25LC512
512 Kbit SPI Bus Serial EEPROM
Device Selection Table
Part Number
VCC Range
Page Size
Temp. Ranges
Packages
25LC512
2.5-5.5V
128 Byte
I,E
P, SN, SM, MF
Features
Description
• 20 MHz max. Clock Speed
• Byte and Page-level Write Operations:
- 128-byte page
- 5 ms max.
- No page or sector erase required
• Low-Power CMOS Technology:
- Max. Write Current: 5 mA at 5.5V, 20 MHz
- Read Current: 10 mA at 5.5V, 20 MHz
- Standby Current: 1A at 2.5V (Deep powerdown)
• Electronic Signature for Device ID
• Self-Timed Erase and Write cycles:
- Page Erase (5 ms, typical)
- Sector Erase (10 ms/sector, typical)
- Bulk Erase (10 ms, typical)
• Sector Write Protection (16K byte/sector):
- Protect none, 1/4, 1/2 or all of array
• Built-In Write Protection:
- Power-on/off data protection circuitry
- Write enable latch
- Write-protect pin
• High Reliability:
- Endurance: 1 Million erase/write cycles
- Data Retention: >200 years
- ESD Protection: >4000V
• Temperature Ranges Supported:
- Industrial (I):
-40C to +85C
- Extended (E):
-40°C to +125°C
The Microchip Technology Inc. 25LC512 is a 512 Kbit
serial EEPROM memory with byte-level and page-level
serial EEPROM functions. It also features Page, Sector
and Chip erase functions typically associated with
Flash-based products. These functions are not required
for byte or page write operations. The memory is
accessed via a simple Serial Peripheral Interface (SPI)
compatible serial bus. The bus signals required are a
clock input (SCK) plus separate data in (SI) and data out
(SO) lines. Access to the device is controlled by a Chip
Select (CS) input.
Packages
• 8-Lead DFN-S, 8-Lead PDIP, 8-Lead SOIC and
8-Lead SOIJ
Package Types (not to scale)
DFN-S
PDIP/SOIC/SOIJ
(MF)
SO 2
WP 3
VSS 4
(P, SN, SM)
8
VCC
7
HOLD
6
5
CS
SO
1
2
SCK
WP
3
SI
VSS
4
25LC512
CS 1
25LC512
• RoHS Compliant
• Automotive AEC-Q100 Qualified
Communication to the device can be paused via the
hold pin (HOLD). While the device is paused, transitions on its inputs will be ignored, with the exception of
Chip Select, allowing the host to service higher priority
interrupts.
8
7
VCC
HOLD
6
SCK
5
SI
Pin Function Table
Name
Function
CS
SO
Chip Select Input
Serial Data Output
WP
VSS
SI
SCK
Write-Protect
Ground
Serial Data Input
Serial Clock Input
HOLD
VCC
Hold Input
Supply Voltage
2007-2021 Microchip Technology Inc.
DS20002065D-page 1
25LC512
1.0
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings (†)
VCC.............................................................................................................................................................................6.5V
All inputs and outputs w.r.t. VSS ..........................................................................................................-0.6V to VCC +1.0V
Storage temperature ................................................................................................................................. -65°C to 150°C
Ambient temperature under bias............................................................................................................... -40°C to 125°C
ESD protection on all pins.......................................................................................................................................... 4 kV
† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
TABLE 1-1:
DC CHARACTERISTICS
DC CHARACTERISTICS
Param.
No.
D001
Sym.
Characteristic
Electrical Characteristics:
Industrial (I):
TA = -40°C to +85°C
Extended (E):
TA = -40°C to +125°C
Min.
Max.
