0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
会员中心
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
ACPL-336J-500E

ACPL-336J-500E

  • 厂商:

    AVAGO(博通)

  • 封装:

    SOIC16

  • 描述:

    OPTOISO 5KV GATE DRIVER 16SO

  • 数据手册
  • 价格&库存
ACPL-336J-500E 数据手册
ACPL-336J 2.5 Amp Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection, Active Miller Clamping, Fault and UVLO Status Feedback Data Sheet Lead (Pb) Free RoHS 6 fully compliant RoHS 6 fully compliant options available; -xxxE denotes a lead-free product Description Features Avago’s ACPL-336J gate drive optocoupler features fast propagation delay with excellent timing skew performance. Smart features that are integrated to protect the IGBT include IGBT desaturation detection with softshutdown protection and fault feedback, undervoltage lockout and feedback, and active Miller current clamping. This full-featured and easy-to-implement IGBT gate drive optocoupler comes in a compact, surface-mountable SO-16 package for space-savings. It is suitable for driving IGBTs and power MOSFETs used in motor control and inverter applications. • 2.5 A maximum peak output current Avago isolation products provide reinforced insulation and reliability that deliver safe signal isolation critical in high voltage and noisy industrial applications. VE - Desaturation detection, “Soft” IGBT turn-off and fault feedback - UnderVoltage LockOut (UVLO) Protection with feedback • Integrated input LED driver • 250 ns maximum propagation delay over temperature • 30 kV/µs minimum Common Mode Rejection (CMR) at VCM = 1500 V • SO-16 package with 8 mm clearance and creepage VLED Input LED Driver VCC1 UVLO UVLO Fault Decoder • Integrated fail-safe IGBT protection • Wide operating temperature range: -40 °C to 105 °C VCC2 VIN+ FAULT • 2.5 A Miller Clamp • Wide operating voltage: 15 V to 30 V Functional Diagram VLEDDRV • Rail-to-rail output voltage DESAT LED2 DESAT Output Driver Applications • Isolated IGBT/Power MOSFET gate drive VEE1 VOUT Soft Shut ANODE V CLAMP CATHODE • Regulatory approvals: – UL 1577, VISO = 5000 VRMS for 1 min – CSA – IEC/EN/DIN EN 60747-5-5 VIORM = 1414 VPEAK LED1 VEE2 V EE2 • Renewable energy inverters • AC and brushless DC motor drives VCLAMP • Industrial Inverters • Switching power supplies CAUTION: It is advised that normal static precautions be taken in handling and assembly of this component to prevent damage and/or degradation which may be induced by ESD. Product Overview Description The ACPL-336J is a highly integrated power control device that incorporates all the necessary components for a complete, isolated IGBT gate drive circuit. It features IGBT desaturation detection with soft-shutdown protection and fault feedback, undervoltage lockout and feedback, and active Miller current clamping in a SO-16 package. Direct LED input with or without integrated LED driver allows flexible logic configuration and differential current mode driving with low input impedance, greatly increasing its noise immunity. Pin Description Pin Symbol Description 1 VEE1 Input common 1 VEE1 VEE2 16 2 VIN+ Non inverting voltage control input. 2 VIN+ VLED 15 3 VCC1 Input power supply (4.5 V to 5.5 V) 3 VCC1 DESAT 14 4 VLEDDRV Integrated LED driver output. 4 VLEDDRV 5 UVLO VCC2 undervoltage lockout feedback 6 FAULT DESAT fault feedback VE 13 5 UVLO VCC2 12 7 ANODE Input LED anode 6 FAULT VOUT 11 8 CATHODE Input LED cathode VCLAMP 10 9 VEE2 Negative power supply 10 VCLAMP Miller current clamping output 11 VOUT Driver output to IGBT gate 12 VCC2 Positive power supply 13 VE Common (IGBT emitter) output supply voltage. 14 DESAT Desaturation voltage input. When the voltage on DESAT exceeds an internal reference voltage of 7 V while the IGBT is on, VOUT will soft shut down and FAULT will change from High impedance to Low logic state 15 VLED No connection, for testing only 16 VEE2 Negative power supply 7 ANODE 8 CATHODE VEE2 9 Ordering Information ACPL-336J is UL Recognized with 5000 Vrms for 1 minute per UL1577. Option Part number RoHS Compliant Package Surface Mount ACPL-336J -000E SO-16 X -500E X Tape & Reel X IEC/EN/DIN EN 60747-5-5 Quantity X 45 per tube X 850 per reel To order, choose a part number from the part number column and combine with the desired option from the option column to form an order entry. Example 1: ACPL-336J-500E to order product of SO-16 Surface Mount package in Tape and Reel packaging with IEC/EN/DIN EN 60747-5-5 Safety Approval in RoHS compliant. Option datasheets are available. Contact your Avago sales representative or authorized distributor for information. 