EMIF06-HMC01F2
6-line IPAD™, EMI filter including ESD protection
Datasheet - production data
• Very thin package: 0.65 mm
• High efficiency in ESD suppression
• High reliability offered by monolithic integration
• High reducing of parasitic elements through
integration and wafer level packaging
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Complies with the following standards
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• IEC 61000-4-2 level 4 on external pins
– 15 kV (air discharge)
– 8 kV (contact discharge)
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Lead-free Flip-Chip package
(16 bumps)
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Application
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• MIL STD 883E - Method 3015-6 Class 3
Figure 1. Pin configuration (ball side) and
Basic cell configuration
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2
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R10
R11
R12
C
D
R13
bs
Vmmc
MMCclk
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R14
MMCcmd
MMCdat0
MMCdat1
MMCdat2
MMCdat3
Vmmc
R2
R3
R4
R5
R6
R7
cmd
dat1
dat2
dat3
• 6 lines low-pass-filter
• High efficiency in EMI filtering
• Very low PCB space consuming: < 4.4 mm2
This is information on a product in full production.
Table 1. Ball configuration
dat0
Features
March 2014
The EMIF06-HMC01F2 is a highly integrated
array designed to suppress EMI / RFI noise for
High Speed MultiMediaCard™ port filtering.
The EMIF06-HMC01F2 Flip-Chip packaging
means the package size is equal to the die size.
Additionally, this filter includes an ESD protection
circuitry which prevents the protected device from
destruction when subjected to ESD surges up to
15 kV.
clk
GND
• Lead-free package
• High Speed MultiMediaCard™
A1
cmd
C1
dat2
A2
clk
C2
gnd
A3
Vmmc/Vdd
C3
MMCdat1
A4
MMCclk
C4
MMCdat0
B1
dat1
D1
dat3
B2
dat0
D2
gnd
B3
gnd
D3
MMCdat3
B4
MMCcmd
D4
MMCdat2
TM: IPAD is a trademark of STMicroelectronics.
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Electrical characteristics
1
EMIF06-HMC01F2
Electrical characteristics
Table 2. Absolute maximum ratings (Tamb = 25 °C)
Symbol
VPP
Tj
Parameter and test conditions
Value
Unit
Internal pins (A4, B4, C3, C4, D3, D4):
ESD discharge IEC61000-4-2, air discharge
ESD discharge IEC61000-4-2, contact discharge
External pins (A1, A2, A3, B1, B2, C1, D1):
ESD discharge IEC61000-4-2, air discharge
ESD discharge IEC61000-4-2, contact discharge
15
8
Maximum junction temperature
125
°C
- 40 to + 85
°C
- 55 to + 150
°C
Top
Operating temperature range
Tstg
Storage temperature range
2
2
kV
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Figure 2. Electrical characteristics (definitions)
Symbol
VBR
VRM
IRM
Cline
Parameter
Breakdown voltage
Stand-off voltage
Leakage current @ VRM
Line capacitance
=
=
=
=
let
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VBR VRM
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I
V
IRM
IRM
IR
VRM
VBR
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Symbol
Test conditions
Tolerance
Min.
Typ.
Max.
Unit
VBR
IR = 1 mA
IRM
VRM = 3 V
0.1
µA
Cline
@0V
20
pF
14
V
R2,R3,R4,
I = 50 mA
R5, R6, R7
±20 %
50
Ω
R10, R11,
I = 50 µA
R12, R13
±30 %
75
kΩ
±30 %
7
kΩ
R14
2/8
Table 3. Electrical characteristics (Tamb = 25 °C)
I = 200 µA
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EMIF06-HMC01F2
Electrical characteristics
Figure 3. S21 (dB) attenuation measurement
Figure 4. Analog crosstalk measurements
0.00
0.00
dB
dB
- 10.00
- 10.00
- 20.00
- 30.00
- 20.00
- 40.00
- 30.00
- 50.00
- 60.00
- 40.00
- 70.00
- 50.00
- 80.00
100.0k
1.0M
10.0M
100.0M
1.0G
100.0k
f/Hz
1.0M
10.0M
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100.0M
f/Hz
1.0G
Figure 5. ESD response to IEC61000-4-2
Figure 6. ESD response to IEC61000-4-2
(+15 kV air discharge) on one input V(in) and on (-15 kV air discharge) on one input V(in) and on
one output (Vout)
one output (Vout)
Input
Input
10V/d
10V/d
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Output
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Output
10V/d
10V/d
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(s
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200ns/d
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200ns/d
Figure 7. Junction capacitance versus reverse voltage applied (typical values)
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Pr
CLINE (pF)
16
14
Vosc=30mV