Units
VCC = 2.5V to 5.5V
VCC = 2.5V to 5.5V
Test Conditions
VIH1
High-level input
voltage
0.7 x VCC
VCC + 1
V
Low-level input
voltage
-0.3
0.3 x VCC
V
VCC2.7V
-0.3
0.2 x VCC
V
VCC < 2.7V
D002
VIL1
D003
VIL2
D004
VOL
Low-level output
voltage
—
0.4
V
IOL = 2.1 mA
D005
VOH
High-level output
voltage
VCC - 0.2
—
V
IOH = -400 A
D006
ILI
Input leakage current
—
±1
A
CS = VCC, VIN = VSS or VCC
D007
ILO
Output leakage
current
—
±1
A
CS = VCC, VOUT = VSS or VCC
D008
CINT
Internal capacitance
(all inputs and
outputs)
—
7
pF
TA = 25°C, CLK = 1.0 MHz,
VCC = 5.0V (Note)
D009
ICC Read
—
10
mA
—
5
mA
VCC = 5.5V; FCLK = 20.0 MHz;
SO = Open
VCC = 2.5V; FCLK = 10.0 MHz;
SO = Open
—
—
7
5
mA
mA
VCC = 5.5V
VCC = 2.5V
—
20
A
—
10
A
CS = VCC = 5.5V, Inputs tied to VCC or
VSS, 125°C
CS = VCC = 5.5V, Inputs tied to VCC or
VSS, 85°C
—
2
A
—
1
A
Operating current
D010
ICC Write
D011
ICCS
Standby current
D012
Note:
ICCSPD
Deep power-down
current
CS = VCC = 2.5V, Inputs tied to VCC or
VSS, 125°C
CS = VCC = 2.5V, Inputs tied to VCC or
VSS, 85°C
This parameter is periodically sampled and not 100% tested.
2007-2021 Microchip Technology Inc.
DS20002065D-page 2
25LC512
TABLE 1-2:
AC CHARACTERISTICS
Electrical Characteristics:
Industrial (I):
TA = -40°C to +85°C
Extended (E):
TA = -40°C to +125°C
AC CHARACTERISTICS
Param.
No.
Sym.
Characteristic
Min.
Max.
Units
VCC = 2.5V to 5.5V
VCC = 2.5V to 5.5V
Conditions
1
FCLK
Clock frequency
—
—
20
10
MHz
MHz
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
2
TCSS
CS setup time
25
50
—
—
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
3
TCSH
CS hold time
50
100
—
—
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
4
TCSD
CS disable time
50
—
ns
—
5
Tsu
Data setup time
5
10
—
—
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
6
THD
Data hold time
10
20
—
—
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
(Note 1)
7
TR
CLK rise time
—
20
ns
8
TF
CLK fall time
—
20
ns
(Note 1)
9
THI
Clock high time
25
50
—
—
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
10
TLO
Clock low time
25
50
—
—
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
—
ns
—
11
TCLD
Clock delay time
50
12
TCLE
Clock enable time
50
—
ns
—
13
TV
Output valid from clock low
—
—
25
50
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
14
THO
Output hold time
0
—
ns
(Note 1)
15
TDIS
Output disable time
—
—
25
50
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
16
THS
HOLD setup time
10
20
—
—
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
17
THH
HOLD hold time
10
20
—
—
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
18
THZ
HOLD low to output
High-Z
—
—
15
30
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
(Note 1)
19
THV
HOLD high to output valid
—
—
15
30
ns
ns
4.5V VCC 5.5V (I)
2.5V VCC 5.5V (I, E)
20
TREL
CS High to Standby mode
—
100
s
—
21
TPD
CS High to Deep powerdown
—
100
s
—
22
TCE
Chip erase cycle time
—
10
ms
—
23
TSE
Sector erase cycle time
—
10
ms
—
24
TWC
Internal write cycle time
—
5
ms
Byte or Page mode and Page
Erase
25
—
Endurance
1M
—
E/W Page mode, 25°C, 5.5V (Note 2)
Cycles
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but established by characterization and qualification.
2007-2021 Microchip Technology Inc.
DS20002065D-page 3
25LC512
TABLE 1-3:
AC TEST CONDITIONS
AC Waveform:
VLO = 0.2V
—
VH I = VCC - 0.2V
(Note 1)
VH I = 4.0V
(Note 2)
CL = 30 pF
—
Timing Measurement Reference Level
Input
0.5 VCC
Output
0.5 VCC
Note 1: For VCC 4.0V
2: For VCC > 4.0V
2007-2021 Microchip Technology Inc.
DS20002065D-page 4
25LC512
FIGURE 1-1:
HOLD TIMING
CS
16
17
16
17
16
17
16
17
SCK
18
n
n+1
SO
High-Impedance
Don’t Care
SI
19
n-1
High-Impedance
19
n-2
Don’t Care
5
n
n+1
18
n
n-1
n
n-2
HOLD
FIGURE 1-2:
SERIAL INPUT TIMING
4
CS
2
7
Mode 1,1
3
8
12
11
SCK Mode 0,0
5
SI
6
MSB in
LSB in
High-Impedance
SO
FIGURE 1-3:
SERIAL OUTPUT TIMING
CS
9
3
10
Mode 1,1
SCK
Mode 0,0
13
SO
14
MSB out
SI
2007-2021 Microchip Technology Inc.
