GT20J101
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
GT20J101
High Power Switching Applications
•
Third-generation IGBT
•
Enhancement mode type
•
High speed: tf = 0.30 μs (max)
•
Low saturation voltage: VCE (sat) = 2.7 V (max)
Unit: mm
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Collector-emitter voltage
VCES
600
V
Gate-emitter voltage
VGES
±20
V
DC
IC
20
1 ms
ICP
40
PC
130
W
Tj
150
°C
JEDEC
―
Tstg
−55~150
°C
JEITA
―
Collector current
Collector power dissipation
(Tc = 25°C)
Junction temperature
Storage temperature range
A
Note: Using continuously under heavy loads (e.g. the application of high
TOSHIBA
2-16C1C
temperature/current/voltage and the significant change in
Weight: 4.6 g
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Marking
TOSHIBA
GT20J101
Part No. (or abbreviation code)
Lot No.
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
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2006-11-01
GT20J101
Electrical Characteristics (Ta = 25°C)
Characteristic
Symbol
Test Condition
Min
Typ.
Max
Unit
Gate leakage current
IGES
VGE = ±20 V, VCE = 0
⎯
⎯
±500
nA
Collector cut-off current
ICES
VCE = 600 V, VGE = 0
⎯
⎯
1.0
mA
VGE (OFF)
IC = 2 mA, VCE = 5 V
5.0
⎯
8.0
V
VCE (sat)
IC = 20 A, VGE = 15 V
⎯
2.1
2.7
V
VCE = 20 V, VGE = 0, f = 1 MHz
⎯
1450
⎯
pF
⎯
0.12
⎯
VCC = 300 V, IC = 20 A
⎯
0.40
⎯
VGG = ±15 V, RG = 56 Ω
⎯
0.15
0.30
⎯
0.50
⎯
⎯
⎯
0.96
Gate-emitter cut-off voltage
Collector-emitter saturation voltage
Input capacitance
Switching time
Cies
Rise time
tr
Turn-on time
ton
Fall time
tf
Turn-off time
toff
Thermal resistance
Inductive Load
(Note1)
⎯
Rth (j-c)
μs
°C/W
Note1: Switching time measurement circuit and input/output waveforms
VGE
GT20J301
90%
10%
0
−VGE
IC
L
RG
IC
VCC
90%
VCE
0
VCE
10%
10%
td (off)
90%
10%
td (on)
10%
tr
tf
toff
ton
Note2: Switching loss measurement waveforms
VGE
90%
10%
0
IC
0
VCE
10%
Eoff
Eon
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GT20J101
IC – VCE
VCE – VGE
50
20
20
Common emitter
15
VCE (V)
Common emitter
Tc = 25°C
13
30
Collector-emitter voltage
Collector current IC
(A)
40
12
20
10
0
VGE = 10 V
0
1
2
3
4
Collector-emitter voltage
Tc = −40°C
16
12
8
10
4
IC = 5 A
0
0
5
4
VCE (V)
8
VGE (V)
Common emitter
VCE (V)
Tc = 25°C
16
Collector-emitter voltage
VCE (V)
Collector-emitter voltage
20
20
Common emitter
12
8
10
20
40
IC = 5 A
4
0
4
8
12
Gate-emitter voltage
16
Tc = 125°C
16
12
8
20
4
IC = 5 A
4
8
12
Gate-emitter voltage
VGE (V)
IC – VGE
16
20
VGE (V)
VCE (sat) – Tc
4
Common emitter
Common emitter
Collector-emitter saturation voltage
VCE (sat) (V)
VCE = 5 V
40
30
20
25
10
Tc = 125°C
0
0
40
10
0
0
20
50
(A)
16
VCE – VGE
VCE – VGE
Collector current IC
12
Gate-emitter voltage
20
0
20 40
4
8
−40
12
Gate-emitter voltage
16
