Si1972DH
Vishay Siliconix
Dual N-Channel 30 V (D-S) MOSFET
FEATURES
PRODUCT SUMMARY
RDS(on) ()
ID (A)a
0.190 at VGS = 10 V
1.3
0.344 at VGS = 4.5 V
1.3
VDS (V)
30
Qg (Typ.)
0.91 nC
• Compliant to RoHS Directive 2002/95/EC
APPLICATIONS
SOT-363
SC-70 (6-LEADS)
S1
1
• Halogen-free According to IEC 61249-2-21
Definition
• TrenchFET® Power MOSFET
• 100 % Rg Tested
• Load Switch for Portable Applications
6
D1
D1
G1
D2
5
2
3
4
G2
S2
CE
XX
D2
YY
Marking Code
Lot Traceability
and Date Code
G1
Part # Code
G2
Top View
Ordering Information:
Si1972DH-T1-E3 (Lead (Pb)-free)
Si1972DH-T1-GE3 (Lead (Pb)-free and Halogen-free)
S1
S2
N-Channel MOSFET
N-Channel MOSFET
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C, unless otherwise noted)
Parameter
Symbol
Limit
Drain-Source Voltage
VDS
30
Gate-Source Voltage
VGS
± 20
TC = 70 °C
TA = 25 °C
1.3a
ID
1.3a
TA = 70 °C
Pulsed Drain Current
TC = 25 °C
TA = 25 °C
4
1
IS
0.61c
TC = 25 °C
TC = 70 °C
Maximum Power Dissipation
TA = 25 °C
1.25
0.8
PD
Soldering Recommendations (Peak Temperature)
W
0.74b, c
0.47b, c
TA = 70 °C
Operating Junction and Storage Temperature Range
A
1.2
IDM
Continuous Source-Drain Diode Current
V
1.3a
TC = 25 °C
Continuous Drain Current (TJ = 150 °C)
Unit
TJ, Tstg
- 55 to 150
d, e
°C
260
THERMAL RESISTANCE RATINGS
Parameter
Symbol
Typical
Maximum
Maximum Junction-to-Ambientb, f
t5s
RthJA
130
170
Maximum Junction-to-Foot (Drain)
Steady State
RthJF
80
100
Unit
°C/W
Notes:
a. Package limited.
b. Surface mounted on 1" x 1" FR4 board.
c. t = 5 s.
d. Maximum under steady state conditions is 220 °C/W.
Document Number: 74398
S12-0335-Rev. C, 13-Feb-12
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This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Si1972DH
Vishay Siliconix
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Conditions
Min.
VDS
VGS = 0 V, ID = 250 µA
30
Typ.
Max.
Unit
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
VDS/TJ
ID = 250 µA
VGS(th) Temperature Coefficient
VGS(th)/TJ
Gate-Source Threshold Voltage
VGS(th)
VDS = VGS, ID = 250 µA
IGSS
Gate-Source Leakage
Zero Gate Voltage Drain Current
IDSS
On-State Drain Currenta
ID(on)
Drain-Source On-State Resistancea
Forward Transconductancea
RDS(on)
gfs
V
23.5
mV/°C
- 4.6
2.8
V
VDS = 0 V, VGS = ± 20 V
± 100
ns
VDS = 30 V, VGS = 0 V
1
VDS = 30 V, VGS = 0 V, TJ = 55 °C
10
VDS 5 V, VGS = 10 V
1.5
4
µA
A
VGS = 10 V, ID = 1.3 A
0.155
0.225
VGS = 4.5 V, ID = 0.29 A
0.278
0.340
VDS = 15 V, ID = 1.3 A
1.4
VDS = 15 V, VGS = 0 V, f = 1 MHz
18
VDS = 15 V, VGS = 10 V, ID = 1.3 A
1.85
2.8
0.91
1.4
S
Dynamicb
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Gate Resistance
Rg
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Turn-on Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
75
6
VDS = 15 V, VGS = 4.5 V, ID = 1.3 A
td(off)
0.51
f = 1 MHz
VDD = 15 V, RL = 12.5
ID 1.2 A, VGEN = 4.5 V, Rg = 1
0.9
4.5
9
15
25
50
75
7
15
tf
15
25
td(on)
5
10
10
15
10
15
6
12
tr
td(off)
nC
0.3
td(on)
tr
pF
VDD = 15 V, RL = 12.5
ID 1.2 A, VGEN = 10 V, Rg = 1
tr
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulse Diode Forward Current
ISM
Body Diode Voltage
VSD
TC = 25 °C
1
4
IS = 1.2 A, VGS = 0 V
0.85
1.2
A
V
Body Diode Reverse Recovery Time
trr
20
40
ns
Body Diode Reverse Recovery Charge
Qrr
18
36
nC
Reverse Recovery Fall Time
ta
Reverse Recovery Rise Time
tb
IF = 1.2 A, dI/dt = 100 A/µs, TJ = 25 °C
16
4
ns
Notes:
a. Pulse test; pulse width 300 µs, duty cycle 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 74398
S12-0335-Rev. C, 13-Feb-12
This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Si1972DH
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
4
1.0
VGS = 10 V thru 5 V
I D - Drain Current (A)