15
LSB out
Don’t Care
DS20002065D-page 5
25LC512
2.0
PIN DESCRIPTIONS
The descriptions of the pins are listed in Table 2-1.
TABLE 2-1:
PIN FUNCTION TABLE
Name
8-Lead DFN-S(1)
8-Lead PDIP
8-Lead SOIC
8-Lead SOIJ
Function
CS
1
1
1
1
Chip Select Input
SO
2
2
2
2
Serial Data Output
WP
3
3
3
3
Write-Protect Pin
VSS
4
4
4
4
Ground
SI
5
5
5
5
Serial Data Input
SCK
6
6
6
6
Serial Clock Input
HOLD
7
7
7
7
Hold Input
VCC
8
8
8
8
Supply Voltage
Note 1: The exposed pad on DFN-S package can be connected to VSS or left floating.
2.1
Chip Select (CS)
A low level on this pin selects the device. A high level
deselects the device and forces it into Standby mode.
However, a programming cycle which is already
initiated or in progress will be completed, regardless of
the CS input signal. If CS is brought high during a
program cycle, the device will go into Standby mode as
soon as the programming cycle is complete. When the
device is deselected, SO goes to the high-impedance
state, allowing multiple parts to share the same SPI
bus. A low-to-high transition on CS after a valid write
sequence initiates an internal write cycle. After powerup, a low level on CS is required prior to any sequence
being initiated.
2.2
Serial Output (SO)
The SO pin is used to transfer data out of the 25LC512.
During a read cycle, data is shifted out on this pin after
the falling edge of the serial clock.
2.3
Write-Protect (WP)
This pin is used in conjunction with the WPEN bit in the
STATUS register to prohibit writes to the nonvolatile
bits in the STATUS register. When WP is low and
WPEN is high, writing to the nonvolatile bits in the
STATUS register is disabled. All other operations
function normally. When WP is high, all functions,
including writes to the nonvolatile bits in the STATUS
register, operate normally. If the WPEN bit is set, WP
low during a STATUS register write sequence will
disable writing to the STATUS register. If an internal
write cycle has already begun, WP going low will have
no effect on the write.
2007-2021 Microchip Technology Inc.
The WP pin function is blocked when the WPEN bit in
the STATUS register is low. This allows the user to
install the 25LC512 in a system with WP pin grounded
and still be able to write to the STATUS register. The
WP pin functions will be enabled when the WPEN bit is
set high.
2.4
Serial Input (SI)
The SI pin is used to transfer data into the device. It
receives instructions, addresses and data. Data is
latched on the rising edge of the serial clock.
2.5
Serial Clock (SCK)
The SCK is used to synchronize the communication
between a host and the 25LC512. Instructions,
addresses or data present on the SI pin are latched on
the rising edge of the clock input, while data on the SO
pin is updated after the falling edge of the clock input.
2.6
Hold (HOLD)
The HOLD pin is used to suspend transmission to the
25LC512 while in the middle of a serial sequence without having to re-transmit the entire sequence over
again. It must be held high any time this function is not
being used. Once the device is selected and a serial
sequence is underway, the HOLD pin may be pulled
low to pause further serial communication without
resetting the serial sequence.
The HOLD pin must be brought low while SCK is low,
otherwise the HOLD function will not be invoked until
the next SCK high-to-low transition. The 25LC512 must
remain selected during this sequence. The SI and SCK
levels are “don’t cares” during the time the device is
paused and any transitions on these pins will be
ignored. To resume serial communication, HOLD
DS20002065D-page 6
25LC512
should be brought high while the SCK pin is low, otherwise serial communication will not be resumed until the
next SCK high-to-low transition.
The SO line will tri-state immediately upon a high-tolow transition of the HOLD pin, and will begin outputting
again immediately upon a subsequent low-to-high
transition of the HOLD pin, independent of the state of
SCK.
2007-2021 Microchip Technology Inc.
DS20002065D-page 7
25LC512
3.0
FUNCTIONAL DESCRIPTION
3.1
Principles of Operation
BLOCK DIAGRAM
The 25LC512 is a 65,536 byte Serial EEPROM
designed to interface directly with the Serial Peripheral Interface (SPI) port of many of today’s popular
microcontroller families, including Microchip’s PIC®
microcontrollers. It may also interface with microcontrollers that do not have a built-in SPI port by using
discrete I/O lines programmed properly in firmware to
match the SPI protocol.
