0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
会员中心
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
SMA-004000-5BL4T2

SMA-004000-5BL4T2

  • 厂商:

    AKER(安碁)

  • 封装:

    SMD5032_4P

  • 描述:

    有源晶振 SMD5032_4P

  • 数据手册
  • 价格&库存
SMA-004000-5BL4T2 数据手册
Customer Name Customer P/N Frequency Aker Approved P/N Aker MPN Rev. : : : 4.000000 MHz : SMA-004000-5BL4T2 : SMA-004000-5BL4T2 :1 ISSUE DATE : Jan.25.2019 APPROVED CHECKED PREPARED Tin Kiku APPROVED BY CUSTOMER AKER TECHNOLOGY CO., LTD. ADDRESS : NO 11-3, Jianguo Rd., T.E.P.Z ,Tanzi Dist., Taichung City 427, Taiwan. TEL:886-4-25335978 FAX : 886-4-25336011 Web: www.aker.com.tw RoHS compliant CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 SHEET : 1 of 10 Tin REV . : 1 Kiku Rev. Date Reviser Revise contents 1 2019/1/25 Kiku Initial Released CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 Tin SHEET : 2 of 10 Kiku REV . : 1 SMD CRYSTAL OSCILLATOR 1 . ELECTRICAL CHARACTERISTICS Standard atmospheric conditions Unless otherwise specified , the standard range of atmospheric conditions for making measurement and tests are as follow : Ambient temperature : 25±5℃ Relative humidity : 40%~70% If there is any doubt about the results , measurement shall be made within the following limits : Ambient temperature : 25±3℃ Relative humidity : 40%~70% AKER Model : SMA-531 Cutting Model : AT CUT Parameters Nominal Frequency Frequency Stability Supply Voltage Output Load CMOS Aging Enable Control Operating Temperature Storage Temperature Range Output Voltage High Output Voltage Low Input Current Standby Current Rise Time Fall Time Symmetry (Duty ratio) Start-up Time Enable Voltage High Disable Voltage Low Output Enable Delay Time Output Disable Delay Time Electrical Spec Symbol Min. Notes Typ. Max. Units. 4.000000 MHz ± 50 ppm VDD 3.3 ± 10% V CL 15 pF ±3 ppm First Year Yes Pad 1 -40 25 85 ℃ -55 ~ 125 ℃ VoH 2.97 V VoL 0.33 V Icc 7 mA IsT 10 µA Tr 10 ns 10%~90%VDD Level Tf 10 ns 10%~90%VDD Level TH/T 40 ~ 60 % Tosc 10 ms Vhi 70%VDD V Vlo 30%VDD V T on 10 ms T off 200 ns *Please kindly be noted that AKER DO NOT guarantee parts quality which involves human security application.* CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 Tin SHEET : 3 of 10 Kiku REV . : 1 2 . C - MOS LOAD OUTPUT WAVEFORM Tr Tf VDD "1"Level 90% VDD "0"Level 50% VDD 10% VDD GND TW T 3 . C - MOS LOAD TEST CIRCUIT CMOS T.P. + A + #4 #3 #1 #2 + DC Power Supply V CL 0.01 µF ***Because SMA series has no by pass capacitor. So,we recommend our customer to use capacitor 0.01 µF in join Vcc and GND. CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 Tin SHEET : 4 of 10 Kiku REV . : 1 4 . MARKING : Voltage Note1 L 4.000 ● FREQUENCY AKER AA Year/Month Code:Please make refer to following tables. Production line code Pin1 AKER LOGO. 5 . DIMENSION : ( UNIT : mm ) METAL CAP CERAMIC BASE 3.2 ± 0.1 5.0 ± 0.1 MARKING 1.60 #2 #3 #1 #4 2.54 ± 0.20 #1 : E/D #4 : VDC #2 : GND #3 : OUTPUT Bottom 1.40 1.20 2.20 1.20 ± 0.20 1.0 (Ref.) 1.3MAX 2.54 (Recommended Land Pattern) CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 Tin SHEET : 5 of 10 Kiku REV . : 1 6 . STRUCTURE ILLUSTRATION A B D C E G N I K R A M F CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 Tin SHEET : 6 of 10 Kiku REV . : 1 7 . PACKING : TAPE SPECIFICATION ( Unit : mm ) OUTLINE DIMENSION ( Unit : mm ) CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : 8. COVER TAPE ADHESION STRENGTH: 9 . SOLDERING REFLOW PROFILE SMA-004000-5BL4T2 Tin SHEET : 7 of 10 Kiku REV . : 1 CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 Tin SHEET : 8 of 10 Kiku REV . : 1 10. PACKING : 185mm 183mm 36mm BOX = 1000 PCS / REEL Stuff 210mm 625mm 390mm SMD product packs 32 BOX = The outside box packs ( 1000 PCS * 32 BOX = 32000 PCS )(MAX) CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 