I D - Drain Current (A)
0.8
3
2
4V
TC = 125 °C
0.6
TC = 25 °C
0.4
TC = - 55 °C
1
0.2
3V
0
0.0
0.0
0.4
0.8
1.2
1.6
VDS - Drain-to-Source Voltage (V)
2.0
0
1
2
3
VGS - Gate-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
100
0.6
0.5
0.4
0.3
0.2
Ciss
80
VGS = 4.5 V
C - Capacitance (pF)
R DS(on) - On-Resistance (Ω)
4
VGS = 10 V
60
40
Coss
20
0.1
Crss
0
0.0
0
1
2
3
0
4
15
20
On-Resistance vs. Drain Current
Capacitance
25
30
1.8
RDS(on) - On-Resistance (Normalized)
I D = 1.3 A
VGS - Gate-to-Source Voltage (V)
10
VDS - Drain-to-Source Voltage (V)
10
8
6
VDS = 15 V
VDS = 24 V
4
2
0
0.0
5
ID - Drain Current (A)
0.5
1.0
1.5
Qg - Total Gate Charge (nC)
Gate Charge
Document Number: 74398
S12-0335-Rev. C, 13-Feb-12
2.0
VGS = 10 V and 4.5 V, I D = 1.3 A
1.6
1.4
1.2
1.0
0.8
0.6
- 50
- 25
0
25
50
75
100
TJ - Junction Temperature (°C)
125
150
On-Resistance vs. Junction Temperature
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This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Si1972DH
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
10
0.6
ID = 1.3 A
R DS(on) - On-Resistance (Ω)
I S - Source Current (A)
0.5
TJ = 150 °C
1
TJ = 25 °C
0.4
125 °C
0.3
0.2
25 °C
0.1
0.1
0.0
0
0.2
0.4
0.6
0.8
1.0
0
1.2
2
4
6
8
VSD - Source-to-Drain Voltage (V)
VGS - Gate-to-Source Voltage (V)
Forward Diode Voltage
On-Resistance vs. Gate-Source Voltage
2.6
10
5
2.5
4
2.4
Power (W)
VGS(th) (V)
2.3
2.2
ID = 250 µA
2.1
2.0
3
2
1.9
1.8
1
1.7
1.6
- 50
- 25
0
25
50
75
100
TJ - Temperature (°C)
125
150
0
0.01
0.1
1
10
100
600
Time (s)
Threshold Voltage
Single Pulse Power
10
Limited by R DS(on)*
I D - Drain Current (A)
100 µs
1
1 ms
10 ms
0.1
100 ms
TA = 25 °C
Single Pulse
BVDSS Limited
0.01
0.1
* VGS
1 s, 10 s
DC
1
10
100
VDS - Drain-to-Source Voltage (V)
minimum VGS at which RDS(on) is specified
Safe Operating Area, Junction-to-Ambient
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Document Number: 74398
S12-0335-Rev. C, 13-Feb-12
This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Si1972DH
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
2.4
1.4
1.2
Power Dissipation (W)
I D - Drain Current (A)
2.0
1.6
Package Limited
1.2
0.8
0.4
1.0
0.8
0.6
0.4
0.2
0.0
0.0
0
25
50
75
100
TC - Case Temperature (°C)
Current Derating*
125
150
25
50
75
100
125
150
T C - Case Temperature (°C)
Power Derating
* The power dissipation PD is based on TJ(max) = 150 °C, using junction-to-case thermal resistance, and is more useful in settling the upper
dissipation limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package
limit.
Document Number: 74398
S12-0335-Rev. C, 13-Feb-12
www.vishay.com
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This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Si1972DH
Vishay Siliconix
TYPICAL CHARACTERISTICS (25 °C, unless otherwiese noted)
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
Notes:
0.1
0.1
PDM
0.05
t1
t2
1. Duty Cycle, D =
0.02
t1
t2
2. Per Unit Base = RthJA = 170 °C/W
3. TJM - TA = PDMZthJA(t)
Single Pulse
0.01
10-4
4. Surface Mounted
10-3
10-2
10-1
1
Square Wave Pulse Duration (s)
10
100
600
Normalized Thermal Transient Impedance, Junction-to-Ambient
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10-4
10-3
10-2
10-1
1
10
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Foot
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?74398.
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Document Number: 74398
S12-0335-Rev. C, 13-Feb-12
This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Legal Disclaimer Notice
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Revision: 01-Jan-2022
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Document Number: 91000