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Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON
Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA
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May 1998
NDS9945
Dual N-Channel Enhancement Mode Field Effect Transistor
General Description
Features
SO-8 N-Channel enhancement mode power field effect
transistors are produced using Fairchild's proprietary, high
cell density, DMOS technology. This very high density
process is especially tailored to provide superior switching
performance and minimize on-state resistance. These
devices are particularly suited for low voltage applications
such as disk drive motor control, battery powered circuits
where fast switching, low in-line power loss, and resistance
to transients are needed.
SuperSOTTM-6
SOT-23
SuperSOTTM-8
D2
D1
D2
D1
S
ND 45
99
S2
SO-8
pin 1
S1
Absolute Maximum Ratings
G2
G1
3.5 A, 60 V. RDS(ON) = 0.100 Ω @ VGS = 10 V,
RDS(ON) = 0.200 Ω @ VGS = 4.5 V.
High density cell design for extremely low RDS(ON).
High power and current handling capability in a widely
used surface mount package.
Dual MOSFET in surface mount package.
SO-8
5
4
6
3
7
2
8
1
TA = 25oC unless other wise noted
Symbol
Parameter
VDSS
Drain-Source Voltage
VGSS
Gate-Source Voltage
ID
Drain Current - Continuous
- Pulsed
10
PD
Power Dissipation for Dual Operation
2
Power Dissipation for Single Operation
TJ,TSTG
SOIC-16
SOT-223
(Note 1a)
(Note 1a)
NDS9945
Units
60
V
±20
V
3.5
A
1.6
(Note 1b)
1
(Note 1c)
0.9
Operating and Storage Temperature Range
W
-55 to 150
°C
THERMAL CHARACTERISTICS
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1a)
78
°C/W
RθJC
Thermal Resistance, Junction-to-Case
(Note 1)
40
°C/W
© 1998 Fairchild Semiconductor Corporation
NDS9945 Rev.B
Electrical Characteristics (TA = 25 OC unless otherwise noted )
Symbol
Parameter
Conditions
Min
Typ
Max
Units
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, I D = 250 µA
60
V
∆BVDSS/∆TJ
Breakdown Voltage Temp. Coefficient
ID = 250 µA, Referenced to 25 C
IDSS
Zero Gate Voltage Drain Current
VDS = 48 V, VGS = 0 V
IGSSF
Gate - Body Leakage, Forward
VGS = 20 V, VDS = 0 V
100
nA
IGSSR
Gate - Body Leakage, Reverse
VGS = -20 V, VDS= 0 V
-100
nA
1.7
3
V
0.076
0.1
0.124
0.18
0.103
0.2
0.166
0.3
ON CHARACTERISTICS
o
mV/ oC
60
1
µA
(Note 2)
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250 µA
RDS(ON)
Static Drain-Source On-Resistance
VGS = 10 V, I D = 3.5 A
1
TJ =125°C
0.7
TJ =125°C
VGS = 4.5 V, I D = 2.5 A
TJ =125°C
2.2
10
Ω
ID(ON)
On-State Drain Current
VGS = 10 V, VDS = 10 V
A
gFS
Forward Transconductance
VDS = 10 V, I D = 3.5 A
5.3
S
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
345
pF
110
pF
25
pF
DYNAMIC CH ARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS
(Note 2)
tD(on)
Turn - On Delay Time
VDS = 30 V, I D = 1 A
tr
Turn - On Rise Time
VGS = 10 V , RGEN = 6 Ω
tD(off)
tf
5
25
7.5
30
Turn - Off Delay Time
20
50
Turn - Off Fall Time
7
40
30
nC
1.3
A
Qg
Total Gate Charge
VDS = 30 V, I D = 3.5 A,
12.9
Qgs
Gate-Source Charge
VGS = 10 V
1.7
Qgd
Gate-Drain Charge
ns
3.2
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
IS
Maximum Continuous Drain-Source Diode Forward Current
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, I S = 1.3 A
trr
Reverse Recovery Time
Irr
Reverse Recovery Current
VGS = 0 V, IF = 1.3 A,
dIF/dt = 100 A/µs
(Note 2)
0.8
1.2
V
40
ns
1.5
A
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by
design while RθCA is determined by the user's board design.
a. 78OC/W on a 0.5 in2
pad of 2oz copper.
b. 125OC/W on a 0.02 in2
pad of 2oz copper.
c. 135OC/W on a 0.003 in2
pad of 2oz copper.
