
※ Note : ID = 2.1 A
0
-1
10
0
0
10
1
10
0
1
2
3
4
5
6
7
QG, Total Gate Charge [nC]
VDS, Drain-Source Voltage [V]
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
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3
FQU2N50B — N-Channel QFET® MOSFET
!
3.0
1.2
RDS(ON) , (Normalized)
Drain-Source On-Resistance
BV DSS , (Normalized)
Drain-Source Breakdown Voltage
2.5
1.1
1.0
※ Notes :
1. VGS = 0 V
2. ID = 250 μA
0.9
0.8
-100
-50
0
50
100
150
2.0
1.5
1.0
※ Notes :
1. VGS = 10 V
2. ID = 1.05 A
0.5
0.0
-100
200
-50
o
0
50
100
150
200
o
TJ, Junction Temperature [ C]
TJ, Junction Temperature [ C]
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
1.8
Operation in This Area
is Limited by R DS(on)
1
1.5
10
ID, Drain Current [A]
1 ms
0
10
10 ms
DC
-1
10
※ Notes :
o
1. TC = 25 C
1.2
0.9
0.6
0.3
o
2. TJ = 150 C
3. Single Pulse
-2
10
0
1
10
2
10
0.0
25
3
10
10
50
75
100
125
TC, Case Temperature [℃]
VDS, Drain-Source Voltage [V]
Figure 9. Maximum Safe Operating Area
ZJC(t), Thermal Response [oC/W]
ID, Drain Current [A]
100 µs
10µs
Figure 10. Maximum Drain Current
vs. Case Temperature
D = 0 .5
10
※ N o te s :
1 . Z θ J C ( t) = 4 .1 7 ℃ /W M a x .
2 . D u ty F a c to r , D = t 1 /t 2
3 . T J M - T C = P D M * Z θ J C ( t)
0
0 .2
0 .1
0 .0 5
10
PDM
0 .0 2
0 .0 1
-1
t1
s i n g l e p u ls e
10
-5
10
-4
10
t2
-3
10
-2
10
-1
10
0
t1 , R e c t a n g u l a r P u l s e D u r a t i o n [ s e c ]
Figure 11. Transient Thermal Response Curve
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4
10
1
150
FQU2N50B — N-Channel QFET® MOSFET
!
FQU2N50B — N-Channel QFET® MOSFET
50KΩ
200nF
12V
VGS
Same Type
as DUT
Qg
10V
300nF
VDS
VGS
Qgs
Qgd
DUT
IG = const.
3mA
Charge
Figure 12. Gate Charge Test Circuit & Waveform
VDS
RG
RL
VDS
90%
VDD
VGS
VGS
DUT
V
10V
GS
10%
td(on)
tr
td(off)
t on
t off
tf
Figure 13. Resistive Switching Test Circuit & Waveforms
VDS
BVDSS
1
EAS = ---- L IAS2 -------------------2
BVDSS - VDD
L
BVDSS
IAS
ID
RG
V
10V
GS
GS
VDD
DUT
ID (t)
VDS (t)
VDD
tp
tp
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
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5
Time
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
I SD
( DUT )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VSD
VDD
Body Diode
Forward Voltage Drop
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
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6
FQU2N50B — N-Channel QFET® MOSFET
DUT
FQU2N50B — N-Channel QFET® MOSFET
Mechanical Dimensions
Figure 16. TO-251 (I-PAK), Molded, 3-Lead, Option AA
Package drawings are provided as a service to customers considering ON Semiconductor components. Drawings may change in
any manner without notice. Please note the revision and/or date on the drawing and contact a ON Semiconductor representative to
verify or obtain the most recent revision. Package specifications do not expand the terms of ON Semiconductor’s worldwide
terms and conditions, specif-ically the warranty therein, which covers ON Semiconductor products.
www.onsemi.com
7
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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