Freescale Semiconductor
Technical Data
Document Number: MRF6S20010N
Rev. 4, 1/2014
RF Power Field Effect Transistors
MRF6S20010NR1
MRF6S20010GNR1
N--Channel Enhancement--Mode Lateral MOSFETs
Designed for Class A or Class AB general purpose applications with
frequencies from 1600 to 2200 MHz. Suitable for analog and digital modulation
and multipurpose amplifier applications.
Typical Two--Tone Performance @ 2170 MHz: VDD = 28 Volts, IDQ =
130 mA, Pout = 10 Watts PEP
Power Gain — 15.5 dB
Drain Efficiency — 36%
IMD — --34 dBc
Typical 2--Carrier W--CDMA Performance: VDD = 28 Volts, IDQ = 130 mA,
Pout = 1 Watt Avg., Full Frequency Band (2130--2170 MHz), Channel
Bandwidth = 3.84 MHz. PAR = 8.5 dB @ 0.01% Probability
Power Gain — 15.5 dB
Drain Efficiency — 15%
IM3 @ 10 MHz Offset — --47 dBc in 3.84 MHz Channel Bandwidth
ACPR @ 5 MHz Offset — --49 dBc in 3.84 MHz Channel Bandwidth
Typical Single--Carrier N--CDMA Performance: VDD = 28 Volts, IDQ =
130 mA, Pout = 1 Watt Avg., Full Frequency Band (1930--1990 MHz),
IS--95 (Pilot, Sync, Paging, Traffic Codes 8 through 13), Channel
Bandwidth = 1.2288 MHz. PAR = 9.8 dB @ 0.01% Probability on CCDF.
Power Gain — 15.5 dB
Drain Efficiency — 16%
ACPR @ 885 kHz Offset = --60 dBc in 30 kHz Bandwidth
Typical GSM EDGE Performance: VDD = 28 Volts, IDQ = 130 mA, Pout =
4 Watts Avg., Full Frequency Band (1805--1880 MHz)
Power Gain — 16 dB
Drain Efficiency — 33%
EVM — 1.3% rms
Capable of Handling 5:1 VSWR, @ 28 Vdc, 2000 MHz, 10 Watts CW
Output Power
Features
Characterized with Series Equivalent Large--Signal Impedance Parameters
Internally Matched for Ease of Use
Qualified Up to a Maximum of 32 VDD Operation
Integrated ESD Protection
225C Capable Plastic Package
In Tape and Reel. R1 Suffix = 500 Units, 24 mm Tape Width, 13--inch Reel.
1600--2200 MHz, 10 W, 28 V
GSM, GSM EDGE
SINGLE N--CDMA
2 x W--CDMA
LATERAL N--CHANNEL
RF POWER MOSFETs
TO--270--2
PLASTIC
MRF6S20010NR1
TO--270G--2
PLASTIC
MRF6S20010GNR1
RFin/VGS 2
1 RFout/VDS
(Top View)
Note: The backside of the package is the
source terminal for the transistor.
Figure 1. Pin Connections
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain--Source Voltage
VDSS
--0.5, +68
Vdc
Gate--Source Voltage
VGS
--0.5, +12
Vdc
Storage Temperature Range
Tstg
--65 to +150
C
Case Operating Temperature
TC
150
C
Operating Junction Temperature (1,2)
TJ
225
C
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access
MTTF calculators by product.
Freescale Semiconductor, Inc., 2005--2006, 2008--2009, 2014. All rights reserved.
RF Device Data
Freescale Semiconductor
1
Table 2. Thermal Characteristics
Characteristic
Symbol
Thermal Resistance, Junction to Case
Case Temperature 78C, 1 W CW
Case Temperature 79C, 10 W PEP, Two--Tone Test
Value (1,2)
RJC
Unit
C/W
2.3
2.9
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22--A114)
1A
Machine Model (per EIA/JESD22--A115)
A
Charge Device Model (per JESD22--C101)
IV
Table 4. Moisture Sensitivity Level
Test Methodology
Per JESD22--A113, IPC/JEDEC J--STD--020
Rating
Package Peak Temperature
Unit
3
260
C
Table 5. Electrical Characteristics (TA = 25C unless otherwise noted)
Symbol
Min
Typ
Max
Unit
Zero Gate Voltage Drain Leakage Current
(VDS = 68 Vdc, VGS = 0 Vdc)
IDSS
—
—
10
Adc
Zero Gate Voltage Drain Leakage Current
(VDS = 28 Vdc, VGS = 0 Vdc)
IDSS
—
—
1
Adc
Gate--Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
IGSS
—
—
500
Adc
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 40 Adc)
VGS(th)
1.5
2.2
3.5
Vdc
Gate Quiescent Voltage
(VDD = 28 Vdc, ID = 130 mAdc, Measured in Functional Test)
VGS(Q)
2
2.8
4
Vdc
Drain--Source On--Voltage
(VGS = 10 Vdc, ID = 0.4 Adc)
VDS(on)
—
0.33
0.4
Vdc
Output Capacitance
(VDS = 28 Vdc 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss
—
20
—
pF
Reverse Transfer Capacitance
(VDS = 28 Vdc 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss
—
11.6
—
pF
Input Capacitance
(VDS = 28 Vdc, VGS = 0 Vdc 30 mV(rms)ac @ 1 MHz)
Ciss
—
120
—
pF
Characteristic
Off Characteristics
On Characteristics
Dynamic Characteristics (3)
Functional Tests (4) (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 130 mA, Pout = 10 W PEP, f1 = 2170 MHz,
f2 = 2170.1 MHz, Two--Tone Test
Power Gain
Gps
14
15.5
17
dB
Drain Efficiency
D
33
36
—
%
Intermodulation Distortion
IMD
—
--34
--28
dBc
Input Return Loss
IRL
—
--15
--9
dB
1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access
MTTF calculators by product.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955.
3. Part internally matched on input.
4. Measurements made with device in straight lead configuration before any lead forming operation is applied. Lead forming is used for gull
wing (GN) parts.
(continued)
MRF6S20010NR1 MRF6S20010GNR1
2
RF Device Data
Freescale Semiconductor
Table 5. Electrical Characteristics (TA = 25C unless otherwise noted) (continued)
Characteristic
Symbol
Min
Typ
Max
Unit
Typical 2--Carrier W--CDMA Performances (In Freescale CDMA Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 130 mA, Pout =
1 W Avg., f1 = 2112.5 MHz, f2 = 2122.5 MHz and f1 = 2157.5 MHz, f2 = 2167.5 MHz, 2--Carrier W--CDMA, 3.84 MHz Channel Bandwidth
Carriers. ACPR measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. IM3 measured in 3.84 MHz Bandwidth @ 10 MHz Offset.
PAR = 8.5 dB @ 0.01% Probability on CCDF.
Power Gain
Gps
—
15.5
—
dB
Drain Efficiency
D
—
15
—
%
Gain Flatness in 30 MHz Bandwidth @ Pout = 1 W CW
GF
—
0.3
—
dB
Intermodulation Distortion
IM3
—
--47
—
dBc
ACPR
—
--49
—
dBc
Adjacent Channel Power Ratio
Typical N--CDMA Performances (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 130 mA, Pout = 1 W Avg.,
1930 MHz