The 25LC512 contains an 8-bit instruction register. The
device is accessed via the SI pin, with data being
clocked in on the rising edge of SCK. The CS pin must
be low and the HOLD pin must be high for the entire
operation.
Table 3-1 contains a list of the possible instruction
bytes and format for device operation. All instructions,
addresses, and data are transferred MSB first, LSB
last.
Data (SI) is sampled on the first rising edge of SCK
after CS goes low. If the clock line is shared with other
peripheral devices on the SPI bus, the user can assert
the HOLD input and place the 25LC512 in ‘HOLD’
mode. After releasing the HOLD pin, operation will
resume from the point when the HOLD was asserted.
TABLE 3-1:
STATUS
Register
I/O Control
Logic
HV Generator
Memory
Control
Logic
EEPROM
Array
X
Dec
Page Latches
SI
SO
Y Decoder
CS
SCK
Sense Amp.
R/W Control
HOLD
WP
VCC
VSS
INSTRUCTION SET
Instruction Name
Instruction Format
Description
READ
0000 0011
Read data from memory array beginning at selected address
WRITE
0000 0010
Write data to memory array beginning at selected address
WREN
0000 0110
Set the write enable latch (enable write operations)
WRDI
0000 0100
Reset the write enable latch (disable write operations)
RDSR
0000 0101
Read STATUS register
WRSR
0000 0001
Write STATUS register
PE
0100 0010
Page Erase – erase one page in memory array
SE
1101 1000
Sector Erase – erase one sector in memory array
CE
1100 0111
Chip Erase – erase all sectors in memory array
RDID
1010 1011
Release from Deep power-down and read electronic signature
DPD
1011 1001
Deep Power-Down mode
2007-2021 Microchip Technology Inc.
DS20002065D-page 8
25LC512
3.2
Read Sequence
The device is selected by pulling CS low. The 8-bit
READ instruction is transmitted to the 25LC512 followed by the 16-bit address. After the correct READ
instruction and address are sent, the data stored in the
memory at the selected address is shifted out on the
SO pin. The data stored in the memory at the next
address can be read sequentially by continuing to
FIGURE 3-1:
provide clock pulses. The internal Address Pointer is
automatically incremented to the next higher address
after each byte of data is shifted out. When the highest
address is reached (FFFFh), the address counter rolls
over to address 0000h allowing the read cycle to be
continued indefinitely. The READ instruction is
terminated by raising the CS pin (Figure 3-1).
READ SEQUENCE
CS
0
1
2
3
4
5
6
7
8
9 10 11
21 22 23 24 25 26 27 28 29 30 31
SCK
Instruction
SI
0
0
0
0
0
16-bit Address
0
1
1 15 14 13 12
2
1
0
Data Out
High-Impedance
SO
2007-2021 Microchip Technology Inc.
7
6
5
4
3
2
1
0
DS20002065D-page 9
25LC512
3.3
Write Sequence
Note:
Page write operations are limited to
writing bytes within a single physical page,
regardless of the number of bytes
actually being written. Physical page
boundaries start at addresses that are
integer multiples of the page buffer size
(or ‘page size’), and end at addresses that
are integer multiples of page size – 1. If a
Page Write command attempts to write
across a physical page boundary, the
result is that the data wraps around to the
beginning of the current page (overwriting
data previously stored there), instead of
being written to the next page as might be
expected. It is therefore necessary for the
application software to prevent page write
operations that would attempt to cross a
page boundary.
Prior to any attempt to write data to the 25LC512, the
write enable latch must be set by issuing the WREN
instruction (Figure 3-4). This is done by setting CS low
and then clocking out the proper instruction into the
25LC512. After all eight bits of the instruction are transmitted, the CS must be brought high to set the write
enable latch. If the write operation is initiated immediately after the WREN instruction without CS being
brought high, the data will not be written to the array
because the write enable latch will not have been
properly set.
A write sequence includes an automatic, self timed
erase cycle. It is not required to erase any portion of the
memory prior to issuing a WRITE instruction.
Once the write enable latch is set, the user may
proceed by setting the CS low, issuing a WRITE instruction, followed by the 16-bit address, and then the data
to be written. Up to 128 bytes of data can be sent to the
device before a write cycle is necessary. The only
restriction is that all of the bytes must reside in the
same page.
