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W29EE011P90Z

W29EE011P90Z

  • 厂商:

    WINBOND(华邦)

  • 封装:

    PLCC32

  • 描述:

    IC FLASH 1MBIT 90NS 32PLCC

  • 数据手册
  • 价格&库存
W29EE011P90Z 数据手册
W29EE011 128K × 8 CMOS FLASH MEMORY Table of Contents1. 2. 3. 4. 5. 6. 7. GENERAL DESCRIPTION ......................................................................................................... 3 FEATURES ................................................................................................................................. 3 PIN CONFIGURATIONS............................................................................................................. 4 BLOCK DIAGRAM ...................................................................................................................... 5 PIN DESCRIPTION..................................................................................................................... 5 FUNCTIONAL DESCRIPTION.................................................................................................... 6 6.1 Read Mode ..................................................................................................................... 6 6.2 Page Write Mode ............................................................................................................ 6 6.3 Software-protected Data Write ....................................................................................... 6 6.4 Hardware Data Protection .............................................................................................. 7 6.5 Data Polling (DQ7)-Write Status Detection .................................................................... 7 6.6 Toggle Bit (DQ6)-Write Status Detection........................................................................ 7 6.7 5-Volt-only Software Chip Erase..................................................................................... 7 6.8 Product Identification ...................................................................................................... 7 TABLE OF OPERATING MODES .............................................................................................. 8 7.1 Operating Mode Selection .............................................................................................. 8 7.2 Command Codes for Software Data Protection ............................................................. 8 7.2.1 7.3 Command Codes for Software Chip Erase .................................................................. 10 7.3.1 7.4 Software Product Identification Acquisition Flow ....................................................11 ELECTRICAL CHARACTERISTICS......................................................................................... 12 8.1 Absolute Maximum Ratings .......................................................................................... 12 8.2 DC Characteristics ........................................................................................................ 12 8.2.1 8.2.2 8.2.3 8.3 Operating Characteristics .......................................................................................12 Power-up Timing ....................................................................................................12 Capacitance............................................................................................................13 AC Characteristics ........................................................................................................ 13 8.3.1 8.3.2 8.3.3 8.3.4 8.3.5 9. Software Chip Erase Acquisition Flow....................................................................10 Command Codes for Product Identification.................................................................. 