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
NDS9945 Rev.B
Typical Electrical Characteristics
6.0V
5.0V
15
R DS(ON), NORMALIZED
ID , DRAIN-SOURCE CURRENT (A)
VGS = 10V
4.5V
4.0V
10
3.5V
5
3.0V
0
DRAIN-SOURCE ON-RESISTANCE
2.5
20
2
3.5 V
1.75
4.0 V
1.5
1
2
V
DS
3
4
5
2
10
I D = 2A
R DS(ON) , ON-RESISTANCE (OHM)
1.2
1
0.8
0.6
-25
0
25
50
75
100
T , JUNCTION TEMPERATURE (°C)
125
0.3
0.2
T A =125°C
0.1
TA =25°C
0
150
2
4
V
I S , REVERSE DRAIN CURRENT (A)
6
4
2
2
2.5
3
3.5
4
VGS , GATE TO SOURCE VOLTAGE (V)
Figure 5 . Transfer Characteristics.
10
10
TJ = -55°C
25°C
125°C
8
8
, GATE TO SOURCE VOLTAGE (V)
Figure 4. On Resistance Variation with
Gate-to-Source Voltage.
10
VDS = 5V
6
GS
Figure 3. On-Resistance Variation With
Temperature.
1.5
8
0.4
I D = 3.5A
V GS = 10V
1.4
1
6
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.6
0
4
I D , DRAIN CURRENT (A)
J
ID , DRAIN CURRENT (A)
R DS(ON) , NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
0
, DRAIN-SOURCE VOLTAGE (V)
2
0.4
-50
10V
1
Figure 1. On-Region Characteristics.
1.8
4.5 V
5.0V
6.0V
1.25
0.75
0
V GS = 3.0V
2.25
4.5
5
VGS = 0V
5
TJ = 125°C
3
2
25°C
1
-55°C
0.5
0.3
0.2
0.1
0.4
0.6
0.8
1
1.2
VSD , BODY DIODE FORWARD VOLTAGE (V)
Figure 6. Body Diode Forward Voltage
Variation with Source Current
and Temperature.
NDS9945 Rev.B
Typical Electrical Characteristics (continued)
1000
I D = 3.5A
VDS = 10V
400
30V
8
CAPACITANCE (pF)
VGS , GATE-SOURCE VOLTAGE (V)
10
40V
6
4
2
Ciss
200
Coss
100
50
Crss
f = 1 MHz
VGS = 0 V
20
10
0.1
0
0
2
4
6
8
10
12
14
0.3
3
10
20
50
Figure 8. Capacitance Characteristics.
Figure 7. Gate Charge Characteristics.
50
30
100
us
1m
s
IT
IM
)L
ON
S(
D
R
3
10m
s
10
0m
s
1
1s
10s
DC
0.3
VGS =10V
SINGLE PULSE
RθJA = 135°C/W
A
TA = 25°C
0.1
0.03
0.01
0.1
0.2
0.5
SINGLE PULSE
RθJA =135°C/W
TA = 25°C
40
POWER (W)
10
30
20
10
1
2
5
10
20
50
0
0.001
100
0.01
0.1
1
10
100
300
SINGLE PULSE TIME (SEC)
V DS , DRAIN-SOURCE VOLTAGE (V)
Figure 9. Maximum Safe Operating Area.
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
ID , DRAIN CURRENT (A)
1
VDS , DRAIN TO SOURCE VOLTAGE (V)
Q g , GATE CHARGE (nC)
Figure 10. Single Pulse Maximum Power
Dissipation.
1
0.5
0.2
0.1
0.05
0.02
D = 0.5
R θJA (t) = r(t) * R θJA
R θJA = 135 °C/W
0.2
0.1
0.05
P(pk)
0.02
0.01
0.01
t1
Single Pulse
Duty Cycle, D = t1 /t2
0.002
0.001
0.0001
t2
TJ - TA = P * RθJA (t)
0.005
0.001
0.01
0.1
1
10
100
300
t1 , TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
NDS9945 Rev.B
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
HiSeC™
ISOPLANAR™
MICROWIRE™
POP™
PowerTrench
QFET™
QS™
Quiet Series™
SuperSOT™-3
SuperSOT™-6
ACEx™
Bottomless™
CoolFET™
CROSSVOLT™
E2CMOSTM
FACT™
FACT Quiet Series™
FAST
FASTr™
GTO™
SuperSOT™-8
SyncFET™
TinyLogic™
UHC™
VCX™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
2. A critical component is any component of a life
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. E
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
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