Note:
When doing a write of less than 128 bytes
the data in the rest of the page is
refreshed along with the data bytes being
written. This will force the entire page to
endure a write cycle, for this reason
endurance is specified per page.
FIGURE 3-2:
For the data to be actually written to the array, the CS
must be brought high after the Least Significant bit (D0)
of the nth data byte has been clocked in. If CS is
brought high at any other time, the write operation will
not be completed. Refer to Figure 3-2 and Figure 3-3
for more detailed illustrations on the byte write
sequence and the page write sequence, respectively.
While the write is in progress, the STATUS register may
be read to check the status of the WPEN, WIP, WEL,
BP1 and BP0 bits (Figure 3-6). A read attempt of a
memory array location will not be possible during a
write cycle. When the write cycle is completed, the
write enable latch is reset.
BYTE WRITE SEQUENCE
CS
(1)
TWC
0
1
2
3
4
5
6
7
8
9 10 11
29 30 31 32 33 34 35 36 37 38 39
SCK
Instruction
SI
0
0
0
0
0
24-bit Address
0
1
0 23 22 21 20
Data Byte
2
1
0
7
6
5
4
3
2
1
0
High-Impedance
SO
Note 1: This sequence initiates a self-timed internal write cycle on the rising edge of CS after a valid sequence.
2007-2021 Microchip Technology Inc.
DS20002065D-page 10
25LC512
FIGURE 3-3:
PAGE WRITE SEQUENCE
CS
0
1
2
3
4
5
6
7
8
9 10 11
29 30 31 32 33 34 35 36 37 38 39
SCK
Instruction
SI
0
0
0
0
0
24-bit Address
0 1
0 23 22 21 20
Data Byte 1
2
1
0
7
6
5
4
3
2
1
0
CS
(1)
TWC
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCK
Data Byte 2
SI
7
6
5
4
3
2
Data Byte n (256 max)
Data Byte 3
1
0
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
Note 1: This sequence initiates a self-timed internal write cycle on the rising edge of CS after a valid sequence.
2007-2021 Microchip Technology Inc.
DS20002065D-page 11
25LC512
3.4
Write Enable (WREN) and Write
Disable (WRDI)
•
•
•
•
•
•
•
The 25LC512 contains a write enable latch.
See
Table 3-4 for the Write-Protect Functionality Matrix.
This latch must be set before any write operation will be
completed internally. The WREN instruction will set the
latch, and the WRDI will reset the latch.
Power-up
WRDI instruction successfully executed
WRSR instruction successfully executed
WRITE instruction successfully executed
PE instruction successfully executed
SE instruction successfully executed
CE instruction successfully executed
The following is a list of conditions under which the
write enable latch will be reset:
FIGURE 3-4:
WRITE ENABLE SEQUENCE (WREN)
CS
0
1
2
3
4
5
6
7
SCK
0
SI
0
0
0
1
1
0
High-Impedance
SO
FIGURE 3-5:
0
WRITE DISABLE SEQUENCE (WRDI)
CS
0
1
2
3
4
5
6
7
SCK
SI
0
0
0
0
0
1
10
0
High-Impedance
SO
2007-2021 Microchip Technology Inc.
DS20002065D-page 12
25LC512
3.5
Read Status Register Instruction
(RDSR)
The Write Enable Latch (WEL) bit indicates the status
of the write enable latch and is read-only. When set to
a ‘1’, the latch allows writes to the array, when set to a
‘0’, the latch prohibits writes to the array. The state of
this bit can always be updated via the WREN or WRDI
commands regardless of the state of write protection
on the STATUS register. These commands are shown
in Figure 3-4 and Figure 3-5.
The Read Status Register instruction (RDSR) provides
access to the STATUS register. The STATUS register
may be read at any time, even during a write cycle. The
STATUS register is formatted as follows:
TABLE 3-2:
7
W/R
WPEN
Note:
STATUS REGISTER
The Block Protection (BP0 and BP1) bits indicate
which blocks are currently write-protected. These bits
are set by the user issuing the WRSR instruction. These
bits are nonvolatile, and are shown in Table 3-3.
6 5 4
3
2
1
0
– – – W/R W/R
R
R
X X X BP1 BP0 WEL WIP
W/R = writable/readable. R = read-only.
See Figure 3-6 for the RDSR timing sequence.