11 7.4.1 8. Software Data Protection Acquisition Flow ...............................................................9 AC Test Conditions.................................................................................................13 AC Test Load and Waveforms................................................................................13 Read Cycle Timing Parameters..............................................................................14 Byte/Page-write Cycle Timing Parameters .............................................................14 Data Polling and Toggle Bit Timing Parameters .....................................................15 TIMING WAVEFORMS ............................................................................................................. 16 9.1 Read Cycle Timing Diagram......................................................................................... 16 9.2 #WE Controlled Write Cycle Timing Diagram............................................................... 16 9.3 #CE Controlled Write Cycle Timing Diagram ............................................................... 17 -1- Publication Release Date: April 11, 2006 Revision A18 W29EE011 10. 11. 12. 13. Page Write Cycle Timing Diagram................................................................................ 17 9.4 9.5 #DATA Polling Timing Diagram .................................................................................... 18 9.6 Toggle Bit Timing Diagram ........................................................................................... 18 9.7 Page Write Timing Diagram Software Data Protection Mode ...................................... 19 9.8 Reset Software Data Protection Timing Diagram......................................................... 19 9.9 5 Volt-only Software Chip Erase Timing Diagram ........................................................ 20 ORDERING INFORMATION..................................................................................................... 21 HOW TO READ THE TOP MARKING...................................................................................... 22 PACKAGE DIMENSIONS ......................................................................................................... 23 12.1 32-pin P-DIP ................................................................................................................. 23 12.2 32-pin PLCC ................................................................................................................. 23 12.3 32-pin TSOP (8 x 20 mm)............................................................................................. 24 12.4 32-pin STSOP (8 x 14 mm) .......................................................................................... 24 VERSION HISTORY ................................................................................................................. 25 -2- W29EE011 1. GENERAL DESCRIPTION The W29EE011 is a 1-megabit, 5-volt only CMOS flash memory organized as 128K × 8 bits. The device can be programmed and erased in-system with a standard 5V power supply. A 12-volt VPP is not required. The unique cell architecture of the W29EE011 results in fast program/erase operations with extremely low current consumption (compared to other comparable 5-volt flash memory products). The device can also be programmed and erased using standard EPROM programmers. 2. FEATURES y y Single 5-volt program and erase operations Fast page-write operations − 128 bytes per page − Page program cycle: 10 mS (max.) − Effective byte-program cycle time: 39 µS − Optional software-protected data write y y y y y y Fast chip-erase operation: 50 mS Read access time: 90/150 nS Page program/erase cycles: 1K/10K Ten-year data retention Software and hardware data protection Low power consumption y y − Active current: 25 mA (typ.) − Standby current: 20 µA (typ.) Automatic program timing with internal VPP generation End of program detection y y y y − Toggle bit − Data polling Latched address and data TTL compatible I/O JEDEC standard byte-wide pinouts Available packages: 32-pin 600 mil DIP, 32-pin TSOP (8 x 