Tin SHEET : 9 of 10 Kiku REV . : 1 11 . MECHANICAL PERFORMANCE TEST ITEMS TEST METHODS AND TEST CONDITION 11.1 Drop Test The specimen is measured for its frequency before the test. It is then dropped from a hight of 100 cm or more as a free fall object onto a hard wooden plate of 30mm or more in thickness. ( in accordance with JIS-C0044 ) 11.2 Vibration Test The specimen is measured for its frequency before the test. Most them into X,Y and Z axes, respectively, for the vibration test. Vibration condition: Frequency range ; 20~2000HZ Peak to peak amplitude : 1.52 mm Peak acceleration : 20G Sweep time : 20 minute / axis Pendicular total test time : 4 hours ( in accordance with MIL-STD-883F : 2007.3 ) The specimen is measured for its frequency before the test. Place the specimen on the belt of the converynace and let it pass through the reflow with the presetted temperature condition. After passing twice the reflow place,the specimen under the referee condition for -~2 hours and then measure its electrical performance. Temperature Condition of IR Simulation: The temperature range of the preheated section is setted at 150~180℃ for 60~120 sec. For the next section the temperature range is setted at 217~260℃ for 45~90 sec. and within this time range the specimen should be able to sustain at the peak temperature, 260+/-3℃ , for 10 sec long. ( in accordance with JESD22-B106-B ) Place the specimen in a pressurized container and pressurize it with the detection gas ( mixed gas consisting of 95% or more helium ) for at least 2 hours. Complete the measurement of the concentration of helium within 30 min after taking it out from the pressurized container. ( in accordance with MIL-STD-883F : 1014.11 ) The referee condition . Temperature 25 ± 2 ℃ Humidity 44 ~ 55 % Pressure 86 ~ 106 kPa 11.3 Resistance to Soldering Test 11.4 Fine Leak Test ( in accordance with MIL-STD-883E : 1014. 9 ) PERFORMANCE To satisfy the electrical performance . Less than 1.0 * 10 - 8 atm .c.c. / sec, Helium CUST. P/N Aker Approved P/N APPROVED PREPARED : : : : SMA-004000-5BL4T2 Tin SHEET : 10 of 10 Kiku REV . : 1 12 . CLIMATIC RESISTANCE TEST ITEMS 12.1 Low Temp Exposure Test TEST METHODS AND TEST CONDITION The specimen is measured for its frequency before the test . Place the specimen in the chamber and kept it at the temperature of - 40 ± 3℃ for 168 ± 6 hours . Take the specimen out of the chamber and measure itselectrical performance after leaving 1~2 hours under the referee condition. ( in accordance with JIS-C0020 ) 12.2 Aging Test The specimen is measured for its frequency before the test . Place the specimen in the testing chamber and keep it at the temperature of + 125 ± 3℃ for 720 ± 48 hours. And then take the specimen out of the chamber and measure its electrical performance after leaving for 1 ~ 2 hours under the referee condition . ( in accordance with JIS-C0021 ) 12.3 High Temperature & High Humidty The specimen is measured for its frequency before the test . Place the specimen in the testing chamber and kept it at the temperature of + 85 ± 5 ℃ and humidity of 85 ± 5 % for 168 ± 6 hours.and then take the specimen out and measure its electrical performance after leaving for 1~2 hours under the referee condition. ( in accordance with MIL-STD-883F : 1004.7 ) 12.4 Temperature Cycle Test The specimen is measured for its frequency before the test . Subject the specimen to the 100 cycles of temperature ranges stated below . High temp . + 125 ± 3 ℃ (15± 3 min). 2~3 min. 2~3 min. Low temp . -55 ±3 ℃ (15± 3 min). Measure its electrical performance after leaving it for 1 ~ 2 hours under the referee condition . ( in accordance with MIL-STD-883F : 1010.8 ) PERFORMANCE To satisfy the electrical performance .
SMA-004000-5BL4T2 价格&库存

很抱歉,暂时无法提供与“SMA-004000-5BL4T2”相匹配的价格&库存,您可以联系我们找货

免费人工找货