The Write-In-Process (WIP) bit indicates whether the
25LC512 is busy with a write operation. When set to a
‘1’, a write is in progress, when set to a ‘0’, no write is
in progress. This bit is read-only.
FIGURE 3-6:
READ STATUS REGISTER TIMING SEQUENCE (RDSR)
CS
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
1
0
SCK
Instruction
SI
0
0
0
0
0
High-Impedance
SO
2007-2021 Microchip Technology Inc.
1
0
1
Data from STATUS Register
7
6
5
4
3
2
DS20002065D-page 13
25LC512
3.6
Write Status Register Instruction
(WRSR)
The Write-Protect Enable (WPEN) bit is a nonvolatile
bit that is available as an enable bit for the WP pin. The
Write-Protect (WP) pin and the Write-Protect Enable
(WPEN) bit in the STATUS register control the
programmable hardware write-protect feature. Hardware write protection is enabled when WP pin is low
and the WPEN bit is high. Hardware write protection is
disabled when either the WP pin is high or the WPEN
bit is low. When the chip is hardware write-protected,
only writes to nonvolatile bits in the STATUS register
are disabled. See Table 3-4 for a matrix of functionality
on the WPEN bit. See Figure 3-7 for the WRSR timing
sequence.
The Write Status Register instruction (WRSR) allows the
user to write to the nonvolatile bits in the STATUS
register as shown in Table 3-2. The user is able to
select one of four levels of protection for the array by
writing to the appropriate bits in the STATUS register.
The array is divided up into four segments. The user
has the ability to write-protect none, one, two or all four
of the segments of the array. The partitioning is
controlled as shown in Table 3-3.
TABLE 3-3:
ARRAY PROTECTION
BP1
BP0
Array Addresses
Write-Protected
Array Addresses
Unprotected
0
0
none
All (Sectors 0, 1, 2 & 3)
(0000h-FFFFh)
0
1
Upper 1/4 (Sector 3)
(C000h-FFFFh)
Lower 3/4 (Sectors 0, 1 & 2)
(0000h-BFFFh)
1
0
Upper 1/2 (Sectors 2 & 3)
(8000h-FFFFh)
Lower 1/2 (Sectors 0 & 1)
(0000h-7FFFh)
1
1
All (Sectors 0, 1, 2 & 3)
(0000h-FFFFh)
none
TABLE 3-4:
WRITE-PROTECT FUNCTIONALITY MATRIX
WEL
(SR bit 1)
WPEN
(SR bit 7)
WP
(pin 3)
Protected Blocks
Unprotected Blocks
STATUS Register
0
x
x
Protected
Protected
Protected
1
0
x
Protected
Writable
Writable
1
1
0 (low)
Protected
Writable
Protected
1
1
1 (high)
Protected
Writable
Writable
x = don’t care
FIGURE 3-7:
WRITE STATUS REGISTER TIMING SEQUENCE (WRSR)
CS
(1)
TWC
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
1
0
SCK
Instruction
SI
0
0
0
0
Data to STATUS register
0
0
0
1
7
6
5
4
3
2
High-Impedance
SO
Note 1: This sequence initiates a self-timed internal write cycle on the rising edge of CS after a valid sequence.
2007-2021 Microchip Technology Inc.
DS20002065D-page 14
25LC512
3.7
PAGE ERASE
The PAGE ERASE instruction will erase all bits (FFh)
inside the given page. A Write Enable (WREN) instruction must be given prior to attempting a PAGE ERASE.
This is done by setting CS low and then clocking out
the proper instruction into the 25LC512. After all eight
bits of the instruction are transmitted, the CS must be
brought high to set the write enable latch.
CS must then be driven high after the last bit of the
address or the PAGE ERASE will not execute. Once
the CS is driven high the self-timed PAGE ERASE
cycle is started. The WIP bit in the STATUS register
can be read to determine when the PAGE ERASE cycle
is complete.
If a PAGE ERASE instruction is given to an address
that has been protected by the Block Protect bits (BP0,
BP1) then the sequence will be aborted and no erase
will occur.
The PAGE ERASE instruction is entered by driving CS
low, followed by the instruction code (Figure 3-8) and
two address bytes. Any address inside the page to be
erased is a valid address.
FIGURE 3-8:
PAGE ERASE SEQUENCE
CS
Twc
0
1
2
3
4
5
6
7
8
9 10 11
(1)
21 22 23
SCK
Instruction
SI
0
1
0
0
0
16-bit Address
0
1
0 15 14 13 12
2
1
0
High-Impedance
SO
Note 1:
This sequence initiates a self-timed internal write cycle on the rising edge of CS after a valid sequence.