20 mm), 32-pin STSOP (8 x 14 mm), 32-pin PLCC, and Lead-free 32-pin PLCC -3- Publication Release Date: April 11, 2006 Revision A18 W29EE011 3. PIN CONFIGURATIONS NC 1 32 V DD A16 2 31 #WE A15 3 30 NC A12 4 29 A14 A7 5 28 A13 A6 6 27 A8 A5 7 26 A9 A4 8 A3 32-pin DIP 25 A11 9 24 #OE A2 10 23 A10 A1 11 22 #CE A0 12 21 DQ7 DQ0 13 20 DQ6 DQ1 14 19 DQ5 DQ2 15 18 DQ4 GND 16 17 DQ3 A 1 2 A 1 5 A 1 6 N C V D D # W E N C 4 3 2 1 32 31 30 A7 5 29 A14 A6 6 28 A13 A5 7 27 A8 A4 8 A3 9 A2 A1 32-pin PLCC 26 A9 25 A11 10 24 #OE 11 23 A10 A0 12 22 #CE DQ0 13 21 DQ7 14 15 16 17 18 19 20 D Q 1 D Q 2 G N D D Q 3 D Q 4 D Q 5 D Q 6 A11 A9 A8 A13 A14 NC 1 2 6 27 #WE V DD NC A16 A15 A12 A7 A6 A5 A4 7 26 25 32 31 3 30 4 5 29 8 9 10 28 32-pin TSOP 11 12 24 23 22 21 20 13 14 19 15 18 17 16 -4- #OE A10 #CE DQ7 DQ6 DQ5 DQ4 DQ3 GND DQ2 DQ1 DQ0 A0 A1 A2 A3 W29EE011 4. BLOCK DIAGRAM VDD GND #CE #OE CONTROL OUTPUT BUFFER DECODER CORE ARRAY #WE DQ0 . . DQ7 A0 . . A16 5. PIN DESCRIPTION SYMBOL A0 − A16 DQ0 − DQ7 PIN NAME Address Inputs Data Inputs/Outputs #CE Chip Enable #OE Output Enable #WE Write Enable VDD Power Supply GND Ground NC No Connection -5- Publication Release Date: April 11, 2006 Revision A18 W29EE011 6. FUNCTIONAL DESCRIPTION 6.1 Read Mode The read operation of the W29EE011 is controlled by #CE and #OE, both of which have to be low for the host to obtain data from the outputs. #CE is used for device selection. When #CE is high, the chip is de-selected and only standby power will be consumed. #OE is the output control and is used to gate data from the output pins. The data bus is in high impedance state when either #CE or #OE is high. Refer to the timing waveforms for further details. 6.2 Page Write Mode The W29EE011 is programmed on a page basis. Every page contains 128 bytes of data. If a byte of data within a page is to be changed, data for the entire page must be loaded into the device. Any byte that is not loaded will be erased to "FFh" during programming of the page. The write operation is initiated by forcing #CE and #WE low and #OE high. The write procedure consists of two steps. Step 1 is the byte-load cycle, in which the host writes to the page buffer of the device. Step 2 is an internal programming cycle, during which the data in the page buffers are simultaneously written into the memory array for non-volatile storage. During the byte-load cycle, the addresses are latched by the falling edge of either #CE or #WE, whichever occurs last. The data are latched by the rising edge of either #CE or #WE, whichever occurs first. If the host loads a second byte into the page buffer within a byte-load cycle time (TBLC) of 200 µS, after the initial byte-load cycle, the W29EE011 will stay in the page load cycle. Additional bytes can then be loaded consecutively. The page load cycle will be terminated and the internal programming cycle will start if no additional byte is loaded into the page buffer within 300 µS (TBLCO) from the last byte-load cycle, i.e., there is no subsequent #WE high-to-low transition after the last rising edge of #WE. A7 to A16 specify the page address. All bytes that are loaded into the page buffer must have the same page address. A0 to A6 specify the byte address within the page. The bytes may be loaded in any order; sequential loading is not required. In the internal programming cycle, all data in the page buffers, i.e., 128 bytes of data, are written simultaneously into the memory array. Before the completion of the internal programming cycle, the host is free to perform other tasks such as fetching data from other locations in the system to prepare to write the next page. 6.3 Software-protected Data Write The device provides a JEDEC-approved optional software-protected data write. Once this scheme is enabled, any write operation requires a series of three-byte program commands (with specific data to a specific address) to be performed before the data load operation. The three-byte load command sequence