2 Package Outline Drawings ACPL-336J 16-Lead Surface Mount Package 0.018 (0.457) 16 15 14 13 12 11 10 9 A 336J AVAGO LEAD-FREE YYWW EEE LAND PATTERN RECOMMENDATION 0.025 (0.64 ) 0.050 (1.270) TYPE NUMBER DATE CODE 0.295 ± 0.010 (7.493 ± 0.254) 0.458 (11.63) LOT ID 0.085 (2.16) 9° 1 2 3 4 5 6 7 8 0.406 ± 0.10 (10.312 ± 0.254) 0.018 (0.457) 0.345 ± 0.010 (8.763 ± 0.254) 0.138 ± 0.005 (3.505 ± 0.127) 0-8° 0.025 MIN. 0.408 ± 0.010 (10.363 ± 0.254) ALL LEADS TO BE COPLANAR ± 0.002 0.008 ± 0.003 (0.203 ± 0.076) STANDOFF Dimensions in inches (millimeters) Notes: Initial and continued variation in the color of the ACPL-336J’s white mold compound is normal and does note affect device performance or reliability. Lead coplanarity = 0.1 mm (0.004 inches) Floating Lead Protrusion is 0.25 mm (10 mils) max. Recommended Pb-Free IR Profile Recommended reflow condition as per JEDEC Standard, J-STD-020 (latest revision). Non- Halide Flux should be used. Regulatory Information The ACPL-336J is approved by the following organizations: IEC/EN/DIN EN 60747-5-5 Maximum working insulation voltage VIORM = 1414 VPEAK UL Approval under UL 1577, component recognition program up to VISO = 5000 VRMS. File E55361. CSA Approval under CSA Component Acceptance Notice #5, File CA 88324. 3 Table 1. IEC/EN/DIN EN 60747-5-5 Insulation Characteristics* Description Symbol Characteristic Installation classification per DIN VDE 0110/39, Table 1 for rated mains voltage ≤ 150 VRMS for rated mains voltage ≤ 300 VRMS for rated mains voltage ≤ 600 VRMS for rated mains voltage ≤ 1000 VRMS I – IV I – IV I – IV I – III Climatic Classification 40/105/21 Pollution Degree (DIN VDE 0110/39) 2 Unit Maximum Working Insulation Voltage VIORM 1414 Vpeak Input to Output Test Voltage, Method b** VIORM x 1.875 = VPR, 100% Production Test with tm = 1 sec, Partial discharge < 5 pC VPR 2652 Vpeak Input to Output Test Voltage, Method a** VIORM x 1.6 = VPR, Type and Sample Test, tm = 10 sec, Partial discharge < 5 pC VPR 2262 Vpeak Highest Allowable Overvoltage (Transient Overvoltage tini = 60 sec) VIOTM 8000 Vpeak Case Temperature TS 175 °C Input Current IS, INPUT 400 mA Output Power PS, OUTPUT 1200 mW RS >109 W Safety-limiting values – maximum values allowed in the event of a failure. Insulation Resistance at TS, VIO = 500 V * Isolation characteristics are guaranteed only within the safety maximum ratings, which must be ensured by protective circuits in application. Surface mount classification is class A in accordance with CECCOO802. ** Refer to the optocoupler section of the Isolation and Control Components Designer’s Catalog, under Product Safety Regulations section IEC/EN/ DIN EN 60747-5-5, for a detailed description of Method a and Method b partial discharge test profiles. Table 2. Insulation and Safety Related Specifications Parameter Symbol ACPL-336J Units Conditions Minimum External Air Gap (Clearance) L(101) 8.3 mm Measured from input terminals to output terminals, shortest distance through air. Minimum External Tracking (Creepage) L(102) 8.3 mm Measured from input terminals to output terminals, shortest distance path along body. 0.5 mm Through insulation distance conductor to conductor, usually the straight line distance thickness between the emitter and detector. >175 V DIN IEC 112/VDE 0303 Part 1 Minimum Internal Plastic Gap (Internal Clearance) Tracking Resistance (Comparative Tracking Index) Isolation Group 4 CTI IIIa Material Group (DIN VDE 0110, 1/89, Table 1) Table 3. Absolute Maximum Ratings Parameter Symbol Min. Max. Units Storage Temperature TS -55 125 °C Operating Temperature TA -40 105 °C Output IC Junction Temperature TJ 125 °C Average Input Current IF(AVG) 20 mA Peak Transient Input Current (< 1 µs pulse width, 300 pps) IF(TRAN) 1 A Reverse Input Voltage VR 5 V Peak Output Current |IO(PEAK)| 2.5 A FAULT Output Current IFAULT 10 mA FAULT Pin Voltage VFAULT VCC1 V UVLO Output Current IUVLO 10 mA UVLO Pin Voltage VUVLO -0.5 VCC1 V Non Inverting Voltage Control Input Voltage VIN+ -0.5 VCC1 V Integrated LED Driver Output Current ILEDDRV 20 mA Integrated LED Driver Output Voltage VLEDDRV -0.5 VCC1 V Positive Input Supply Voltage VCC1 -0.5 7.0 V Total Output Supply Voltage VCC2 – VEE2 -0.5 35 V Negative Output Supply Voltage VE – VEE2 -0.5 15 V Positive Output Supply Voltage VCC2 – VE -0.5 35 – (VE – VEE) V Gate Drive Output Voltage VO(PEAK) -0.5 VCC2 V Peak Clamping Sinking Current ICLAMP 2.5 A Miller Clamping Pin Voltage VCLAMP -0.5 VCC2 V DESAT Voltage VDESAT VE – 0.5 (VCC2 + 0.5) V Output IC Power Dissipation PO 600 mW 4 Input LED Power Dissipation PI 150 mW 5 -0.5 Note 1 2 3 2 Notes: 1. Derate linearly above 70 °C free-air temperature at a rate of 0.3 mA/°C. 2. Maximum pulse width = 10 µs 3. This supply is optional and is required only when negative gate drive is implemented. 