NLSF3T125
Quad Bus Buffer
with 3−State Control Inputs
The NLSF3T125 is a high speed CMOS quad bus buffer fabricated
with silicon gate CMOS technology. It achieves high speed operation
similar to equivalent Bipolar Schottky TTL while maintaining CMOS
low power dissipation.
The NLSF3T125 requires the 3−state control input (OE) to be set
High to place the output into the high impedance state.
The T125 inputs are compatible with TTL levels. This device can be
used as a level converter for interfacing 3.3 V to 5.0 V, because it has
full 5.0 V CMOS level output swings.
The NLSF3T125 input structures provide protection when voltages
between 0 V and 5.5 V are applied, regardless of the supply voltage.
The output structures also provide protection when VCC = 0 V. These
input and output structures help prevent device destruction caused by
supply voltage − input/output voltage mismatch, battery backup, hot
insertion, etc.
The internal circuit is composed of three stages, including a buffer
output which provides high noise immunity and stable output. The
inputs tolerate voltages up to 7.0 V, allowing the interface of 5.0 V
systems to 3.0 V systems.
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1
QFN−16
CASE 485G
MARKING DIAGRAM
ÇÇÇ
ÇÇÇ
16
1
NLSF
T125
ALYW G
G
Features
•
•
•
•
•
•
•
•
•
•
•
•
High Speed: tPD = 3.8 ns (Typ) at VCC = 5.0 V
Low Power Dissipation: ICC = 4.0 mA (Max) at TA = 25°C
TTL−Compatible Inputs: VIL = 0.8 V; VIH = 2.0 V
Power Down Protection Provided on Inputs
Balanced Propagation Delays
Designed for 2.0 V to 5.5 V Operating Range
Low Noise: VOLP = 0.8 V (Max)
Pin and Function Compatible with Other Standard Logic Families
Latchup Performance Exceeds 300 mA
ESD Performance: Human Body Model; > 2000 V,
Machine Model; > 200 V
Chip Complexity: 72 FETs or 18 Equivalent Gates
Pb−Free Package is Available*
FUNCTION TABLE
Output
A
OE
Y
H
L
X
L
L
H
H
L
Z
ORDERING INFORMATION
Device
NLSF3T125MNR2
NLSF3T125MNR2G
Package
Shipping†
QFN−16
3000/Tape & Reel
QFN−16 3000/Tape & Reel
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
NLSF3T125
Inputs
A = Assembly Location
L = Wafer Lot
Y = Year
W = Work Week
G = Pb−Free Package
(Note: Microdot may be in either location)
.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2006
May, 2006 − Rev. 4
1
Publication Order Number:
NLSF3T125/D
NLSF3T125
Active−Low Output Enables
16
A1
1
Y1
15
OE1
5
4
A2
Y2
3
OE2
7
8
A3
Y3
9
OE3
10
12
A4
Y4
13
OE4
Figure 1. Logic Diagram
OE1 VCC
A1
16
15
14
OE4
Exposed Pad (EP)
13
Y1
1
12
A4
NC
2
11
NC
OE2
3
10
Y4
A2
4
9
5
6
Y2
7
GND Y3
OE3
8
A3
Figure 2. QFN − 16 Pinout (Top View)
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MAXIMUM RATINGS
Parameter
Symbol
Value
Unit
DC Supply Voltage
VCC
– 0.5 to + 7.0
V
DC Input Voltage
Vin
– 0.5 to + 7.0
V
Vout
– 0.5 to + 7.0
– 0.5 to VCC + 0.5
V
Input Diode Current
IIK
− 20
mA
Output Diode Current (VOUT < GND; VOUT > VCC)
IOK
± 20
mA
DC Output Current, per Pin
Iout
± 25
mA
DC Supply Current, VCC and GND Pins
ICC
± 75
mA
Power Dissipation in Still Air
PD
500
mW
Tstg
– 65 to + 150
°C
DC Output Voltage
Storage Temperature
Output in 3−State
High or Low State
QFN Packages
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress
ratings only. Functional operation above the Recommended Operating Conditions is not implied.
Extended exposure to stresses above the Recommended Operating Conditions may affect device
reliability.
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2
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or V CC ).
Unused outputs must be left open.