2007-2021 Microchip Technology Inc.
DS20002065D-page 15
25LC512
3.8
SECTOR ERASE
The SECTOR ERASE instruction will erase all bits
(FFh) inside the given sector. A Write Enable (WREN)
instruction must be given prior to attempting a SECTOR
ERASE. This is done by setting CS low and then clocking out the proper instruction into the 25LC512. After
all eight bits of the instruction are transmitted, the CS
must be brought high to set the write enable latch.
CS must then be driven high after the last bit of the
address or the SECTOR ERASE will not execute. Once
the CS is driven high the self-timed SECTOR ERASE
cycle is started. The WIP bit in the STATUS register
can be read to determine when the SECTOR ERASE
cycle is complete.
If a SECTOR ERASE instruction is given to an address
that has been protected by the Block Protect bits (BP0,
BP1) then the sequence will be aborted and no erase
will occur.
The SECTOR ERASE instruction is entered by driving
CS low, followed by the instruction code (Figure 3-9)
and two address bytes. Any address inside the sector
to be erased is a valid address.
FIGURE 3-9:
See Table 3-3 for Sector Addressing.
SECTOR ERASE SEQUENCE
CS
TSE
0
1
1
1
2
3
4
5
6
0
0
7
8
9 10 11
(1)
21 22 23
SCK
Instruction
SI
0
1
1
16-bit Address
0 15 14 13 12
2
1
0
High-Impedance
SO
Note 1:
This sequence initiates a self-timed internal write cycle on the rising edge of CS after a valid sequence.
2007-2021 Microchip Technology Inc.
DS20002065D-page 16
25LC512
3.9
CHIP ERASE
The CHIP ERASE instruction will erase all bits (FFh) in
the array. A Write Enable (WREN) instruction must be
given prior to executing a CHIP ERASE. This is done
by setting CS low and then clocking out the proper
instruction into the 25LC512. After all eight bits of the
instruction are transmitted, the CS must be brought
high to set the write enable latch.
The CS pin must be driven high after the eighth bit of
the instruction code has been given or the CHIP
ERASE instruction will not be executed. Once the CS
pin is driven high the self-timed CHIP ERASE instruction begins. While the device is executing the CHIP
ERASE instruction the WIP bit in the STATUS register
can be read to determine when the CHIP ERASE
instruction is complete.
The CHIP ERASE instruction is entered by driving the
CS low, followed by the instruction code (Figure 3-10)
onto the SI line.
FIGURE 3-10:
The CHIP ERASE instruction is ignored if either of the
Block Protect bits (BP0, BP1) are not 0, meaning ¼,
½, or all of the array is protected.
CHIP ERASE SEQUENCE
CS
TCE
0
1
2
3
4
5
6
(1)
7
SCK
SI
1
1
0
0
0
1
1
1
High-Impedance
SO
Note 1:
This sequence initiates a self-timed internal write cycle on the rising edge of CS after a valid sequence.
2007-2021 Microchip Technology Inc.
DS20002065D-page 17
25LC512
3.10
DEEP POWER-DOWN MODE
Deep Power-Down mode of the 25LC512 is its lowest
power consumption state. The device will not respond
to any of the Read or Write commands while in Deep
Power-Down mode, and therefore it can be used as an
additional software write protection feature.
All instructions given during Deep Power-Down mode
are ignored except the Read Electronic Signature
command (RDID). The RDID command will release
the device from Deep power-down and outputs the
electronic signature on the SO pin, and then returns
the device to Standby mode after delay (TREL)
The Deep Power-Down mode is entered by driving CS
low, followed by the instruction code (Figure 3-11) onto
the SI line, followed by driving CS high.
Deep Power-Down mode automatically releases at
device power-down. Once power is restored to the
device it will power-up in the Standby mode.
If the CS pin is not driven high after the eighth bit of the
instruction code has been given, the device will not
execute Deep power-down. Once the CS line is driven
high there is a delay (TDP) before the current settles to
its lowest consumption.
FIGURE 3-11:
DEEP POWER-DOWN SEQUENCE
CS
0
1
2
3
4
5
6
7
SCK
SI
1
0
1
1
1
0
0
1
High-Impedance
SO
2007-2021 Microchip Technology Inc.
