TYPICAL PERFORMANCE CURVES
1200V APT25GN120B_S(G)
APT25GN120B
APT25GN120S
APT25GN120BG* APT25GN120SG*
*G Denotes RoHS Compliant, Pb Free Terminal Finish.
Utilizing the latest Field Stop and Trench Gate technologies, these IGBT's have ultra
low VCE(ON) and are ideal for low frequency applications that require absolute minimum
conduction loss. Easy paralleling is a result of very tight parameter distribution and
a slightly positive VCE(ON) temperature coefficient. A built-in gate resistor ensures
extremely reliable operation, even in the event of a short circuit fault. Low gate charge
simplifies gate drive design and minimizes losses.
(B)
TO
-2
D3PAK
47
(S)
C
G
G
C
E
E
• 1200V Field Stop
• Trench Gate: Low VCE(on)
• Easy Paralleling
• Integrated Gate Resistor: Low EMI, High Reliability
C
G
E
Applications: Welding, Inductive Heating, Solar Inverters, SMPS, Motor drives, UPS
MAXIMUM RATINGS
Symbol
All Ratings: TC = 25°C unless otherwise specified.
Parameter
APT25GN120B(G)
VCES
Collector-Emitter Voltage
1200
VGE
Gate-Emitter Voltage
±30
I C1
Continuous Collector Current @ TC = 25°C
67
I C2
Continuous Collector Current @ TC = 110°C
33
I CM
SSOA
PD
TJ,TSTG
TL
Pulsed Collector Current
1
UNIT
Volts
Amps
75
Switching Safe Operating Area @ TJ = 150°C
75A @ 1200V
Total Power Dissipation
272
Operating and Storage Junction Temperature Range
Watts
-55 to 150
Max. Lead Temp. for Soldering: 0.063" from Case for 10 Sec.
°C
300
STATIC ELECTRICAL CHARACTERISTICS
Collector-Emitter Breakdown Voltage (VGE = 0V, I C = 150µA)
VGE(TH)
Gate Threshold Voltage
VCE(ON)
(VCE = VGE, I C = 1mA, Tj = 25°C)
I GES
RG(int)
5
5.8
6.5
1.4
1.7
2.1
Units
Volts
Collector-Emitter On Voltage (VGE = 15V, I C = 25A, Tj = 25°C)
Collector Cut-off Current (VCE = 1200V, VGE = 0V, Tj = 25°C)
MAX
1200
Collector-Emitter On Voltage (VGE = 15V, I C = 25A, Tj = 125°C)
I CES
TYP
1.9
2
Collector Cut-off Current (VCE = 1200V, VGE = 0V, Tj = 125°C)
100
2
Gate-Emitter Leakage Current (VGE = ±20V)
600
8
Integrated Gate Resistor
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.
Microsemi Website - http://www.microsemi.com
µA
TBD
nA
Ω
9-2009
V(BR)CES
MIN
Rev E
Characteristic / Test Conditions
050-7600
Symbol
APT25GN120B_S(G)
DYNAMIC CHARACTERISTICS
Symbol
Test Conditions
Characteristic
Cies
Input Capacitance
Coes
Output Capacitance
Cres
Reverse Transfer Capacitance
VGEP
Gate-to-Emitter Plateau Voltage
Qg
Qge
Qgc
SSOA
Total Gate Charge
3
Gate-Emitter Charge
TYP
Capacitance
1800
VGE = 0V, VCE = 25V
105
f = 1 MHz
85
Gate Charge
9.5
VGE = 15V
155
VCE = 600V
10
I C = 25A
85
Gate-Collector ("Miller ") Charge
TJ = 150°C, R G = 4.3Ω 7, VGE =
Switching Safe Operating Area
MIN
15V, L = 100µH,VCE = 1200V
Inductive Switching (25°C)
22
tr
Current Rise Time
VCC = 800V
17
td(off)
Turn-off Delay Time
VGE = 15V
280
I C = 25A
135
RG = 1.0Ω 7
TBD
Eon1
Eon2
Turn-on Switching Energy
4
Turn-on Switching Energy (Diode)
TJ = +25°C
5
Turn-off Switching Energy
td(on)
Turn-on Delay Time
Inductive Switching (125°C)
22
tr
Current Rise Time
VCC = 800V
17
Turn-off Delay Time
VGE = 15V
335
I C = 25A
RG = 1.0Ω 7
225
TBD
TJ = +125°C
2390
tf
44
Turn-on Switching Energy
Eon2
Turn-on Switching Energy (Diode)
Eoff
Turn-off Switching Energy
ns
mJ
2150
Current Fall Time
Eon1
nC
1490
6
Eoff
td(off)
V
A
Turn-on Delay Time
Current Fall Time
UNIT
pF
75
td(on)
tf
MAX
55
66
ns
mJ
3075
THERMAL AND MECHANICAL CHARACTERISTICS
Symbol
Characteristic
MIN
TYP
MAX
RθJC
Junction to Case (IGBT)
.46
RθJC
Junction to Case (DIODE)
N/A
WT
Package Weight
5.9
UNIT
°C/W
gm
1 Repetitive Rating: Pulse width limited by maximum junction temperature.
2 For Combi devices, Ices includes both IGBT and FRED leakages
3 See MIL-STD-750 Method 3471.
4 Eon1 is the clamped inductive turn-on energy of the IGBT only, without the effect of a commutating diode reverse recovery current
adding to the IGBT turn-on loss. Tested in inductive switching test circuit shown in figure 21, but with a Silicon Carbide diode.
050-7600
Rev E
9-2009
5 Eon2 is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching
loss. (See Figures 21, 22.)
6 Eoff is the clamped inductive turn-off energy measured in accordance with JEDEC standard JESD24-1. (See Figures 21, 23.)
7 RG is external gate resistance, not including RG(int) nor gate driver impedance. (MIC4452)
Microsemi Reserves the right to change, without notice, the specifications and information contained herein.
TYPICAL PERFORMANCE CURVES
APT25GN120B_S(G)
80
80
70
IC, COLLECTOR CURRENT (A)
12V
60
11V
50
40
10V
30
9V
20
8V
10
9V
20
0
8V
0
5
10
15
VCE, COLLECTER-TO-EMITTER VOLTAGE (V)
FIGURE 2, Output Characteristics (TJ = 125°C)
16
250µs PULSE
TEST
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