4. Derate linearly above 95 °C free-air temperature at a rate of 20 mW/°C. 5. Derate linearly above 95 °C free-air temperature at a rate of 5 mW/°C. The maximum LED junction temperature should not exceed 125 °C. Table 4. Recommended Operating Conditions Parameter Symbol Min. Max. Units Operating Temperature TA -40 105 °C Note Input supply voltage VCC1 4.5 5.5 V 1 Total Output Supply Voltage VCC2 – VEE2 15 30 V 2 Negative Output Supply Voltage (VE – VEE) 0 13.5 V 3 Positive Output Supply Voltage VCC2 – VE 15 30 – (VE – VEE) V Input LED Current IF(ON) 9 16 mA Input Voltage (OFF) VF(OFF) -3.6 0.8 V Notes: 1. In most applications VCC1 will be powered up first (before VCC2) and powered down last (after VCC2). This is desirable for maintaining control of the IGBT gate. In applications where VCC2 is powered up first, it is important to ensure that input remains low until VCC1 reaches the proper operating voltage (minimum 4.5 V) to avoid any momentary instability at the output during VCC1 ramp-up or ramp-down. 2. 15 V is the recommended minimum operating positive supply voltage (VCC2 - VE) to ensure adequate margin in excess of the maximum VUVLO+ threshold of 13.7 V. 3. This supply is optional and is required only when negative gate drive is implemented. 5 Table 5. Electrical Specifications (DC) Unless otherwise noted, all typical values at TA = 25 °C, VCC1 = 5 V, VCC2 – VEE2 = 30 V, VE – VEE2 = 0 V; all Minimum/ Maximum specifications are at Recommended Operating Conditions. Parameter Symbol Logic Low Input Voltage Logic High Input Voltage Logic High LED Driver Output RDS(ON) Logic Low LED Driver Output Voltage Input Low Supply Current Input High Supply Current VIN+L VIN+H RLEDDRVH VLEDDRVL ICC1L ICC1H Output Low Supply Current Output High Supply Current LED Forward Voltage Temperature Coefficient of Input Forward Voltage LED Reverse Breakdown Voltage Input Capacitance LED Turn on Current Threshold Low to High LED Turn on Current Threshold High to Low LED Turn on Current Hysteresis High Level Output Current Low Level Output Current High Output Transistor RDS(ON) Low Output Transistor RDS(ON) Low Level Output Current During Fault Condition High Level Output Voltage Low Level Output Voltage Clamp Threshold Voltage Clamp Low Level Sinking Current Clamp Output Transistor RDS(ON) VCC2 UVLO Threshold Low to High VCC2 UVLO Threshold High to Low VCC2 UVLO Hysteresis DESAT Detection Threshold DESAT Charging Current DESAT Discharging Current FAULT Logic Low Output Current FAULT Logic High Output Current UVLO Logic Low Output Current UVLO Logic High Output Current ICC2L ICC2H VF ΔVF/ΔTA Min. 2 5.5 0.2 1.2 VBR CIN ITH+ 5 Typ. 13.5 0.4 3 3 13 4.3 5.4 1.55 -1.7 Max. Units Test Conditions 0.8 V V Ω V mA mA mA mA mA V mV/°C 23 23 ILEDDRV = -10 mA, VIN+ = 5 V 23 ILEDDRV = 2.4 mA, VIN+ = 0 V 23 IF = 0 mA, VIN+ = 0 V 1 IF = 10 mA, VIN+=0 V 1 ILEDDRV = 10 mA , VIN+=5 V IF = 0 mA 2, 3 IF = 10 mA 2, 3 IF =10 mA 4 IF = 10 mA IF = 10 µA 24 0.8 6 6 16 6.5 7.5 1.95 Fig. Note 0.25 70 2 6 V pF mA ITH- 0.15 1.5 5.5 mA VOUT = 5 V ITH_HYS IOH IOL RDS,OH RDS,OL IOLF -2 2 0.5 0.2 55 0.5 -3.5 3.0 2.5 1.8 115 5.0 4.0 170 mA A A Ω Ω mA VCC2 - VOUT =15 V VOUT - VEE = 15 V IOH = -2 A IOL = 2 A VOUT - VEE = 14 V 7 IOUT = -100 mA IOUT = 100 mA 5 6 VOH VOL VTH_CLAMP ICLAMP RDS,CLAMP VUVLO+ VUVLOVUVLO_HYS VDESAT ICHG IDSCHG IFAULT_L IFAULT_H IUVLO_L IUVLO_H VCC2– 0.5 VCC2 – 0.15 0.1 2 0.75 1.9 1.1 11 12.5 10.1 11.3 0.4 1.2 6.2 7 0.6 1.0 20 58 4 9.0 0.5 3 3.5 13.7 12.8 7.8 1.2 20 4 9.0 20 V V V A Ω V V V V mA mA mA µA mA µA VOUT = 5 V VCLAMP = VEE + 2.5 ICLAMP = 1 A VOUT > 5 V VOUT < 5 V VDESAT = 2 V VDESAT = 8 V VFAULT = 0.4 V VFAULT = 5 V VUVLO = 0.4 V VUVLO = 5 V 1 1 2 2 3 4, 5, 6 4, 6, 7 4, 6, 8 8 9 10 6 6, 9 Notes: 1. Maximum pulse width = 10 μs. 2. Output is sourced at -2.0 A/2.0 A with a maximum pulse width = 10 μs. 3. For further details, see the description of operation during DESAT fault condition section in the application notes. 4. 15 V is the recommended minimum operating positive supply voltage (VCC2 – VE) to ensure adequate margin in excess of the maximum VUVLO+ threshold of 13.7 V. For High Level Output Voltage testing, VOH is measured with a DC load current. When driving capacitive loads, VOH will approach VCC as IOH approaches zero. 5. Maximum pulse width = 1.0 ms. 6. Once VOUT of ACPL-336J is allowed to go High (VCC2 – VE > VUVLO+), the DESAT detection feature of the ACPL-336J will be the primary source of IGBT protection. UVLO is needed to ensure DESAT is functional. Once VCC2 exceeds VUVLO+ threshold, DESAT will remain functional until VCC2 is below VUVLO- threshold. Thus, the DESAT detection and UVLO features of the ACPL-336J work in conjunction to ensure constant IGBT protection. 7. This is the “increasing” (i.e., turn-on or “positive going” direction) of VCC2 – VE. 8. This is the “decreasing” (i.e., turn-off or “negative going” direction) of VCC2 – VE. 9. For further details, see the DESAT fault detection blanking time section in the applications notes. 