NLAS324
Dual SPST Analog Switch,
Low Voltage, Single Supply
The NLAS324 is a dual SPST (Single Pole, Single Throw) switch,
similar to 1/2 a standard 4066. The device permits the independent
s e l e c t i o n o f 2 a n a l o g / d i g i t a l s i g n a l s . Av a i l a b l e i n t h e
Ultra−Small 8 package.
The use of advanced 0.6 CMOS process, improves the RON
resistance considerably compared to older higher voltage
technologies.
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MARKING
DIAGRAM
8
Features
•
•
•
•
•
•
•
•
•
•
•
On Resistance is 20 Typical at 5.0 V
Matching is t Between Sections
2 − 6 V Operating Range
Ultra Low t 5 pC Charge Injection
Ultra Low Leakage t 1 nA at 5.0 V, 25°C
Wide Bandwidth u 200 MHz, −3 dB
2000 V ESD (HBM)
Ron Flatness $ 6 at 5.0 V
Negative Enable
Switches are Independent
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
NC1
1
8
VCC
COM1
2
7
IN1
IN2
3
6
COM2
GND
4
5
NC2
US8
US SUFFIX
CASE 493
8
1
A7 M G
G
1
A7
= Device Code
M
= Date Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
PIN ASSIGNMENT
1
NC1
2
COM1
3
IN2
4
GND
5
NC2
6
COM2
7
IN1
8
VCC
FUNCTION TABLE
Figure 1. Pinout
On/Off
Enable Input
State of
Analog Switch
L
H
On
Off
ORDERING INFORMATION
Device
Package
Shipping†
NLAS324USG
US8
(Pb−Free)
3,000 / Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 2015
July, 2015 − Rev. 8
1
Publication Order Number:
NLAS324/D
NLAS324
MAXIMUM RATINGS
Symbol
Value
Unit
DC Supply Voltage
*0.5 to )7.0
V
VI
DC Input Voltage
*0.5 to )7.0
V
VO
DC Output Voltage
*0.5 to )7.0
V
IIK
DC Input Diode Current
VI < GND
*50
mA
IOK
DC Output Diode Current
VO < GND
*50
mA
VCC
Parameter
IO
DC Output Sink Current
$50
mA
ICC
DC Supply Current per Supply Pin
$100
mA
IGND
DC Ground Current per Ground Pin
$100
mA
TSTG
Storage Temperature Range
*65 to )150
_C
260
_C
)150
_C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
TJ
Junction Temperature under Bias
JA
Thermal Resistance (Note 1)
250
_C/W
PD
Power Dissipation in Still Air at 85_C
250
mW
MSL
Moisture Sensitivity
FR
Level 1
Flammability Rating Oxygen Index: 28 to 34
VESD
ESD Withstand Voltage
UL 94 V−0 @ 0.125 in
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
> 2000
> 150
N/A
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
Min
Max
Unit
2.0
5.5
V
Digital Input Voltage (Enable)
GND
5.5
V
VIO
Static or Dynamic Voltage Across an Off Switch
GND
VCC
V
VIS
Analog Input Voltage (NO, COM)
GND
VCC
V
TA
Operating Temperature Range, All Package Types
−55
+125
°C
tr, tf
Input Rise or Fall Time,
(Enable Input)
0
0
100
20
ns/V
VCC
Positive DC Supply Voltage
VIN
Vcc = 3.3 V + 0.3 V
Vcc = 5.0 V + 0.5 V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
90
419,300
47.9
100
178,700
20.4
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
140
8,900
1.0
TJ = 80_C
117.8
TJ = 90_C
1,032,200
TJ = 100_C
80
TJ = 110_C
Time, Years
TJ = 120_C
Time, Hours
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
TJ = 130_C
Junction
Temperature 5C
NORMALIZED FAILURE RATE
DEVICE JUNCTION TEMPERATURE VERSUS TIME
TO 0.1% BOND FAILURES
1
1
10
100
1000
TIME, YEARS
Figure 2. Failure Rate vs. Time Junction Temperature
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2
NLAS324
DC CHARACTERISTICS − Digital Section (Voltages Referenced to GND)
Guaranteed Max Limit
Symbol
Parameter
VIH
Condition
VCC
−55 to 255C
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