begins the page load cycle, without which the write operation will not be activated. This write scheme provides optimal protection against inadvertent write cycles, such as cycles triggered by noise during system power-up and power-down. The W29EE011 is shipped with the software data protection enabled. To enable the software data protection scheme, perform the three-byte command cycle at the beginning of a page load cycle. The device will then enter the software data protection mode, and any subsequent write operation must be preceded by the three-byte program command cycle. Once enabled, the software data protection will remain enabled unless the disable commands are issued. A power transition will not reset the software data protection feature. To reset the device to unprotected mode, a six-byte command sequence is required. See Table 3 for specific codes and Figure 10 for the timing diagram. -6- W29EE011 6.4 Hardware Data Protection The integrity of the data stored in the W29EE011 is also hardware protected in the following ways: (1) Noise/Glitch Protection: A #WE pulse of less than 15 nS in duration will not initiate a write cycle. (2) VDD Power Up/Down Detection: The programming and read operation are inhibited when VDD is less than 3.8V. (3) Write Inhibit Mode: Forcing #OE low, #CE high, or #WE high will inhibit the write operation. This prevents inadvertent writes during power-up or power-down periods. 6.5 Data Polling (DQ7)-Write Status Detection The W29EE011 includes a data polling feature to indicate the end of a programming cycle. When the W29EE011 is in the internal programming cycle, any attempt to read DQ7 of the last byte loaded during the page/byte-load cycle will receive the complement of the true data. Once the programming cycle is completed. DQ7 will show the true data. 6.6 Toggle Bit (DQ6)-Write Status Detection In addition to data polling, the W29EE011 provides another method for determining the end of a program cycle. During the internal programming cycle, any consecutive attempts to read DQ6 will produce alternating 0's and 1's. When the programming cycle is completed, this toggling between 0's and 1's will stop. The device is then ready for the next operation. 6.7 5-Volt-only Software Chip Erase The chip-erase mode can be initiated by a six-byte command sequence. After the command loading cycles, the device enters the internal chip erase mode, which is automatically timed and will be completed in 50 mS. The host system is not required to provide any control or timing during this operation. 6.8 Product Identification The product ID operation outputs the manufacturer code and device code. Programming equipment automatically matches the device with its proper erase and programming algorithms. The manufacturer and device codes can be accessed by software or hardware operation. In the software access mode, a six-byte command sequence can be used to access the product ID. A read from address 0000H outputs the manufacturer code (DAh). A read from address 0001H outputs the device code (C1h). The product ID operation can be terminated by a three-byte command sequence. In the hardware access mode, access to the product ID is activated by forcing #CE and #OE low, #WE high, and raising A9 to 12 volts. Note: The hardware SID read function is not included in all parts; please refer to Ordering Information for details. -7- Publication Release Date: April 11, 2006 Revision A18 W29EE011 7. TABLE OF OPERATING MODES 7.1 Operating Mode Selection Operating Range = 0 to 70°C (Ambient Temperature), VDD = 5V ±10%, VSS = 0V, VHH = 12V MODE PINS #CE #OE #WE ADDRESS Read VIL VIL VIH AIN Dout Write VIL VIH VIL AIN Din Standby VIH X X X High Z X VIL X X High Z/DOUT X X VIH X High Z/DOUT X VIH X X High Z 5-Volt Software Chip Erase VIL VIH VIL AIN Product ID VIL VIL VIH A0 = VIL; A1 − A16 = VIL; Manufacturer Code DA (Hex) A9 = VHH VIL VIL VIH A0 = VIH; A1 − A16 = VIL; Device Code C1 (Hex) A9 = VHH Write Inhibit