6 Table 6. Switching Specifications (AC) Unless otherwise noted, all typical values at TA = 25 °C, VCC1 = 5 V, VCC2 – VEE2 = 30 V, VE – VEE2 = 0 V; all Minimum/ Maximum specifications are at Recommended Operating Conditions. Parameter Symbol Min. Typ.* Max. Units Test Conditions Input LED to High Level Output Propagation Delay Time tPLH 50 130 220 ns 11, 12, 1 RG = 10 Ω, CG = 10 nF, f = 10 kHz, Duty Cycle = 50% 13 Input LED to Low Level Output Propagation Delay Time tPHL 50 155 250 ns 11, 12, 2 13 Pulse Width Distortion PWD 25 120 ns 3, 4 Propagation Delay Difference Between Any 2 Parts (tPHL-tPLH) PDD 150 ns 4, 5 Propagation Delay Skew tPSK 100 ns 4,6 10% to 90% Rise Time tR 80 ns 90% to 10% Fall Time tF 45 ns DESAT Blanking Time tDESAT(BLANKING) 0.6 1.1 µs DESAT Sense to 90% VOUT Delay tDESAT(90%) 1.3 2 µs DESAT Sense to 10% VOUT Delay tDESAT(10%) 4.8 6.5 DESAT Sense to DESAT Low Propagation Delay tDESAT(LOW) 0.25 DESAT Sense to Low Level FAULT Signal Delay tDESAT(FAULT) 2.2 5 µs Output Mute Time due to DESAT tDESAT(MUTE) 2.3 3.0 4.2 ms Time Input Kept Low Before Fault Reset to High tDESAT(RESET) 2.3 3.0 4.2 ms VCC2 to UVLO High Delay tPLH_UVLO 10 VCC2 to UVLO Low Delay tPHL_UVLO 10 VCC2 UVLO to VOUT High Delay tUVLO_ON VCC2 UVLO to VOUT Low Delay tUVLO_OFF Output High Level Common Mode Transient Immunity |CMH| 30 Output Low Level Common Mode Transient Immunity |CML| 30 >50 -150 Fig. Note 24 7 24 8 µs 24 9 µs 24 10 24 11 24 12 24 13 µs 22 14 µs 22 15 5.3 µs 22 16 1 µs 22 17 >50 kV/µs TA = 25 °C, IF = 10 mA, VCM = 1500 V, VCC2 = 30 V 14, 16,18 18, 20 kV/µs TA = 25 °C, IF = 0 mA, VCM = 1500 V, VCC2 = 30 V, 15, 17, 19, 20 19 RG = 10 Ω, CG= 10 nF RF = 10 kΩ, CF = Open RF = 10 kΩ, CF = Open Notes: 1. tPLH is defined as propagation delay from 50% of LED input IF to 50% of High level output. 2. tPHL is defined as propagation delay from 50% of LED input IF to 50% of Low level output. 3. Pulse Width Distortion (PWD) is defined as |tPHL - tPLH| for any given unit. 4. As measured from IF to VOUT. 5. The difference between tPHL and tPLH between any two ACPL-336J parts under the same test conditions. 6. tPSK is equal to the worst-case difference in tPHL and tPLH that will be seen between units under the same test condition. 7. The ACPL-336J internal delay time to respond to a DESAT fault condition without any external DESAT capacitor. 8. The amount of time from when DESAT threshold is exceeded to 90% of VGATE at mentioned test conditions. 9. The amount of time from when DESAT threshold is exceeded to 10% of VGATE at mentioned test conditions. 10. The amount of time from when DESAT threshold is exceeded to DESAT Low voltage, 0.7 V. 11. The amount of time from when DESAT threshold is exceeded to FAULT output Low – 50% of VCC1 voltage. 12. The amount of time when DESAT threshold is exceeded, output is muted to LED input. 13. The amount of time when DESAT mute time is expired, LED input must be kept low for FAULT status to return to High. 14. The delay time when VCC2 exceeds UVLO+ threshold to UVLO high – 50% of UVLO positive-going edge. 15. The delay time when VCC2 exceeds UVLO- threshold to UVLO low – 50% of UVLO negative-going edge. 16. The delay time when VCC2 exceeds UVLO+ threshold to 50% of high level output. 17. The delay time when VCC2 exceeds UVLO- threshold to 50% of low level output. 18. Common mode transient immunity in the high state is the maximum tolerable dVCM/dt of the common mode pulse, VCM, to assure that the output will remain in the high state (i.e., VOUT > 15 V or FAULT > 2 V or UVLO > 2 V). A 330 pF and a 10 kΩ pull-up resistor are needed in FAULT and UVLO detection mode. 19. Common mode transient immunity in the low state is the maximum tolerable dVCM/dt of the common mode pulse, VCM, to assure that the output will remain in a low state (i.e., VOUT < 1.0 V or FAULT < 0.8 V or UVLO < 0.8 V). 20. Split resistor network in the ratio 1:1 at the anode and cathode. For further details, see description of input LED driver and split resistors circuit section in the application notes. 7 Table 7. Package Characteristics Parameter Symbol Min. Input-Output Momentary Withstand Voltage VISO 5000 Resistance (Input-Output) RI-O Capacitance (Input-Output) Thermal Coefficient Between LED and Input IC LED and Output IC Input IC and Output IC LED and Ambient Input IC and Ambient Output IC and Ambient Typ. Max. Units Test Conditions Note VRMS RH < 50%, 1, 2, 3 t = 1 min., TA = 25 °C > 109 W VI-O = 500 VDC CI-O 1.3 pF freq =1 MHz AEI AEO AIO AEA AIA AOA 35.4 33.1 25.6 176.1 92 76.7 °C/W °C/W °C/W °C/W °C/W °C/W 3 4 3.5 3.4 3.3 3.2 3.1 3.0 2.9 2.8 2.7 2.6 2.5 -40 7.0 I F = 10 mA for I CC1H I F = 0 mA for I CC1L VCC = 30 V VEE = 0 V ICC2 - OUTPUT SUPPLY CURRENT - mA I CC1 - INPUT SUPPLY CURRENT - mA Notes 1. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 6000 VRMS for 1 second. This test is performed before the 100% production test for partial discharge (method b) shown in IEC/EN/DIN EN 60747-5-5 Insulation Characteristic Table, if applicable. 2. The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output continuous voltage rating. For the continuous voltage rating, refer to your equipment level safety specification or IEC/EN/DIN EN 60747-5-5 Insulation Characteristics Table. 3. Device considered a two-terminal device: pins 1 to 8 are shorted together and pins 9 to 16 are shorted together. 4. For further details, see thermal calculation section in the application notes. ICC1L ICC1H -20 0 20 40 60 TA - TEMPERATURE - °C 80 5.0 4.5 4.0 ICC2L ICC2H 3.5 -20 0 20 40 60 TA - TEMPERATURE - °C 80 100 Figure 2. ICC2 vs. temperature 100 6.0 5.5 I F - LED1 FORWARD CURRENT - mA IF = 10 mA for I CC2H IF = 10 mA for I CC2L T A = 25 ° C V EE = 0 V 6.5 ICC2- SUPPLY CURRENT - mA I F = 10 mA for I CC2H I F = 0 mA for I CC2L V CC = 30 V V EE = 0 V 5.5 3.0 -40 7.0 5.0 10 4.5 4.0 ICC2L ICC2H 3.5 15 Figure 3. ICC vs.VCC 8 6.0 100 Figure 1. ICC1 vs. temperature 3.0 6.5 17 19 21 VCC - SUPPLY VOLTAGE - V 23 25 1 1.4 1.5 1.6 1.7 VF - LED1 FORWARD VOLTAGE - V Figure 4. LED1 Input Current vs. forward voltage 1.8 VOL - LOW OUTPUT VOLTAGE - V VOH - HIGH OUTPUT VOLTAGE DROP - V 30 29.95 29.9 29.85 29.8 29.75 29.7 29.65 29.6 29.55 29.5 I F = 10 mA I OUT = -100 mA VCC2 = 30 V VEE2 = 0 V -40 -20 0 Figure 5. VOH vs. temperature 20 40 60 TA - TEMPERATURE - °C 80 100 VDESAT - DESAT THRESHOLD - V IOLF - LOW LEVEL OUTPUT CURRENT DURING FAULT CONDITION - mA 140 120 100 80 60 40 -40 25 105 20 0 10 20 VOUT - VEE - OUTPUT LOW VOLTAGE - V 30 Figure 7. IOLF vs. output voltage IDSCHG - DESAT DISCHARGING CURRENT - mA ICHG - DESAT CHARGING CURRENT - mA -0.85 -0.90 -0.95 -1.00 -1.05 -1.10 -1.15 -20 0 Figure 9. ICHG vs. temperature 9 20 40 60 TA - TEMPERATURE - °C -20 0 20 40 60 TA - TEMPERATURE - °C 80 100 7.5 7.4 7.3 7.2 7.1 7 6.9 6.8 6.7 6.6 6.5 -40 -20 0 20 40 60 TA - TEMPERATURE - °C 80 100 Figure 8. VDESAT vs. temperature -0.80 -1.20 -40 I F = 0 mA I OUT = -100 mA VCC = 30 V VEE = 0 V Figure 6. VOL vs. temperature 160 0 0.5 0.45 0.4 0.35 0.3 0.25 0.2 0.15 0.1 0.05 0 -40 80 100 80 70 60 50 40 30 20 10 0 -40 -20 0 20 40 60 TA - TEMPERATURE - °C Figure 10. IDSCHG vs. temperature 80 100 tp - PROPAGATION DELAY - ns 250 100 I F = 10 mA CG = 10 nF DUTY CYCLE = 50% f = 10 kHz 200 150 100 50 t PLH t PHL 0 10 20 30 LOAD RESISTANCE - Ω Figure 13. Propagation delay vs. load resistance 10 t PLH t PHL 80 40 250 I = 10 mA 230 RF = 10 Ω, C = 10 nF G G 210 DUTY CYCLE = 50% f = 10 kHz 190 170 150 130 110 90 70 50 15 20 25 VCC - SUPPLY VOLTAGE - V Figure 12. Propagation delay vs. supply voltage tp - PROPAGATION DELAY - ns tp - PROPAGATION DELAY - ns 200 180 160 140 120 100 80 60 I = 10 mA 40 RF = 10 Ω, C = 10 nF G G 20 DUTY CYCLE = 50% f = 10 kHz 0 -40 -20 0 20 40 60 TA - TEMPERATURE - °C Figure 11. Propagation delay vs. temperature 50 t PLH t PHL 30 1 VEE1 VEE2 16 2 VIN+ VLED 15 3 VCC1 DESAT 14 4 VLEDDRV VE 13 5 UVLO 150 Ω 5V + _ 150 Ω 1 µF VCC2 12 6 FAULT VOUT 11 7 ANODE VCLAMP 10 8 CATHODE VEE2 Scope 10 Ω 30 V 10 nF + _ 9 VCM = 1500 V Figure 14. CMR VOUT High test circuit 1 VEE1 VEE2 16 2 VIN+ VLED 15 3 VCC1 DESAT 14 4 VLEDDRV VE 13 5 UVLO 150 Ω 150 Ω 1 µF VCC2 12 6 FAULT VOUT 11 7 ANODE VCLAMP 10 8 CATHODE VEE2 Scope 10 Ω 30 V 10 nF + _ 9 VCM = 1500 V Figure 15. CMR VOUT Low test circuit VLED 15 3 VCC1 DESAT 14 Scope 5V + _ 150 Ω 150 Ω VE 13 5 UVLO VCC2 12 6 FAULT VOUT 11 7 ANODE VCLAMP 10 8 CATHODE Figure 16. CMR FAULT High test circuit 11 VEE2 16 4 VLEDDRV 10 kΩ 330 pF 1 VEE1 1 µF 2 VIN+ VEE2 VCM = 1500 V 9 1 µF 10 Ω 30 V 10 nF + _ VLED 15 3 VCC1 DESAT 14 VEE2 16 4 VLEDDRV 10 kΩ Scope 330 pF 1 VEE1 1 µF 2 VIN+ 5V + _ 150 Ω 150 Ω VE 13 5 UVLO VCC2 12 6 FAULT VOUT 11 7 ANODE VCLAMP 10 8 CATHODE 1 µF 10 Ω 30 V 10 nF + _ 9 VEE2 VCM = 1500 V Figure 17. CMR FAULT Low test circuit 10 kΩ VLED 15 3 VCC1 DESAT 14 VEE2 16 4 VLEDDRV Scope 330 pF 1 VEE1 1 µF 2 VIN+ 5V + _ 150 Ω 150 Ω VE 13 5 UVLO VCC2 12 6 FAULT VOUT 11 7 ANODE VCLAMP 10 VEE2 9 8 CATHODE 1 µF 10 Ω 30 V 10 nF + _ VCM = 1500 V Figure 18. CMR UVLO High test circuit 10 kΩ VLED 15 3 VCC1 DESAT 14 VEE2 16 4 VLEDDRV Scope 330 pF 1 VEE1 1 µF 2 VIN+ 5V + _ 150 Ω 150 Ω VE 13 5 UVLO VCC2 12 6 FAULT VOUT 11 7 ANODE VCLAMP 10 8 CATHODE VEE2 VCM = 1500 V Figure 19. CMR UVLO Low test circuit 12 9 1 µF 10 Ω 10 nF Applications Information Recommended Application Circuit 1 µF + _ 10 k Ω 10 k Ω UVLO FAULT 330 pF 330 pF 150 Ω 150 Ω 1 VEE1 VEE2 16 2 VIN+ VLED 15 3 VCC1 DESAT 14 4 VLEDDRV 5 UVLO VCC2 12 6 FAULT VOUT 11 7 ANODE VCLAMP 10 8 CATHODE VE 13 1 µF 1kΩ DDESAT CBLANK =220 pF 1 µF 1 µF RG + _ Q1 + VCE - + _ VEE2 9 Q2 Figure 20. Typical gate drive circuits with DESAT detection 1 µF + _ 10 k Ω 10 k Ω UVLO FAULT 330 pF 330 