AOSP32314
30V N-Channel MOSFET
General Description
Product Summary
• Latest advanced trench technology
• Low RDS(ON)
• High Current capability
• RoHS and Halogen-Free Compliant
ID (at VGS=10V)
30V
14.5A
RDS(ON) (at VGS=10V)
< 9mΩ
RDS(ON) (at VGS=4.5V)
< 12.6mΩ
VDS
Applications
100% UIS Tested
100% Rg Tested
• Notebook AC-in load switch
• Battery protection charge/discharge
SOIC-8
Top View
D
Top View
Bottom View
D
D
D
D
G
1
8
2
7
3
6
4
5
G
S
S
S
S
Orderable Part Number
Package Type
Form
Minimum Order Quantity
AOSP32314
SO-8
Tape & Reel
3000
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Drain-Source Voltage
Symbol
VDS
Gate-Source Voltage
VGS
TA=25°C
Continuous Drain
Current
Pulsed Drain Current C
Avalanche Current C
Avalanche energy
L=0.05mH
TA=25°C
Power Dissipation B
TA=70°C
C
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A D
Maximum Junction-to-Lead
Rev.1.0: July 2017
Steady-State
Steady-State
V
A
11.5
58
IAS
33
A
EAS
27
mJ
3.1
W
2.0
TJ, TSTG
Symbol
t ≤ 10s
±20
IDM
PD
Junction and Storage Temperature Range
Units
V
14.5
ID
TA=70°C
Maximum
30
RqJA
RqJL
-55 to 150
Typ
31
59
16
www.aosmd.com
°C
Max
40
75
24
Units
°C/W
°C/W
°C/W
Page 1 of 5
AOSP32314
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
Conditions
Min
ID=250mA, VGS=0V
Typ
Zero Gate Voltage Drain Current
IGSS
VGS(th)
Gate-Body leakage current
VDS=0V, VGS=±20V
Gate Threshold Voltage
VDS=VGS, ID=250mA
V
1
TJ=55°C
1.25
±100
nA
1.75
2.25
V
7.5
9
11.6
14
12.6
RDS(ON)
Static Drain-Source On-Resistance
VGS=4.5V, ID=12A
10.1
gFS
Forward Transconductance
VDS=5V, ID=14.5A
48
VSD
Diode Forward Voltage
IS=1A, VGS=0V
0.7
IS
Maximum Body-Diode Continuous Current
TJ=125°C
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
μA
5
VGS=10V, ID=14.5A
Coss
Units
30
VDS=30V, VGS=0V
IDSS
Max
VGS=0V, VDS=15V, f=1MHz
mΩ
mΩ
S
1
V
4
A
1420
pF
150
pF
95
pF
2
3
Ω
SWITCHING PARAMETERS
Qg(10V)
Total Gate Charge
22
32
nC
Qg(4.5V)
Total Gate Charge
10
15
nC
Qgs
Gate Source Charge
Qgd
f=1MHz
VGS=10V, VDS=15V, ID=14.5A
1
4.7
nC
Gate Drain Charge
4
nC
tD(on)
Turn-On DelayTime
6.5
ns
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
trr
Turn-Off Fall Time
Qrr
2.5
ns
22.5
ns
3
ns
IF=14.5A, di/dt=500A/ms
7.5
Body Diode Reverse Recovery Charge IF=14.5A, di/dt=500A/ms
9.0
ns
nC
Body Diode Reverse Recovery Time
VGS=10V, VDS=15V, RL=1.05W,
RGEN=3W
A. The value of RqJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
value in any given application depends on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initialTJ=25°C.
D. The RqJA is the sum of the thermal impedance from junction to lead RqJL and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using or equal to 4.5V
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
1
0.0001 0.001
100
0.01
0.1
1
10
100
1000
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-toAmbient (Note F)
ZqJA Normalized Transient
Thermal Resistance
10
D=Ton/T
TJ,PK=TA+PDM.ZqJA.RqJA
1
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
RqJA=75°C/W
0.1
PDM
0.01
0.001
1E-05
Single Pulse
Ton
T
0.0001
0.001
0.01
0.1
1
10
100
1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
Rev.1.0: July 2017
www.aosmd.com
Page 4 of 5
AOSP32314
Figure
A: Charge
Gate Charge
Test Circuit
& Waveforms
Gate
Test Circuit
& Waveform
Vgs
Qg
10V
+
+ Vds
VDC
-
Qgs
Qgd
VDC
-
DUT
Vgs
Ig
Charge
Figure B:
ResistiveSwitching
Switching Test
Test Circuit
Resistive
Circuit&&Waveforms
Waveforms
RL
Vds
Vds
DUT
Vgs
90%
+ Vdd
VDC
-
Rg
10%
Vgs
Vgs
td(on)
tr
td(off)
ton
tf
toff
Figure C:
UnclampedInductive
InductiveSwitching
Switching (UIS) Test
Unclamped
TestCircuit
Circuit&&Waveforms
Waveforms
L
2
EAR= 1/2 LIAR
Vds
BVDSS
Vds
Id
+ Vdd
Vgs
Vgs
I AR
VDC
-
Rg
Id
DUT
Vgs
Vgs
Figure
D:Recovery
Diode Recovery
Test Circuit
& Waveforms
Diode
Test Circuit
& Waveforms
Q rr = - Idt
Vds +
DUT
Vds -
Isd
Vgs
Ig
Rev.1.0: July 2017
Vgs
L
Isd
+ Vdd
t rr
dI/dt
I RM
Vdd
VDC
-
IF
Vds
www.aosmd.com
Page 5 of 5
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