Output Disable 7.2 DQ. DIN Command Codes for Software Data Protection BYTE SEQUENCE TO ENABLE PROTECTION ADDRESS TO DISABLE PROTECTION DATA ADDRESS DATA AAH 5555H AAH 0 Write 5555H 1 Write 2AAAH 55H 2AAAH 55H 2 Write 5555H A0H 5555H 80H 3 Write - - 5555H AAH 4 Write - - 2AAAH 55H 5 Write - - 5555H 20H -8- W29EE011 7.2.1 Software Data Protection Acquisition Flow Software Data Protection Enable Flow (Optional page load operation) Software Data Protection Disable Flow Load data AA to address 5555 Load data AA to address 5555 Load data 55 to address 2AAA Load data 55 to address 2AAA Load data A0 to address 5555 Load data 80 to address 5555 Sequentially load up to 128 bytes of page data Load data AA to address 5555 Pause 10 mS Load data 55 to address 2AAA Exit Load data 20 to address 5555 Pause 10 mS Exit Notes for software program code: Data Format: DQ7 − DQ0 (Hex) Address Format: A14 − A0 (Hex) -9- Publication Release Date: April 11, 2006 Revision A18 W29EE011 7.3 Command Codes for Software Chip Erase BYTE SEQUENCE ADDRESS 0 Write 5555H AAH 1 Write 2AAAH 55H 2 Write 5555H 80H 3 Write 5555H AAH 4 Write 2AAAH 55H 5 Write 5555H 10H 7.3.1 Software Chip Erase Acquisition Flow Load data AA to address 5555 Load data 55 to address 2AAA Load data 80 to address 5555 Load data AA to address 5555 Load data 55 to address 2AAA Load data 10 to address 5555 Pause 50 mS Exit Notes for software chip erase: Data Format: DQ7 − DQ0 (Hex) Address Format: A14 − A0 (Hex) - 10 - DATA W29EE011 7.4 Command Codes for Product Identification BYTE SEQUENCE SOFTWARE PRODUCT IDENTIFICATION ENTRY ADDRESS 0 Write 1 Write 2 Write 3 Write 4 Write 5 Write DATA 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H 5555H 60H Pause 10 µS SOFTWARE PRODUCT IDENTIFICATION EXIT ADDRESS DATA 5555H 2AAAH 5555H - AAH 55H F0H Pause 10 µS 7.4.1 Software Product Identification Acquisition Flow Product Identification Entry(1) Product Identification Mode(2, 3) Product Identification Exit(1) Load data AA to address 5555 Load data 55 to address 2AAA Load data 80 to address 5555 Load data AA to address 5555 Read address = 0 data = DA Load data AA to address 5555 Load data 55 to address 2AAA Load data 55 to address 2AAA Load data FO to address 5555 Read address = 1 data = C1 m Pause 10 µS (4) Load data 60 to address 5555 Normal Mode Pause 10 µ S Notes for software product identification: (1) Data format: DQ7 − DQ0 (Hex); address format: A14 − A0 (Hex). (2) A1 − A16 = VIL; manufacture code is read for A0 = VIL; device code is read for A0 = VIH. (3) The device does not remain in identification mode if power down. (4) The device returns to standard operation mode. - 11 - Publication Release Date: April 11, 2006 Revision A18 W29EE011 8. ELECTRICAL CHARACTERISTICS 8.1 Absolute Maximum Ratings PARAMETER RATING UNIT -0.5 to +7.0 V 0 to +70 °C -65 to +150 °C D.C. Voltage on Any Pin to Ground Potential Except #OE -0.5 to VDD +1.0 V Transient Voltage (< 20 nS) on Any Pin to Ground Potential -1.0 to VDD +1.0 V -0.5 to 12.5 V Power Supply Voltage to GND Potential Operating Temperature Storage Temperature Voltage on #OE Pin to Ground Potential Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability of the device. 8.2 DC Characteristics 8.2.1 Operating Characteristics (VDD = 5.0V ±10%, GND = 0V, TA = 0 to 70° C) PARAMETER SYM. Power Supply Current ICC Standby VDD Current (TTL input) ISB1 TEST CONDITIONS LIMITS UNIT MIN. TYP. MAX. #CE = #OE = VIL, #WE = VIH, all I/Os open Address inputs = VIL/VIH, at f = 5 MHz - - 50 mA #CE = VIH, all I/Os open Other inputs = VIL/VIH - 2 3 mA Standby VDD Current (CMOS input) ISB2 #CE = VDD -0.3V, all I/Os open Other inputs = VDD -0.3V/GND - 20 100 µA Input Leakage Current ILI VIN = GND to VDD - - 1 µA Output Leakage Current ILO VIN = GND to VDD - - 10 µA Input Low Voltage VIL - -0.3 - 0.8 V Input High Voltage VIH - 2.0 - VDD +0.5 V Output Low Voltage VOL IOL = 2.1 mA - - 0.45 V Output High Voltage VOH IOH = -0.4 mA 2.4 - - V 8.2.2 Power-up Timing PARAMETER SYMBOL TYPICAL UNIT Power-up to Read Operation TPU.READ 100 µS Power-up to Write Operation TPU.WRITE 5 mS - 12 - W29EE011 8.2.3 Capacitance (VDD = 5.0V, TA = 25° C, f = 1 MHz) PARAMETER SYMBOL CONDITIONS MAX. UNIT I/O Pin Capacitance CI/O VI/O = 0V 12 pF Input Capacitance CIN VIN = 0V 6 pF 8.3 AC Characteristics 8.3.1 AC Test Conditions (VDD = 5V ±10%) PARAMETER CONDITIONS Input Pulse Levels 0V to 3V Input Rise/Fall Time < 5 nS Input/Output Timing Level 1.5V/1.5V Output Load 1 TTL Gate and CL = 30 pF for 70 nS and 100 pF for others. 