SMG2314NE
Elektronische Bauelemente 4 A, 20 V, RDS(ON) 32 m N-Channel Enhancement Mode Mos.FET
RoHS Compliant Product A suffix of “-C” specifies halogen and lead-free
DESCRIPTION
These miniature surface mount MOSFETs utilize High Cell Density process. Low RDS(on) assures minimal power loss and conserves energy, making this device ideal for use in power management circuitry. Typical applications are PWMDC-DC converters, power management in portable and battery-powered products such as computers, printers, battery charger, telecommunication power system, and telephones power system.
A
3
SC-59
L
3
Top View
1 2
CB
1 2
K
E D
FEATURES
Low RDS(on) provides higher efficiency and extends battery life. Miniature SC-59 surface mount package saves board space. High power and current handling capability. MLow side high current DC-DC Converter applications
F
G
H
J
REF. A B C D E F
PACKAGE INFORMATION
Package SC-59 MPQ 3K LeaderSize 7’ inch
Millimeter Min. Max. 2.70 3.10 2.25 3.00 1.30 1.70 1.00 1.40 1.70 2.30 0.35 0.50
REF. G H J K L
Millimeter Min. Max. 0.10 REF. 0.40 REF. 0.10 0.20 0.45 0.55 0.85 1.15
ESD Protection Diode 2KV
ABSOLUTE MAXIMUM RATINGS(TA=25°C UNLESS OTHERWISE NOTED)
Parameter
Drain-Source Voltage Gate-Source Voltage Continuous Drain Current 1 Pulsed Drain Current Continuous Source Current (Diode Conduction) 1 Power Dissipation 1 Operating Junction and Storage Temperature Range PD @ TA=25°C PD @ TA=70°C
2
Symbol VDS VGS
ID @ TA=25°C ID @ TA=70°C
ID IDM IS PD Tj, Tstg
Ratings Maximum 20 ±12 4.0 3.1 ±20 1.6 1.3 0.8 -55 ~ 150
Unit
V V A A A A W W °C
THERMAL RESISTANCE RATINGS Parameter
Maximum Junction to Ambient 1 Notes 1 2 Surface Mounted on 1” x 1” FR4 Board. Pulse width limited by maximum junction temperature.
Any changes of specification will not be informed individually.
Symbol
t ≦ 5 sec Steady State
Maximum 100 166
Unit
°C / W
RJA
http://www.SeCoSGmbH.com/
27-Jan-2011 Rev. A
Page 1 of 2
SMG2314NE
Elektronische Bauelemente 4 A, 20 V, RDS(ON) 32 m N-Channel Enhancement Mode Mos.FET
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified) Parameter
Gate-Threshold Voltage Gate-Body Leakage
Symbol Min.
VGS(th) IGSS 0.7 -
Typ. Max.
11.3 0.75 ±100 1
Unit
V nA
Test Conditions
VDS=VGS, ID= 250uA VDS= 0V, VGS= ±8V VDS= 16V, VGS= 0V
Zero Gate Voltage Drain Current
IDSS 10 32
uA VDS= 16V, VGS= 0V, TJ= 55°C A VDS = 5V, VGS= 4.5V VGS= 4.5V, ID= 4.6A mΩ 44 S V VGS= 2.5V, ID= 3.9A VDS= 10V, ID= 4.0A IS= 1.6A, VGS= 0V
On-State Drain Current 1
ID(on)
10 -
Drain-Source On-Resistance 1
RDS(ON)
Forward Transconductance 1 Diode Forward Voltage
gfs VSD
-
Dynamic 2
Total Gate Charge Gate-Source Charge Gate-Drain Charge Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Source-Ddrain Reverse Recovery Time
Notes 1 2 Pulse test:PW ≦ 300 us duty cycle ≦ 2%. Guaranteed by design, not subject to production testing.
Qg Qgs Qgd Td(on) Tr Td(off) Tf Trr
-
13.4 0.9 2.0 8 24 35 10 40
IF=1.6A, di/dt =100 A/uS nS VDD= 10V, VGEN= 4.5V, RL= 15, ID= 1A nC VDS= 10V, VGS= 4.5V, ID= 4.0A
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
27-Jan-2011 Rev. A
Page 2 of 2
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