pF 150 Ω 150 Ω 1 VEE1 VEE2 16 2 VIN+ VLED 15 3 VCC1 DESAT 14 4 VLEDDRV 5 UVLO 6 FAULT VOUT 11 7 ANODE VCLAMP 10 8 CATHODE VE 13 VCC2 12 VEE2 9 1 µF 1kΩ DDESAT CBLANK =220 pF 1 µF 1 µF ROUT RG + _ RC + _ Figure 21. Typical parallel IGBT gate drive circuits with DESAT detection The ACPL-336J has non-inverting gate control inputs, and an open drain FAULT and UVLO outputs suitable for wired ‘OR’ applications. The two supplies bypass capacitors (1 µF) provide the large transient currents necessary during a switching transition. The DESAT diode and 220 pF blanking capacitor are the necessary external components for the fault detection circuitry. The gate resistor (RG) serves to limit gate charge current and indirectly control the IGBT collector voltage rise and fall times. The open drain FAULT and UVLO outputs have passive 10kΩ pull-up resistors and a 330 pF filtering capacitor. 13 Introduction to DESAT Detection The power stage of a typical three phase inverter is susceptible to several types of failures, most of which are potentially destructive to the power IGBTs. These failure modes can be grouped into four basic categories: phase and/or rail supply short circuits due to user misconnect or bad wiring, control signal failures due to noise or computational errors, overload conditions induced by the load, and component failures in the gate drive circuitry. Under any of these fault conditions, the current through the IGBTs can increase rapidly, causing excessive power dissipation and heating. The IGBTs become damaged when the current load approaches the saturation current of the device, and the collector to emitter voltage rises above the saturation voltage level. The drastically increased power dissipation very quickly overheats the power device and destroys it. To prevent damage to the drive, fault protection must be implemented to reduce or turn-off the IGBTs during a fault condition. A circuit providing fast local DESAT detection and shutdown is an ideal solution, but the number of required components, board space consumed, cost, and complexity have until now limited its use to high performance drives. The features that this circuit must have are high speed, low cost, low resolution, low power dissipation, and small size. The ACPL-336J satisfies these criteria by combining a high speed, high output current driver, high voltage optical isolation between the input and output, local IGBT desaturation detection and shut down, and optically isolated fault and UVLO status feedback signal into a single 16-pin surface mount package. The fault detection method, which is adopted in the ACPL-336J, is to monitor the saturation (collector) voltage of the IGBT and to trigger a local fault shutdown sequence if the collector voltage exceeds a predetermined threshold. A small gate discharge device slowly reduces the high short circuit IGBT current to prevent damaging voltage spikes. Before the dissipated energy can reach destructive levels, the IGBT is shut off. During the off state of the IGBT, the fault detect circuitry is simply disabled to prevent false ‘fault’ signals. The alternative protection scheme of measuring IGBT current to prevent desaturation is effective if the short circuit capability of the power device is known, but this method will fail if the gate drive voltage decreases enough to only partially turn on the IGBT. By directly measuring the collector voltage, the ACPL-336J limits the power dissipation in the IGBT even with insufficient gate drive voltage. Another more subtle advantage of the desaturation detection method is that power dissipation in the IGBT is monitored, while the current sense method relies on a preset current threshold to predict the safe limit of operation. Therefore, an overly-conservative overcurrent threshold is not needed to protect the IGBT. Output Control The outputs (VOUT, FAULT and UVLO) of the ACPL-336J are controlled by the combination of VCC1, VCC2(UVLO), LED current IF and IGBT desaturation condition. The following table shows the logic truth table for these outputs. VCC1 VCC2 (UVLO) IF DESAT VOUT Fault UVLO Low Low X Not Active Low Low Low Low High Low Not Active Low Low Low Low High High Active (no DESAT fault) High Low Low Low High High Active (DESAT fault) Low Low Low High Low X Not Actve Low High Low High High High Active (DESAT fault) Low Low High High High Low Not Active Low High High High High High Active (no DESAT fault) High High High The logic level is defined by the respective threshold of each function pin. 14 Description of UnderVoltage LockOut Insufficient gate voltage to IGBT can increase turn-on resistance of IGBT, resulting in large power loss and IGBT damage due to high heat dissipation. ACPL-336J monitors the output power supply constantly. When output power supply is lower than