8.3.2 AC Test Load and Waveforms +5V 1.8K ohm DOUT 100 pF for 90/120/150 nS 30 pF for 70 nS (Including Jig and Scope) 1.3K ohm Input Output 3V 1.5V 1.5V 0V Test Point Test Point - 13 - Publication Release Date: April 11, 2006 Revision A18 W29EE011 8.3.3 Read Cycle Timing Parameters (VDD = 5.0V ±10 %, VDD = 5.0 ±5 % for 70 nS, GND = 0V, TA = 0 to 70° C) PARAMETER SYMBOL W29EE011-90 W29EE011-15 MIN. MAX. MIN. MAX. UNIT Read Cycle Time TRC 90 - 150 - nS Chip Enable Access Time TCE - 90 - 150 nS Address Access Time TAA - 90 - 150 nS Output Enable Access Time TOE - 45 - 70 nS #CE Low to Active Output TCLZ 0 - 0 - nS #OE Low to Active Output TOLZ 0 - 0 - nS #CE High to High-Z Output TCHZ - 45 - 45 nS #OE High to High-Z Output TOHZ - 45 - 45 nS Output Hold from Address Change TOH 0 - 0 - nS 8.3.4 Byte/Page-write Cycle Timing Parameters PARAMETER SYMBOL MIN. TYP. MAX. UNIT Write Cycle (Erase and Program) TWC - - 10 mS Address Setup Time TAS 0 - - nS Address Hold Time TAH 50 - - nS #WE and #CE Setup Time TCS 0 - - nS #WE and #CE Hold Time TCH 0 - - nS #OE High Setup Time TOES 10 - - nS #OE High Hold Time TOEH 10 - - nS #CE Pulse Width TCP 70 - - nS #WE Pulse Width TWP 70 - - nS #WE High Width TWPH 150 - - nS Data Setup Time TDS 50 - - nS Data Hold Time TDH 10 - - nS Byte Load Cycle Time TBLC 0.22 - 200 µS Byte Load Cycle Time-out TBLCO 300 - - µS Note: All AC timing signals observe the following guidelines for determining setup and hold times: (a) High level signal's reference level is VIH and (b) low level signal's reference level is VIL. - 14 - W29EE011 8.3.5 Data Polling and Toggle Bit Timing Parameters PARAMETER SYM. W29EE011-90 W29EE011-15 MIN. MAX. MIN. MAX. UNIT #OE to Data Polling Output Delay TOEP - 45 - 70 nS #CE to Data Polling Output Delay TCEP - 90 - 150 nS #OE to Toggle Bit Output Delay TOET - 45 - 70 nS #CE to Toggle Bit Output Delay TCET - 90 - 150 nS - 15 - Publication Release Date: April 11, 2006 Revision A18 W29EE011 9. TIMING WAVEFORMS 9.1 Read Cycle Timing Diagram TRC Address A16-0 TCE #CE TOE #OE #WE T OHZ TOLZ VIH TCLZ DQ7-0 TOH TCHZ High-Z High-Z Data Valid Data Valid TAA 9.2 #WE Controlled Write Cycle Timing Diagram TBLCO TAS T WC TAH Address A16-0 #CE TCS TCH TOES T OEH #OE #WE TWP TWPH TDS DQ7-0 Data Valid TDH Internal write starts - 16 - W29EE011 9.3 #CE Controlled Write Cycle Timing Diagram TAS TBLCO T AH T WC Address A16-0 T CPH T CP #CE T OES T OEH #OE #WE T DS DQ7-0 High Z Data Valid T DH Internal Write Starts 9.4 Page Write Cycle Timing Diagram TWC Address A16-0 DQ7-0 #CE #OE TWP T WPH TBLCO TBLC #WE Byte 0 Byte 1 Byte 2 Byte N-1 Byte N Internal Write Start - 17 - Publication Release Date: April 11, 2006 Revision A18 W29EE011 9.5 #DATA Polling Timing Diagram Address A16-0 #WE TCEP #CE TOES TOEH #OE TOEP DQ7-0 X X X X TWC 9.6 Toggle Bit Timing Diagram Address A16-0 #WE #CE TOES TOEH #OE DQ6 TWC - 18 - W29EE011 9.7 Page Write Timing Diagram Software Data Protection Mode Address A16-0 DQ6 5555 2AAA 5555 AA TWC Byte/page load cycle starts Three-byte sequence for software data protection mode A0 55 #CE #OE TBLC TWP #WE TBLCO TWPH Byte N-1 Byte 0 SW2 SW1 SW0 Byte N (last byte) Internal write starts 9.8 Reset Software Data Protection Timing Diagram Six-byte sequence for resetting software data protection mode Address A16-0 DQ7-0 5555 2AAA 5555 55 80 AA 5555 AA TWC 2AAA 55 5555 20 #CE #OE TWP #WE TBLC TBLCO TWPH SW0 SW1 SW2 SW3 SW4 SW5 Internal