NLSF3T125
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RECOMMENDED OPERATING CONDITIONS
Symbol
Min
Max
Unit
DC Supply Voltage
Parameter
VCC
2.0
5.5
V
DC Input Voltage
Vin
0
5.5
V
Vout
0
0
5.5
VCC
V
TA
− 40
+ 85
°C
tr, tf
0
20
ns/V
DC Output Voltage
Output in 3−State
High or Low State
Operating Temperature
VCC = 5.0 V ±0.5 V
Input Rise and Fall Time
DC ELECTRICAL CHARACTERISTICS
Parameter
Test Conditions
Symbol
Minimum
High−Level
Input Voltage
2.3 V ± 0.3 V
3.3 V ± 0.3 V
5.0 V ± 0.5 V
VIH
Maximum
Low−Level
Input Voltage
2.3 V ± 0.3 V
3.3 V ± 0.3 V
5.0 V ± 0.5 V
VIL
Minimum
High−Level
Output Voltage
VIN = VIH or VIL
VOL @ IOL, 50 mA
VIN = VIH or VIL
IOH = − 50 mA
VOH
Maximum
Low−Level
Output Voltage
VIN = VIH or VIL
VIN = VIH or VIL
IOH = − 2.0 mA
IOH = − 4.0 mA
IOH = − 8.0 mA
VOL @ IOL, 50 mA
VIN = VIH or VIL
IOL = 50 mA
VOL
VIN = VIH or VIL
IOL = 2.0 mA
IOL = 4.0 mA
IOL = 8.0 mA
VCC
(V)
TA ≤ 85°C
TA = 25°C
Min
Typ
Max
0.5 VCC
0.4 VCC
0.44 VCC
Min
0.5 VCC
0.4 VCC
0.44 VCC
0.3 VCC
0.18 VCC
0.18 VCC
2.0
3.0
4.5
1.9
2.9
4.4
2.0
3.0
4.5
1.82
2.58
3.94
Max
2.0
3.0
4.5
2.0
3.0
4.5
0.0
0.0
0.0
TA ≤ 125°C
Min
Max
0.5 VCC
0.4 VCC
0.44 VCC
0.3 VCC
0.18 VCC
0.18 VCC
V
0.3 VCC
0.18 VCC
0.18 VCC
1.9
2.9
4.4
1.9
2.9
4.4
1.72
2.48
3.80
1.60
2.34
3.66
Unit
V
V
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
2.0
3.0
4.5
0.36
0.36
0.36
0.44
0.44
0.44
0.52
0.52
0.52
V
Maximum
Input Leakage
Current
VIN = 5.5 V or GND
IIN
0
to
5.5
± 0.1
± 1.0
± 1.0
mA
Maximum
Quiescent
Supply Current
VIN = VCC or GND
ICC
5.5
2.0
20
40
mA
Quiescent
Supply
Current
Input: VIN = 3.4 V
ICCT
5.5
1.35
1.50
1.65
mA
Maximum
3−State
Leakage
Current
VIN = VIH or VIL
VOUT = VCC or GND
IOZ
5.5
±0.25
±2.5
±2.5
mA
Output
Leakage
Current
VOUT = 5.5 V
IOPD
0.0
0.5
5.0
10
mA
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3
NLSF3T125
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AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3.0 ns)
TA = ≤ 85°C
TA ≤ 125°C
Typ
Max
Min
Max
Min
Max
Unit
TA = 25°C
Test Conditions
Symbol
Min
VCC = 2.3 ± 0.3 V CL = 15 pF
tPLH,
tPHL
1.0
14.5
16.9
1.0
18.1
1.0
19.2
ns
1.0
1.0
5.6
8.1
8.0
11.5
1.0
1.0
9.5
13.0
1.0
1.0
12.0
16.0
ns
1.0
1.0
3.8
5.3
5.5
7.5
1.0
1.0
6.5
8.5
1.0
1.0
8.5
10.5
1.0
14.8
16.2
1.0
17.4
1.0
19.3
ns
1.0
1.0
5.4
7.9
8.0
11.5
1.0
1.0
9.5
13.0
1.0
1.0
11.5
15.0
ns
1.0
1.0
3.6
5.1
5.1
7.1
1.0
1.0
6.0
8.0
1.0
1.0
7.5
9.5
1.0
15.4
18.0
1.0
19.8
1.0
22.0
ns
1.0
9.5
13.2
1.0
15.0
1.0
18.0
ns
1.0
6.1
8.8
1.0
10.0
1.0
12.0
ns
ns
Parameter
Maximum Propagation Delay,
A to Y
VCC = 3.3 ± 0.3 V CL = 15 pF
CL = 50 pF
VCC = 5.0 ± 0.5 V CL = 15 pF
CL = 50 pF
Maximum Output
Enable TIme, OE to Y
VCC = 2.3 ± 0.3 V CL = 15 pF
VCC = 3.3 ± 0.3 V CL = 15 pF