undervoltage lockout (UVLO) threshold, the gate driver output will shut off to protect IGBT from low voltage bias. The low output power supply fault will be reported via the UVLO feedback. In this way, the UVLO feedback can also serve as a READY signal to the controller during power up. VCC1 VUVLO– VCC2 VUVLO+ LED1 IF tUVLO_OFF VOUT tUVLO_ON FAULT UVLO tPHL_UVLO tPLH_UVLO Figure 22. UVLO and feedback behaviors and timing diagram Description of Input LED Driver and Split Resistors Circuit The ACPL-336J has integrated an input LED driver that with high impedance input(VIN+) for interfacing with the controller. The LED driver’s output(VLEDDRV) has to be connected with the recommended split resistors circuit to the LED1 anode to achieve the rated high CMR performance. The LED current can be calculated by ILEDDRV = (VCC1- VF)/(RLEDDRVH +2R). Alternatively, if the LED driver is not used, LED1 can still be driven directly by other means of discrete driver configuration. It is recommended that the two resistors (R) connected to input LED’s anode and cathode are split in the ratio 1:1. They will help to balance the common mode impedances at the LED’s anode and cathode. This helps to equalize the common mode voltage changes at the anode and cathode to give high CMR performance. 1 5V 1 µF 2 5V + _ 3 4 ILEDDRV R R VEE1 VIN+ VCC1 5 UVLO 6 FAULT 7 8 ANODE CATHODE Figure 23. Input LED driver functional diagram 15 RLEDDRVH VLEDDRV LED1 ILEDDRV = (VCC1 - VF)/(RLEDDRVH+2R) DESAT Fault Detection Blanking Time The DESAT fault detection circuitry must remain disabled for a short time period following the turn-on of the IGBT to allow the collector voltage to fall below the DESAT theshold. This time period, called the DESAT blanking time, is controlled by the internal DESAT charge current, the DESAT voltage threshold, and the external DESAT capacitor. The nominal blanking time is calculated in terms of external capacitance (CBLANK, see Figure 20 and Figure 21), FAULT threshold voltage (VDESAT), and DESAT charge current (ICHG) in addition to an internal DESAT blanking time (tDESAT(BLANKING)). tBLANK = CBLANK × (VDESAT/ICHG) + tDESAT(BLANKING) Description of Operation during DESAT Fault Condition 1. DESAT terminal monitors IGBT’s VCE voltage. 2. When the voltage on the DESAT terminal exceeds 7 V, a weak pull-down in the output stage(IOLF) will turn on to ‘softly’ turn off the IGBT. When the gate voltage falls below VEE+2 V, the Miller Clamp will turn on to clamp the IGBT gate to VEE. 3. FAULT output goes low, notifying the microcontroller of the fault condition. 4. Microcontroller takes appropriate action. 5. When tDESAT(MUTE) expires, LED input needs to be kept low for tDESAT(RESET) before fault condition is cleared. FAULT status will return to high. 6. Output (VOUT) starts to respond to LED input after fault condition is cleared. tDESAT(MUTE) LED1 IF tDESAT(90%) 90% VOUT 10% tDESAT(10%) 7V VDESAT FAULT tDESAT(BLANKING) tDESAT(BLANKING) tDESAT(LOW) 50% t DESAT(RESET) t DESAT(FAULT) Figure 24. DESAT fault state timing diagram Selecting the Gate Resistor (RG) Step 1: Calculate RG minimum from the IO(PEAK) specification. The IGBT and RG in Figure 20 can be analyzed as a simple RC circuit with a voltage supplied by ACPL-336J. RG ≥ V CC − V EE − R DS ,OH(MIN ) I O(PEAK) = 30 − 0 V − 0 . 5 Ω 2 .5 A = 11. 5 Ω RG ≥ or V CC − V EE − R DS ,OL (MIN ) I O(PEAK) = 30 − 0 V − 0 . 2 Ω 2 .5 A = 11. 8 Ω The external gate resistor, RG and internal minimum turn-on resistance, RDSON will ensure the output current will not exceed the device absolute maximum rating of 2.5 A. In this case, we will use worst-case RG ≥ 11.8 Ω. 16 Step 2: Check the ACPL-336J power dissipation and increase RG if necessary. The ACPL-336J total power dissipation (PT) is equal to the sum of the LED power (PE), input IC power(PI) and the output IC power (PO). PT = PE + PI + PO Assuming operation conditions of IF(worst case) = 16 mA, RG = 11.8 Ω, Max Duty Cycle = 80%, QG = 1 µC, f = 10 kHz and TA max = 95 °C. Calculation of LED Power Dissipation PE = IF • VF • Duty Cycle = 16 mA • 1.95 V • 0.8 = 25 mW Calculation of Input IC Power Dissipation PI = ICC1(Max) * VCC1(Recommended Max) = 6 mA * 5.5 V = 33 mW Calculation of Input IC Power Dissipation PO = PO(BIAS) + PO(SWITCHING) = ICC2 • (VCC2-VEE2) + PHS + PLS PHS = (VCC2*QG*f ) * RDS,OH(MAX) / (RDS,OH(MAX)+RG) / 2 PLS = (VCC2*QG*f ) * RDS,OL(MAX) / (RDS,OL(MAX)+RG) / 2 PHS = (30 V • 1µC • 10 kHz) • 4.5 Ω/(4.5 Ω +7.3 Ω)/2 = 44.6 mW PLS = (30 V • 1µC • 10 kHz) • 3.6 Ω/(3.6 Ω+7.3 Ω)/2 = 38.0 mW PO = 7.5 mA • 30 V + 44.6 mW +38.0 mW = 307.6 mW < 600 mW (PO(MAX) @ 95 °C) The value of 7.5 mA for ICC2 in the previous equation is the maximum ICC2 over the entire operating temperature range. Since PO is less than PO(MAX), RG = 11.8 Ω is all right for the power dissipation. Thermal