programming starts - 19 - Publication Release Date: April 11, 2006 Revision A18 W29EE011 9.9 5 Volt-only Software Chip Erase Timing Diagram Six-byte code for 5V-only software chip erase Address A16-0 DQ7-0 5555 2AAA 5555 55 80 AA 5555 AA 2AAA 55 TWC 5555 10 #CE #OE TWP #WE TBLC TBLCO TWPH SW0 SW1 SW2 SW3 SW4 SW5 Internal programming starts - 20 - W29EE011 10. ORDERING INFORMATION PART NO. ACCESS TIME (NS) W29EE011-90 W29EE011-15 90 150 W29EE011T-90 90 W29EE011T-15 150 W29EE011Q-90 90 W29EE011Q-15 150 W29EE011P-90 W29EE011P-15 W29EE011-90B W29EE011-15B W29EE011T90B W29EE011T15B W29EE011Q90B W29EE011Q15B W29EE011P90B W29EE011P15B W29EE011-90N W29EE011-15N W29EE011P90N W29EE011P15N 90 150 90 150 90 150 90 150 90 150 90 150 90 150 W29EE011P90Z 90 W29EE011P15Z 150 W29EE011Q90Z 90 POWER STANDBY VDD SUPPLY CURRENT PACKAGE CURRENT MAX. (µA) MAX. (MA) 50 100 600 mil DIP 50 100 600 mil DIP TSOP 50 100 (8 x 20 mm) TSOP 50 100 (8 x 20 mm) STSOP 50 100 (8 x 14 mm) STSOP 50 100 (8 x 14 mm) 50 100 32-pin PLCC 50 100 32-pin PLCC 50 100 600 mil DIP 50 100 600 mil DIP 50 100 TSOP (8x20mm) 50 100 TSOP (8x20mm) 50 100 STSOP (8x14mm) 50 100 STSOP (8x14mm) 50 100 32-pin PLCC 50 100 32-pin PLCC 50 100 600 mil DIP 50 100 600 mil DIP 50 100 32-pin PLCC 50 100 32-pin PLCC Lead-free 32-pin 50 100 PLCC Lead-free 32-pin 50 100 PLCC 50 100 STSOP (8x14mm) CYCLING HARDWARE SID READ FUNCTION 1K 1K Y Y 1K Y 1K Y 1K Y 1K Y 1K 1K 10K 10K 10K 10K 10K 10K 10K 10K 1K 1K 1K 1K Y Y Y Y Y Y Y Y Y Y N N N N 1K Y 1K Y 10K Y Notes: 1. Winbond reserves the right to make changes to its products without prior notice. 2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in applications where personal injury might occur as a consequence of product failure. 3. In Hardware SID Read column: Y = with SID read function; N = without SID read function. - 21 - Publication Release Date: April 11, 2006 Revision A18 W29EE011 11. HOW TO READ THE TOP MARKING Example: The top marking of 32L-PLCC W29EE011P15N W29EE011P15N 2138977A-A12 149OBRA 1st line: winbond logo 2nd line: the part number: W29EE011P15N 3rd line: the lot number 4th line: the tracking code: 149 O B RA 149: Packages made in ’01, week 49 O: Assembly house ID: A means ASE, O means OSE, ...etc. B: IC revision; A means version A, B means version B, ...etc. RA: Process code - 22 - W29EE011 12. PACKAGE DIMENSIONS 12.1 32-pin P-DIP Symbol A A1 A2 B B1 c D E E1 e1 L D 17 32 E1 E A1 L Base Plane Seating Plane B e1 a B1 0.25 0.155 0.160 3.81 3.94 4.06 0.016 0.018 0.022 0.41 0.46 0.56 0.048 0.050 0.054 1.22 1.27 1.37 0.008 0.010 0.014 0.20 0.25 0.36 0.150 1.650 1.660 41.91 42.16 0.600 0.610 14.99 15.24 15.49 0.590 0.545 0.550 0.555 13.84 13.97 14.10 0.090 0.100 0.110 2.29 2.54 2.79 0.120 0.130 0.140 3.05 3.30 3.56 15 0 0.670 16.00 16.51 17.02 0 0.630 0.650 15 0.085 2.16 1.Dimensions D Max. & S include mold flash or tie bar burrs. 2.Dimension E1 does not include interlead flash. 3.Dimensions D & E1. include mold mismatch and are determined at the mold parting line. 4.Dimension B1 does not include dambar protrusion/intrusion. 5.Controlling dimension: Inches 6.General appearance spec. should be based on final visual inspection spec. c A A2 5.33 0.210 eA S Notes: 16 S Dimension in mm Min. Nom. Max. Min. Nom. Max. 0.010 a 1 Dimension in inches eA 12.2 32-pin PLCC Symbol HE E 4 1 32 30 5 29 GD D HD A A1 A2 b1 b c D E e GD GE HD HE L y θ Dimension in Inches Min. Nom. Max. Dimension in mm Min. Nom. 0.140 0.020 Max. 3.56 0.50 0.105 0.110 0.115 2.67 2.80 2.93 0.026 0.028 0.032 0.66 0.71 0.81 0.016 0.018 0.022 0.41 0.46 0.008 0.010 0.014 0.20 0.25 0.35 0.547 0.550 0.553 13.89 13.97 14.05 0.447 0.450 0.453 11.35 11.43 11.51 0.044 0.050 0.056 1.12 1.27 1.42 0.490 0.51 0.530 12.45 13.46 0.56 9.91 12.9 5 10.41 0.585 0.590 0.595 14.86 14.99 15.11 0.485 0.49 0 0.090 0.495 12.32 12.45 12.57 0.095 1.91 2.29 2.41 0.390 0.075 0.410 0.430 0.004 0 10 10.92 0.10 0 10 21 13 Notes: 14 1. Dimensions D & E do not include interlead flash. 