F=1MHz
Ta=25 °C
12
10
8
6
4
2
0
0
1
2
3
4
5
VLINE (V)
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Aplac model
2
EMIF06-HMC01F2
Aplac model
Figure 8. Aplac model device structure
R10
R11
R12
Lbump Rbump
Vmmc_Vdd
R13
Cbump Rsub
A3
bulk
Vmmc_Vdd
R14
Lbump Rbump
R2
clk
MMCclk
MMCclk
MMCcmd
A4
cmd
bulk
Lbump
R4
MMCdat0
Rbump
MMCcmd
R5
MMCdat1
Rsub
bulk
dat1
cmd
dat2
bulk
R7
Rbump
MMCdat0
Cbump Rsub
MMCdat3
dat3
Rsub Cbump
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bulk
MMCdat1
bulk
dat1
Cbump Rsub
MODEL = demif06_gnd
C3
bulk
Lbump Rbump
Cbump Rsub
let
Rbump
bulk
Lbump Rbump
MMCdat3
bulk
b
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dat2
Rsub Cbump
B1
Rbump Lbump
Rsub Cbump
bulk
dat3
Rgnd
bulk
C1
Rbump Lbump
Rsub Cbump
D1
Cgnd
Variables
R2 50
od
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R3 50
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R4 50
R5 50
R6 50
R7 50
R10 75k
R11 75k
R12 75k
4/8
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Figure 9. Aplac model parameters
Variables
demif06_gnd
demif06
Cz 11pF
BV=14
BV=14
Cz_gnd 45pF
IBV=1m
IBV=1m
RS_gnd 480m
CJO=Cz_gnd
CJO=Cz
Ls 950pH
M=0.31
M=0.31
Rs 150m
RS=RS_gnd
RS=1
Rbump 100m
VJ=0.6
VJ=0.6
Lbump 50pH
TT=100n
TT=100n
Cbump 0.15pF
R13 75k
Lgnd 50pH
R14 7k
Rgnd 100m
Rsub 100m
Cgnd 0.15pF
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B2
Rbump Lbump
bulk
Lgnd
so
Cbump Rsub
D3
P
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Lbump
MMCdat2
D4
A1
uc
MODEL = demif06
bulk
Lbump Rbump
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Cbump
Rbump Lbump
dat0
MODEL = demif06
C4
A2
Rsub
MMCdat2
Cbump
Rbump Lbump
R6
B4
Rbump Lbump
bulk
dat0
Cbump Rsub
Lbump
clk
R3
Cbump Rsub
EMIF06-HMC01F2
3
Ordering information scheme
Ordering information scheme
Figure 10. Ordering information scheme
EMIF
yy
-
xxx zz
Fx
EMI Filter
Number of lines
Information
x = resistance value (Ohms)
z = capacitance value / 10(pF)
or
3 letters = application
2 digits = version
Package
F = flip chip
x = 2: lead free pitch = 500 µm, bump = 315 µm
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Package information
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In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
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315 µm ± 50
1.89 mm ± 50 µm
650 µm ± 65
195 µm
1.89 mm ± 50 µm
195 µm
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500 µm ± 10
500 µm ± 10
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Figure 11. Package dimensions
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Package information
EMIF06-HMC01F2
Figure 12. Footprint
Figure 13. Marking
Dot, ST logo
xx = marking
z = packaging location
yww = datecode
(y = year
ww = week)
Copper pad Diameter :
250 µm recommended , 300 µm max
E
Solder stencil opening : 330 µm
x x z
y ww
Solder mask opening recommendation :
340 µm min for 315 µm copper pad diameter
Figure 14. Flip chip tape and reel specification
Dot identifying Pin A1 location
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3.5 +/- 0.1
STE
xxx
yww
4 +/- 0.1
User direction of unreeling
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2.06
xxx
yww
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STE
STE
xxx
yww
8 +/- 0.3
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All dimensions in mm
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1.75 +/- 0.1
2.06
0.73 +/- 0.05
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Ø 1.5 +/- 0.1
4 +/- 0.1
EMIF06-HMC01F2
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Ordering information
Ordering information
Table 4. Ordering information
Note:
Order code
Marking
Package
Weight
Base qty
Delivery mode
EMIF06-HMC01F2
GH
Flip chip
5.3 mg
5000
Tape and reel 7”
6
More informations are available in the application notes:
AN1235:"Flip chip: Package description and recommendations for use"
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Revision history
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Table 5. Document revision history
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Date
Revision
Changes
25-Jan-2005
1
Initial release.
27-Nov-2007
2
Updated ECOPACK statement. Updated Figure 10, Figure 11,
Figure 12, Figure 13 and Figure 14. Reformatted to current
standards.
17-Mar-2014
3
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Updated die size in Figure 11.
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