Calculation Application and environmental design for ACPL-336J needs to ensure that the junction temperature of the internal ICs and LED within the gate driver optocoupler do not exceed 125 °C. The following equations calculate the maximum power dissipation effect on junction temperatures. LED Junction Temperature, TE = AEA*PE + AEI*PI + AEO*PO + TA = 176.1 °C/W *25 mW + 35.4 °C/W *33 mW + 33.1 °C/W *307.6 mW + 95 °C = 110.7 °C Input IC Junction Temperature, TI = AEI*PE + AIA*PI + AIO*PO + TA = 35.4 °C/W *25 mW + 92 °C/W *33 mW + 25.6*307.6 mW + 95 °C = 106.8 °C Output IC Junction Temperature, TO = AEO*PE + AIO*PI + AOA*PO + TA = 33.1 °C/W *25 mW + 25.6 °C/W *33 mW + 76.7*307.6 mW + 95 °C = 120.3 °C 17 DESAT Diode and DESAT Threshold The DESAT diode's function is to conduct forward current, allowing sensing of the IGBT's saturated collector-to-emitter voltage, VCESAT, (when the IGBT is "on") and to block high voltages (when the IGBT is "off"). When the IGBT is switching off and toward the end of the forward conduction of the DESAT diode, a reverse current will flow for short time. This reverse recovery effect prevents the diode from achieving its blocking capability until the mobile charge in the junction is depleted. During this time, there is commonly a very high dVCE/dt voltage ramp rate across the IGBT’s collector-to-emitter. This results in ICHARGE = CD-DESAT x dVCE/dt charging current which will charge the blanking capacitor, CBLANK. To minimize this charging current and avoid false DESAT triggering, it is best to use fastresponse diodes. In the recommended application circuit shown in Figure 20, the voltage on pin 14 (DESAT) is VDESAT = VF + VCE, where VF is the forward ON voltage of DDESAT and VCE is the IGBT collector-to-emitter voltage. The value of VCE that triggers DESAT to signal a FAULT condition is nominally 7 V – VF. If desired, this DESAT threshold voltage can be decreased by using multiple DESAT diodes or low-voltage Zener diode in series. If n is the number of DESAT diodes, the nominal threshold value becomes VCE,FAULT(TH) = 7 V – n × VF. If a Zener diode is used, the nominal threshold value becomes VCE,FAULT(TH) = 7 V – VF – VZ. When using two diodes instead of one, then diodes with half of the total required maximum reverse-voltage rating may be chosen. VEE2 16 VEE2 16 VLED 15 VLED 15 1 kΩ D ZENER D DESAT DESAT 14 10 V Zener 1N5925A 1 kΩ D DESAT DESAT 14 CBLANK VE 13 Q1 + V CE - Figure 25. DESAT diode and DESAT threshold CBLANK VE 13 Schottky Diode MBR0540 Q1 + V CE - Figure 26. False fault prevention diodes DESAT Pin Protection Resistor The freewheeling of flyback diodes connected across the IGBTs can have large instantaneous forward voltage transients that greatly exceed the nominal forward voltage of the diode. This may result in a large negative voltage spike on the DESAT pin, which will draw substantial current out of the driver if protection is not used. To limit this current to levels that will not damage the driver IC, make sure a 1 kΩ resistor is inserted in series with the DESAT diode. False Fault Prevention Diodes A situation that may cause the driver to generate a false fault signal is if the substrate diode of the driver becomes forward biased. This can happen if the reverse recovery spikes coming from the IGBT freewheeling diodes bring the DESAT pin below Ground. Therefore, the DESAT pin voltage will be ‘brought’ above the threshold voltage. This negative going voltage spikes are typically generated by inductive loads or reverse recovery spikes of the IGBT/MOSFETs freewheeling diodes. To prevent a false fault signal, it is highly recommended that you connect a Zener diode and a Schottky diode across the DESAT pin and VE pin Figure 26 shows this circuit solution. The Schottky diode will prevent the substrate diode of the gate driver optocoupler from being forward biased while the Zener diode (10 V) is used to prevent any positive high transient voltage from affecting the DESAT pin. For product information and a complete list of distributors, please go to our web site: www.avagotech.com Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies in the United States and other countries. Data subject to change. Copyright © 2005-2014 Avago Technologies. All rights reserved. AV02-4391EN - May 9, 2014
ACPL-336J-500E 价格&库存

很抱歉,暂时无法提供与“ACPL-336J-500E”相匹配的价格&库存,您可以联系我们找货

免费人工找货
ACPL-336J-500E
  •  国内价格 香港价格
  • 1+60.290501+7.27170
  • 10+43.7427010+5.27590
  • 25+40.3025025+4.86090
  • 100+36.18590100+4.36440
  • 250+34.58830250+4.17180
  • 500+31.14810500+3.75680
  • 850+29.88870850+3.60490
  • 1700+29.224001700+3.52480

库存:2144

ACPL-336J-500E
  •  国内价格
  • 1+51.06946
  • 25+50.14263
  • 100+49.24704
  • 250+48.36186
  • 500+47.51834

库存:814

ACPL-336J-500E

    库存:80367

    ACPL-336J-500E

      库存:2550