2. Dimension b1 does not include dambar protrusion/intrusion. 3. Controlling dimension: Inches 4. General appearance spec. should be based on final visual inspection sepc. c 20 L A2 θ e b b1 Seating Plane GE A A1 y - 23 - Publication Release Date: April 11, 2006 Revision A18 W29EE011 Package Dimensions, continued 12.3 32-pin TSOP (8 x 20 mm) HD Dimension in Inches Dimension in mm Symbol D Nom. __ __ A c M Min. e E 0.10(0.004) b A1 0.002 A2 0.037 b __ __ Max. 1.20 0.039 0.041 0.95 1.00 1.05 0.007 0.008 0.009 0.17 0.20 0.23 c 0.005 0.006 0.007 0.12 0.15 0.17 D 0.720 0.724 0.728 18.30 18.40 18.50 E 0.311 0.315 0.319 7.90 8.00 8.10 HD 0.780 0.787 0.795 19.80 20.00 20.20 __ __ 0.024 0.40 __ __ __ L L __ Nom. __ 0.05 0.020 0.016 0.020 __ L θ 0.047 Min. 0.006 e A Max. 0.031 1 A2 Y 0.000 A1 θ 1 __ 0.004 0.00 5 1 3 0.15 __ 0.50 0.50 0.60 __ 0.80 __ 0.10 5 3 Y L1 Note: Controlling dimension: Millimeters 12.4 32-pin STSOP (8 x 14 mm) HD Dimension in Inches Dimension in mm D Symbol Min. Nom. Max. c A A1 A2 b c D E HD e L L1 Y θ e E b θ L L1 A1 A2 A - 24 - Y Min. Nom. Max. 0.047 0.002 1.20 0.006 0.05 0.15 0.035 0.040 0.041 0.95 1.00 1.05 0.007 0.009 0.010 0.17 0.22 0.27 0.004 ----- 0.008 0.10 ----- 0.21 0.488 12.40 0.315 8.00 0.551 14.00 0.020 0.020 0.024 0.50 0.028 0.50 0.031 0.000 0 3 0.60 0.70 0.80 0.004 0.00 5 0 0.10 3 5 W29EE011 13. VERSION HISTORY VERSION DATE PAGE A9 Feb. 1998 6 Add pause 10 mS 7 Add pause 50 mS 8 Correct the time 10 mS to 10 µS 1, 17 A10 Jun. 1998 1, 10, 11, 12, 17 A11 Aug. 1998 1, 2, 17, 19 A12 Jul. 1999 1, 17 1, 11, 12, 17 1, 17, 18 A13 Dec. 2000 4, 17 A14 Mar. 2001 1, 17, 18 A15 Feb. 19, 2002 DESCRIPTION Add cycing 100 item Add 70 nS bining Add TSOP package Change endurance cycles as 1K/10K Delete 70, 120 nS bining Delete SOP package Add in Hardware SID Read Function note Add in TSOP (8 x 14 mm) package 17 Correct Part No. in Ordering Information 4 Modify VDD Power Up/Down Detection in Hardware Data Protection 18 Add HOW TO READ THE TOP MARKING 1, 17, 20 Rename TSOP (8 x 14 mm) as STSOP (8 X 14 mm) A16 Feb. 17, 2004 1, 17 Add in Lead-free 32-pin PLCC package A17 April 15 ,2005 23 Add important notice A18 April 11, 2006 21 Add W29EE011Q90Z package - 25 - Publication Release Date: April 11, 2006 Revision A18 W29EE011 Important Notice Winbond products are not designed, intended, authorized or warranted for use as components in systems or equipment intended for surgical implantation, atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, or for other applications intended to support or sustain life. Further more, Winbond products are not intended for applications wherein failure of Winbond products could result or lead to a situation wherein personal injury, death or severe property or environmental damage could occur. Winbond customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Winbond for any damages resulting from such improper use or sales. Headquarters Winbond Electronics Corporation America Winbond Electronics (Shanghai) Ltd. No. 4, Creation Rd. III, Science-Based Industrial Park, Hsinchu, Taiwan TEL: 886-3-5770066 FAX: 886-3-5665577 http://www.winbond.com.tw/ 2727 North First Street, San Jose, CA 95134, U.S.A. TEL: 1-408-9436666 FAX: 1-408-5441798 27F, 2299 Yan An W. Rd. Shanghai, 200336 China TEL: 86-21-62365999 FAX: 86-21-62365998 Taipei Office Winbond Electronics Corporation Japan Winbond Electronics (H.K.) Ltd. 9F, No.480, Rueiguang Rd., Neihu District, Taipei, 114, Taiwan, R.O.C. TEL: 886-2-8177-7168 FAX: 886-2-8751-3579 7F Daini-ueno BLDG, 3-7-18 Shinyokohama Kohoku-ku, Yokohama, 222-0033 TEL: 81-45-4781881 FAX: 81-45-4781800 Unit 9-15, 22F, Millennium City, No. 378 Kwun Tong Rd., Kowloon, Hong Kong TEL: 852-27513100 FAX: 852-27552064 Please note that all data and specifications are subject to change without notice. All the trade marks of products and companies mentioned in this data sheet belong to their respective owners. - 26 -
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