VGE = 15 V
3
30
2
VGE (V)
20
10
IC = 5 A
1
0
−60
20
40
−20
20
60
100
140
Case temperature Tc (°C)
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GT20J101
Switching time
Switching time
3
0.5
tr
0.3
0.1
1
0.5
0.3
ton
0.1
0.05
0.03
tr
0.05
10
30
100
Gate resistance
Switching time
1
toff, tf – RG
toff
tf
0.05
30
100
Gate resistance
Switching loss
1
300
RG
12
20
16
(A)
toff, tf – IC
0.3
0.1
0.03
4
Eon
0.3
100
8
Switching loss
10
RG
Common emitter
VCC = 300 V
VGG = ±15 V
RG = 56 Ω
: Tc = 25°C
: Tc = 125°C
(Ω)
Common emitter
VCC = 300 V
VGG = ±15 V
IC = 20 A
: Tc = 25°C
: Tc = 125°C
Note2
Gate resistance
tf
0.05
Eon, Eoff – RG
10
toff
0.5
12
Collector current IC
Eoff
0.1
1
1
0.01
0
1000
Switching loss
Eon, Eoff (mJ)
Switching time
0.1
3
8
3
0.3
10
4
Collector current IC
Common emitter
VCC = 300 V
VGG = ±15 V
IC = 20 A
: Tc = 25°C
: Tc = 125°C
10
0
(Ω)
0.5
0.03
3
Switching loss
RG
0.01
1000
Eon, Eoff (mJ)
Switching time toff, tf (μs)
3
300
Switching time toff, tf (μs)
0.03
3
ton, tr – IC
Common emitter
VCC = 300 V
VGG = ±15 V
RG = 56 Ω
: Tc = 25°C
: Tc = 125°C
ton
(μs)
1
ton, tr – RG
Common emitter
VCC = 300 V
VGG = ±15 V
IC = 20 A
: Tc = 25°C
: Tc = 125°C
Switching time ton, tr
Switching time ton, tr
(μs)
3
1
(Ω)
Eon
0.3
Eoff
0.1
0.03
0.01
1000
Eon, Eoff – IC
Common emitter
VCC = 300 V
VGG = ±15 V
RG = 56 Ω
: Tc = 25°C
: Tc = 125°C
Note2
3
0
4
8
12
Collector current IC
4
20
16
(A)
16
20
(A)
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GT20J101
C – VCE
VCE, VGE – QG
5000
500
3000
100
Coes
30
Common emitter
10
VGE = 0
f = 1 MHz
5
0.5
Cres
Tc = 25°C
1
3
10
30
100
Collector-emitter voltage
300
1000
RL = 15 Ω
Tc = 25°C
300
IC max (pulsed)*
4
100
20
VCE (V)
60
0
100
80
Reverse bias SOA
50
50 μs*
30
(A)
100 μs*
IC max
10 (continuous)
Collector current IC
(A)
40
Gate charge QG (nC)
10 ms*
30
Collector current IC
8
100
50
1 ms*
5
DC
operation
3
200
VCE = 100 V
200
Safe operating area
100
12
300
0
0
3000
16
VGE (V)
400
Gate-emitter voltage
300
Collector-emitter voltage
(pF)
VCE (V)
Cies
1000
Capacitance C
20
Common emitter
1
0.5 *: Single nonrepetitive
pulse Tc = 25°C
0.3 Curves must be derated
linearly with increase in
temperature.
0.1
1
3
10
30
10
5
3
1
0.5
Tj <
= 125°C
0.3
VGE = ±15 V
0.1
100
Collector-emitter voltage
300
1000
3000
RG = 56 Ω
1
3
10
30
100
Collector-emitter voltage
VCE (V)
300
1000
3000
VCE (V)
Rth (t) – tw
Transient thermal impedance
Rth (t) (°C/W)
10
10
10
10
10
10
10
2
1
0
−1
−2
−3
−4
10
Tc = 25°C
−5
10
−4
10
−3
10
−2
Pulse width
10
−1
tw
10
0
10
1
10
2
(s)
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GT20J101
RESTRICTIONS ON PRODUCT USE
20070701-EN
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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2006-11-01