TC74HC590AP

TC74HC590AP/AF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HC590AP,TC74HC590AF 8-Bit Binary Counter/Register with 3-State Outputs The TC74HC590A is a high speed CMOS 8-BIT COUNTER/REGISTER fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to epuivalent LSTTL while maintaining the CMOS low power dissipation. The internal counter counts on the positive going edge of Counter Clock (CCK) when Counter Clock Enable ( CCKEN ) is low. When Counter Clear ( CCLR ) is low, the internal counter is cleared asynchronously to the clock. Data in the internal counter are loaded into the register at positive going edge of Register Clock (RCK), and the register outputs are controlled by enable input ( G ). All inputs are equipped with protection circuits against static discharge or transient excess voltage. TC74HC590AP TC74HC590AF Features • • • • • High speed: fmax = 62 MHz (typ.) at VCC = 5 V Low power dissipation: ICC = 4 μA (max) at Ta = 25°C High noise immunity: VNIH = VNIL = 28% VCC (min) Output drive capability: 15 LSTTL loads for QA to QH 10 LSTTL loads for RCO Symmetrical output impedance: |IOH| = IOL = 6 mA (min) For QA to QH |IOH| = IOL = 4 mA (min) • • • For RCO ∼ Balanced propagation delays: tpLH − tpHL Wide operating voltage range: VCC (opr) = 2 to 6 V Pin and function compatible with 74LS590 Weight DIP16-P-300-2.54A SOP16-P-300-1.27A : 1.00 g (typ.) : 0.18 g (typ.) Pin Assignment 1 2007-10-01 TC74HC590AP/AF IEC Logic Symbol Block Diagram Truth Table Inputs G H L X X X X X X X X X X RCK X X CCLR X X X X L H H H CCKEN X X X X X L L H CCK X X X X X Function Q Outputs Disable Q Outputs Enable Counter Data is Stored into Register Register State is not Changed Counter Clear Advance One Count No Count X No Count X: Don’t care RCO = QA′ ⋅ QB′ ⋅ QC′ ⋅ QD′ ⋅ QE′ ⋅ QF′ ⋅ QG′ ⋅ QH′ (QA’ to QH’: internal outputs of the counter) 2 2007-10-01 TC74HC590AP/AF Timing Chart 3 2007-10-01 TC74HC590AP/AF Logic Diagram 4 2007-10-01 TC74HC590AP/AF Absolute Maximum Ratings (Note 1) Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current ( RCO ) Symbol VCC VIN VOUT IIK IOK Rating −0.5 to 7 −0.5 to VCC + 0.5 −0.5 to VCC + 0.5 ±20 ±20 ±25 ±35 ±75 Unit V V V mA mA (QA to QH) IOUT ICC PD Tstg mA mA mW °C DC VCC/ground current Power dissipation Storage temperature 500 (DIP) (Note 2)/180 (SOP) −65 to 150 Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be applied until 300 mW. Operating Ranges (Note) Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VCC VIN VOUT Topr Rating 2 to 6 0 to VCC 0 to VCC −40 to 85 Unit V V V °C 0 to 1000 (VCC = 2.0 V) Input rise and fall time tr, tf 0 to 500 (VCC = 4.5 V) 0 to 400 (VCC = 6.0 V) ns Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. 5 2007-10-01 TC74HC590AP/AF Electrical Characteristics DC Characteristics Test Condition Characteristics Symbol VCC (V) 2.0 High-level input voltage VIH ⎯ Ta = 25°C Min 1.50 3.15 4.20 ⎯ ⎯ ⎯ Ta = −40 to 85°C Max ⎯ ⎯ ⎯ Unit Typ. ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Min 1.50 3.15 4.20 ⎯ ⎯ ⎯ Max ⎯ ⎯ ⎯ 4.5 6.0 2.0 V 0.50 1.35 1.80 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ 0.50 1.35 1.80 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Low-level input voltage VIL ⎯ 4.5 6.0 2.0 V 1.9 4.4 5.9 4.18 5.68 4.18 5.68 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ 2.0 4.5 6.0 4.31 5.80 4.31 5.80 0.0 0.0 0.0 0.17 0.18 0.17 0.18 ⎯ ⎯ ⎯ 1.9 4.4 5.9 4.13 5.63 4.13 5.63 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ VIN = VIH or VIL High-level output voltage VOH IOH = −20 μA IOH = −4 mA IOH = −5.2 mA IOH = −6 mA IOH = −7.8 mA IOL = 20 μA IOL = 4 mA IOL = 5.2 mA IOL = 6 mA IOL = 7.8 mA 4.5 6.0 RCO QA to QH 4.5 6.0 4.5 6.0 2.0 V 0.1 0.1 0.1 0.26 0.26 0.26 0.26 ±0.5 ±0.1 0.1 0.1 0.1 0.33 0.33 0.33 0.33 ±5.0 ±1.0 μA μA μA VIN = VIH or VIL Low-level output voltage VOL 4.5 6.0 RCO QA to QH 4.5 6.0 4.5 6.0 6.0 6.0 6.0 V 3-state output off-state current Input leakage current Quiescent supply current IOZ IIN ICC VIN = VIH or VIL VOUT = VCC or GND VIN = VCC or GND VIN = VCC or GND 4.0 40.0 6 2007-10-01 TC74HC590AP/AF Timing Requirements (input: tr = tf = 6 ns) Characteristics Symbol Test Condition VCC (V) Minimum pulse width (CCK, RCK) tW (H) tW (L) 2.0 ⎯ Ta = 25°C Typ. ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Ta = −40 to 85°C Limit 95 19 16 95 19 16 125 25 21 250 50 43 0 0 0 95 19 16 5 26 31 Unit Limit 75 15 13 75 15 13 100 20 17 200 40 34 0 0 0 75 15 13 6 33 39 4.5 6.0 2.0 ns Minimum pulse width ( CCLR ) tW (L) ⎯ 4.5 6.0 2.0 ns Minimum set-up time ( CCKEN -CCK) ts ⎯ 4.5 6.0 2.0 ns Minimum set-up time (CCK-RCK) ts ⎯ 4.5 6.0 2.0 ns Minimum hold time th ⎯ 4.5 6.0 ns Minimum removal time ( CCLR ) 2.0 trem ⎯ 4.5 6.0 2.0 ns Clock frequency f ⎯ 4.5 6.0 MHz AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25°C, input: tr = tf = 6 ns) Characteristics Output transition time ( RCO ) Propagation delay time (CCK- RCO ) Propagation delay time ( CCLR - RCO ) Maximum clock frequency Symbol tTLH tTHL tpLH tpHL tpLH fmax Test Condition ⎯ Min ⎯ Typ. 4 Max 8 Unit ns ⎯ ⎯ 18 28 ns ⎯ ⎯ ⎯ 20 62 30 ⎯ ns MHz 32 7 2007-10-01 TC74HC590AP/AF AC Characteristics (input: tr = tf = 6 ns) Test Condition Characteristics Symbol CL (pF) ⎯ Ta = 25°C VCC (V) 2.0 50 4.5 6.0 2.0 Min ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Ta = −40 to 85°C Max 60 12 10 75 15 13 163 33 28 175 35 30 145 29 25 185 37 31 105 21 18 150 30 26 105 21 18 ⎯ ⎯ ⎯ Unit Typ. 25 7 6 30 8 7 75 22 17 78 23 18 62 19 15 78 24 19 43 14 12 58 19 16 33 16 12 12 51 80 5 34 Min ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Max 75 15 13 95 19 16 205 41 35 220 44 37 180 36 31 230 46 39 130 26 22 190 38 33 130 26 22 ⎯ ⎯ ⎯ Output transition time (Qn) tTLH tTHL ns Output transition time ( RCO ) Propagation delay time (CCK- RCO ) Propagation delay time ( CCLR - RCO ) tTLH tTHL ⎯ 50 4.5 6.0 2.0 ns tpLH tpHL ⎯ 50 4.5 6.0 2.0 ns tpLH ⎯ 50 4.5 6.0 2.0 ns 50 Propagation delay time (RCK-Qn) tpLH tpHL ⎯ 4.5 6.0 2.0 ns 150 4.5 6.0 2.0 50 Output enable time tpZL tpZH RL = 1 kΩ 150 4.5 6.0 2.0 4.5 6.0 ns Output disable time tpLZ tpHZ 2.0 RL = 1 kΩ 50 4.5 6.0 2.0 ns 6 30 35 ⎯ ⎯ 5 24 28 ⎯ ⎯ Maximum clock frequency Input capacitance Power dissipation capacitance fmax ⎯ 50 4.5 6.0 MHz CIN CPD (Note) ⎯ ⎯ 10 ⎯ 10 ⎯ pF pF Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC 8 2007-10-01 TC74HC590AP/AF Package Dimensions Weight: 1.00 g (typ.) 9 2007-10-01 TC74HC590AP/AF Package Dimensions Weight: 0.18 g (typ.) 10 2007-10-01 TC74HC590AP/AF RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN GENERAL • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 11 2007-10-01