DS20002065D-page 18
25LC512
3.11
RELEASE FROM DEEP
POWER-DOWN AND READ
ELECTRONIC SIGNATURE
Once the device has entered Deep Power-Down
mode all instructions are ignored except the Release
from Deep Power-down and Read Electronic Signature command. This command can also be used when
the device is not in Deep power-down to read the
electronic signature out on the SO pin unless another
command is being executed such as Erase, Program
or Write Status Register.
FIGURE 3-12:
Release from Deep Power-Down mode and Read
Electronic Signature is entered by driving CS low,
followed by the RDID instruction code (Figure 3-12)
and then a dummy address of 16 bits (A15-A0). After
the last bit of the dummy address is clock in, the 8-bit
Electronic Signature is clocked out on the SO pin.
After the signature has been read out at least once,
the sequence can be terminated by driving CS high.
The device will then return to Standby mode and will
wait to be selected so it can be given new instructions.
If additional clock cycles are sent after the electronic
signature has been read once, it will continue to output
the signature on the SO line until the sequence is
terminated.
RELEASE FROM DEEP POWER-DOWN AND READ ELECTRONIC SIGNATURE
CS
0
1
2
3
4
5
6
7
8
9 10 11
21 22 23 24 25 26 27 28 29 30 31
SCK
Instruction
SI
1
0
1
0
1
16-bit Address
0
1
1 15 14 13 12
2
1
0
Electronic Signature Out
High-Impedance
SO
7
6
5
4
3
2
1
0
0
0
1
0
1
0
0
1
Manufacturer’s ID = 0x29
Driving CS high after the 8-bit RDID command but before the Electronic Signature has been transmitted will still ensure
the device will be taken out of Deep Power-Down mode. However, there is a delay TREL that occurs before the device
returns to Standby mode (ICCS), as shown in Figure 3-13.
FIGURE 3-13:
RELEASE FROM DEEP POWER-DOWN AND READ ELECTRONIC SIGNATURE
CS
0
1
2
3
4
5
6
0
1
7
TREL
SCK
Instruction
SI
1
0
1
0
1
1
High-Impedance
SO
2007-2021 Microchip Technology Inc.
DS20002065D-page 19
25LC512
4.0
DATA PROTECTION
The following protection has been implemented to
prevent inadvertent writes to the array:
• The write enable latch is reset on power-up
• A write enable instruction must be issued to set
the write enable latch
• After a byte write, page write or STATUS register
write, the write enable latch is reset
• CS must be set high after the proper number of
clock cycles to start an internal write cycle
• Access to the array during an internal write cycle
is ignored and programming is continued
2007-2021 Microchip Technology Inc.
5.0
POWER-ON STATE
The 25LC512 powers on in the following state:
• The device is in low-power Standby mode
(CS = 1)
• The write enable latch is reset
• SO is in high-impedance state
• A high-to-low-level transition on CS is required to
enter active state
DS20002065D-page 20
25LC512
6.0
PACKAGING INFORMATION
6.1
Package Marking Information
8-Lead DFN-S
Example:
XXXXXXX
T/XXXXX
YYWW
NNN
25LC512
I/MF e3
0728
1L7
8-Lead PDIP
Example:
XXXXXXXX
T/XXXNNN
YYWW
25LC512
I/P e3 1L7
0728
8-Lead SOIC
Example:
XXXXXXXT
XXXXYYWW
NNN
25LC512I
SN e3 0728
1L7
Example:
8-Lead SOIJ
25LC512
I/SM e3
07281L7
XXXXXXXX
T/XXXXXX
YYWWNNN
1st Line Marking Codes
Device
25LC512
Legend: XX...X
T
Y
YY
WW
NNN
e3
DFN-S
PDIP
SOIC
SOIJ
25LC512
25LC512
25LC512T
25LC512
Part number or part number code
Temperature (I, E)
Year code (last digit of calendar year)
Year code (last 2 digits of calendar year)
Week code (week of January 1 is week ‘01’)
Alphanumeric traceability code (2 characters for small packages)
RoHS-compliant JEDEC designator for Matte Tin (Sn)
Note:
For very small packages with no room for the RoHS-compliant JEDEC
designator e3 , the marking will only appear on the outer carton or reel label.
Note:
In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
2007-2021 Microchip Technology Inc.
DS20002065D-page 21
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2007-2021 Microchip Technology Inc.
DS20002065D-page 22
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