RL = 1.0 kW
CL = 50 pF
tPZL,
tPZH
VCC = 5.0 ± 0.5 V CL = 15 pF
RL = 1.0 kW
CL = 50 pF
Maximum Output
Disable Time, OE to Y
VCC = 2.3 ± 0.3 V CL = 15 pF
VCC = 3.3 ± 0.3 V CL = 50 pF
RL = 1.0 kW
tPLZ,
tPHZ
VCC = 5.0 ± 0.5 V CL = 50 pF
RL = 1.0 kW
Output−to−Output Skew
VCC = 3.3 ± 0.3 V CL = 50 pF
(Note 1)
tOSLH,
tOSHL
VCC = 5.0 ± 0.5 V CL = 50 pF
(Note 1)
Maximum Input Capacitance
Cin
4
Maximum Three−State Output
Capacitance (Output in High
Impedance State)
Cout
6
1.5
1.5
2.0
1.0
1.0
1.5
10
10
10
pF
pF
Typical @ 25°C, VCC = 5.0V
Power Dissipation Capacitance (Note 2)
CPD
15
pF
1. Parameter guaranteed by design. tOSLH = |tPLHm − tPLHn|, tOSHL = |tPHLm − tPHLn|.
2. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.
Average operating current can be obtained by the equation: ICC(OPR) = CPD VCC fin + ICC / 4 (per buffer). CPD is used to determine the
no−load dynamic power consumption; PD = CPD VCC2 fin + ICC VCC.
NOISE CHARACTERISTICS (Input tr = tf = 3.0 ns, CL = 50 pF, VCC = 5.0 V)
TA = 25°C
Symbol
Typ
Max
Unit
Quiet Output Maximum Dynamic VOL
VOLP
0.3
0.8
V
Quiet Output Minimum Dynamic VOL
VOLV
− 0.3
− 0.8
V
Minimum High Level Dynamic Input Voltage
VIHD
3.5
V
Maximum Low Level Dynamic Input Voltage
VILD
1.5
V
Characteristic
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4
NLSF3T125
SWITCHING WAVEFORMS
OE
3.0V
1.5V
A
tPHL
tPLH
1.5V
Y
GND
tPZL
GND
Y
VOH
tPLZ
HIGH
IMPEDANCE
1.5V
tPZH
VOL
VOL + 0.3V
tPHZ
VOH − 0.3V
1.5V
Y
Figure 3.
HIGH
IMPEDANCE
Figure 4.
TEST POINT
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
3.0V
1.5V
DEVICE
UNDER
TEST
CL*
*Includes all probe and jig capacitance
OUTPUT
1 kW
CL *
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance
Figure 5. Test Circuit
Figure 6. Test Circuit
http://onsemi.com
5
NLSF3T125
PACKAGE DIMENSIONS
16 PIN QFN
CASE 485G−01
ISSUE C
PIN 1
LOCATION
ÇÇ
ÇÇ
ÇÇ
D
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.25 AND 0.30 MM FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
5. Lmax CONDITION CAN NOT VIOLATE 0.2 MM
MINIMUM SPACING BETWEEN LEAD TIP
AND FLAG
A
B
E
DIM
A
A1
A3
b
D
D2
E
E2
e
K
L
0.15 C
TOP VIEW
0.15 C
(A3)
0.10 C
A
16 X
0.08 C
SIDE VIEW
MILLIMETERS
MIN
MAX
0.80
1.00
0.00
0.05
0.20 REF
0.18
0.30
3.00 BSC
1.65
1.85
3.00 BSC
1.65
1.85
0.50 BSC
0.18 TYP
0.30
0.50
SEATING
PLANE
A1
C
D2
16X
e
L
5
NOTE 5
EXPOSED PAD
8
4
9
E2
16X
K
12
1
16
16X
13
b
0.10 C A B
0.05 C
e
BOTTOM VIEW
NOTE 3
ON Semiconductor and
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to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
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“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
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NLSF3T125/D